WO2008056846A1 - Method of setting reference value for electronic measuring instrument and measuring instrument therefor - Google Patents
Method of setting reference value for electronic measuring instrument and measuring instrument therefor Download PDFInfo
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- WO2008056846A1 WO2008056846A1 PCT/KR2006/004872 KR2006004872W WO2008056846A1 WO 2008056846 A1 WO2008056846 A1 WO 2008056846A1 KR 2006004872 W KR2006004872 W KR 2006004872W WO 2008056846 A1 WO2008056846 A1 WO 2008056846A1
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- reference value
- value
- measurement reference
- measuring instrument
- measurement
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/16—Spectrum analysis; Fourier analysis
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/20—Monitoring; Testing of receivers
Definitions
- the present invention relates to an electronic measuring instrument such as a frequency spectrum analyzer and, more particularly, to a method of setting a measurement reference value for deciding a magnitude value of an input frequency for the measurement, and a measuring instrument therefor.
- measuring instrument includes an oscilloscope, a spectrum analyzer and the like.
- the measuring instrument is used for analyzing magnitude data such as voltage values, current values, magnitude values, phase values, etc. of input analog signals .
- a measurement reference value is preset as an absolute value corresponding to a measured value of an input signal. Then, the magnitude value of the input signal is decided based on the measurement reference value.
- the precision of the measurement reference value has a direct relation with the precision of the product, it is necessary to set the measurement reference value very cautiously.
- Fig. 1 is a diagram for illustrating a process of setting a measurement reference value applied to the existing spectrum analyzer.
- reference numeral 1 denotes a measuring instrument such as a spectrum analyzer
- numeral 2 denotes an external control unit for setting a measurement reference value in the measuring instrument
- numeral 3 denotes a signal generator that generates and outputs signals having a series of magnitudes and frequencies in accordance with the control of the external control unit 2.
- the measuring instrument 1 comprises an amplifier 11, an intermediate frequency (IF) circuit 12, a signal processor 13, a reference value storage unit 14 and a control unit 15, as schematically depicted in Fig. 1.
- IF intermediate frequency
- the amplifier 11 amplifies an input frequency signal
- the IF circuit 12 converts the frequency of input signal into an intermediate frequency signal for the process of the measuring instrument.
- the signal processor 13 analog/digital-converts a level of the input signal to apply the same to the control unit 15 and supplies a magnitude value of the input signal based on an absolute magnitude data applied from the control unit 15 to a display device as a measurement result value that outputs the measurement result value as visual data.
- the data value that the signal processor 13 measures the level of the input signal from the outside and applies to the control unit 15 is hereinafter referred to as a measured value and an actual physical level value corresponding to the measured value is referred to as a measurement reference value.
- the reference value storage unit 14 stores an absolute magnitude value corresponding to the level value of the input signal obtained from the signal processor 13, as a measurement reference value.
- the control unit 15 controls the overall measuring instrument 1.
- the control unit 15 basically connected with the external control unit 2 stores the measurement reference value in the reference value storage unit 14, reads the measurement reference value, corresponding to the measured value applied from the signal processor 13, from the reference value storage unit 14 and applied the same to the signal processor 13.
- the external control unit 2 a personal computer may be used.
- the external control unit 2 is connected to the control unit 15 or the signal generator 3 through RS232C, for example.
- the external control unit 2 transmits a frequency value and a magnitude value for the signal generation to the signal generator 3 and applies the same to the control unit 15. The operation of the external control unit 2 will be described in detail hereafter.
- the signal generator 3 generates a frequency signal having a predetermined magnitude in accordance with the control data applied from the external control unit 2.
- the frequency signal generated like this is input to the measuring instrument 1.
- the external control unit 2 transmits the frequency value and its magnitude value to the signal generator 3 and applies the magnitude value data to the control unit 15.
- the frequency signal of a predetermined magnitude value output from the signal generator 3 is applied to the signal processor 13 through the amplifier 11 and the IF circuit 12.
- the signal processor 13 detects the level of the input signal and applies the same to the control unit 15.
- the control unit 15 stores the magnitude value data, applied from the external control unit 2 corresponding to the signal level value applied from the signal processor 13, in the reference value storage unit 14 as an absolute measurement reference value .
- the external control unit 2 and the control unit 15 store absolute magnitudes value corresponding to a series of level values applied from the signal processor 13 in the reference value storage unit 14 as a measurement reference value, by modifying the magnitude value for a frequency signal step by step through the above operation repeatedly.
