WO2008009566A2 - Procede et dispositif d'analyse de reseaux de cables electriques - Google Patents
Procede et dispositif d'analyse de reseaux de cables electriques Download PDFInfo
- Publication number
- WO2008009566A2 WO2008009566A2 PCT/EP2007/056834 EP2007056834W WO2008009566A2 WO 2008009566 A2 WO2008009566 A2 WO 2008009566A2 EP 2007056834 W EP2007056834 W EP 2007056834W WO 2008009566 A2 WO2008009566 A2 WO 2008009566A2
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- WIPO (PCT)
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- frequency
- network
- frequencies
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- filters
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/08—Locating faults in cables, transmission lines, or networks
- G01R31/11—Locating faults in cables, transmission lines, or networks using pulse reflection methods
Definitions
- the invention relates to a method and an apparatus for analyzing networked electrical cables for detecting and locating faults in the cables of this network.
- the electric cables concerned may be energy transmission cables or communication cables, in fixed installations (distribution network, internal or external communication network) or mobile (energy or communication network in an airplane, a boat, automobile, etc.).
- the cables concerned may be any: coaxial or two-wire, in parallel lines or in twisted pairs, shielded or not, etc., provided that the speed of propagation of the signals in these cables can be known.
- These networks can be organized according to different known topologies: bus, tree, mesh, ring, star, linear, or mixed of these different topologies.
- the faults concerned are faults that can affect the electrical operation of the circuits whose cables are part of and may have sometimes very critical consequences (failures of electrical systems in an aircraft for example), or even defects that can directly cause fire starts (short circuit, arcing in a dry environment or in the presence of moisture, etc.). It is important to be able to detect these defects to remedy them in time.
- Time Domain Reflectometry In Time Domain Reflectometry (TDR) methods, an electromagnetic wave is injected into the cable in the form of a voltage pulse, a voltage step or the like. The wave reflected at the location of the impedance discontinuity is detected at the injection site and the time difference between the transmitted and received edges is measured. The position of the fault is determined from this difference, and the amplitude and polarity of the reflected pulse give an indication of the type of fault (open circuit, short circuit, resistive fault, or other).
- FDR Frequency Domain Reflectometry
- Frequency domain reflectometry methods are effective for analyzing a single cable. They are difficult to use when the cable has taps. The time domain reflectometry methods can be used even with derivations but the analysis of the reflected signals is difficult due to the presence of multiple reflections. It has also been proposed in the published patent application WO
- This system is particularly suitable for detecting intermittent faults as it can operate even while the network is in use; however, intermittent faults may only occur when the network is in service and disappear when it is no longer (eg a fault that would occur while a plane is flying but disappears on the ground).
- This method can be used for cables with taps, but it still has ambiguities: it is not known which branch a fault is detected on.
- the purpose of the invention is to remove these ambiguities, especially in cables having a T-structure (also called a Y-structure), that is to say having at least one branch.
- the invention proposes a method for testing a network of cables comprising at least one junction from which N secondary sections (N greater than or equal to 2) start, the method consisting of:
- test signal modulated simultaneously or successively by N-1 different carrier frequencies each located in one of the N-1 frequency bands of the filters placed at the input of the sections, the test signal is also modulated by an N I ⁇ m ⁇ frequency located outside the bands of the N-1 filters,
- the amplitude of the modulation of the pulse test signal applied to the input is preferably of Gaussian form.
- the frequency modulation by the N frequencies of the test signal is preferably simultaneous, the pulse containing the N carrier frequencies, but one can also imagine a solution in which several successive pulses are emitted, each modulated by a respective frequency. This latter solution, however, is less advantageous because it generates several distinct response patterns that must then be compared with each other.
- the fault position detection is preferably done via a time-frequency analysis providing a time-frequency diagram of the signals reflected to the cable input; the time position of the spot centers of a series of reflection spots corresponding to different frequencies in the time-frequency diagram then represents information on the position of a defect and the section in which it is located.
