WO2008032736A1 - Dye-containing resist composition containing photoacid generator, and cyclohexadiene-type oxime sulfonate compound - Google Patents

Dye-containing resist composition containing photoacid generator, and cyclohexadiene-type oxime sulfonate compound Download PDF

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Publication number
WO2008032736A1
WO2008032736A1 PCT/JP2007/067726 JP2007067726W WO2008032736A1 WO 2008032736 A1 WO2008032736 A1 WO 2008032736A1 JP 2007067726 W JP2007067726 W JP 2007067726W WO 2008032736 A1 WO2008032736 A1 WO 2008032736A1
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group
carbon atoms
dye
compound
resist composition
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PCT/JP2007/067726
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French (fr)
Japanese (ja)
Inventor
Hideo Suzuki
Tomoe Miyazawa
Takamasa Kikuchi
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Nissan Chemical Industries, Ltd.
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Publication of WO2008032736A1 publication Critical patent/WO2008032736A1/en

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    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07CACYCLIC OR CARBOCYCLIC COMPOUNDS
    • C07C309/00Sulfonic acids; Halides, esters, or anhydrides thereof
    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07CACYCLIC OR CARBOCYCLIC COMPOUNDS
    • C07C255/00Carboxylic acid nitriles
    • C07C255/63Carboxylic acid nitriles containing cyano groups and nitrogen atoms further bound to other hetero atoms, other than oxygen atoms of nitro or nitroso groups, bound to the same carbon skeleton
    • C07C255/64Carboxylic acid nitriles containing cyano groups and nitrogen atoms further bound to other hetero atoms, other than oxygen atoms of nitro or nitroso groups, bound to the same carbon skeleton with the nitrogen atoms further bound to oxygen atoms
    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07CACYCLIC OR CARBOCYCLIC COMPOUNDS
    • C07C309/00Sulfonic acids; Halides, esters, or anhydrides thereof
    • C07C309/63Esters of sulfonic acids
    • C07C309/64Esters of sulfonic acids having sulfur atoms of esterified sulfo groups bound to acyclic carbon atoms
    • C07C309/65Esters of sulfonic acids having sulfur atoms of esterified sulfo groups bound to acyclic carbon atoms of a saturated carbon skeleton
    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07CACYCLIC OR CARBOCYCLIC COMPOUNDS
    • C07C309/00Sulfonic acids; Halides, esters, or anhydrides thereof
    • C07C309/63Esters of sulfonic acids
    • C07C309/72Esters of sulfonic acids having sulfur atoms of esterified sulfo groups bound to carbon atoms of six-membered aromatic rings of a carbon skeleton
    • C07C309/73Esters of sulfonic acids having sulfur atoms of esterified sulfo groups bound to carbon atoms of six-membered aromatic rings of a carbon skeleton to carbon atoms of non-condensed six-membered aromatic rings
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0005Production of optical devices or components in so far as characterised by the lithographic processes or materials used therefor
    • G03F7/0007Filters, e.g. additive colour filters; Components for display devices
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/0045Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/20Filters
    • G02B5/22Absorbing filters
    • G02B5/223Absorbing filters containing organic substances, e.g. dyes, inks or pigments

Definitions

  • Dye-containing resist composition containing photoacid generator and cyclohexagen-based oxime sulfonate compound
  • the present invention relates to a dye-containing resist composition containing a photoacid generator and a cyclohexagen-based oxime sulfonate compound. More specifically, the present invention relates to a dye-containing composition containing a photoacid generator corresponding to i-line (365 nm). The present invention relates to a resist composition.
  • a color filter for an image sensor such as a charge coupled device (CCD) or a liquid crystal display device (LCD) is capable of producing a high-definition color filter mainly because a fine pattern can be formed. Therefore, it is produced using a method of forming a pattern with a photoresist added with a dye.
  • a resist composition containing a dye and a polymer resin is used. After coating the film on a substrate, the colored layer is patterned and developed by a photolithography method to form a single colored pattern. Then, this process is repeated for each color to produce a color filter.
  • pigments that are excellent in heat resistance and light stability are generally used as the coloring agent used as the colorant, and resists in which pigments are dispersed have been proposed.
  • a photosensitive colored resin composition comprising a resin material that can be hardened by an acid, a photoacid generator, and a pigment (for example, Patent Document 1). It is disclosed that the resin material consists of a resin containing phenol and a crosslinking agent having an N-methylol structure.
  • the pigment itself contains particles having a particle size of several tens of nm! / And several hundreds of nm, the pigment itself becomes a foreign substance, or the dispersion is not stable and causes aggregation. There was a problem. For this reason, using conventional pigments makes it difficult to produce color filters for CCDs that require high resolution.
  • a uniform resist composition can be obtained because the dye is soluble in an organic solvent. Therefore, a resist composition in which pigments are dispersed It is possible to form a fine pattern as compared with an object.
  • a negative resist composition comprising a resin curable with an acid, a crosslinking agent, a photoacid generator, a dye and a solvent is disclosed (for example, Patent Document 2).
  • a resist-added dye for a color filter that is an amine salt of an acid dye and is soluble in an organic solvent and an alkaline aqueous solution is disclosed (for example, Patent Document 3).
  • an ink composition containing a reaction mixture of a water-soluble dye having active hydrogen, an epoxy compound, and an amine as a colorant. It is described that these are used for writing instruments, printing, recording, stamping, and paper coloring (for example, Patent Document 5).
  • a photoacid generator! / An oxime sulfonate compound that has an excellent absorption coefficient (photosensitivity) for g-line, h-line and i-line, and excellent solubility in solvents. It is known (for example, Patent Document 6).
  • Patent Document 1 Japanese Patent Laid-Open No. 4 163552
  • Patent Document 2 Japanese Patent Laid-Open No. 6-51514
  • Patent Document 3 JP-A-6-51115
  • Patent Document 4 JP-A-60-229953
  • Patent Document 5 Japanese Patent Laid-Open No. 61-203182
  • Patent Document 6 Special Table 2002-508774
  • Patent Document 7 International Publication No. 2006/046398 Pamphlet
  • a dye-containing resist composition using a thiophene oxime sulfonate compound as a photoacid generator is colored by exposure and subsequent heat treatment. Have it!
  • the present invention has been made in view of such circumstances, and an object thereof is to provide a dye-containing resist composition that provides a color filter in which coloring in the visible region (400 nm to 730 nm) is suppressed.
  • Another object of the present invention is to provide a photoacid generator that is excellent in sensitivity to active light used for exposure, in particular, sensitivity to i-line (365 nm), has little coloration by exposure and subsequent heat treatment, and can produce a resist. To do.
  • the present inventors have found that a dye-containing resist composition containing a cyclohexagen-based oxime sulfonate compound as a photoacid generator.
  • the maximum absorption wavelength of the compound having a 2,6-substituted phenyl group almost coincides with the i-line wavelength of 365 nm.
  • the present inventors have completed the present invention by finding that a resist produced using the resist has high light transmittance and little coloring.
  • the present invention provides:
  • R 2 , R 5 , R 6 and R ′ are each independently a hydrogen atom, a halogen atom, CN, NO, an alkyl group having 1 to 10 carbon atoms, or an alkoxy group having 1 to 5 carbon atoms. Represents a haloalkyl group having 1 to 5 carbon atoms or a haloalkoxy group having 1 to 5 carbon atoms,
  • R 3 represents a hydrogen atom, a halogen atom, a nitro group, a CN group, an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms, or the number of carbon atoms.
  • each R 3 may be the same as or different from each other, and when R 3 is adjacent
  • the two adjacent R 3 groups are — CH CH —CH O— — CH N (R 8 ) — — CH CH CH —CH CH O— CH CH N (R CH CH CH CH CH —CH CH CH O— —
  • CH CH CH N (R CH CH CH CH CH CH CH CH O— or one CH CH CH CH N (R 8 ) — By forming CH CH CH N (R CH CH CH CH CH CH CH CH CH CH CH CH CH O— or one CH CH CH N (R 8 ) —, a four-membered ring with the carbon atom to which each of the two R 3 bonds is attached.
  • 5-membered ring or 6-membered ring may be formed
  • R 4 is an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms, a haloalkoxy group having 1 to 5 carbon atoms,
  • R 8 represents a hydrogen atom or an alkyl group having 1 to 10 carbon atoms
  • W is a halogen atom, CN NO, an alkyl group having 1 to 10 carbon atoms, or the number of carbon atoms
  • alkoxy group having 1 to 5 carbon atoms a haloalkyl group having 1 to 5 carbon atoms, or a haloalkoxy group having 1 carbon atom and 5 haloalkoxy groups,
  • n an integer of 1 2 3 or 4.
  • a dye-containing resist composition comprising a photoacid generator comprising a cyclohexadiene oxime sulfonate compound represented by:
  • R 5 to R 7 are all hydrogen atoms, and R 1 and R 2 are each independently a halogen atom, CN NO, an alkyl group having 1 to 10 carbon atoms, or 1 carbon atom.
  • the dye (D) is represented by the formula [2]
  • the dye-containing resist composition according to 6 which comprises a cationic compound represented by:
  • a method for producing a color filter comprising the steps of: applying one dye-containing resist composition onto a substrate, drying, exposing and developing;
  • a liquid crystal display device including a color filter manufactured by 13 methods,
  • LED (light emitting diode) display device including color filters manufactured by 13 methods Place
  • a solid-state imaging device including a color filter manufactured by 13 methods
  • R 1 and R 2 are each independently a halogen atom, CN NO, an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, or Represents a haloalkyl group or a haloalkoxy group having 1 to 5 carbon atoms,
  • R 3 represents a hydrogen atom, a halogen atom, a nitro group, a CN group, an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms, or the number of carbon atoms.
  • each R 3 may be the same as or different from each other, and when R 3 is adjacent
  • the two adjacent R 3 groups are — CH CH —CH O— — CH N (R 8 ) — — CH CH CH —CH CH O— CH CH N (R CH CH CH CH CH —CH CH CH O— —
  • CH CH CH N (R CH CH CH CH CH CH CH CH O— or one CH CH CH CH N (R 8 ) — By forming CH CH CH N (R CH CH CH CH CH CH CH CH CH CH CH CH CH O— or one CH CH CH N (R 8 ) —, a four-membered ring with the carbon atom to which each of the two R 3 bonds is attached.
  • 5-membered ring or 6-membered ring may be formed
  • R 4 is an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms, a haloalkoxy group having 1 to 5 carbon atoms,
  • R 8 represents a hydrogen atom or an alkyl group having 1 to 10 carbon atoms
  • W is a halogen atom, CN NO, an alkyl group having 1 to 10 carbon atoms, or the number of carbon atoms An alkoxy group having 1 to 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms, or a haloalkoxy group having 1 carbon atom and 5 haloalkoxy groups,
  • n an integer of 1 2 3 or 4.
  • R 1 and R 2 are each independently a halogen atom, CN NO, an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, or Represents a haloalkyl group or a haloalkoxy group having 1 to 5 carbon atoms,
  • R 3 represents a hydrogen atom, a halogen atom, a nitro group, a CN group, an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms, or the number of carbon atoms.
  • each R 3 may be the same as or different from each other, and when R 3 is adjacent
  • the two adjacent R 3 groups are — CH CH —CH O— — CH N (R 8 ) — — CH CH CH —CH CH O— CH CH N (R CH CH CH CH CH —CH CH CH O— —
  • a 4-membered ring, a 5-membered ring or a 6-membered ring may be formed together with the carbon atom to which each R 3 is bonded.
  • R 8 represents a hydrogen atom or an alkyl group having 1 to 10 carbon atoms
  • n an integer of 1, 2, 3 or 4.
  • a photoacid generator comprising a cyclohexadiene oxime sulfonate compound represented by the formula [3],
  • An i-line photoacid generator comprising a cyclohexadiene oxime sulfonate compound represented by the formula [3]
  • the dye-containing resist composition of the present invention is less colored by exposure and subsequent heat treatment, thereby making it possible to improve the characteristics of the color filter.
  • a color filter having high heat resistance and light resistance can be produced by the interaction between the phenolic resin and the dye.
  • the dye-containing resist composition of the present invention can be thinned when a color filter is produced by increasing the dye concentration in the resist composition. In order to set the film thickness of the color filter from 0.3 to 1.5 111, the dye concentration in the resist composition must be 30% by mass or more.
  • the resist composition containing the dye molecule and the color filter produced from the resist composition have a region exhibiting a transmittance of 70% or more and a wavelength of 10% or less in the wavelength region of 400 to 700 nm due to the dye molecule.
  • the dye-containing resist composition of the present invention has a region showing a transmittance of 70% or more and a region showing a transmittance of 10% or less in the visible region (400 nm to 730 ⁇ m), particularly 400 to 700 nm. It contains at least a dye exhibiting a spectral spectrum.
  • Dyes such as red, green, and blue have specific areas where each dye absorbs (area where the transmittance is 10% or less) and areas where the dye does not absorb (area where the transmittance is 70% or more). It is preferable that the region does not show absorption, and that the region inhibits absorption of other dyes! When each dye has absorption in a region that does not inherently exhibit absorption, the heat resistance or light resistance of the dye is insufficient.
  • the dye used in the dye-containing resist composition of the present invention has a transmittance of 10% or less in a specific region showing absorption, and has a transmittance in a region showing no absorption.
  • the photoacid generator comprising the cyclohexadiene oxime sulfonate compound of the present invention exhibits high compatibility with the other main components of the resist composition, that is, the resin, the crosslinkable compound, the dye and the solvent.
  • the cyclohexagen-based oxime sulfonate compound having a 2,6-substituted phenyl group according to the present invention has a maximum absorption wavelength almost coincident with the i-line wavelength of 365 nm, and the resist produced using the compound is colored. Has a high light transmittance.
  • the dye-containing resist composition according to the present invention contains a photoacid generator composed of a cyclohexagen-based oxime sulfonate compound represented by the formula [1].
  • R 1 , R 2 , R 5 , R 6 and R 7 are each independently a hydrogen atom, a nitrogen atom, CN, NO, or an alkyl having 1 to 10 carbon atoms.
  • R 3 represents a hydrogen atom, a halogen atom, a nitro group, or a CN group
  • n is 2, 3 or 4 represents each R 3 may be the same or different from each other.
  • R 3 when R 3 is adjacent, two adjacent R 3 are CH 2 CH 2 --CH O CH N (R 8 )--CH CH CH CH CH O CH CH N (R 8 DOO, -CH CH CH CH -CH CH CH O CH CH CH N (RCH CH CH CH CH CH CH CH CH O or by forming a CH CH CH CH N (R 8 ), each of the two R 3 May form a 4-membered ring, a 5-membered ring or a 6-membered ring with the carbon atom to which R is bonded.
  • R 8 represents a hydrogen atom or an alkyl group having 1 to 10 carbon atoms, and n is 1 2 3 Or represents an integer of 4.
  • halogen atom examples include a fluorine atom, a chlorine atom, a bromine atom, and an iodine atom.
  • alkyl group having 1 to 10 carbon atoms include a methyl group, an ethyl group, an n-propyl group, an i-propyl group, an n-butyl group, an i-butyl group, an s-butyl group, an n-amyl group, an i-aminole group, s Amino group, n-hexyl group, n-heptyl group, n-octyl group, n-nonyl group, n-decyl group and the like.
  • alkoxy group having 1 to 5 carbon atoms include a methoxy group, an ethoxy group, an n propoxy group, an i propoxy group, an n -butoxy group, and an n amyloxy group.
  • a haloalkyl group having 1 to 5 carbon atoms Specific examples thereof include trifluoromethyl group, pentafluoroethyl group, perfluoro n propyl group, perfluoro n butyl group, perfluoro n amyl group and the like.
  • haloalkoxy group having 1 to 5 carbon atoms include trifluoromethoxy group, pentafluoroethoxy group, perfluoro n propoxy group, perfluoro n butoxy group, perfluoro n amyloxy group, and the like.
  • R 5 R 6 and R 7 are all hydrogen atoms.
  • R 1 and R 2 are each independently a halogen atom, CN NO, an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, or 1 to 1 carbon atoms.
  • R 3 is preferably a hydrogen atom, preferably a haloalkyl group of 5 or a haloalkoxy group of 1 to 5 carbon atoms.
  • R 1 and R 2 are each independently a halogen atom or a halogen atom, preferably an alkyl group having 1 to 10 carbon atoms.
  • R 1 and R 2 are each independently a chlorine atom or a methyl group, and more preferably a chlorine atom.
  • R 4 represents an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms, or 1 carbon atom.
  • a phenyl group that may be substituted with W a naphthyl group that may be substituted with W, or an anthranyl group that may be substituted with W;
  • W is a halogen atom, CN , NO, an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms, or a haloalkoxy group having 1 to 5 carbon atoms.
  • halogen atom examples include the above R 1 to R 3 and Examples thereof are the same as those described for R 5 to R 8 .
  • phenyl group which may be substituted with W include a phenyl group, o-tolyl group, m-trinole group, p-trinole group, o-ethino-lefinino group, m-ethino-lefinenole group.
  • the naphthyl group which may be substituted with W include 1 naphthyl group, 2-naphthinole group, 2-methyl-1 naphthyl group, 3-methyl-1 naphthyl group, 4-methynole 1 naphthyl group, 5 methyl-1 naphthyl group Group, 6 methyl-1 naphthyl group, 7 methyl 1 naphthyl group, 8 methyl-1 naphthyl group, 1-methyl-2 naphthyl group, 3-methyl-2 naphthyl group, 4-methyl-2 naphthyl group, 5 methyl-2 naphthyl group, 6 methyl-2 naphthyl group 7 methyl-2-naphthyl group, 8 methyl-2-naphthyl group and the like.
  • anthranyl group which may be substituted with W include 1 anthranyl group, 2 anthranyl group, 2-methyl-1 anthranyl group, 3-methyl-1 anthranyl group, 4-methyl-1 anthranyl group, 5-methyl-1 anthranyl group 6-methyl-1-anthranyl group, 7-methyl-1-anthranyl group, 8-methyl-1-anthranyl group, 9-methyl-1-anthranyl group, 10-methyl-1-anthranyl group, 1-methyl-2-anthranolin group, 3-methyl-2-anthranyl group, Examples include 4-methyl-2-anthranyl group, 5-methyl-2-anthranyl group, 6-methyl-2-anthranyl group, 7-methyl-2-anthranyl group, 8-methyl-2-anthranyl group, 9-methyl-2-anthranyl group, and 10-methyl-2-anthranyl group.
  • R 4 is substituted with an alkyl group having 1 to 10 carbon atoms or W and V 4 It is preferably a phenyl group, more preferably a W substituted! /, Or even a phenyl group.
  • W is preferably a halogen atom or an alkyl group having 1 to 10 carbon atoms.
  • R 4 is more preferably a phenyl group or a p-tolyl group, preferably a methinole group, an ethyl group, an n-propyl group, a phenyl group, a p-trinole group, or a pentafluorophenyl group. .
  • photoacid generator comprising the cyclohexadiene oxime sulfonate compound represented by the formula [1] include the following compounds.
  • the dye-containing resist composition of the present invention includes a negative type (negative type) resist and a positive type.
  • the dye-containing resist composition of the present invention comprises a photoacid generator (A), a resin (B), a crosslinkable compound (A) comprising a cyclohexagen oxime sulfonate compound represented by the above formula [1]
  • the photoacid generator (A) to be used is one that generates an acid directly or indirectly by light irradiation.
  • the photoacid generator (A) can be used alone or in combination of two or more thereof.
  • the amount introduced is preferably 1 to 300 parts by mass with respect to 100 parts by mass of the resin (B) component. Is selected in the range of 20 to 200 parts by weight. When this amount is less than 1 part by mass, the bridge reaction does not proceed sufficiently, and it is difficult to obtain a desired resist pattern, and when it exceeds 300 parts by mass, the storage stability of the resist composition is poor.
  • the resin (B) used in the negative resist composition is a resin that cures with an acid generated by heat or light irradiation, or a base generated by heat or light irradiation, heat or light irradiation. If it is a photosensitive resin that crosslinks more and the coating film of the unexposed part in the resin can be removed by a developing solution, it is not particularly limited.
  • Examples of the resin (B) include resins having a hydroxyl group or a carboxyl group, for example, acrylic resins such as polybulal alcohol, polyacrylamide, polyacrylic acid, and polymethacrylic acid, polyamic acid, and polybuhlphenol.
  • Derivatives thereof and copolymers thereof copolymers of polymetatalylate and maleic anhydride, phenol resins, novolak resins, polyimides containing hydroxyl groups and / or carboxyl groups, cellulose, cellulose derivatives, starches, Examples include chitin, chitosan, gelatin, zein, sugar skeleton polymer compound, polyamide, polyethylene terephthalate, polycarbonate, polyurethane, and polysiloxane. These resins are used singly or in combination of two or more. Particularly preferably, the resin (B) is polybutanol or a copolymer thereof.
  • Examples of the copolymerizable monomer include acrylic monomers.
  • (Meth) acrylic acid esters include methyl (meth) acrylate, ethyl (meth) acrylate, propyl (meth) acrylate, butyl (meth) acrylate, hexyl (meth) acrylate, 2-ethyl hexyl ( (Meth) Atarylate, Cyclohexyl (Meth) Atylate, Benzyl (Meth) Atarylate, Dimethylamino (Meth) Atarylate, Hydroxyethyl (Meth) Atarylate, Hydroxypropyl (Meth) Atarylate, Glycidyl (Meth) Atallate is mentioned.
  • Examples of the ethylenically unsaturated carboxylic acid include acrylic acid, methacrylic acid, crotonic acid, maleic acid, fumaric acid, itaconic acid, and acid anhydrides and half esters thereof. Of these, acrylic acid, methacrylic acid, maleic acid, and hydroxypropyl (meth) acrylate are preferable.
  • Polybulfenol a copolymer of polybuhlphenol and the above acrylic monomer has a weight average molecular weight of 1000 to 100,000, and preferably 2000 to 30,000 in terms of developability and adhesion. These can be combined as necessary, and can be used by copolymerizing buluenol with one of the above acrylic monomers, or using buluenol with A copolymer composed of a combination of two or more of the above acrylic monomers can be used.
  • the weight average molecular weight is a relative value in terms of polystyrene.
  • Examples of other compounds used for copolymerization include styrene derivatives such as acrylic acid derivatives, acrylonitrile, methacrylonitrinole, styrene, ⁇ -methylstyrene, ⁇ methylstyrene, ⁇ methylstyrene, ⁇ -methoxystyrene, and ⁇ chlorostyrene. . Of these, styrene is preferred!
  • Polybutanol or a copolymer thereof that is, polyhydroxystyrene or polyhydroxystyrene derivative has a weight average molecular weight of 1000 to 100,000, preferably 2000 to 30,000 from the viewpoint of developability and adhesion. These can be combined as necessary, and can be used alone or in combination of two or more kinds of copolymers.
  • the weight average molecular weight is a relative value in terms of polystyrene.
  • the photoacid generator ( ⁇ ) used when using a resin ( ⁇ ) in a negative resist composition is one that generates acid directly or indirectly by light irradiation. .
  • the crosslinkable compound (C) used for the resin ( ⁇ ) includes a hydroxyl group, a hydroxyalkyl group, (a carbon number of 1 to 5) alkoxy (a carbon atom number of 1 to 5). ) A compound having at least one cross-linking group selected from the group consisting of alkyl groups can be used.
  • an amino resin having a hydroxyl group or an alkoxyl group such as melamine resin, urea resin, guanamine resin, glycoluril formaldehyde resin, succinylamide formaldehyde resin, ethylene urea formaldehyde resin, etc.
  • crosslinkable compound (C) for example, a melamine derivative, a benzoguanamine derivative or glycoluril substituted with a hydrogen nuclear S-methylol group or an alkoxymethyl group of an amino group or both can be used.
  • the melamine derivative and benzoguanamine derivative can exist as a dimer or a trimer. These preferably have an average of 3 to 6 methylol groups or alkoxymethyl groups per triazine ring.
  • Examples of such melamine derivatives or benzoguanamine derivatives include commercially available tria.
  • Methoxymethinorei melamine such as methoxymethinorei melamine, Saimenole 235, 236, 238, 212, 253, 254 etc.
  • Toximethylated Benzoguanamine such as melamine, Cymel 1 123, Toximethylated Benzoguanamine, like Cymel 1123-10, Toximethylinole Benzoguanamine, Saimenole 1125—80
  • a methoxymethylated oxymethylated benzoguanamine (above, manufactured by Nippon Cite Industries Co., Ltd.) is included.
  • glycoluril include salylated glycoluril and the like, and methoxymethylolated glycoluril such as Powderlink 1174 (hereinafter, Nippon Cytec Industries, Ltd.).
  • benzene or phenolic compounds having a hydroxyl group or an alkoxyl group such as 1,3,5-tris (methoxymethyl) benzene, 1,2,4-tris (isopropoxymethinole) benzene, 1,4 bis (sec Butoxymethylol) benzene, 2,6 dihydroxymethyl-p tert butylphenol.
  • a compound containing an epoxy group or an isocyanate group and having a crosslinking group can also be used.
  • Specific examples include, for example, bisphenolacetone glycidyl ether, phenol nopolac epoxy resin, cresol nopolac epoxy resin, triglycidyl isocyanurate, tetraglycidylaminodiphenylene, tetraglycidyl m-xylenediamine, tetraglycidyl 1,3 —Bis (aminoethyl) cyclohexane, tetraphenyldaricidyl etherenoethane, triphenenoreglicidinoreethenoethane, bisphenolenohexanoleoroacetodiglycidinoreethenole, 1,3bis (1— (2,3 epoxy Propoxy) 1-trifluoromethyl-2,2,2 trifluoromethyleno) benzene, 4,4 bis (2,3 epoxycyclopropoxy
  • crosslinkable compounds (C) can be used singly or in combination of two or more.
  • the amount introduced is selected in the range of 1 to 300 parts by weight, preferably 20 to 200 parts by weight, per 100 parts by weight of the resin (B) component. When this amount is less than 1 part by mass, the crosslinking reaction does not proceed sufficiently, and it is difficult to obtain a desired resist pattern. When it exceeds 300 parts by mass, the storage stability of the resist composition is poor. . Therefore, the amount of the crosslinking agent introduced is preferably 1 to 300 parts by mass with respect to 100 parts by mass of the resin component.
  • the dye (D) used in the present invention has a spectral spectrum that is desirable when a color filter is produced, and uses the ability to dissolve in a solvent as it is, or the dye that dissolves in an organized form. I'll do it with power.
  • the dye (D) used in the present invention preferably contains a cationic compound represented by the formula [2].
  • At least one of R 9 and R 1Q has a nitrogen-containing organic group. S is preferable. Particularly, both R 9 and R 1Q have a nitrogen-containing organic group. Is preferred.
  • At least one of the nitrogen-containing organic groups of R 9 and R 1Q has an imino structure (one NH—R 13 ). Particularly, both R 9 and R 1Q have an imino structure (one NH—R 13 ) Is preferable.
  • R 13 represents an organic group, and is preferably an alkyl group such as a methyl group, an ethyl group, or a propyl group, or a substituted or unsubstituted aromatic group, particularly a substituted or unsubstituted aromatic group. It is preferably a group.
  • the aromatic group is preferably a phenyl group, a naphthyl group, an anthryl group, or the like.
  • the substituent of these aromatic groups is an alkyl group such as a methyl group, an ethyl group, or a propyl group, or a halogen atom. Etc. are preferred.
  • R 13 is a phenyl group, o tolyl group, m-tolyl group or p-tolyl group. Are preferred.
  • R u and R 12 at least one of time of preferably fitting one is a hydrogen atom a hydrogen atom and the other is a methyl group, Echiru group, alkyl groups such as propyl group, or a substituted or unsubstituted
  • an aromatic group is preferred.
  • the aromatic group is preferably a phenyl group, a naphthyl group, an anthryl group or the like, and the substituent of these aromatic groups is an alkyl group such as a methyl group, an ethyl group or a propyl group, A halogen atom or the like is preferable.
  • R 11 and R 12 are hydrogen atoms, or, preferably may other while hydrogen atom of R u and R 12 is the aromatic group! /,.
  • cationic compound examples include compounds represented by the following formula.
  • R 14 and R 15 each independently represents a hydrogen atom or a methyl group).
  • the cationic compound may have a resonance structure.
  • the compound of the formula [17] is taken as an example, the formula [18]
  • the dye (D) used in the present invention is preferably an organic salt composed of a cationic compound and an anionic compound.
  • anionic compound as a counter ion of the cationic compound represented by the formula [2] examples include a compound having a phthalocyanine structure, a compound having a pyrazole azo structure, a compound having a pyrazono laser structure and a metal complex structure, xanthene Examples include compounds having a structure.
  • the compound having a phthalocyanine structure is a compound having at least one phthalocyanine structure in one molecule.
  • Phthalocyanine can be used with or without metal, and examples of central metals include Cu, Zn, Al, Ni, and Co.
  • a sulfonic acid group ( -so-) and / or carboxylic acid groups (one coo-).
  • One or a combination of both can be contained in one molecule of phthalocyanine at a ratio of 1 to 4.
  • a sulfonic acid ester group (one SO R 16 , where R 16 represents an aliphatic or aromatic hydrocarbon group having 1 to 20 carbon atoms, an ether group or an ester group).
  • Sulfonic acid amino ester group (one SO NHR 17 , wherein R 17 represents an aliphatic, aromatic hydrocarbon group, ether group or ester group having 1 to 20 carbon atoms), hydroxyl group, It can have a tro group, an amino group, a chlorine atom such as chloro and bromo, and an alkyl group such as a methyl group and an ethyl group, and these nonionic groups can be any one or a combination thereof to form a phthalocyanine.
  • 1 to 4 can be contained in each molecule.
  • the nonionic group is particularly preferably a sulfonic acid amino ester group!
  • a dye (D) used in the present invention comprising a combination of a sulfonic acid group-containing phthalocyanine as an anionic compound and a cationic compound represented by the formulas [5] to [10] 21] can be exemplified.
  • the compound having a pyrazole azo structure is a compound having at least one of a pyrazole part and a azo part in one molecule.
  • the direct bond between the pyrazole moiety and the azo moiety can also exist with other organic groups in between. Both are possible. Examples include compounds in which an aromatic group or aliphatic group such as a phenyl group exists between the pyrazole part and the azo part, and the aromatic group or aliphatic group has a sulfonic acid group or other substituent. It is done.
  • the compound having a pyrazole azo structure preferably has a sulfonic acid group (-so-) and / or a carboxylic acid group (one COO-) as an anion component.
  • Either one or a combination of both may be contained in a ratio of 1 to 4 in one molecule of the compound having a pyrazole azo structure.
  • anionic group a sulfonic acid group can be preferably used.
  • a sulfonic acid amino ester group (one SO NHR 18 , wherein R 18 is an aliphatic, aromatic hydrocarbon group, ether group or ester group having 1 to 20 carbon atoms).
  • R 18 is an aliphatic, aromatic hydrocarbon group, ether group or ester group having 1 to 20 carbon atoms.
  • a hydroxyl group, a nitro group, an amino group, a chlorine atom such as chloro and bromo, an alkyl group such as a methyl group and an ethyl group, and these nonionic groups are either one or these In combination, it can be contained in a ratio of 1 to 4 per molecule of the compound having a pyrazole azo structure.
  • a dye (D) used in the present invention comprising a combination of a compound having a sulfonic acid group-containing pyrazole azo structure as an anionic compound and a cationic compound represented by the formulas [5] to [18], 22] to [24] can be exemplified.
  • the compound having a pyrazole azo structure and a metal complex structure is a compound in which a compound having an anionic group-containing virazo azo structure forms a complex with a metal.
  • the compound having an anionic group-containing pyrazole azo structure and the metal have a force S of forming a complex at a ratio of 2 to 4: 1 (molar ratio), and a preferable ratio is 2: 1 (molar ratio).
  • the metal existing in the center is preferably a force Co such as Cu, Zn, Al, Ni, Co and the like.
  • a compound having a pyrazole azo structure and a metal complex structure preferably has a sulfonic acid group (SO) and / or a carboxylic acid group (COO-) as an anion component. These can be contained in a ratio of 1 to 4 in one molecule of a compound having a pyrazole azo structure, either one or a combination of both.
  • a sulfonic acid group can be preferably used as the anionic group.
  • a sulfonic acid amino ester group (one SO NHR 19 , where R 19 is an aliphatic, aromatic hydrocarbon group, ether group or ester group having 1 to 20 carbon atoms).
  • R 19 is an aliphatic, aromatic hydrocarbon group, ether group or ester group having 1 to 20 carbon atoms.
  • a hydroxyl group, a nitro group, an amino group, a chlorine atom such as chloro and bromo, an alkyl group such as a methyl group and an ethyl group, and these nonionic groups are either one or these In combination, it can be contained in a ratio of 1 to 4 per molecule of the compound having a pyrazole azo structure.
  • an alkyl group such as a nitro group, a hydroxyl group, a methyl group, and an ethyl group can be preferably used.
  • a dye used in the present invention comprising a combination of a compound having a metal complex structure and a sulfonic acid group-containing pyrazole azo structure as an anionic compound and a cationic compound represented by the formula [5] to formula [18] ( As D), it is possible to exemplify the one of the formula [25]! And the formula [30].
  • R 2 ° represents an aliphatic or aromatic hydrocarbon group, ether group or ester group having 1 to 20 carbon atoms. ), A hydroxyl group, a nitro group, an amino group, a chlorine atom such as chloro and bromo, and an alkyl group such as a methyl group and an ethyl group. These nonionic groups may be any one or a combination thereof.
  • the compound having a pyrazole azo structure can be contained in a ratio of 1 to 4 in one molecule.
  • a compound having a xanthene structure has at least one xanthene structure in one molecule. It is a compound.
  • the compound having a xanthene structure preferably has a sulfonic acid group (one S O—) and / or a carboxylic acid group (one COO—) as an anion component. These can be contained in a ratio of 1 to 3 in one molecule of a compound having a pyrazole azo structure, either or a combination of both.
  • a carboxylic acid group can be preferably used as the anionic group.
  • a sulfonic acid amino ester group (one SO NHR 21 , wherein R 21 is an aliphatic, aromatic hydrocarbon group, ether group or ester group having 1 to 20 carbon atoms).
  • R 21 is an aliphatic, aromatic hydrocarbon group, ether group or ester group having 1 to 20 carbon atoms.
  • a hydroxyl group, a nitro group, an amino group, a chlorine atom such as chloro and bromo, an alkyl group such as a methyl group and an ethyl group, and these nonionic groups are either one or these In combination, it can be contained in a ratio of 1 to 3 per molecule of the compound having a xanthene structure.
  • the dye (D) used in the present invention comprising a combination of a compound having a xanthene structure as an anionic compound and a cationic compound represented by the formulas [5] to [18] is represented by the formula [31] to the formula [35]. Can be illustrated.
  • a commercial item can be used for the dye (D) used for this invention.
  • These dyes can be easily synthesized by known methods. For example, it can be obtained by a method of reacting an amine corresponding to the structure of the above formulas [5] to [18] with a dye molecule (matrix) having a sulfonic acid group or a carboxylic acid group. That is, a compound having a phthalocyanine structure having a sulfonic acid group or a carboxylic acid group, a compound having a pyrazole azo structure, a compound having a metal complex structure and a pyrazole azo structure, or a compound having a xanthene structure.
  • the solution can be synthesized by reacting with the amine required for salt formation in the desired molar ratio to precipitate a sparingly soluble salt in water. When the dye salt is soluble in water, the salt is obtained by salting out.
  • an aqueous solution of an amine hydrochloride corresponding to the structure of the above formulas [5] to [18] is added to an aqueous solution of the above dye having sodium sulfonate or sodium carboxylate, and reacted. [5] to produce a dye having a cationic compound of formula [18].
  • the dye (D) used in the present invention can be further used in combination with an arbitrary dye.
  • these dyes include acid dyes, oil-soluble dyes, disperse dyes, reactive dyes, and direct dyes.
  • azo dyes benzoquinone dyes, naphthoquinone dyes, anthraquinone dyes, cyanine dyes, squarylium dyes, croconium dyes, merocyanine dyes, stilbene dyes, diphenylmethane dyes, triphenylmethane dyes, fluoranes Dyes, spiropyran dyes, phthalocyanine dyes, indigo dyes, fulgide dyes, nickel complex dyes and azulene dyes.
