WO2007110910A1 - Circuit simulator - Google Patents

Circuit simulator Download PDF

Info

Publication number
WO2007110910A1
WO2007110910A1 PCT/JP2006/306139 JP2006306139W WO2007110910A1 WO 2007110910 A1 WO2007110910 A1 WO 2007110910A1 JP 2006306139 W JP2006306139 W JP 2006306139W WO 2007110910 A1 WO2007110910 A1 WO 2007110910A1
Authority
WO
WIPO (PCT)
Prior art keywords
analysis
circuit
linear
nonlinear
result
Prior art date
Application number
PCT/JP2006/306139
Other languages
French (fr)
Japanese (ja)
Inventor
Kumiko Teramae
Atsushi Takeuchi
Original Assignee
Fujitsu Limited
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Limited filed Critical Fujitsu Limited
Priority to JP2008507299A priority Critical patent/JP4486693B2/en
Priority to PCT/JP2006/306139 priority patent/WO2007110910A1/en
Publication of WO2007110910A1 publication Critical patent/WO2007110910A1/en

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00Computer-aided design [CAD]
    • G06F30/30Circuit design
    • G06F30/36Circuit design at the analogue level
    • G06F30/367Design verification, e.g. using simulation, simulation program with integrated circuit emphasis [SPICE], direct methods or relaxation methods

Definitions

  • the present invention relates to a circuit simulator, and more particularly to a circuit simulator that performs a circuit simulation at a high speed by performing a process according to the characteristics of elements constituting the circuit.
  • General-purpose circuit simulators generally simulate the characteristics of the elements that make up a circuit (resistors' capacitance, inductance, etc.) and non-linear characteristics (MOS transistors, diodes, etc.). Yes. In circuit simulation, there was a problem that a large amount of data was generated and processing time was significant.
  • Patent Document 1 Japanese Unexamined Patent Application Publication No. 2003-337842
  • Patent Document 1 describes the first simulation for confirming the basic operation. It is proposed to analyze the results and perform a second simulation with detailed analysis steps when it is determined that detailed analysis of the circuit operation is necessary.
  • Patent Document 2 Japanese Patent Application Laid-Open No. 2002-197132 (Patent Document 2) describes a circuit under test before performing this analysis.
  • the slow start power supply element that has the slow start characteristic for the power supply element specified in the input data and holds this set potential until a predetermined convergence judgment time after reaching the set potential
  • perform preliminary transient analysis during the slow start-up period set the potential of each contact of the circuit under test when the convergence judgment time is reached as the operating point of this circuit under test, and set this operating point after setting this operating point.
  • the change of each node of the circuit is calculated during the preliminary transient analysis, and the convergence is judged, so it is proposed to automatically determine whether the operating point of the input data is obtained.
  • Patent Document 3 discloses a comparison result between an estimated error value and an allowable error value. Based on the above, it is proposed to control the optimal step width by calculating a small step width. I am planning.
  • Patent Document 1 Japanese Unexamined Patent Publication No. 2003-337842
  • Patent Document 2 JP 2002-197132 A
  • Patent Document 3 Japanese Patent Laid-Open No. 2002-318990
  • the circuit is composed of a linear element and a nonlinear element, and the characteristic of the linear element is constant regardless of the current change Z voltage change ratio, but the characteristic of the nonlinear element is the current change Z voltage change.
  • the conversion ratio is not constant. For this reason, when analyzing a circuit, processing is also performed on linear elements at the same time as analysis steps reduced by the characteristics of nonlinear elements. there were.
  • the present invention has been made in view of such problems, and an object of the present invention is to provide a circuit simulator that performs circuit simulation at a high speed by performing processing according to the characteristics of elements constituting the circuit.
  • the present invention provides a circuit simulator for simulating a circuit including a linear circuit, wherein the linear circuit is analyzed with a linear element for each of a plurality of pseudo-variable steps.
  • An LU decomposition result storage area that stores the LU decomposition result of the linear circuit matrix corresponding to the configured linear part in association with the LU decomposition result storage area, and matches the analysis step being executed with reference to the LU decomposition result storage area
  • An LU decomposition result reading unit that reads the LU decomposition result corresponding to the pseudo variable step and a first analysis unit that solves a linear circuit matrix equation using the LU decomposition result are configured.
  • the analysis step for the linear part of the circuit configuration is analyzed from the start to the end of the analysis process, based on the analysis steps specified by the user, using several analysis steps assumed in advance,
  • Analysis processing can be performed at high speed. Therefore, analysis processing of the entire circuit can be performed at high speed.
  • the present invention provides a circuit simulation method
  • a computer-readable storage medium storing a program for causing a computer to perform circuit simulation processing can be used.
  • the analysis step for the linear portion of the circuit configuration is performed from the start to the end of the analysis process, based on the analysis step specified by the user, using several analysis steps assumed in advance, Since the LU decomposition result calculated in advance is used, analysis processing can be performed at high speed. Accordingly, the analysis process for the entire circuit can be performed at high speed.
  • FIG. 1 is a block diagram showing a hardware configuration of a simulator according to an embodiment of the present invention.
  • FIG. 2 is a flowchart for explaining an outline of circuit simulation processing according to the embodiment of the present invention.
  • FIG. 3 is a schematic diagram for explaining division processing using a circuit matrix.
  • FIG. 4 is a flowchart for explaining a first analysis process for analyzing a linear circuit performed in step S12 of FIG.
  • FIG. 5 is a flowchart for explaining the next analysis step determination process.
  • FIG. 6 is a flowchart for explaining a second analysis process for analyzing the nonlinear circuit performed in step S32 of FIG.
  • FIG. 7 is a flowchart for explaining the convergence determination process in step S13 of FIG.
  • a component part composed of elements having linear characteristics such as resistance, capacitance, and inductance is defined as a linear part, and an element having non-linear characteristics such as a MOS transistor and a diode.
  • FIG. 1 is a block diagram showing a hardware configuration of a simulator according to an embodiment of the present invention.
  • a simulator 100 is a terminal controlled by a computer, and includes a CPU (Central Processing Unit) 51, a memory unit 52, a display unit 53, an output unit 54, and an input unit 55.
  • the communication unit 56, the storage device 57, and the driver 58 are connected to the system bus B.
  • the CPU 51 controls the simulator 100 according to a program stored in the memory unit 52.
  • the memory unit 52 is composed of RAM (Random Access Memory), ROM (Read-Only Memory), etc., and is obtained by a program executed by the CPU 51, data necessary for processing by the CPU 51, and processing by the CPU 51. Stored data. Also, a part of the memory capacity 52 is allocated as a work area used for processing by the CPU 51.
  • the display unit 53 displays various information necessary under the control of the CPU 51.
  • the output unit 54 has a printer or the like and is used for outputting various information in accordance with instructions from the user.
  • the input unit 55 includes a mouse, a keyboard, and the like, and is used for a user to input various information necessary for processing with the simulator 100.
  • the communication unit 56 is a device for controlling communication between the simulator 100 and the external device when the simulator 100 is connected to the external device via, for example, the Internet or a LAN (Local Area Network). It is.
  • the storage device 57 is composed of, for example, a hard disk unit, and stores data such as programs for executing various processes.
  • a program for realizing the processing performed by the simulator 100 is, for example, a CD-ROM.
  • a storage medium 59 such as (Compact Disc Read-Only Memory). That is, when the storage medium 59 storing the program is set in the driver 58, the driver 58 reads the program from the storage medium 59, and the read program is installed in the storage device 57 via the system bus B. . When the program is activated, the CPU 51 starts its processing according to the program installed in the storage device 57.
  • the medium for storing the program is not limited to a CD-ROM, and any medium that can be read by a computer may be used.
  • the program for realizing the processing according to the present invention may be downloaded via the network by the communication unit 56 and installed in the storage device 57.
  • the circuit simulation process executed by the CPU 51, the circuit is divided into a linear part and a nonlinear part using a circuit matrix, and a first analysis process corresponding to the linear part is performed.
  • the second analysis process is performed on the nonlinear part, and the analysis results are converged by the waveform relaxation method.
  • FIG. 2 is a flowchart for explaining an outline of the circuit simulation processing according to the embodiment of the present invention.
  • the process on the A side is a process for the linear part
  • the process on the B side is a process for the nonlinear part.
  • the CPU 51 acquires circuit data according to user input (step Sl) and generates a circuit matrix (step 2).
  • the user inputs connection information for connecting elements and analysis control information such as analysis steps.
  • the CPU 51 performs a dividing process of dividing the circuit into a linear part and a nonlinear part using the circuit matrix (step S3).
  • the CPU 51 initializes the nonlinear external terminal belonging to the nonlinear part in the circuit matrix to zero (0) (step S11), and performs a first analysis process for analyzing the linear circuit (step S12).
  • the CPU 51 connects the analysis result of the linear circuit as a voltage source to the linear external terminal belonging to the nonlinear circuit (step 15).
  • Step S13 it is determined whether or not the convergence determination result indicates unconvergence.
  • step S14 When the convergence determination result indicates that the convergence is not converged in step S14, the CPU 51 connects the analysis result of the nonlinear circuit to the nonlinear external terminal belonging to the nonlinear circuit as a voltage source (step S15 ).
  • step S14 the convergence determination result indicates convergence in step S14, the combined result based on the analysis result of the linear circuit and the analysis result of the nonlinear circuit is output to the combined result storage area 75 (step S16). ), The circuit simulation is terminated.
  • step S3 the CPU 51 initializes the linear external terminal belonging to the linear part in the circuit matrix to zero (0) (step S31), and performs a second analysis process for analyzing the nonlinear circuit (step S32).
  • step S32-2 it is determined whether or not the force is the first analysis.
  • the CPU 51 connects the analysis result of the nonlinear circuit as a voltage source to the nonlinear external terminal belonging to the linear circuit (step 35).