- the control unit 15 reads an absolute magnitude value corresponding to the level value from the reference storage unit 14 and applies the same to the signal processor 13, and the signal processor 13 displays the level value of the corresponding input signal based on the magnitude value input from the control unit 15.
- the magnitude value may be varied according to the frequency of the signal transmitted through the corresponding circuit, and the frequency signal applied to the signal processor 13 may be also varied due to minute errors of an oscillator used for the intermediate frequency conversion in the IF circuit 12, thus causing a change in the level value of the signal detected in the signal processor 13.
- a signal having the same magnitude input through the amplifier 11 may be detected as another level signal in the signal processor 13 in accordance with its frequency.
- the absolute magnitude value applied from the control unit 15 to the signal processor 13 is varied, thus causing a problem in that the different measurement result value is provided.
- an object of the present invention is to provide a method of setting a measurement reference value for an electronic measuring instrument that can set the measurement reference value for the measuring instrument readily and simply, and a measuring instrument therefor.
- a method of setting a measurement reference value for an electronic measuring instrument in accordance with a first aspect of the present invention comprising a signal processing unit for measuring a magnitude of a frequency signal input from the outside, a reference value storage unit, in which an absolute physical value corresponding to a measured value measured by the signal processing unit is stored, and a control unit for controlling the reference value storage for the reference value storage unit, the method comprising: a step of setting a measuring point that executes the measurement in the measuring instrument; a step of inputting a measured signal corresponding to the measuring point set in the step of setting a measuring point to the measuring instrument/ a step of inputting an absolute physical value of the measured signal to the control unit as a measurement reference value; a step of measuring a signal magnitude input to the measuring instrument and generating a measured value by means of the signal processing unit; a first measurement reference value setting step of setting a measurement reference value for the measuring point in the reference value storage unit based on the measured value and the measurement reference value by means
- the second measurement reference value setting step is executed using a nonlinear equation.
- an electronic measuring instrument in accordance with a second aspect of the present invention that comprises a signal processing unit for measuring a magnitude of a frequency signal input from the outside and a reference value storage unit, in which an absolute physical value corresponding to the measured value measured by the signal processing unit as a measurement reference value, and displays a magnitude value of the input frequency signal based on the measurement reference value
- the electronic measuring instrument comprising: an input unit, through which a user inputs a measurement frequency value to be measured to the measuring instrument; and a control unit for reading the measurement reference value from the reference value storage unit based on the measurement frequency value input through the input unit and the measured value, the measurement reference value corresponding to the measurement frequency value and the measured value of the input signal being stored in the reference value storage unit.
- control unit further comprises an operation unit that calculates a measurement reference value to be stored in the reference value storage, and the measurement reference value calculation is performed based on two adjacent measurement reference values.
- Fig. 1 is a block diagram depicting essential elements of a system for setting a measurement reference value for a conventional electronic measuring instrument
- Fig. 2 is a block diagram depicting essential elements of an electronic measuring instrument 10 in accordance with the present invention and a system for setting a measurement reference value for the measuring instrument;
- Fig. 3 is a diagram showing a memory map configuration of a reference value storage unit of Fig. 2;
- Fig. 4 is a diagram illustrating a method of setting a measurement reference value in accordance with the present invention.
- Fig. 2 is a block diagram depicting essential elements of an electronic measuring instrument 10 in accordance with a preferred embodiment of the present invention and a system for setting a measurement reference value for the measuring instrument, in which the same elements as those in Fig. 1 have the same reference numerals and their detailed description will be omitted.
- an electronic measuring instrument 10 in accordance with a preferred embodiment of the present invention comprises an amplifier 11, an IF circuit 12 and a signal processor 13. These elements are to measure the magnitudes of frequency signals input from the outside of the measuring instrument 10. The measured value measured in the signal processor 13 is applied to a control unit 30.
- Fig. 3 is a diagram showing a memory map configuration of the reference value storage unit 20 in the preferred embodiment of the present invention. As depicted in the figure, measurement reference values based on measured values (0-n) for plural frequencies (fl-fn) are stored in the reference storage unit 20.
- the reference value storage unit 14 merely stores measurement reference values corresponding to the measured values .
- the conventional instrument shown in Fig. 1 performs hardware and software adjustments so that the signal having the same magnitude input through the amplifier 11 obtains the same measure value from the signal processor 13 regardless of its frequency value.
