WO2008052377A3 - Method and measuring system for measuring a physical quantity - Google Patents

Method and measuring system for measuring a physical quantity Download PDF

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Publication number
WO2008052377A3
WO2008052377A3 PCT/CH2007/000534 CH2007000534W WO2008052377A3 WO 2008052377 A3 WO2008052377 A3 WO 2008052377A3 CH 2007000534 W CH2007000534 W CH 2007000534W WO 2008052377 A3 WO2008052377 A3 WO 2008052377A3
Authority
WO
WIPO (PCT)
Prior art keywords
reference signal
signal input
computation unit
signal
measuring
Prior art date
Application number
PCT/CH2007/000534
Other languages
German (de)
French (fr)
Other versions
WO2008052377A2 (en
Inventor
Lars Kamm
Werner Hinn
Roman Baumann
Original Assignee
Hsr Hochschule Fuer Technik Ra
Lars Kamm
Werner Hinn
Roman Baumann
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hsr Hochschule Fuer Technik Ra, Lars Kamm, Werner Hinn, Roman Baumann filed Critical Hsr Hochschule Fuer Technik Ra
Publication of WO2008052377A2 publication Critical patent/WO2008052377A2/en
Publication of WO2008052377A3 publication Critical patent/WO2008052377A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
    • G01D18/008—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00 with calibration coefficients stored in memory
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/028—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
    • G01D3/036—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves
    • G01D3/0365—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves the undesired influence being measured using a separate sensor, which produces an influence related signal

Abstract

The invention relates to a method for measuring a physical quantity by means of a measuring system comprising a measuring sensor, a signal source and a computation unit, wherein the computation unit has a reference signal input, a measurement signal input and a signal output and generates an amplified difference between a measurement signal and a reference signal as output signal. In the method, a reference signal is applied both to the reference signal input and to the measurement signal input of the computation unit, an offset error of the measuring system is determined from the resultant output signal of the computation unit, an attenuated reference signal is applied to the reference signal input and the reference signal is applied to the measurement signal input and an actual gain quantity is determined by the difference between the then resultant output signal of the computation unit and the previously calculated offset error, then the reference signal is applied to the reference signal input and a measurement signal is applied to the measurement signal input and a corrected output signal is determined by forming the difference between the resultant output signal of the computation unit and the offset error and the actual gain quantity is compared with a predetermined desired gain quantity and a total gain of the measuring system is reduced if the actual gain quantity is greater than the desired gain quantity, or increased if the desired gain quantity is greater than the actual gain quantity. The invention furthermore relates to a measuring system for carrying out such a method.
PCT/CH2007/000534 2006-11-02 2007-10-29 Method and measuring system for measuring a physical quantity WO2008052377A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CH17402006A CH698811B1 (en) 2006-11-02 2006-11-02 The method and measurement system for detecting and processing a physical quantity.
CH1740/06 2006-11-02

Publications (2)

Publication Number Publication Date
WO2008052377A2 WO2008052377A2 (en) 2008-05-08
WO2008052377A3 true WO2008052377A3 (en) 2008-08-21

Family

ID=39344618

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CH2007/000534 WO2008052377A2 (en) 2006-11-02 2007-10-29 Method and measuring system for measuring a physical quantity

Country Status (2)

Country Link
CH (1) CH698811B1 (en)
WO (1) WO2008052377A2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102012024893B4 (en) * 2012-12-20 2017-01-26 Krohne Messtechnik Gmbh Measuring arrangement for determining a measured variable and method for generating an output signal
CN104614002B (en) * 2015-01-04 2017-02-22 中国科学院光电技术研究所 Subdivided signal error compensation method of photoelectric encoder of tracking control platform

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2072349A (en) * 1980-03-18 1981-09-30 Gaeltec Ltd Conditioning pressure transducer outputs
US4364028A (en) * 1978-06-30 1982-12-14 Tokyo Shibaura Denki Kabushiki Kaisha Integrating analog to digital converter having offset error compensation
US4873655A (en) * 1987-08-21 1989-10-10 Board Of Regents, The University Of Texas System Sensor conditioning method and apparatus
JPH0972757A (en) * 1995-09-01 1997-03-18 Murata Mfg Co Ltd Microcapacitance detection circuit
EP1037017A1 (en) * 1999-03-15 2000-09-20 Atsutoshi Goto Inductive position detector

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4364028A (en) * 1978-06-30 1982-12-14 Tokyo Shibaura Denki Kabushiki Kaisha Integrating analog to digital converter having offset error compensation
GB2072349A (en) * 1980-03-18 1981-09-30 Gaeltec Ltd Conditioning pressure transducer outputs
US4873655A (en) * 1987-08-21 1989-10-10 Board Of Regents, The University Of Texas System Sensor conditioning method and apparatus
JPH0972757A (en) * 1995-09-01 1997-03-18 Murata Mfg Co Ltd Microcapacitance detection circuit
EP1037017A1 (en) * 1999-03-15 2000-09-20 Atsutoshi Goto Inductive position detector

Also Published As

Publication number Publication date
CH698811B1 (en) 2009-10-30
WO2008052377A2 (en) 2008-05-08

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