  • step S13 when the analysis is performed for the second time and thereafter, the convergence judgment process is executed based on the analysis result of the second analysis process, and the voltage at which the linear external terminal voltage of the linear circuit has converged. Judgment is made (step S13), and it is judged whether or not the convergence judgment result indicates unconvergence (step S14).
  • step S35 the CPU 51 connects the analysis result of the linear circuit to a linear external terminal belonging to the linear circuit as a voltage source (step S35).
  • step S14 when the convergence determination result indicates convergence in step S14, the combined result based on the analysis result of the linear circuit and the analysis result of the nonlinear circuit is output to the combined result storage area 75 (step S16). ), The circuit simulation is terminated.
  • FIG. 3 is a schematic diagram for explaining division processing using a circuit matrix.
  • the CPU 51 when the non-linear portion is configured as a subcircuit, the CPU 51 describes the circuit configuration with respect to the circuit matrix 20 of the entire circuit generated in step S2 of FIG.
  • the data capacity of the circuit is divided by deleting the sub-circuit that calls the nonlinear circuit, thereby dividing the linear circuit part and the nonlinear circuit part.
  • the circuit has a circuit configuration in which PCB (Printed Circuit Board) and LSI (Large Scale Integration) are integrated
  • the LSI circuit mounted on the PCB is defined as a sub-circuit.
  • the circuit configuration data power that describes the circuit configuration is also modeled by integrating it with the LSI by calling the subcircuit.
  • LSI interiors use non-linear elements such as mosfet.
  • the external terminal of the subcircuit is the connection part to the PCB (such as a package pin).
  • a small resistor is connected in series at the connection between the PCB and LSI.
  • a nonlinear circuit matrix 40 is generated by the nonlinear element unit 41, the nonlinear external terminal unit 42, and the linear terminal unit 32.
  • a linear circuit matrix 30 is generated by the linear element unit 31, the nonlinear external terminal unit 42, and the linear terminal unit 32.
  • the linear circuit matrix 30 and the non-linear circuit matrix 40 generated in this way are stored in predetermined storage areas, respectively, and the first analysis process and the second analysis process are performed.
  • the waveform relaxation loop (repeating process from step S12 to step S15 and repeating process from step S32 to step S35 in FIG. 2).
  • the linear circuit matrix 30 is referred to.
  • step S11 the nonlinear external terminal 42 of the linear circuit matrix 30 is initialized to OV (voltage zero), and in step S12, the linear circuit is analyzed using the linear circuit matrix 30 (first analysis process).
  • step S15 the nonlinear circuit analysis result obtained in step S32 (nonlinear external terminal voltage) is obtained until the nonlinear external terminal part 42 (nonlinear external terminal voltage) of the linear circuit matrix 30 is converged by the waveform relaxation loop. Voltage) is set to the nonlinear external terminal portion 42 of the linear circuit matrix 30.
  • the nonlinear circuit matrix 40 is referred to.
  • step S31 the linear external terminal 32 of the nonlinear circuit matrix 40 is initialized to 0 V (voltage zero), and in step S32, the nonlinear circuit is analyzed using the nonlinear circuit matrix 40 (second analysis process). Also, in step S35, until the linear external terminal 32 (linear external terminal voltage) of the nonlinear circuit matrix 40 is converged by the waveform relaxation loop, the linear circuit analysis result (linear external terminal voltage) obtained in step S12 is converged. ) Is set in the linear external terminal portion 32 of the nonlinear circuit matrix 40.
  • the voltage at the linear external terminal is defined as a polygonal power supply, and the nonlinear external terminal Connect to.
  • the voltage at the nonlinear external terminal is defined as a polygonal line power supply and connected to the linear external terminal.
  • FIG. 4 is a flowchart for explaining a first analysis process for analyzing the linear circuit performed in step S12 of FIG.
  • the ratio of the voltage change to the current change in the linear portion is constant regardless of the voltage. Therefore, in the first analysis process shown in FIG. 4, several types of analysis steps are prepared in advance as pseudo-variable steps, and the linear circuit matrix 30 is calculated and stored in the storage area for each analysis step. Repeat the process of finding the solution of the circuit equation with reference to the linear circuit matrix 30 corresponding to.
  • the CPU 51 sets the analysis step designated by the user as At (step S51).
  • the CPU 51 acquires At from the analysis control information acquired from the user in step S1 in FIG. 2 and sets it as the analysis step.
  • the CPU 51 determines a plurality of pseudo variable steps AtZ2, At / 4, ⁇ , 2 ⁇ t, 4 ⁇ t, ⁇ using the analysis step At, and stores the pseudovariable steps.
  • For analysis step At specified by user, 1Z2, 1/4, 1/8, 1/16, ..., 2 times, 4 times, 8 times, 16 times, etc.
  • a multiple in a ratio sequence may be determined in advance as a pseudo variable step.
  • the CPU 51 calculates circuit matrix elements corresponding to each pseudo-variable step, and as a result of LU-decomposing the circuit matrix elements, the circuit matrix after LU decomposition is associated with the pseudo-variable steps and LU-decomposed.
  • the result is stored in the result storage area 81 (step S53).
  • the CPU 51 sets the analysis step ⁇ t to the current analysis time time-pre. Also, User force Acquired analysis control information force Obtain the time from the start to the end of the analysis and set it to the final analysis time time-end.
  • the CPU 51 determines whether or not the current analysis time time-pre has reached the final analysis time time-end (step S54).
  • the current analysis time time-pre becomes the final analysis time time-end
  • the first analysis process is terminated.
  • the CPU 51 searches the LU decomposition result storage area 81 for a pseudo variable step that matches the analysis step At,
  • the LU decomposition result corresponding to the pseudo variable step is read (step S55).
  • the CPU 51 obtains a converged solution by performing Yuton iteration while performing forward substitution and backward substitution on the circuit equation using the LU decomposition result read from the LU decomposition result storage area 81 (step S56). ).
  • the CPU 51 outputs the convergence solution as the first analysis result to the first analysis result storage area 71 (step S57).
  • the CPU 51 sets the analysis step At to the previous step At-pre, performs the next analysis step determination process (step S58), and returns to step S54.
  • FIG. 5 is a flowchart for explaining the next analysis step determination process.
  • the CPU 51 sets twice the previous step ⁇ t—pre as the next step ⁇ t—next (step S61).
  • the CPU 51 determines whether the power exceeds the current analysis time time-pre and the next step At-next, which is the value of the broken line power supply. S62). If the next defined time time-def of the broken line power supply is not exceeded, the process proceeds to step S64.
  • step S62! if the next defined time time-def is exceeded in step S62! /, The next defined time time-def will be entered in the next step At-next. A value obtained by subtracting the current analysis time time_pre is set (step S63).
  • step S62 By such a determination in step S62, the analysis step in a state where there is no waveform change can be extended.
  • the CPU 51 refers to the pseudo variable step storage area 80 and defines it in advance.
  • the pseudo-variable step closest to the next step ⁇ t—next is selected, the pseudo-variable step of the value is selected, the pseudo-variable step is set as the analysis step At (step S64), and the next analysis step is determined. The process ends.
  • FIG. 6 is a flowchart for explaining the second analysis process for analyzing the nonlinear circuit performed in step S32 of FIG.
  • the ratio of the voltage change to the current change in the nonlinear portion is not constant. Therefore, in the second analysis process shown in FIG. 6, the ratio of the voltage change to the current change in the non-linear part is large! In the state, the analysis step is emphasized, and in the state where this ratio is small, the analysis step is enlarged. In the analysis step, the elements of the nonlinear circuit matrix are calculated, LU decomposition is performed, and the solution of the circuit equation is obtained repeatedly.
  • the CPU 51 sets an analysis step designated by the user as At (step S71).
  • the CPU 51 sets the analysis step ⁇ t to the previous step ⁇ t-pre and the current analysis time time-pre. Also, the time from the start to the end of the analysis control information force analysis acquired from the user is acquired and set to the final analysis time time-end. Thereafter, the CPU 51 determines whether or not the current analysis time time-pre has reached the final analysis time time-end (step S72).
  • step S73 the CPU 51 calculates circuit matrix elements of the nonlinear circuit matrix 40 and performs LU decomposition.
  • the CPU 51 can obtain a convergent solution by performing -Yutton iteration while performing forward substitution and backward substitution (step S74). Newton iteration modifies variable values.
  • the CPU 51 outputs the converged solution as the second analysis result to the second analysis result storage area 72 (step S75).
  • step S76 the CPU 51 performs the next analysis step determination process (step S76), and returns to step S72.
  • step S13 of FIG. 2 is the same as Figure 2. It is a flowchart for demonstrating the convergence determination process in step S13.
  • the convergence determination process is executed after the first analysis process in step 12 in FIG. 2, the first analysis result storage area 71 is referred to, and after the second analysis process in step 32 in FIG. When it is executed, the second analysis result storage area 72 is referred to.
  • the external terminal voltage storage area 77 used by the convergence judgment process is used for the process for the linear part (A side in Fig. 2) and for the process for the nonlinear part (B side in Figure 2). And having a region.
  • the linear external terminal and the non-linear external terminal are collectively referred to as external terminals, and linear and non-linear are omitted.
  • the CPU 51 obtains the voltage of the previous external terminal from the external terminal voltage storage area 77 (step S82). Further, the CPU 51 refers to the first analysis result storage area 71 or the second analysis result storage area 72, acquires the voltage of the external terminal from the current analysis result, and stores it in the external terminal voltage storage area 77 (step S83). ).
  • the CPU 51 calculates the difference between the current external terminal voltage and the previous external terminal voltage (step S84), and determines whether the difference is within the allowable error range (step S84). Step S85). If the difference is not within the allowable error range, the CPU 51 sets non-convergence as the convergence determination result (step S85-4).
  • step S84 if it is determined in step S84 that the difference is within the allowable error range, the CPU 51 sets convergence as a convergence determination result (step S86).
  • an analysis step that can be set in advance is created as a plurality of pseudo variable steps, and the LU decomposition result for the linear circuit portion at each pseudo variable step is calculated. .
  • the linear circuit matrix 30 and the non-linear circuit matrix 40 are generated from the circuit matrix 20, it is possible to separately execute the process for the linear circuit and the process for the non-linear circuit. Become. Therefore, the processing for the linear circuit depends on the characteristics of the nonlinear element. Instead, processing can be performed.