- the conventional hardware and software adjustments are simplified and, instead, measurement reference values based on measured values (0-n) for plural frequencies (fl-fn) are stored correspondingly to each other in the reference storage unit 20.
- the intervals between the respective frequencies (fl-fn) and measured values (0-n) are set appropriately and equivalently according to the properties or precision of the measuring instrument.
- an input unit 40 is provided so that a user inputs a value or a range of a frequency (ies) to be measured through this measuring instrument.
- This input unit 40 is a general one.
- the user executes a frequency analysis by setting a measurement frequency through the input unit 40 and, then, inputting a frequency signal to be measured to this measuring instrument.
- the control unit 30 functions to control the overall instrument.
- the control unit 30 performs a measurement mode in which the user carries out the frequency analysis using this instrument and a measurement reference value setting mode in which the measurement reference values are set in the reference value storage unit 20.
- the control unit 30 includes an operation unit 31 for performing an operation process required for setting the measurement reference values.
- the operation unit 31 is composed of hardware or software. The operation unit 31 will be described in detail hereafter.
- the control unit 30 reads a measurement reference value from the reference value storage unit 20 based on the frequency value preset through the input unit 40 and the input measured value and provides an absolute physical value read like this to the signal processor 13 as a measurement reference value for the measured value.
- a measurement reference value corresponding to the measured value is stored in the reference value storage unit 20 and this measurement reference value is stored correspondingly to the input frequency and its measured value, respectively. Accordingly, in the above embodiment, it is possible to decide the absolute physical value accurately even in the case where the measured value by the signal processor 13 is varied according to the frequency vale of the signal input from the outside. That is, the operation of executing the hardware or software adjustment for maintaining the precision of the measurement is omitted or very simplified.
- the external control unit 2 applies the frequency value and its magnitude value to be measured to the signal generator 3 and, at the same time, provides the same values to the control unit 30.
- the frequency value and its magnitude value which are the objects of the measurement, i.e., the measuring points 21 are preset programmatically.
- the number and the locations of the measuring points have an effect on the precision of the measuring instrument and the time required for setting the measurement reference values, it is desirable that they be set appropriately by considering the properties of the measuring instrument and so on.
- the signal generator 3 generates a frequency signal having a predetermined magnitude based on the frequency value and its magnitude value applied from the external control unit 2, and the generated frequency signal is input to the measuring instrument 10 and its magnitude value is measured by the signal processor 13. Then, the signal processor 13 applies the measured value to the control unit 30.
- the control unit 30 stores the magnitude value applied from the external control unit 2, i.e., the absolute physical value of the frequency signal currently input, in the reference value storage unit 20, as a measurement reference value, based on the frequency value applied from the external control unit 2 and the measured value applied from the signal processor 13.
- the measurement reference value storage is executed for all preset measuring points.
- the measurement reference value setting operation for the measuring points is performed repeatedly, for example, 10 to 20 times, and the most desirable result value is stored in the reference value storage unit 20.
- the decision for the desirable result value is executed through a method in that the maximum and minimum values among the obtained measured values are taken off and then the rest values are averaged or the most frequent result value is selected.
- control unit 30 calculates measurement reference values, not yet set, by driving the operation unit 31.
- the operation unit 31 is composed of software or hardware.
- the operation unit 31 calculates unset values adjacent to measuring point values through a nonlinear equation using a bisection method, a fixed point iteration method, a Newton-Raphson method, etc., or a linear equation using a numerical differentiation method based on Taylor series or Richardson's extrapolation.
- This unset value calculation is not limited to a specific algorithm or method, and any algorithm that can decide unknown values exist between two values having a linear or nonlinear relation with each other is available.
- the measurement reference value setting operation is made only for a portion of the measuring points among the whole measurement reference values to be stored in the reference value storage unit 20 using the external control unit 2.
- the other unset measurement reference values are calculated through an operation algorithm and stored. Accordingly, it is possible to perform the measurement reference value setting operation for the reference value storage unit 20 very simply and readily and maintain the precision for measurement reference value setting operation over a desirable level.