  • Specific examples of color index numbers include the following. C. I. Solvent Yellow
  • the dye (D) exhibits an optical characteristic having a region showing a transmittance of 70% or more in a wavelength region of 400 to 700 nm and a region showing a transmittance of 10% or less, and 200
  • the resist composition of the present invention in which the change in transmittance is preferably within 5% even at a temperature of ⁇ C, and the color filter produced from the resist composition exhibit similar optical characteristics.
  • the dye-containing resist composition of the present invention is applied to a substrate, then baked at a temperature of 50 to 150 ° C, exposed and developed, and this baking temperature is set to 200 to 270 ° C (200 ° C). Even if baked at a high temperature of 30 minutes for C and 30 seconds at 270 ° C), it is 400! /, And the transmittance change with time of the portion showing a transmittance of 70% or more in the 700 nm wavelength region is high-temperature baking. Within 5% is preferred compared to before performing.
  • the amount of the dye (D) introduced is a solid comprising the photoacid generator (A), the resin (B), the crosslinkable compound (C), and the dye (D). It is selected in the range of 1 to 90% by mass with respect to the whole minute (100%).
  • the amount of dye introduced is small, it becomes difficult to develop a desired spectral spectrum when the resist film is thinned, and when the amount of dye introduced is large, the storage stability of the resist composition is poor.
  • a dye having a cationic compound represented by the above formula [2], and further a dye comprising a cationic compound represented by the above formula [2] and an anionic compound As a matter of course, the introduction amount of the above dye (the concentration of the dye in the entire solid content) can be used at a low concentration of several mass%, but it is set to a high concentration of 30 to 90 mass%. The dye is sufficiently soluble.
  • the solvent (E) used in the dye-containing resist composition of the present invention is, for example, acetone, methanol monoethanol, ethanol, isopropyl alcohol, methoxymethylpentanol, dipentene, ethyl amyl ketone, methyl nonyl ketone, methyl ester.
  • Tilketone methyl isoamyl ketone, methinoreisopropenoleketone, methinoresenoresorenolev, ethinoresenoresonolev, methinoreserosolorebu Cetate, ethyl acetate sorb acetate, butyl carbitol, ethyl carbitol, ethylene glycolate, ethylene glycol monoacetate, ethylene glycol monoacetopropylene oleore, ethylene glycol ole monobutenoate, propylene glycol nore, propylene glycol Nole monoacetate, propylene glycol nole monomethylenoate, propylene glycol nore tert butinoleate nore, dipropylene glycol nole monomethinoatenore, diethylene glycol nore, diethylene glycol nore monoacetate, diethylene glyconoremino chinenoate nore, dipropylene Glyconole monoacetate monomethylenoateolene
  • ketol solvents are particularly preferred for compatibility with the dye (D) used in the present invention.
  • ketol include / 3-hydroxyketone, and specific examples thereof include 4-hydroxy-4-methyl-2-pentanone.
  • this ketol solvent can be used alone, but it is preferable to select a solvent containing the ketol solvent in a ratio of 10% by mass or more in the total solvent.
  • the photoacid generator (A), the resin (B), the crosslinkable compound (C) and the dye (D) are combined with the photoacid generator (A), the resin (B ),
  • the crosslinkable compound (C), the dye (D), and the solvent (E) are contained in a proportion, that is, a solid content concentration of 5 to 50% by mass, preferably 10 to 30% by mass.
  • a proportion that is, a solid content concentration of 5 to 50% by mass, preferably 10 to 30% by mass.
  • the dye-containing resist composition of the present invention may contain a surfactant for the purpose of improving the wettability and flatness of the resist film.
  • surfactants include fluorine-based surfactants, silicone-based surfactants, and noion-based surfactants.
  • F-top EF301, EF303, EF352 manufactured by Tochem Products Co., Ltd.
  • MegaFac F171, F173, R-30 manufactured by Dainippon Ink Co., Ltd.
  • Florard FC4 30, FC431 Sumitomo 3EM Co., Ltd.
  • Asahi Guard AG710, Surflon S-382, SC101, SC102, SC103, SC104, SC105, SC106 manufactured by Asahiishi Shoko Co., Ltd.
  • the ratio of these surfactants to be used is preferably 0.01 to 2 parts by mass, more preferably 0.01 to 1 part by mass with respect to 100 parts by mass of the resin (B) component. If the surfactant content exceeds 2 parts by mass, the resist film becomes uneven, and if it is less than 0.01 parts by mass, striations are likely to occur in the resist film.
  • an adhesion promoter can be contained.
  • adhesion promoters include, for example, trimethylchlorosilane, dimethylvinylchlorosilane, methyldiphenylchlorosilane, chloromethyldimethylchlorosilane.
  • Chlorosilanes such as orchid, alkoxysilanes such as trimethylmethoxysilane, dimethyljetoxysilane, methyldimethoxysilane, dimethylvinylethoxysilane, diphenyldimethoxysilane, phenyltriethoxysilane, hexamethyldisilazane, N, N, Bis (trimethylsilyl) urea, dimethyltrimethylsilylamine, silazanes of trimethylsilylimidazoles, butyltrichlorosilane, ⁇ -chloropropylpropylmethoxysilane, ⁇ -aminopropyltriethoxysilane, ⁇ -methacryloxypropyltrimethoxysilane ⁇ -glycidoxyprovir trimethoxysilane and other silanes, benzotriazole, benzimidazole, indazole, imidazole, 2-mercaptobensimidazole
  • the use ratio of these adhesion promoters is usually 20 parts by mass or less, preferably 0.05 to 10 parts by mass, and particularly preferably 1 to 10 parts by mass with respect to 100 parts by mass of the resin (i) component. It is.
  • UV absorbers and antioxidants that enhance light stability, and compatibilizers that suppress dye precipitation include polyoxyethylene octyl ether compounds, polyoxyethylene lauryl ether compounds, polyoxyethylene alkyl ( 12 to 13 carbon atoms ether compound, polyoxyethylene secondary alkyl (12 to 14 carbon atoms) ether compound, polyoxyethylene alkyl (13 carbon atoms) ether compound, polyoxyethylene cetyl ether compound, polyoxyethylene Stearyl ether compounds, polyoxyethylene oleyl ether compounds, polyoxyethylene decyl ether compounds, polyoxyalkylene alkyls (11 carbon atoms!
  • ether compounds such as ether compounds and polyoxyalkylene cetyl ether compounds, alkyls such as polyoxyethylene lauryl amino ether compounds, polyoxyethylene stearyl amino ether compounds and polyoxyethylene oleylamino ether compounds Amino ether compound, polyoxyethylene lauric acid Alkylamide compounds such as amide ether compounds, polyoxyethylene stearic acid amide ether compounds, polyoxyethylene oleic acid amide ether compounds, lauric acid diethanolamide compounds, stearic acid diethanolamide compounds, oleic acid diethanolamide compounds, Polyoxyethylene polystilphenyl ether compound
  • Polysyl phenyl ether formamide condensates polyoxyethylene monostyryl phenyl ether compounds, polyoxyethylene distyryl phenyl ether compounds, polyoxyethylene naphthyl ether compounds and other aryl phenyl ether compounds, glycerin monolaurate compounds, Glycerin monostearate compound, glycerin monooleate compound, glycerin fatty acid ester compound such as glycerol triolate compound, sorbitan monolaurate compound, sorbitan monopalmitate compound, sorbitan monostearate compound, sorbitan tristearate compound, sorbitan Sorbitanate compounds such as monooleate compounds, sorbitan trioleate compounds, polyoxyethylene dilaurate compounds, polyoxyesters Len laurate compound, polyoxyethylene stearate compound, polyoxyethylene distearate compound, polyoxyethylene dioleate compound, fatty acid ether ester compound such as polyoxyethylene o
  • Monool type polyether compound such as ether compound, polyoxyalkylene oleyl ether compound, diol type polyether compound such as polyoxyethylene polyoxypropylene condensate, trimethylolpropane tris (polyoxyalkylene) ether
  • polyol type polyether compounds such as polyoxyalkylene glyceryl ether compounds, methyl laurate compounds, methyl oleate compounds, isopyl pyrmyristate compounds, butyl stearate compounds, octyl palmitate compounds, Octyl stearate compound, Lauryl oleate compound, Isotridecyl stearate compound, Oleolelate compound, Dioleyl adipate compound, Trimethylolpropane Tridecanoate compound, Trimethylolpropane trilaurate compound, Pentaerythritol monorudiolate compound, Fatty acid alkyl ester compounds such as pentaerythrito
  • sulfonic acid type compounds such as dioctylsulfosuccinate compounds, oleic acid sulfated oil compounds, castor sulfated compounds, octyl sulfate compounds, lauryl sulfate compounds, alkyl sulfate compounds, alkyl ether sulfate compounds, etc.
  • cellulose, cellulose derivatives, and sugar skeleton polymer compounds such as dioctylsulfosuccinate compounds, oleic acid sulfated oil compounds, castor sulfated compounds, octyl sulfate compounds, lauryl sulfate compounds, alkyl sulfate compounds, alkyl ether sulfate compounds, etc.
  • the proportion of the compatibilizer used is 0.001 to 100 parts by mass of resin (B) component 100 parts by mass.
  • the compatibilizer does not interfere with the pattern shape, it can be used in an amount of 20 parts by mass or more.
  • photosensitizers can be used as photosensitizers.
  • a method for producing a color filter using the dye-containing resist composition of the present invention is not particularly limited, and examples thereof include the following methods.
  • the resist composition of the present invention is prepared at a rotational speed to obtain a desired resist film thickness by a spinner method. Apply on recon wafer or glass substrate and perform soft beta (firing). The soft beta should be conducted for 30 seconds to 10 minutes in the temperature range of 50 to 150 ° C, as long as the solvent is evaporated. After that, exposure is performed through a mask at an exposure amount of about 10 to 3000 mj / cm 2 . For the exposure, for example, ultraviolet rays such as a mercury lamp, far ultraviolet rays, electron beams, or X-rays are used. When a pattern is formed using a negative resist composition after exposure, heating (P EB (post exposure beta)) is preferably performed.
  • P EB post exposure beta
  • PEB crosslinking with an acid or base generated by exposure further proceeds, and the difference in the solubility of the developing solution from the unexposed area is further widened to improve the resolution contrast.
  • PEB should be in the temperature range of 50 to 170 ° C for 30 seconds! /, And preferably for 5 minutes! /.
  • the developing method can be carried out by a known method such as a paddle method, a dating method, or a spray method without any particular limitation.
  • the development temperature is 20! /, And it is preferable to immerse in a developer solution preferably between 50 ° C for 10 seconds to 10 minutes.
  • an organic solvent or an alkaline aqueous solution can be used as the developer.
  • an organic solvent or an alkaline aqueous solution can be used. Specific examples include isopropyl alcohol, propylene glycol monomethyl ether, ethylamine aqueous solution, n-propylamine aqueous solution, jetylamine aqueous solution, diethyl n-propylamine aqueous solution, triethylamine aqueous solution, methyljetylamine aqueous solution, diethanolamine aqueous solution, triethanol.
  • Examples thereof include an aqueous solution of amine, an aqueous solution of tetramethylammonium hydroxide, an aqueous solution of sodium hydroxide, an aqueous solution of potassium hydroxide, an aqueous solution of sodium carbonate, an aqueous solution of sodium bicarbonate, an aqueous solution of sodium silicate, and an aqueous solution of sodium metasilicate.
  • a surfactant to the developer in order to enhance the removability of the unexposed areas.
  • Specific examples include polyoxyethylene octyl ether compounds, polyoxyethylene lauryl ether compounds, polyoxyethylene alkyl (12 or 13 carbon atoms) ether compounds, polyoxyethylene secondary alkyl (12 to 14 carbon atoms).
  • Ether compounds polyoxyethylene alkyl (13 carbon atoms) ether compounds, polyoxyethylene cetyl ether compounds, polyoxyethylene stearyl ether compounds, polyoxyethylene oleyl ether compounds, polyoxyethylene decyl ether compounds, polyoxyalkylenes Alkyl (11 carbon atoms!
  • etherification Compounds polyoxyalkylene secondary alkyl (carbon atoms of 12 to 14) ether compounds, alkyl ether compounds such as polyoxyalkylene cetyl ether compounds, polyoxyethylene lauryl amino ether compounds, polyoxyethylene stearyl amino ethers Compounds, alkylamino ether compounds such as polyoxyethylene oleylamino ether compounds, polyoxyethylene lauric acid amide ether compounds, polyoxyethylene stearic acid amide ether compounds, polyoxyethylene oleic acid amide ether compounds, Alkylamide ether compounds such as lauric acid diethanolamide compound, stearic acid diethanolamide compound, oleic acid diethanolamide compound, polyoxyl ether compound, polyoxyalkylene Polystyryl phenyl ether formamide condensate, polyoxyethylene monostyryl phenyl ether compound, polyoxyethylene distyryl phenyl ether compound, polyoxyethylene naphthyl ether compound
  • Sorbitan ether ester compounds such as polyoxyethylene sorbitan monolaurate compounds, polyoxyethylene sorbitan monostearate compounds, polyoxyethylene sorbitan monooleate compounds, polyoxyethylene sorbitan trioleate compounds,
  • polyoxyalkylene alkyl (carbon atoms of 14! /, 15) ether compounds monool-type polyether compounds such as polyoxyalkylene oleyl ether compounds
  • Diol type polyether compounds such as polyoxyethylene polyoxypropylene condensate
  • polyol type polyether compounds such as trimethylolpropane tris (polyoxyalkylene) ether compound
  • polyoxyalkylene glyceryl ether compound methyl laurate compound, methyl oleate compound, Isopropyl myristate compound, butyl stearate compound, octyl palmitate compound, octyl stearate compound, laurylololeate compound, isotridecyl stearate compound, oleyllate compound, dioleyl adipate compound, trimethylolpropane tridecanoate compound, trimethylo Propanetrilaurate compound, pentaerythritol diolate compound,
  • the preferred concentration of the alkali developer is 0.001 to 10% by mass for the alkali component and 0.001 to 10% by mass for the surfactant component. If the alkali component is too high, the developability is too strong. In the case of the negative type, the unexposed area penetrates to the unexposed area. If the pattern surface is rough, the developability cannot be obtained. On the other hand, if the surfactant component is too high, foaming tends to occur and development unevenness tends to occur, and if it is too low, developability cannot be obtained.
  • the color filter produced using the dye-containing resist composition of the present invention can be suitably used for a liquid crystal display device, an LED (light emitting diode) display device, a solid-state imaging device, and the like. It is preferably used as a solid-state image sensor.
  • the present invention also provides a cyclohexagen-based oxime sulfonate compound represented by the formula [3].
  • R 1 and R 2 are each independently a halogen atom, a CN NO alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, or 1 to 1 carbon atoms.
  • R 3 represents a hydrogen atom, a halogen atom, a nitro group, a CN group, an alkyl group of 1 to 10 carbon atoms, or an alkyl group of 1 to 5 carbon atoms.
  • each R 3 may be the same as each other or in addition, when R 3 is adjacent to each other, the two adjacent R 3 are —CH CH —CH 2 O— —CH N (R 8 ) — —CH 2 CH 2 CH 2 CH 2 O— CH CH N (R 8 ) CH CH CH CH CH CH CH O— CH CH CH N (R 8 ) — CH CH CH CH CH CH CH CH
  • R 4 may be an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms, a haloalkoxy group having 1 to 5 carbon atoms
  • R 8 represents a phenyl group which may be substituted with W, a naphthyl group which may be substituted with W, or an anthranyl group which may be substituted with W.
  • R 8 represents a hydrogen atom or a carbon atom having 1 to 10 carbon atoms.
  • W represents a halogen atom, CN NO, an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms, or 1 to 1 carbon atoms.
  • 5 represents a haloalkoxy group
  • n is 1 2 3 Or represents an integer of 4.
  • a halogen atom an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, a haloalkoxy group having 1 to 5 carbon atoms, a phenyl group optionally substituted by W, W
  • W Specific examples of the naphthyl group optionally substituted with and the anthranyl group optionally substituted with W include the same groups as those described for R 1 to R 4 above.
  • the present invention also provides a cyclohexadiene-based oxime compound represented by the formula [4] as an intermediate for producing the compound represented by the formula [3].
  • R 1 and R 2 are each independently a halogen atom, a CN NO alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, or 1 to 1 carbon atoms.
  • R 3 represents a hydrogen atom, a halogen atom, a nitro group, a CN group, an alkyl group of 1 to 10 carbon atoms, or an alkyl group of 1 to 5 carbon atoms.
  • each R 3 may be the same as each other or in addition, when R 3 is adjacent to each other, the two adjacent R 3 are —CH CH —CH 2 O— —CH N (R 8 ) — —CH 2 CH 2 CH 2 CH 2 O— CH CH N (R 8 ) CH CH CH CH CH CH CH O— CH CH CH N (R 8 ) — CH CH CH CH CH CH CH CH
  • R 8 represents a hydrogen atom or an alkyl group having 1 to 10 carbon atoms
  • n represents an integer of 1 2 3 or 4.
  • halogen atom an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, a haloalkoxy group having 1 to 5 carbon atoms, and a phenyl group optionally substituted by W
  • a halogen atom an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, a haloalkoxy group having 1 to 5 carbon atoms, and a phenyl group optionally substituted by W Examples thereof include the same groups as those described for R 1 to R 4 above.
  • the cyclohexadiene oxime sulfonate compound represented by the formula [3] can be produced by a production method including the following steps. [Formula 15] one R1 (f [pi basic acid R 1 ⁇ >"R4S02CI R 1 ()" 2 R 2 CN bases R 2 0N
  • an intermediate oxime compound is obtained by reacting a substituted phenylacetonitrile compound (PAN) and a nitrobenzene compound (NB) in the presence of a base, followed by acidification.
  • OC is reacted with a sulfonyl chloride compound (SC) in the presence of a base to produce the desired cyclohexadiene oxime sulfonate compound (SCHC).
  • substituted phenylacetonitrile compound (PAN) in the first step 2, 6 difluorophenylacetonitrile, 2, 6 diclonal phenylacetonitrile, 2, 6 dibuphthyl phenylacetonitrile, 2 , 6 Jodophenylacetonitrile, 2, 6 Dicyanophenoxyacetonitrile, 2, 6 Dinitrophenylacetonitrile, 2, 6 Dimethylphenylacetonitorinole, 2, 6 Dimethoxyphenenoleacetonitrinole, 2, 6 Examples include 6-difluoromethoxyphenylacetonitrile, 2-fluoro-6-methylphenylacetonitrile, 2-chloro-6-methylphenylacetonitrile, 2-bromo-6-methylphenylacetonitrile, and the like. Of these, 2,6-dichlorophenylnitrile and 2,6 dimethylphenylnitrile are particularly preferred.
  • nitrobenzene compound (NB) examples include nitrobenzene, 2-chloronitrite benzene, 3 chloronitrobenzene, 2 cyanonitrobenzene, 3 cyanonitrobenzene, 2 methinorenitrobenzene, 3 methinorenitrobenzene, 2- (i —Propinole) Nitrobenzene, 3— (i Propinole) Nitrobenzene, 2 Methoxy nitrobenzene, 3 Methoxynitrate Mouth benzene, 2 Trifunoleolomethino nitrobenzene, 3 Trifunoleolomethino nitrobenzene, 2 Trifluoromethoxynitrobenzene 3 trifluoromethoxynitrobenzene and the like. Also, the 2nd and 3rd positions are joined together to form a ring with 2 to 5 carbon atoms (oxygen atom or As the group that may form a nitrogen atom), for example, a compound of the following
  • nitrobenzene, 2-chloronitrobenzene, 3-chloronitrobenzene, 2-methino nitrobenzene, 3-methino nitrobenzene, 2- (i-propinole) nitrobenzene, 3- (i -Propyl) nitrobenzene and the like are preferred.
  • the amount used is 0.8 for PAN. : Booster preference.
  • alkali metal or alkaline earth metal hydroxides, carbonates, organic acid salts and the like can be used as the base. Specifically, from the viewpoint of reactivity and economy, sodium hydroxide or lithium hydroxide Is preferred.
  • the amount used is preferably 2 to 5 equivalents to PAN.
  • the reaction solvent is preferably an aliphatic alcohol having 1 to 5 carbon atoms such as methanol or ethanol.
  • the reaction temperature is preferably -20 to 150 ° C, particularly 0 to 100 ° C.
  • water is added to the reaction solution, acidified with an inorganic or organic acid, extracted with ethyl acetate and concentrated, and the resulting crude product is purified by recrystallization or column chromatography to obtain the desired OC.
  • hydrochloric acid or acetic acid is used as the inorganic acid or organic acid.
  • organic bases such as triethylamine, pyridine, 4-N, N dimethylaminopyridine (DMA P) can be used.
  • the amount used is preferably 1 to 1.1 equivalent times the amount of SC.
  • reaction solvent examples include the number of carbon atoms such as toluene, xylene, ethylbenzene, and cumene.
  • the reaction temperature is preferably -20 to 100 ° C, particularly 0 to 80 ° C.
  • concentration yields a brown solid, which is then recrystallized or purified by column chromatography using silica gel to produce the desired cyclohexadiene oxime sulfonate compound (SCHC). .
  • Each of the above reactions can be carried out batchwise or flow-through, and can be carried out at normal pressure or under pressure.
  • n is normal, “i” is iso, “s” is secondary, “t” is tertiary, “c” is cyclo, “o” is ortho.
  • M represents meta, “p” represents para, “Me” represents a methyl group, “Et” represents an ethyl group, and “Pr” represents a propyl group.
  • the measuring device and conditions for each physical property in the examples are as follows.
  • Measuring instrument Automatic melting point measuring device, FP62 (Metler Toledo Co., Ltd.)
  • VP8000 manufactured by Nippon Soda Co., Ltd., the component is polybutanol.
  • Megafac R-30 Dainippon Ink Chemical Co., Ltd.
  • 4 hydroxy-4-methyl-2-pentanone (30 g) was added as a solvent and stirred at room temperature. No insoluble matter was found in the reaction solution, and the solution was uniform.
  • the composition was filtered using a 0.2 Hm PTFE (polytetrafluoroethylene) filter, and the composition was applied onto a glass substrate using a spin coater.
  • the film was baked on a hot plate (soft beta) at 110 ° C for 1 minute to form a coating film with a thickness of 1.02 ⁇ (measured with an interference film thickness meter).
  • This coating film was irradiated with ultraviolet rays having an irradiation dose of 600 mj / cm 2 at 365 nm by an ultraviolet irradiation device. Subsequently, PEB was performed on a hot plate at 120 ° C for 1 minute. Thereafter, post-beta was performed on a hot plate at 200 ° C. for 5 minutes, and the transmittance (transmittance at 400 nm) of the glass substrate on which the resist was formed was measured with a spectrophotometer.
  • the composition was filtered using a 0.2 m PTFE filter, and the composition was applied onto a glass substrate using a spin coater.
  • the film was baked on a hot plate at 110 ° C for 1 minute (soft beta) to form a coating film with a thickness of 1.02 ⁇ m (measured with an interference film thickness meter).
  • This coating film was irradiated with ultraviolet rays having an irradiation dose of 600 mj / cm 2 at 365 nm by an ultraviolet irradiation device. Subsequently, PEB was performed on a hot plate at 120 ° C for 1 minute. After that, post-beta was performed on a hot plate at 200 ° C for 5 minutes, and the resist was deposited on the film. The transmittance of the glass substrate (transmittance at 400 nm) was measured with a spectrophotometer.
  • This coating film was irradiated with ultraviolet rays having an irradiation dose of 600 mj / cm 2 at 365 nm by an ultraviolet irradiation device. Subsequently, PEB was performed on a hot plate at 120 ° C for 1 minute. Thereafter, post-beta was performed on a hot plate at 200 ° C. for 5 minutes, and the transmittance (transmittance at 400 nm) of the glass substrate on which the resist was formed was measured with a spectrophotometer.
  • VP8000 manufactured by Nippon Soda Co., Ltd., the component is polybutanol.
  • Weight average molecular weight 8000 (polystyrene conversion)) 5 g, CGI1325 (manufactured by Ciba Specialty Chemicals Co., Ltd.) 0.25 g of thiophenoxime sulfonate photoacid generator) and 0.012 g of MegaFac R-30 (Dainippon Ink Chemical Co., Ltd.) as the surfactant were added, and 4-hydroxy-4-methyl-2 as the solvent. 30 g of pentanone was added and stirred at room temperature.
  • the composition was filtered using a 0.2 m PTFE filter, and the composition was applied onto a glass substrate using a spin coater.
  • the film was baked on a hot plate at 110 ° C for 1 minute (soft beta) to form a coating film with a thickness of 1.02 and im (measured with an interference film thickness meter).
  • This coating film was irradiated with ultraviolet rays having an irradiation dose of 600 mj / cm 2 at 365 nm by an ultraviolet irradiation device. Subsequently, PEB was performed on a hot plate at 120 ° C for 1 minute. afterwards Post-beta was performed on a hot plate at 200 ° C for 5 minutes, and the transmittance (transmittance at 400 nm) of the glass substrate on which this resist was formed was measured with a spectrophotometer.
  • VP8000 manufactured by Nippon Soda Co., Ltd., the component is polybutanol.
  • Weight average molecular weight 8000 (polystyrene conversion)) 5 g, CGI1397 (manufactured by Ciba Specialty Chemicals Co., Ltd.) 0.25 g of thiophenoxime sulfonate photoacid generator) and 0.012 g of MegaFac R-30 (Dainippon Ink Chemical Co., Ltd.) as the surfactant were added, and 4-hydroxy-4-methyl-2 as the solvent.
  • Pentanone (30 g) was added and stirred at room temperature.
  • the composition was filtered using a 0.2 m PTFE filter, and the composition was applied onto a glass substrate using a spin coater.
  • the film was baked on a hot plate at 110 ° C for 1 minute (soft beta) to form a coating film with a thickness of 1.02 and im (measured with an interference film thickness meter).
  • This coating film was irradiated with ultraviolet rays having an irradiation dose of 600 mj / cm 2 at 365 nm by an ultraviolet irradiation device. Subsequently, PEB was performed on a hot plate at 120 ° C for 1 minute. Thereafter, post-beta was performed on a hot plate at 200 ° C. for 5 minutes, and the transmittance (transmittance at 400 nm) of the glass substrate on which the resist was formed was measured with a spectrophotometer.
  • Table 1 shows the transmittance results of the resists produced in Examples 4 to 6 and Comparative Examples 1 and 2. [table 1]
  • Comparative Example 2 4 2% As shown in Table 1, the resist (Examples 4 to 6) prepared using the photoacid generator of the cyclohexagen-based oxime sulfonate compound of the present invention is shown in Table 2002. — Photoacid of the present invention having higher post-beta transmittance than a resist (Comparative Examples 4 to 6) prepared using a photoacid generator comprising a thiophenoxime sulfonate compound described in Japanese Patent No. 508774. It can be seen that the generator is less colored by exposure and heating. Next, the effect of producing a color filter using the dye-containing resist composition of the present invention will be shown.
  • VP8000 manufactured by Nippon Soda Co., Ltd., the component is polybutanol.
  • Weight average molecular weight 8000 (polystyrene equivalent)) is 1.54 g
  • dye formula [21] is 1.9 g
  • As a solvent 23.756 g of propylene glycol monomethyl ether was added and stirred at room temperature. No insoluble matter was found in the reaction solution, and the solution was uniform.
  • This coating film was irradiated with ultraviolet rays having an irradiation dose of 600 mj / cm 2 at 365 nm by an ultraviolet irradiation device. Subsequently, PEB was performed on a hot plate at 120 ° C for 1 minute. After that, post-beta was performed on a hot plate at 200 ° C for 5 minutes, and the resist was deposited on the film. The transmittance of the glass substrate (transmittance at 400 nm) was measured with a spectrophotometer.
  • this composition was apply
  • This coating film was irradiated with ultraviolet rays having an irradiation dose of 600 mJ / cm 2 at 365 nm by an ultraviolet irradiation device. Subsequently, PEB was performed on a hot plate at 120 ° C for 1 minute. Thereafter, the film thickness was measured using an interference type film thickness meter.
  • This film was statically developed at room temperature for 40 seconds using a developer NMD-3 (manufactured by Tokyo Ohka Kogyo Co., Ltd.), and the film thickness was measured again using an interference film thickness meter.
  • the film thickness before and after development was compared, and the remaining film ratio after development was calculated.
  • VP8000 manufactured by Nippon Soda Co., Ltd., the component is polybutanol.
  • Weight average molecular weight 8000 (polystyrene equivalent)) is 1.54 g
  • dye formula [21] is 1.9 g
  • As a solvent 23.756 g of propylene glycol monomethyl ether was added and stirred at room temperature. No insoluble matter was found in the reaction solution, and the solution was uniform.
  • This coating film was irradiated with ultraviolet rays having an irradiation dose of 600 mj / cm 2 at 365 nm by an ultraviolet irradiation device. Subsequently, PEB was performed on a hot plate at 120 ° C for 1 minute. Thereafter, post-beta was performed on a hot plate at 200 ° C. for 5 minutes, and the transmittance (transmittance at 400 nm) of the glass substrate on which the resist was formed was measured with a spectrophotometer.
  • this composition was apply
  • the UV irradiation device applied this coating film with a dose of 300mj / c at 365nm. Irradiated with ultraviolet rays of m 2 .
  • PEB was performed on a hot plate at 120 ° C for 1 minute. Thereafter, the film thickness was measured using an interference type film thickness meter.
  • This film was statically developed at room temperature for 30 seconds using a developer NMD-3 (manufactured by Tokyo Ohka Kogyo Co., Ltd.), and the film thickness was measured again using an interference film thickness meter.
  • the film thickness before and after development was compared, and the remaining film ratio after development was calculated.
  • Table 2 shows the transmittance of the resists produced in Example 7 and Comparative Example 3.
  • the resist (Example 7) prepared using the dye-containing resist composition of the present invention is a thiophenoxime sulfonate compound described in JP-T-2002-508774.
  • the dye-containing resist composition of the present invention which has higher post-beta transmittance, is more effective for color filters than a resist prepared using a dye-containing resist composition containing I understand.
  • Table 3 shows the remaining film ratio of the color filters manufactured in Example 7 and Comparative Example 3.

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Abstract

[PROBLEMS] To provide a dye-containing resist composition which can provide a color filter suppressed in the coloration at the visible region (400 to 730 nm). [MEANS FOR SOLVING PROBLEMS] A dye-containing resist composition containing a photoacid generator comprising a cyclohexadiene-type oxime sulfonate compound represented by the formula [1]. [1] wherein R1, R2, R5, R6 and R7 independently represent a hydrogen atom, a halogen atom, CN, NO2, an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, or the like; R3 represents a hydrogen atom, a halogen atom, a nitro group, a CN group, an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, or the like; R4 represents an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms, a haloalkoxy group having 1 to 5 carbon atoms, a phenyl group which may be substituted by W, or the like; and W represents a halogen atom, CN, an alkyl group having 1 to 10 carbon atoms, or the like; and n represents an integer of 1, 2, 3 or 4.

Description

明 細 書  Specification
光酸発生剤を含む染料含有レジスト組成物及びシクロへキサジェン系ォ キシムスルホネート化合物  Dye-containing resist composition containing photoacid generator and cyclohexagen-based oxime sulfonate compound
技術分野  Technical field
[0001] 本発明は、光酸発生剤を含む染料含有レジスト組成物及びシクロへキサジェン系 ォキシムスルホネート化合物に関し、さらに詳述すると、 i線(365nm)対応の光酸発 生剤を含む染料含有レジスト組成物に関する。  The present invention relates to a dye-containing resist composition containing a photoacid generator and a cyclohexagen-based oxime sulfonate compound. More specifically, the present invention relates to a dye-containing composition containing a photoacid generator corresponding to i-line (365 nm). The present invention relates to a resist composition.
背景技術  Background art
[0002] 電荷結合素子(CCD)又は液晶表示素子(LCD)等の撮像素子用カラーフィルタ 一は、主に、微細なパターン形成ができることにより高精細なカラーフィルターを作製 することが可能であることから、色素を添加したフォトレジストによりパターンを形成す る方法を用いて作製されている。この方法では色素と高分子樹脂とを含むレジスト組 成物を用いて、それを基板上に塗布成膜した後、着色層をフォトリソグラフィ一法で パターユング、現像することで一つの着色パターンを形成し、各色毎にこの工程を繰 り返し行い、カラーフィルターを作製する。  [0002] A color filter for an image sensor such as a charge coupled device (CCD) or a liquid crystal display device (LCD) is capable of producing a high-definition color filter mainly because a fine pattern can be formed. Therefore, it is produced using a method of forming a pattern with a photoresist added with a dye. In this method, a resist composition containing a dye and a polymer resin is used. After coating the film on a substrate, the colored layer is patterned and developed by a photolithography method to form a single colored pattern. Then, this process is repeated for each color to produce a color filter.
その際、着色剤として用いられる色素には、一般的に耐熱性ゃ耐光安定性に優れ る顔料が用いられ、顔料を分散させたレジストが提案されている。例えば、酸により硬 化し得る樹脂系材料と、光酸発生剤と、顔料とを含有してなることを特徴とする感光 性着色樹脂組成物が開示されている (例えば、特許文献 1)。そこには樹脂系材料が フエノールを含む樹脂と N—メチロール構造を持つ架橋剤とからなることが開示され ている。  In this case, pigments that are excellent in heat resistance and light stability are generally used as the coloring agent used as the colorant, and resists in which pigments are dispersed have been proposed. For example, there is disclosed a photosensitive colored resin composition comprising a resin material that can be hardened by an acid, a photoacid generator, and a pigment (for example, Patent Document 1). It is disclosed that the resin material consists of a resin containing phenol and a crosslinking agent having an N-methylol structure.
しかしながら、顔料は顔料自体が数十 nmな!/、し数百 nm前後の粒子径を有する粒 子を含んでいるため、それ自体が異物となる、又は分散が安定せず凝集を起こすと いう問題があった。そのため、従来の顔料を用いることによっては、高解像度が要求 される CCD用カラーフィルターの作製が困難な状況となってきている。  However, since the pigment itself contains particles having a particle size of several tens of nm! / And several hundreds of nm, the pigment itself becomes a foreign substance, or the dispersion is not stable and causes aggregation. There was a problem. For this reason, using conventional pigments makes it difficult to produce color filters for CCDs that require high resolution.
これに対して、色素として染料を用いた場合、染料は有機溶剤に対して可溶である ことから均一なレジスト組成物が得られる。そのため、顔料を分散させたレジスト組成 物に比べて微細なパターンを形成することが可能である。例えば、酸により硬化し得 る樹脂、架橋剤、光酸発生剤、染料及び溶剤を含有してなるネガティブ型レジスト組 成物が開示されて!/、る(例えば、特許文献 2)。 On the other hand, when a dye is used as a pigment, a uniform resist composition can be obtained because the dye is soluble in an organic solvent. Therefore, a resist composition in which pigments are dispersed It is possible to form a fine pattern as compared with an object. For example, a negative resist composition comprising a resin curable with an acid, a crosslinking agent, a photoacid generator, a dye and a solvent is disclosed (for example, Patent Document 2).
また、酸性染料のアミン塩であり、有機溶媒及びアルカリ性水溶液に可溶なカラー フィルター用レジスト添加色素が開示されている(例えば、特許文献 3)。  In addition, a resist-added dye for a color filter that is an amine salt of an acid dye and is soluble in an organic solvent and an alkaline aqueous solution is disclosed (for example, Patent Document 3).
一方、含窒素有機化合物による陽イオンを有する染料については、テトラキスァゾ 染料に、脂肪族ァミン類、脂環族ァミン類、芳香族ァミン類又は第 4級アンモニゥム塩 類を作用させる方法による製造方法が開示されている。これらは、各種インキ、ラッカ 一用として、あるいは紙、合成樹脂、繊維材料その他一般合成樹脂材料、木材、油、 天然及び合成ワックス用の着色剤、石油製品の着色剤として使用できることが記載さ れてレ、る (例えば、特許文献 4)。  On the other hand, for a dye having a cation by a nitrogen-containing organic compound, a production method by a method in which an aliphatic amine, an alicyclic amine, an aromatic amine or a quaternary ammonium salt is allowed to act on a tetrakisazo dye is disclosed. Has been. It is described that they can be used for various inks and lacquers, or as colorants for paper, synthetic resins, fiber materials and other general synthetic resin materials, wood, oil, natural and synthetic waxes, and petroleum products. (For example, Patent Document 4).