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Evolutionary Computation (AREA)
  • Geometry (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)

Abstract

A circuit simulator for simulating a circuit having a linear circuit comprises an LU decomposition result storage area where the analysis of a linear circuit and the results of the LU decomposition of a linear circuit matrix corresponding to the linear section composed of a linear element are associated with each other for each of pseudo-variable step and stored, LU decomposition result read means for reading the results of the LU decomposition corresponding to the pseudo-variable step matching the analyzing step being executing by referring to the LU decomposition result storage area, and first analyzing means for solving a linear circuit matrix equation by using the results of the LU decomposition.

Description

明 細 書  Specification
回路シミュレータ  Circuit simulator
技術分野  Technical field
[0001] 本発明は、回路シミュレータに関し、特に、回路を構成する素子の特性に応じた処 理を行うことによって回路シミュレーションを高速に行う回路シミュレータに関する。 背景技術  TECHNICAL FIELD [0001] The present invention relates to a circuit simulator, and more particularly to a circuit simulator that performs a circuit simulation at a high speed by performing a process according to the characteristics of elements constituting the circuit. Background art
[0002] 汎用の回路シミュレータは、回路を構成する素子の特性が線形的なもの (抵抗'容 量 ·インダクタンスなど)と、線形的でないもの(MOSトランジスタ、ダイオードなど)を 総括的にシミュレーションしている。回路のシミュレーションでは、データ量を大量に 発生させ、処理時間が力かると言った問題があった。  [0002] General-purpose circuit simulators generally simulate the characteristics of the elements that make up a circuit (resistors' capacitance, inductance, etc.) and non-linear characteristics (MOS transistors, diodes, etc.). Yes. In circuit simulation, there was a problem that a large amount of data was generated and processing time was significant.
[0003] そのため、シミュレーション時間を短縮し、シミュレーション結果のデータ量を削減す るために、例えば、特開 2003— 337842号公報 (特許文献 1)は、基本動作を確認 する第一回目のシミュレーションの結果を解析し、回路動作の詳細な解析が必要で あると判断された場合に、解析ステップを細力べ設定して第二回目のシミュレーション を行うことを提案している。  [0003] Therefore, in order to shorten the simulation time and reduce the data amount of the simulation result, for example, Japanese Unexamined Patent Application Publication No. 2003-337842 (Patent Document 1) describes the first simulation for confirming the basic operation. It is proposed to analyze the results and perform a second simulation with detailed analysis steps when it is determined that detailed analysis of the circuit operation is necessary.
[0004] また、設計者の解析時間を削減すると共に回路の収束性を向上させるために、例 えば、特開 2002— 197132号公報 (特許文献 2)は、本解析実施前に被試験回路に おける初期条件の直流特性値を求めるため、入力データに指定されている電源素子 を緩起動特性を有し設定電位に到達後この設定電位を予め定めた収束判定時刻ま で保持する緩起動電源素子に変更し、緩起動期間に予備過渡解析を実行し、収束 判定時刻に到達した時点の被試験回路の各接点の電位をこの被試験回路の動作 点として設定し、この動作点の設定後に本解析を実行することにより、予備過渡解析 中に回路の各節点の変化を計算し、収束判定を行うので、入力データの動作点が求 まった力どうかを自動的に判断することを提案して 、る。  [0004] Further, in order to reduce the analysis time of the designer and improve the convergence of the circuit, for example, Japanese Patent Application Laid-Open No. 2002-197132 (Patent Document 2) describes a circuit under test before performing this analysis. In order to obtain the DC characteristic value of the initial condition, the slow start power supply element that has the slow start characteristic for the power supply element specified in the input data and holds this set potential until a predetermined convergence judgment time after reaching the set potential And perform preliminary transient analysis during the slow start-up period, set the potential of each contact of the circuit under test when the convergence judgment time is reached as the operating point of this circuit under test, and set this operating point after setting this operating point. By executing the analysis, the change of each node of the circuit is calculated during the preliminary transient analysis, and the convergence is judged, so it is proposed to automatically determine whether the operating point of the input data is obtained. RU
[0005] 更に、解曲線の追跡を高安定及び高精度とするために、例えば、特開 2002- 318 990号公報 (特許文献 3)は、誤差の推定値と誤差の許容値との比較結果に基づい て、小さなステップ幅を計算することによって、最適なステップ幅に制御することを提 案している。 [0005] Further, in order to make tracking of the solution curve highly stable and accurate, for example, Japanese Patent Laid-Open No. 2002-318990 (Patent Document 3) discloses a comparison result between an estimated error value and an allowable error value. Based on the above, it is proposed to control the optimal step width by calculating a small step width. I am planning.
特許文献 1:特開 2003 - 337842号公報  Patent Document 1: Japanese Unexamined Patent Publication No. 2003-337842
特許文献 2 :特開 2002— 197132号公報  Patent Document 2: JP 2002-197132 A
特許文献 3 :特開 2002— 318990号公報  Patent Document 3: Japanese Patent Laid-Open No. 2002-318990
発明の開示  Disclosure of the invention
発明が解決しょうとする課題  Problems to be solved by the invention
[0006] 回路は線形素子と非線形素子とで構成され、線形素子の特性は、電流変化 Z電 圧変化比が電圧に因らず一定であるが、非線形素子の特性は、電流変化 Z電圧変 化比が一定でない。そのため、回路を解析する場合、非線形素子の特性によって縮 められた解析ステップにて、線形素子に対しても同時に処理が行われるため、不要 な解析ステップにて処理が行われると言った問題があった。  [0006] The circuit is composed of a linear element and a nonlinear element, and the characteristic of the linear element is constant regardless of the current change Z voltage change ratio, but the characteristic of the nonlinear element is the current change Z voltage change. The conversion ratio is not constant. For this reason, when analyzing a circuit, processing is also performed on linear elements at the same time as analysis steps reduced by the characteristics of nonlinear elements. there were.
[0007] 上述したような従来の回路シミュレーションでは、線形素子の特性と、非線形素子の 特性との違 、を考慮したシミュレーション方法が提案されて 、な 、ため、回路を構成 する素子の特性を考慮した効率的な解析を行うことができない。  [0007] In the conventional circuit simulation as described above, a simulation method that considers the difference between the characteristics of a linear element and the characteristics of a nonlinear element has been proposed. Therefore, the characteristics of the elements constituting the circuit are considered. Efficient analysis cannot be performed.
[0008] 本発明はこのような問題点に鑑みてなされたものであり、回路を構成する素子の特 性に応じた処理を行うことによって回路シミュレーションを高速に行う回路シミュレータ を提供することを目的とする。  The present invention has been made in view of such problems, and an object of the present invention is to provide a circuit simulator that performs circuit simulation at a high speed by performing processing according to the characteristics of elements constituting the circuit. And
課題を解決するための手段  Means for solving the problem
[0009] 上記課題を解決するため、本発明は、線形回路を含む回路をシミュレーションする 回路をシミュレーションする回路シミュレータであって、線形回路の解析について、複 数の擬似可変ステップ毎に、線形素子で構成される線形部に相当する線形回路行 列の LU分解の結果を対応させて記憶する LU分解結果記憶領域と、前記 LU分解 結果記憶領域を参照して、実行中の解析ステップと一致する前記擬似可変ステップ の対応する前記 LU分解結果を読み出す LU分解結果読出手段と、前記 LU分解結 果を用いて線形回路行列方程式を解く第一解析手段とを有するように構成される。  [0009] In order to solve the above problems, the present invention provides a circuit simulator for simulating a circuit including a linear circuit, wherein the linear circuit is analyzed with a linear element for each of a plurality of pseudo-variable steps. An LU decomposition result storage area that stores the LU decomposition result of the linear circuit matrix corresponding to the configured linear part in association with the LU decomposition result storage area, and matches the analysis step being executed with reference to the LU decomposition result storage area An LU decomposition result reading unit that reads the LU decomposition result corresponding to the pseudo variable step and a first analysis unit that solves a linear circuit matrix equation using the LU decomposition result are configured.
[0010] このような回路シミュレータでは、回路構成の線形部に対する解析ステップを解析 処理の開始から終了まで、ユーザが指定した解析ステップに基づいて、予め想定し たいくつかの解析ステップを用いて、また、予め算出した LU分解結果を用いるため、 解析処理を高速にて行うことが可能となる。従って、回路全体の解析処理を高速で行 えるようになる。 [0010] In such a circuit simulator, the analysis step for the linear part of the circuit configuration is analyzed from the start to the end of the analysis process, based on the analysis steps specified by the user, using several analysis steps assumed in advance, In addition, in order to use the pre-calculated LU decomposition result, Analysis processing can be performed at high speed. Therefore, analysis processing of the entire circuit can be performed at high speed.
[0011] 上記課題を解決するための手段として、本発明は、回路シミュレーション方法、また [0011] As means for solving the above problems, the present invention provides a circuit simulation method,
、回路シミュレーション処理をコンピュータに行わせるプログラムを記憶したコンビユー タ読み取り可能な記憶媒体とすることもできる。 Also, a computer-readable storage medium storing a program for causing a computer to perform circuit simulation processing can be used.
発明の効果  The invention's effect
[0012] 本発明によれば、回路構成の線形部に対する解析ステップを解析処理の開始から 終了まで、ユーザが指定した解析ステップに基づいて、予め想定したいくつかの解析 ステップを用いて、また、予め算出した LU分解結果を用いるため、解析処理を高速 にて行うことが可能となる。従って、回路全体の解析処理を高速で行えるようになる。 図面の簡単な説明  [0012] According to the present invention, the analysis step for the linear portion of the circuit configuration is performed from the start to the end of the analysis process, based on the analysis step specified by the user, using several analysis steps assumed in advance, Since the LU decomposition result calculated in advance is used, analysis processing can be performed at high speed. Accordingly, the analysis process for the entire circuit can be performed at high speed. Brief Description of Drawings
[0013] [図 1]本発明の一実施形態に係るシミュレータのハードウェア構成を示すブロック図で ある。  FIG. 1 is a block diagram showing a hardware configuration of a simulator according to an embodiment of the present invention.
[図 2]本発明の実施形態に係る回路シミュレーション処理の概要を説明するためのフ ローチャート図である。  FIG. 2 is a flowchart for explaining an outline of circuit simulation processing according to the embodiment of the present invention.
[図 3]回路行列を用いた分割処理を説明するための略図である。 FIG. 3 is a schematic diagram for explaining division processing using a circuit matrix.
[図 4]図 2のステップ S12にて行われる線形回路を解析する第一解析処理を説明する ためのフローチャート図である。  FIG. 4 is a flowchart for explaining a first analysis process for analyzing a linear circuit performed in step S12 of FIG.
[図 5]次の解析ステップ決定処理を説明するためのフローチャート図である。  FIG. 5 is a flowchart for explaining the next analysis step determination process.
[図 6]図 2のステップ S32にて行われる非線形回路を解析する第二解析処理を説明 するためのフローチャート図である。  FIG. 6 is a flowchart for explaining a second analysis process for analyzing the nonlinear circuit performed in step S32 of FIG.
[図 7]図 2のステップ S13での収束判断処理を説明するためのフローチャート図であ る。  FIG. 7 is a flowchart for explaining the convergence determination process in step S13 of FIG.
符号の説明  Explanation of symbols
[0014] 20 回路行列 [0014] 20 circuit matrix
30 線形回路行列  30 linear circuit matrix
31 線形要素部  31 Linear element
32 線形外部端子部 40 非線形回路行列 32 Linear external terminal 40 Nonlinear circuit matrix
41 非線形要素部  41 Nonlinear elements
42 非線形外部端子部  42 Nonlinear external terminal
51 CPU  51 CPU
