WO2007065388A2 - Elektronenoptischer korrektor für aplanatische abbildungssysteme - Google Patents
Elektronenoptischer korrektor für aplanatische abbildungssysteme Download PDFInfo
- Publication number
- WO2007065388A2 WO2007065388A2 PCT/DE2006/001773 DE2006001773W WO2007065388A2 WO 2007065388 A2 WO2007065388 A2 WO 2007065388A2 DE 2006001773 W DE2006001773 W DE 2006001773W WO 2007065388 A2 WO2007065388 A2 WO 2007065388A2
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- corrector
- hexapole
- hexapole fields
- fields
- lens
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
- H01J37/153—Electron-optical or ion-optical arrangements for the correction of image defects, e.g. stigmators
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/153—Correcting image defects, e.g. stigmators
Definitions
- the invention relates to an electron-optical corrector for eliminating both the third-order aperture error and the anisotropic (azimuthal) portion of the off-axis third-order coma using round lenses and hexapole fields.
- the performance of high-resolution imaging electron-optical systems such.
- B. high-resolution electron microscopy is limited by the third-order aperture error.
- a major concern for the further development of such systems is therefore the elimination of the third order opening error.
- another important criterion of performance is to be able to image an image area of sufficient size.
- Gaussian ray path which is always assumed below the third-order opening error consists of the third-order spherical aberration.
- all those image errors are summarized under opening errors, in whose error integrals only those Gaussian elementary paths are included that originate from the optical axis in the object plane to be imaged.
- the size of the object / image field to be imaged is determined by the off-axis errors, that is to say those errors whose error integrals also contain elementary orbits according to Gaussian diopter that originate in the object plane outside the optical axis.
- the focus is on the aberration of the off-axis coma when delimiting the image field.
- a corrective of this structure thus allows the elimination of the third-order opening error (3rd-order spherical aberration) Objective lens while avoiding the radial (isotropic) portion of the off-axis coma.
- the system consisting of objective lens, transfer system and corrective, is a semi-aplanat.
- a disadvantage of the arrangement described is that the inevitable anisotropic off-axis coma of the magnetic objective lens, which is left unaffected by the corrective, limits the sharply imaged image area, which could be significantly enlarged if this image error is completely eliminated.
- the invention has set itself the task of creating an electron-optical corrective which, in addition to eliminating the third-order opening error, also has the object of eliminating the azimuthal (anisotropic) off-axis coma.
- the corrector consists of at least three coaxially arranged hexapole fields, at least one round lens field being arranged between adjacent hexapole fields in such a way that the hexapole fields are mapped to one another in pairs and the strengths of the hexapole fields are chosen such that the image error coefficient of threefold astigmatism
- 0 and at least three hexapole fields in the Larmor reference system are rotated relative to one another by an angle around the optical axis.
- the task of a corrective is to correct the image errors of a
- the corrective and the transfer lens system of the lens are connected upstream or downstream.
- the lens to be corrected i.e. the objective lens, which will usually be a magnetic lens
- the basic structure of the corrective consists of three or more hexapole fields and circular lenses in between, which together form the corrective.
- the strengths of the hexapole fields are chosen in such a way that the three-fold astigmatism disappears.
- a description of the physical conditions can be achieved by displaying them in a coordinate system that moves in accordance with the rotating movement of the electrons and that is referred to as the Larmor reference system.
- the one described in this invention is a coordinate system that moves in accordance with the rotating movement of the electrons and that is referred to as the Larmor reference system.
- the rotation of the hexapole fields is always measured relative to the Larmor reference system.
- the at least three hexapole fields are rotated relative to one another with respect to the optical axis in such a way that the anisotropic off-axis coma is corrected.
- one of the hexapoles will be held in a fixed position and the others rotated relative to it until the anisotropic off-axis coma is eliminated.
- the procedure can be carried out either by experimental adjustment or else by mathematically determining the angle of rotation and setting accordingly.
- the hexapole fields must be assigned to the round lenses in such a way that they map the hexapole fields to one another in pairs.
- An arrangement which always fulfills this condition is given when the circular lenses image the neighboring hexapoles on one another.
- Another special solution would be to adjust the round lens so that it alternately maps to the next but one hexapole.
- Lengths of the hexapole fields reach that, in addition to the image errors described above (opening errors, off-axis coma), the axial three-lobe error and the three-fold error also occur
- the corrector in a double-symmetrical manner, so that a double-symmetrical beam path is also generated in such a way that the axial fundamental path to the central plane of the corrector is antisymmetric, but symmetrical with respect to the central plane of the first and second Half of the corrector runs.