また、活性水素を有する水溶性染料、エポキシ化合物、ァミンの反応混合物を着色 剤として含有するインキ組成物が開示されている。これらは筆記具用、印刷用、記録 用、スタンプ用、紙着色に利用されることが記載されている(例えば、特許文献 5)。 光酸発生剤につ!/、ては、 g線、 h線及び i線に対して優れた吸光係数 (光感度)を有 し、溶剤に対して優れた溶解性を有するォキシムスルホネート化合物が知られてレ、る (例えば、特許文献 6)。  Also disclosed is an ink composition containing a reaction mixture of a water-soluble dye having active hydrogen, an epoxy compound, and an amine as a colorant. It is described that these are used for writing instruments, printing, recording, stamping, and paper coloring (for example, Patent Document 5). As a photoacid generator! /, An oxime sulfonate compound that has an excellent absorption coefficient (photosensitivity) for g-line, h-line and i-line, and excellent solubility in solvents. It is known (for example, Patent Document 6).
最近、チォフェン系ォキシムスルホネート化合物を用いた染料含有レジスト組成物 が見出され、カラーフィルターを作製した際にその薄膜化が可能であることが報告さ れてレ、る (例えば、特許文献 7)。  Recently, a dye-containing resist composition using a thiophene-based oxime sulfonate compound has been found, and it has been reported that a thin film can be formed when a color filter is produced (for example, Patent Document 7). ).
特許文献 1:特開平 4 163552号公報 Patent Document 1: Japanese Patent Laid-Open No. 4 163552
特許文献 2:特開平 6— 51514号公報 Patent Document 2: Japanese Patent Laid-Open No. 6-51514
特許文献 3:特開平 6— 51115号公報 Patent Document 3: JP-A-6-51115
特許文献 4 :特開昭 60— 229953号公報 Patent Document 4: JP-A-60-229953
特許文献 5:特開昭 61— 203182号公報 Patent Document 5: Japanese Patent Laid-Open No. 61-203182
特許文献 6:特表 2002— 508774号公報 Patent Document 6: Special Table 2002-508774
特許文献 7:国際公開第 2006/046398号パンフレット Patent Document 7: International Publication No. 2006/046398 Pamphlet
発明の開示 発明が解決しょうとする課題 Disclosure of the invention Problems to be solved by the invention
[0004] 光酸発生剤としてチォフェン系ォキシムスルホネート化合物を用いた染料含有レジ スト組成物は、露光及びその後の熱処理により着色するため、カラーフィルターの透 過率を低下させるとレ、う問題を有して!/、る。 [0004] A dye-containing resist composition using a thiophene oxime sulfonate compound as a photoacid generator is colored by exposure and subsequent heat treatment. Have it!
本発明は、このような事情に鑑みてなされたものであり、可視領域(400nmないし 7 30nm)での着色が抑制されたカラーフィルターを与える染料含有レジスト組成物を 提供することを目的とする。  The present invention has been made in view of such circumstances, and an object thereof is to provide a dye-containing resist composition that provides a color filter in which coloring in the visible region (400 nm to 730 nm) is suppressed.
また、露光に使用した活性光に対する感度、特に、 i線(365nm)に対する感度に 優れ、露光及びその後の熱処理により着色の少な!/、レジストを作製できる光酸発生 剤を提供することを目的とする。  Another object of the present invention is to provide a photoacid generator that is excellent in sensitivity to active light used for exposure, in particular, sensitivity to i-line (365 nm), has little coloration by exposure and subsequent heat treatment, and can produce a resist. To do.
課題を解決するための手段  Means for solving the problem
[0005] 本発明者らは、上記目的を達成するために鋭意検討を重ねた結果、光酸発生剤と してシクロへキサジェン系ォキシムスルホネート化合物を含む染料含有レジスト組成 物力 可視領域での着色が抑制されたカラーフィルターを与えることを見出し、さらに 、シクロへキサジェン系ォキシムスルホネート化合物の中でも、 2, 6—置換フエニル 基を有する化合物の最大吸収波長が i線の波長 365nmにほぼ一致し、それを用い て作製されるレジストが高い光透過率と着色の少ないことを見出し、本発明を完成さ せた。 As a result of intensive investigations to achieve the above object, the present inventors have found that a dye-containing resist composition containing a cyclohexagen-based oxime sulfonate compound as a photoacid generator. In addition, among the cyclohexagen-based oxime sulfonate compounds, the maximum absorption wavelength of the compound having a 2,6-substituted phenyl group almost coincides with the i-line wavelength of 365 nm. The present inventors have completed the present invention by finding that a resist produced using the resist has high light transmittance and little coloring.
[0006] すなわち、本発明は、  That is, the present invention provides:
1. 式 [1]  1. Formula [1]
[化 1]  [Chemical 1]
Figure imgf000004_0001
Figure imgf000004_0001
(式中、
Figure imgf000004_0002
R2、 R5、 R6及び R'は、それぞれ独立して、水素原子、ハロゲン原子、 CN 、 NO、炭素原子数 1ないし 10のアルキル基、炭素原子数 1ないし 5のアルコキシ基 、炭素原子数 1ないし 5のハロアルキル基又は炭素原子数 1ないし 5のハロアルコキ シ基を表し、
(Where
Figure imgf000004_0002
R 2 , R 5 , R 6 and R ′ are each independently a hydrogen atom, a halogen atom, CN, NO, an alkyl group having 1 to 10 carbon atoms, or an alkoxy group having 1 to 5 carbon atoms. Represents a haloalkyl group having 1 to 5 carbon atoms or a haloalkoxy group having 1 to 5 carbon atoms,
R3は、水素原子、ハロゲン原子、ニトロ基、 CN基、炭素原子数 1ないし 10のアルキル 基、炭素原子数 1ないし 5のアルコキシ基、炭素原子数 1ないし 5のハロアルキル基又 は炭素原子数 1ないし 5のハロアルコキシ基を表し、 nが 2 3又は 4を表すとき、各々 の R3は互いに同一であっても又は互いに相異なっていてもよぐさらに、 R3が隣接す る場合には、隣接する 2つの R3は、— CH CH -CH O— — CH N (R8)— - CH CH CH -CH CH O— CH CH N (R CH CH CH CH -CH CH CH O— -CH CH CH N (R CH CH CH CH CH C H CH CH CH O—又は一 CH CH CH CH N (R8)—を形成することにより、 2つの R3のそれぞれが結合する炭素原子と共に 4員環、 5員環又は 6員環を形成してもよく R 3 represents a hydrogen atom, a halogen atom, a nitro group, a CN group, an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms, or the number of carbon atoms. When 1 represents a haloalkoxy group of 1 to 5 and n represents 2 3 or 4, each R 3 may be the same as or different from each other, and when R 3 is adjacent The two adjacent R 3 groups are — CH CH —CH O— — CH N (R 8 ) — — CH CH CH —CH CH O— CH CH N (R CH CH CH CH —CH CH CH O— — By forming CH CH CH N (R CH CH CH CH CH CH CH CH CH O— or one CH CH CH CH N (R 8 ) —, a four-membered ring with the carbon atom to which each of the two R 3 bonds is attached. , 5-membered ring or 6-membered ring may be formed
R4は、炭素原子数 1ないし 10のアルキル基、炭素原子数 1ないし 5のアルコキシ基、 炭素原子数 1ないし 5のハロアルキル基、炭素原子数 1ないし 5のハロアルコキシ基、R 4 is an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms, a haloalkoxy group having 1 to 5 carbon atoms,
Wで置換されて!/、てもよ!/、フエニル基、 Wで置換されて!/、てもよ!/、ナフチル基又は W で置換されて!/、てもよ!/、アントラニル基を表し、 Substituted with W! /, May! /, Phenyl group, substituted with W! /, May! /, Naphthyl group or substituted with W! /, May! /, Anthranyl group Represents
R8は、水素原子又は炭素原子数 1ないし 10のアルキル基を表し、 R 8 represents a hydrogen atom or an alkyl group having 1 to 10 carbon atoms,
Wは、ハロゲン原子、 CN NO、炭素原子数 1ないし 10のアルキル基、炭素原子数 W is a halogen atom, CN NO, an alkyl group having 1 to 10 carbon atoms, or the number of carbon atoms
1ないし 5のアルコキシ基、炭素原子数 1ないし 5のハロアルキル基又は炭素原子数 1 なレ、し 5のハロアルコキシ基を表し、 An alkoxy group having 1 to 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms, or a haloalkoxy group having 1 carbon atom and 5 haloalkoxy groups,
nは、 1 2 3又は 4の整数を表す。 ) n represents an integer of 1 2 3 or 4. )
で表されるシクロへキサジェン系ォキシムスルホネート化合物からなる光酸発生剤を 含む染料含有レジスト組成物、 A dye-containing resist composition comprising a photoacid generator comprising a cyclohexadiene oxime sulfonate compound represented by:
2. 前記 R5ないし R7が、全て水素原子であり、前記 R1及び R2が、それぞれ独立して 、ハロゲン原子、 CN NO、炭素原子数 1ないし 10のアルキル基、炭素原子数 1な いし 5のアルコキシ基、炭素原子数 1ないし 5のハロアルキル基又は炭素原子数 1な いし 5のハロアルコキシ基である 1に記載の染料含有レジスト組成物、 2. R 5 to R 7 are all hydrogen atoms, and R 1 and R 2 are each independently a halogen atom, CN NO, an alkyl group having 1 to 10 carbon atoms, or 1 carbon atom. The dye-containing resist composition according to 1, which is an alkoxy group having 5 or 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms, or a haloalkoxy group having 1 to 5 carbon atoms,
3. 前記 R1及び R2が、ハロゲン原子である 2に記載の染料含有レジスト組成物、 4. 前記ハロゲン原子が塩素原子である 3に記載の染料含有レジスト組成物、3. The dye-containing resist composition according to 2, wherein R 1 and R 2 are halogen atoms, 4. The dye-containing resist composition according to 3, wherein the halogen atom is a chlorine atom,
5. 前記 R3が、水素原子である 1ないし 4のいずれか 1つの染料含有レジスト組成物 5. The dye-containing resist composition according to any one of 1 to 4, wherein R 3 is a hydrogen atom
6. 前記式 [ 1 ]で表されるシクロへキサジェン系ォキシムスルホネート化合物からな る光酸発生剤 (A)、樹脂 (B)、架橋性化合物 (C)、染料 (D)及び溶媒 (E)を含む染 料含有レジスト組成物、 6. A photoacid generator (A), a resin (B), a crosslinkable compound (C), a dye (D) and a solvent (E) comprising a cyclohexadiene oxime sulfonate compound represented by the above formula [1]. Dye-containing resist composition containing
7.前記染料 (D)が、式 [2]  7. The dye (D) is represented by the formula [2]
[化 2] [Chemical 2]
Figure imgf000006_0001
Figure imgf000006_0001
(式中、 R9ないし R12は、それぞれ独立して、水素原子又は有機基を表す。)で表され る陽イオン化合物を含有するものである 6に記載の染料含有レジスト組成物、 (Wherein R 9 to R 12 each independently represents a hydrogen atom or an organic group). The dye-containing resist composition according to 6, which comprises a cationic compound represented by:
8. 前記染料 (D)が、前記式 [2]で表される陽イオン化合物の対イオンとなる陰ィォ ン化合物を含有するものである 7に記載の染料含有レジスト組成物、  8. The dye-containing resist composition according to 7, wherein the dye (D) contains an anion compound which is a counter ion of the cationic compound represented by the formula [2].
9. 前記陰イオン化合物が、フタロシアニン構造を有する化合物である 8に記載の染 料含有レジスト組成物、  9. The dye-containing resist composition according to 8, wherein the anionic compound is a compound having a phthalocyanine structure,
10. 前記陰イオン化合物が、ピラゾールァゾ構造を有する化合物である 8に記載の 染料含有レジスト組成物、  10. The dye-containing resist composition according to 8, wherein the anionic compound is a compound having a pyrazole azo structure,
11. 前記陰イオン化合物が、ピラゾールァゾ構造と金属錯体構造とを有する化合 物である 8に記載の染料含有レジスト組成物、  11. The dye-containing resist composition according to 8, wherein the anionic compound is a compound having a pyrazole azo structure and a metal complex structure,
12. 前記陰イオン化合物が、キサンテン構造を有する化合物である 8に記載の染 料含有レジスト組成物、  12. The dye-containing resist composition according to 8, wherein the anionic compound is a compound having a xanthene structure,
13. 1ないし 12のいずれ力、 1つの染料含有レジスト組成物を、基板上に塗布し、乾 燥し、露光し、そして現像する工程を含むカラーフィルターの製造方法、  13. A method for producing a color filter comprising the steps of: applying one dye-containing resist composition onto a substrate, drying, exposing and developing;
14. 13の方法で製造されたカラーフィルターを含む液晶表示装置、  14. A liquid crystal display device including a color filter manufactured by 13 methods,
15. 13の方法で製造されたカラーフィルターを含む LED (発光ダイオード)表示装 置、 15. LED (light emitting diode) display device including color filters manufactured by 13 methods Place
16. 13の方法で製造されたカラーフィルターを含む固体撮像素子、  16. A solid-state imaging device including a color filter manufactured by 13 methods,
17. 式 [3] 17. Formula [3]
[化 3] [Chemical 3]
Figure imgf000007_0001
Figure imgf000007_0001
(式中、 R1及び R2は、それぞれ独立して、ハロゲン原子、 CN NO、炭素原子数 1な いし 10のアルキル基、炭素原子数 1ないし 5のアルコキシ基、炭素原子数 1ないし 5 のハロアルキル基又は炭素原子数 1ないし 5のハロアルコキシ基を表し、 (Wherein R 1 and R 2 are each independently a halogen atom, CN NO, an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, or Represents a haloalkyl group or a haloalkoxy group having 1 to 5 carbon atoms,
R3は、水素原子、ハロゲン原子、ニトロ基、 CN基、炭素原子数 1ないし 10のアルキル 基、炭素原子数 1ないし 5のアルコキシ基、炭素原子数 1ないし 5のハロアルキル基又 は炭素原子数 1ないし 5のハロアルコキシ基を表し、 nが 2 3又は 4を表すとき、各々 の R3は互いに同一であっても又は互いに相異なっていてもよぐさらに、 R3が隣接す る場合には、隣接する 2つの R3は、— CH CH -CH O— — CH N (R8)— - CH CH CH -CH CH O— CH CH N (R CH CH CH CH -CH CH CH O— -CH CH CH N (R CH CH CH CH CH C H CH CH CH O—又は一 CH CH CH CH N (R8)—を形成することにより、 2つの R3のそれぞれが結合する炭素原子と共に 4員環、 5員環又は 6員環を形成してもよく R 3 represents a hydrogen atom, a halogen atom, a nitro group, a CN group, an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms, or the number of carbon atoms. When 1 represents a haloalkoxy group of 1 to 5 and n represents 2 3 or 4, each R 3 may be the same as or different from each other, and when R 3 is adjacent The two adjacent R 3 groups are — CH CH —CH O— — CH N (R 8 ) — — CH CH CH —CH CH O— CH CH N (R CH CH CH CH —CH CH CH O— — By forming CH CH CH N (R CH CH CH CH CH CH CH CH CH O— or one CH CH CH CH N (R 8 ) —, a four-membered ring with the carbon atom to which each of the two R 3 bonds is attached. , 5-membered ring or 6-membered ring may be formed
R4は、炭素原子数 1ないし 10のアルキル基、炭素原子数 1ないし 5のアルコキシ基、 炭素原子数 1ないし 5のハロアルキル基、炭素原子数 1ないし 5のハロアルコキシ基、R 4 is an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms, a haloalkoxy group having 1 to 5 carbon atoms,
Wで置換されて!/、てもよ!/、フエニル基、 Wで置換されて!/、てもよ!/、ナフチル基又は W で置換されて!/、てもよ!/、アントラニル基を表し、 Substituted with W! /, May! /, Phenyl group, substituted with W! /, May! /, Naphthyl group or substituted with W! /, May! /, Anthranyl group Represents
R8は、水素原子又は炭素原子数 1ないし 10のアルキル基を表し、 R 8 represents a hydrogen atom or an alkyl group having 1 to 10 carbon atoms,
Wは、ハロゲン原子、 CN NO、炭素原子数 1ないし 10のアルキル基、炭素原子数 1ないし 5のアルコキシ基、炭素原子数 1ないし 5のハロアルキル基又は炭素原子数 1 なレ、し 5のハロアルコキシ基を表し、 W is a halogen atom, CN NO, an alkyl group having 1 to 10 carbon atoms, or the number of carbon atoms An alkoxy group having 1 to 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms, or a haloalkoxy group having 1 carbon atom and 5 haloalkoxy groups,
nは、 1 2 3又は 4の整数を表す。 ) n represents an integer of 1 2 3 or 4. )
で表されるシクロへキサジェン系ォキシムスルホネート化合物。 A cyclohexadiene oxime sulfonate compound represented by the formula:
18. 前記 R1及び R2が、それぞれ独立して、ハロゲン原子である 17に記載のシクロ へキサジェン系ォキシムスルホネート化合物、 18. The cyclohexadiene oxime sulfonate compound according to 17, wherein R 1 and R 2 are each independently a halogen atom,
19. 前記ハロゲン原子が塩素原子である 18に記載のシクロへキサジェン系ォキシ ムスルホネート化合物、  19. The cyclohexadiene oxime sulfonate compound according to 18, wherein the halogen atom is a chlorine atom,
20. 前記 R3が、水素原子である 17ないし 19のいずれ力、 1つのシクロへキサジェン 系ォキシムスルホネ一ト化合物、 20. The power of 17 to 19, wherein R 3 is a hydrogen atom, one cyclohexadiene oxime sulfonate compound,
21. 式 [4]  21. Equation [4]
[化 4] [Chemical 4]
Figure imgf000008_0001
Figure imgf000008_0001
(式中、 R1及び R2は、それぞれ独立して、ハロゲン原子、 CN NO、炭素原子数 1な いし 10のアルキル基、炭素原子数 1ないし 5のアルコキシ基、炭素原子数 1ないし 5 のハロアルキル基又は炭素原子数 1ないし 5のハロアルコキシ基を表し、 (Wherein R 1 and R 2 are each independently a halogen atom, CN NO, an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, or Represents a haloalkyl group or a haloalkoxy group having 1 to 5 carbon atoms,
R3は、水素原子、ハロゲン原子、ニトロ基、 CN基、炭素原子数 1ないし 10のアルキル 基、炭素原子数 1ないし 5のアルコキシ基、炭素原子数 1ないし 5のハロアルキル基又 は炭素原子数 1ないし 5のハロアルコキシ基を表し、 nが 2 3又は 4を表すとき、各々 の R3は互いに同一であっても又は互いに相異なっていてもよぐさらに、 R3が隣接す る場合には、隣接する 2つの R3は、— CH CH -CH O— — CH N (R8)— - CH CH CH -CH CH O— CH CH N (R CH CH CH CH -CH CH CH O— -CH CH CH N (R CH CH CH CH CH C H CH CH CH O—又は一 CH CH CH CH N (R8)—を形成することにより、 2つの R3のそれぞれが結合する炭素原子と共に 4員環、 5員環又は 6員環を形成してもよく R 3 represents a hydrogen atom, a halogen atom, a nitro group, a CN group, an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms, or the number of carbon atoms. When 1 represents a haloalkoxy group of 1 to 5 and n represents 2 3 or 4, each R 3 may be the same as or different from each other, and when R 3 is adjacent The two adjacent R 3 groups are — CH CH —CH O— — CH N (R 8 ) — — CH CH CH —CH CH O— CH CH N (R CH CH CH CH —CH CH CH O— — By forming CH CH CH N (R CH CH CH CH CH CH CH CH CH O—or one CH CH CH CH N (R 8 ) — A 4-membered ring, a 5-membered ring or a 6-membered ring may be formed together with the carbon atom to which each R 3 is bonded.
R8は、水素原子又は炭素原子数 1ないし 10のアルキル基を表し、 R 8 represents a hydrogen atom or an alkyl group having 1 to 10 carbon atoms,
nは、 1、 2、 3又は 4の整数を表す。 ) n represents an integer of 1, 2, 3 or 4. )
で表されるシクロへキサジェン系ォキシム化合物、 A cyclohexadiene oxime compound represented by:
22. 前記式 [3]で表されるシクロへキサジェン系ォキシムスルホネート化合物から なる光酸発生剤、  22. A photoacid generator comprising a cyclohexadiene oxime sulfonate compound represented by the formula [3],
23. 前記式 [3]で表されるシクロへキサジェン系ォキシムスルホネート化合物から なる i線用光酸発生剤  23. An i-line photoacid generator comprising a cyclohexadiene oxime sulfonate compound represented by the formula [3]
を提供する。 I will provide a.
発明の効果 The invention's effect
本発明の染料含有レジスト組成物は、露光及びその後の熱処理による着色が少な ぐそれによりカラーフィルターの特性向上を可能とする。またフエノール性樹脂と染 料の相互作用により高い耐熱 ·耐光性を有するカラーフィルターを作製できる。 本発明の染料含有レジスト組成物は、レジスト組成物中での染料濃度を高めること でカラーフィルターを作製した際に、その薄膜化が可能である。カラーフィルターの 膜厚を 0. 3ないし 1. 5 111に設定するには、レジスト組成物中での染料濃度が 30質 量%以上必要である。該染料分子を含有したレジスト組成物及びそれから製造され たカラーフィルタ一は、その染料分子に起因して 400ないし 700nmの波長領域にお いて、 70%以上の透過率を示す領域と 10%以下の透過率を示す領域とを少なくとも 有する光学特性を示す。染料濃度が低濃度でこの透過率の値を示す場合は、単位 体積当たりの染料分子の数が少なくてすむ力 S、耐熱性ゃ耐光性が十分に確保でき ない。また、染料濃度が高濃度でこの透過率を示す場合は、所望の光学特性を得る 上で単位体積当たりの染料分子の数が多くなり、解像度や密着性が十分に確保でき ない。従って、本発明の染料含有レジスト組成物は、可視領域(400nmないし 730η m)、特には 400ないし 700nmにおいて、 70%以上の透過率を示す領域と 10%以 下の透過率を示す領域とを少なくとも有する分光スペクトルを示す染料を含有するも のである。 赤、緑、青等の染料は、各染料が吸収を示す特定領域 (透過率が 10%以下の領 域)と吸収を示さない領域 (透過率が 70%以上の領域)を有しているものであり、吸収 を示さなレ、領域は他の染料の吸収を阻害するものであっては好ましくな!/、。各染料が 本来、吸収を示さない領域に吸収を持つ場合は、その染料の耐熱性ゃ耐光性が不 十分な場合である。本発明の染料含有レジスト組成物に使用される上記染料は、吸 収を示す特定領域で透過率が 10%以下であり、吸収を示さない領域では透過率がThe dye-containing resist composition of the present invention is less colored by exposure and subsequent heat treatment, thereby making it possible to improve the characteristics of the color filter. In addition, a color filter having high heat resistance and light resistance can be produced by the interaction between the phenolic resin and the dye. The dye-containing resist composition of the present invention can be thinned when a color filter is produced by increasing the dye concentration in the resist composition. In order to set the film thickness of the color filter from 0.3 to 1.5 111, the dye concentration in the resist composition must be 30% by mass or more. The resist composition containing the dye molecule and the color filter produced from the resist composition have a region exhibiting a transmittance of 70% or more and a wavelength of 10% or less in the wavelength region of 400 to 700 nm due to the dye molecule. And an optical characteristic having at least a region exhibiting transmittance. When the dye concentration is low and this transmittance value is shown, sufficient force S, heat resistance, and light resistance cannot be ensured because the number of dye molecules per unit volume is small. In addition, when the dye concentration is high and exhibits this transmittance, the number of dye molecules per unit volume increases in order to obtain desired optical characteristics, and sufficient resolution and adhesion cannot be ensured. Therefore, the dye-containing resist composition of the present invention has a region showing a transmittance of 70% or more and a region showing a transmittance of 10% or less in the visible region (400 nm to 730 ηm), particularly 400 to 700 nm. It contains at least a dye exhibiting a spectral spectrum. Dyes such as red, green, and blue have specific areas where each dye absorbs (area where the transmittance is 10% or less) and areas where the dye does not absorb (area where the transmittance is 70% or more). It is preferable that the region does not show absorption, and that the region inhibits absorption of other dyes! When each dye has absorption in a region that does not inherently exhibit absorption, the heat resistance or light resistance of the dye is insufficient. The dye used in the dye-containing resist composition of the present invention has a transmittance of 10% or less in a specific region showing absorption, and has a transmittance in a region showing no absorption.
70%以上であり、 目的とする分光スペクトルを発現することにより、鮮明なカラーフィ ノレターを得ること力 Sできる。 本発明のシクロへキサジェン系ォキシムスルホネート化合物からなる光酸発生剤は 、レジスト組成物のその他主成分、すなわち樹脂、架橋性化合物、染料及び溶剤の 各成分に対して高い相溶性を示す。 It is 70% or more, and it is possible to obtain a clear color finisher by expressing the target spectrum. The photoacid generator comprising the cyclohexadiene oxime sulfonate compound of the present invention exhibits high compatibility with the other main components of the resist composition, that is, the resin, the crosslinkable compound, the dye and the solvent.
また、本発明の 2, 6—置換フエ二ル基を有するシクロへキサジェン系ォキシムスル ホネート化合物は、最大吸収波長が i線の波長 365nmにほぼ一致し、それを用いて 作製されるレジストは、着色が少なぐ高い光透過率を有する。  In addition, the cyclohexagen-based oxime sulfonate compound having a 2,6-substituted phenyl group according to the present invention has a maximum absorption wavelength almost coincident with the i-line wavelength of 365 nm, and the resist produced using the compound is colored. Has a high light transmittance.
本発明の染料含有レジスト組成物を、基板上に塗布し、硬化し、露光、そして現像 して得られるカラーフィルターを用いることで、高デバイス感度の撮像素子を作製す ることが可能である。  By using a color filter obtained by coating the dye-containing resist composition of the present invention on a substrate, curing, exposing, and developing, it is possible to produce an image sensor with high device sensitivity.
発明を実施するための最良の形態  BEST MODE FOR CARRYING OUT THE INVENTION
[0008] 以下、本発明についてさらに詳しく説明する。  [0008] Hereinafter, the present invention will be described in more detail.
本発明に係る染料含有レジスト組成物は、前記式 [1]で表されるシクロへキサジェ ン系ォキシムスルホネート化合物からなる光酸発生剤を含むものである。  The dye-containing resist composition according to the present invention contains a photoacid generator composed of a cyclohexagen-based oxime sulfonate compound represented by the formula [1].
[0009] 前記式 [1]において、 R1, R2、 R5、 R6及び R7は、それぞれ独立して、水素原子、ノヽ ロゲン原子、 CN、 NO、炭素原子数 1ないし 10のアルキル基、炭素原子数 1ないし 5 のアルコキシ基、炭素原子数 1ないし 5のハロアルキル基又は炭素原子数 1ないし 5 のハロアルコキシ基を表し、 R3は、水素原子、ハロゲン原子、ニトロ基、 CN基、炭素 原子数 1ないし 10のアルキル基、炭素原子数 1ないし 5のアルコキシ基、炭素原子数 1ないし 5のハロアルキル基又は炭素原子数 1ないし 5のハロアルコキシ基を表し、 n が 2、 3又は 4を表すとき、各々の R3は互いに同一であっても又は互いに相異なって いてもよく、さらに、 R3が隣接する場合には、隣接する 2つの R3は、 CH2CH2― - CH O CH N (R8)— -CH CH CH CH CH O CH CH N (R8 ト、 -CH CH CH CH -CH CH CH O CH CH CH N (R C H CH CH CH CH CH CH CH CH O 又は CH CH CH CH N (R8) を形成することにより、 2つの R3のそれぞれが結合する炭素原子と共に 4員環、 5員 環又は 6員環を形成してもよぐ R8は、水素原子又は炭素原子数 1ないし 10のアルキ ル基を表し、 nは、 1 2 3又は 4の整数を表す。 In the above formula [1], R 1 , R 2 , R 5 , R 6 and R 7 are each independently a hydrogen atom, a nitrogen atom, CN, NO, or an alkyl having 1 to 10 carbon atoms. Group, an alkoxy group having 1 to 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms, or a haloalkoxy group having 1 to 5 carbon atoms, R 3 represents a hydrogen atom, a halogen atom, a nitro group, or a CN group Represents an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms or a haloalkoxy group having 1 to 5 carbon atoms, and n is 2, 3 or 4 represents each R 3 may be the same or different from each other. In addition, when R 3 is adjacent, two adjacent R 3 are CH 2 CH 2 --CH O CH N (R 8 )--CH CH CH CH CH O CH CH N (R 8 DOO, -CH CH CH CH -CH CH CH O CH CH CH N (RCH CH CH CH CH CH CH CH CH O or by forming a CH CH CH CH N (R 8 ), each of the two R 3 May form a 4-membered ring, a 5-membered ring or a 6-membered ring with the carbon atom to which R is bonded. R 8 represents a hydrogen atom or an alkyl group having 1 to 10 carbon atoms, and n is 1 2 3 Or represents an integer of 4.
[0010] ハロゲン原子の具体例としては、フッ素原子、塩素原子、臭素原子又は沃素原子 が挙げられる。 [0010] Specific examples of the halogen atom include a fluorine atom, a chlorine atom, a bromine atom, and an iodine atom.
炭素原子数 1ないし 10のアルキル基の具体例としては、メチル基、ェチル基、 n- プロピル基、 i プロピル基、 n ブチル基、 i ブチル基、 s ブチル基、 n ァミル基 i—アミノレ基、 s アミノレ基、 n へキシル基、 n へプチル基、 n ォクチル基、 n— ノニル基、 n デシル基等が挙げられる。  Specific examples of the alkyl group having 1 to 10 carbon atoms include a methyl group, an ethyl group, an n-propyl group, an i-propyl group, an n-butyl group, an i-butyl group, an s-butyl group, an n-amyl group, an i-aminole group, s Amino group, n-hexyl group, n-heptyl group, n-octyl group, n-nonyl group, n-decyl group and the like.
炭素原子数 1ないし 5のアルコキシ基の具体例としては、メトキシ基、エトキシ基、 n プロポキシ基、 i プロポキシ基、 n—ブトキシ基、 n アミルォキシ基等が挙げられ 炭素原子数 1ないし 5のハロアルキル基の具体例としては、トリフルォロメチル基、 ペンタフルォロェチル基、パーフルォロ n プロピル基、パーフルォロ n ブチル基、 パーフルォロ n アミル基等が挙げられる。 Specific examples of the alkoxy group having 1 to 5 carbon atoms include a methoxy group, an ethoxy group, an n propoxy group, an i propoxy group, an n -butoxy group, and an n amyloxy group. A haloalkyl group having 1 to 5 carbon atoms Specific examples thereof include trifluoromethyl group, pentafluoroethyl group, perfluoro n propyl group, perfluoro n butyl group, perfluoro n amyl group and the like.
炭素原子数 1ないし 5のハロアルコキシ基の具体例としては、トリフルォロメトキシ基 、ペンタフルォロエトキシ基、パーフルォロ n プロポキシ基、パーフルォロ n ブトキ シ基、パーフルォロ n アミルォキシ基等が挙げられる。  Specific examples of the haloalkoxy group having 1 to 5 carbon atoms include trifluoromethoxy group, pentafluoroethoxy group, perfluoro n propoxy group, perfluoro n butoxy group, perfluoro n amyloxy group, and the like.
[0011] 上記各置換基の中でも、 i線(365nm)に対する感度及び該染料含有レジスト組成 物より作製されるレジストの光透過率を考慮すると、 R5 R6及び R7は、全て水素原子 であること力 S好ましく、 R1及び R2は、それぞれ独立して、ハロゲン原子、 CN NO、炭 素原子数 1ないし 10のアルキル基、炭素原子数 1ないし 5のアルコキシ基、炭素原子 数 1ないし 5のハロアルキル基又は炭素原子数 1ないし 5のハロアルコキシ基であるこ とが好ましぐ R3は、水素原子であることが好ましい。 さらに、 R1及び R2は、それぞれ独立して、ハロゲン原子又は炭素原子数 1ないし 10 のアルキル基であることが好ましぐハロゲン原子であることがより好ましい。 [0011] Among the above substituents, considering the sensitivity to i-line (365 nm) and the light transmittance of a resist prepared from the dye-containing resist composition, R 5 R 6 and R 7 are all hydrogen atoms. Some force S Preferably, R 1 and R 2 are each independently a halogen atom, CN NO, an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, or 1 to 1 carbon atoms. R 3 is preferably a hydrogen atom, preferably a haloalkyl group of 5 or a haloalkoxy group of 1 to 5 carbon atoms. Furthermore, it is more preferable that R 1 and R 2 are each independently a halogen atom or a halogen atom, preferably an alkyl group having 1 to 10 carbon atoms.
具体的には、 R1及び R2は、それぞれ独立して、塩素原子又はメチル基であること好 ましぐ塩素原子であることがより好ましい。 Specifically, R 1 and R 2 are each independently a chlorine atom or a methyl group, and more preferably a chlorine atom.
[0012] また、前記式 [1]において、 R4は、炭素原子数 1ないし 10のアルキル基、炭素原子 数 1ないし 5のアルコキシ基、炭素原子数 1ないし 5のハロアルキル基、炭素原子数 1 ないし 5のハロアルコキシ基、 Wで置換されていてもよいフエニル基、 Wで置換されて いてもよいナフチル基又は Wで置換されていてもよいアントラニル基を表し、 Wは、ハ ロゲン原子、 CN、 NO、炭素原子数 1ないし 10のアルキル基、炭素原子数 1ないし 5 のアルコキシ基、炭素原子数 1ないし 5のハロアルキル基又は炭素原子数 1ないし 5 のハロアルコキシ基を表す。 [0012] In the formula [1], R 4 represents an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms, or 1 carbon atom. To 5 haloalkoxy groups, a phenyl group that may be substituted with W, a naphthyl group that may be substituted with W, or an anthranyl group that may be substituted with W; W is a halogen atom, CN , NO, an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms, or a haloalkoxy group having 1 to 5 carbon atoms.
[0013] ハロゲン原子、炭素原子数 1ないし 10のアルキル基、炭素原子数 1ないし 5のアル コキシ基、炭素原子数 1ないし 5のハロアルコキシ基の具体例としては、上記 R1ないし R3及び R5ないし R8で説明した基と同様のものが挙げられる。 Specific examples of the halogen atom, the alkyl group having 1 to 10 carbon atoms, the alkoxy group having 1 to 5 carbon atoms, and the haloalkoxy group having 1 to 5 carbon atoms include the above R 1 to R 3 and Examples thereof are the same as those described for R 5 to R 8 .