52 メモリユニット  52 Memory unit
53 表 ユニット  53 Table Unit
54 出力ユニット  54 Output unit
55 入力ユニット  55 Input unit
56 通 1 ユニット  56 1 unit
57 記憶装置  57 Storage device
58 ドライノ  58 Dryino
59 記憶媒体  59 Storage media
71 第一解析結果記憶領域  71 First analysis result storage area
72 第二解析結果記憶領域  72 Second analysis result storage area
75 結合結果記憶領域  75 Join result storage area
80 擬似可変ステップ記憶領域  80 Pseudo variable step storage area
81 LU分解結果記憶領域  81 LU decomposition result storage area
100 シミュレータ  100 simulator
発明を実施するための最良の形態  BEST MODE FOR CARRYING OUT THE INVENTION
[0015] 以下、本発明の実施形態を図面に基づいて説明する。  Hereinafter, embodiments of the present invention will be described with reference to the drawings.
[0016] 本発明では、回路を構成する素子のうち、抵抗、容量、インダクタンスなどの特性が 線形的な素子による構成部分を線形部とし、また、 MOSトランジスタ、ダイオードなど の特性が非線形的な素子による構成部分を非線形部とし、線形部の線形回路と非 線形部の非線形回路に対する解析処理を個別に行うことによって、回路シミュレーシ ヨン処理をより高速に行うことを実現する。  [0016] In the present invention, among the elements constituting the circuit, a component part composed of elements having linear characteristics such as resistance, capacitance, and inductance is defined as a linear part, and an element having non-linear characteristics such as a MOS transistor and a diode. By implementing the analysis part for the linear part of the linear part and the nonlinear part of the nonlinear part separately, the circuit simulation process can be performed at a higher speed.
[0017] 本実施形態におけるシミュレータ 100は、例えば、図 1に示すようなハードウェア構 成を有する。図 1は、本発明の一実施形態に係るシミュレータのハードウェア構成を 示すブロック図である。 [0018] 図 1において、シミュレータ 100は、コンピュータによって制御される端末であって、 CPU (Central Processing Unit) 51と、メモリユニット 52と、表示ユニット 53と、出力ュ ニット 54と、入力ユニット 55と、通信ユニット 56と、記憶装置 57と、ドライバ 58とで構 成され、システムバス Bに接続される。 The simulator 100 in the present embodiment has a hardware configuration as shown in FIG. 1, for example. FIG. 1 is a block diagram showing a hardware configuration of a simulator according to an embodiment of the present invention. In FIG. 1, a simulator 100 is a terminal controlled by a computer, and includes a CPU (Central Processing Unit) 51, a memory unit 52, a display unit 53, an output unit 54, and an input unit 55. The communication unit 56, the storage device 57, and the driver 58 are connected to the system bus B.
[0019] CPU51は、メモリユニット 52に格納されたプログラムに従ってシミュレータ 100を制 御する。メモリユニット 52は、 RAM (Random Access Memory)及び ROM (Read- Only Memory)等にて構成され、 CPU51にて実行されるプログラム、 CPU51での処理に 必要なデータ、 CPU51での処理にて得られたデータ等を格納する。また、メモリュ- ット 52の一部の領域力 CPU51での処理に利用されるワークエリアとして割り付けら れている。  The CPU 51 controls the simulator 100 according to a program stored in the memory unit 52. The memory unit 52 is composed of RAM (Random Access Memory), ROM (Read-Only Memory), etc., and is obtained by a program executed by the CPU 51, data necessary for processing by the CPU 51, and processing by the CPU 51. Stored data. Also, a part of the memory capacity 52 is allocated as a work area used for processing by the CPU 51.
[0020] 表示ユニット 53は、 CPU51の制御のもとに必要な各種情報を表示する。出力ュ- ット 54は、プリンタ等を有し、利用者からの指示に応じて各種情報を出力するために 用いられる。入力ユニット 55は、マウス、キーボード等を有し、利用者がシミュレータ 1 00で処理を行なうための必要な各種情報を入力するために用いられる。通信ュ-ッ ト 56は、シミュレータ 100が例えばインターネット、 LAN (Local Area Network)等を介 して外部装置と接続する場合に、シミュレータ 100と外部装置との間の通信制御をす るための装置である。記憶装置 57は、例えば、ハードディスクユニットにて構成され、 各種処理を実行するプログラム等のデータを格納する。  The display unit 53 displays various information necessary under the control of the CPU 51. The output unit 54 has a printer or the like and is used for outputting various information in accordance with instructions from the user. The input unit 55 includes a mouse, a keyboard, and the like, and is used for a user to input various information necessary for processing with the simulator 100. The communication unit 56 is a device for controlling communication between the simulator 100 and the external device when the simulator 100 is connected to the external device via, for example, the Internet or a LAN (Local Area Network). It is. The storage device 57 is composed of, for example, a hard disk unit, and stores data such as programs for executing various processes.
[0021] シミュレータ 100よって行われる処理を実現するプログラムは、例えば、 CD-ROM  [0021] A program for realizing the processing performed by the simulator 100 is, for example, a CD-ROM.
(Compact Disc Read- Only Memory)等の記憶媒体 59によってシミュレータ 100に提 供される。即ち、プログラムが保存された記憶媒体 59がドライバ 58にセットされると、 ドライバ 58が記憶媒体 59からプログラムを読み出し、その読み出されたプログラムが システムバス Bを介して記憶装置 57にインストールされる。そして、プログラムが起動 されると、記憶装置 57にインストールされたプログラムに従って CPU51がその処理を 開始する。尚、プログラムを格納する媒体として CD— ROMに限定するものではなく 、コンピュータが読み取り可能な媒体であればよい。本発明に係る処理を実現するプ ログラムは、通信ユニット 56によってネットワークを介してダウンロードし、記憶装置 57 にインスト一ノレするようにしても良 、。 [0022] CPU51によって実行される本発明の実施形態に係る回路シミュレーション処理で は、回路行列を用いて回路を線形部と非線形部とに分割し、線形部に対応する第一 解析処理を行い、非線形部に対する第二解析処理を行い、それら解析結果を波形 緩和法によって収束させる。 Provided to the simulator 100 by a storage medium 59 such as (Compact Disc Read-Only Memory). That is, when the storage medium 59 storing the program is set in the driver 58, the driver 58 reads the program from the storage medium 59, and the read program is installed in the storage device 57 via the system bus B. . When the program is activated, the CPU 51 starts its processing according to the program installed in the storage device 57. The medium for storing the program is not limited to a CD-ROM, and any medium that can be read by a computer may be used. The program for realizing the processing according to the present invention may be downloaded via the network by the communication unit 56 and installed in the storage device 57. [0022] In the circuit simulation process according to the embodiment of the present invention executed by the CPU 51, the circuit is divided into a linear part and a nonlinear part using a circuit matrix, and a first analysis process corresponding to the linear part is performed. The second analysis process is performed on the nonlinear part, and the analysis results are converged by the waveform relaxation method.
[0023] 図 2は、本発明の実施形態に係る回路シミュレーション処理の概要を説明するため のフローチャート図である。  FIG. 2 is a flowchart for explaining an outline of the circuit simulation processing according to the embodiment of the present invention.
[0024] 図 2に示すフローチャートにおいて、 A側での処理が線形部に対する処理であり、 B 側での処理が非線形部に対する処理である。 CPU51は、ユーザの入力によって回 路データを取得し (ステップ Sl)、回路行列を生成する (ステップ 2)。ユーザは、素子 間を接続するための結線情報と、解析ステップなどの解析制御情報を入力する。 CP U51は、回路行列を用いて回路を線形部と非線形部とに分割する分割処理を行う( ステップ S3)。  In the flowchart shown in FIG. 2, the process on the A side is a process for the linear part, and the process on the B side is a process for the nonlinear part. The CPU 51 acquires circuit data according to user input (step Sl) and generates a circuit matrix (step 2). The user inputs connection information for connecting elements and analysis control information such as analysis steps. The CPU 51 performs a dividing process of dividing the circuit into a linear part and a nonlinear part using the circuit matrix (step S3).
[0025] まず、 A側の線形部に対する処理について説明する。 CPU51は、回路行列内の 非線形部に属する非線形外部端子をゼロ (0)に初期化して (ステップ S11)、線形回 路を解析する第一解析処理を行う (ステップ S 12)。  First, the process for the linear part on the A side will be described. The CPU 51 initializes the nonlinear external terminal belonging to the nonlinear part in the circuit matrix to zero (0) (step S11), and performs a first analysis process for analyzing the linear circuit (step S12).
[0026] 波形緩和ループにおいて、初回解析である力否かを判断する (ステップ S 12— 2)。 In the waveform relaxation loop, it is determined whether or not the force is the initial analysis (step S 12-2).
初回の解析であるとき、 CPU51は、線形回路の解析結果を、電圧源として非線形回 路に属する線形外部端子に接続する (ステップ 15)  In the first analysis, the CPU 51 connects the analysis result of the linear circuit as a voltage source to the linear external terminal belonging to the nonlinear circuit (step 15).
一方、波形緩和ループにおいて、 2回目以降の解析であるとき、第一解析処理によ る解析結果に基づ 、て、収束判断処理を実行して非線形回路の非線形外部端子の 電圧が収束したか否かを判断する (ステップ S 13)、収束判断結果が未収束であるこ とを示すか否かを判断する (ステップ S 14)。  On the other hand, in the waveform relaxation loop, when it is the second or later analysis, whether the voltage at the nonlinear external terminal of the nonlinear circuit has converged by executing the convergence judgment process based on the analysis result of the first analysis process. (Step S13), it is determined whether or not the convergence determination result indicates unconvergence (Step S14).
[0027] ステップ S14にて収束判断結果が未収束であることを示す場合、 CPU51は、非線 形回路の解析結果を、電圧源として非線形回路に属する非線形外部端子に接続す る(ステップ S 15)。 [0027] When the convergence determination result indicates that the convergence is not converged in step S14, the CPU 51 connects the analysis result of the nonlinear circuit to the nonlinear external terminal belonging to the nonlinear circuit as a voltage source (step S15 ).
[0028] 一方、ステップ S14にて収束判断結果が収束を示す場合、線形回路の解析結果と 非線形回路の解析結果に基づいて結合した結合結果を結合結果記憶領域 75に出 力して (ステップ S16)、回路シミュレーションを終了する。 [0029] 次に、 B側の非線形部に対する処理について説明する。ステップ S3の後、 CPU51 は、回路行列内の線形部に属する線形外部端子をゼロ(0)に初期化して (ステップ S 31)、非線形回路を解析する第二解析処理を行う (ステップ S32)。 [0028] On the other hand, if the convergence determination result indicates convergence in step S14, the combined result based on the analysis result of the linear circuit and the analysis result of the nonlinear circuit is output to the combined result storage area 75 (step S16). ), The circuit simulation is terminated. [0029] Next, processing for the nonlinear part on the B side will be described. After step S3, the CPU 51 initializes the linear external terminal belonging to the linear part in the circuit matrix to zero (0) (step S31), and performs a second analysis process for analyzing the nonlinear circuit (step S32).
[0030] 波形緩和ループにお!、て、初回解析である力否かを判断する (ステップ S32— 2)。  [0030] In the waveform relaxation loop, it is determined whether or not the force is the first analysis (step S32-2).
初回の解析であるとき、 CPU51は、非線形回路の解析結果を、電圧源として線形回 路に属する非線形外部端子に接続する (ステップ 35)  In the first analysis, the CPU 51 connects the analysis result of the nonlinear circuit as a voltage source to the nonlinear external terminal belonging to the linear circuit (step 35).
一方、波形緩和ループにおいて、 2回目以降の解析であるとき、第二解析処理によ る解析結果に基づ 、て、収束判断処理を実行して線形回路の線形外部端子の電圧 が収束したカゝ否かを判断する (ステップ S 13)、収束判断結果が未収束であることを 示すか否かを判断する (ステップ S 14)。  On the other hand, in the waveform relaxation loop, when the analysis is performed for the second time and thereafter, the convergence judgment process is executed based on the analysis result of the second analysis process, and the voltage at which the linear external terminal voltage of the linear circuit has converged. Judgment is made (step S13), and it is judged whether or not the convergence judgment result indicates unconvergence (step S14).
[0031] ステップ S14にて収束判断結果が未収束であることを示す場合、 CPU51は、線形 回路の解析結果を、電圧源として線形回路に属する線形外部端子に接続する (ステ ップ S35)。  [0031] When the convergence determination result indicates that the convergence is not converged in step S14, the CPU 51 connects the analysis result of the linear circuit to a linear external terminal belonging to the linear circuit as a voltage source (step S35).