- the off-axis fundamental trajectories are symmetrical with respect to the median plane of the corrector and antisymmetric with respect to the median planes of the first and second halves of the corrector.
- the amplitudes of the hexapole fields are to be chosen symmetrically with respect to all three levels.
- the anisotropic coma is corrected either by adjusting the strength of the second and penultimate hexapole fields if the angles of rotation are as follows:
- focal lengths and lengths of the hexapole fields can be freely selected, since the axial three-lobe error, the three-fold distortion and the Generalized 4th Seidel order comata disappear through symmetry correction.
- the generation of the hexapoi field is basically free within the scope of the invention.
- the hexapole field is created after using a multipole element with 6-fold rotational symmetry. It is also possible to use a multipole element with 12 digits
- a round lens is composed of two or more magnetic lens fields, so that the respective strengths are available as parameters for adjustment and adjustment.
- Such an arrangement produces a round lens field that, with an appropriate choice of the respective power, makes it possible to set the Larmor rotation of the field in the desired manner while maintaining the refractive power of the round lens.
- the two degrees of freedom of adjusting the strengths of the two magnetic lenses includes the possibility of adjusting refractive power and
- the arrangement of the corrective described above has the result that, in addition to eliminating the third-order opening error, the anisotropic (azimuthal) off-axis coma of third Seidel's order is also eliminated. that can.
- the magnetic objective lens delivers
- the transfer lens system can consist of a single round lens, which is to be adjusted with regard to its strength and position such that the coma-free plane of the objective lens is mapped into the coma-free plane of the corrective.
- Intermediate transfer lenses behind the to be corrected renden lens is arranged or whether corrector and possibly transfer lenses are arranged in front of the lens to be corrected.
- the aim is always to completely eliminate certain image errors in the entire optical system by adjusting the corrector or the transfer lenses.
- FIG. 1 shows, in principle, a side view of the structure of an electron-optical arrangement consisting of an objective lens 1, which is usually a circular magnetic lens, a corrector 2 and a transfer lens system 6 arranged between them. All these individual elements have the optical axis 28 in common.
- an objective lens 1 which is usually a circular magnetic lens
- a corrector 2 which is usually a circular magnetic lens
- a transfer lens system 6 arranged between them. All these individual elements have the optical axis 28 in common.
- the corrector 2 contains a total of 3 hexapole fields (3, 7 and 8) and interposed circular lenses which are arranged one behind the other and in their entirety result in the corrector 2.
- a first hexapole field 3 represented as a rectangle, a first round lens with the focal length f '.
- the distance between the round lens and the center plane corresponds to the focal length f '.
- the angle of rotation in which the hexapole field is aligned around the optical axis is ⁇ 1 .
- the beam path is followed by a round lens and the third and last hexapole field (8), which is mirror-symmetrical to the first.
- the entire arrangement is mirror-symmetrical to the central plane 9.
- the angle of the hexapole field 7 is cp2, that of the hexapole field 8 ⁇ 3 .
- all three hexapole fields are rotated around the optical axis at different angles.
- the setting of the angle of rotation and the hexapole field strengths should be selected such that, in addition to the third-order opening error, the anisotropic (azimuthal) off-axis third-order coma is also eliminated.
- the setting has to be made in such a way that the image errors of the entire system, that is to say the image errors generated by the objective lens 1, are compensated for.
- a transfer lens system 6 consisting of two round lenses is interposed between the objective lens 1 and the corrector 2. Its setting is carried out in such a way that the coma-free plane 17 of the objective lens 1 is imaged in the coma-free plane of the corrector 2.
- the axial fundamental path 26 has the course shown in the figure.
- FIG. 2 shows a deviating structure. Here, only one round lens is arranged between the hexapoles. As in FIG. 1, the setting and spatial arrangement take place
- An adapter lens (31), which is typically used, is arranged behind the corrector and has a parallel or convergent axial beam path behind it
- the transfer lens system 6 which consists of two round lenses.
- the transfer lens system 6 is arranged and set in such a way that the coma-free plane 17 of the objective lens 1 is imaged in the coma-free plane of the corrector (2).
- both the isotropic portion of the off-axis coma is compensated in addition to that of the 3rd order opening error, and that of the anisotropic (azimuthal) portion of the off-axis coma.