Wで置換されていてもよいフエニル基の具体例としては、フエニル基、 o—トリル基、 m—トリノレ基、 p—トリノレ基、 o—ェチノレフエニノレ基、 m—ェチノレフエニノレ基、 p—ェチ ノレフエニル基、 p— (n—プロピル)フエニル基、 p— (i—プロピル)フエニル基、 p— (n ーブチル)フエニル基、 p—(iーブチル)フエニル基、 p—(s—ブチル)フエニル基、 p 一(tーブチル)フエニル基、 p— (n—ァミル)フエニル基、 p— (i—ァミル)フエニル基、 p— (t—ァミル)フエニル基、 o—メトキシフエニル基、 m—メトキシフエニル基、 p—メト キシフエニル基、 o—エトキシフエニル基、 m—エトキシフエニル基、 p—エトキシフエ二 ノレ基、 p— (n—プロポキシ)フエニル基、 p— (i—プロポキシ)フエニル基、 p— (n—ブ トキシ)フエニル基、 p— (i—ブトキシ)フエニル基、 p— (s—ブトキシ)フエニル基、 p— (t—ブトキシ)フエニル基、 p— (n—アミルォキシ)フエニル基、 p— (i—アミルォキシ) フエニル基、 p— (t—アミルォキシ)フエニル基、 p—クロルフエニル基、 p—ブロモフエ 二ノレ基、 p—フルオロフェニル基、 2, 4—ジクロルフエニル基、 2, 4—ジブロモフエ二 ノレ基、 2, 4—ジフルオロフェニル基、 2, 4, 6—ジクロルフエニル基、 2, 4, 6—トリブ ロモフエニル基、 2, 4, 6—トリフルオロフェニル基、ペンタクロロフェニル基、ペンタブ ロモフエニル基、ペンタフルオロフェニル基、 p ビフエ二リル基等が挙げられる。Specific examples of the phenyl group which may be substituted with W include a phenyl group, o-tolyl group, m-trinole group, p-trinole group, o-ethino-lefinino group, m-ethino-lefinenole group. P- (ethyl) phenyl group, p- (n-propyl) phenyl group, p- (i-propyl) phenyl group, p- (n-butyl) phenyl group, p- (i-butyl) phenyl group, p- ( s-butyl) phenyl group, p- (t-butyl) phenyl group, p- (n-amyl) phenyl group, p- (i-amyl) phenyl group, p- (t-amyl) phenyl group, o-methoxyphenyl Enyl group, m-methoxyphenyl group, p-methoxyphenyl group, o-ethoxyphenyl group, m-ethoxyphenyl group, p-ethoxyphenyl group, p- (n-propoxy) phenyl group, p- ( i-propoxy) phenyl, p- (n-butoxy) phenyl P- (i-butoxy) phenyl group, p- (s-butoxy) phenyl group, p- (t-butoxy) phenyl group, p- (n-amyloxy) phenyl group, p- (i-amyloxy) phenyl Group, p- (t-amyloxy) phenyl group, p-chlorophenyl group, p-bromophenyl group, p-fluorophenyl group, 2, 4-dichlorophenyl group, 2,4-dibromophenyl group, 2, 4— Difluorophenyl group, 2, 4, 6-dichlorophenyl group, 2, 4, 6-trifluorophenyl group, 2, 4, 6-trifluorophenyl group, pentachlorophenyl group, pen tab A lomophenyl group, a pentafluorophenyl group, a p-biphenylyl group, and the like.
Wで置換されていてもよいナフチル基の具体例としては、 1 ナフチル基、 2—ナフ チノレ基、 2—メチルー 1 ナフチル基、 3—メチルー 1 ナフチル基、 4ーメチノレー 1 ナフチル基、 5 メチルー 1 ナフチル基、 6 メチルー 1 ナフチル基、 7 メチ ルー 1 ナフチル基、 8 メチルー 1 ナフチル基、 1ーメチルー 2 ナフチル基、 3 ーメチルー 2 ナフチル基、 4ーメチルー 2 ナフチル基、 5 メチルー 2 ナフチル 基、 6 メチルー 2 ナフチル基、 7 メチルー 2 ナフチル基、 8 メチルー 2 ナフ チル基等が挙げられる。 Specific examples of the naphthyl group which may be substituted with W include 1 naphthyl group, 2-naphthinole group, 2-methyl-1 naphthyl group, 3-methyl-1 naphthyl group, 4-methynole 1 naphthyl group, 5 methyl-1 naphthyl group Group, 6 methyl-1 naphthyl group, 7 methyl 1 naphthyl group, 8 methyl-1 naphthyl group, 1-methyl-2 naphthyl group, 3-methyl-2 naphthyl group, 4-methyl-2 naphthyl group, 5 methyl-2 naphthyl group, 6 methyl-2 naphthyl group 7 methyl-2-naphthyl group, 8 methyl-2-naphthyl group and the like.
Wで置換されていてもよいアントラニル基の具体例としては、 1 アントラニル基、 2 アントラニル基、 2—メチルー 1 アントラニル基、 3—メチルー 1 アントラニル基、 4ーメチルー 1 アントラニル基、 5—メチルー 1 アントラニル基、 6—メチルー 1ーァ ントラニル基、 7 メチルー 1 アントラニル基、 8—メチルー 1 アントラニル基、 9 メチルー 1 アントラニル基、 10—メチルー 1 アントラニル基、 1ーメチルー 2—アン トラニノレ基、 3 メチルー 2 アントラニル基、 4ーメチルー 2 アントラニル基、 5 メ チルー 2 アントラニル基、 6 メチルー 2 アントラニル基、 7 メチルー 2 アントラ ニル基、 8 メチルー 2 アントラニル基、 9ーメチルー 2 アントラニル基、 10 メチ ノレ 2—アントラニル基等が挙げられる。  Specific examples of the anthranyl group which may be substituted with W include 1 anthranyl group, 2 anthranyl group, 2-methyl-1 anthranyl group, 3-methyl-1 anthranyl group, 4-methyl-1 anthranyl group, 5-methyl-1 anthranyl group 6-methyl-1-anthranyl group, 7-methyl-1-anthranyl group, 8-methyl-1-anthranyl group, 9-methyl-1-anthranyl group, 10-methyl-1-anthranyl group, 1-methyl-2-anthranolin group, 3-methyl-2-anthranyl group, Examples include 4-methyl-2-anthranyl group, 5-methyl-2-anthranyl group, 6-methyl-2-anthranyl group, 7-methyl-2-anthranyl group, 8-methyl-2-anthranyl group, 9-methyl-2-anthranyl group, and 10-methyl-2-anthranyl group.
[0014] 上記各置換基の中でも、該染料含有レジスト組成物より作製されるレジストの光透 過率を考慮すると、 R4は、炭素原子数 1ないし 10のアルキル基又は Wで置換されて V、てもよ!/、フエニル基であることが好ましく、 Wで置換されて!/、てもよ!/、フエニル基で あることがより好ましい。ここで、 Wは、ハロゲン原子又は炭素原子数 1ないし 10のァ ルキル基であることが好ましレ、。 [0014] Among the above substituents, in consideration of the light transmittance of the resist prepared from the dye-containing resist composition, R 4 is substituted with an alkyl group having 1 to 10 carbon atoms or W and V 4 It is preferably a phenyl group, more preferably a W substituted! /, Or even a phenyl group. Here, W is preferably a halogen atom or an alkyl group having 1 to 10 carbon atoms.
具体的には、 R4は、メチノレ基、ェチル基、 n—プロピル基、フエニル基、 p トリノレ基 又はペンタフルオロフェニル基であること好ましぐフエニル基又は p—トリル基である ことがより好ましい。 Specifically, R 4 is more preferably a phenyl group or a p-tolyl group, preferably a methinole group, an ethyl group, an n-propyl group, a phenyl group, a p-trinole group, or a pentafluorophenyl group. .
[0015] 前記式 [1]で表されるシクロへキサジェン系ォキシムスルホネート化合物からなる光 酸発生剤の具体例としては、例えば、下記の化合物が挙げられる。  [0015] Specific examples of the photoacid generator comprising the cyclohexadiene oxime sulfonate compound represented by the formula [1] include the following compounds.
[化 5] [Chemical 5]
Figure imgf000014_0001
Figure imgf000014_0001
Figure imgf000014_0002
Figure imgf000014_0002
[0016] 本発明の染料含有レジスト組成物は、ネガティブ型(ネガ型)レジストとポジティブ型 The dye-containing resist composition of the present invention includes a negative type (negative type) resist and a positive type.
(ポジ型)レジストに適用可能である。  It can be applied to (positive type) resist.
好ましくは、本発明の染料含有レジスト組成物は、前記式 [1]で表されるシクロへキ サジェン系ォキシムスルホネート化合物からなる光酸発生剤 (A)、樹脂(B)、架橋性 化合物(C)、染料 (D)、及び溶媒 (E)を含有するネガ型レジスト組成物である。 ネガ型レジスト組成物において、使用する光酸発生剤 (A)としては、光照射により 直接又は間接的に酸を発生するものである。  Preferably, the dye-containing resist composition of the present invention comprises a photoacid generator (A), a resin (B), a crosslinkable compound (A) comprising a cyclohexagen oxime sulfonate compound represented by the above formula [1] A negative resist composition containing C), a dye (D), and a solvent (E). In the negative resist composition, the photoacid generator (A) to be used is one that generates an acid directly or indirectly by light irradiation.
光酸発生剤 (A)は、単独で用いることも、 2種以上組み合わせて用いることもできる またその導入量は、樹脂(B)成分 100質量部に対して 1ないし 300質量部、好まし くは 20ないし 200質量部の範囲で選ばれる。この量が 1質量部未満の場合では、架 橋反応が十分に進行せず、所望のレジストパターンが得られ難ぐまた 300質量部を 超えた場合では、レジスト組成物の保存安定性に劣る。  The photoacid generator (A) can be used alone or in combination of two or more thereof. The amount introduced is preferably 1 to 300 parts by mass with respect to 100 parts by mass of the resin (B) component. Is selected in the range of 20 to 200 parts by weight. When this amount is less than 1 part by mass, the bridge reaction does not proceed sufficiently, and it is difficult to obtain a desired resist pattern, and when it exceeds 300 parts by mass, the storage stability of the resist composition is poor.
[0017] ネガ型レジスト組成物に使用される樹脂(B)は、熱若しくは光照射により発生する 酸、又は熱若しくは光照射により発生する塩基により硬化する樹脂、熱又は光照射に より架橋する感光性樹脂であり、該樹脂中の未露光部の塗膜が現像液により除去で きるものであれば特に限定されなレ、。 [0017] The resin (B) used in the negative resist composition is a resin that cures with an acid generated by heat or light irradiation, or a base generated by heat or light irradiation, heat or light irradiation. If it is a photosensitive resin that crosslinks more and the coating film of the unexposed part in the resin can be removed by a developing solution, it is not particularly limited.
[0018] 樹脂(B)としては、例えば水酸基、又はカルボキシル基を有する樹脂等が挙げられ 例えばポリビュルアルコール、ポリアクリルアミド、ポリアクリル酸及びポリメタクリル酸 等のアクリル系樹脂、ポリアミド酸、ポリビュルフエノール並びにその誘導体及びその 共重合体、ポリメタタリレートとマレイン酸無水物との共重合体、フエノール樹脂、ノボ ラック樹脂、水酸基及び/又はカルボキシル基を含むポリイミド、セルロース、セル口 ース誘導体、スターチ、キチン、キトサン、ゼラチン、ゼイン、糖骨格高分子化合物、 ポリアミド、ポリエチレンテレフタレート、ポリカーボネート、ポリウレタン及びポリシロキ サンが挙げられる。これらの樹脂は、単独で、又は 2種類以上組み合わせて用いられ 特に好ましくは、樹脂(B)としては、ポリビュルフエノール及びその共重合体である[0018] Examples of the resin (B) include resins having a hydroxyl group or a carboxyl group, for example, acrylic resins such as polybulal alcohol, polyacrylamide, polyacrylic acid, and polymethacrylic acid, polyamic acid, and polybuhlphenol. Derivatives thereof and copolymers thereof, copolymers of polymetatalylate and maleic anhydride, phenol resins, novolak resins, polyimides containing hydroxyl groups and / or carboxyl groups, cellulose, cellulose derivatives, starches, Examples include chitin, chitosan, gelatin, zein, sugar skeleton polymer compound, polyamide, polyethylene terephthalate, polycarbonate, polyurethane, and polysiloxane. These resins are used singly or in combination of two or more. Particularly preferably, the resin (B) is polybutanol or a copolymer thereof.
Yes
[0019] 共重合モノマーとしてはアクリル系モノマーが挙げられる。  [0019] Examples of the copolymerizable monomer include acrylic monomers.
(メタ)アクリル酸エステルとしては、メチル (メタ)アタリレート、ェチル (メタ)アタリレート 、プロピル(メタ)アタリレート、ブチル(メタ)アタリレート、へキシル(メタ)アタリレート、 2 ェチルへキシル(メタ)アタリレート、シクロへキシル(メタ)アタリレート、ベンジル(メ タ)アタリレート、ジメチルァミノ(メタ)アタリレート、ヒドロキシェチル (メタ)アタリレート、 ヒドロキシプロピル (メタ)アタリレート、グリシジル (メタ)アタリレートが挙げられる。 エチレン性不飽和カルボン酸としては、アクリル酸、メタクリル酸、クロトン酸、マレイ ン酸、フマル酸、ィタコン酸、及びそれらの酸無水物やハーフエステルが用いられる 。これらのなかでは、アクリル酸、メタクリル酸、マレイン酸、ヒドロキシプロピル (メタ)ァ タリレートが好ましい。  (Meth) acrylic acid esters include methyl (meth) acrylate, ethyl (meth) acrylate, propyl (meth) acrylate, butyl (meth) acrylate, hexyl (meth) acrylate, 2-ethyl hexyl ( (Meth) Atarylate, Cyclohexyl (Meth) Atylate, Benzyl (Meth) Atarylate, Dimethylamino (Meth) Atarylate, Hydroxyethyl (Meth) Atarylate, Hydroxypropyl (Meth) Atarylate, Glycidyl (Meth) Atallate is mentioned. Examples of the ethylenically unsaturated carboxylic acid include acrylic acid, methacrylic acid, crotonic acid, maleic acid, fumaric acid, itaconic acid, and acid anhydrides and half esters thereof. Of these, acrylic acid, methacrylic acid, maleic acid, and hydroxypropyl (meth) acrylate are preferable.
ポリビュルフエノール、ポリビュルフエノールと上記アクリル系モノマーとの共重合体 は重量平均分子量で 1000ないし 10万であり、好ましくは、現像性、密着性の点から 、 2000ないし 3万である。これらは必要に応じて組み合わせることができ、ビュルフエ ノールと上記アクリル系モノマー 1種とを共重合して用いることや、ビュルフエノールと 上記アクリル系モノマー 2種類以上との組み合わせからなる共重合体を用いることが 可能である。なお、重量平均分子量は、ポリスチレン換算の相対値である。 Polybulfenol, a copolymer of polybuhlphenol and the above acrylic monomer has a weight average molecular weight of 1000 to 100,000, and preferably 2000 to 30,000 in terms of developability and adhesion. These can be combined as necessary, and can be used by copolymerizing buluenol with one of the above acrylic monomers, or using buluenol with A copolymer composed of a combination of two or more of the above acrylic monomers can be used. The weight average molecular weight is a relative value in terms of polystyrene.
共重合に用いる他の化合物としては、アクリル酸誘導体、アクリロニトリル、メタクリロ 二トリノレ、スチレン、 α—メチルスチレン、 ρ メチルスチレン、 ο メチルスチレン、 ρ —メトキシスチレン、 ρ クロロスチレン等のスチレン誘導体が挙げられる。これらのな かではスチレンが好まし!/、。  Examples of other compounds used for copolymerization include styrene derivatives such as acrylic acid derivatives, acrylonitrile, methacrylonitrinole, styrene, α-methylstyrene, ρ methylstyrene, ο methylstyrene, ρ-methoxystyrene, and ρ chlorostyrene. . Of these, styrene is preferred!
ポリビュルフエノール又はその共重合体、即ちポリヒドロキシスチレン又はポリヒドロ キシスチレン誘導体は重量平均分子量で 1000ないし 10万であり、好ましくは、現像 性、密着性の点から、 2000ないし 3万である。これらは必要に応じて組み合わせるこ とができ、単独で、又は 2種類以上の共重合体を組み合わせて用いることが出来る。 なお、重量平均分子量は、ポリスチレン換算の相対値である。  Polybutanol or a copolymer thereof, that is, polyhydroxystyrene or polyhydroxystyrene derivative has a weight average molecular weight of 1000 to 100,000, preferably 2000 to 30,000 from the viewpoint of developability and adhesion. These can be combined as necessary, and can be used alone or in combination of two or more kinds of copolymers. The weight average molecular weight is a relative value in terms of polystyrene.
ネガ型レジスト組成物にお!/、て、樹脂 (Β)を用いた際に使用する光酸発生剤 (Α)と しては、光照射により直接もしくは間接的に酸を発生するものである。  The photoacid generator (Α) used when using a resin (型) in a negative resist composition is one that generates acid directly or indirectly by light irradiation. .
[0020] ネガ型レジスト組成物において、樹脂(Β)に用いられる架橋性化合物(C)としては 、ヒドロキシル基、ヒドロキシアルキル基、(炭素原子数 1ないし 5)アルコキシ(炭素原 子数 1ないし 5)アルキル基からなる群より選ばれる少なくとも 1種の架橋形成基を有 する化合物を使用することができる。 [0020] In the negative resist composition, the crosslinkable compound (C) used for the resin (Β) includes a hydroxyl group, a hydroxyalkyl group, (a carbon number of 1 to 5) alkoxy (a carbon atom number of 1 to 5). ) A compound having at least one cross-linking group selected from the group consisting of alkyl groups can be used.
例えば、ヒドロキシル基又はアルコキシル基を有するァミノ樹脂、例えばメラミン樹脂 、尿素樹脂、グアナミン樹脂、グリコールゥリルーホルムアルデヒド樹脂、スクシニルァ ミドーホルムアルデヒド樹脂、エチレン尿素 ホルムアルデヒド樹脂などが挙げられる  For example, an amino resin having a hydroxyl group or an alkoxyl group, such as melamine resin, urea resin, guanamine resin, glycoluril formaldehyde resin, succinylamide formaldehyde resin, ethylene urea formaldehyde resin, etc.
[0021] この架橋性化合物(C)は例えば、ァミノ基の水素原子力 Sメチロール基又はアルコキ シメチル基又はその両方で置換されたメラミン誘導体、ベンゾグアナミン誘導体又は グリコールゥリルを用いることができる。このメラミン誘導体及びべンゾグアナミン誘導 体は二量体又は三量体として存在することも可能である。これらはトリアジン環 1個当 たり、メチロール基又はアルコキシメチル基を平均 3個以上 6個以下有するものが好 ましい。 [0021] As the crosslinkable compound (C), for example, a melamine derivative, a benzoguanamine derivative or glycoluril substituted with a hydrogen nuclear S-methylol group or an alkoxymethyl group of an amino group or both can be used. The melamine derivative and benzoguanamine derivative can exist as a dimer or a trimer. These preferably have an average of 3 to 6 methylol groups or alkoxymethyl groups per triazine ring.
[0022] このようなメラミン誘導体又はべンゾグアナミン誘導体の例としては、市販品のトリア ジン環 1個当たりメトキシメチル基が平均 3· 7個置換されている MX— 750、トリアジン 環 1個当たりメトキシメチル基が平均 5. 8個置換されている MW— 30 (以上、(株)三 禾ロケミカノレ製)や、サイメノレ 300、 301、 303、 350、 370、 771、 325、 327、 703、 71 2などのメトキシメチノレイ匕メラミン、サイメノレ 235、 236、 238、 212、 253、 254などのメ [0022] Examples of such melamine derivatives or benzoguanamine derivatives include commercially available tria. MX—750 substituted with an average of 3 · 7 methoxymethyl groups per gin ring, MW—30 substituted with an average of 5.8 methoxymethyl groups per triazine ring (Made by Rochemica Canore), Saimenole 300, 301, 303, 350, 370, 771, 325, 327, 703, 712, etc., such as methoxymethinorei melamine, Saimenole 235, 236, 238, 212, 253, 254 etc. Me
化メラミン、サイメル 1 123のようなメトキシメチル化工トキシメチル化べンゾグアナミン、 サイメル 1123— 10のようなメトキシメチル化ブトキシメチル化べンゾグアナミン、サイ メノレ 128のようなプ、トキシメチノレイ匕べンゾグアナミン、サイメノレ 1125— 80のような力 ルポキシル基含有メトキシメチル化工トキシメチル化べンゾグアナミン(以上、 日本サ ィテックインダストリーズ (株)製)が挙げられる。また、グリコールゥリルの例として、サ 一ル化グリコールゥリル等、パウダーリンク 1174のようなメトキシメチロール化グリコー ルゥリル (以上、 日本サイテックインダストリーズ (株)製)等が挙げられる。 Toximethylated Benzoguanamine, such as melamine, Cymel 1 123, Toximethylated Benzoguanamine, like Cymel 1123-10, Toximethylinole Benzoguanamine, Saimenole 1125—80 A methoxymethylated oxymethylated benzoguanamine (above, manufactured by Nippon Cite Industries Co., Ltd.) is included. Examples of glycoluril include salylated glycoluril and the like, and methoxymethylolated glycoluril such as Powderlink 1174 (hereinafter, Nippon Cytec Industries, Ltd.).
また、ヒドロキシル基又はアルコキシル基を有するベンゼン又はフエノール性化合 物、例えば 1 , 3, 5—トリス(メトキシメチル)ベンゼン、 1 , 2, 4—トリス(イソプロポキシ メチノレ)ベンゼン、 1 , 4 ビス(sec ブトキシメチノレ)ベンゼン、 2, 6 ジヒドロキシメ チルー p tert ブチルフエノール等が挙げられる。  Also, benzene or phenolic compounds having a hydroxyl group or an alkoxyl group, such as 1,3,5-tris (methoxymethyl) benzene, 1,2,4-tris (isopropoxymethinole) benzene, 1,4 bis (sec Butoxymethylol) benzene, 2,6 dihydroxymethyl-p tert butylphenol.
また、エポキシ基、イソシァネート基を含み、架橋形成基を有する化合物も使用でき る。具体例としては、例えばビスフエノールアセトングリシジルエーテル、フエノールノ ポラックエポキシ樹脂、クレゾールノポラックエポキシ樹脂、トリグリシジルイソシァヌレ ート、テトラグリシジルアミノジフエ二レン、テトラグリシジルー m キシレンジァミン、テ トラグリシジルー 1 , 3—ビス(アミノエチル)シクロへキサン、テトラフエニルダリシジル エーテノレエタン、トリフエニノレグリシジノレエーテノレエタン、ビスフエノーノレへキサフノレオ ロアセトジグリシジノレエーテノレ、 1 , 3 ビス(1— (2, 3 エポキシプロポキシ) 1ート リフルォロメチルー 2, 2, 2 トリフルォロメチノレ)ベンゼン、 4, 4 ビス(2, 3 ェポキ シプロボキシ)ォクタフルォロビフエニル、トリグリシジノレ p ァミノフエノーノレ、テトラ グリシジルメタキシレンジァミン、 2—(4一(2, 3 エポキシプロポキシ)フエニル) - 2 一(4一(1 , 1 ビス(4一(2, 3 エポキシプロポキシ)フエニル)ェチル)フエニル)プ 口パン、 1 , 3 ビス(4— (1— (4— (2, 3 エポキシプロポキシ)フエニル)ー1 (4 (1 - (4 - (2, 3—エポキシプロポキシフエニル) 1ーメチルェチル)フエニル)ェ チル)フエノキシ) 2—プロパノール等が挙げられる。 In addition, a compound containing an epoxy group or an isocyanate group and having a crosslinking group can also be used. Specific examples include, for example, bisphenolacetone glycidyl ether, phenol nopolac epoxy resin, cresol nopolac epoxy resin, triglycidyl isocyanurate, tetraglycidylaminodiphenylene, tetraglycidyl m-xylenediamine, tetraglycidyl 1,3 —Bis (aminoethyl) cyclohexane, tetraphenyldaricidyl etherenoethane, triphenenoreglicidinoreethenoethane, bisphenolenohexanoleoroacetodiglycidinoreethenole, 1,3bis (1— (2,3 epoxy Propoxy) 1-trifluoromethyl-2,2,2 trifluoromethyleno) benzene, 4,4 bis (2,3 epoxycyclopropoxy) octafluorobiphenyl, triglycidinole paminophenol, tetraglycidyl Taki Shi range § Min, 2- (4 one (2, 3-epoxypropoxy) phenyl) - 2 1 (4 1 (1, 1 bis (4 1 (2, 3 epoxypropoxy) phenyl) phenyl) phenyl) 1, 3 bis (4— (1— (4— (2, 3 epoxypropoxy) phenyl) ) -1 (4 (1- (4- (2,3-epoxypropoxyphenyl) 1-methylethyl) phenyl) ethyl) phenoxy) 2-propanol and the like.
[0024] これらの架橋性化合物(C)は単独で用いることも、 2種類以上組み合わせて用いる こともできる。また、その導入量は樹脂(B)成分 100質量部に対して 1ないし 300質量 部、好ましくは 20ないし 200質量部の範囲で選ばれる。この量が 1質量部未満の場 合では、架橋反応が十分に進行せず、所望のレジストパターンが得られにくぐまた 3 00質量部を超えた場合では、レジスト組成物の保存安定性に劣る。そのため、架橋 剤の導入量は樹脂成分 100質量部に対して 1ないし 300質量部であることが好まし い。 [0024] These crosslinkable compounds (C) can be used singly or in combination of two or more. The amount introduced is selected in the range of 1 to 300 parts by weight, preferably 20 to 200 parts by weight, per 100 parts by weight of the resin (B) component. When this amount is less than 1 part by mass, the crosslinking reaction does not proceed sufficiently, and it is difficult to obtain a desired resist pattern. When it exceeds 300 parts by mass, the storage stability of the resist composition is poor. . Therefore, the amount of the crosslinking agent introduced is preferably 1 to 300 parts by mass with respect to 100 parts by mass of the resin component.
[0025] 本発明に用いられる染料 (D)は、カラーフィルターを作製した際に望ましい分光ス ベクトルを有し、かつ溶媒にそのまま溶解する力、、あるいは染料を編成した形で溶解 するあのを用いること力でさる。  [0025] The dye (D) used in the present invention has a spectral spectrum that is desirable when a color filter is produced, and uses the ability to dissolve in a solvent as it is, or the dye that dissolves in an organized form. I'll do it with power.
[0026] 本発明に用いられる染料 (D)は、前記式 [2]で表される陽イオン化合物を含有する ものであることが好ましい。 [0026] The dye (D) used in the present invention preferably contains a cationic compound represented by the formula [2].
前記式 [2]において、 R9及び R1Qは、少なくとも一方が含窒素有機基を有するもの であること力 S好ましく、特に R9及び R1Qの両方が含窒素有機基を有するものであること が好ましい。 In the formula [2], at least one of R 9 and R 1Q has a nitrogen-containing organic group. S is preferable. Particularly, both R 9 and R 1Q have a nitrogen-containing organic group. Is preferred.
この R9及び R1Qの含窒素有機基は、少なくとも一方がィミノ構造(一 NH— R13)を有 するものが好ましぐ特に R9及び R1Qの両方がィミノ構造(一 NH— R13)を有しているこ とが好ましい。 It is preferable that at least one of the nitrogen-containing organic groups of R 9 and R 1Q has an imino structure (one NH—R 13 ). Particularly, both R 9 and R 1Q have an imino structure (one NH—R 13 ) Is preferable.
ここで、 R13は、有機基を表し、メチル基、ェチル基、プロピル基等のアルキル基、又 は置換若しくは未置換の芳香族基であることが好ましぐ特に置換若しくは未置換の 芳香族基であることが好ましい。ここで、芳香族基としては、フエニル基、ナフチル基 、アントリル基等であることが好ましぐこれら芳香族基の置換基としては、メチル基、 ェチル基、プロピル基等のアルキル基、ハロゲン原子等が好ましい。 Here, R 13 represents an organic group, and is preferably an alkyl group such as a methyl group, an ethyl group, or a propyl group, or a substituted or unsubstituted aromatic group, particularly a substituted or unsubstituted aromatic group. It is preferably a group. Here, the aromatic group is preferably a phenyl group, a naphthyl group, an anthryl group, or the like. The substituent of these aromatic groups is an alkyl group such as a methyl group, an ethyl group, or a propyl group, or a halogen atom. Etc. are preferred.
具体的には、 R13は、フエニル基、 o トリル基、 m—トリル基又は p—トリル基であるこ とが好ましい。 Specifically, R 13 is a phenyl group, o tolyl group, m-tolyl group or p-tolyl group. Are preferred.
[0027] Ru及び R12は、少なくとも一方が水素原子であることが好ましぐ一方が水素原子の とき、他方はメチル基、ェチル基、プロピル基等のアルキル基、又は置換若しくは未 置換の芳香族基であることが好ましい。ここで、芳香族基としては、フエニル基、ナフ チル基、アントリル基等であることが好ましぐこれら芳香族基の置換基としては、メチ ル基、ェチル基、プロピル基等のアルキル基、ハロゲン原子等が好ましい。 [0027] R u and R 12, at least one of time of preferably fitting one is a hydrogen atom a hydrogen atom and the other is a methyl group, Echiru group, alkyl groups such as propyl group, or a substituted or unsubstituted An aromatic group is preferred. Here, the aromatic group is preferably a phenyl group, a naphthyl group, an anthryl group or the like, and the substituent of these aromatic groups is an alkyl group such as a methyl group, an ethyl group or a propyl group, A halogen atom or the like is preferable.
特に R11及び R12の両方が水素原子である場合、又は、 Ru及び R12の一方が水素原 子で他方が上記芳香族基である場合が好まし!/、。 Particularly when both of R 11 and R 12 are hydrogen atoms, or, preferably may other while hydrogen atom of R u and R 12 is the aromatic group! /,.
[0028] 前記陽イオン化合物の具体例としては、例えば、下記式で示される化合物が挙げら れる。  [0028] Specific examples of the cationic compound include compounds represented by the following formula.
[化 6] [Chemical 6]
Figure imgf000020_0001
[11]
Figure imgf000020_0001
[11]
Figure imgf000021_0001
Figure imgf000022_0001
Figure imgf000021_0001
Figure imgf000022_0001
(式中、 R14及び R15は、それぞれ独立して、水素原子又はメチル基を表す。)である場 合が好ましい。 (Wherein R 14 and R 15 each independently represents a hydrogen atom or a methyl group).
また前記陽イオン化合物は、共鳴構造を有する場合があり、式 [17]の化合物を例 に挙げて示すと、式 [18]  In addition, the cationic compound may have a resonance structure. When the compound of the formula [17] is taken as an example, the formula [18]
[化 9]  [Chemical 9]
Figure imgf000022_0002
Figure imgf000022_0002
(式中、 R14及び R15は、それぞれ独立して、水素原子又はメチル基を示す。)の構造 を示す陽イオン化合物も存在する。この陽イオン化合物も、染料 (D)に含有される陽 イオン化合物として用いることができる。 There is also a cationic compound having the structure (wherein R 14 and R 15 each independently represents a hydrogen atom or a methyl group). This cationic compound can also be used as the cationic compound contained in the dye (D).
[0031] 本発明に用いられる染料 (D)は、陽イオン化合物と陰イオン化合物とからなる有機 塩であることが好ましい。 [0031] The dye (D) used in the present invention is preferably an organic salt composed of a cationic compound and an anionic compound.
前記式 [2]で表される陽イオン化合物の対イオンとなる陰イオン化合物としては、フ タロシアニン構造を有する化合物、ピラゾールァゾ構造を有する化合物、ピラゾーノレ ァゾ構造と金属錯体構造とを有する化合物、キサンテン構造を有する化合物等が挙 げられる。  Examples of the anionic compound as a counter ion of the cationic compound represented by the formula [2] include a compound having a phthalocyanine structure, a compound having a pyrazole azo structure, a compound having a pyrazono laser structure and a metal complex structure, xanthene Examples include compounds having a structure.
[0032] フタロシアニン構造を有する化合物とは、 1分子中にフタロシアニン構造を少なくと も 1個有する化合物である。フタロシアニンは、金属含有でも金属非含有でも用いるこ と力 Sでき、中心金属としては Cu、 Zn、 Al、 Ni、 Co等が挙げられる。  [0032] The compound having a phthalocyanine structure is a compound having at least one phthalocyanine structure in one molecule. Phthalocyanine can be used with or without metal, and examples of central metals include Cu, Zn, Al, Ni, and Co.
フタロシアニン構造を有する化合物においては、陰イオン成分としてスルホン酸基( -so―)及び/又はカルボン酸基(一 coo—)を有することが好ましい。これらは、どIn a compound having a phthalocyanine structure, a sulfonic acid group ( -so-) and / or carboxylic acid groups (one coo-). These are
3 Three
ちらか一方、又は両者を組み合わせて、フタロシアニンの 1分子中に 1ないし 4個の割 合で含有することができる。 One or a combination of both can be contained in one molecule of phthalocyanine at a ratio of 1 to 4.
また、この陰イオン成分以外に、スルホン酸エステル基(一 SO R16、式中、 R16は炭 素原子数 1ないし 20の脂肪族、芳香族の炭化水素基、エーテル基、エステル基を表 す。)、スルホン酸ァミノエステル基(一 SO NHR17、式中、 R17は炭素原子数 1ないし 20の脂肪族、芳香族の炭化水素基、エーテル基、エステル基を表す。)、水酸基、二 トロ基、アミノ基、クロルやブロム等の塩素原子、メチル基やェチル基等のアルキル基 を有することができ、これらの非イオン性基は、いずれかひとつ、又はこれらを組み合 わせて、フタロシアニンの分子中に 1ないし 4個の割合で含有することができる。この 非イオン性基は、スルホン酸ァミノエステル基が特に好まし!/、。 In addition to this anionic component, a sulfonic acid ester group (one SO R 16 , where R 16 represents an aliphatic or aromatic hydrocarbon group having 1 to 20 carbon atoms, an ether group or an ester group). ), Sulfonic acid amino ester group (one SO NHR 17 , wherein R 17 represents an aliphatic, aromatic hydrocarbon group, ether group or ester group having 1 to 20 carbon atoms), hydroxyl group, It can have a tro group, an amino group, a chlorine atom such as chloro and bromo, and an alkyl group such as a methyl group and an ethyl group, and these nonionic groups can be any one or a combination thereof to form a phthalocyanine. 1 to 4 can be contained in each molecule. The nonionic group is particularly preferably a sulfonic acid amino ester group!
陰イオン化合物としてスルホン酸基含有フタロシアニンと、式 [5]ないし式 [10]で示 される陽イオン化合物との組み合わせからなる本発明に用いられる染料 (D)として、 式 [19]ないし式 [21]のものを例示することができる。  As a dye (D) used in the present invention comprising a combination of a sulfonic acid group-containing phthalocyanine as an anionic compound and a cationic compound represented by the formulas [5] to [10] 21] can be exemplified.
[化 10] [Chemical 10]
Figure imgf000024_0001
ピラゾールァゾ構造を有する化合物とは、 1分子中にピラゾール部分とァゾ部分の それぞれ少なくとも 1個を有する化合物である。
Figure imgf000024_0001
The compound having a pyrazole azo structure is a compound having at least one of a pyrazole part and a azo part in one molecule.
ピラゾール部分とァゾ部分が直接結合することも、他の有機基を挟んで存在するこ とも可能である。例として、ピラゾール部分とァゾ部分を挟んで、フエニル基等の芳香 族基や脂肪族基が存在し、それら芳香族基や脂肪族基にスルホン酸基やその他の 置換基を有する化合物が挙げられる。 The direct bond between the pyrazole moiety and the azo moiety can also exist with other organic groups in between. Both are possible. Examples include compounds in which an aromatic group or aliphatic group such as a phenyl group exists between the pyrazole part and the azo part, and the aromatic group or aliphatic group has a sulfonic acid group or other substituent. It is done.
ピラゾールァゾ構造を有する化合物にお!/、ては、陰イオン成分としてスルホン酸基( -so―)及び/又はカルボン酸基(一 COO—)を有することが好ましい。これらは、ど The compound having a pyrazole azo structure preferably has a sulfonic acid group (-so-) and / or a carboxylic acid group (one COO-) as an anion component. These are
3 Three
ちらか一方、又は両者を組み合わせて、ピラゾールァゾ構造を有する化合物の 1分 子中に 1ないし 4個の割合で含有することができる。陰イオン性基としてはスルホン酸 基を好ましく用いることができる。 Either one or a combination of both may be contained in a ratio of 1 to 4 in one molecule of the compound having a pyrazole azo structure. As the anionic group, a sulfonic acid group can be preferably used.
また、この陰イオン性基以外に、スルホン酸ァミノエステル基(一 SO NHR18、式中 、 R18は炭素原子数 1ないし 20の脂肪族、芳香族の炭化水素基、エーテル基、エステ ル基を表す。)、水酸基、ニトロ基、アミノ基、クロルやブロム等の塩素原子、メチル基 やェチル基等のアルキル基を有することができ、これらの非イオン性基は、いずれか ひとつ、又はこれらを組み合わせて、ピラゾールァゾ構造を有する化合物の 1分子中 に 1ないし 4個の割合で含有することができる。 In addition to this anionic group, a sulfonic acid amino ester group (one SO NHR 18 , wherein R 18 is an aliphatic, aromatic hydrocarbon group, ether group or ester group having 1 to 20 carbon atoms). ), A hydroxyl group, a nitro group, an amino group, a chlorine atom such as chloro and bromo, an alkyl group such as a methyl group and an ethyl group, and these nonionic groups are either one or these In combination, it can be contained in a ratio of 1 to 4 per molecule of the compound having a pyrazole azo structure.