[0032] 一方、ステップ S14にて収束判断結果が収束を示す場合、線形回路の解析結果と 非線形回路の解析結果に基づいて結合した結合結果を結合結果記憶領域 75に出 力して (ステップ S16)、回路シミュレーションを終了する。  On the other hand, when the convergence determination result indicates convergence in step S14, the combined result based on the analysis result of the linear circuit and the analysis result of the nonlinear circuit is output to the combined result storage area 75 (step S16). ), The circuit simulation is terminated.
[0033] 図 2のステップ S3における回路行列を用いて回路を線形部と非線形部とに分割す る分割処理と、波形緩和ループによる結合処理とについて、図 3に示す略図で説明 する。図 3は、回路行列を用いた分割処理を説明するための略図である。  [0033] The dividing process for dividing the circuit into a linear part and a nonlinear part using the circuit matrix in step S3 of FIG. 2 and the coupling process by the waveform relaxation loop will be described with reference to the schematic diagram shown in FIG. FIG. 3 is a schematic diagram for explaining division processing using a circuit matrix.
[0034] 図 3において、図 2のステップ S2によって生成された回路全体の回路行列 20に対 して、例えば、非線形部がサブサーキットとして構成されている場合、 CPU51は、回 路構成を記述している回路構成データ力 非線形回路を呼び出しているサブサーキ ットを削除することによって、線形回路部分と非線形回路部分との分割を行う。  In FIG. 3, for example, when the non-linear portion is configured as a subcircuit, the CPU 51 describes the circuit configuration with respect to the circuit matrix 20 of the entire circuit generated in step S2 of FIG. The data capacity of the circuit is divided by deleting the sub-circuit that calls the nonlinear circuit, thereby dividing the linear circuit part and the nonlinear circuit part.
[0035] 例えば、回路が PCB (Printed Circuit Board)と LSI (Large Scale Integration)とが一 体化した回路構成である場合、 PCB上に搭載される LSI回路がサブサーキットとして 定義されており、 PCBの回路構成を記述した回路構成データ力もサブサーキットを 呼び出すことによって、 LSIと一体化してモデル化している。  [0035] For example, if the circuit has a circuit configuration in which PCB (Printed Circuit Board) and LSI (Large Scale Integration) are integrated, the LSI circuit mounted on the PCB is defined as a sub-circuit. The circuit configuration data power that describes the circuit configuration is also modeled by integrating it with the LSI by calling the subcircuit.
[0036] LSI内部は、抵抗、容量、インダクタンスの他に mosfetなどの非線形素子によって 記述されている。このような回路モデルにおいて、サブサーキットの外部端子が PCB との接続部分 (パッケージのピンなど)である。 PCBと LSIの接続部分には、微小抵抗 が直列接続されている。 [0036] In addition to resistors, capacitors, and inductances, LSI interiors use non-linear elements such as mosfet. is described. In such a circuit model, the external terminal of the subcircuit is the connection part to the PCB (such as a package pin). A small resistor is connected in series at the connection between the PCB and LSI.
[0037] 従って、サブサーキットを削除した回路構成力も得られる回路行列を線形要素部 3 1とし、 LSIに相当する部分を非線形要素部 41とすることによって、線形回路部分と 非線形回路部分とを分割することができる。  [0037] Therefore, by dividing the linear circuit portion and the non-linear circuit portion by setting the circuit matrix that can also obtain the circuit configuration power from which the sub-circuit is removed as the linear element portion 31 and the portion corresponding to the LSI as the non-linear element portion 41. can do.
[0038] そして、非線形要素部 41と、非線形外部端子部 42と、線形端子部 32とによって、 非線形回路行列 40が生成される。また、線形要素部 31と、非線形外部端子部 42と 、線形端子部 32とによって、線形回路行列 30が生成される。  Then, a nonlinear circuit matrix 40 is generated by the nonlinear element unit 41, the nonlinear external terminal unit 42, and the linear terminal unit 32. In addition, a linear circuit matrix 30 is generated by the linear element unit 31, the nonlinear external terminal unit 42, and the linear terminal unit 32.
[0039] このように生成された、すなわち回路行列 20から分離された線形回路行列 30と非 線形回路行列 40とは、夫々所定の記憶領域に格納されて、第一解析処理及び第二 解析処理と、波形緩和ループ(図 2のステップ S 12からステップ S 15の繰り返し処理 及びステップ S32からステップ S35の繰り返し処理)とによる処理の間使用される。  [0039] The linear circuit matrix 30 and the non-linear circuit matrix 40 generated in this way, that is, separated from the circuit matrix 20, are stored in predetermined storage areas, respectively, and the first analysis process and the second analysis process are performed. And the waveform relaxation loop (repeating process from step S12 to step S15 and repeating process from step S32 to step S35 in FIG. 2).
[0040] 図 2の A側の線形部に対する処理では、線形回路行列 30が参照される。ステップ S 11にて線形回路行列 30の非線形外部端子部 42が OV (電圧ゼロ)に初期化され、ス テツプ S12にて線形回路行列 30を用いて線形回路を解析する(第一解析処理)。ま た、ステップ S15にて、波形緩和ループによって線形回路行列 30の非線形外部端 子部 42 (非線形外部端子の電圧)が収束するまで、ステップ S32で取得した非線形 回路の解析結果 (非線形外部端子の電圧)が、線形回路行列 30の非線形外部端子 部 42に設定される。  In the processing for the linear part on the A side in FIG. 2, the linear circuit matrix 30 is referred to. In step S11, the nonlinear external terminal 42 of the linear circuit matrix 30 is initialized to OV (voltage zero), and in step S12, the linear circuit is analyzed using the linear circuit matrix 30 (first analysis process). Also, in step S15, the nonlinear circuit analysis result obtained in step S32 (nonlinear external terminal voltage) is obtained until the nonlinear external terminal part 42 (nonlinear external terminal voltage) of the linear circuit matrix 30 is converged by the waveform relaxation loop. Voltage) is set to the nonlinear external terminal portion 42 of the linear circuit matrix 30.
[0041] 同様に、図 2の B側の非線形部に対する処理では、非線形回路行列 40が参照され る。ステップ S31にて非線形回路行列 40の線形外部端子部 32が 0V (電圧ゼロ)に 初期化され、ステップ S32にて非線形回路行列 40を用いて非線形回路を解析する( 第二解析処理)。また、ステップ S35にて、波形緩和ループによって非線形回路行列 40の線形外部端子部 32 (線形外部端子の電圧)が収束するまで、ステップ S12で取 得した線形回路の解析結果 (線形外部端子の電圧)が、非線形回路行列 40の線形 外部端子部 32に設定される。  Similarly, in the process for the nonlinear part on the B side in FIG. 2, the nonlinear circuit matrix 40 is referred to. In step S31, the linear external terminal 32 of the nonlinear circuit matrix 40 is initialized to 0 V (voltage zero), and in step S32, the nonlinear circuit is analyzed using the nonlinear circuit matrix 40 (second analysis process). Also, in step S35, until the linear external terminal 32 (linear external terminal voltage) of the nonlinear circuit matrix 40 is converged by the waveform relaxation loop, the linear circuit analysis result (linear external terminal voltage) obtained in step S12 is converged. ) Is set in the linear external terminal portion 32 of the nonlinear circuit matrix 40.
[0042] 本実施例では、線形外部端子の電圧を折れ線電源として定義し、非線形外部端子 に接続する。同様に、非線形外部端子の電圧を折れ線電源として定義し、線形外部 端子に接続する。 In this embodiment, the voltage at the linear external terminal is defined as a polygonal power supply, and the nonlinear external terminal Connect to. Similarly, the voltage at the nonlinear external terminal is defined as a polygonal line power supply and connected to the linear external terminal.
[0043] 従って、互いに他方の解析結果を用いることによって、線形外部端子 32と非線形 外部端子部 42の電圧が収束した時、線形回路行列 30と非線形回路行列 40とが結 合したと見なすことができる。  [0043] Therefore, by using the analysis results of the other, it can be considered that the linear circuit matrix 30 and the nonlinear circuit matrix 40 are combined when the voltages at the linear external terminal 32 and the nonlinear external terminal section 42 converge. it can.
[0044] 次に、図 2のステップ S12にて行われる線形回路を解析する第一解析処理につい て図 4で説明する。図 4は、図 2のステップ S 12にて行われる線形回路を解析する第 一解析処理を説明するためのフローチャート図である。  Next, the first analysis process for analyzing the linear circuit performed in step S12 of FIG. 2 will be described with reference to FIG. FIG. 4 is a flowchart for explaining a first analysis process for analyzing the linear circuit performed in step S12 of FIG.
[0045] 線形部が電流変化に対する電圧変化の比は電圧に因らず一定である。従って、図 4に示す第一解析処理では、予め数種類の解析ステップを擬似可変ステップとして 用意しておき、解析ステップ毎に線形回路行列 30を計算して記憶領域に保存してお き、解析ステップに対応した線形回路行列 30を参照して回路方程式の解を求めるこ とを繰り返す。  [0045] The ratio of the voltage change to the current change in the linear portion is constant regardless of the voltage. Therefore, in the first analysis process shown in FIG. 4, several types of analysis steps are prepared in advance as pseudo-variable steps, and the linear circuit matrix 30 is calculated and stored in the storage area for each analysis step. Repeat the process of finding the solution of the circuit equation with reference to the linear circuit matrix 30 corresponding to.
[0046] 先ず、 CPU51は、ユーザに指定された解析ステップを A tとする(ステップ S51)。 C PU51は、図 2のステップ S1にてユーザから取得しておいた解析制御情報から A tを 取得して解析ステップとする。  First, the CPU 51 sets the analysis step designated by the user as At (step S51). The CPU 51 acquires At from the analysis control information acquired from the user in step S1 in FIG. 2 and sets it as the analysis step.
[0047] CPU51は、解析ステップ A tを用いて、複数の擬似可変ステップ AtZ2、 A t/4, • · ·、 2 Δ t、 4 Δ t、 · · ·を決定して、擬似可変ステップ記憶領域 80に格納する (ステツ プ S52)。ユーザが指定した解析ステップ A tに対して、その 1Z2、 1/4, 1/8, 1/ 16、 · · ·、 2倍、 4倍、 8倍、 16倍、 · · ·のように等比数列的な倍数を擬似可変ステップ として予め決定しておいてもよい。また、ユーザが指定した解析ステップ A tに対して 、 1/2, 1/3, 1/4, 1/5, · · ·、 2倍、 3倍、 4倍、 5倍、 · · ·のように等差数列的な 倍数を擬似可変ステップとして予め決定してぉ 、てもよ 、。このように複数の擬似可 変ステップとして量子化しておく。  [0047] The CPU 51 determines a plurality of pseudo variable steps AtZ2, At / 4, ···, 2Δt, 4Δt, ··· using the analysis step At, and stores the pseudovariable steps. Store in area 80 (step S52). For analysis step At specified by user, 1Z2, 1/4, 1/8, 1/16, ..., 2 times, 4 times, 8 times, 16 times, etc. A multiple in a ratio sequence may be determined in advance as a pseudo variable step. Also, for analysis step At specified by the user, 1/2, 1/3, 1/4, 1/5, ..., 2 times, 3 times, 4 times, 5 times, ... Thus, it is also possible to predetermine the multiple of the arithmetic progression as a pseudo variable step. In this way, quantization is performed as a plurality of pseudo-variable steps.
[0048] そして、 CPU51は、各擬似可変ステップに対応する回路行列要素を計算して、回 路行列要素を LU分解した結果として LU分解後の回路行列を擬似可変ステップと対 応付けて LU分解結果記憶領域 81に保存する (ステップ S53)。  [0048] Then, the CPU 51 calculates circuit matrix elements corresponding to each pseudo-variable step, and as a result of LU-decomposing the circuit matrix elements, the circuit matrix after LU decomposition is associated with the pseudo-variable steps and LU-decomposed. The result is stored in the result storage area 81 (step S53).
[0049] CPU51は、解析ステップ Δ tを現在解析時刻 time— preとに設定しておく。また、 ユーザ力 取得した解析制御情報力 解析を開始して終了するまでの時間を取得し て最終解析時刻 time— endに設定する。 The CPU 51 sets the analysis step Δt to the current analysis time time-pre. Also, User force Acquired analysis control information force Obtain the time from the start to the end of the analysis and set it to the final analysis time time-end.
[0050] その後、 CPU51は、現在解析時刻 time— preが最終解析時刻 time— endとなつ たカゝ否かを判断する (ステップ S54)。  [0050] Thereafter, the CPU 51 determines whether or not the current analysis time time-pre has reached the final analysis time time-end (step S54).
