WO2008069284A1 - Capteur et procédé de fabrication de celui-ci - Google Patents
Capteur et procédé de fabrication de celui-ci Download PDFInfo
- Publication number
- WO2008069284A1 WO2008069284A1 PCT/JP2007/073617 JP2007073617W WO2008069284A1 WO 2008069284 A1 WO2008069284 A1 WO 2008069284A1 JP 2007073617 W JP2007073617 W JP 2007073617W WO 2008069284 A1 WO2008069284 A1 WO 2008069284A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- movable element
- substrate
- sensor
- region
- impurity
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C19/00—Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
- G01C19/56—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
- G01C19/5719—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces using planar vibrating masses driven in a translation vibration along an axis
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B3/00—Devices comprising flexible or deformable elements, e.g. comprising elastic tongues or membranes
- B81B3/0018—Structures acting upon the moving or flexible element for transforming energy into mechanical movement or vice versa, i.e. actuators, sensors, generators
- B81B3/0021—Transducers for transforming electrical into mechanical energy or vice versa
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/0802—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/12—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by alteration of electrical resistance
- G01P15/124—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by alteration of electrical resistance by semiconductor devices comprising at least one PN junction, e.g. transistors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/125—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by capacitive pick-up
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2201/00—Specific applications of microelectromechanical systems
- B81B2201/02—Sensors
- B81B2201/0228—Inertial sensors
- B81B2201/025—Inertial sensors not provided for in B81B2201/0235 - B81B2201/0242
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2201/00—Specific applications of microelectromechanical systems
- B81B2201/02—Sensors
- B81B2201/0264—Pressure sensors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P2015/0805—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration
- G01P2015/0822—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass
- G01P2015/0825—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass for one single degree of freedom of movement of the mass
- G01P2015/0828—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining out-of-plane movement of the mass for one single degree of freedom of movement of the mass the mass being of the paddle type being suspended at one of its longitudinal ends
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Pressure Sensors (AREA)
Abstract
La présente invention concerne un capteur comprenant un élément mobile supporté de manière mobile et un élément opposé. Le capteur détecte une relation de position relative entre l'élément mobile et l'élément opposé entre lesquels est prévu un espacement. L'élément opposé a une portion dopée par des impuretés qui est prévue sur une portion opposée qui est opposée à l'élément mobile ou sur une portion contiguë qui est voisine de la portion opposée. Au moins une partie de la portion dopée par des impuretés est formée sur une surface opposée, opposée à une surface qui est opposée à l'élément mobile, surface opposée à partir de laquelle on fait sortir un câblage électrique.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12/516,007 US8336381B2 (en) | 2006-12-04 | 2007-11-29 | Sensor and method of manufacturing the same |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006-326401 | 2006-12-04 | ||
JP2006326401 | 2006-12-04 | ||
JP2007-267308 | 2007-10-15 | ||
JP2007267308A JP5376790B2 (ja) | 2006-12-04 | 2007-10-15 | センサ、及びその製造方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2008069284A1 true WO2008069284A1 (fr) | 2008-06-12 |
Family
ID=39156316
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2007/073617 WO2008069284A1 (fr) | 2006-12-04 | 2007-11-29 | Capteur et procédé de fabrication de celui-ci |
Country Status (1)
Country | Link |
---|---|
WO (1) | WO2008069284A1 (fr) |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4812888A (en) * | 1984-11-11 | 1989-03-14 | Cornell Research Foundation, Inc. | Suspended gate field effect semiconductor pressure transducer device |
US4873868A (en) * | 1986-06-10 | 1989-10-17 | Metravib R.D.S. | Force measurement sensor integrated on silicon, and a method of manufacture |
JPH0425764A (ja) * | 1990-05-21 | 1992-01-29 | Nec Corp | 半導体加速度センサ |
JPH0850022A (ja) * | 1994-05-30 | 1996-02-20 | Murata Mfg Co Ltd | 角速度センサ |
US5572057A (en) * | 1993-12-21 | 1996-11-05 | Nippondenso Co., Ltd. | Semiconductor acceleration sensor with movable electrode |
US20050194651A1 (en) * | 2004-02-09 | 2005-09-08 | Toshio Ohashi | Physical quantity sensor |
-
2007
- 2007-11-29 WO PCT/JP2007/073617 patent/WO2008069284A1/fr active Application Filing
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4812888A (en) * | 1984-11-11 | 1989-03-14 | Cornell Research Foundation, Inc. | Suspended gate field effect semiconductor pressure transducer device |
US4873868A (en) * | 1986-06-10 | 1989-10-17 | Metravib R.D.S. | Force measurement sensor integrated on silicon, and a method of manufacture |
JPH0425764A (ja) * | 1990-05-21 | 1992-01-29 | Nec Corp | 半導体加速度センサ |
US5572057A (en) * | 1993-12-21 | 1996-11-05 | Nippondenso Co., Ltd. | Semiconductor acceleration sensor with movable electrode |
JPH0850022A (ja) * | 1994-05-30 | 1996-02-20 | Murata Mfg Co Ltd | 角速度センサ |
US20050194651A1 (en) * | 2004-02-09 | 2005-09-08 | Toshio Ohashi | Physical quantity sensor |
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