陰イオン化合物としてスルホン酸基含有ピラゾールァゾ構造を有する化合物と、式 [ 5]ないし式 [18]で表される陽イオン化合物との組み合わせからなる本発明に用いら れる染料 (D)として、式 [22]ないし式 [24]のものを例示することができる。  As a dye (D) used in the present invention comprising a combination of a compound having a sulfonic acid group-containing pyrazole azo structure as an anionic compound and a cationic compound represented by the formulas [5] to [18], 22] to [24] can be exemplified.
[化 11] [Chemical 11]
Figure imgf000026_0001
ピラゾールァゾ構造と金属錯体構造とを有する化合物とは、陰イオン性基含有ビラ ゾールァゾ構造を有する化合物が金属と錯体を形成するものである。
Figure imgf000026_0001
The compound having a pyrazole azo structure and a metal complex structure is a compound in which a compound having an anionic group-containing virazo azo structure forms a complex with a metal.
陰イオン性基含有ピラゾールァゾ構造を有する化合物と金属とは、 2ないし 4 : 1 (モ ル比)の割合で錯体を形成する力 S、好ましい割合は 2 : 1 (モル比)である。中心に存 在する金属は、 Cu、 Zn、 Al、 Ni、 Co等が挙げられる力 Coが好ましい。  The compound having an anionic group-containing pyrazole azo structure and the metal have a force S of forming a complex at a ratio of 2 to 4: 1 (molar ratio), and a preferable ratio is 2: 1 (molar ratio). The metal existing in the center is preferably a force Co such as Cu, Zn, Al, Ni, Co and the like.
ピラゾールァゾ構造と金属錯体構造とを有する化合物においては、陰イオン成分と してスルホン酸基( SO )及び/又はカルボン酸基( COO— )を有することが好ま しい。これらは、どちらか一方、又は両者を組み合わせて、ピラゾールァゾ構造を有 する化合物の 1分子中に 1ないし 4個の割合で含有することができる。陰イオン性基と してはスルホン酸基を好ましく用いることができる。  A compound having a pyrazole azo structure and a metal complex structure preferably has a sulfonic acid group (SO) and / or a carboxylic acid group (COO-) as an anion component. These can be contained in a ratio of 1 to 4 in one molecule of a compound having a pyrazole azo structure, either one or a combination of both. A sulfonic acid group can be preferably used as the anionic group.
また、この陰イオン性基以外に、スルホン酸ァミノエステル基(一 SO NHR19、式中 、 R19は炭素原子数 1ないし 20の脂肪族、芳香族の炭化水素基、エーテル基、エステ ル基を表す。)、水酸基、ニトロ基、アミノ基、クロルやブロム等の塩素原子、メチル基 やェチル基等のアルキル基を有することができ、これらの非イオン性基は、いずれか ひとつ、又はこれらを組み合わせて、ピラゾールァゾ構造を有する化合物の 1分子中 に 1ないし 4個の割合で含有することができる。この非イオン性基は、ニトロ基と水酸 基とメチル基、ェチル基等のアルキル基を好ましく用いることができる。 陰イオン化合物として金属錯体構造とスルホン酸基含有ピラゾールァゾ構造とを有 する化合物と、式 [5]ないし式 [18]で表される陽イオン化合物との組み合わせからな る本発明に用いられる染料 (D)として、式 [25]な!/、し式 [30]のものを例示すること力 できる。 In addition to this anionic group, a sulfonic acid amino ester group (one SO NHR 19 , where R 19 is an aliphatic, aromatic hydrocarbon group, ether group or ester group having 1 to 20 carbon atoms). ), A hydroxyl group, a nitro group, an amino group, a chlorine atom such as chloro and bromo, an alkyl group such as a methyl group and an ethyl group, and these nonionic groups are either one or these In combination, it can be contained in a ratio of 1 to 4 per molecule of the compound having a pyrazole azo structure. As the nonionic group, an alkyl group such as a nitro group, a hydroxyl group, a methyl group, and an ethyl group can be preferably used. A dye used in the present invention comprising a combination of a compound having a metal complex structure and a sulfonic acid group-containing pyrazole azo structure as an anionic compound and a cationic compound represented by the formula [5] to formula [18] ( As D), it is possible to exemplify the one of the formula [25]! And the formula [30].
[化 12][Chemical 12]
Figure imgf000027_0001
Figure imgf000027_0001
[化 13]
Figure imgf000028_0001
[Chemical 13]
Figure imgf000028_0001
[0038] また、この陰イオン性基以外に、スルホン酸ァミノエステル基(一SO NHR2°、式中 [0038] In addition to this anionic group, a sulfonic acid amino ester group (one SO NHR 2 °, in the formula
2  2
、 R2°は炭素原子数 1ないし 20の脂肪族、芳香族の炭化水素基、エーテル基、エステ ル基を表す。)、水酸基、ニトロ基、アミノ基、クロルやブロム等の塩素原子、メチル基 やェチル基等のアルキル基を有することができ、これらの非イオン性基は、いずれか ひとつ、又はこれらを組み合わせて、ピラゾールァゾ構造を有する化合物の 1分子中 に 1ないし 4個の割合で含有することができる。 R 2 ° represents an aliphatic or aromatic hydrocarbon group, ether group or ester group having 1 to 20 carbon atoms. ), A hydroxyl group, a nitro group, an amino group, a chlorine atom such as chloro and bromo, and an alkyl group such as a methyl group and an ethyl group. These nonionic groups may be any one or a combination thereof. The compound having a pyrazole azo structure can be contained in a ratio of 1 to 4 in one molecule.
[0039] キサンテン構造を有する化合物とは、 1分子中にキサンテン構造を少なくとも 1個有 する化合物である。 [0039] A compound having a xanthene structure has at least one xanthene structure in one molecule. It is a compound.
キサンテン構造を有する化合物においては、陰イオン成分としてスルホン酸基(一 S O―)及び/又はカルボン酸基(一 COO—)を有することが好ましい。これらは、どちら か一方、又は両者を組み合わせて、ピラゾールァゾ構造を有する化合物の 1分子中 に 1ないし 3個の割合で含有することができる。陰イオン性基としては、カルボン酸基 を好ましく用いることができる。  The compound having a xanthene structure preferably has a sulfonic acid group (one S O—) and / or a carboxylic acid group (one COO—) as an anion component. These can be contained in a ratio of 1 to 3 in one molecule of a compound having a pyrazole azo structure, either or a combination of both. As the anionic group, a carboxylic acid group can be preferably used.
また、この陰イオン性基以外に、スルホン酸ァミノエステル基(一SO NHR21、式中 、 R21は炭素原子数 1ないし 20の脂肪族、芳香族の炭化水素基、エーテル基、エステ ル基を表す。)、水酸基、ニトロ基、アミノ基、クロルやブロム等の塩素原子、メチル基 やェチル基等のアルキル基を有することができ、これらの非イオン性基は、いずれか ひとつ、又はこれらを組み合わせて、キサンテン構造を有する化合物の 1分子中に 1 なレ、し 3個の割合で含有することができる。 In addition to this anionic group, a sulfonic acid amino ester group (one SO NHR 21 , wherein R 21 is an aliphatic, aromatic hydrocarbon group, ether group or ester group having 1 to 20 carbon atoms). ), A hydroxyl group, a nitro group, an amino group, a chlorine atom such as chloro and bromo, an alkyl group such as a methyl group and an ethyl group, and these nonionic groups are either one or these In combination, it can be contained in a ratio of 1 to 3 per molecule of the compound having a xanthene structure.
陰イオン化合物としてキサンテン構造を有する化合物と式 [5]ないし式 [18]で示さ れる陽イオン化合物との組み合わせからなる本発明に用いられる染料 (D)として、式 [31]ないし式 [35]のものを例示することができる。  The dye (D) used in the present invention comprising a combination of a compound having a xanthene structure as an anionic compound and a cationic compound represented by the formulas [5] to [18] is represented by the formula [31] to the formula [35]. Can be illustrated.
[化 14] [Chemical 14]
Figure imgf000030_0001
本発明に用いられる染料 (D)は、市販品を使用することができる。また、これら染料 は公知な方法で容易に合成することができる。例えば、前記式 [5]ないし [18]の構 造に対応するァミンと、スルホン酸基又はカルボン酸基を有する染料分子(母体)を 反応させる方法により得られる。即ち、スルホン酸基又はカルボン酸基を有するフタ口 シァニン構造を有する化合物、ピラゾールァゾ構造を有する化合物、金属錯体構造 とピラゾールァゾ構造とを有する化合物、又はキサンテン構造を有する化合物の水溶 液を、所望のモル比の塩形成に必要なァミンと反応させ、水に難溶の塩を沈殿させ ることにより合成できる。染料の塩が水に可溶性のときは塩析を行うことにより塩が得 られる。
Figure imgf000030_0001
A commercial item can be used for the dye (D) used for this invention. These dyes can be easily synthesized by known methods. For example, it can be obtained by a method of reacting an amine corresponding to the structure of the above formulas [5] to [18] with a dye molecule (matrix) having a sulfonic acid group or a carboxylic acid group. That is, a compound having a phthalocyanine structure having a sulfonic acid group or a carboxylic acid group, a compound having a pyrazole azo structure, a compound having a metal complex structure and a pyrazole azo structure, or a compound having a xanthene structure. The solution can be synthesized by reacting with the amine required for salt formation in the desired molar ratio to precipitate a sparingly soluble salt in water. When the dye salt is soluble in water, the salt is obtained by salting out.
より具体的には、スルホン酸ナトリウム、又はカルボン酸ナトリウムを有する上記染料 の水溶液に、前記式 [5]ないし [18]の構造に対応するァミンの塩酸塩の水溶液を加 えて反応させ、前記式 [5]ないし式 [18]の陽イオン化合物を有する染料を製造する こと力 Sでさる。  More specifically, an aqueous solution of an amine hydrochloride corresponding to the structure of the above formulas [5] to [18] is added to an aqueous solution of the above dye having sodium sulfonate or sodium carboxylate, and reacted. [5] to produce a dye having a cationic compound of formula [18].
本発明に用いられる染料 (D)には、更に任意の染料を混合して用いることも可能で ある。これらの染料としては、酸性染料、油溶性染料、分散染料、反応性染料、直接 染料等が挙げられる。例えば、ァゾ系染料、ベンゾキノン系染料、ナフトキノン染料、 アントラキノン系染料、シァニン系染料、スクァリリウム系染料、クロコニゥム系染料、メ ロシアニン計染料、スチルベン系染料、ジフエニルメタン系染料、トリフエニルメタン系 染料、フルオラン系染料、スピロピラン系染料、フタロシアニン系染料、インジゴ計染 料、フルギド系染料、ニッケル錯体系染料及びァズレン系染料が挙げられる。具体的 には、カラーインデックス番号で以下のものが挙げられる。 C. I. Solvent Yellow The dye (D) used in the present invention can be further used in combination with an arbitrary dye. Examples of these dyes include acid dyes, oil-soluble dyes, disperse dyes, reactive dyes, and direct dyes. For example, azo dyes, benzoquinone dyes, naphthoquinone dyes, anthraquinone dyes, cyanine dyes, squarylium dyes, croconium dyes, merocyanine dyes, stilbene dyes, diphenylmethane dyes, triphenylmethane dyes, fluoranes Dyes, spiropyran dyes, phthalocyanine dyes, indigo dyes, fulgide dyes, nickel complex dyes and azulene dyes. Specific examples of color index numbers include the following. C. I. Solvent Yellow
2 3 7 12 13 14 16 18 19 21 25 25 : 1 27 28 29 30 33 34 36 42 43 44 47 56 62 72 73 77 79 81 82 83 83 : 1 88 89 90 92 3 7 12 13 14 16 18 19 21 25 25: 1 27 28 29 30 33 34 36 42 43 44 47 56 62 72 73 77 79 81 82 83 83: 1 88 89 90 9
3 94 96 98 104 107 114 116 117 124 130 131 133 135 141 143 145 146 157 160 : 1 162 163 167 169 172 174 175 1 76 179 180 181 182 183 184 185 186 187 189 190 191 C. I. Solvent Orange 1 2 3 4 5 7 11 14 20 23 25 31 40 : 1 41 45 54 56 58 60 62 63 70 75 77 80 81 86 99 102 103 105 106 107 108 109 1 10 111 112 1 13 C. I. Solvent Red 1 2 3 4 8 16 17 18 19 23 24 25 26 27 30 33 35 41 43 45 48 49 52 68 69 72 73 83 : 1 84 : 1 89 90 90 : 1 91 92 106 109 110 118 11 9 122 124 125 127 130 132 135 141 143 145 146 149 150 1 51 155 160 161 164 164 : 1 165 166 168 169 172 175 179 18 0 181 182 195 196 197 198 207 208 210 212 214 215 218 2 22 223 225 227 229 230 233 234 235 236 238 239 240 241 242 243 244 245 247 248 C. I. Solvent Violet 2 8 9 11 13 14 21 21 : 1 26 31 36 37 38 45 46 47 48 4m9 50 51 55 56 57 58 59 60 61 C. I. Solvent Blue 2 3 4 5 7 18 25 26 35 36 3 7 38 43 44 45 48 51 58 59 59 : 1 63 64 67 68 69 70 78 79 83 94 97 98 100 102 104 105 111 112 122 124 128 129 132 136 137 138 139 143 C. I. Solvent Green 1 3 4 5 7 28 29 32 33 34 35 C. I. Solvent Brown 1 3 4 5 12 20 22 28 38 41 42 43 44 52 53 59 60 61 62 63 C. I. Solvent Black 3 5 5 : 2 7 13 22 22 : 1 26 27 28 29 34 35 43 45 46 48 49 50 C. I. Acid Red 6 11 26 60 88 111 186 215 C. I. Acid Green 25 27 C. I. Acid Blue 22 25 40 78 92 113 129 167 230 C. I. Acid Yel low 17 23 25 36 38 42 44 72 78 C. I. Basic Red 1 2 13 14 2 2 27 29 39 C. I. Basic Green 3 4 C. I. Basic Blue 3 9 41 66 C . I. Basic Violet 1 3 18 39 66 C. I. Basic Yellow 11 23 25 28 4 1 C. I. Direct Red 4 23 31 75 76 79 80 81 83 84 149 224 C. I. Direct Green 26 28 C. I. Direct Blue 71 78 98 106 108 192 2 01 C. I. Direct Violet 51 C. I. Direct Yellow 26 27 28 33 44 50 86 142 C. I. Direct Orange 26 29 34 37 72 C. I. Sulphur Red 5 6 7 C. I. Sulphur Green 2 3 6 C. I. Sulphur Blue 2 3 7 9 13 15 C. I. Sulphur Violet 2 3 4 C. I. Sulphur Yellow 4 C. I. Vat Re d 13 21 23 28 29 48 C. I. Vat Green 3 5 8 C. I. Vat Blue 6 1 4 26 30 C. I. Vat Violet 1 3 9 13 15 16 C. I. Vat Yellow 2 12 20 33 C. I. Vat Orange 2 5 11 15 18 20 C. I. Azoic Coupling Component 2 3 4 5 7 8 9 10 11 13 32 37 41 48 C. I. Reactiv e Red 8 22 46 120 C. I. Reactive Blue 1 2 7 19 C. I. Reactive Violet 2 4 C. I. Reactive Yellow 1 2 4 14 16 C. I. Reactive Oran ge 1 4 7 13 16 20 C. I. Disperse Red 4 11 54 55 58 65 73 1 27、 129、 141、 196、 210、 229、 354、 356、 C. I. Disperse Blue 3、 24、 79、 82、 87、 106、 125、 165、 183、 C. I. Disperse Violet 1、 6、 12、 26、 27、 28、 C. I. Disperse Yellow 3、 4、 5、 7、 23、 33、 42、 60、 64、 C. I. Disperse Ora nge 13、 29、 30。 3 94 96 98 104 107 114 116 117 124 130 131 133 135 141 143 145 146 157 160: 1 162 163 167 169 172 174 175 1 76 179 180 181 182 183 184 185 186 187 189 190 191 CI Solvent Orange 1 2 3 4 5 7 11 14 20 23 25 31 40: 1 41 45 54 56 58 60 62 63 70 75 77 80 81 86 99 102 103 105 106 107 108 109 1 10 111 112 1 13 CI Solvent Red 1 2 3 4 8 16 17 18 19 23 24 25 26 27 30 33 35 41 43 45 48 49 52 68 69 72 73 83: 1 84: 1 89 90 90: 1 91 92 106 109 110 118 11 9 122 124 125 127 130 132 135 141 143 145 146 149 150 1 51 155 160 161 164 164: 1 165 166 168 169 172 175 179 18 0 181 182 195 196 197 198 207 208 210 212 214 215 218 2 22 223 225 227 229 230 233 234 235 236 238 239 240 241 242 243 244 245 247 248 CI Solvent Violet 2 8 9 11 13 14 21 21: 1 26 31 36 37 38 45 46 47 48 4m9 50 51 55 56 57 58 59 60 61 CI Solvent Blue 2 3 4 5 7 18 25 26 35 36 3 7 38 43 44 45 48 51 58 59 59: 1 63 64 67 68 69 70 78 79 83 94 97 98 100 102 104 105 111 112 122 124 128 129 132 136 137 138 139 143 CI Solvent Green 1 3 4 5 7 28 29 32 33 34 35 CI Solvent Brown 1 3 4 5 12 20 22 28 38 41 42 43 44 52 53 59 60 61 62 63 CI Solvent Black 3 5 5: 2 7 13 22 22: 1 26 27 28 29 34 35 43 45 46 48 49 50 CI Acid Red 6 11 26 60 88 111 186 215 CI Acid Green 25 27 CI Acid Blue 22 25 40 78 92 113 129 167 230 CI Acid Yel low 17 23 25 36 38 42 44 72 78 CI Basic Red 1 2 13 14 2 2 27 29 39 CI Basic Green 3 4 CI Basic Blue 3 9 41 66 C. I. Basic Violet 1 3 18 39 66 CI Basic Yellow 11 23 25 28 4 1 CI Direct Red 4 23 31 75 76 79 80 81 83 84 149 224 CI Direct Green 26 28 CI Direct Blue 71 78 98 106 108 192 2 01 CI Direct Violet 51 CI Direct Yellow 26 27 28 33 44 50 86 142 CI Direct Orange 26 29 34 37 72 CI Sulfur Red 5 6 7 CI Sulfur Green 2 3 6 CI Sulfur Blue 2 3 7 9 13 15 CI Sulfur Violet 2 3 4 CI Sulfur Yellow 4 CI Vat Re d 13 21 23 28 29 48 CI Vat Green 3 5 8 CI Vat Blue 6 1 4 26 30 CI Vat Violet 1 3 9 13 15 16 CI Vat Yellow 2 12 20 33 CI Vat Orange 2 5 11 15 18 20 CI Azoic Coupling Component 2 3 4 5 7 8 9 10 11 13 32 37 41 48 CI Reactiv e Red 8 22 46 120 CI Reactive Blue 1 2 7 19 CI Reactive Violet 2 4 CI Reactive Yellow 1 2 4 14 16 CI Reactive Orange 1 4 7 13 16 20 CI Disperse Red 4 11 54 55 58 65 73 1 27, 129, 141, 196, 210, 229, 354, 356, CI Disperse Blue 3, 24, 79, 82, 87, 106, 125, 165, 183, CI Disperse Violet 1, 6, 12, 26, 27, 28, CI Disperse Yellow 3, 4, 5, 7, 23, 33, 42, 60, 64, CI Disperse Orange 13, 29, 30.
[0043] 染料(D)としては、 400ないし 700nmの波長領域において 70%以上の透過率を 示す領域と、 10%以下の透過率を示す領域とを有する光学特性を示すものであり、 そして 200°C以上の温度を経ても透過率変化が 5%以内が好ましぐ本発明のレジス ト組成物及び、そのレジスト組成物から作製されたカラーフィルターにおいても同様 の光学特性を示すものである。  [0043] The dye (D) exhibits an optical characteristic having a region showing a transmittance of 70% or more in a wavelength region of 400 to 700 nm and a region showing a transmittance of 10% or less, and 200 The resist composition of the present invention, in which the change in transmittance is preferably within 5% even at a temperature of ≧ C, and the color filter produced from the resist composition exhibit similar optical characteristics.
[0044] 本発明の染料含有レジスト組成物は、基材に塗布後、 50ないし 150°Cの温度で焼 成し、露光、現像されるが、この焼成温度を 200ないし 270°C (200°Cでは 30分、 27 0°Cでは 30秒)の高温で焼成しても 400な!/、し 700nmの波長領域で 70%以上の透 過率を示す部分の透過率の経時変化は高温焼成を行う前に比べて 5%以内が好ま しい。  [0044] The dye-containing resist composition of the present invention is applied to a substrate, then baked at a temperature of 50 to 150 ° C, exposed and developed, and this baking temperature is set to 200 to 270 ° C (200 ° C). Even if baked at a high temperature of 30 minutes for C and 30 seconds at 270 ° C), it is 400! /, And the transmittance change with time of the portion showing a transmittance of 70% or more in the 700 nm wavelength region is high-temperature baking. Within 5% is preferred compared to before performing.
[0045] 本発明の染料含有レジスト組成物では、染料 (D)の導入量は、光酸発生剤 (A)、 樹脂 (B)、架橋性化合物(C)、及び染料 (D)からなる固形分全体(100%)に対して 1ないし 90質量%の範囲で選ばれる。染料の導入量が少ない場合、レジスト膜が薄 膜化した際に所望の分光スペクトルを発現することが困難となり、染料の導入量が多 い場合、レジスト組成物の保存安定性に劣る。しかし、本発明のレジスト組成物にお いては、前記式 [2]で表される陽イオン化合物を有する染料、更には前記式 [2]で表 される陽イオン化合物と陰イオン化合物からなる染料を用いたことにより、上記の染料 の導入量(固形分全体中の染料濃度)が数質量%の低濃度で使用できることはもち ろんであるが、 30ないし 90質量%の高濃度に設定しても染料は十分な溶解性を示 す。  [0045] In the dye-containing resist composition of the present invention, the amount of the dye (D) introduced is a solid comprising the photoacid generator (A), the resin (B), the crosslinkable compound (C), and the dye (D). It is selected in the range of 1 to 90% by mass with respect to the whole minute (100%). When the amount of dye introduced is small, it becomes difficult to develop a desired spectral spectrum when the resist film is thinned, and when the amount of dye introduced is large, the storage stability of the resist composition is poor. However, in the resist composition of the present invention, a dye having a cationic compound represented by the above formula [2], and further a dye comprising a cationic compound represented by the above formula [2] and an anionic compound As a matter of course, the introduction amount of the above dye (the concentration of the dye in the entire solid content) can be used at a low concentration of several mass%, but it is set to a high concentration of 30 to 90 mass%. The dye is sufficiently soluble.
[0046] 本発明の染料含有レジスト組成物に用いられる溶媒 (E)は、例えばアセトン、メタノ 一ノレ、エタノール、イソプロピルアルコール、メトキシメチルペンタノール、ジペンテン、 ェチルアミルケトン、メチルノニルケトン、メチルェチルケトン、メチルイソアミルケトン、 メチノレイソプロピノレケトン、メチノレセノレソノレブ.ェチノレセノレソノレブ、メチノレセロソノレブァ セテート、ェチルセ口ソルブアセテート、ブチルカルビトール、ェチルカルビトール、ェ チレングリコーノレ、エチレングリコーノレモノアセテート、エチレングリコーノレモノイソプロ ピノレエーテノレ、エチレングリコーノレモノブチノレエーテノレ、プロピレングリコーノレ、プロピ レングリコーノレモノアセテート、プロピレングリコーノレモノメチノレエーテノレ、プロピレン グリコーノレ tert ブチノレエーテノレ、ジプロピレングリコーノレモノメチノレエーテノレ、ジ エチレングリコーノレ、ジエチレングリコーノレモノアセテート、ジエチレングリコーノレジメ チノレエーテノレ、ジプロピレングリコーノレモノアセテートモノメチノレエーテノレ、ジプロピレ ングリコーノレモノメチノレエーテノレ、ジプロピレングリコーノレモノェチノレエーテノレ、ジプロ ピレングリコーノレモノアセテートモノェチノレエーテノレ、ジプロピレングリコーノレモノプロ ピルエーテル、ジプロピレングリコールモノアセテートモノプロピルエーテル、ジプロピ レングリコーノレモノプロピノレエーテノレ、ジプロピレングリコーノレモノアセテートモノプロ ピルエーテル、 3—メチルー 3—メトキシブチルアセテート、トリプロピレングリコールメ チルエーテル、 3—メチルー 3—メトキシブタノール、ジイソプロピルエーテル、ェチル イソブチノレエーテノレ、ジイソブチレン、アミノレアセテート、ブチノレブチレート、ブチノレエ 一テル、ジイソプチルケトン、メチルシクロへキセン、プロピルエーテル、ジへキシルェ 一テル、ジォキサン、 N, N ジメチルァセトアミド、 N, N ジメチルホルムアミド、ジメ チルスルホキシド、 N メチルピロリドン、 γ—ブチ口ラタトン、 η へキサン、 η ペン タン、 η—オクタン、ジェチルエーテル、シクロへキサノン、乳酸メチル、乳酸ェチル、 酢酸メチル、酢酸ェチル、酢酸 η ブチル、酢酸プロピレングリコールモノェチルェ 一テル、ピルビン酸メチル、ピルビン酸ェチル、 3—メトキシプロピオン酸メチル、 3— エトキシプロピオン酸メチルェチル、 3—メトキシプロピオン酸ェチル、 3—エトキシプ ロピオン酸、 3—メトキシプロピオン酸、 3—メトキシプロピオン酸プロピル、 3—メトキシ プロピオン酸ブチル、ジグライム、 4ーヒドロキシー4ーメチルー 2 ペンタノンなどが 挙げられる。これらは単独で、また 2種類以上の組み合わせで使用することができる。 これらの溶媒の中でも本発明に用いられる上記染料 (D)との相溶性はケトール系 溶媒が特に好ましい。ケトールは /3—ヒドロキシケトンがあげられ、具体的には 4ーヒド ロキシー4ーメチルー 2 ペンタノンが好ましく例示される。 The solvent (E) used in the dye-containing resist composition of the present invention is, for example, acetone, methanol monoethanol, ethanol, isopropyl alcohol, methoxymethylpentanol, dipentene, ethyl amyl ketone, methyl nonyl ketone, methyl ester. Tilketone, methyl isoamyl ketone, methinoreisopropenoleketone, methinoresenoresorenolev, ethinoresenoresonolev, methinoreserosolorebu Cetate, ethyl acetate sorb acetate, butyl carbitol, ethyl carbitol, ethylene glycolate, ethylene glycol monoacetate, ethylene glycol monoacetopropylene oleore, ethylene glycol ole monobutenoate, propylene glycol nore, propylene glycol Nole monoacetate, propylene glycol nole monomethylenoate, propylene glycol nore tert butinoleate nore, dipropylene glycol nole monomethinoatenore, diethylene glycol nore, diethylene glycol nore monoacetate, diethylene glyconoremino chinenoate nore, dipropylene Glyconole monoacetate monomethylenoateolene, dipropylene glycolenolemonomethylenoteatere, dipropylene Ricohino Monochinoleetenore, Dipropylene glycolenole monoacetate Monoethinoreethenole, Dipropylene glycolenoremonopropyl ether, Dipropylene glycol monoacetate monopropyl ether, Dipropylene glycolenole monopropenoate, Dipropylene glycolanol monoacetate monopropyl ether, 3-methyl-3-methoxybutyl acetate, tripropylene glycol methyl ether, 3-methyl-3-methoxybutanol, diisopropyl ether, ethyl isobutinoleatenore, diisobutylene, aminoreacetate , Butinolevylate, butinoleate, diisoptyl ketone, methylcyclohexene, propyl ether, dihexyl ester, dioxane, N, N dimethylase Toamide, N, N dimethylformamide, dimethyl sulfoxide, N methylpyrrolidone, γ-butyral rataton, η hexane, η pentane, η-octane, jetyl ether, cyclohexanone, methyl lactate, methyl lactate, methyl acetate , Ethyl acetate, η-butyl acetate, propylene glycol monoethyl acetate, methyl pyruvate, ethyl pyruvate, methyl 3-methoxypropionate, methyl ethyl ethoxypropionate, ethyl 3-methoxypropionate, 3-ethoxypropyl Examples include lopionic acid, 3-methoxypropionic acid, propyl 3-methoxypropionate, butyl 3-methoxypropionate, diglyme, 4-hydroxy-4-methyl-2-pentanone. These can be used alone or in combination of two or more. Of these solvents, ketol solvents are particularly preferred for compatibility with the dye (D) used in the present invention. Examples of ketol include / 3-hydroxyketone, and specific examples thereof include 4-hydroxy-4-methyl-2-pentanone.
これは、ケトール系溶媒分子中の水酸基とカルボニル基が、上記染料 (D)に含ま れるイオン化合物、特に陽イオン化合物に対して、好都合な配位子として効果を発 揮するために、非常に高い溶解性を示すと考えられる。よって、これらの上記染料 (D )を使った場合に高!、溶解性を有するものと考えられる。 This is because the hydroxyl group and carbonyl group in the ketol solvent molecule are contained in the dye (D). In order to exert an effect as a convenient ligand, it is considered that the compound exhibits extremely high solubility. Therefore, when these dyes (D) are used, they are considered to be highly soluble.
本願発明に用いられる溶媒 (E)としては、このケトール系溶媒を単独で用いることが できるが、全溶媒中にケトール系溶媒を 10質量%以上の割合で含む溶媒を選択す ることが好ましい。  As the solvent (E) used in the present invention, this ketol solvent can be used alone, but it is preferable to select a solvent containing the ketol solvent in a ratio of 10% by mass or more in the total solvent.
[0048] 本発明の染料含有レジスト組成物において、光酸発生剤 (A)、樹脂 (B)、架橋性 化合物 (C)及び染料 (D)が、光酸発生剤 (A)、樹脂 (B)、架橋性化合物 (C)、染料 ( D)及び溶媒 (E)中に含有する割合、すなわち固形分濃度は、 5ないし 50質量%で あり、好ましくは、 10ないし 30質量%である。この割合が 5質量%未満である場合に は、塗膜の膜厚が過小になり、ピンホールの発生や特性上問題となる。また、 50質量 %を超える場合には、レジスト組成物の粘度が過大となり、塗膜の膜厚均一性が損な われる。  [0048] In the dye-containing resist composition of the present invention, the photoacid generator (A), the resin (B), the crosslinkable compound (C) and the dye (D) are combined with the photoacid generator (A), the resin (B ), The crosslinkable compound (C), the dye (D), and the solvent (E) are contained in a proportion, that is, a solid content concentration of 5 to 50% by mass, preferably 10 to 30% by mass. When this ratio is less than 5% by mass, the film thickness of the coating film becomes too small, which causes pinholes and characteristics. On the other hand, when it exceeds 50% by mass, the viscosity of the resist composition becomes excessive, and the film thickness uniformity of the coating film is impaired.
[0049] 本発明の染料含有レジスト組成物には、レジスト膜の塗れ性や平坦化性を高める 目的で、界面活性剤を含有する事が出来る。このような界面活性剤としては、フッ素 系界面活性剤、シリコーン系界面活性剤、ノユオン系界面活性剤等が挙げられる。 より具体的には、例えばエフトップ EF301、 EF303、 EF352 (トーケムプロダクツ( 株)製))、メガファック F171、 F173、 R— 30 (大日本インキ (株)製)、フロラード FC4 30、 FC431 (住友スリーェム(株)製)、アサヒガード AG710、サーフロン S— 382、 S C101、 SC102、 SC103、 SC104、 SC105、 SC106 (旭石肖子(株)製)等カ挙げ、ら れる。  [0049] The dye-containing resist composition of the present invention may contain a surfactant for the purpose of improving the wettability and flatness of the resist film. Examples of such surfactants include fluorine-based surfactants, silicone-based surfactants, and noion-based surfactants. More specifically, for example, F-top EF301, EF303, EF352 (manufactured by Tochem Products Co., Ltd.), MegaFac F171, F173, R-30 (manufactured by Dainippon Ink Co., Ltd.), Florard FC4 30, FC431 ( Sumitomo 3EM Co., Ltd.), Asahi Guard AG710, Surflon S-382, SC101, SC102, SC103, SC104, SC105, SC106 (manufactured by Asahiishi Shoko Co., Ltd.).
[0050] これらの界面活性剤の使用割合は、樹脂 (B)成分 100質量部に対して、好ましくは 0. 01ないし 2質量部、より好ましくは 0. 01ないし 1質量部である。界面活性剤の含 有量が 2質量部よりも多くなるとレジスト膜がムラになりやすぐ 0. 01質量部未満では 、レジスト膜にストリエーシヨンが発生しやすくなる。  [0050] The ratio of these surfactants to be used is preferably 0.01 to 2 parts by mass, more preferably 0.01 to 1 part by mass with respect to 100 parts by mass of the resin (B) component. If the surfactant content exceeds 2 parts by mass, the resist film becomes uneven, and if it is less than 0.01 parts by mass, striations are likely to occur in the resist film.
[0051] また、現像後の基板との密着性を向上させる目的で、密着促進剤を含有することが 出来る。このような密着促進剤の具体例としては、例えばトリメチルクロロシラン、ジメ チルビユルクロロシラン、メチルジフエユルクロロシラン、クロロメチルジメチルクロロシ ラン等のクロロシラン類、トリメチルメトキシシラン、ジメチルジェトキシシラン、メチルジ メトキシシラン、ジメチルビニルエトキシシラン、ジフエ二ルジメトキシシラン、フエニルト リエトキシシラン等のアルコキシシラン類、へキサメチルジシラザン、 N, N, 一ビス(トリ メチルシリル)ゥレア、ジメチルトリメチルシリルァミン、トリメチルシリルイミダゾール類 のシラザン類、ビュルトリクロロシラン、 γ—クロ口プロピルトリメトキシシラン、 γ—アミ ノプロピルトリエトキシシラン、 γ—メタクリロキシプロピルトリメトキシシラン、 γ—グリシ ドキシプロビルトリメトキシシラン等のシラン類、ベンゾトリァゾール、ベンズイミダゾー ノレ、インダゾール、イミダゾーノレ、 2—メルカプトべンズイミダゾーノレ、 2—メルカプトべ ンゾチアゾール、 2—メルカプトべンゾォキサゾール、ゥラゾール、チォゥラシル、メル カプトイミダゾール、メルカプトピリミジン等の複素環状化合物や、 1 , 1ージメチレンゥ レア、 1 , 3—ジメチルゥレア等の尿素、又はチォ尿素化合物を挙げることができる。 [0051] For the purpose of improving the adhesion to the substrate after development, an adhesion promoter can be contained. Specific examples of such adhesion promoters include, for example, trimethylchlorosilane, dimethylvinylchlorosilane, methyldiphenylchlorosilane, chloromethyldimethylchlorosilane. Chlorosilanes such as orchid, alkoxysilanes such as trimethylmethoxysilane, dimethyljetoxysilane, methyldimethoxysilane, dimethylvinylethoxysilane, diphenyldimethoxysilane, phenyltriethoxysilane, hexamethyldisilazane, N, N, Bis (trimethylsilyl) urea, dimethyltrimethylsilylamine, silazanes of trimethylsilylimidazoles, butyltrichlorosilane, γ-chloropropylpropylmethoxysilane, γ-aminopropyltriethoxysilane, γ-methacryloxypropyltrimethoxysilane Γ-glycidoxyprovir trimethoxysilane and other silanes, benzotriazole, benzimidazole, indazole, imidazole, 2-mercaptobensimidazole, 2— Mention may be made of heterocyclic compounds such as lucaptobenzothiazole, 2-mercaptobenzoxazole, urazole, thiouracil, mercaptoimidazole, mercaptopyrimidine, urea such as 1,1-dimethyleneurea, 1,3-dimethylurea, or thiourea compounds. it can.