[0051] 現在解析時刻 time— preが最終解析時刻 time— endとなった場合、第一解析処 理を終了する。一方、ステップ S54において、現在解析時刻 time— preが最終解析 時刻 time— endとなっていない場合、 CPU51は、 LU分解結果記憶領域 81から解 析ステップ A tに一致する擬似可変ステップを検索し、その擬似可変ステップに対応 する LU分解結果を読み出す (ステップ S55)。  [0051] When the current analysis time time-pre becomes the final analysis time time-end, the first analysis process is terminated. On the other hand, if the current analysis time time-pre is not the final analysis time time-end in step S54, the CPU 51 searches the LU decomposition result storage area 81 for a pseudo variable step that matches the analysis step At, The LU decomposition result corresponding to the pseudo variable step is read (step S55).
[0052] そして、 CPU51は、 LU分解結果記憶領域 81から読み出した LU分解結果を用い て回路方程式を、前進代入及び後退代入を行いながら-ユートン反復処理を行うこと によって収束解を得る (ステップ S56)。 CPU51は、その収束解を第一解析結果とし て第一解析結果記憶領域 71へ出力する (ステップ S57)。  [0052] Then, the CPU 51 obtains a converged solution by performing Yuton iteration while performing forward substitution and backward substitution on the circuit equation using the LU decomposition result read from the LU decomposition result storage area 81 (step S56). ). The CPU 51 outputs the convergence solution as the first analysis result to the first analysis result storage area 71 (step S57).
[0053] その後、 CPU51は、解析ステップ A tを前回ステップ A t— preに設定して、次の解 析ステップ決定処理を行い(ステップ S 58)、ステップ S54へと戻る。  [0053] Thereafter, the CPU 51 sets the analysis step At to the previous step At-pre, performs the next analysis step determination process (step S58), and returns to step S54.
[0054] 次の解析ステップ決定処理について図 5で説明する。図 5は、次の解析ステップ決 定処理を説明するためのフローチャート図である。図 5において、 CPU51は、前回ス テツプ Δ t— preの 2倍を次のステップ Δ t— nextに設定する(ステップ S61)。  The next analysis step determination process will be described with reference to FIG. FIG. 5 is a flowchart for explaining the next analysis step determination process. In FIG. 5, the CPU 51 sets twice the previous step Δt—pre as the next step Δt—next (step S61).
[0055] そして、 CPU51は、現在解析時刻 time— preに次のステップ A t— nextをカ卩えた 値力 折れ線電源の次の定義時刻 time— defを超えている力否かを判断する (ステ ップ S62)。折れ線電源の次の定義時刻 time— defを超えていない場合、ステップ S 64へと進む。  [0055] Then, the CPU 51 determines whether the power exceeds the current analysis time time-pre and the next step At-next, which is the value of the broken line power supply. S62). If the next defined time time-def of the broken line power supply is not exceeded, the process proceeds to step S64.
[0056] 一方、ステップ S62にお!/、て、折れ線電源の次の定義時刻 time— defを超えて!/ヽ る場合、次のステップ A t— nextに、次の定義時刻 time— defから現在解析時刻 tim e_preを減算した値を設定する (ステップ S63)。  [0056] On the other hand, if the next defined time time-def is exceeded in step S62! /, The next defined time time-def will be entered in the next step At-next. A value obtained by subtracting the current analysis time time_pre is set (step S63).
[0057] このようなステップ S62の判断によって、波形変化のない状態での解析ステップを 伸長させておくことができる。  [0057] By such a determination in step S62, the analysis step in a state where there is no waveform change can be extended.
[0058] そして、 CPU51は、擬似可変ステップ記憶領域 80を参照して、予め定義しておい た擬似可変ステップのうち、最も次のステップ Δ t— nextに近 、値の擬似可変ステツ プを選択し、その擬似可変ステップを解析ステップ A tに設定し (ステップ S64)、次の 解析ステップ決定処理を終了する。 Then, the CPU 51 refers to the pseudo variable step storage area 80 and defines it in advance. The pseudo-variable step closest to the next step Δ t—next is selected, the pseudo-variable step of the value is selected, the pseudo-variable step is set as the analysis step At (step S64), and the next analysis step is determined. The process ends.
[0059] 次に、図 2のステップ S32にて行われる非線形回路を解析する第二解析処理につ いて図 6で説明する。図 6は、図 2のステップ S32にて行われる非線形回路を解析す る第二解析処理を説明するためのフローチャート図である。  Next, the second analysis process for analyzing the nonlinear circuit performed in step S32 in FIG. 2 will be described with reference to FIG. FIG. 6 is a flowchart for explaining the second analysis process for analyzing the nonlinear circuit performed in step S32 of FIG.
[0060] 非線形部の電流変化に対する電圧変化の比は一定ではない。従って、図 6に示す 第二解析処理では、非線形部の電流変化に対する電圧変化の比が大き!、状態では 、解析ステップを細力べし、この比が小さい状態では解析ステップを大きくして、その 解析ステップにて非線形回路行列の要素を算出し、 LU分解を行い、そして回路方 程式の解を求めることを繰り返す。  [0060] The ratio of the voltage change to the current change in the nonlinear portion is not constant. Therefore, in the second analysis process shown in FIG. 6, the ratio of the voltage change to the current change in the non-linear part is large! In the state, the analysis step is emphasized, and in the state where this ratio is small, the analysis step is enlarged. In the analysis step, the elements of the nonlinear circuit matrix are calculated, LU decomposition is performed, and the solution of the circuit equation is obtained repeatedly.
[0061] 先ず、 CPU51は、ユーザに指定された解析ステップを A tとする (ステップ S71)。  First, the CPU 51 sets an analysis step designated by the user as At (step S71).
[0062] CPU51は、解析ステップ Δ tを前回ステップ Δ t— preと、現在解析時刻 time— pre とに設定しておく。また、ユーザから取得した解析制御情報力 解析を開始して終了 するまでの時間を取得して最終解析時刻 time— endに設定する。その後、 CPU51 は、現在解析時刻 time— preが最終解析時刻 time— endとなったか否かを判断す る(ステップ S 72)。  The CPU 51 sets the analysis step Δt to the previous step Δt-pre and the current analysis time time-pre. Also, the time from the start to the end of the analysis control information force analysis acquired from the user is acquired and set to the final analysis time time-end. Thereafter, the CPU 51 determines whether or not the current analysis time time-pre has reached the final analysis time time-end (step S72).
[0063] 現在解析時刻 time— preが最終解析時刻 time— endとなった場合、第二解析処 理を終了する。一方、ステップ S72において、現在解析時刻 time— preが最終解析 時刻 time— endとなっていない場合、 CPU51は、非線形回路行列 40の回路行列 要素を計算し、 LU分解を行う (ステップ S73)。  [0063] When the current analysis time time-pre becomes the final analysis time time-end, the second analysis processing is terminated. On the other hand, if the current analysis time time-pre is not the final analysis time time-end in step S72, the CPU 51 calculates circuit matrix elements of the nonlinear circuit matrix 40 and performs LU decomposition (step S73).
[0064] そして、 CPU51は、前進代入及び後退代入を行いながら-ユートン反復処理を行 うことによって収束解を得える(ステップ S 74)。ニュートン反復処理によって変数値は 修正される。 CPU51は、その収束解を第二解析結果として第二解析結果記憶領域 72へ出力する (ステップ S75)。  [0064] Then, the CPU 51 can obtain a convergent solution by performing -Yutton iteration while performing forward substitution and backward substitution (step S74). Newton iteration modifies variable values. The CPU 51 outputs the converged solution as the second analysis result to the second analysis result storage area 72 (step S75).
[0065] その後、 CPU51は、次の解析ステップ決定処理を行い(ステップ S76)、ステップ S 72へと戻る。  Thereafter, the CPU 51 performs the next analysis step determination process (step S76), and returns to step S72.
[0066] 次に、図 2のステップ S13での収束判断処理について図 7で説明する。図 7は、図 2 のステップ S13での収束判断処理を説明するためのフローチャート図である。 Next, the convergence determination process in step S13 of FIG. 2 will be described with reference to FIG. Figure 7 is the same as Figure 2. It is a flowchart for demonstrating the convergence determination process in step S13.
[0067] 収束判断処理は、図 2のステップ 12の第一解析処理の後に実行される場合には、 第一解析結果記憶領域 71を参照し、図 2のステップ 32の第二解析処理の後に実行 される場合には、第二解析結果記憶領域 72を参照する。また、収束判断処理が使 用する外部端子電圧記憶領域 77は、線形部に対する処理(図 2の A側)に使用され る領域と、非線形部に対する処理(図 2の B側)に使用される領域とを有する。  [0067] When the convergence determination process is executed after the first analysis process in step 12 in FIG. 2, the first analysis result storage area 71 is referred to, and after the second analysis process in step 32 in FIG. When it is executed, the second analysis result storage area 72 is referred to. The external terminal voltage storage area 77 used by the convergence judgment process is used for the process for the linear part (A side in Fig. 2) and for the process for the nonlinear part (B side in Figure 2). And having a region.
[0068] 図 7において、説明の便宜上、例えば、線形外部端子と非線形外部端子とを総称 して外部端子とするなど、線形及び非線形を省略して説明する。  In FIG. 7, for convenience of explanation, for example, the linear external terminal and the non-linear external terminal are collectively referred to as external terminals, and linear and non-linear are omitted.
[0069] CPU51は、外部端子電圧格納領域 77から前回の外部端子の電圧を取得する (ス テツプ S82)。また、 CPU51は、第一解析結果記憶領域 71又は第二解析結果記憶 領域 72を参照して、今回の解析結果から外部端子の電圧を取得して外部端子電圧 格納領域 77に保存する (ステップ S83)。  [0069] The CPU 51 obtains the voltage of the previous external terminal from the external terminal voltage storage area 77 (step S82). Further, the CPU 51 refers to the first analysis result storage area 71 or the second analysis result storage area 72, acquires the voltage of the external terminal from the current analysis result, and stores it in the external terminal voltage storage area 77 (step S83). ).
[0070] そして、 CPU51は、今回の外部端子の電圧と、前回の外部端子の電圧との差分を 算出し (ステップ S84)、その差分が許容誤差の範囲以内であるか否かを判断する( ステップ S85)。差分が許容誤差の範囲以内でない場合、 CPU51は、収束判断結 果として未収束を設定する (ステップ S85— 4)。  [0070] Then, the CPU 51 calculates the difference between the current external terminal voltage and the previous external terminal voltage (step S84), and determines whether the difference is within the allowable error range (step S84). Step S85). If the difference is not within the allowable error range, the CPU 51 sets non-convergence as the convergence determination result (step S85-4).
[0071] 一方、ステップ S84にて差分が許容誤差の範囲以内であると判断した場合、 CPU 51は、収束判断結果として収束を設定する (ステップ S86)。  On the other hand, if it is determined in step S84 that the difference is within the allowable error range, the CPU 51 sets convergence as a convergence determination result (step S86).
[0072] 上述より、本発明では、線形部に対する処理において、予め、設定されうる解析ス テツプを複数の擬似可変ステップとして作成し、各擬似可変ステップでの線形回路部 に対する LU分解結果を算出する。  As described above, in the present invention, in the processing for the linear portion, an analysis step that can be set in advance is created as a plurality of pseudo variable steps, and the LU decomposition result for the linear circuit portion at each pseudo variable step is calculated. .
[0073] そのため、線形回路を解析する第一解析処理にて実際に解析ステップとして設定 された擬似可変ステップでの LU分解を、第一解析処理が実行される毎に行う必要 がない。従って処理時間及び CPU51の負荷を軽減させることができ、高速処理を実 現できる。  [0073] Therefore, it is not necessary to perform LU decomposition at the pseudo variable step that is actually set as the analysis step in the first analysis process for analyzing the linear circuit each time the first analysis process is executed. Therefore, the processing time and the load on the CPU 51 can be reduced, and high-speed processing can be realized.
[0074] また、図 3に示すように、回路行列 20から線形回路行列 30と非線形回路行列 40と を生成するため、線形回路に対する処理と非線形回路に対する処理とを個別に実行 させることが可能となる。従って、線形回路に対する処理は、非線形素子の特性に因 らず処理を行うことができる。 Further, as shown in FIG. 3, since the linear circuit matrix 30 and the non-linear circuit matrix 40 are generated from the circuit matrix 20, it is possible to separately execute the process for the linear circuit and the process for the non-linear circuit. Become. Therefore, the processing for the linear circuit depends on the characteristics of the nonlinear element. Instead, processing can be performed.
本発明は、具体的に開示された実施形態に限定されるものではなぐ特許請求の 範囲から逸脱することなぐ種々の変形や変更が可能である。  The present invention is not limited to the specifically disclosed embodiments, and various modifications and changes can be made without departing from the scope of the claims.