- the corrector 2 shown in FIG. 3 consists of a total of 5 hexapole fields 23, 10, 11, 12, 13 and 2 interposed ⁇ round lenses.
- the entire structure of the corrector 2 is symmetrical with respect to the center plane 9 with regard to the amplitudes of the hexapole fields and the focal lengths of the round lens fields.
- the angles of rotation of the hexapole fields are the same
- a transfer lens system 6 consisting of a round lens is arranged between the objective lens 1 and the corrector 2.
- FIG. 4 shows a corrector 2, which is made up of double symmetry from hexapole fields (14, 18, 19, 20, 22) and round lenses. As a result, a double-symmetrical beam path is also generated, in which the axial fundamental path 26 to the central plane 9 of the corrector 2 is antisymmetric and symmetrical with respect to the central planes
- the off-axis fundamental path 27 runs symmetrically with respect to this central plane 9 and antisymmetrically with respect to the planes 24 and 25.
- Hexapole fields are symmetrical here, both to the central plane 9 and to the planes 24, 25.
- the compensation of the image error of the anisotropic external-axial coma can be done with a constant angle setting ⁇ i by appropriate selection of the amplitudes of the hexapole fields 18, 21, that is to say those in the Levels 24,
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Beam Exposure (AREA)
- Image-Pickup Tubes, Image-Amplification Tubes, And Storage Tubes (AREA)
- Electron Tubes For Measurement (AREA)
- Optical Communication System (AREA)
- Display Devices Of Pinball Game Machines (AREA)
- Lenses (AREA)
- Electron Sources, Ion Sources (AREA)
Abstract
Description
Claims
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE112006003527T DE112006003527A5 (de) | 2005-10-24 | 2006-10-11 | Elektronenoptischer Korrektor für aplanatische Abbildungssysteme |
DE502006002532T DE502006002532D1 (de) | 2005-10-24 | 2006-10-11 | Elektronenoptischer korrektor für aplanatische abbildungssysteme |
EP06805391A EP1941531B1 (de) | 2005-10-24 | 2006-10-11 | Elektronenoptischer korrektor für aplanatische abbildungssysteme |
JP2008536920A JP4801165B2 (ja) | 2005-10-24 | 2006-10-11 | アプラナティック結像系用の電気光学補正器 |
US12/091,411 US7800074B2 (en) | 2005-10-24 | 2006-10-11 | Electron-optical corrector for an aplanatic imaging system |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102005050810.3 | 2005-10-24 | ||
DE102005050810A DE102005050810A1 (de) | 2005-10-24 | 2005-10-24 | Elektronenoptischer Korrektor für aplanatische Abbildungssysteme |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2007065388A2 true WO2007065388A2 (de) | 2007-06-14 |
WO2007065388A3 WO2007065388A3 (de) | 2007-08-23 |
Family
ID=37891691
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/DE2006/001773 WO2007065388A2 (de) | 2005-10-24 | 2006-10-11 | Elektronenoptischer korrektor für aplanatische abbildungssysteme |
Country Status (6)
Country | Link |
---|---|
US (1) | US7800074B2 (de) |
EP (1) | EP1941531B1 (de) |
JP (1) | JP4801165B2 (de) |
AT (1) | ATE419642T1 (de) |
DE (3) | DE102005050810A1 (de) |
WO (1) | WO2007065388A2 (de) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009054565A (ja) * | 2007-08-02 | 2009-03-12 | Jeol Ltd | 収差補正装置 |
EP2107590A3 (de) * | 2008-03-31 | 2010-07-07 | Hitachi Ltd. | Aberrationskorrektur für Transmissionsselektronenmikroskop |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102006017686A1 (de) * | 2006-04-15 | 2007-10-18 | Ceos Corrected Electron Optical Systems Gmbh | Elektronenoptischer Korrektor für aplanatische Abbildungssysteme |
JP5623719B2 (ja) * | 2008-10-06 | 2014-11-12 | 日本電子株式会社 | 荷電粒子線装置の色収差補正装置及びその補正方法 |