[0052] これらの密着促進剤の使用割合は、樹脂 (Β)成分 100質量部に対して、通常、 20 質量部以下、好ましくは 0. 05ないし 10質量部、特に好ましくは 1ないし 10質量部で ある。 [0052] The use ratio of these adhesion promoters is usually 20 parts by mass or less, preferably 0.05 to 10 parts by mass, and particularly preferably 1 to 10 parts by mass with respect to 100 parts by mass of the resin (i) component. It is.
[0053] 本発明の染料含有レジスト組成物には、さらに染料含有レジスト組成物と混和性の ある添加物類を加えることができる。例えば、耐光安定性を高める紫外線吸収剤や 酸化防止剤、染料の析出を抑制する相溶化剤として、具体例としては、ポリオキシェ チレンォクチルエーテル化合物、ポリオキシエチレンラウリルエーテル化合物、ポリオ キシエチレンアルキル(炭素原子数 12ないし 13)エーテル化合物、ポリオキシェチレ ン 2級アルキル(炭素原子数 12ないし 14)エーテル化合物、ポリオキシエチレンアル キル (炭素原子数 13)エーテル化合物、ポリオキシエチレンセチルエーテル化合物、 ポリオキシエチレンステアリルエーテル化合物、ポリオキシエチレンォレイルエーテル 化合物、ポリオキシエチレンデシルエーテル化合物、ポリオキシアルキレンアルキル( 炭素原子数 11な!、し 15)エーテル化合物、ポリオキシアルキレン 2級アルキル (炭素 原子数 12ないし 14)エーテル化合物、ポリオキシアルキレンセチルエーテル化合物 等のアルキルエーテル化合物、ポリオキシエチレンラウリルアミノエ一テル化合物、ポ リオキシエチレンステアリルアミノエ一テル化合物、ポリオキシエチレンォレイルァミノ エーテル化合物等のアルキルアミノエ一テル化合物、ポリオキシエチレンラウリン酸 アミドエ一テル化合物、ポリオキシエチレンステアリン酸アミドエーテル化合物、ポリオ キシエチレンォレイン酸アミドエ一テル化合物、ラウリン酸ジエタノールアミド化合物、 ステアリン酸ジエタノールアミド化合物、ォレイン酸ジエタノールアミド化合物等のァ ルキルアミドエ一テル化合物、ポリオキシエチレンポリスチルフエニルエーテル化合 [0053] Additives miscible with the dye-containing resist composition may be further added to the dye-containing resist composition of the present invention. For example, UV absorbers and antioxidants that enhance light stability, and compatibilizers that suppress dye precipitation include polyoxyethylene octyl ether compounds, polyoxyethylene lauryl ether compounds, polyoxyethylene alkyl ( 12 to 13 carbon atoms ether compound, polyoxyethylene secondary alkyl (12 to 14 carbon atoms) ether compound, polyoxyethylene alkyl (13 carbon atoms) ether compound, polyoxyethylene cetyl ether compound, polyoxyethylene Stearyl ether compounds, polyoxyethylene oleyl ether compounds, polyoxyethylene decyl ether compounds, polyoxyalkylene alkyls (11 carbon atoms! 15) ether compounds, polyoxyalkylene secondary alkyls (12 to 12 carbon atoms) 14) Alkyl ether compounds such as ether compounds and polyoxyalkylene cetyl ether compounds, alkyls such as polyoxyethylene lauryl amino ether compounds, polyoxyethylene stearyl amino ether compounds and polyoxyethylene oleylamino ether compounds Amino ether compound, polyoxyethylene lauric acid Alkylamide compounds such as amide ether compounds, polyoxyethylene stearic acid amide ether compounds, polyoxyethylene oleic acid amide ether compounds, lauric acid diethanolamide compounds, stearic acid diethanolamide compounds, oleic acid diethanolamide compounds, Polyoxyethylene polystilphenyl ether compound
ポリスチルフエニルエーテルホルムアミド縮合物、ポリオキシエチレンモノスチリルフエ ニルエーテル化合物、ポリオキシエチレンジスチリルフエニルエーテル化合物、ポリ ォキシエチレンナフチルエーテル化合物等のァリルフエニルエーテル化合物、グリセ リンモノラウレート化合物、グリセリンモノステアレート化合物、グリセリンモノォレート化 合物、グリセリントリオレート化合物等のグリセリン脂肪酸エステル化合物、ソルビタン モノラウレート化合物、ソルビタンモノパルミテート化合物、ソルビタンモノステアレート 化合物、ソルビタントリステアレート化合物、ソルビタンモノォレート化合物、ソルビタン トリオレート化合物等のソルビタン酸エステル化合物、ポリオキシエチレンジラウレート 化合物、ポリオキシエチレンラウレート化合物、ポリオキシエチレンステアレート化合 物、ポリオキシエチレンジステアレート化合物、ポリオキシエチレンジォレート化合物、 ポリオキシエチレンォレート化合物等の脂肪酸エーテルエステル化合物、ポリオキシ エチレンヒマシ油エーテル化合物、ポリオキシエチレン硬化ヒマシ油エーテル化合物 等の植物油エーテルエステル化合物、ポリオキシエチレンソルビタンモノラウレート化 合物、ポリオキシエチレンソルビタンモノステアレート化合物、ポリオキシエチレンカレ ビタンモノォレート化合物、ポリオキシエチレンスルビタントリオレート化合物等のカレ ビタンエーテルエステル化合物、ポリオキシアルキレンブチルエーテル化合物、ポリ Polysyl phenyl ether formamide condensates, polyoxyethylene monostyryl phenyl ether compounds, polyoxyethylene distyryl phenyl ether compounds, polyoxyethylene naphthyl ether compounds and other aryl phenyl ether compounds, glycerin monolaurate compounds, Glycerin monostearate compound, glycerin monooleate compound, glycerin fatty acid ester compound such as glycerol triolate compound, sorbitan monolaurate compound, sorbitan monopalmitate compound, sorbitan monostearate compound, sorbitan tristearate compound, sorbitan Sorbitanate compounds such as monooleate compounds, sorbitan trioleate compounds, polyoxyethylene dilaurate compounds, polyoxyesters Len laurate compound, polyoxyethylene stearate compound, polyoxyethylene distearate compound, polyoxyethylene dioleate compound, fatty acid ether ester compound such as polyoxyethylene oleate compound, polyoxyethylene castor oil ether compound, polyoxyethylene Vegetable oil ether ester compounds such as hardened castor oil ether compounds, polyoxyethylene sorbitan monolaurate compounds, polyoxyethylene sorbitan monostearate compounds, polyoxyethylene carbitan monooleate compounds, polyoxyethylene sulfitan trioleate compounds Carabitan ether ester compounds such as polyoxyalkylene butyl ether compounds, poly
子数 14ないし 15)エーテル化合物、ポリオキシアルキレンォレイルエーテル化合物 等のモノオール型ポリエーテル化合物、ポリオキシエチレンポリオキシプロピレン縮合 物等のジオール型ポリエーテル化合物、トリメチロールプロパントリス(ポリオキシアル キレン)エーテル化合物、ポリオキシアルキレングリセリルエーテル化合物等のポリオ ール型ポリエーテル化合物、メチルラウレート化合物、メチルォレート化合物、イソプ 口ピルミリステート化合物、ブチルステアレート化合物、ォクチルパルミテート化合物、 ォクチルステアレート化合物、ラウリルォレート化合物、イソトリデシルステアレート化 合物、ォレイルォレート化合物、ジォレイルアジペート化合物、トリメチロールプロパン トリデカノエート化合物、トリメチロールプロパントリラウレート化合物、ペンタエリスリト 一ルジォレート化合物、ペンタエリスリトールモノステアレート化合物、ペンタエリスリト ールジステアレート化合物等の脂肪酸アルキルエステル化合物、アルキルスルホネ ート化合物、長鎖アルキルベンゼンスルホン酸化合物、分岐アルキルベンゼンスノレ ホン酸化合物、長鎖アルキルベンゼンスルホネート化合物、分岐アルキルベンゼンス ルホネート化合物、分岐アルキルジフエ二ルエーテルジスルホネート化合物、モノィ 14 to 15) Monool type polyether compound such as ether compound, polyoxyalkylene oleyl ether compound, diol type polyether compound such as polyoxyethylene polyoxypropylene condensate, trimethylolpropane tris (polyoxyalkylene) ether Compounds, polyol type polyether compounds such as polyoxyalkylene glyceryl ether compounds, methyl laurate compounds, methyl oleate compounds, isopyl pyrmyristate compounds, butyl stearate compounds, octyl palmitate compounds, Octyl stearate compound, Lauryl oleate compound, Isotridecyl stearate compound, Oleolelate compound, Dioleyl adipate compound, Trimethylolpropane Tridecanoate compound, Trimethylolpropane trilaurate compound, Pentaerythritol monorudiolate compound, Fatty acid alkyl ester compounds such as pentaerythritol monostearate compound and pentaerythritol distearate compound, alkyl sulfonate compounds, long-chain alkylbenzene sulfonate compounds, branched alkylbenzene sulfonate compounds, long-chain alkylbenzene sulfonate compounds, branched Alkylbenzene sulfonate compounds, branched alkyl diphenyl ether disulfonate compounds, mono
化合物、ジォクチルスルホサクシネート化合物等のスルホン酸型化合物、ォレイン酸 硫酸化油化合物、ヒマシ硫酸化化合物、ォクチルサルフェート化合物、ラウリルサル フェート化合物、アルキルサルフェート化合物、アルキルエーテルサルフェート化合 物等の硫酸エステル化合物、セルロース、セルロース誘導体、糖骨格高分子化合物 が挙げられる。 Compounds, sulfonic acid type compounds such as dioctylsulfosuccinate compounds, oleic acid sulfated oil compounds, castor sulfated compounds, octyl sulfate compounds, lauryl sulfate compounds, alkyl sulfate compounds, alkyl ether sulfate compounds, etc. Compounds, cellulose, cellulose derivatives, and sugar skeleton polymer compounds.
[0054] これら相溶化剤の使用割合は、樹脂(B)成分 100質量部に対して、 0. 001ないし  [0054] The proportion of the compatibilizer used is 0.001 to 100 parts by mass of resin (B) component 100 parts by mass.
20質量部である。使用量が少ない場合は染料の析出を抑制することができず、多い 場合は良好なパターン形状が得られにくくなる。し力もながら、相溶化剤がパターン 形状を阻害しない場合は 20質量部以上使用できる。  20 parts by mass. When the amount used is small, the precipitation of the dye cannot be suppressed, and when it is large, it is difficult to obtain a good pattern shape. However, if the compatibilizer does not interfere with the pattern shape, it can be used in an amount of 20 parts by mass or more.
[0055] さらに光増感剤として従来から公知の光増感剤を用いることができる。例えば、チォ キサンテン系、キサンテン系、ケトン系、チォピリリウム塩系、ベーススチリル系、メロシ ァニン系、 3—置換クマリン系、 3, 4—置換クマリン系、 3—クマリン系、アタリジン系、 チアジン系、フエノチアジン系、アントラセン系、コロネン系、ベンズアントラセン系、ぺ リレン系、メロシアニン系、ケトクマリン系、フマリン系、ボレート系が挙げられる。これら は単独で用いることも、 2種類以上組み合わせて用いることも出来る。  [0055] Further, conventionally known photosensitizers can be used as photosensitizers. For example, thioxanthene, xanthene, ketone, thiopyrylium salt, base styryl, merocyanine, 3-substituted coumarin, 3, 4-substituted coumarin, 3-coumarin, atalidine, thiazine, phenothiazine , Anthracene, coronene, benzanthracene, perylene, merocyanine, ketocoumarin, fumarine, and borate. These can be used alone or in combination of two or more.
[0056] 本発明の染料含有レジスト組成物を用いたカラーフィルターの作製方法は、特に限 定されないが、以下の方法が挙げられる。  [0056] A method for producing a color filter using the dye-containing resist composition of the present invention is not particularly limited, and examples thereof include the following methods.
本発明のレジスト組成物をスピナ一法などで所望のレジスト膜厚を得る回転数でシ リコンウェハやガラス基板上に塗布し、ソフトベータ (焼成)を行う。ソフトベータは溶剤 を蒸発させれば良ぐ 50ないし 150°Cの温度範囲で 30秒ないし 10分間で行うことが 好ましい。その後、マスクを介して、露光量 10ないし 3000mj/cm2程度で露光する 。露光には、例えば水銀ランプ等の紫外線、遠紫外線、電子線、もしくは X線等が用 いられる。露光後、ネガ型レジスト組成物を用いてパターンを形成する場合、加熱 (P EB (ポストェクスポージャーベータ))を行うことが好ましい。 PEBにより、露光により発 生した酸又は塩基による架橋化がさらに進行し、より未露光部との現像溶液溶解度 に対する差が広がり、解像コントラストが向上する。 PEBは、 50ないし 170°Cの温度 範囲で 30秒な!/、し 5分間行うのが好まし!/、。 The resist composition of the present invention is prepared at a rotational speed to obtain a desired resist film thickness by a spinner method. Apply on recon wafer or glass substrate and perform soft beta (firing). The soft beta should be conducted for 30 seconds to 10 minutes in the temperature range of 50 to 150 ° C, as long as the solvent is evaporated. After that, exposure is performed through a mask at an exposure amount of about 10 to 3000 mj / cm 2 . For the exposure, for example, ultraviolet rays such as a mercury lamp, far ultraviolet rays, electron beams, or X-rays are used. When a pattern is formed using a negative resist composition after exposure, heating (P EB (post exposure beta)) is preferably performed. By PEB, crosslinking with an acid or base generated by exposure further proceeds, and the difference in the solubility of the developing solution from the unexposed area is further widened to improve the resolution contrast. PEB should be in the temperature range of 50 to 170 ° C for 30 seconds! /, And preferably for 5 minutes! /.
次に現像を行う。現像方法としては、特に制限はなぐパドル法、デイツビング法、ス プレー法等の公知の方法により行うことができる。現像温度は 20な!/、し 50°Cの間が 好ましぐ現像液に 10秒ないし 10分間浸漬することが好ましい。  Next, development is performed. The developing method can be carried out by a known method such as a paddle method, a dating method, or a spray method without any particular limitation. The development temperature is 20! /, And it is preferable to immerse in a developer solution preferably between 50 ° C for 10 seconds to 10 minutes.
[0057] 現像液としては、有機溶剤又はアルカリ性水溶液などを用いることができる。具体的 には、イソプロピルアルコール、プロピレングリコールモノメチルエーテル、ェチルアミ ン水溶液、 n—プロピルアミン水溶液、ジェチルァミン水溶液、ジー n—プロピルアミ ン水溶液、トリェチルァミン水溶液、メチルジェチルァミン水溶液、ジエタノールァミン 水溶液、トリエタノールァミン水溶液、テトラメチルアンモニゥムハイド口オキサイド水溶 液、水酸化ナトリウム水溶液、水酸化カリウム水溶液、炭酸ナトリウム水溶液、重炭酸 ナトリウム水溶液、ケィ酸ナトリウム水溶液、メタケイ酸ナトリウム水溶液などが挙げら れる。 As the developer, an organic solvent or an alkaline aqueous solution can be used. Specific examples include isopropyl alcohol, propylene glycol monomethyl ether, ethylamine aqueous solution, n-propylamine aqueous solution, jetylamine aqueous solution, diethyl n-propylamine aqueous solution, triethylamine aqueous solution, methyljetylamine aqueous solution, diethanolamine aqueous solution, triethanol. Examples thereof include an aqueous solution of amine, an aqueous solution of tetramethylammonium hydroxide, an aqueous solution of sodium hydroxide, an aqueous solution of potassium hydroxide, an aqueous solution of sodium carbonate, an aqueous solution of sodium bicarbonate, an aqueous solution of sodium silicate, and an aqueous solution of sodium metasilicate.
[0058] さらに、現像液には未露光部の除去性を高めるために、界面活性剤を添加すること が好ましい。具体例としては、ポリオキシエチレンォクチルエーテル化合物、ポリオキ シエチレンラウリルエーテル化合物、ポリオキシエチレンアルキル(炭素原子数 12な いし 13)エーテル化合物、ポリオキシエチレン 2級アルキル(炭素原子数 12ないし 14 )エーテル化合物、ポリオキシエチレンアルキル (炭素原子数 13)エーテル化合物、 ポリオキシエチレンセチルエーテル化合物、ポリオキシエチレンステアリルエーテル 化合物、ポリオキシエチレンォレイルエーテル化合物、ポリオキシエチレンデシルェ 一テル化合物、ポリオキシアルキレンアルキル (炭素原子数 11な!/、し 15)エーテル化 合物、ポリオキシアルキレン 2級アルキル (炭素原子数 12ないし 14)エーテル化合物 、ポリオキシアルキレンセチルエーテル化合物等のアルキルエーテル化合物、ポリオ キシエチレンラウリルアミノエ一テル化合物、ポリオキシエチレンステアリルアミノエ一 テル化合物、ポリオキシエチレンォレイルァミノエーテル化合物等のアルキルアミノエ 一テル化合物、ポリオキシエチレンラウリン酸アミドエ一テル化合物、ポリオキシェチ レンステアリン酸アミドエ一テル化合物、ポリオキシエチレンォレイン酸アミドエ一テル 化合物、ラウリン酸ジエタノールアミド化合物、ステアリン酸ジエタノールアミド化合物 、ォレイン酸ジエタノールアミド化合物等のアルキルアミドエ一テル化合物、ポリオキ ニルエーテル化合物、ポリオキシアルキレンポリスチルフエニルエーテルホルムアミド 縮合物、ポリオキシエチレンモノスチリルフエニルエーテル化合物、ポリオキシェチレ ンジスチリルフエニルエーテル化合物、ポリオキシエチレンナフチルエーテル化合物 等のァリルフエニルエーテル化合物、グリセリンモノラウレート化合物、グリセリンモノ ステアレート化合物、グリセリンモノォレート化合物、グリセリントリオレート化合物等の グリセリン脂肪酸エステル化合物、ソルビタンモノラウレート化合物、ソルビタンモノパ ルミテート化合物、ソルビタンモノステアレート化合物、ソルビタントリステアレート化合 物、ソルビタンモノォレート化合物、ソルビタントリオレート化合物等のソルビタン酸ェ ステル化合物、ポリオキシエチレンジラウレート化合物、ポリオキシエチレンラウレート 化合物、ポリオキシエチレンステアレート化合物、ポリオキシエチレンジステアレート 化合物、ポリオキシエチレンジォレート化合物、ポリオキシエチレンォレート化合物等 の脂肪酸エーテルエステル化合物、ポリオキシエチレンヒマシ油エーテル化合物、ポ リオキシエチレン硬化ヒマシ油エーテル化合物等の植物油エーテルエステル化合物[0058] Furthermore, it is preferable to add a surfactant to the developer in order to enhance the removability of the unexposed areas. Specific examples include polyoxyethylene octyl ether compounds, polyoxyethylene lauryl ether compounds, polyoxyethylene alkyl (12 or 13 carbon atoms) ether compounds, polyoxyethylene secondary alkyl (12 to 14 carbon atoms). Ether compounds, polyoxyethylene alkyl (13 carbon atoms) ether compounds, polyoxyethylene cetyl ether compounds, polyoxyethylene stearyl ether compounds, polyoxyethylene oleyl ether compounds, polyoxyethylene decyl ether compounds, polyoxyalkylenes Alkyl (11 carbon atoms! /, 15) etherification Compounds, polyoxyalkylene secondary alkyl (carbon atoms of 12 to 14) ether compounds, alkyl ether compounds such as polyoxyalkylene cetyl ether compounds, polyoxyethylene lauryl amino ether compounds, polyoxyethylene stearyl amino ethers Compounds, alkylamino ether compounds such as polyoxyethylene oleylamino ether compounds, polyoxyethylene lauric acid amide ether compounds, polyoxyethylene stearic acid amide ether compounds, polyoxyethylene oleic acid amide ether compounds, Alkylamide ether compounds such as lauric acid diethanolamide compound, stearic acid diethanolamide compound, oleic acid diethanolamide compound, polyoxyl ether compound, polyoxyalkylene Polystyryl phenyl ether formamide condensate, polyoxyethylene monostyryl phenyl ether compound, polyoxyethylene distyryl phenyl ether compound, polyoxyethylene naphthyl ether compound and other aryl phenyl ether compounds, glycerin monolaurate compound, glycerin mono Glycerin fatty acid ester compounds such as stearate compounds, glycerol monooleate compounds, glycerol trioleate compounds, sorbitan monolaurate compounds, sorbitan monopalmitate compounds, sorbitan monostearate compounds, sorbitan tristearate compounds, sorbitan monooleate Compounds, sorbitan acid ester compounds such as sorbitan triolate compounds, polyoxyethylene dilaurate compounds, polyoxy Tylene laurate compounds, polyoxyethylene stearate compounds, polyoxyethylene distearate compounds, polyoxyethylene diolate compounds, polyoxyethylene oleate compounds and other fatty acid ether ester compounds, polyoxyethylene castor oil ether compounds, Vegetable oil ether ester compounds such as reoxyethylene hydrogenated castor oil ether compounds
、ポリオキシエチレンソルビタンモノラウレート化合物、ポリオキシエチレンソルビタン モノステアレート化合物、ポリオキシエチレンソルビタンモノォレート化合物、ポリオキ シエチレンスルビタントリオレート化合物等のソルビタンエーテルエステル化合物、ポ Sorbitan ether ester compounds such as polyoxyethylene sorbitan monolaurate compounds, polyoxyethylene sorbitan monostearate compounds, polyoxyethylene sorbitan monooleate compounds, polyoxyethylene sorbitan trioleate compounds,
化合物、ポリオキシアルキレンアルキル (炭素原子数 14な!/、し 15)エーテル化合物、 ポリオキシアルキレンォレイルエーテル化合物等のモノオール型ポリエーテル化合物 、ポリオキシエチレンポリオキシプロピレン縮合物等のジオール型ポリエーテル化合 物、トリメチロールプロパントリス(ポリオキシアルキレン)エーテル化合物、ポリオキシ アルキレングリセリルエーテル化合物等のポリオール型ポリエーテル化合物、メチル ラウレート化合物、メチルォレート化合物、イソプロピルミリステート化合物、ブチルス テアレート化合物、ォクチルパルミテート化合物、ォクチルステアレート化合物、ラウリ ノレオレート化合物、イソトリデシルステアレート化合物、ォレイルォレート化合物、ジォ レイルアジペート化合物、トリメチロールプロパントリデカノエート化合物、トリメチロー ルプロパントリラウレート化合物、ペンタエリスリトールジォレート化合物、ペンタエリス リトールモノステアレート化合物、ペンタエリスリトールジステアレート化合物等の脂肪 酸アルキルエステル化合物、アルキルスルホネート化合物、長鎖アルキルベンゼンス ルホン酸化合物、分岐アルキルベンゼンスルホン酸化合物、長鎖アルキルベンゼン スルホネート化合物、分岐アルキルベンゼンスルホネート化合物、分岐アルキルジフ ェニルエーテルジスルホネート化合物、モノイソプロピルナフタレンスルホネート化合 ネート化合物、ジブチルナフタレンスルホネート化合物、ジォクチルスルホサクシネー ト化合物等のスルホン酸型化合物、ォレイン酸硫酸化油化合物、ヒマシ硫酸化化合 物、ォクチルサルフェート化合物、ラウリルサルフェート化合物、アルキルサルフエ一 ト化合物、アルキルエーテルサルフェート化合物等の硫酸エステル化合物が挙げら れる。 Compounds, polyoxyalkylene alkyl (carbon atoms of 14! /, 15) ether compounds, monool-type polyether compounds such as polyoxyalkylene oleyl ether compounds Diol type polyether compounds such as polyoxyethylene polyoxypropylene condensate, polyol type polyether compounds such as trimethylolpropane tris (polyoxyalkylene) ether compound, polyoxyalkylene glyceryl ether compound, methyl laurate compound, methyl oleate compound, Isopropyl myristate compound, butyl stearate compound, octyl palmitate compound, octyl stearate compound, laurylololeate compound, isotridecyl stearate compound, oleyllate compound, dioleyl adipate compound, trimethylolpropane tridecanoate compound, trimethylo Propanetrilaurate compound, pentaerythritol diolate compound, pentaerythritol monostearate Fatty acid alkyl ester compounds, alkyl sulfonate compounds, long-chain alkyl benzene sulfonate compounds, branched alkyl benzene sulfonate compounds, long-chain alkyl benzene sulfonate compounds, branched alkyl benzene sulfonate compounds, branched alkyl diphenyl ethers Sulfonic acid type compounds such as disulfonate compound, monoisopropyl naphthalene sulfonate compound compound, dibutyl naphthalene sulfonate compound, dioctyl sulfosuccinate compound, oleic acid sulfated oil compound, castor sulfate compound, octyl sulfate compound, Sulfate ester compounds such as lauryl sulfate compounds, alkyl sulfate compounds, alkyl ether sulfate compounds Gera is.
[0059] アルカリ現像液の好ましい濃度は、アルカリ成分が 0. 001ないし 10質量%、界面 活性剤成分が 0. 001ないし 10質量%である。アルカリ成分が高すぎると現像性能力 が強すぎ、ネガ型では未露光部まで浸透してしまレ、パターン表面の荒れが起こりや すぐ低すぎると現像性能力が得られない。また、界面活性剤成分が高すぎると泡立 ちゃすくて現像ムラが発生しやすくなり、低すぎると現像性能力が得られない。  [0059] The preferred concentration of the alkali developer is 0.001 to 10% by mass for the alkali component and 0.001 to 10% by mass for the surfactant component. If the alkali component is too high, the developability is too strong. In the case of the negative type, the unexposed area penetrates to the unexposed area. If the pattern surface is rough, the developability cannot be obtained. On the other hand, if the surfactant component is too high, foaming tends to occur and development unevenness tends to occur, and if it is too low, developability cannot be obtained.
[0060] 現像後、水ある!/、は一般有機溶剤でリンスすることが好ましレ、。その後、乾燥するこ とでパターンが形成される。ネガ型レジスト組成物を用いた場合には、露光部が硬化 し、未露光部が溶解するネガ型のパターンが形成される。  [0060] After development, there is water! / Is preferably rinsed with a general organic solvent. Thereafter, the pattern is formed by drying. When a negative resist composition is used, a negative pattern is formed in which the exposed portion is cured and the unexposed portion is dissolved.
[0061] 以上の一連の工程を各色及びパターンを替え、必要な数だけ繰り返すことで必要 な色数が組み合わされた着色パターンを得ることができる。また、パターン形成後、 又はパターン中に残存する重合あるいは縮合可能な官能基を完全に反応させるた めに、加熱(ポストベータ)を行っても、全ての着色パターンを形成した後に行ってもよ く、 150な!/、し 500°Cの温度範囲で 30な!/、し 2時間行うのが好まし!/、。 [0061] Necessary by repeating the above series of steps as many times as necessary, changing each color and pattern. A colored pattern in which various numbers of colors are combined can be obtained. Further, after pattern formation, or in order to completely react the functional group that can be polymerized or condensed remaining in the pattern, heating (post beta) may be performed or after all colored patterns are formed. 150! /, 30 ° C in the temperature range of 500 ° C! /, And preferably 2 hours! /.
[0062] 本発明の染料含有レジスト組成物を用いて作製されるカラーフィルタ一は、液晶表 示装置、 LED (発光ダイオード)表示装置、固体撮像素子等に好適に使用すること ができ、なかでも固体撮像素子として用いることが好ましい。  [0062] The color filter produced using the dye-containing resist composition of the present invention can be suitably used for a liquid crystal display device, an LED (light emitting diode) display device, a solid-state imaging device, and the like. It is preferably used as a solid-state image sensor.
[0063] また、本発明は、前記式 [3]で表されるシクロへキサジェン系ォキシムスルホネート 化合物を提供する。  [0063] The present invention also provides a cyclohexagen-based oxime sulfonate compound represented by the formula [3].
前記式 [3]において、 R1及び R2は、それぞれ独立して、ハロゲン原子、 CN NO 炭素原子数 1ないし 10のアルキル基、炭素原子数 1ないし 5のアルコキシ基、炭素原 子数 1ないし 5のハロアルキル基又は炭素原子数 1ないし 5のハロアルコキシ基を表し R3は、水素原子、ハロゲン原子、ニトロ基、 CN基、炭素原子数 1ないし 10のアルキ ル基、炭素原子数 1ないし 5のアルコキシ基、炭素原子数 1ないし 5のハロアルキル基 又は炭素原子数 1ないし 5のハロアルコキシ基を表し、 nが 2 3又は 4を表すとき、各 々の R3は互いに同一であっても又は互いに相異なっていてもよぐさらに、 R3が隣接 する場合には、隣接する 2つの R3は、— CH CH -CH O— — CH N (R8)— -CH CH CH CH CH O— CH CH N (R8) CH CH CH CH CH CH CH O— CH CH CH N (R8)— CH CH CH CH CH In the above formula [3], R 1 and R 2 are each independently a halogen atom, a CN NO alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, or 1 to 1 carbon atoms. Represents a haloalkyl group of 5 or a haloalkoxy group of 1 to 5 carbon atoms, and R 3 represents a hydrogen atom, a halogen atom, a nitro group, a CN group, an alkyl group of 1 to 10 carbon atoms, or an alkyl group of 1 to 5 carbon atoms. An alkoxy group, a haloalkyl group having 1 to 5 carbon atoms, or a haloalkoxy group having 1 to 5 carbon atoms, and when n represents 23 or 4, each R 3 may be the same as each other or In addition, when R 3 is adjacent to each other, the two adjacent R 3 are —CH CH —CH 2 O— —CH N (R 8 ) — —CH 2 CH 2 CH 2 CH 2 O— CH CH N (R 8 ) CH CH CH CH CH CH CH CH O— CH CH CH N (R 8 ) — CH CH CH CH CH
CH CH CH CH O—又は一 CH CH CH CH N (R8)—を形成することにより、 2つ の R3のそれぞれが結合する炭素原子と共に 4員環、 5員環又は 6員環を形成してもよ ぐ R4は、炭素原子数 1ないし 10のアルキル基、炭素原子数 1ないし 5のアルコキシ 基、炭素原子数 1ないし 5のハロアルキル基、炭素原子数 1ないし 5のハロアルコキシ 基、 Wで置換されていてもよいフエニル基、 Wで置換されていてもよいナフチル基又 は Wで置換されていてもよいアントラニル基を表し、 R8は、水素原子又は炭素原子数 1ないし 10のアルキル基を表し、 Wは、ハロゲン原子、 CN NO、炭素原子数 1ない し 10のアルキル基、炭素原子数 1ないし 5のアルコキシ基、炭素原子数 1ないし 5の ハロアルキル基又は炭素原子数 1ないし 5のハロアルコキシ基を表し、 nは、 1 2 3 又は 4の整数を表す。 Form CH CH CH CH O— or one CH CH CH CH N (R 8 ) — to form a 4-, 5-, or 6-membered ring with the carbon atom to which each of the two R 3 bonds. R 4 may be an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms, a haloalkoxy group having 1 to 5 carbon atoms, R 8 represents a phenyl group which may be substituted with W, a naphthyl group which may be substituted with W, or an anthranyl group which may be substituted with W. R 8 represents a hydrogen atom or a carbon atom having 1 to 10 carbon atoms. Represents an alkyl group, and W represents a halogen atom, CN NO, an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms, or 1 to 1 carbon atoms. 5 represents a haloalkoxy group, n is 1 2 3 Or represents an integer of 4.
ここで、ハロゲン原子、炭素原子数 1ないし 10のアルキル基、炭素原子数 1ないし 5 のアルコキシ基、炭素原子数 1ないし 5のハロアルコキシ基、 Wで置換されていてもよ いフエニル基、 Wで置換されていてもよいナフチル基、 Wで置換されていてもよいァ ントラニル基の具体例としては、上記 R1ないし R4で説明した基と同様のものが挙げら れる。 Here, a halogen atom, an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, a haloalkoxy group having 1 to 5 carbon atoms, a phenyl group optionally substituted by W, W Specific examples of the naphthyl group optionally substituted with and the anthranyl group optionally substituted with W include the same groups as those described for R 1 to R 4 above.
[0064] また、本発明は、上述した式 [3]で表される化合物の製造中間体として、前記式 [4 ]で表されるシクロへキサジェン系ォキシム化合物を提供する。  [0064] The present invention also provides a cyclohexadiene-based oxime compound represented by the formula [4] as an intermediate for producing the compound represented by the formula [3].
前記式 [4]において、 R1及び R2は、それぞれ独立して、ハロゲン原子、 CN NO 炭素原子数 1ないし 10のアルキル基、炭素原子数 1ないし 5のアルコキシ基、炭素原 子数 1ないし 5のハロアルキル基又は炭素原子数 1ないし 5のハロアルコキシ基を表し R3は、水素原子、ハロゲン原子、ニトロ基、 CN基、炭素原子数 1ないし 10のアルキ ル基、炭素原子数 1ないし 5のアルコキシ基、炭素原子数 1ないし 5のハロアルキル基 又は炭素原子数 1ないし 5のハロアルコキシ基を表し、 nが 2 3又は 4を表すとき、各 々の R3は互いに同一であっても又は互いに相異なっていてもよぐさらに、 R3が隣接 する場合には、隣接する 2つの R3は、— CH CH -CH O— — CH N (R8)— -CH CH CH CH CH O— CH CH N (R8) CH CH CH CH CH CH CH O— CH CH CH N (R8)— CH CH CH CH CH In the formula [4], R 1 and R 2 are each independently a halogen atom, a CN NO alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, or 1 to 1 carbon atoms. Represents a haloalkyl group of 5 or a haloalkoxy group of 1 to 5 carbon atoms, and R 3 represents a hydrogen atom, a halogen atom, a nitro group, a CN group, an alkyl group of 1 to 10 carbon atoms, or an alkyl group of 1 to 5 carbon atoms. An alkoxy group, a haloalkyl group having 1 to 5 carbon atoms, or a haloalkoxy group having 1 to 5 carbon atoms, and when n represents 23 or 4, each R 3 may be the same as each other or In addition, when R 3 is adjacent to each other, the two adjacent R 3 are —CH CH —CH 2 O— —CH N (R 8 ) — —CH 2 CH 2 CH 2 CH 2 O— CH CH N (R 8 ) CH CH CH CH CH CH CH CH O— CH CH CH N (R 8 ) — CH CH CH CH CH
CH CH CH CH O—又は一 CH CH CH CH N (R8)—を形成することにより、 2つ の R3のそれぞれが結合する炭素原子と共に 4員環、 5員環又は 6員環を形成してもよ ぐ R8は、水素原子又は炭素原子数 1ないし 10のアルキル基を表し、 nは、 1 2 3又 は 4の整数を表す。 Form CH CH CH CH O— or one CH CH CH CH N (R 8 ) — to form a 4-, 5-, or 6-membered ring with the carbon atom to which each of the two R 3 bonds. However, R 8 represents a hydrogen atom or an alkyl group having 1 to 10 carbon atoms, and n represents an integer of 1 2 3 or 4.
ここで、ハロゲン原子、炭素原子数 1ないし 10のアルキル基、炭素原子数 1ないし 5 のアルコキシ基、炭素原子数 1ないし 5のハロアルコキシ基、 Wで置換されていてもよ いフエニル基の具体例としては、上記 R1ないし R4で説明した基と同様のものが挙げら れる。 Specific examples of a halogen atom, an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, a haloalkoxy group having 1 to 5 carbon atoms, and a phenyl group optionally substituted by W Examples thereof include the same groups as those described for R 1 to R 4 above.
[0065] 前記式 [3]で表されるシクロへキサジェン系ォキシムスルホネート化合物は、下記 の工程を含む製造法により製造することができる。 [化 15] 一 R1 (f Π 塩基 酸 R1 < >" R4S02CI R1 ( )" 2 R2 CN 塩基 R20N[0065] The cyclohexadiene oxime sulfonate compound represented by the formula [3] can be produced by a production method including the following steps. [Formula 15] one R1 (f [pi basic acid R 1 <>"R4S02CI R 1 ()" 2 R 2 CN bases R 2 0N
PAN NB AN OC SCHC PAN NB A N OC SCHC
(式中、 R1ないし R4は上記と同じ意味を表す。 ) (In the formula, R 1 to R 4 have the same meaning as above.)