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Abstract
Disclosed relates to a method of setting a measurement reference value for deciding a magnitude value of an measurement frequency, input to an electronic measuring instrument such as a frequency spectrum analyzer, and an electronic measuring instrument therefor. The electronic measuring instrument in accordance with the present invention comprises: a signal processor 13 for measuring a magnitude of a frequency signal input from the outside and generating a measured value; a reference value storage unit 20, in which an absolute physical value corresponding to the measured value measured by the signal processor 13 as a measurement reference value; an input unit 40, through which a user inputs a measurement frequency value to be measured to the measuring instrument; and a control unit 30 for reading the measurement reference value from the reference value storage unit 20 based on the measurement frequency value input through the input unit 40 and the measured value. The control unit 30 storing the measurement reference values in the reference value storage unit 20 calculates other measurement reference values than a measuring point based on adjacent measurement reference values using a linear or non linear equation.
Description
[DESCRIPTION]
[invention Title]
METHOD OF SETTING KEFEEENCE VALUE FOR ELECTRONIC MEASURING INSTRUMENT AND MEASURING INSTRUMENT THEREFOR
[Technical Field]
The present invention relates to an electronic measuring instrument such as a frequency spectrum analyzer and, more particularly, to a method of setting a measurement reference value for deciding a magnitude value of an input frequency for the measurement, and a measuring instrument therefor.
[Background Art] In general, various kinds of measuring instruments have been used for carrying out experiments or developing new products in electric and electronic fields . Such measuring instrument includes an oscilloscope, a spectrum analyzer and the like. The measuring instrument is used for analyzing magnitude data such as voltage values, current values, magnitude values, phase values, etc. of input analog signals .
In the measuring instrument that processes input analog signals digitally, a measurement reference value is preset as an absolute value corresponding to a measured
value of an input signal. Then, the magnitude value of the input signal is decided based on the measurement reference value. Here, since the precision of the measurement reference value has a direct relation with the precision of the product, it is necessary to set the measurement reference value very cautiously.
Fig. 1 is a diagram for illustrating a process of setting a measurement reference value applied to the existing spectrum analyzer. In the figure, reference numeral 1 denotes a measuring instrument such as a spectrum analyzer, numeral 2 denotes an external control unit for setting a measurement reference value in the measuring instrument 1, and numeral 3 denotes a signal generator that generates and outputs signals having a series of magnitudes and frequencies in accordance with the control of the external control unit 2.
The measuring instrument 1 comprises an amplifier 11, an intermediate frequency (IF) circuit 12, a signal processor 13, a reference value storage unit 14 and a control unit 15, as schematically depicted in Fig. 1.
The amplifier 11 amplifies an input frequency signal, and the IF circuit 12 converts the frequency of input signal into an intermediate frequency signal for the process of the measuring instrument. The signal processor 13 analog/digital-converts a level of the input signal to apply
the same to the control unit 15 and supplies a magnitude value of the input signal based on an absolute magnitude data applied from the control unit 15 to a display device as a measurement result value that outputs the measurement result value as visual data. The data value that the signal processor 13 measures the level of the input signal from the outside and applies to the control unit 15 is hereinafter referred to as a measured value and an actual physical level value corresponding to the measured value is referred to as a measurement reference value.
Moreover, the reference value storage unit 14 stores an absolute magnitude value corresponding to the level value of the input signal obtained from the signal processor 13, as a measurement reference value. The control unit 15 controls the overall measuring instrument 1. The control unit 15 basically connected with the external control unit 2 stores the measurement reference value in the reference value storage unit 14, reads the measurement reference value, corresponding to the measured value applied from the signal processor 13, from the reference value storage unit 14 and applied the same to the signal processor 13.
As the external control unit 2 a personal computer may be used. The external control unit 2 is connected to the control unit 15 or the signal generator 3 through RS232C,
for example. The external control unit 2 transmits a frequency value and a magnitude value for the signal generation to the signal generator 3 and applies the same to the control unit 15. The operation of the external control unit 2 will be described in detail hereafter.
The signal generator 3 generates a frequency signal having a predetermined magnitude in accordance with the control data applied from the external control unit 2. The frequency signal generated like this is input to the measuring instrument 1.
In the above configuration, the external control unit 2 transmits the frequency value and its magnitude value to the signal generator 3 and applies the magnitude value data to the control unit 15. The frequency signal of a predetermined magnitude value output from the signal generator 3 is applied to the signal processor 13 through the amplifier 11 and the IF circuit 12. The signal processor 13 detects the level of the input signal and applies the same to the control unit 15. The control unit 15 stores the magnitude value data, applied from the external control unit 2 corresponding to the signal level value applied from the signal processor 13, in the reference value storage unit 14 as an absolute measurement reference value . The external control unit 2 and the control unit 15
store absolute magnitudes value corresponding to a series of level values applied from the signal processor 13 in the reference value storage unit 14 as a measurement reference value, by modifying the magnitude value for a frequency signal step by step through the above operation repeatedly.