- a device for analyzing an electrical cable network comprising at least one junction from which N secondary sections (N greater than or equal to 2) start, the device comprising, in series with the input of each of N-1 secondary sections starting from the junction, a bidirectional passive filter capable of cutting a frequency band associated with this section, the filters all leaving the frequencies useful for the normal operation of the network,
- a short-duration test signal generator modulated simultaneously or successively by N-1 different carrier frequencies each situated in one of the N-1 frequency bands of the filters placed at the input of the sections, the test signal being also modulated by an N I ⁇ m ⁇ frequency located outside the rejection bands of the N-1 filters, and a device for detecting the time position of signal peaks resulting from the reflection of the test signal, for each of the N frequencies.
- the bidirectional passive filters pass the signal by filtering it both in the forward direction of the transmitted pulse and in the return direction of a reflected pulse.
- These are preferably reciprocal filters, having the same function of transfer in both directions.
- FIG. 1 shows a network of shunt cables that it is desired to analyze
- FIG. 2 represents a reflectogram generated by conventional test means applied to the network of FIG. 1;
- FIG. 3 represents the analysis device according to the invention;
- FIG. 4 represents a preferred waveform for the pulse test signal applied to the input;
- FIG. 5 represents a diagram which is the result of a time-frequency analysis of the transmitted pulse
- FIG. 6 represents a time-frequency diagram of the signals reflected by the cable in the configuration of FIG. 3;
- FIG. 9 shows another testable cable network configuration using the present invention (1 junction and 4 leads);
- FIG. 10 represents an example of filter templates that can be used in the test of a multi-branch network requiring four filters, for example the network of FIG. 9 or the network of FIG.
- FIG. 1 1 shows yet another configuration of cable network with serial junctions (3 junctions and 4 leads).
- FIG. 1 diagrammatically shows a network with one junction and two branches having three sections T1, T2 and T3.
- the sections T2 and T3 have an input end connected to a junction point A located at an output end of the section T1.
- T or Y
- the sections considered and represented by a line may consist of a sheathed conductor wire or a pair of sheathed wires or a coaxial cable.
- This network can be used either to transport energy or communication signals from the input E1 to the outputs S2 and S3, or in the opposite direction from an output S2 or S3 to the other or to the input E1. That's why the notions of input and output are used here only for the application of reflectometry and to fix the direction of emission of measurement signals that will be used for the detection of defects: the input E1 here will be assumed to be the one on which the test signals of the network are applied.
- the outputs of sections T2 and T3 may be in open circuit or short circuit or adapted to the impedance of the network (if they are adapted they do not cause reflection); in this example it has been assumed that the outputs S2 and S3 are in open circuit (CO), which will allow to observe signals reflected at the ends to better understand the principles of the invention.
- These open circuits can also represent faults to be detected and located, for example unplugged connectors.
- a test pulse would typically be applied from the input E1, and a signal pattern called a "reflectogram" would be collected on the same input; the reflectogram is the plot of a curve representing revolution of a voltage amplitude recorded at the input E1 over time.
- FIG. 2 represents such a reflectogram for the cable of FIG. 1, with the time on the abscissa and a voltage amplitude on the ordinate.
- the test is made for a faultless cable having a length of 10 meters for the first section L1, and lengths of 1 m80 and 1 m for the sections L2 and L3.
- the input pulse, on the left of the diagram, is a positive pulse of short duration with respect to propagation times in the cables so that the reflected pulses do not mix with the transmitted pulse.
- the reflected pulses are first of all a negative reflection pulse at the junction; the junction creates an impedance mismatch in which the impedance seen is lower than the characteristic impedance of the cable, hence the negative amplitude of the reflected signal.
- a fault may have the effect of displacing some of the pulses or simply of adding impulses to the diagram of Figure 2. It is therefore not easy to interpret the existence of a defect and find the location of the defect from such a reflectogram.
- FIG. 3 represents the principle of the defect analysis device according to the invention, applied to a T-cable of the same kind as that shown in FIG. 1; the cable here comprises two parallel son, twisted or coaxial and the two son are represented by parallel lines.
- the cable parameters (characteristic impedance, propagation speed) are assumed to be identical for all sections; only the lengths differ.
- the section T2 is larger than the section T3.
- a test signal is applied to the input E1 in the form of a pulse of short duration.
- Short term is short term compared to the time taken by the pulse to propagate and reflect at the location of a fault located at a distance where we want to be able to detect this defect. For example, if we want to detect a fault located 1 meter from the entrance while the speed of propagation of signals in a cable is of the order of 200 000 km / s, it will be understood that the pulse must have a duration that does not exceed a few tens of nanoseconds, so that the reflected pulse does not mix with the transmitted pulse in time.