Claims

請求の範囲 The scope of the claims
[1] 線形回路を含む回路をシミュレーションする回路シミュレータであって、  [1] A circuit simulator for simulating a circuit including a linear circuit,
線形回路の解析について、複数の擬似可変ステップ毎に、線形素子で構成される 線形部に相当する線形回路行列の LU分解の結果を対応させて記憶する LU分解 結果記憶領域と、  For the analysis of the linear circuit, an LU decomposition result storage area for storing the LU decomposition result of the linear circuit matrix corresponding to the linear part composed of linear elements corresponding to each of the plurality of pseudo variable steps, and
前記 LU分解結果記憶領域を参照して、実行中の解析ステップと一致する前記擬 似可変ステップの対応する前記 LU分解結果を読み出す LU分解結果読出手段と、 前記 LU分解結果を用いて線形回路行列方程式を解く第一解析手段とを有する回 路シミュレータ。  LU decomposition result reading means that reads the LU decomposition result corresponding to the pseudo variable step that matches the currently executed analysis step with reference to the LU decomposition result storage area, and a linear circuit matrix using the LU decomposition result A circuit simulator having a first analysis means for solving an equation.
[2] 所定基本ステップを用いて前記複数の擬似可変ステップを生成する擬似可変ステ ップ手段と、  [2] pseudo variable step means for generating the plurality of pseudo variable steps using a predetermined basic step;
前記複数の擬似可変ステップ毎に線形回路行列要素を算出する第一行列要素算 出手段と、  First matrix element calculation means for calculating a linear circuit matrix element for each of the plurality of pseudo variable steps;
前記線形回路行列要素に基づく前記線形行列に対して LU分解を行う LU分解手 段と、  LU decomposition means for performing LU decomposition on the linear matrix based on the linear circuit matrix elements;
前記擬似可変ステップ手段によって生成された前記複数の擬似可変ステップ毎に 、前記 LU分解手段によって得られた前記 LU分解を対応させて前記 LU分解結果記 憶領域に記憶させる LU分解結果記憶手段とを有することを特徴とする請求項 1記載 の回路シミュレータ。  LU decomposition result storage means for storing the LU decomposition result obtained by the LU decomposition means in association with the LU decomposition result storage area for each of the plurality of pseudo variable steps generated by the pseudo variable step means. The circuit simulator according to claim 1, further comprising:
[3] 前記擬似可変ステップ手段によって生成された前記複数の擬似可変ステップを記 憶する擬似可変ステップ記憶領域と、  [3] A pseudo variable step storage area for storing the plurality of pseudo variable steps generated by the pseudo variable step means;
前記線形部をシミュレーションする次の解析ステップを前記擬似可変ステップ記憶 領域を参照することによって決定する次の解析ステップ決定手段とを有することを特 徴とする請求項 2記載の回路シミュレータ。  3. The circuit simulator according to claim 2, further comprising: a next analysis step determining unit that determines a next analysis step for simulating the linear portion by referring to the pseudo variable step storage area.
[4] 前記次の解析ステップ決定手段は、前回ステップを伸長した次のステップに最も近 い前記擬似可変ステップを選択して前記次の解析ステップとして決定することを特徴 とする請求項 3記載の回路シミュレータ。 [4] The next analysis step determining means, wherein the pseudo variable step closest to the next step obtained by extending the previous step is selected and determined as the next analysis step. Circuit simulator.
[5] 前記回路が線形部と非線形部の混合で構成されて 、る場合には、前記回路を線 形部と非線形部とに分割する分割手段を有することを特徴とする請求項 1記載の回 路シミュレータ。 [5] When the circuit is composed of a mixture of a linear part and a nonlinear part, the circuit is connected to a line. 2. The circuit simulator according to claim 1, further comprising a dividing unit that divides the shape part and the nonlinear part.
[6] 前記分割手段は、  [6] The dividing means includes
前記回路の回路行列を用いて前記線形部に相当する線形回路行列と、前記非線 形部に相当する非線形回路行列とを生成することによって、前記回路を分割すること を特徴とする請求項 5記載の回路シミュレータ。  6. The circuit is divided by generating a linear circuit matrix corresponding to the linear part and a nonlinear circuit matrix corresponding to the nonlinear part using a circuit matrix of the circuit. The circuit simulator described.
[7] 前記非線形部に対して非線形回路行列方程式を解く第二解析手段と、 [7] second analysis means for solving a nonlinear circuit matrix equation for the nonlinear part;
少なくとも前記第一解析手段による第一解析結果又は前記第二解析手段による第 二解析結果が収束したカゝ否かを判断する収束判断手段とを有することを特徴とする 請求項 1記載の回路シミュレータ。  The circuit simulator according to claim 1, further comprising a convergence determination unit that determines whether the first analysis result by the first analysis unit or the second analysis result by the second analysis unit has converged. .
[8] 前記非線形部に対して非線形回路行列方程式を解く第二解析手段と、 [8] second analysis means for solving a nonlinear circuit matrix equation for the nonlinear part;
少なくとも前記第一解析手段による第一解析結果又は前記第二解析手段による第 二解析結果が収束したカゝ否かを判断する収束判断手段とを有し、  Convergence determination means for determining whether or not the first analysis result by the first analysis means or the second analysis result by the second analysis means has converged,
前記収束判断手段によって前記第一解析手段による第一解析結果が収束しない と判断された場合、前記第二解析手段による第二解析結果を電圧源として前記非線 形部に属する非線形外部端子に接続する第一外部端子接続手段を有することを特 徴とする請求項 1記載の回路シミュレータ。  When the convergence determination means determines that the first analysis result by the first analysis means does not converge, the second analysis result by the second analysis means is connected to a nonlinear external terminal belonging to the nonlinear portion as a voltage source. The circuit simulator according to claim 1, further comprising first external terminal connecting means.
[9] 前記非線形部に対して非線形回路行列方程式を解く第二解析手段と、 [9] second analysis means for solving a nonlinear circuit matrix equation for the nonlinear part;
少なくとも前記第一解析手段による第一解析結果又は前記第二解析手段による第 二解析結果が収束したカゝ否かを判断する収束判断手段とを有し、  Convergence determination means for determining whether or not the first analysis result by the first analysis means or the second analysis result by the second analysis means has converged,
前記収束判断手段によって前記第二解析手段による第二尾解析結果が収束しな Vヽと判断された場合、前記第一解析手段による第一解析結果を電圧源として前記線 形部に属する線形外部端子に接続する第二外部端子接続手段を有することを特徴 とする請求項 1記載の回路シミュレータ。  When it is determined by the convergence determining means that the second tail analysis result by the second analysis means does not converge V ヽ, the first external analysis result by the first analysis means is used as a voltage source and the linear external The circuit simulator according to claim 1, further comprising second external terminal connection means for connecting to the terminal.
[10] 前記非線形部に対して非線形回路行列方程式を解く第二解析手段と、 [10] second analysis means for solving a nonlinear circuit matrix equation for the nonlinear part;
少なくとも前記第一解析手段による第一解析結果又は前記第二解析手段による第 二解析結果が収束したカゝ否かを判断する収束判断手段とを有し、  Convergence determination means for determining whether or not the first analysis result by the first analysis means or the second analysis result by the second analysis means has converged,
前記収束判断手段によって前記第一解析手段による第一解析結果が収束したと 判断した場合、該第一解析結果と前記第二解析手段による第二解析結果とを結合 することを特徴とする請求項 1記載の回路シミュレータ。 When the first analysis result by the first analysis means has converged by the convergence determination means 2. The circuit simulator according to claim 1, wherein when the determination is made, the first analysis result and the second analysis result by the second analysis means are combined.
[11] 前記第二解析手段は、解析ステップ毎に、非線形回路行列要素を算出し、 LU分 解を行うことを特徴とする請求項 7記載の回路シミュレータ。 11. The circuit simulator according to claim 7, wherein the second analysis means calculates a nonlinear circuit matrix element and performs LU analysis for each analysis step.
[12] 線形部と非線形部とで構成される回路をシミュレーションする回路シミュレーション 方法であって、 [12] A circuit simulation method for simulating a circuit composed of a linear part and a nonlinear part,
複数の擬似可変ステップ毎に、線形素子で構成される線形部に相当する線形回路 行列の LU分解の結果を対応させて LU分解結果記憶領域に記憶させる LU分解結 果記憶手順と、  LU decomposition result storage procedure for storing the LU decomposition result of the linear circuit matrix corresponding to the linear part composed of linear elements in the LU decomposition result storage area in correspondence with the plurality of pseudo variable steps;
前記 LU分解結果記憶領域を参照して、実行中の解析ステップと一致する前記擬 似可変ステップの対応する前記 LU分解結果を読み出す LU分解結果読出手順と、 前記 LU分解結果を用いて線形回路行列方程式を解く第一解析手順とを有する回 路シミュレーション方法。  An LU decomposition result reading procedure for reading the LU decomposition result corresponding to the pseudo variable step that matches the currently executed analysis step with reference to the LU decomposition result storage area; and a linear circuit matrix using the LU decomposition result A circuit simulation method having a first analysis procedure for solving an equation.
[13] 線形回路を含む回路をシミュレーションする回路シミュレーション処理をコンビユー タに行わせるプログラムを記憶したコンピュータ読み取り可能な記憶媒体であって、 該コンピュータに、 [13] A computer-readable storage medium storing a program that causes a computer to perform a circuit simulation process for simulating a circuit including a linear circuit.
線形回路の解析について、複数の擬似可変ステップ毎に、線形素子で構成される 線形部に相当する線形回路行列の LU分解の結果を対応させて LU分解結果記憶 領域に記憶させる LU分解結果記憶手順と、  For the analysis of linear circuits, the LU decomposition result storage procedure for storing the LU decomposition result of the linear circuit matrix corresponding to the linear part composed of linear elements in the LU decomposition result storage area for each of the pseudo variable steps. When,
前記 LU分解結果記憶領域を参照して、実行中の解析ステップと一致する前記擬 似可変ステップの対応する前記 LU分解結果を読み出す LU分解結果読出手順と、 前記 LU分解結果を用いて線形回路行列方程式を解く第一解析手順とを実行させ るプログラムを記憶したコンピュータ読み取り可能な記憶媒体。  An LU decomposition result reading procedure for reading the LU decomposition result corresponding to the pseudo variable step that matches the currently executed analysis step with reference to the LU decomposition result storage area; and a linear circuit matrix using the LU decomposition result A computer-readable storage medium storing a program for executing a first analysis procedure for solving an equation.
PCT/JP2006/306139 2006-03-27 2006-03-27 Circuit simulator WO2007110910A1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2008507299A JP4486693B2 (en) 2006-03-27 2006-03-27 Circuit simulator
PCT/JP2006/306139 WO2007110910A1 (en) 2006-03-27 2006-03-27 Circuit simulator

