WO2007117869A3 - Self-boosting system with suppression of high lateral electric fields - Google Patents
Self-boosting system with suppression of high lateral electric fields Download PDFInfo
- Publication number
- WO2007117869A3 WO2007117869A3 PCT/US2007/064215 US2007064215W WO2007117869A3 WO 2007117869 A3 WO2007117869 A3 WO 2007117869A3 US 2007064215 W US2007064215 W US 2007064215W WO 2007117869 A3 WO2007117869 A3 WO 2007117869A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- isolation
- word lines
- electric fields
- lateral electric
- suppression
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
- G11C16/3418—Disturbance prevention or evaluation; Refreshing of disturbed memory data
Landscapes
- Read Only Memory (AREA)
- Non-Volatile Memory (AREA)
- Semiconductor Memories (AREA)
Abstract
In an improved EASB programming scheme for a flash device (e.g. a NAND flash device), the number of word lines separating a selected word line (to which a program voltage is applied) and an isolation word line (to which an isolation voltage is applied) is adjusted as a function (e.g. inverse function) of distance of the selected word line from the drain side select gate to reduce program disturb due to high vertical and lateral electric fields at or near the isolation transistor when programming word lines closer to the drain side select gate. The selected and isolation word lines are preferably separated by two or more word lines to which intermediate voltage(s) are applied.
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/394,803 | 2006-03-30 | ||
US11/394,460 US7428165B2 (en) | 2006-03-30 | 2006-03-30 | Self-boosting method with suppression of high lateral electric fields |
US11/394,803 US7511995B2 (en) | 2006-03-30 | 2006-03-30 | Self-boosting system with suppression of high lateral electric fields |
US11/394,460 | 2006-03-30 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2007117869A2 WO2007117869A2 (en) | 2007-10-18 |
WO2007117869A3 true WO2007117869A3 (en) | 2007-12-06 |
Family
ID=38283334
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2007/064215 WO2007117869A2 (en) | 2006-03-30 | 2007-03-16 | Self-boosting system with suppression of high lateral electric fields |
Country Status (2)
Country | Link |
---|---|
TW (1) | TW200807422A (en) |
WO (1) | WO2007117869A2 (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7161833B2 (en) | 2004-02-06 | 2007-01-09 | Sandisk Corporation | Self-boosting system for flash memory cells |
US7466590B2 (en) | 2004-02-06 | 2008-12-16 | Sandisk Corporation | Self-boosting method for flash memory cells |
US7511995B2 (en) | 2006-03-30 | 2009-03-31 | Sandisk Corporation | Self-boosting system with suppression of high lateral electric fields |
US7428165B2 (en) | 2006-03-30 | 2008-09-23 | Sandisk Corporation | Self-boosting method with suppression of high lateral electric fields |
CN103106922B (en) * | 2012-12-26 | 2017-05-10 | 上海华虹宏力半导体制造有限公司 | Programming method for separating grid memory array |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1997049089A1 (en) * | 1996-06-18 | 1997-12-24 | Advanced Micro Devices, Inc. | Nand flash memory using floating gate transistors as select gate devices and its bias scheme |
US6191975B1 (en) * | 1998-12-22 | 2001-02-20 | Kabushiki Kaisha Toshiba | Non-volatile NAND type semiconductor memory device with stacked gate memory cells and a stacked gate select transistor |
US20050056869A1 (en) * | 2003-08-04 | 2005-03-17 | Kabushiki Kaisha Toshiba | Nonvolatile semiconductor memory cell matrix, a mehtod for operating the same, monolithic integrated circuits and systems |
US20050174852A1 (en) * | 2004-02-06 | 2005-08-11 | Hemink Gerrit J. | Self-boosting system for flash memory cells |
WO2006124525A1 (en) * | 2005-05-12 | 2006-11-23 | Sandisk Corporation | Selective application of program inhibit schemes in non-volatile memory |
-
2007
- 2007-03-16 WO PCT/US2007/064215 patent/WO2007117869A2/en active Application Filing
- 2007-03-30 TW TW96111435A patent/TW200807422A/en unknown
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1997049089A1 (en) * | 1996-06-18 | 1997-12-24 | Advanced Micro Devices, Inc. | Nand flash memory using floating gate transistors as select gate devices and its bias scheme |
US6191975B1 (en) * | 1998-12-22 | 2001-02-20 | Kabushiki Kaisha Toshiba | Non-volatile NAND type semiconductor memory device with stacked gate memory cells and a stacked gate select transistor |
US20050056869A1 (en) * | 2003-08-04 | 2005-03-17 | Kabushiki Kaisha Toshiba | Nonvolatile semiconductor memory cell matrix, a mehtod for operating the same, monolithic integrated circuits and systems |
US20050174852A1 (en) * | 2004-02-06 | 2005-08-11 | Hemink Gerrit J. | Self-boosting system for flash memory cells |
WO2006124525A1 (en) * | 2005-05-12 | 2006-11-23 | Sandisk Corporation | Selective application of program inhibit schemes in non-volatile memory |
Also Published As
Publication number | Publication date |
---|---|
WO2007117869A2 (en) | 2007-10-18 |
TW200807422A (en) | 2008-02-01 |
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