- the pulse is frequency modulated and its overall amplitude is defined by a non-zero amplitude level envelope during this short time; this amplitude is modulated simultaneously by two carrier frequencies F2 and F3 located largely above the frequency band of the signals that the cable is supposed to transmit in operation. For a low frequency power transmission cable, this is not a problem.
- the frequencies F2 and F3 For a digital communications cable to transmit for example 100 megabits per second, the frequencies F2 and F3 must be well above 100 megahertz. They can be for example 500 and 1000 MHz respectively.
- the constraints are the following ones: the frequencies F2 and F3 should not be too high so that the pulses are not overly attenuated in their propagation, the attenuation in the cables increasing for the high frequencies. They must be sufficiently separated from each other so that it is possible to easily make separate rejecting filters which reject one of the frequencies while letting the other pass through.
- the form of the voltage envelope of the short-duration test signal is preferably a Gaussian form because it is this type of shape that allows for the most concentrated signal spectrum around the F2 and F3 modulation frequencies; it is also this type of shape that allows the pulse signal to undergo the least spectrum distortion during its propagation and its reflections.
- envelope shapes that are too square, however, are less advantageous because they have a less concentrated spectrum around the modulation frequencies.
- a notch filter (notch filter) FR2 which strongly attenuates the frequencies in a band which contains the frequency F2 (for example a band centered on the frequency F2) but which does not attenuate or almost not the frequency F3 nor the frequencies located in the useful bandwidth of the signals that must be transported by the cable in operation.
- a rejector filter FR3 is placed at the input of the section T3 which strongly attenuates the frequencies in a band which contains the frequency F3 (for example a band centered on the frequency F3) but which does not attenuate or virtually frequency F2 or frequencies within the useful bandwidth of the signals to be carried by the cable in operation.
- the filter FR2 is in series in the section T2 and the filter FR3 is in series in the section T3.
- the filters are bidirectional so that they act as well for the signals traveling on the T2 or T3 section from the input to the output as for the signals traversing the section in the opposite direction.
- These are passive filters based on inductances and capacitors, possibly resistors. Their attenuation is preferably as low as possible, especially in the useful frequency band of the signals which must be transported in normal operation.
- the filters are from Preferably, their transfer function is preferably identical in both directions.
- the pulse modulated by the frequencies F2 and F3 propagates in the section T1; it is partially reflected at the junction A because of the impedance discontinuity presented at this point; it is partially transmitted by the section T2 except for the frequency band around F2 which is rejected by the filter FR2; the part that passes (and in particular the modulation at the frequency F3) is reflected at the end of the section T2.
- the non-reflected part at the junction A passes in the section T3 except for the frequency band around F3 which is rejected by the filter FR3; the modulation at the frequency F2 passes and is reflected at the end of the section T3.
- FIG. 4 represents the preferred waveform (Gaussian modulated in frequency by the frequencies F2 and F3) of the emitted test pulse; the time T is on the abscissa, in seconds; the instantaneous amplitude V is in the ordinate, in arbitrary units.
- the duration of the pulse in this example is about 30 nanoseconds (width at mid-height of the Gaussian: about 12 nanoseconds).
- This pulse is applied to the input E1 (FIG. 3) by a not shown test signal generator.
- FIG. 5 represents the same test signal, but according to another representation comprising three associated diagrams; the diagrams represent the transmitted pulse, respectively in a temporal domain (upper rectangle of FIG. 5), in a spectral domain (left rectangle of the figure) and in a time-frequency domain (the largest rectangle between the upper rectangle and the left rectangle).
- the representation in the time domain is only a reduction of the representation of FIG. 4: time T in horizontal abscissa to the right, voltage amplitude V in vertical ordinate upwards.
- the representation in the spectral domain shows two peaks centered around the modulation frequencies F2 and F3 of the pulse.
- the representation in the time-frequency domain shows two concentrated spots corresponding to two narrow spectra, one centered on the frequency F2, the other on the frequency F3; the centers of the spots have for abscissa the moment corresponding to the vertex of the peak of the Gaussian envelope of the pulse and for ordinates the frequencies F2 and F3 respectively.