Subsequently, in a normal operation state where an actual measurement is executed using the measuring instrument, if a level value of the frequency signal is input from the signal processor 13, the control unit 15 reads an absolute magnitude value corresponding to the level value from the reference storage unit 14 and applies the same to the signal processor 13, and the signal processor 13 displays the level value of the corresponding input signal based on the magnitude value input from the control unit 15. Meanwhile, in electronic and electric circuits, the magnitude value may be varied according to the frequency of the signal transmitted through the corresponding circuit, and the frequency signal applied to the signal processor 13 may be also varied due to minute errors of an oscillator used for the intermediate frequency conversion in the IF circuit 12, thus causing a change in the level value of the signal detected in the signal processor 13. That is, a signal having the same magnitude input through the amplifier 11 may be detected as another level signal in the signal processor 13 in accordance with its frequency. In this case,
the absolute magnitude value applied from the control unit 15 to the signal processor 13 is varied, thus causing a problem in that the different measurement result value is provided. Taking the above-described circumferences into consideration, conventional methods for identically performing the level measurement by signal magnitudes for a plurality of frequency signals and, then, executing software and hardware compensations for removing the level differences between the signals have been adopted.
However, the above-described methods require much time for performing the level measurement for various input signals and, further, much time and great efforts to execute the software and hardware compensations, thus causing a problem in that the price of the measuring instrument becomes higher.
[Disclosure] [Technical Problem] The present invention has been contrived taking the above-described circumstances into consideration and, an object of the present invention is to provide a method of setting a measurement reference value for an electronic measuring instrument that can set the measurement reference value for the measuring instrument readily and simply, and a
measuring instrument therefor.
[Technical Solution]
To accomplish the object of the present invention, there is provided a method of setting a measurement reference value for an electronic measuring instrument in accordance with a first aspect of the present invention comprising a signal processing unit for measuring a magnitude of a frequency signal input from the outside, a reference value storage unit, in which an absolute physical value corresponding to a measured value measured by the signal processing unit is stored, and a control unit for controlling the reference value storage for the reference value storage unit, the method comprising: a step of setting a measuring point that executes the measurement in the measuring instrument; a step of inputting a measured signal corresponding to the measuring point set in the step of setting a measuring point to the measuring instrument/ a step of inputting an absolute physical value of the measured signal to the control unit as a measurement reference value; a step of measuring a signal magnitude input to the measuring instrument and generating a measured value by means of the signal processing unit; a first measurement reference value setting step of setting a measurement reference value for the measuring point in the reference
value storage unit based on the measured value and the measurement reference value by means of the control unit; and a second measurement reference value setting step of setting measurement reference values for other points than the measuring point based on the measurement reference value set in the first setting step by means of the control unit. Moreover, the step of inputting a measured signal and the step of measuring a signal magnitude are performed for a measuring point repeatedly. Furthermore, the second measurement reference value setting step is executed using a linear equation.
In addition, the second measurement reference value setting step is executed using a nonlinear equation.
To accomplish the object of the present invention, there is provided an electronic measuring instrument in accordance with a second aspect of the present invention that comprises a signal processing unit for measuring a magnitude of a frequency signal input from the outside and a reference value storage unit, in which an absolute physical value corresponding to the measured value measured by the signal processing unit as a measurement reference value, and displays a magnitude value of the input frequency signal based on the measurement reference value, the electronic measuring instrument comprising: an input unit, through which a user inputs a measurement frequency value to be
measured to the measuring instrument; and a control unit for reading the measurement reference value from the reference value storage unit based on the measurement frequency value input through the input unit and the measured value, the measurement reference value corresponding to the measurement frequency value and the measured value of the input signal being stored in the reference value storage unit.
Moreover, the control unit further comprises an operation unit that calculates a measurement reference value to be stored in the reference value storage, and the measurement reference value calculation is performed based on two adjacent measurement reference values.