EP2325862A1 (de) * | 2009-11-18 | 2011-05-25 | Fei Company | Korrektor für axiale Aberrationen einer teilchenoptischen Linse |
JP5502595B2 (ja) * | 2010-05-18 | 2014-05-28 | 日本電子株式会社 | 球面収差補正装置および球面収差補正方法 |
JP2013030374A (ja) * | 2011-07-29 | 2013-02-07 | Jeol Ltd | 電子顕微鏡 |
DE102019122013B3 (de) * | 2019-08-15 | 2021-01-14 | Ceos Corrected Electron Optical Systems Gmbh | Teilchenoptischer Korrektor frei von axialen Fehlern sechster Ordnung und Elektronenmikroskop mit Korrektor |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1999038188A1 (de) * | 1998-01-23 | 1999-07-29 | Ceos Corrected Electron Optical Systems Gmbh | Anordnung zur korrektur des öffnungsfehlers dritter ordnung einer linse, insbesondere der objektivlinse eines elektronenmikroskops |
WO2001052301A1 (de) * | 2000-01-14 | 2001-07-19 | Leo Elektronenmikroskopie Gmbh | Elektronenoptischer korrektor zur beseitigung der bildfehler dritter ordnung |
US20050167607A1 (en) * | 2003-12-12 | 2005-08-04 | Jeol Ltd. | Multipole field-producing apparatus in charged-particle optical system and aberration corrector |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0451370B1 (de) * | 1990-04-12 | 1996-03-27 | Koninklijke Philips Electronics N.V. | Korrekturvorrichtung für ein teilchengeladenes Strahlgerät |
DE102006017686A1 (de) * | 2006-04-15 | 2007-10-18 | Ceos Corrected Electron Optical Systems Gmbh | Elektronenoptischer Korrektor für aplanatische Abbildungssysteme |
-
2005
- 2005-10-24 DE DE102005050810A patent/DE102005050810A1/de not_active Withdrawn
-
2006
- 2006-10-11 JP JP2008536920A patent/JP4801165B2/ja active Active
- 2006-10-11 DE DE112006003527T patent/DE112006003527A5/de not_active Withdrawn
- 2006-10-11 EP EP06805391A patent/EP1941531B1/de active Active
- 2006-10-11 AT AT06805391T patent/ATE419642T1/de not_active IP Right Cessation
- 2006-10-11 WO PCT/DE2006/001773 patent/WO2007065388A2/de active Application Filing
- 2006-10-11 DE DE502006002532T patent/DE502006002532D1/de active Active
- 2006-10-11 US US12/091,411 patent/US7800074B2/en active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1999038188A1 (de) * | 1998-01-23 | 1999-07-29 | Ceos Corrected Electron Optical Systems Gmbh | Anordnung zur korrektur des öffnungsfehlers dritter ordnung einer linse, insbesondere der objektivlinse eines elektronenmikroskops |
WO2001052301A1 (de) * | 2000-01-14 | 2001-07-19 | Leo Elektronenmikroskopie Gmbh | Elektronenoptischer korrektor zur beseitigung der bildfehler dritter ordnung |
US20050167607A1 (en) * | 2003-12-12 | 2005-08-04 | Jeol Ltd. | Multipole field-producing apparatus in charged-particle optical system and aberration corrector |
Non-Patent Citations (1)
Title |
---|
ROSE H: "Correction of aperture aberrations in magnetic systems with threefold symmetry" NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, NORTH-HOLLAND PUBLISHING COMPANY. AMSTERDAM, NL, Bd. 187, Nr. 1, 1981, Seiten 187-199, XP002090289 ISSN: 0167-5087 * |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009054565A (ja) * | 2007-08-02 | 2009-03-12 | Jeol Ltd | 収差補正装置 |
EP2020673A3 (de) * | 2007-08-02 | 2010-08-11 | JEOL Ltd. | Aberrationskorrektursystem |
EP2107590A3 (de) * | 2008-03-31 | 2010-07-07 | Hitachi Ltd. | Aberrationskorrektur für Transmissionsselektronenmikroskop |
Also Published As
Publication number | Publication date |
---|---|
US20080265172A1 (en) | 2008-10-30 |
EP1941531A2 (de) | 2008-07-09 |
EP1941531B1 (de) | 2008-12-31 |
DE112006003527A5 (de) | 2008-09-25 |
JP2009512989A (ja) | 2009-03-26 |
WO2007065388A3 (de) | 2007-08-23 |
DE502006002532D1 (de) | 2009-02-12 |
ATE419642T1 (de) | 2009-01-15 |
JP4801165B2 (ja) | 2011-10-26 |
US7800074B2 (en) | 2010-09-21 |
DE102005050810A1 (de) | 2007-04-26 |
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