WO2007000746A3 - Configuration de circuit permettant d'obtenir un signal de sortie binaire - Google Patents

Configuration de circuit permettant d'obtenir un signal de sortie binaire Download PDF

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Publication number
WO2007000746A3
WO2007000746A3 PCT/IB2006/052155 IB2006052155W WO2007000746A3 WO 2007000746 A3 WO2007000746 A3 WO 2007000746A3 IB 2006052155 W IB2006052155 W IB 2006052155W WO 2007000746 A3 WO2007000746 A3 WO 2007000746A3
Authority
WO
WIPO (PCT)
Prior art keywords
signal
analogue
digital
obtaining
voltage
Prior art date
Application number
PCT/IB2006/052155
Other languages
English (en)
Other versions
WO2007000746A2 (fr
Inventor
Stefan Butzmann
Original Assignee
Philips Intellectual Property
Koninkl Philips Electronics Nv
Stefan Butzmann
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Intellectual Property, Koninkl Philips Electronics Nv, Stefan Butzmann filed Critical Philips Intellectual Property
Priority to EP06765927.6A priority Critical patent/EP1899740B1/fr
Priority to JP2008519094A priority patent/JP2008545133A/ja
Priority to CN2006800235636A priority patent/CN101213466B/zh
Priority to US11/993,323 priority patent/US7948419B2/en
Publication of WO2007000746A2 publication Critical patent/WO2007000746A2/fr
Publication of WO2007000746A3 publication Critical patent/WO2007000746A3/fr

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
    • G01D5/244—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing characteristics of pulses or pulse trains; generating pulses or pulse trains
    • G01D5/24471—Error correction
    • G01D5/2448—Correction of gain, threshold, offset or phase control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/028—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
    • G01D3/036—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Measuring Magnetic Variables (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)

Abstract

L'invention concerne une configuration de circuit permettant d'obtenir un signal de sortie binaire d'un signal de courant transmis par un capteur de champ magnétique. La configuration de circuit présente: un capteur de champ magnétique (1) alimenté au niveau de deux bornes (2; 3) par une tension d'alimentation et produisant à partir de ces bornes (2; 3) un signal de courant alternant sensiblement en forme d'impulsions entre deux valeurs de courant; un bloc d'alimentation en tension (50) pour alimenter le capteur de champ magnétique (1) en tension d'alimentation stabilisée; un dispositif de mesure (51) pour dériver le signal de courant à impulsions mises en forme du capteur de champ magnétique (1) et pour transmettre un signal de mesure; un étage de conditionnement du signal (52) pour former un signal de tension analogique à partir du signal de mesure; un étage de conversion analogique-numérique (6) pour obtenir un signal de tension numérique du signal de tension analogique; un étage de commande (7) pour obtenir une première et une seconde valeurs de signal du signal de tension numérique, lesquelles valeurs de signal représentent les deux valeurs du courant du signal de courant alternant en forme d'impulsions, alimenté par le capteur de champ magnétique (1), pour transmettre la première et la seconde valeurs de signal ainsi obtenues à un dispositif à mémoire (8) après chaque changement par impulsions mises en forme dans le signal de courant, et pour identifier un signal de seuil de commutation numérique, selon un premier algorithme, à partir de la première et de la seconde valeurs de signal numérique en temps réel; le dispositif à mémoire (8) pour stocker la première et la seconde valeurs de signal ainsi obtenues; un étage de conversion numérique-analogique (9) pour obtenir un signal de seuil de commutation analogique du signal de seuil de commutation numérique; et un comparateur (10) pour comparer le signal de tension analogique au signal de seuil de commutation analogique et pour créer le signal de sortie binaire sur la base de cette comparaison.
PCT/IB2006/052155 2005-06-29 2006-06-28 Configuration de circuit permettant d'obtenir un signal de sortie binaire WO2007000746A2 (fr)

Priority Applications (4)

Application Number Priority Date Filing Date Title
EP06765927.6A EP1899740B1 (fr) 2005-06-29 2006-06-28 Configuration de circuit permettant d'obtenir un signal de sortie binaire
JP2008519094A JP2008545133A (ja) 2005-06-29 2006-06-28 バイナリ出力信号を得るための回路構成
CN2006800235636A CN101213466B (zh) 2005-06-29 2006-06-28 获得二进制输出信号的电路结构
US11/993,323 US7948419B2 (en) 2005-06-29 2006-06-28 Circuit configuration for obtaining a binary output signal

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP05105780.0 2005-06-29
EP05105780 2005-06-29

Publications (2)