[Description of Drawings] The above and other features of the present invention will be described with reference to certain exemplary embodiments thereof illustrated the attached drawings in which:
Fig. 1 is a block diagram depicting essential elements of a system for setting a measurement reference value for a conventional electronic measuring instrument;
Fig. 2 is a block diagram depicting essential elements of an electronic measuring instrument 10 in accordance with the present invention and a system for setting a measurement reference value for the measuring instrument;
Fig. 3 is a diagram showing a memory map configuration of a reference value storage unit of Fig. 2; and
Fig. 4 is a diagram illustrating a method of setting a measurement reference value in accordance with the present invention.
[Mode for the invention]
Hereinafter, the preferred embodiment of the present invention will now be described in detail with reference to the accompanying drawings. In the below embodiment, the description will be made by exemplifying a spectrum analyzer to which the present invention is applied. However, such exemplification is not intended to limit the scope of the present invention. The present invention can be applied in the same manner to any electronic measuring instrument that stores an absolute physical value as a measurement reference value and provides the absolute physical value for a measured value measured from an input signal based on the measurement reference value. Fig. 2 is a block diagram depicting essential elements of an electronic measuring instrument 10 in accordance with a preferred embodiment of the present invention and a system for setting a measurement reference value for the measuring instrument, in which the same elements as those in Fig. 1 have the same reference numerals and their detailed
description will be omitted.
In the figure, an electronic measuring instrument 10 in accordance with a preferred embodiment of the present invention comprises an amplifier 11, an IF circuit 12 and a signal processor 13. These elements are to measure the magnitudes of frequency signals input from the outside of the measuring instrument 10. The measured value measured in the signal processor 13 is applied to a control unit 30.
Then, the control unit 30 reads an absolute physical value, i.e., a measurement reference value, corresponding to the measured value applied from the signal processor 13, from a reference value storage unit 20 and provides the same to the signal processor 13. The signal processor 13 displays the magnitude value of the input frequency signal based on the measurement reference value applied from the control unit 30, through a display device, not depicted in the figure. The above operation is substantially identical with that of the conventional measuring instrument 1 shown in Fig. 1. Fig. 3 is a diagram showing a memory map configuration of the reference value storage unit 20 in the preferred embodiment of the present invention. As depicted in the figure, measurement reference values based on measured values (0-n) for plural frequencies (fl-fn) are stored in the reference storage unit 20.
In the conventional instrument shown in Fig. 1, the reference value storage unit 14 merely stores measurement reference values corresponding to the measured values . As described above, the conventional instrument shown in Fig. 1 performs hardware and software adjustments so that the signal having the same magnitude input through the amplifier 11 obtains the same measure value from the signal processor 13 regardless of its frequency value.
In this embodiment, the conventional hardware and software adjustments are simplified and, instead, measurement reference values based on measured values (0-n) for plural frequencies (fl-fn) are stored correspondingly to each other in the reference storage unit 20. Here, the intervals between the respective frequencies (fl-fn) and measured values (0-n) are set appropriately and equivalently according to the properties or precision of the measuring instrument.
In Fig. 2, an input unit 40 is provided so that a user inputs a value or a range of a frequency (ies) to be measured through this measuring instrument. This input unit 40 is a general one. The user executes a frequency analysis by setting a measurement frequency through the input unit 40 and, then, inputting a frequency signal to be measured to this measuring instrument. The control unit 30 functions to control the overall
instrument. The control unit 30 performs a measurement mode in which the user carries out the frequency analysis using this instrument and a measurement reference value setting mode in which the measurement reference values are set in the reference value storage unit 20. The control unit 30 includes an operation unit 31 for performing an operation process required for setting the measurement reference values. The operation unit 31 is composed of hardware or software. The operation unit 31 will be described in detail hereafter.
In the measurement mode, if a measured value is input from the signal processor 13, the control unit 30 reads a measurement reference value from the reference value storage unit 20 based on the frequency value preset through the input unit 40 and the input measured value and provides an absolute physical value read like this to the signal processor 13 as a measurement reference value for the measured value.
In the measuring instrument 10 in accordance with the above embodiment, a measurement reference value corresponding to the measured value is stored in the reference value storage unit 20 and this measurement reference value is stored correspondingly to the input frequency and its measured value, respectively. Accordingly, in the above embodiment, it is possible to decide the
absolute physical value accurately even in the case where the measured value by the signal processor 13 is varied according to the frequency vale of the signal input from the outside. That is, the operation of executing the hardware or software adjustment for maintaining the precision of the measurement is omitted or very simplified.