[0066] すなわち、第 1工程は、置換フエ二ルァセトニトリル化合物(PAN)とニトロベンゼン 化合物(NB)を塩基の存在下で反応させた後酸性にすることにより、中間体ォキシム 化合物(OC)が得られる。第 2工程は、 OCを塩化スルホニル化合物(SC)と塩基の 存在下で反応させることにより、 目的のシクロへキサジェン系ォキシムスルホネート化 合物(SCHC)が製造される。  [0066] That is, in the first step, an intermediate oxime compound (OC) is obtained by reacting a substituted phenylacetonitrile compound (PAN) and a nitrobenzene compound (NB) in the presence of a base, followed by acidification. . In the second step, OC is reacted with a sulfonyl chloride compound (SC) in the presence of a base to produce the desired cyclohexadiene oxime sulfonate compound (SCHC).
[0067] 第 1工程の置換フエ二ルァセトニトリル化合物(PAN)の具体例としては、 2, 6 ジ フルオロフェニルァセトニトリル、 2, 6 ジクロ口フエ二ルァセトニトリル、 2, 6 ジブ口 モフエ二ルァセトニトリル、 2, 6 ジョードフエ二ルァセトニトリル、 2, 6 ジシァノフエ 二ルァセトニトリル、 2, 6 ジニトロフエ二ルァセトニトリル、 2, 6 ジメチルフエニルァ セトニトリノレ、 2, 6 ジメトキシフエニノレアセトニトリノレ、 2, 6 ジトリフノレ才ロメチノレフェ 二ルァセトニトリル、 2, 6 ジトリフルォロメトキシフエ二ルァセトニトリル、 2 フルォロ 6 メチルフエ二ルァセトニトリル、 2 クロロー 6 メチルフエ二ルァセトニトリル、 2 —ブロモ一 6 メチルフエ二ルァセトニトリル等が挙げられる。これらの中で特には 2, 6 ジクロ口フエ二ルァセトニトリル及び 2, 6 ジメチルフエ二ルァセトニトリルが好まし い。  [0067] As specific examples of the substituted phenylacetonitrile compound (PAN) in the first step, 2, 6 difluorophenylacetonitrile, 2, 6 diclonal phenylacetonitrile, 2, 6 dibuphthyl phenylacetonitrile, 2 , 6 Jodophenylacetonitrile, 2, 6 Dicyanophenoxyacetonitrile, 2, 6 Dinitrophenylacetonitrile, 2, 6 Dimethylphenylacetonitorinole, 2, 6 Dimethoxyphenenoleacetonitrinole, 2, 6 Examples include 6-difluoromethoxyphenylacetonitrile, 2-fluoro-6-methylphenylacetonitrile, 2-chloro-6-methylphenylacetonitrile, 2-bromo-6-methylphenylacetonitrile, and the like. Of these, 2,6-dichlorophenylnitrile and 2,6 dimethylphenylnitrile are particularly preferred.
[0068] 一方、ニトロベンゼン化合物(NB)の具体例としては、ニトロベンゼン、 2 クロロニト 口ベンゼン、 3 クロロニトロベンゼン、 2 シァノニトロベンゼン、 3 シァノニトロベン ゼン、 2 メチノレニトロベンゼン、 3 メチノレニトロベンゼン、 2—(i—プロピノレ)ニトロべ ンゼン、 3—(i プロピノレ)ニトロベンゼン、 2 メトキシュトロベンゼン、 3 メトキシニト 口ベンゼン、 2 トリフノレオロメチノレニトロベンゼン、 3 トリフノレオロメチノレニトロべンゼ ン、 2 トリフルォロメトキシニトロベンゼン、 3 トリフルォロメトキシニトロベンゼン等が 挙げられる。又、 2位と 3位が一緒になつて炭素原子数 2ないし 5の環(酸素原子又は 窒素原子を含んでもよい)を形成してもよい基としては、例えば以下の式の化合物等 が適用できる。 [0068] On the other hand, specific examples of the nitrobenzene compound (NB) include nitrobenzene, 2-chloronitrite benzene, 3 chloronitrobenzene, 2 cyanonitrobenzene, 3 cyanonitrobenzene, 2 methinorenitrobenzene, 3 methinorenitrobenzene, 2- (i —Propinole) Nitrobenzene, 3— (i Propinole) Nitrobenzene, 2 Methoxy nitrobenzene, 3 Methoxynitrate Mouth benzene, 2 Trifunoleolomethino nitrobenzene, 3 Trifunoleolomethino nitrobenzene, 2 Trifluoromethoxynitrobenzene 3 trifluoromethoxynitrobenzene and the like. Also, the 2nd and 3rd positions are joined together to form a ring with 2 to 5 carbon atoms (oxygen atom or As the group that may form a nitrogen atom), for example, a compound of the following formula can be applied.
[化 16]  [Chemical 16]
Figure imgf000045_0001
Figure imgf000045_0001
[0069] これらの中で特にはニトロベンゼン、 2—クロロニトロベンゼン、 3—クロロニトロベン ゼン、 2—メチノレニトロベンゼン、 3—メチノレニトロベンゼン、 2—(i—プロピノレ)ニトロべ ンゼン、 3—(i—プロピル)ニトロベンゼン等が好ましい。その使用量は PANに対して 、 0. 8なレヽし 1. 2当!:倍力好ましレヽ。 [0069] Among these, nitrobenzene, 2-chloronitrobenzene, 3-chloronitrobenzene, 2-methino nitrobenzene, 3-methino nitrobenzene, 2- (i-propinole) nitrobenzene, 3- (i -Propyl) nitrobenzene and the like are preferred. The amount used is 0.8 for PAN. : Booster preference.
[0070] 塩基としては、アルカリ金属やアルカリ土類金属の水酸化物、炭酸塩、有機酸塩等 が使用できる力 反応性と経済性から具体的には、水酸化ナトリウムや水酸化力リウ ムが好ましい。その使用量は PANに対して、 2ないし 5当量倍が好ましい。  [0070] As the base, alkali metal or alkaline earth metal hydroxides, carbonates, organic acid salts and the like can be used. Specifically, from the viewpoint of reactivity and economy, sodium hydroxide or lithium hydroxide Is preferred. The amount used is preferably 2 to 5 equivalents to PAN.
[0071] 反応溶媒としては、メタノールやエタノール等の炭素原子数 1ないし 5脂肪族アルコ ール類が好ましい。  [0071] The reaction solvent is preferably an aliphatic alcohol having 1 to 5 carbon atoms such as methanol or ethanol.
反応温度は— 20ないし 150°Cが好ましぐ特には 0ないし 100°Cが好ましい。 反応後、反応液に水を加えてから無機酸や有機酸で酸性にし、酢酸ェチルで抽出 後濃縮して得られた粗物を再結晶やカラムクロマトグラフィーによる精製により目的の OCが得られる。この際の無機酸や有機酸としては、塩酸や酢酸等が用いられる。  The reaction temperature is preferably -20 to 150 ° C, particularly 0 to 100 ° C. After the reaction, water is added to the reaction solution, acidified with an inorganic or organic acid, extracted with ethyl acetate and concentrated, and the resulting crude product is purified by recrystallization or column chromatography to obtain the desired OC. In this case, hydrochloric acid or acetic acid is used as the inorganic acid or organic acid.
[0072] 次に、第 2工程の SCの具体例としては、メタンスルホユルク口ライド、エタンスルホニ ノレクロライド、 n—プロピルスルホユルク口ライド、 i—プロピルスルホユルク口ライド、 n ーブチルスルホユルク口ライド、 n—アミルスルホユルク口ライド、 n—へキシルスルホ ユルク口ライド、 n—へプチルスルホユルク口ライド、 n—ォクチルスルホユルク口ライド 、 n—ノニノレスノレホニノレクロライド、 n—デシノレスノレホニノレクロライド、フエニノレスノレホニ ノレクロライド、 p—トシルスルホユルク口ライド、 p—ェチルフエニルスルホユルク口ライド 、 p— (n—プロピノレ)フエニルスルホユルク口ライド、 p— (n—ブチノレ)フエニルスルホ ユルク口ライド、 p- (n ァミル)フエニルスルホユルク口ライド、トリフルォロメチルスル ホニノレクロライド、ペンタフノレォロェチノレスノレホニノレクロライド、ノ ーフノレオ口 n—プロ ピノレスノレホニノレクロライド、ノ ーフノレオ口 i プロピノレスノレホニノレクロライド、ノ ーフノレ ォロ n ブチルスルホユルク口ライド、パーフルォロ n アミルスルホユルク口ライド、ぺ ンタフルオロフェニルスルホユルク口ライド、 1 ナフチルスルホユルク口ライド、 2—ナ フチルスルホユルク口ライド、 1 アントラニルスルホユルク口ライド等が挙げられる。そ の使用量は OCに対して、 1ないし 1. 2当量倍が好ましい。 [0072] Next, as specific examples of SC in the second step, methanesulfurol chloride, ethanesulfonol chloride, n -propylsulfurol chloride, i-propylsulfurol chloride, n- butylsulfurol chloride N-Amylsulfuryl chloride, n-Hexylsulfuryl chloride, n-Heptylsulfuryl chloride, n-octylsulfuryl chloride, n-Noninoresnorephoninorechloride, n-Desinoresnorecho Ninorechloride, Phenollessrephoni Nolechloride, p-Tosylsulfoylolide, p-Ethylphenylsulfurolide, p- (n-Propinole) phenylsulfolucide, p- (n-Butinore) Phenylsulfo Yuruku mouthride, p- (n-amyl) phenylsulfuryl mouthride, trifluoromethylsulfoninorechloride, pentafanolorechinolesnorehoninorechloride, nofnoreo- n -pro-pinolesnorehoninorechloride, Novoleo mouth i Propinoles Norehonino chloride, Novenoreol butylsulfurol mouthride, Perfluoro n Amylsulfurol mouthride, Pentafluorophenylsulfurol mouthride, 1 Naphthylsulfurol mouthride, 2-Na Examples include butylsulfurolide, 1-anthranylsulfurolide and the like. The amount used is preferably 1 to 1.2 equivalents to OC.
[0073] 塩基としては、トリエチルァミン、ピリジン、 4— N, N ジメチルァミノピリジン(DMA P)等の有機塩基が使用できる。その使用量は SCに対して、 1ないし 1. 1当量倍が好 ましい。 [0073] As the base, organic bases such as triethylamine, pyridine, 4-N, N dimethylaminopyridine (DMA P) can be used. The amount used is preferably 1 to 1.1 equivalent times the amount of SC.
[0074] 反応溶媒としては、トルエン、キシレン、ェチルベンゼン及びクメン等の炭素原子数  [0074] Examples of the reaction solvent include the number of carbon atoms such as toluene, xylene, ethylbenzene, and cumene.
1な!/、し 5アルキルベンゼン類が好まし!/、。  1! /, And 5 alkyl benzenes are preferred! /, ...
反応温度は— 20ないし 100°Cが好ましぐ特には 0ないし 80°Cが好ましい。 反応終了後濃縮すると、褐色固体が得られ、この粗物を再結晶するかシリカゲルを 用いてカラムクロマトグラフィーで精製することにより目的のシクロへキサジェン系ォキ シムスルホネート化合物(SCHC)が製造される。  The reaction temperature is preferably -20 to 100 ° C, particularly 0 to 80 ° C. Upon completion of the reaction, concentration yields a brown solid, which is then recrystallized or purified by column chromatography using silica gel to produce the desired cyclohexadiene oxime sulfonate compound (SCHC). .
上記各反応は、バッチ式又は流通式で行うことが出来、又常圧でも加圧でも行うこ と力 Sできる。  Each of the above reactions can be carried out batchwise or flow-through, and can be carried out at normal pressure or under pressure.
[0075] 本明細書中、「n」はノルマルを、「i」はイソを、「s」はセカンダリーを、「t」はターシャリ 一を、 「c」はシクロを、 「o」はオルトを、 「m」はメタを、 「p」はパラを、 「Me」はメチル基 を、「Et」はェチル基を、「Pr」はプロピル基を、それぞれ表す。  [0075] In this specification, "n" is normal, "i" is iso, "s" is secondary, "t" is tertiary, "c" is cyclo, "o" is ortho. , “M” represents meta, “p” represents para, “Me” represents a methyl group, “Et” represents an ethyl group, and “Pr” represents a propyl group.
実施例  Example
[0076] 以下に実施例をあげ、本発明を更に詳しく説明するが、本発明はこれらに限定され るものではない。  [0076] Hereinafter, the present invention will be described in more detail with reference to examples, but the present invention is not limited thereto.
実施例に於ける各物性の測定装置及び条件は以下のとおりである。  The measuring device and conditions for each physical property in the examples are as follows.
[1] [質量分析 (MASS) ]  [1] [Mass Spectrometry (MASS)]
機種: LX— 1000 (日本電子 (株)製)  Model: LX—1000 (manufactured by JEOL Ltd.)
検出法:イオン化法: DEP (EI+) m/z = 50な!/、し 1000 [2] [:H NMR] Detection method: Ionization method: DEP (EI +) m / z = 50! /, 1000 [2] [ : H NMR]
機種: 装置: JNM— LA400型 FT— NMR system (日本電子(株)製) 測定溶媒: DMSO— d  Model: Equipment: JNM—LA400 type FT—NMR system (manufactured by JEOL Ltd.) Measurement solvent: DMSO—d
6  6
[3] [13C NMR] [3] [ 13 C NMR]
機種: 装置: JNM— LA400型 FT— NMR system (日本電子(株)製) 測定溶媒: DMSO— d  Model: Equipment: JNM—LA400 type FT—NMR system (manufactured by JEOL Ltd.) Measurement solvent: DMSO—d
6  6
[4] [融点(mp. ) ]  [4] [Melting point (mp.)]
測定機器: 自動融点測定装置、 FP62 (メトラー トレド (株)製)  Measuring instrument: Automatic melting point measuring device, FP62 (Metler Toledo Co., Ltd.)
[5] UV— Visスペクトル [5] UV—Vis spectrum
装置: UV—VIS— NIR SCANNING SPECTROPHOTOMETER (自記分 光光度計) ( (株)島津製作所製)  Equipment: UV—VIS—NIR SCANNING SPECTROPHOTOMETER (Self-recorded spectrophotometer) (manufactured by Shimadzu Corporation)
[6]紫外線照射装置 [6] UV irradiation equipment
機種: PLA600FA (キャノン(株)製)  Model: PLA600FA (Canon Co., Ltd.)
[7]干渉式膜厚計 [7] Interferometric film thickness meter
機種; F20— EXR (フィルメトリタス(株)製)  Model: F20— EXR (Filmetritas Co., Ltd.)
[実施例 1] [HDCCの合成] [Example 1] [Synthesis of HDCC]
[化 17] [Chemical 17]
Figure imgf000047_0001
lOOmL四つ口反応フラスコに NaOH8. 4g (200mmol)とメタノーノレ 42gを仕込み 、加温して溶解させた。続いて 55°Cで 2, 6—ジクロロフエ二ルァセトニトリル(2, 6 - DCPA) 11. 2g (60mmol)を添カロした後、続いてニトロベンゼン(ΝΒ) 6· 15g (50m mol)を滴下した。更に 55°Cで 2時間攪拌した後、濃縮し溶媒を留去した。残渣に水 50mLと酢酸ェチル 50mLを加えて溶解させてから氷冷し、続いて酢酸 18gを滴下し 酸性にした。固形物が生成したので濾別、酢酸ェチルと水で洗浄した後、濾液の有 機層と水層を分液した。有機層を濃縮すると油状物 13. lgが得られた。この粗物を シリカゲル 140gを用いてカラムクロマトグラフィー(酢酸ェチル /ヘプタン = l/3〜 1/1)による精製をした後、酢酸ェチルから再結晶させることにより黄色結晶 6.52g (収率 44.8%)を得た。
Figure imgf000047_0001
A lOOmL four-necked reaction flask was charged with 8.4 g (200 mmol) of NaOH and 42 g of methanol and heated to dissolve. Subsequently, after adding 11.2 g (60 mmol) of 2,6-dichlorophenylacetonitrile (2, 6-DCPA) at 55 ° C., 6.15 g (50 mmol) of nitrobenzene (ΝΒ) was added dropwise. The mixture was further stirred at 55 ° C for 2 hours and then concentrated to distill off the solvent. The residue was dissolved by adding 50 mL of water and 50 mL of ethyl acetate, and then ice-cooled. Then, 18 g of acetic acid was added dropwise to make it acidic. Since a solid was formed, it was separated by filtration and washed with ethyl acetate and water, and then the organic layer and aqueous layer of the filtrate were separated. Concentration of the organic layer gave 13. lg of oil. This crude After purification by column chromatography (ethyl acetate / heptane = 1/3 to 1/1) using 140 g of silica gel, recrystallization from ethyl acetate gave 6.52 g (yield 44.8%) of yellow crystals.
この結晶は以下の分析結果から、(4ーヒドロキシイミノシクロへキサ 2, 5 ジェチ リデン) 2, 6 ジクロロフエ二ルァセトニトリル(HDCC)であることを確認した。  This crystal was confirmed to be (4-hydroxyiminocyclohexa 2,5 dimethylidene) 2,6 dichlorophenyl nitrile (HDCC) from the following analysis results.
— NMRから 2種類の異性体混合物(1対 1)であることを確認した。  — NMR confirmed that it was a mixture of two isomers (one to one).
MASS(FAB, m/e(%)): 291.96 ([M + H]+, 39), 289.97(46), 23 9.06(79), 237.06(72), 190.20(100), 177.20(87) MASS (FAB, m / e (%)): 291.96 ([M + H] +, 39), 289.97 (46), 23 9.06 (79), 237.06 (72), 190.20 (100), 177.20 (87)
:H NMR(DMSO-d, δ ppm) : 6.35(d, .1=10.1Hz, 0.5H) , 6.43 ( : H NMR (DMSO-d, δ ppm): 6.35 (d, .1 = 10.1Hz, 0.5H), 6.43 (
6  6
dd, J =1.83Hz, J =10.08Hz, 0.5H), 6.70 (d, J = 9.78Hz, 0.5dd, J = 1.83Hz, J = 10.08Hz, 0.5H), 6.70 (d, J = 9.78Hz, 0.5
1 2 1 2
H), 6.91 (dd, J =1.83Hz, J =9.32Hz, 0.5H) , 7.27(dd, J =1.8  H), 6.91 (dd, J = 1.83Hz, J = 9.32Hz, 0.5H), 7.27 (dd, J = 1.8
1 2 1 1 2 1
3Hz, J2=10.08Hz, 1H), 7.36 (dd, = 1.07Hz, ] =7.63Hz, 1H), 7.39(dd, J =1.83Hz, J =9.77Hz, 1H), 7.44 (d, J = 0.54Hz, 1H 3Hz, J 2 = 10.08Hz, 1H), 7.36 (dd, = 1.07Hz,] = 7.63Hz, 1H), 7.39 (dd, J = 1.83Hz, J = 9.77Hz, 1H), 7.44 (d, J = 0.54Hz, 1H
1 2  1 2
), 7.46(t, J=l.07Hz, 1H), 7.48 (s, 1H)  ), 7.46 (t, J = l.07Hz, 1H), 7.48 (s, 1H)
13  13
C NMR(DMSO-d , δ ppm) : 107.01, 107.04, 116.30, 116.3  C NMR (DMSO-d, δ ppm): 107.01, 107.04, 116.30, 116.3
6  6
6, 119.58, 119.79, 127.51, 128.09, 128.31, 128.54, 129 .69, 129.96, 130.00, 130.20, 131.41, 135.92, 135.98, 1 45.03, 145.06, 150.64, 150.72.  6, 119.58, 119.79, 127.51, 128.09, 128.31, 128.54, 129.69, 129.96, 130.00, 130.20, 131.41, 135.92, 135.98, 1 45.03, 145.06, 150.64, 150.72.
mp.176なぃし177。。 mp.176 .
[実施例 2] [TCDCの合成] [Example 2] [Synthesis of TCDC]
[化 18]
Figure imgf000048_0001
[Chemical 18]
Figure imgf000048_0001
HDCC p-TSC  HDCC p-TSC
TCDC 以下黄色蛍光灯下で操作を行った。  The operation was performed under a yellow fluorescent lamp below TCDC.
50mL四つ口反応フラスコに HDCCl.0g(3.44mmol)とトルエン 15mLを仕込 み、 17°Cでマグネチックスターラー攪拌下に p—トルエンスルホユルク口ライド 0· 66g (3.44mmol)を添加すると、赤色沈殿が生成した。そのまま攪拌下に、 4 ジメチノレ アミノビリジン(DMAP)O.63g(5.16mmol)を滴下した。 白濁スラリーとなり攪拌が 悪くなつたため、トルエン ImLを添加した。 2時間攪拌後、クロ口ホルムで反応液を洗 い出しながらナスフラスコに移し、続いて 40°Cで濃縮すると、褐色固体が 2· 59g得ら 1 Charge a 50 mL four-necked reaction flask with HDCCl.0g (3.44 mmol) and 15 mL of toluene, and stir the magnetic stirrer at 17 ° C. When (3.44 mmol) was added, a red precipitate formed. While stirring as it was, 4 dimethylolaminoviridine (DMAP) O.63 g (5.16 mmol) was added dropwise. Since it became a cloudy slurry and stirring became worse, ImL of toluene was added. After stirring for 2 hours, transfer the reaction mixture to a round bottom flask while washing the reaction mixture with chloroform, and concentrate at 40 ° C to obtain 2.59 g of a brown solid.
この粗物をシリカゲル 60gを用いてカラムクロマトグラフィー(へキサン/クロ口ホル ム =1/;!〜 2/3〜1/2〜0/1)による精製をした後、留分を 40°Cで濃縮した後 1 7°Cで 2時間減圧乾燥すると、アモルファス固体が 1· 55g (収率 100%)が得られた。 この固体は、液体カラムクロマトグラフィーでの分析により、純度は 98.8%であり、又 以下の分析結果から、(4— p—トルエンスルホニルォキシイミノーシクロへキサ—2, 5 ージェチリデン) 2, 6 ジクロ口フエ二ルァセトニトリル (TCDC)であることを確認し た。  This crude product was purified by column chromatography (hexane / chloroform = 1 / ;! ~ 2/3 ~ 1/2 ~ 0/1) using 60 g of silica gel, and then the fraction was purified at 40 ° C. After concentrating with, and dried under reduced pressure at 17 ° C for 2 hours, 1.555 g (100% yield) of amorphous solid was obtained. This solid had a purity of 98.8% according to analysis by liquid column chromatography. From the following analysis results, (4-p-toluenesulfonyloxyiminocyclohexa-2,5-gertylidene) 2,6 dichloro It was confirmed that it was oral phenylacetonitrile (TCDC).
:H NMRから 2種類の異性体混合物(1対 1)であることを確認した。 : H NMR confirmed that it was a mixture of two isomers (1 to 1).
MASS(FAB, m/e(%)) :469 ([M + Na + H]+, 71), 467 (100), 44 7 ([M + H]+, 30), 445 (41), 413 (9) MASS (FAB, m / e (%)): 469 ([M + Na + H] + , 71), 467 (100), 44 7 ([M + H] +, 30), 445 (41), 413 (9)
:H NMR(DMSO-d, δ ppm): 2.46(s, 3H) , 6.86 (dd, J =9.99Hz : H NMR (DMSO-d, δ ppm): 2.46 (s, 3H), 6.86 (dd, J = 9.99Hz
6 1  6 1
, J =16.2Hz, 0.5H), 7.12(dd, =9.99Hz, J =16.2Hz, 0.5H ), 7.26(s, 0.5H), 7.32— 7.52(m, 7.5H) , 7.89 (d, J = 8.37Hz , 2H)  , J = 16.2Hz, 0.5H), 7.12 (dd, = 9.99Hz, J = 16.2Hz, 0.5H), 7.26 (s, 0.5H), 7.32—7.52 (m, 7.5H), 7.89 (d, J = 8.37Hz, 2H)
13C NMR(DMSO-d , δ ppm): 21.842, 111.638, 115.415, 119. 13 C NMR (DMSO-d, δ ppm): 21.842, 111.638, 115.415, 119.
6  6
553, 111.976, 128.192, 128.546, 128.587, 128.892, 128.9 33, 129.673, 129.969, 130.710, 131.689, 131.738, 131.79 6, 132.553, 135.474, 135.531, 143.446, 145.552, 153.978 , 154.043.  553, 111.976, 128.192, 128.546, 128.587, 128.892, 128.9 33, 129.673, 129.969, 130.710, 131.689, 131.738, 131.79 6, 132.553, 135.474, 135.531, 143.446, 145.552, 153.978, 154.043.
[実施例 3]PCDCの合成  [Example 3] Synthesis of PCDC
[化 19]
Figure imgf000050_0001
[Chemical 19]
Figure imgf000050_0001
HDCC ""PSC PCDC 以下黄色蛍光灯下で操作を行った。 HDCC "" PSC PCDC and below were operated under a yellow fluorescent lamp.
50mL四つ口反応フラスコに HDCC3. Og(10.3mmol)とトルエン 25mLを仕込 み、 10°Cでマグネチックスターラー攪拌下に n—プロピルスルホユルク口ライド 1· 47g (10.3mmol)を滴下し、スラリーが生成したので、再びトルエン 20mLを添加した。 2 0°Cに加温してから攪拌下に、 4— N, N—ジメチルァミノピリジン(DMAP)l.89g( 15.5mmol)を滴下した。一旦スラリーが薄くなつた後、発熱(20ないし 24°C)しなが らスラリーが濃くなり粒状物が生成した。そのまま攪拌を継続すると粒状物は小さくな り、 2時間 30分後攪拌を停止させた。反応液を濃縮すると、固形物が 6.73g得られ た。  In a 50 mL four-necked reaction flask, charge HDCC3.Og (10.3 mmol) and 25 mL of toluene, and add dropwise n-propylsulfurolide ride · 47 g (10.3 mmol) under magnetic stirring at 10 ° C. As a result, 20 mL of toluene was added again. 4-N, N-dimethylaminopyridine (DMAP) l.89 g (15.5 mmol) was added dropwise with stirring after heating to 20 ° C. Once the slurry had thinned, the slurry became thicker while generating heat (20 to 24 ° C), and particulate matter was formed. When stirring was continued as it was, the granular material became smaller, and stirring was stopped after 2 hours and 30 minutes. The reaction solution was concentrated to obtain 6.73 g of a solid.
この粗物をシリカゲル 100gを用いてカラムクロマトグラフィー(へキサン/クロ口ホル ム =1/;!〜 2/3〜1/2〜0/1)による精製し、留分を 40°Cで濃縮した後 1時間減 圧乾燥すると、二次元 TLCでワンスポットの赤褐色固体が 3.72g (収率 91%)が得ら 1  This crude product was purified by column chromatography (hexane / chloroform = 1 / ;! ~ 2/3 ~ 1/2 ~ 0/1) using 100 g of silica gel, and the fraction was concentrated at 40 ° C. After drying for 1 hour under reduced pressure, 3.72 g (yield 91%) of one-spot reddish brown solid was obtained by two-dimensional TLC.
この固体は以下の分析結果から、(4— n—プロピルスルホニルォキシイミノーシクロ へキサ— 2, 5—ジェチリデン)—2, 6—ジクロロフエ二ルァセトニトリル(PCDC)であ ることを確言忍した。  From the results of the following analysis, it was confirmed that this solid was (4-n-propylsulfonyloxyiminocyclohexa-2,5-diethylidene) -2,6-dichlorophenylacetonitrile (PCDC).
:H NMRから 2種類の異性体混合物(0.4対 0.6)であることを確認した。 : H NMR confirmed a mixture of two isomers (0.4 vs. 0.6).
:H NMR(DMSO-d, δ ppm): 1.10(t, J = 7.29Hz, 3H) , 1.89— 1.99 : H NMR (DMSO-d, δ ppm): 1.10 (t, J = 7.29Hz, 3H), 1.89— 1.99
6  6
(m, 2H), 3.35-3.42 (m, 2H) , 6.55(t, J = 8. 10Hz, 1H), 6.78 (dd , J =1.89Hz, J =10.3Hz, 0.4H), 6.98 (dd, J =1.89Hz, J =10 (m, 2H), 3.35-3.42 (m, 2H), 6.55 (t, J = 8. 10Hz, 1H), 6.78 (dd, J = 1.89Hz, J = 10.3Hz, 0.4H), 6.98 (dd, J = 1.89Hz, J = 10
1 2 1 21 2 1 2
.3Hz, 0.6H), 7.16 (dd, J =1.89Hz, J =10.3Hz, 0.6H) , 7.2 .3Hz, 0.6H), 7.16 (dd, J = 1.89Hz, J = 10.3Hz, 0.6H), 7.2
1 2  1 2
7(s, 0.4H), 7.36-7.62(m, 4H)  7 (s, 0.4H), 7.36-7.62 (m, 4H)
13  13
C NMR(DMSO-d , δ ppm): 12.890, 17.152, 51.067, 51.116  C NMR (DMSO-d, δ ppm): 12.890, 17.152, 51.067, 51.116
6  6
112.140, 115.332, 119.389, 119.619, 128.225, 128.27 4, 128. 554, 128. 587, 130. 348, 131. 080, 131. 812, 131. 870 , 132. 890, 135. 400, 135. 441 , 143. 315, 143. 339, 154. 26 [0080] [実施例 4] 光酸発生剤の露光,加熱による着色性評価 112.140, 115.332, 119.389, 119.619, 128.225, 128.27 4, 128. 554, 128. 587, 130. 348, 131. 080, 131. 812, 131. 870, 132. 890, 135. 400, 135. 441, 143. 315, 143. 339, 154. 26 [ [Example 4] Evaluation of colorability of photoacid generator by exposure and heating
50mLのナス型フラスコに VP8000 (日本曹達(株)製、成分はポリビュルフエノー ルである。重量平均分子量 8000 (ポリスチレン換算))を 5g、実施例 2において合成 した TCDCを 0. 25g、界面活性剤としてメガファック R— 30 (大日本インキ化学工業( 株)製)を 0. 012g入れ、溶媒として 4 ヒドロキシ一 4 メチル 2 ペンタノンを 30g 入れ、室温で攪拌した。反応溶液中に不溶物は見られず、均一な溶液であった。こ の組成物を 0· 2 H mの PTFE (ポリテトラフルォロエチレン)製フィルターを用いて濾 過し、組成物をガラス基板上にスピンコーターを用いて塗布した。 110°Cで 1分間、ホ ットプレート上で焼成 (ソフトベータ)して、膜厚 1. 02 ίηの塗膜 (干渉式膜厚計によ り測定)を形成した。  In a 50 mL eggplant-shaped flask, VP8000 (manufactured by Nippon Soda Co., Ltd., the component is polybutanol. Weight average molecular weight 8000 (polystyrene equivalent)) 5 g, TCDC synthesized in Example 2 0.25 g, interface As an activator, Megafac R-30 (Dainippon Ink Chemical Co., Ltd.) (0.012 g) was added, and 4 hydroxy-4-methyl-2-pentanone (30 g) was added as a solvent and stirred at room temperature. No insoluble matter was found in the reaction solution, and the solution was uniform. The composition was filtered using a 0.2 Hm PTFE (polytetrafluoroethylene) filter, and the composition was applied onto a glass substrate using a spin coater. The film was baked on a hot plate (soft beta) at 110 ° C for 1 minute to form a coating film with a thickness of 1.02 ίη (measured with an interference film thickness meter).
この塗膜に紫外線照射装置により、 365nmにおける照射量が 600mj/cm2である 紫外線を照射した。ついで 120°Cで 1分間、ホットプレート上で PEBを行った。その後 200°Cで 5分間、ホットプレート上でポストベータを行い、このレジストが成膜されたガ ラス基板の透過率 (400nmにおける透過率)を分光光度計により測定した。 This coating film was irradiated with ultraviolet rays having an irradiation dose of 600 mj / cm 2 at 365 nm by an ultraviolet irradiation device. Subsequently, PEB was performed on a hot plate at 120 ° C for 1 minute. Thereafter, post-beta was performed on a hot plate at 200 ° C. for 5 minutes, and the transmittance (transmittance at 400 nm) of the glass substrate on which the resist was formed was measured with a spectrophotometer.
[0081] [実施例 5] 光酸発生剤の露光,加熱による着色性評価 [0081] [Example 5] Evaluation of colorability of photoacid generator by exposure and heating
50mLのナス型フラスコに VP8000 (日本曹達(株)製、成分はポリビュルフエノー ルである。重量平均分子量 8000 (ポリスチレン換算))を 5g、実施例 3において合成 した PCDCを 0. 25g、界面活性剤としてメガファック R— 30 (大日本インキ化学工業( 株)製)を 0. 012g入れ、溶媒として 4 ヒドロキシ一 4 メチル 2 ペンタノンを 30g 入れ、室温で攪拌した。反応溶液中に不溶物は見られず、均一な溶液であった。こ の組成物を 0. 2 mの PTFE製フィルターを用いて濾過し、組成物をガラス基板上 にスピンコーターを用いて塗布した。 110°Cで 1分間、ホットプレート上で焼成(ソフト ベータ)して、膜厚 1. 02 ^ mの塗膜 (干渉式膜厚計により測定)を形成した。  In a 50 mL eggplant-shaped flask, 5 g of VP8000 (manufactured by Nippon Soda Co., Ltd., component polypolyphenol. Weight average molecular weight 8000 (polystyrene equivalent)), 0.25 g of PCDC synthesized in Example 3, interface As an activator, Megafac R-30 (Dainippon Ink Chemical Co., Ltd.) (0.012 g) was added, and 4 hydroxy-4-methyl-2-pentanone (30 g) was added as a solvent and stirred at room temperature. No insoluble matter was found in the reaction solution, and the solution was uniform. The composition was filtered using a 0.2 m PTFE filter, and the composition was applied onto a glass substrate using a spin coater. The film was baked on a hot plate at 110 ° C for 1 minute (soft beta) to form a coating film with a thickness of 1.02 ^ m (measured with an interference film thickness meter).
この塗膜に紫外線照射装置により、 365nmにおける照射量が 600mj/cm2である 紫外線を照射した。ついで 120°Cで 1分間、ホットプレート上で PEBを行った。その後 200°Cで 5分間、ホットプレート上でポストベータを行い、このレジストが成膜されたガ ラス基板の透過率 (400nmにおける透過率)を分光光度計により測定した。 This coating film was irradiated with ultraviolet rays having an irradiation dose of 600 mj / cm 2 at 365 nm by an ultraviolet irradiation device. Subsequently, PEB was performed on a hot plate at 120 ° C for 1 minute. After that, post-beta was performed on a hot plate at 200 ° C for 5 minutes, and the resist was deposited on the film. The transmittance of the glass substrate (transmittance at 400 nm) was measured with a spectrophotometer.
[0082] [実施例 6] [Example 6]
50mLのナス型フラスコにマルカーリンカー CHM (丸善石油化学(株)製、成分は p ビュルフエノール/メタクリル酸 2 ヒドロキシェチル = 50質量部 /50質量部の割 合からなる重合体である。重量平均分子量 10000 (ポリスチレン換算))を 5g、実施 例 3において合成した PCDCを 0. 25g、界面活性剤としてメガファック R— 30 (大日 本インキ化学工業 (株)製)を 0· 012g入れ、溶媒として 4 ヒドロキシ一 4 メチノレ一 2 ペンタノンを 30g入れ、室温で攪拌した。反応溶液中に不溶物は見られず、均一 な溶液であった。この組成物を 0. 2 mの PTFE製フィルターを用いて濾過し、組成 物をガラス基板上にスピンコーターを用いて塗布した。 110°Cで 1分間、ホットプレー ト上で焼成 (ソフトベータ)して、膜厚 1. 02 ίηの塗膜 (干渉式膜厚計により測定)を 形成した。  Marker Linker CHM (manufactured by Maruzen Petrochemical Co., Ltd., a component in a 50 mL eggplant-shaped flask, the component is a polymer consisting of a ratio of p-Buhlphenol / hydroxyethyl methacrylate = 50 parts by mass / 50 parts by mass. 5 g of average molecular weight 10000 (polystyrene equivalent)), 0.25 g of PCDC synthesized in Example 3, and Mega-F R-30 (manufactured by Dainippon Ink & Chemicals, Inc.) as a surfactant are put in 0 · 012 g. As a solvent, 30 g of 4-hydroxy-1,4-methylol-2-pentanone was added and stirred at room temperature. There was no insoluble material in the reaction solution, and the solution was uniform. The composition was filtered using a 0.2 m PTFE filter, and the composition was applied onto a glass substrate using a spin coater. The film was baked (soft beta) on a hot plate at 110 ° C for 1 minute to form a coating film with a thickness of 1.02 ίη (measured with an interference film thickness meter).
