WO2006045867A3 - Mechanical-electronic system for the laser measurement of the thickness of moving sheets with perpendicularity correction - Google Patents

Mechanical-electronic system for the laser measurement of the thickness of moving sheets with perpendicularity correction Download PDF

Info

Publication number
WO2006045867A3
WO2006045867A3 PCT/ES2005/000557 ES2005000557W WO2006045867A3 WO 2006045867 A3 WO2006045867 A3 WO 2006045867A3 ES 2005000557 W ES2005000557 W ES 2005000557W WO 2006045867 A3 WO2006045867 A3 WO 2006045867A3
Authority
WO
WIPO (PCT)
Prior art keywords
thickness
mechanical
electronic system
laser measurement
moving sheets
Prior art date
Application number
PCT/ES2005/000557
Other languages
Spanish (es)
French (fr)
Other versions
WO2006045867A2 (en
Inventor
Spinola Carlos Gonzalez
Garcia Javier Lopez
Vacas Francisco Garcia
Bohorguez Alfonso Gago
Sanchez Jose Maria Bonelo
Perez Carlos Martin
Original Assignee
Univ Malaga
Spinola Carlos Gonzalez
Garcia Javier Lopez
Vacas Francisco Garcia
Bohorguez Alfonso Gago
Sanchez Jose Maria Bonelo
Perez Carlos Martin
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Malaga, Spinola Carlos Gonzalez, Garcia Javier Lopez, Vacas Francisco Garcia, Bohorguez Alfonso Gago, Sanchez Jose Maria Bonelo, Perez Carlos Martin filed Critical Univ Malaga
Publication of WO2006045867A2 publication Critical patent/WO2006045867A2/en
Publication of WO2006045867A3 publication Critical patent/WO2006045867A3/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0691Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving

Abstract

The invention relates to a mechanical-electronic system for the laser measurement of the thickness of moving sheets with perpendicularity correction. The inventive system comprises: a C-shaped head (1); two opposing laser sensors (4 and 8); three sonar sensors (3, 5 and 6) which are arranged in a triangle and which are fixed to the head (1) by means of a support (2); a control automaton and mechanical means for positioning the head (1) along a horizontal axis (x), a vertical axis (y), a rotational axis (r) and an angular axis (a), which are used to ensure that the beam from the laser sensors (4 and 8) is perpendicular to the surface of the material (7) of which the thickness (e) is to be measured.
PCT/ES2005/000557 2004-10-19 2005-10-19 Mechanical-electronic system for the laser measurement of the thickness of moving sheets with perpendicularity correction WO2006045867A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
ES200402490A ES2259521B1 (en) 2004-10-19 2004-10-19 MECHANICAL-ELECTRONIC SYSTEM FOR LASER MEASUREMENT OF THE THICKNESS OF MOVING SHEETS WITH PERPENDICULARITY CORRECTION.
ESP200402490 2004-10-19

Publications (2)

Publication Number Publication Date
WO2006045867A2 WO2006045867A2 (en) 2006-05-04
WO2006045867A3 true WO2006045867A3 (en) 2006-06-22

Family

ID=36228146

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/ES2005/000557 WO2006045867A2 (en) 2004-10-19 2005-10-19 Mechanical-electronic system for the laser measurement of the thickness of moving sheets with perpendicularity correction

Country Status (2)

Country Link
ES (1) ES2259521B1 (en)
WO (1) WO2006045867A2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109000571B (en) * 2018-09-11 2021-05-14 中国科学院光电技术研究所 Thickness consistency detection device

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1996003616A1 (en) * 1994-07-21 1996-02-08 Wangner Systems Corporation Apparatus and method for measuring the caliper of papermaking fabric in a non-contacting manner
DE10060144A1 (en) * 2000-12-04 2002-06-13 Dillinger Huettenwerke Ag Thickness measuring device for sheet or web material uses optical distance measuring devices on opposite sides of sheet or web
US20030007161A1 (en) * 2001-03-05 2003-01-09 Bowles Dennis Lee Laser non-contact thickness measurement system