- the instantaneous amplitude of the pulse is of the form
- S (t) is the amplitude as a function of time t;
- SO is an amplitude of the top of the Gaussian envelope;
- a is a coefficient which determines the width of the Gaussian pulse at half height, that is to say the more or less large spread of the pulse; this width at half height is equal to
- variable may be selected equal to approximately 5.10 "9, t being expressed in seconds.
- the time-frequency diagram is plotted using a time-frequency analyzer connected to the input E1 of the network by a T-junction.
- Such analyzers are known, they operate by sampling and digitizing the signals they receive. , and calculation on the samples, in particular Fourier transform calculations making it possible to determine the frequency components contained in a signal of short duration. Digital time-frequency algorithms can also be used to perform this analysis.
- the same time-frequency analyzer connected to the input E1 also makes it possible to draw a time-frequency diagram of the signals reflected towards the input E1.
- FIG. 6 represents, with a double representation of time amplitude on the one hand and time-frequency on the other hand, a reflectogram resulting from the application of a voltage pulse of Gaussian amplitude, modulated by the frequencies F2 and F3 in a cable equipped according to the invention with reject filters FR2 and FR3; the assembly is in accordance with the diagram of FIG. 3; the cable lengths are as follows: about 3 meters for L1, 3m for L3, 6m for L2.
- the transmitted pulse is not represented on this reflectogram because of the scales used for both amplitude V and time T; only the reflections are represented.
- the origin of time is arbitrary in this drawing.
- the time / frequency reflectectogram (at the bottom of the figure), more explicit than the amplitude / time reflectogram (at the top), reveals several spots centered on a respective time and frequency.
- the leftmost spots centered respectively on the frequencies F2 and F3, correspond to the reflection of the Gaussian pulse on the junction A.
- There is one spot for each frequency and the propagation times for the two frequencies are identical, so that the spots are centered on the same instant which is the peak of a Gaussian signal modulated by the two frequencies.
- the next spot to the right is centered on the frequency F2; it does not come from a reflection in the section T2 which does not allow the passage of this frequency; it corresponds to the reflection at the end S3 of the section T3 (which is the shortest).
- the next spot to the right is centered on the frequency F3; it can not correspond to a reflection in the section T3 that does not let this frequency pass; it corresponds to a reflection at the end S2 of the other section T2.
- the last spot on the right corresponds, since it is centered on the frequency F2, to a multiple reflection in the section T3 (two round trip between the junction A and the end S3).
- a double spot one centered on F2 and the other on F3 may appear between the position of the spot representing the input pulse (not visible in FIG. 6) and the spot representing the junction A.
- the temporal position of this task makes it possible to deduce the physical position of the defect, knowing the speed of propagation of the signals in the cable.
- the sign of the amplitudes makes it possible to know if the defect is of type open circuit (signal of the same sign as the emitted pulse) or of type short circuit (negative signal).
- a spot at the frequency F3 appears between the spot corresponding to the junction A and that corresponding to the known theoretical length L2 of the section.
- a stain at the frequency F2 appears between the position of the junction A and the position of the output S3 of the section T3.
- the time-frequency representation that can give a frequency analysis apparatus therefore provides a very convenient representation of possible cable faults.
- the position can be determined. a fault along the cable by distinguishing the different sections.
- FIG. 7 represents another reflectogram which would be obtained if the section T3 was longer than the section T2, and FIG. 8 a reflectogram corresponding to sections of the same length.
- N rejecting filters one at the entry of each section
- N-1 rejecting filters one at the entry of each section except for the N I ⁇ m ⁇ section . Therefore, in general, the method will use at least N-1 rejector filters and possibly an N I ⁇ m ⁇ rejection filter.
- FIG. 9 represents a configuration with 4 sections starting from the same junction A, thus requiring four test frequencies F1, F2, F3, F4.
- FIG. 10 represents the schematic diagram of each of the four filters: the filter FR1 rejects a frequency band centered on F1, the filter FR2 rejects a band centered on F2, the filter FR3 rejects a band centered on F3.