この塗膜に紫外線照射装置により、 365nmにおける照射量が 600mj/cm2である 紫外線を照射した。ついで 120°Cで 1分間、ホットプレート上で PEBを行った。その後 200°Cで 5分間、ホットプレート上でポストベータを行い、このレジストが成膜されたガ ラス基板の透過率 (400nmにおける透過率)を分光光度計により測定した。 This coating film was irradiated with ultraviolet rays having an irradiation dose of 600 mj / cm 2 at 365 nm by an ultraviolet irradiation device. Subsequently, PEB was performed on a hot plate at 120 ° C for 1 minute. Thereafter, post-beta was performed on a hot plate at 200 ° C. for 5 minutes, and the transmittance (transmittance at 400 nm) of the glass substrate on which the resist was formed was measured with a spectrophotometer.
[0083] [比較例 1] 光酸発生剤の露光,加熱による着色性評価 [0083] [Comparative Example 1] Evaluation of colorability of photoacid generator by exposure and heating
50mLのナス型フラスコに VP8000 (日本曹達(株)製、成分はポリビュルフエノー ルである。重量平均分子量 8000 (ポリスチレン換算))を 5g、 CGI1325 (チバスぺシ ャルティケミカルズ (株)製、チォフェンォキシムスルホネート系光酸発生剤)を 0. 25g 、界面活性剤としてメガファック R— 30 (大日本インキ化学工業 (株)製)を 0. 012g入 れ、溶媒として 4ーヒドロキシー4ーメチルー 2 ペンタノンを 30g入れ、室温で攪拌し た。反応溶液中に不溶物は見られず、均一な溶液であった。この組成物を 0. 2 m の PTFE製フィルターを用いて濾過し、組成物をガラス基板上にスピンコーターを用 いて塗布した。 110°Cで 1分間、ホットプレート上で焼成(ソフトベータ)して、膜厚 1. 02 ,i mの塗膜 (干渉式膜厚計により測定)を形成した。  In a 50 mL eggplant-shaped flask, VP8000 (manufactured by Nippon Soda Co., Ltd., the component is polybutanol. Weight average molecular weight 8000 (polystyrene conversion)) 5 g, CGI1325 (manufactured by Ciba Specialty Chemicals Co., Ltd.) 0.25 g of thiophenoxime sulfonate photoacid generator) and 0.012 g of MegaFac R-30 (Dainippon Ink Chemical Co., Ltd.) as the surfactant were added, and 4-hydroxy-4-methyl-2 as the solvent. 30 g of pentanone was added and stirred at room temperature. No insoluble matter was found in the reaction solution, and the solution was uniform. The composition was filtered using a 0.2 m PTFE filter, and the composition was applied onto a glass substrate using a spin coater. The film was baked on a hot plate at 110 ° C for 1 minute (soft beta) to form a coating film with a thickness of 1.02 and im (measured with an interference film thickness meter).
この塗膜に紫外線照射装置により、 365nmにおける照射量が 600mj/cm2である 紫外線を照射した。ついで 120°Cで 1分間、ホットプレート上で PEBを行った。その後 200°Cで 5分間、ホットプレート上でポストベータを行い、このレジストが成膜されたガ ラス基板の透過率 (400nmにおける透過率)を分光光度計により測定した。 This coating film was irradiated with ultraviolet rays having an irradiation dose of 600 mj / cm 2 at 365 nm by an ultraviolet irradiation device. Subsequently, PEB was performed on a hot plate at 120 ° C for 1 minute. afterwards Post-beta was performed on a hot plate at 200 ° C for 5 minutes, and the transmittance (transmittance at 400 nm) of the glass substrate on which this resist was formed was measured with a spectrophotometer.
[化 20]
Figure imgf000053_0001
[Chemical 20]
Figure imgf000053_0001
CG1 1325  CG1 1325
[0084] [比較例 2] 光酸発生剤の露光,加熱による着色性評価 [0084] [Comparative Example 2] Evaluation of colorability of photoacid generator by exposure and heating
50mLのナス型フラスコに VP8000 (日本曹達(株)製、成分はポリビュルフエノー ルである。重量平均分子量 8000 (ポリスチレン換算))を 5g、 CGI1397 (チバスぺシ ャルティケミカルズ (株)製、チォフェンォキシムスルホネート系光酸発生剤)を 0. 25g 、界面活性剤としてメガファック R— 30 (大日本インキ化学工業 (株)製)を 0. 012g入 れ、溶媒として 4ーヒドロキシー4ーメチルー 2—ペンタノンを 30g入れ、室温で攪拌し た。反応溶液中に不溶物は見られず、均一な溶液であった。この組成物を 0. 2 m の PTFE製フィルターを用いて濾過し、組成物をガラス基板上にスピンコーターを用 いて塗布した。 110°Cで 1分間、ホットプレート上で焼成(ソフトベータ)して、膜厚 1. 02 ,i mの塗膜 (干渉式膜厚計により測定)を形成した。  In a 50 mL eggplant-shaped flask, VP8000 (manufactured by Nippon Soda Co., Ltd., the component is polybutanol. Weight average molecular weight 8000 (polystyrene conversion)) 5 g, CGI1397 (manufactured by Ciba Specialty Chemicals Co., Ltd.) 0.25 g of thiophenoxime sulfonate photoacid generator) and 0.012 g of MegaFac R-30 (Dainippon Ink Chemical Co., Ltd.) as the surfactant were added, and 4-hydroxy-4-methyl-2 as the solvent. —Pentanone (30 g) was added and stirred at room temperature. No insoluble matter was found in the reaction solution, and the solution was uniform. The composition was filtered using a 0.2 m PTFE filter, and the composition was applied onto a glass substrate using a spin coater. The film was baked on a hot plate at 110 ° C for 1 minute (soft beta) to form a coating film with a thickness of 1.02 and im (measured with an interference film thickness meter).
この塗膜に紫外線照射装置により、 365nmにおける照射量が 600mj/cm2である 紫外線を照射した。ついで 120°Cで 1分間、ホットプレート上で PEBを行った。その後 200°Cで 5分間、ホットプレート上でポストベータを行い、このレジストが成膜されたガ ラス基板の透過率 (400nmにおける透過率)を分光光度計により測定した。 This coating film was irradiated with ultraviolet rays having an irradiation dose of 600 mj / cm 2 at 365 nm by an ultraviolet irradiation device. Subsequently, PEB was performed on a hot plate at 120 ° C for 1 minute. Thereafter, post-beta was performed on a hot plate at 200 ° C. for 5 minutes, and the transmittance (transmittance at 400 nm) of the glass substrate on which the resist was formed was measured with a spectrophotometer.
[化 21]
Figure imgf000053_0002
[Chemical 21]
Figure imgf000053_0002
CG1 1397  CG1 1397
[0085] 実施例 4ないし 6及び比較例 1ないし 2で作製されたレジストの透過率の結果を表 1 に示す。 [表 1] [0085] Table 1 shows the transmittance results of the resists produced in Examples 4 to 6 and Comparative Examples 1 and 2. [table 1]
4 0 0 n mにおける透過率 Transmittance at 4 0 0 nm
実施例 4 9 1 %  Example 4 9 1%
実施例 5 8 3 %  Example 5 8 3%
実施例 6 8 8 %  Example 6 8 8%
比較例 1 7 2 %  Comparative Example 1 7 2%
比較例 2 4 2 % 表 1に示されるように、本発明のシクロへキサジェン系ォキシムスルホネート化合物 力 なる光酸発生剤を用いて作製されたレジスト(実施例 4ないし 6)は、特表 2002— 508774号公報に記載のチォフェンォキシムスルホネート化合物からなる光酸発生 剤を用いて作製されたレジスト(比較例 4ないし 6)よりも、ポストベータ後の透過率が 高ぐ本発明の光酸発生剤の方が、露光及び加熱による着色は小さいことが分かる。 次に、本発明の染料含有レジスト組成物を用いて、カラーフィルターを作製した際 の効果を示す。  Comparative Example 2 4 2% As shown in Table 1, the resist (Examples 4 to 6) prepared using the photoacid generator of the cyclohexagen-based oxime sulfonate compound of the present invention is shown in Table 2002. — Photoacid of the present invention having higher post-beta transmittance than a resist (Comparative Examples 4 to 6) prepared using a photoacid generator comprising a thiophenoxime sulfonate compound described in Japanese Patent No. 508774. It can be seen that the generator is less colored by exposure and heating. Next, the effect of producing a color filter using the dye-containing resist composition of the present invention will be shown.
[実施例 7] [Example 7]
50mLのナス型フラスコに VP8000 (日本曹達(株)製、成分はポリビュルフエノー ルである。重量平均分子量 8000 (ポリスチレン換算))を 1. 54g、染料式 [21]を 1. 9 g、溶媒としてプロピレングリコールモノメチルエーテルを 23· 756g入れ、室温で攪 拌した。反応溶液中に不溶物は見られず、均一な溶液であった。  In a 50 mL eggplant-shaped flask, VP8000 (manufactured by Nippon Soda Co., Ltd., the component is polybutanol. Weight average molecular weight 8000 (polystyrene equivalent)) is 1.54 g, dye formula [21] is 1.9 g, As a solvent, 23.756 g of propylene glycol monomethyl ether was added and stirred at room temperature. No insoluble matter was found in the reaction solution, and the solution was uniform.
その後架橋性化合物 Cymel 303 (日本サイテックインダストリーズ (株)製)を 0· 3 8g、実施例 2において合成した TCDCを 0· 2g、界面活性剤としてメガファック R— 3 0 (大日本インキ化学工業 (株)製)を 0. 013g加え、さらに室温で攪拌した。反応溶 液中に不溶物は見られず、均一な溶液であった。この組成物を 0. 2 111の PTFE製 フィルターを用いて濾過し、組成物をガラス基板上にスピンコーターを用いて塗布し た。 110°Cで 1分間、ホットプレート上で焼成(ソフトベータ)して、膜厚 1. 02 111の塗 膜 (干渉式膜厚計により測定)を形成した。  Thereafter, 0 · 38 g of the crosslinkable compound Cymel 303 (manufactured by Nippon Cytec Industries Co., Ltd.), 0 · 2 g of TCDC synthesized in Example 2, and MegaFac R— 3 0 as a surfactant (Dainippon Ink Chemical Co., Ltd.) 0.013 g) was added, and the mixture was further stirred at room temperature. No insoluble matter was found in the reaction solution, and the solution was uniform. This composition was filtered using a 0.2111 PTFE filter, and the composition was applied onto a glass substrate using a spin coater. Firing was performed on a hot plate at 110 ° C for 1 minute (soft beta) to form a coating film with a thickness of 1.02 111 (measured with an interference film thickness meter).
この塗膜に紫外線照射装置により、 365nmにおける照射量が 600mj/cm2である 紫外線を照射した。ついで 120°Cで 1分間、ホットプレート上で PEBを行った。その後 200°Cで 5分間、ホットプレート上でポストベータを行い、このレジストが成膜されたガ ラス基板の透過率 (400nmにおける透過率)を分光光度計により測定した。 This coating film was irradiated with ultraviolet rays having an irradiation dose of 600 mj / cm 2 at 365 nm by an ultraviolet irradiation device. Subsequently, PEB was performed on a hot plate at 120 ° C for 1 minute. After that, post-beta was performed on a hot plate at 200 ° C for 5 minutes, and the resist was deposited on the film. The transmittance of the glass substrate (transmittance at 400 nm) was measured with a spectrophotometer.
また、この組成物をアクリル付シリコン基板上にスピンコーターを用いて塗布した。 1 10°Cで 1分間、ホットプレート上で焼成(ソフトベータ)して、膜厚 1. 02 mの塗膜を 形成した。この塗膜に紫外線製照射装置により、 365nmにおける照射量が 600mJ /cm2である紫外線を照射した。ついで 120°Cで 1分間、ホットプレート上で PEBを 行った。その後干渉式膜厚計を用いて膜厚を測定した。 Moreover, this composition was apply | coated using the spin coater on the silicon substrate with an acryl. 1 Baked on a hot plate for 1 minute at 10 ° C (soft beta) to form a coating film with a thickness of 1.02 m. This coating film was irradiated with ultraviolet rays having an irradiation dose of 600 mJ / cm 2 at 365 nm by an ultraviolet irradiation device. Subsequently, PEB was performed on a hot plate at 120 ° C for 1 minute. Thereafter, the film thickness was measured using an interference type film thickness meter.
この膜を、現像液 NMD— 3 (東京応化工業 (株)製)を用いて 40秒間、室温で静止 現像を行い、再び干渉式膜厚計を用いて膜厚を測定した。  This film was statically developed at room temperature for 40 seconds using a developer NMD-3 (manufactured by Tokyo Ohka Kogyo Co., Ltd.), and the film thickness was measured again using an interference film thickness meter.
現像前後の膜厚を比較し、現像後の残膜率を計算した。  The film thickness before and after development was compared, and the remaining film ratio after development was calculated.
[比較例 3] [Comparative Example 3]
50mLのナス型フラスコに VP8000 (日本曹達(株)製、成分はポリビュルフエノー ルである。重量平均分子量 8000 (ポリスチレン換算))を 1. 54g、染料式 [21]を 1. 9 g、溶媒としてプロピレングリコールモノメチルエーテルを 23· 756g入れ、室温で攪 拌した。反応溶液中に不溶物は見られず、均一な溶液であった。  In a 50 mL eggplant-shaped flask, VP8000 (manufactured by Nippon Soda Co., Ltd., the component is polybutanol. Weight average molecular weight 8000 (polystyrene equivalent)) is 1.54 g, dye formula [21] is 1.9 g, As a solvent, 23.756 g of propylene glycol monomethyl ether was added and stirred at room temperature. No insoluble matter was found in the reaction solution, and the solution was uniform.
その後架橋性化合物 Cymel 303 (日本サイテックインダストリーズ (株)製)を 0· 3 8g、 CGI1397を 0. 2g、界面活性剤としてメガファック R— 30 (大日本インキ化学ェ 業 (株)製)を 0. 013g加え、さらに室温で攪拌した。反応溶液中に不溶物は見られ ず、均一な溶液であった。この組成物を 0. 2 mの PTFE製フィルターを用いて濾過 し、組成物をガラス基板上にスピンコーターを用いて塗布した。 110°Cで 1分間、ホッ トプレート上で焼成(ソフトベータ)して、膜厚 1. 02 πιの塗膜 (干渉式膜厚計により 測定)を形成した。  Then, 0 · 38g of cross-linkable compound Cymel 303 (Nippon Cytec Industries Co., Ltd.), 0.2g of CGI1397, and MegaFac R-30 (manufactured by Dainippon Ink & Chemicals, Inc.) as a surfactant are used. . 013 g was added and further stirred at room temperature. There was no insoluble matter in the reaction solution, and the solution was uniform. The composition was filtered using a 0.2 m PTFE filter, and the composition was applied onto a glass substrate using a spin coater. The film was baked (soft beta) on a hot plate at 110 ° C for 1 minute to form a coating film with a thickness of 1.02 πι (measured with an interference film thickness meter).
この塗膜に紫外線照射装置により、 365nmにおける照射量が 600mj/cm2である 紫外線を照射した。ついで 120°Cで 1分間、ホットプレート上で PEBを行った。その後 200°Cで 5分間、ホットプレート上でポストベータを行い、このレジストが成膜されたガ ラス基板の透過率 (400nmにおける透過率)を分光光度計により測定した。 This coating film was irradiated with ultraviolet rays having an irradiation dose of 600 mj / cm 2 at 365 nm by an ultraviolet irradiation device. Subsequently, PEB was performed on a hot plate at 120 ° C for 1 minute. Thereafter, post-beta was performed on a hot plate at 200 ° C. for 5 minutes, and the transmittance (transmittance at 400 nm) of the glass substrate on which the resist was formed was measured with a spectrophotometer.
また、この組成物をアクリル付シリコン基板上にスピンコーターを用いて塗布した。 1 10°Cで 1分間、ホットプレート上で焼成(ソフトベータ)して、膜厚 1. 02 mの塗膜を 形成した。この塗膜に紫外線照射装置により、 365nmにおける照射量が 300mj/c m2である紫外線を照射した。ついで 120°Cで 1分間、ホットプレート上で PEBを行つ た。その後干渉式膜厚計を用いて膜厚を測定した。 Moreover, this composition was apply | coated using the spin coater on the silicon substrate with an acryl. 1 Baked on a hot plate for 1 minute at 10 ° C (soft beta) to form a coating film with a thickness of 1.02 m. The UV irradiation device applied this coating film with a dose of 300mj / c at 365nm. Irradiated with ultraviolet rays of m 2 . Next, PEB was performed on a hot plate at 120 ° C for 1 minute. Thereafter, the film thickness was measured using an interference type film thickness meter.
この膜を、現像液 NMD— 3 (東京応化工業 (株)製)を用いて 30秒間、室温で静止 現像を行い、再び干渉式膜厚計を用いて膜厚を測定した。  This film was statically developed at room temperature for 30 seconds using a developer NMD-3 (manufactured by Tokyo Ohka Kogyo Co., Ltd.), and the film thickness was measured again using an interference film thickness meter.
現像前後の膜厚を比較し、現像後の残膜率を計算した。  The film thickness before and after development was compared, and the remaining film ratio after development was calculated.
実施例 7及び比較例 3で作製されたレジストの透過率を表 2に示す。  Table 2 shows the transmittance of the resists produced in Example 7 and Comparative Example 3.
[表 2]  [Table 2]
Figure imgf000056_0001
表 2に示されるように、本発明の染料含有レジスト組成物を用いて作製されたレジス ト(実施例 7)は、特表 2002— 508774号公報に記載のチォフェンォキシムスルホネ ート化合物を含む染料含有レジスト組成物用いて作製されたレジスト(比較例 3)より も、ポストベータ後の透過率が高ぐ本発明の染料含有レジスト組成物の方が、カラ 一フィルターに有効であることが分かる。
Figure imgf000056_0001
As shown in Table 2, the resist (Example 7) prepared using the dye-containing resist composition of the present invention is a thiophenoxime sulfonate compound described in JP-T-2002-508774. The dye-containing resist composition of the present invention, which has higher post-beta transmittance, is more effective for color filters than a resist prepared using a dye-containing resist composition containing I understand.
実施例 7及び比較例 3で作製されたカラーフィルターの残膜率を表 3に示す。  Table 3 shows the remaining film ratio of the color filters manufactured in Example 7 and Comparative Example 3.
[表 3]
Figure imgf000056_0002
表 3に示されるように、実施例 7で作製されたカラーフィルターの残膜率は、比較例 3で作製されたカラーフィルターの残膜率よりも高ぐ本発明の染料含有レジスト組成 物の方が、高感度であることが分かる。
[Table 3]
Figure imgf000056_0002
As shown in Table 3, the residual film ratio of the color filter prepared in Example 7 is higher than the residual film ratio of the color filter manufactured in Comparative Example 3. However, it turns out that it is highly sensitive.
産業上の利用可能性 Industrial applicability
カラーフィルターの薄膜化に対応し、所望の分光スペクトルを発現させるための染 料濃度の高レ、染料含有レジスト組成物を提供できる。  Corresponding to the thinning of the color filter, it is possible to provide a dye-containing resist composition having a high dye concentration for expressing a desired spectral spectrum.
また、従来の光酸発生剤で問題となっていた着色を抑制することにより高い分光ス トルの再現性、高い耐熱性、耐光性 一を提供する。 In addition, by suppressing the coloration that has been a problem with conventional photoacid generators, Toll reproducibility, high heat resistance, light resistance

Claims

請求の範囲 [1] 式 [1] Claim [1] Formula [1]
[化 1]  [Chemical 1]
Figure imgf000058_0001
Figure imgf000058_0001
(式中、
Figure imgf000058_0002
R°及び R7は、それぞれ独立して、水素原子、ハロゲン原子、 CN NO、炭素原子数 1ないし 10のアルキル基、炭素原子数 1ないし 5のアルコキシ基 、炭素原子数 1ないし 5のハロアルキル基又は炭素原子数 1ないし 5のハロアルコキ シ基を表し、
(Where
Figure imgf000058_0002
R ° and R 7 are each independently a hydrogen atom, a halogen atom, CN NO, an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, or a haloalkyl group having 1 to 5 carbon atoms. Or a haloalkoxy group having 1 to 5 carbon atoms,
R3は、水素原子、ハロゲン原子、ニトロ基、 CN基、炭素原子数 1ないし 10のアルキル 基、炭素原子数 1ないし 5のアルコキシ基、炭素原子数 1ないし 5のハロアルキル基又 は炭素原子数 1ないし 5のハロアルコキシ基を表し、 nが 2 3又は 4を表すとき、各々 の R3は互いに同一であっても又は互いに相異なっていてもよぐさらに、 R3が隣接す る場合には、隣接する 2つの R3は、— CH CH -CH O— — CH N (R8)— - CH CH CH -CH CH O— CH CH N (R CH CH CH CH -CH CH CH O— -CH CH CH N (R CH CH CH CH CH C H CH CH CH O—又は一 CH CH CH CH N (R8)—を形成することにより、 2つの R3のそれぞれが結合する炭素原子と共に 4員環、 5員環又は 6員環を形成してもよく R 3 represents a hydrogen atom, a halogen atom, a nitro group, a CN group, an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms, or the number of carbon atoms. When 1 represents a haloalkoxy group of 1 to 5 and n represents 2 3 or 4, each R 3 may be the same as or different from each other, and when R 3 is adjacent The two adjacent R 3 groups are — CH CH —CH O— — CH N (R 8 ) — — CH CH CH —CH CH O— CH CH N (R CH CH CH CH —CH CH CH O— — By forming CH CH CH N (R CH CH CH CH CH CH CH CH CH O— or one CH CH CH CH N (R 8 ) —, a four-membered ring with the carbon atom to which each of the two R 3 bonds is attached. , 5-membered ring or 6-membered ring may be formed
R4は、炭素原子数 1ないし 10のアルキル基、炭素原子数 1ないし 5のアルコキシ基、 炭素原子数 1ないし 5のハロアルキル基、炭素原子数 1ないし 5のハロアルコキシ基、R 4 is an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms, a haloalkoxy group having 1 to 5 carbon atoms,
Wで置換されて!/、てもよ!/、フエニル基、 Wで置換されて!/、てもよ!/、ナフチル基又は W で置換されて!/、てもよ!/、アントラニル基を表し、 Substituted with W! /, May! /, Phenyl group, substituted with W! /, May! /, Naphthyl group or substituted with W! /, May! /, Anthranyl group Represents
R8は、水素原子又は炭素原子数 1ないし 10のアルキル基を表し、 R 8 represents a hydrogen atom or an alkyl group having 1 to 10 carbon atoms,
Wは、ハロゲン原子、 CN NO、炭素原子数 1ないし 10のアルキル基、炭素原子数 1ないし 5のアルコキシ基、炭素原子数 1ないし 5のハロアルキル基又は炭素原子数 1 なレ、し 5のハロアルコキシ基を表し、 W is a halogen atom, CN NO, an alkyl group having 1 to 10 carbon atoms, or the number of carbon atoms An alkoxy group having 1 to 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms, or a haloalkoxy group having 1 carbon atom and 5 haloalkoxy groups,
nは、 1、 2、 3又は 4の整数を表す。 )  n represents an integer of 1, 2, 3 or 4. )
で表されるシクロへキサジェン系ォキシムスルホネート化合物からなる光酸発生剤を 含む染料含有レジスト組成物。  A dye-containing resist composition comprising a photoacid generator comprising a cyclohexagen-based oxime sulfonate compound represented by the formula:
[2] 前記 R5ないし R7力 全て水素原子であり、前記 R1及び R2が、それぞれ独立して、ハロ ゲン原子、 CN、 NO、炭素原子数 1ないし 10のアルキル基、炭素原子数 1ないし 5 のアルコキシ基、炭素原子数 1ないし 5のハロアルキル基又は炭素原子数 1ないし 5 のハロアルコキシ基である請求項 1に記載の染料含有レジスト組成物。 [2] The R 5 to R 7 forces are all hydrogen atoms, and R 1 and R 2 are each independently a halogen atom, CN, NO, an alkyl group having 1 to 10 carbon atoms, or a carbon atom number. The dye-containing resist composition according to claim 1, which is an alkoxy group having 1 to 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms, or a haloalkoxy group having 1 to 5 carbon atoms.
[3] 前記 R1及び R2が、ハロゲン原子である請求項 2に記載の染料含有レジスト組成物。 [3] The dye-containing resist composition according to [2], wherein R 1 and R 2 are halogen atoms.
[4] 前記ハロゲン原子が塩素原子である請求項 3に記載の染料含有レジスト組成物。 4. The dye-containing resist composition according to claim 3, wherein the halogen atom is a chlorine atom.
[5] 前記 R3が、水素原子である請求項 1ないし請求項 4のいずれ力、 1項に記載の染料含 有レジスト組成物。 5. The dye-containing resist composition according to any one of claims 1 to 4, wherein R 3 is a hydrogen atom.
[6] 前記式 [1]で表されるシクロへキサジェン系ォキシムスルホネート化合物からなる光 酸発生剤 (A)、樹脂 (B)、架橋性化合物 (C)、染料 (D)及び溶媒 (E)を含む染料含有 レジスト組成物。  [6] A photoacid generator (A), a resin (B), a crosslinkable compound (C), a dye (D), and a solvent (E) comprising a cyclohexadiene oxime sulfonate compound represented by the formula [1] And a dye-containing resist composition.
[7] 前記染料 (D)が、式 [2]  [7] The dye (D) has the formula [2]
[化 2]
Figure imgf000059_0001
[Chemical 2]
Figure imgf000059_0001
(式中、 R9ないし R12は、それぞれ独立して、水素原子又は有機基を表す。)で表され る陽イオン化合物を含有するものである請求項 6に記載の染料含有レジスト組成物。 7. The dye-containing resist composition according to claim 6, comprising a cationic compound represented by the formula: wherein R 9 to R 12 each independently represents a hydrogen atom or an organic group.
[8] 前記染料 (D)が、前記式 [2]で表される陽イオン化合物の対イオンとなる陰イオン化合 物を含有するものである請求項 7に記載の染料含有レジスト組成物。  [8] The dye-containing resist composition according to [7], wherein the dye (D) contains an anion compound which is a counter ion of the cationic compound represented by the formula [2].
[9] 前記陰イオン化合物が、フタロシアニン構造を有する化合物である請求項 8に記載の 染料含有レジスト組成物。  [9] The dye-containing resist composition according to [8], wherein the anionic compound is a compound having a phthalocyanine structure.
[10] 前記陰イオン化合物が、ピラゾールァゾ構造を有する化合物である請求項 8に記載 の染料含有レジスト組成物。 10. The anionic compound according to claim 8, wherein the anionic compound is a compound having a pyrazole azo structure. A dye-containing resist composition.
[11] 前記陰イオン化合物が、ピラゾールァゾ構造と金属錯体構造とを有する化合物であ る請求項 8に記載の染料含有レジスト組成物。 [11] The dye-containing resist composition according to [8], wherein the anionic compound is a compound having a pyrazole azo structure and a metal complex structure.
[12] 前記陰イオン化合物が、キサンテン構造を有する化合物である請求項 8に記載の染 料含有レジスト組成物。 12. The dye-containing resist composition according to claim 8, wherein the anionic compound is a compound having a xanthene structure.
[13] 請求項 1ないし 12のいずれ力、 1項に記載の染料含有レジスト組成物を、基板上に塗 布し、乾燥し、露光し、そして現像する工程を含むカラーフィルターの製造方法。  [13] A method for producing a color filter comprising the steps of applying the dye-containing resist composition according to any one of claims 1 to 12 on a substrate, drying, exposing and developing.
[14] 請求項 13の方法で製造されたカラーフィルターを含む液晶表示装置。 14. A liquid crystal display device comprising a color filter produced by the method of claim 13.
[15] 請求項 13の方法で製造されたカラーフィルターを含む LED (発光ダイオード)表示 装置。 15. An LED (light emitting diode) display device comprising a color filter manufactured by the method of claim 13.
[16] 請求項 13の方法で製造されたカラーフィルターを含む固体撮像素子。  [16] A solid-state imaging device comprising a color filter manufactured by the method of claim 13.
[17] 式 [3] [17] Equation [3]
[化 3]  [Chemical 3]
Figure imgf000060_0001
Figure imgf000060_0001
(式中、 R1及び R2は、それぞれ独立して、ハロゲン原子、 CN NO、炭素原子数 1な いし 10のアルキル基、炭素原子数 1ないし 5のアルコキシ基、炭素原子数 1ないし 5 のハロアルキル基又は炭素原子数 1ないし 5のハロアルコキシ基を表し、 (Wherein R 1 and R 2 are each independently a halogen atom, CN NO, an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, or Represents a haloalkyl group or a haloalkoxy group having 1 to 5 carbon atoms,
R3は、水素原子、ハロゲン原子、ニトロ基、 CN基、炭素原子数 1ないし 10のアルキル 基、炭素原子数 1ないし 5のアルコキシ基、炭素原子数 1ないし 5のハロアルキル基又 は炭素原子数 1ないし 5のハロアルコキシ基を表し、 nが 2 3又は 4を表すとき、各々 の R3は互いに同一であっても又は互いに相異なっていてもよぐさらに、 R3が隣接す る場合には、隣接する 2つの R3は、— CH CH -CH O— — CH N (R8)— - CH CH CH -CH CH O— CH CH N (R CH CH CH CH -CH CH CH O— -CH CH CH N (R8) CH CH CH CH CH C H CH CH CH O—又は一 CH CH CH CH N (R8)—を形成することにより、 2つの R3のそれぞれが結合する炭素原子と共に 4員環、 5員環又は 6員環を形成してもよく R 3 represents a hydrogen atom, a halogen atom, a nitro group, a CN group, an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms, or the number of carbon atoms. When 1 represents a haloalkoxy group of 1 to 5 and n represents 2 3 or 4, each R 3 may be the same as or different from each other, and when R 3 is adjacent The two adjacent R 3 groups are — CH CH —CH O— — CH N (R 8 ) — — CH CH CH —CH CH O— CH CH N (R CH CH CH CH —CH CH CH O— — CH CH CH N (R 8 ) CH CH CH CH CH C By forming H CH CH CH O— or one CH CH CH CH N (R 8 ) —, a 4-membered ring, 5-membered ring or 6-membered ring is formed with the carbon atom to which each of the two R 3 bonds. May
R4は、炭素原子数 1ないし 10のアルキル基、炭素原子数 1ないし 5のアルコキシ基、 炭素原子数 1ないし 5のハロアルキル基、炭素原子数 1ないし 5のハロアルコキシ基、R 4 is an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms, a haloalkoxy group having 1 to 5 carbon atoms,
Wで置換されて!/、てもよ!/、フエニル基、 Wで置換されて!/、てもよ!/、ナフチル基又は W で置換されて!/、てもよ!/、アントラニル基を表し、 Substituted with W! /, May! /, Phenyl group, substituted with W! /, May! /, Naphthyl group or substituted with W! /, May! /, Anthranyl group Represents
R8は、水素原子又は炭素原子数 1ないし 10のアルキル基を表し、 R 8 represents a hydrogen atom or an alkyl group having 1 to 10 carbon atoms,
Wは、ハロゲン原子、 CN、 NO、炭素原子数 1ないし 10のアルキル基、炭素原子 数 1ないし 5のアルコキシ基、炭素原子数 1ないし 5のハロアルキル基又は炭素原子 数 1ないし 5のハロアルコキシ基を表し、  W is a halogen atom, CN, NO, an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms, or a haloalkoxy group having 1 to 5 carbon atoms. Represents
nは、 1、 2、 3又は 4の整数を表す。 )  n represents an integer of 1, 2, 3 or 4. )
で表されるシクロへキサジェン系ォキシムスルホネート化合物。  A cyclohexadiene oxime sulfonate compound represented by the formula:
[18] 前記 R1及び R2が、それぞれ独立して、ハロゲン原子である請求項 17に記載のシクロ へキサジェン系ォキシムスルホネート化合物。 18. The cyclohexadiene oxime sulfonate compound according to claim 17, wherein R 1 and R 2 are each independently a halogen atom.
[19] 前記ハロゲン原子が塩素原子である請求項 18に記載のシクロへキサジェン系ォキ シムスルホネート化合物。  [19] The cyclohexadiene oxime sulfonate compound according to [18], wherein the halogen atom is a chlorine atom.
[20] 前記 R3が、水素原子である請求項 17ないし 19のいずれ力、 1項に記載のシクロへキ サジェン系ォキシムスルホネート化合物。 [20] The cyclohexacene oxime sulfonate compound according to any one of [17] to [19], wherein R 3 is a hydrogen atom.
[21] 式 [4]  [21] Equation [4]
[化 4]  [Chemical 4]
Figure imgf000061_0001
Figure imgf000061_0001
(式中、 R1及び R2は、それぞれ独立して、ハロゲン原子、 CN、 NO、炭素原子数 1な いし 10のアルキル基、炭素原子数 1ないし 5のアルコキシ基、炭素原子数 1ないし 5 のハロアルキル基又は炭素原子数 1ないし 5のハロアルコキシ基を表し、 (Wherein R 1 and R 2 are each independently a halogen atom, CN, NO, an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, or 1 to 5 carbon atoms. Or a haloalkoxy group having 1 to 5 carbon atoms,
R3は、水素原子、ハロゲン原子、ニトロ基、 CN基、炭素原子数 1ないし 10のアルキ ル基、炭素原子数 1ないし 5のアルコキシ基、炭素原子数 1ないし 5のハロアルキル基 又は炭素原子数 1ないし 5のハロアルコキシ基を表し、 nが 2 3又は 4を表すとき、各 々の R3は互いに同一であっても又は互いに相異なっていてもよぐさらに、 R3が隣接 する場合には、隣接する 2つの R3は、— CH CH -CH O— — CH N (R8)— -CH CH CH CH CH O— CH CH N (R8) CH CH CH CH CH CH CH O— CH CH CH N (R8)— CH CH CH CH CH CH CH CH CH O—又は一 CH CH CH CH N (R8)—を形成することにより、 2つ の R3のそれぞれが結合する炭素原子と共に 4員環、 5員環又は 6員環を形成してもよ ぐ R 3 is a hydrogen atom, a halogen atom, a nitro group, a CN group, an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 5 carbon atoms, a haloalkyl group having 1 to 5 carbon atoms, or the number of carbon atoms When 1 represents a haloalkoxy group of 1 to 5 and n represents 2 3 or 4, each R 3 may be the same or different from each other, and when R 3 is adjacent The two adjacent R 3 groups are — CH CH —CH O— — CH N (R 8 ) — —CH CH CH CH CH O—CH CH N (R 8 ) CH CH CH CH CH CH CH O— CH By forming CH CH N (R 8 ) —CH CH CH CH CH CH CH CH CH CH O— or one CH CH CH CH N (R 8 ) — together with the carbon atom to which each of the two R 3 bonds May form 4-, 5-, or 6-membered rings
R8は、水素原子又は炭素原子数 1ないし 10のアルキル基を表し、 R 8 represents a hydrogen atom or an alkyl group having 1 to 10 carbon atoms,
nは、 1 2 3又は 4の整数を表す。 )  n represents an integer of 1 2 3 or 4. )
で表されるシクロへキサジェン系ォキシム化合物。  A cyclohexadiene oxime compound represented by:
[22] 前記式 [3]で表されるシクロへキサジェン系ォキシムスルホネート化合物からなる光 酸発生剤。 [22] A photoacid generator comprising a cyclohexadiene oxime sulfonate compound represented by the formula [3].
[23] 前記式 [3]で表されるシクロへキサジェン系ォキシムスルホネート化合物からなる i線 用光酸発生剤。  [23] A photoacid generator for i-line comprising a cyclohexadiene oxime sulfonate compound represented by the above formula [3].
PCT/JP2007/067726 2006-09-13 2007-09-12 Dye-containing resist composition containing photoacid generator, and cyclohexadiene-type oxime sulfonate compound WO2008032736A1 (en)

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