Accordingly, it is possible to simplify the manufacturing process of the measuring instrument and reduce its manufacturing cost sharply. Next, a method of setting a measurement reference value in the reference value storage unit 20 of the measuring instrument 10 will be described below.
In the measuring instrument depicted in Fig. 2, there are a great number of measurement reference values to be stored in the reference value storage unit 20. Accordingly, if these measurement reference values are set one by one using the external control unit 2 and the signal generator 3 the same manner as the conventional art, it requires much time and great effects to set the measurement reference values.
In the method in accordance with this embodiment, only a portion of values out of the measurement reference values to be stored in the reference value storage unit 20 are set through the above-described process, and the other values are set through an appropriate operation process, thus
setting all measurement reference values readily and simply.
In the method of this embodiment, as depicted in Fig. 4 with black dots, only a portion of measurement reference values corresponding to measuring points 21 are set in connection with the external control unit 2. That is, the same as described in Fig. 1, the external control unit 2 applies the frequency value and its magnitude value to be measured to the signal generator 3 and, at the same time, provides the same values to the control unit 30. Here, the frequency value and its magnitude value, which are the objects of the measurement, i.e., the measuring points 21 are preset programmatically. Moreover, since the number and the locations of the measuring points have an effect on the precision of the measuring instrument and the time required for setting the measurement reference values, it is desirable that they be set appropriately by considering the properties of the measuring instrument and so on.
The signal generator 3 generates a frequency signal having a predetermined magnitude based on the frequency value and its magnitude value applied from the external control unit 2, and the generated frequency signal is input to the measuring instrument 10 and its magnitude value is measured by the signal processor 13. Then, the signal processor 13 applies the measured value to the control unit 30.
The control unit 30 stores the magnitude value applied from the external control unit 2, i.e., the absolute physical value of the frequency signal currently input, in the reference value storage unit 20, as a measurement reference value, based on the frequency value applied from the external control unit 2 and the measured value applied from the signal processor 13.
The measurement reference value storage is executed for all preset measuring points. Preferably, the measurement reference value setting operation for the measuring points is performed repeatedly, for example, 10 to 20 times, and the most desirable result value is stored in the reference value storage unit 20. Here, the decision for the desirable result value is executed through a method in that the maximum and minimum values among the obtained measured values are taken off and then the rest values are averaged or the most frequent result value is selected.
If specific measurement reference values are set in the reference value storage unit 20 through the above- described process, the control unit 30 calculates measurement reference values, not yet set, by driving the operation unit 31.
As described above, the operation unit 31 is composed of software or hardware. The operation unit 31 calculates unset values adjacent to measuring point values through a
nonlinear equation using a bisection method, a fixed point iteration method, a Newton-Raphson method, etc., or a linear equation using a numerical differentiation method based on Taylor series or Richardson's extrapolation. This unset value calculation is not limited to a specific algorithm or method, and any algorithm that can decide unknown values exist between two values having a linear or nonlinear relation with each other is available.
If the setting operation for the unset values is completed through the above-described operation process, the measurement reference value setting operation is terminated.
In the above-described method, the measurement reference value setting operation is made only for a portion of the measuring points among the whole measurement reference values to be stored in the reference value storage unit 20 using the external control unit 2. Here, the other unset measurement reference values are calculated through an operation algorithm and stored. Accordingly, it is possible to perform the measurement reference value setting operation for the reference value storage unit 20 very simply and readily and maintain the precision for measurement reference value setting operation over a desirable level.
As above, preferred embodiments of the present invention have been described and illustrated, however, the present invention is not limited thereto, rather, it should
be understood that various modifications and variations of the present invention can be made thereto by those skilled in the art without departing from the spirit and the technical scope of the present invention as defined by the appended claims .
[industrial Applicability]
According to the present invention as described above, it is possible to materialize a method of setting a measurement reference value for an electronic measuring instrument, in which the measurement reference value setting operation for the measuring instrument is executed very readily and simply, and provide a measuring instrument therefor.