- the filter corresponding to the highest test frequency that is the FR4 filter in this case, corresponding to the frequency F4, may be a low-pass filter rather than a notch filter, cutting the frequency F4 and higher frequencies and passing frequencies F1, F2 and F3. If there is no FR4 filter in this four-section structure, it is the filter FR3 which can be a low-pass filter, allowing frequencies F1 and F2 to pass and cutting the frequency F3.
- the band of useful frequencies in operation represented by a frequency Fu in the diagram of FIG. 10, is hypothetically lower than all the frequencies used in the modulation of the signal of test; it is not attenuated by any of the filters because it is lower than all the frequency bands cut by the filters.
- FIG. 11 shows another cable network configuration, with several successive junctions A, B, C with two leads each, in total 3 junctions and four leads:
- Tc2 Tc3 for the junction C located at the end of the section Tb2.
- This configuration can be tested by the same method, and requires four test frequencies F1 to F4 and four filters (or at least three) whose templates meet the same requirements as before. The number of frequencies required for the test is deduced from the configuration, so that there are not two notch filters in series. The first two junctions can only be followed by one filter each, the last junction can have one or two filters.
- test pulse was a single pulse simultaneously modulated by several carrier frequencies.
- Gaussian test pulse generator could also provide a plurality of successive pulses each modulated by a respective frequency. Several reflectograms are then produced and they must be superimposed to deduce the presence, the position and the nature of the defect. This solution is less advantageous.
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Locating Faults (AREA)
- Monitoring And Testing Of Transmission In General (AREA)
- Monitoring And Testing Of Exchanges (AREA)
- Cable Transmission Systems, Equalization Of Radio And Reduction Of Echo (AREA)
Abstract
Description
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Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009519913A JP2009545196A (ja) | 2006-07-18 | 2007-07-05 | 電気ケーブルのネットワーク解析方法及び装置 |
US12/307,761 US8063645B2 (en) | 2006-07-18 | 2007-07-05 | Method and device for analyzing electric cable networks |
EP07787124A EP2041588A2 (fr) | 2006-07-18 | 2007-07-05 | Procede et dispositif d'analyse de reseaux de cables electriques |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0606531 | 2006-07-18 | ||
FR0606531A FR2904116B1 (fr) | 2006-07-18 | 2006-07-18 | Procede et dispositif d'analyse de reseaux de cables electriques. |
Publications (2)
Publication Number | Publication Date |
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WO2008009566A2 true WO2008009566A2 (fr) | 2008-01-24 |
WO2008009566A3 WO2008009566A3 (fr) | 2008-03-20 |
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Application Number | Title | Priority Date | Filing Date |
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PCT/EP2007/056834 WO2008009566A2 (fr) | 2006-07-18 | 2007-07-05 | Procede et dispositif d'analyse de reseaux de cables electriques |
Country Status (5)
Country | Link |
---|---|
US (1) | US8063645B2 (fr) |
EP (1) | EP2041588A2 (fr) |
JP (1) | JP2009545196A (fr) |
FR (1) | FR2904116B1 (fr) |
WO (1) | WO2008009566A2 (fr) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8410791B2 (en) * | 2007-03-06 | 2013-04-02 | Nec Corporation | Impulse immunity test apparatus |
US20110209894A1 (en) * | 2010-02-26 | 2011-09-01 | United States Of America As Represented By The Administrator Of The National Aeronautics | Electrically Conductive Composite Material |
US9210257B2 (en) | 2010-06-11 | 2015-12-08 | Utilx Corporation | Systems and methods employing time domain reflectometry |
FR2965933B1 (fr) * | 2010-10-12 | 2013-04-26 | Schneider Electric Ind Sas | Localisation de defauts dans un reseau electrique |