Publication Number Publication Date
WO2007000746A2 WO2007000746A2 (fr) 2007-01-04
WO2007000746A3 true WO2007000746A3 (fr) 2007-05-03

Family

ID=37441276

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/IB2006/052155 WO2007000746A2 (fr) 2005-06-29 2006-06-28 Configuration de circuit permettant d'obtenir un signal de sortie binaire

Country Status (6)

Country Link
US (1) US7948419B2 (fr)
EP (1) EP1899740B1 (fr)
JP (1) JP2008545133A (fr)
KR (1) KR20080024221A (fr)
CN (1) CN101213466B (fr)
WO (1) WO2007000746A2 (fr)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8350563B2 (en) 2010-10-12 2013-01-08 Allegro Microsystems, Inc. Magnetic field sensor and method used in a magnetic field sensor that adjusts a sensitivity and/or an offset over temperature
EP2541213B1 (fr) * 2011-07-01 2017-03-08 EM Microelectronic-Marin SA Procédé pour réduire la non linéarité pendant la mesure d'un paramètre physique et circuit électronique pour sa mise en oeuvre
US10845434B2 (en) 2012-01-06 2020-11-24 Allegro Microsystems, Llc Magnetic field sensor having a temperature compensated threshold on power up
US8736260B2 (en) 2012-01-06 2014-05-27 Allegro Microsystems, Llc Magnetic field sensor and associated method that can establish a measured threshold value and that can store the measured threshold value in a memory device
US9395391B2 (en) * 2013-03-15 2016-07-19 Allegro Microsystems, Llc Magnetic field sensor and associated method that can store a measured threshold value in a memory device during a time when the magnetic field sensor is powered off
DE102017200143A1 (de) * 2017-01-09 2018-07-12 Robert Bosch Gmbh Magnetometer
US10430296B2 (en) 2017-09-29 2019-10-01 Allegro Microsystems, Llc Circuit and method for storing information in non-volatile memory during a loss of power event
US10839920B2 (en) 2017-09-29 2020-11-17 Allegro Microsystems, Llc Circuit having a low power charge pump for storing information in non-volatile memory during a loss of power event
DE102020124816B4 (de) * 2020-09-23 2022-07-28 Ifm Electronic Gmbh Messumformer zur Übertragung einer Prozessgröße an eine speicherprogrammierbare Steuerung
CN113219386A (zh) * 2021-05-20 2021-08-06 北京优赛寰宇科技有限公司 一种用于脉冲磁化仪测量的脉冲磁化自动控制电路

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0919789A1 (fr) * 1997-11-27 1999-06-02 Micronas Intermetall GmbH Dispositif capteur
US20020100866A1 (en) * 2001-01-30 2002-08-01 David Butka Optical position sensor with threshold updated dynamically by interpolation between minimum and maximum levels of output signal
FR2860587A1 (fr) * 2003-10-01 2005-04-08 Bosch Gmbh Robert Procede et dispositif pour corriger l'evaluation des seuils de commutation dans un capteur magnetique

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5672963A (en) * 1991-02-26 1997-09-30 Illinois Tool Works Inc. Variable induction control led transformer
EP0686850A1 (fr) * 1994-06-09 1995-12-13 Lem S.A. Circuit de mesure de courants continus avec isolation de tension entre le circuit de courant et le circuit de mesure
JP3674292B2 (ja) * 1997-06-19 2005-07-20 株式会社デンソー 空燃比検出装置
JP2005051021A (ja) * 2003-07-28 2005-02-24 Sharp Corp 磁気結合素子、及びそれを用いた電子機器
DE102004022572B4 (de) * 2004-05-07 2012-02-16 Infineon Technologies Ag Integratorschaltung

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0919789A1 (fr) * 1997-11-27 1999-06-02 Micronas Intermetall GmbH Dispositif capteur
US20020100866A1 (en) * 2001-01-30 2002-08-01 David Butka Optical position sensor with threshold updated dynamically by interpolation between minimum and maximum levels of output signal
FR2860587A1 (fr) * 2003-10-01 2005-04-08 Bosch Gmbh Robert Procede et dispositif pour corriger l'evaluation des seuils de commutation dans un capteur magnetique

Also Published As

Publication number Publication date
JP2008545133A (ja) 2008-12-11
US20100321224A1 (en) 2010-12-23
KR20080024221A (ko) 2008-03-17
WO2007000746A2 (fr) 2007-01-04
US7948419B2 (en) 2011-05-24
CN101213466B (zh) 2012-04-25
EP1899740A2 (fr) 2008-03-19
CN101213466A (zh) 2008-07-02
EP1899740B1 (fr) 2017-03-22

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