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2006/306139 WO2007110910A1 (en) 2006-03-27 2006-03-27 Circuit simulator

Publications (1)

Publication Number Publication Date
WO2007110910A1 true WO2007110910A1 (en) 2007-10-04

Family

ID=38540850

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2006/306139 WO2007110910A1 (en) 2006-03-27 2006-03-27 Circuit simulator

Country Status (2)

Country Link
JP (1) JP4486693B2 (en)
WO (1) WO2007110910A1 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102081690A (en) * 2010-12-30 2011-06-01 南京理工大学 MDA (Matrix Decomposition Algorithm)-combined novel SVD (Singular Value Decomposition) method for complex circuit
JP2013101608A (en) * 2011-10-17 2013-05-23 Mizuho Information & Research Institute Inc Non-linear structure analysis calculation device, non-linear structure analysis calculation method and non-linear structure analysis calculation program
CN104636315A (en) * 2015-02-06 2015-05-20 中国人民解放军国防科学技术大学 GPDSP-oriented matrix LU decomposition vectorization calculation method
CN104699874A (en) * 2013-12-06 2015-06-10 南京理工大学 Multilayer matrix compression method for analyzing mutual coupling of micro-strip package interconnecting lines
JP2016009320A (en) * 2014-06-24 2016-01-18 富士電機株式会社 Simulation device for electric circuit, simulation method for electric circuit, and program

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03182968A (en) * 1989-07-21 1991-08-08 Mitsubishi Electric Corp Circuit simulation method
JP2000148726A (en) * 1998-11-11 2000-05-30 Hitachi Ltd Method for solving simultaneous linear equations by using parallel computer system, method for numerical simulation implementation using same, circuit simulation implementing method, and electronic state calculating method

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03182968A (en) * 1989-07-21 1991-08-08 Mitsubishi Electric Corp Circuit simulation method
JP2000148726A (en) * 1998-11-11 2000-05-30 Hitachi Ltd Method for solving simultaneous linear equations by using parallel computer system, method for numerical simulation implementation using same, circuit simulation implementing method, and electronic state calculating method

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102081690A (en) * 2010-12-30 2011-06-01 南京理工大学 MDA (Matrix Decomposition Algorithm)-combined novel SVD (Singular Value Decomposition) method for complex circuit
CN102081690B (en) * 2010-12-30 2014-07-02 南京理工大学 MDA (Matrix Decomposition Algorithm)-combined novel SVD (Singular Value Decomposition) method for complex circuit
JP2013101608A (en) * 2011-10-17 2013-05-23 Mizuho Information & Research Institute Inc Non-linear structure analysis calculation device, non-linear structure analysis calculation method and non-linear structure analysis calculation program
CN104699874A (en) * 2013-12-06 2015-06-10 南京理工大学 Multilayer matrix compression method for analyzing mutual coupling of micro-strip package interconnecting lines
CN104699874B (en) * 2013-12-06 2018-01-05 南京理工大学 A kind of Multi-layer matrix compression method for analyzing micro-strip encapsulation interconnection line mutual coupling
JP2016009320A (en) * 2014-06-24 2016-01-18 富士電機株式会社 Simulation device for electric circuit, simulation method for electric circuit, and program
CN104636315A (en) * 2015-02-06 2015-05-20 中国人民解放军国防科学技术大学 GPDSP-oriented matrix LU decomposition vectorization calculation method

Also Published As

Publication number Publication date
JP4486693B2 (en) 2010-06-23
JPWO2007110910A1 (en) 2009-08-06

Similar Documents

Publication Publication Date Title
US20100031206A1 (en) Method and technique for analogue circuit synthesis
WO2007110910A1 (en) Circuit simulator
US7444604B2 (en) Apparatus and methods for simulation of electronic circuitry
US20080209366A1 (en) Method and apparatus for analyzing circuit model by reduction and computer program product for analyzing the circuit model
US20040054974A1 (en) Method and system for power node current waveform modeling
US6560755B1 (en) Apparatus and methods for modeling and simulating the effect of mismatch in design flows of integrated circuits
US6389381B1 (en) Method and apparatus for calculating delay times in semiconductor circuit
US10922459B2 (en) Methods for converting circuits in circuit simulation programs
JPH10240796A (en) Circuit simulation method and record medium for recording circuit simulation program and circuit simulation device
US7107198B2 (en) Automatic generation of reduced-size circuit models including inductive interaction
US20080077897A1 (en) Circuit design method and circuit design system
Li et al. A comparison of steady state methods for power electronic circuits
Gil et al. SystemC AMS power electronic modeling with ideal instantaneous switches
US20060047492A1 (en) Circuit simulation methods and systems
JP6029712B2 (en) Method for identifying the value of an unknown circuit component in an analog circuit
JP4620708B2 (en) Noise countermeasure determination device
JP4051937B2 (en) Non-linear element characteristic value calculation method and apparatus
US20120245904A1 (en) Waveform-based digital gate modeling for timing analysis
KR102561849B1 (en) Method and device for processing neural network model for circuit simulator
JP2012242926A (en) Circuit improvement device, circuit improvement method for circuit improvement device, and circuit improvement program
US20040153277A1 (en) Analytical parasitic constraints generation technique
US20020144225A1 (en) Performance verification/analysis tool for full-chip designs
JP4015376B2 (en) Noise countermeasure determination device, recording medium, and program
US11100268B1 (en) Fast and accurate simulation for power delivery networks with integrated voltage regulators
Chawda et al. An Automated Design Flow for Synthesis of Optimal Switching Power Supply

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 06730087

Country of ref document: EP

Kind code of ref document: A1

WWE Wipo information: entry into national phase

Ref document number: 2008507299

Country of ref document: JP

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 06730087

Country of ref document: EP

Kind code of ref document: A1