Claims
[CLAIMS]
[Claim l]
A method of setting a measurement reference value for an electronic measuring instrument comprising a signal processing unit for measuring a magnitude of a frequency signal input from the outside, a reference value storage unit, in which an absolute physical value corresponding to a measured value measured by the signal processing unit is stored, and a control unit for controlling the reference value storage for the reference value storage unit, the method comprising: a step of setting a measuring point that executes the measurement in the measuring instrument; a step of inputting a measured signal corresponding to the measuring point set in the step of setting a measuring point to the measuring instrument; a step of inputting an absolute physical value of the measured signal to the control unit as a measurement reference value; a step of measuring a signal magnitude input to the measuring instrument and generating a measured value by means of the signal processing unit; a first measurement reference value setting step of setting a measurement reference value for the measuring point in the reference value storage unit based on the measured value and the measurement reference value by means of the control unit; and a second measurement reference value setting step of setting measurement reference values for other points than the measuring point based on the measurement reference value set in the first setting step by means of the control unit.
[Claim 2]
The method of setting a measurement reference value for an electronic measuring instrument as recited in claim 1, wherein the step of inputting a measured signal and the step of measuring a signal magnitude are performed for a measuring point plural times repeatedly.
[Claim 3]
The method of setting a measurement reference value for an electronic measuring instrument as recited in claim 1, wherein the second measurement reference value setting step is executed using a linear equation.
[Claim 4]
The method of setting a measurement reference value for an electronic measuring instrument as recited in claim I1 wherein the second measurement reference value setting step is executed using a nonlinear equation.
[Claim 5]
An electronic measuring instrument that comprises a signal processing unit for measuring a magnitude of a frequency signal input from the outside and a reference value storage unit, in which an absolute physical value corresponding to the measured value measured by the signal processing unit as a measurement reference value, and displays a magnitude value of the input frequency signal based on the measurement reference value, the electronic measuring instrument comprising: an input unit, through which a user inputs a measurement frequency value to be measured to the measuring instrument; and a control unit for reading the measurement reference value from the reference value storage unit based on the measurement frequency value input through the input unit and the measured value, the measurement reference value corresponding to the measurement frequency value and the measured value of the input signal being stored in the reference value storage unit .
[Claim 6] The electronic measuring instrument as recited in claim 1, wherein the control unit further comprises an operation unit that calculates a measurement reference value to be stored in the reference value storage, and the measurement reference value calculation is performed based on two adjacent measurement reference values.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2006-0108945 | 2006-11-06 | ||
| KR1020060108945A KR20080040943A (en) | 2006-11-06 | 2006-11-06 | Method of setting reference value for electronic measuring instrument and measuring instrument therefor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2008056846A1 true WO2008056846A1 (en) | 2008-05-15 |
Family
ID=39364646
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/KR2006/004872 WO2008056846A1 (en) | 2006-11-06 | 2006-11-20 | Method of setting reference value for electronic measuring instrument and measuring instrument therefor |
Country Status (2)
| Country | Link |
|---|---|
| KR (1) | KR20080040943A (en) |
| WO (1) | WO2008056846A1 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101294334B1 (en) * | 2012-06-05 | 2013-08-08 | 이영재 | Apparatus for testing without display panel the control pcb for display unit, and the method therefor |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR19990079610A (en) * | 1998-04-07 | 1999-11-05 | 윤종용 | Level detection device and method having automatic reference voltage setting function |
| US6294921B1 (en) * | 1997-10-01 | 2001-09-25 | International Business Machines Corp. | Apparatus for testing an integrated circuit device |
| KR20050042388A (en) * | 2003-11-03 | 2005-05-09 | 주식회사 케이티 | Power supply instrument |
| JP2006203369A (en) * | 2005-01-18 | 2006-08-03 | Sanyo Electric Co Ltd | Voltage-frequency converting device and reference voltage generating method of the voltage-frequency converting device |
-
2006
- 2006-11-06 KR KR1020060108945A patent/KR20080040943A/en not_active Application Discontinuation
- 2006-11-20 WO PCT/KR2006/004872 patent/WO2008056846A1/en active Application Filing
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6294921B1 (en) * | 1997-10-01 | 2001-09-25 | International Business Machines Corp. | Apparatus for testing an integrated circuit device |
| KR19990079610A (en) * | 1998-04-07 | 1999-11-05 | 윤종용 | Level detection device and method having automatic reference voltage setting function |
| KR20050042388A (en) * | 2003-11-03 | 2005-05-09 | 주식회사 케이티 | Power supply instrument |
| JP2006203369A (en) * | 2005-01-18 | 2006-08-03 | Sanyo Electric Co Ltd | Voltage-frequency converting device and reference voltage generating method of the voltage-frequency converting device |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20080040943A (en) | 2008-05-09 |
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