FR2988855B1 (fr) * | 2012-04-03 | 2014-12-19 | Commissariat Energie Atomique | Procede et systeme de diagnostic d'un cable par reflectometrie distribuee a moyenne autoselective |
FR3006769B1 (fr) * | 2013-06-11 | 2016-12-02 | Commissariat Energie Atomique | Procede de reflectometrie pour l'identification de defauts non francs impactant un cable |
FR3013163B1 (fr) * | 2013-11-08 | 2018-09-14 | Airbus Operations | Reseau de distribution d'energie electrique d'un vehicule de transport, tel qu'un avion, ainsi qu'une installation electrique d'un avion |
FR3022639B1 (fr) * | 2014-06-20 | 2017-12-29 | Centre National De La Recherche Scient - Cnrs - | Procede de marquage de faisceaux de lignes electriques pour le diagnostic par reflectometrie et kit correspondant |
FR3026848B1 (fr) * | 2014-10-02 | 2018-01-05 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Procede d'analyse d'un cable, basee sur une correlation auto-adaptative, pour la detection de defauts non francs |
US10684319B2 (en) * | 2015-07-20 | 2020-06-16 | International Business Machines Corporation | Tuning a testing apparatus for measuring skew |
US10162002B2 (en) | 2015-07-20 | 2018-12-25 | International Business Machines Corporation | Tuning a testing apparatus for measuring skew |
US10175287B2 (en) * | 2016-07-29 | 2019-01-08 | Cameron International Corporation | Cable monitoring system and method using noise-domain reflectometry |
FR3065533B1 (fr) * | 2017-04-19 | 2019-04-19 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Procede et systeme de detection d'un defaut dans une ligne de transmission a partir d'une mesure de phase |
US10935593B2 (en) * | 2017-12-28 | 2021-03-02 | Intel Corporation | Method of resonance analysis for electrical fault isolation |
CN110658257A (zh) * | 2019-10-10 | 2020-01-07 | 天津科技大学 | 一种基于小波包分析的飞机电缆绝缘层缺陷识别方法 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CA1187974A (fr) * | 1982-10-15 | 1985-05-28 | Mervin R. Black | Methode et appareil pour controler l'integrite d'un cable par emission acoustique |
JPH05126674A (ja) * | 1991-11-07 | 1993-05-21 | Tokyo Electric Power Co Inc:The | 光伝送路の断線検出方法 |
JPH06118118A (ja) * | 1992-10-06 | 1994-04-28 | Tokyo Electric Power Co Inc:The | Opgwを利用する送電線の故障点標定方法 |
US5369366A (en) * | 1993-02-12 | 1994-11-29 | Cable Repair Systems Corporation | Method of finding faults in a branched electrical distribution circuit |
JP3346233B2 (ja) * | 1997-08-18 | 2002-11-18 | ケイディーディーアイ株式会社 | 光伝送線路監視装置 |
US20040015311A1 (en) | 2001-01-09 | 2004-01-22 | Cynthia Furse | Low-cost, compact, frequency domain reflectometry system for testing wires and cables |
JP3906461B2 (ja) * | 2001-10-12 | 2007-04-18 | 日本電信電話株式会社 | 光アドドロップ装置用監視システムならびに光クロスコネクト装置用監視システム |
KR100486972B1 (ko) | 2002-07-09 | 2005-05-03 | 신용준 | 시간-주파수 영역 반사파 처리 방법 |
WO2004084033A2 (fr) * | 2003-03-18 | 2004-09-30 | University Of Utah Research Foundation | Dispositif et procede servant a controler des trajets de signalisation |
US20050083067A1 (en) * | 2003-09-23 | 2005-04-21 | Kirbas Emuel P. | Coded multi-frequency transmitter and receiver for testing multi-conductor cables |
US7245129B2 (en) * | 2005-02-14 | 2007-07-17 | Texas Instruments Incorporated | Apparatus for and method of cable diagnostics utilizing time domain reflectometry |
-
2006
- 2006-07-18 FR FR0606531A patent/FR2904116B1/fr not_active Expired - Fee Related
-
2007
- 2007-07-05 WO PCT/EP2007/056834 patent/WO2008009566A2/fr active Application Filing
- 2007-07-05 JP JP2009519913A patent/JP2009545196A/ja active Pending
- 2007-07-05 US US12/307,761 patent/US8063645B2/en not_active Expired - Fee Related
- 2007-07-05 EP EP07787124A patent/EP2041588A2/fr not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
US8063645B2 (en) | 2011-11-22 |
WO2008009566A3 (fr) | 2008-03-20 |
FR2904116A1 (fr) | 2008-01-25 |
JP2009545196A (ja) | 2009-12-17 |
US20100141264A1 (en) | 2010-06-10 |
EP2041588A2 (fr) | 2009-04-01 |
FR2904116B1 (fr) | 2008-09-12 |
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