WO2007003175A3 - Method and device for the analysis of ordered structures - Google Patents

Method and device for the analysis of ordered structures Download PDF

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Publication number
WO2007003175A3
WO2007003175A3 PCT/DE2006/001148 DE2006001148W WO2007003175A3 WO 2007003175 A3 WO2007003175 A3 WO 2007003175A3 DE 2006001148 W DE2006001148 W DE 2006001148W WO 2007003175 A3 WO2007003175 A3 WO 2007003175A3
Authority
WO
WIPO (PCT)
Prior art keywords
structures
structural image
evaluated
analysis
produced
Prior art date
Application number
PCT/DE2006/001148
Other languages
German (de)
French (fr)
Other versions
WO2007003175A2 (en
Inventor
Hans Eberhard Koenig
Original Assignee
Hans Eberhard Koenig
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hans Eberhard Koenig filed Critical Hans Eberhard Koenig
Publication of WO2007003175A2 publication Critical patent/WO2007003175A2/en
Publication of WO2007003175A3 publication Critical patent/WO2007003175A3/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4788—Diffraction

Landscapes

  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)

Abstract

The invention relates to a method for the analysis of ordered structures with limited geometry. According to said method, a first structural image with Bragg reflexes is produced by appropriate irradiation of the structures, and a second structural image is produced from said first structural image, under partial direction-selective and structure-selective masking of the Bragg reflexes, with masking-specific colour and/or intensity progressions that are then detected and evaluated in a suitable manner. The axial symmetry of the structures, the orientation of individual elementary cells and the location correlation thereof, and the type and number of available structures are determined by local resolution. The second structural image can be evaluated by means of a data processing device. The inventive method can be used, for example, for quality control during the production of ordered monolayers and multilayers of colloids, especially two-dimensional or three-dimensional optical grids and data memories. The invention also relates to a device for carrying out said method.
PCT/DE2006/001148 2005-07-01 2006-07-03 Method and device for the analysis of ordered structures WO2007003175A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102005031180.6 2005-07-01
DE102005031180A DE102005031180B4 (en) 2005-07-01 2005-07-01 Structure analysis method for ordered structures and use of the method

Publications (2)

Publication Number Publication Date
WO2007003175A2 WO2007003175A2 (en) 2007-01-11
WO2007003175A3 true WO2007003175A3 (en) 2007-05-03

Family

ID=37545108

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/DE2006/001148 WO2007003175A2 (en) 2005-07-01 2006-07-03 Method and device for the analysis of ordered structures

Country Status (2)

Country Link
DE (1) DE102005031180B4 (en)
WO (1) WO2007003175A2 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2539503A1 (en) * 1974-09-09 1976-03-18 Tokyo Shibaura Electric Co METHOD AND APPARATUS FOR FINDING DEFECTS IN A TEMPLATE
EP0028774A2 (en) * 1979-11-07 1981-05-20 Kabushiki Kaisha Toshiba Apparatus for detecting defects in a periodic pattern
US5719405A (en) * 1992-09-01 1998-02-17 Nikon Corporation Particle inspecting apparatus and method using fourier transform

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2616716A1 (en) * 1976-04-15 1977-11-03 Philips Patentverwaltung Image fault detection system - uses optical filter in plane of spatial frequency diffraction spectrum blocking correct spectrum
US4407569A (en) * 1981-07-07 1983-10-04 Carl Zeiss-Stiftung Device for selectively available phase-contrast and relief observation in microscopes
DE3926199A1 (en) * 1989-08-08 1991-02-14 Siemens Ag Fault detector for complex, relatively regular structures - uses shutter in Fourier plane of beam path of light microscope
DE4236803C2 (en) * 1992-10-30 1996-03-21 Leica Mikroskopie & Syst Microscope for microscopic amplitude and / or phase objects

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2539503A1 (en) * 1974-09-09 1976-03-18 Tokyo Shibaura Electric Co METHOD AND APPARATUS FOR FINDING DEFECTS IN A TEMPLATE
EP0028774A2 (en) * 1979-11-07 1981-05-20 Kabushiki Kaisha Toshiba Apparatus for detecting defects in a periodic pattern
US5719405A (en) * 1992-09-01 1998-02-17 Nikon Corporation Particle inspecting apparatus and method using fourier transform

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
RALF BIEHL: "Optische Mikroskopie an kolloidalen Suspensionen unter Nichtgleichgewichtsbedingungen", October 2001, MAINZ, XP002421451 *

Also Published As

Publication number Publication date
DE102005031180A1 (en) 2007-01-04
DE102005031180B4 (en) 2008-06-05
WO2007003175A2 (en) 2007-01-11

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