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1996003616A1 (en) * 1994-07-21 1996-02-08 Wangner Systems Corporation Apparatus and method for measuring the caliper of papermaking fabric in a non-contacting manner
DE10060144A1 (en) * 2000-12-04 2002-06-13 Dillinger Huettenwerke Ag Thickness measuring device for sheet or web material uses optical distance measuring devices on opposite sides of sheet or web
US20030007161A1 (en) * 2001-03-05 2003-01-09 Bowles Dennis Lee Laser non-contact thickness measurement system

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
SPINOLA ET AL: "Sistema Automatico de Adquisicion de Medidas en Laminas de Acero.", EDIGAR S A., 2 December 1996 (1996-12-02), Retrieved from the Internet <URL:http://electrica.frba.utn.edu.ar/electrotecnica/0797.pdf> *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109000571B (en) * 2018-09-11 2021-05-14 中国科学院光电技术研究所 Thickness consistency detection device

Also Published As

Publication number Publication date
WO2006045867A2 (en) 2006-05-04
ES2259521B1 (en) 2007-06-01
ES2259521A1 (en) 2006-10-01

Similar Documents

Publication Publication Date Title
CN108362439B (en) A kind of standardized centroid exemplar centroid position two-dimentional measuring device and measurement method
WO2008123510A1 (en) Displacement measuring method, displacement measuring apparatus and target for displacement measurement
PL2167912T5 (en) Compensation of measurement errors due to dynamic deformations in a coordinate measuring machine
JP2010203055A (en) Substrate sensor, substrate detection mechanism, and robot for interior finish work
EP1039262A3 (en) Sheet thickness and swell measurement method and apparatus therefor
EP1750085A3 (en) Laser tracking interferometer
WO2011064339A3 (en) Method and arrangement for tactile-optical determination of the geometry of a measurement object
WO2012156071A8 (en) Laser material processing system with at least one inertial sensor; corresponding laser processing method
EP2075530A3 (en) Surveying instrument and surveying compensation method
WO2010004024A3 (en) Rotating construction laser, in particular a self-compensating rotating construction laser, and method for measuring a tilt of an axis of rotation of a construction laser
WO2006128733A3 (en) Coordinate measuring unit and method for measuring an object with a coordinate measuring unit
PL2176465T3 (en) Method for measuring a track position
KR20070111776A (en) Final sighting
JP2008503746A5 (en)
TW200631724A (en) Stage device, gantry-type stage device, and method for controlling stage device
KR102045696B1 (en) Gap measuring device and gap measuring method
JP2005077371A (en) Measuring method of tire shape and its device
CN102519424A (en) Accelerometer mounting tool angle change monitoring system
WO2006045867A3 (en) Mechanical-electronic system for the laser measurement of the thickness of moving sheets with perpendicularity correction
EP1724548A3 (en) Position measuring device
US20110205545A1 (en) Supporting structure for a movable mirror, method for reducing the tilting of a movable mirror, and interferometer
JP2008256715A (en) Surface shape measuring device of thin plate
WO2009078284A1 (en) Angular velocity sensor
EP1959226A3 (en) Optical axis polarization type laser interferometer
KR20140124576A (en) Method for measuring accuracy of steering block of ship

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A2

Designated state(s): AE AG AL AM AT AU AZ BA BB BG BW BY BZ CA CH CN CO CR CU CZ DK DM DZ EC EE EG ES FI GB GD GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV LY MD MG MK MN MW MX MZ NA NG NO NZ OM PG PH PL PT RO RU SC SD SG SK SL SM SY TJ TM TN TR TT TZ UG US UZ VC VN YU ZA ZM

AL Designated countries for regional patents

Kind code of ref document: A2

Designated state(s): BW GH GM KE LS MW MZ NA SD SZ TZ UG ZM ZW AM AZ BY KG MD RU TJ TM AT BE BG CH CY DE DK EE ES FI FR GB GR HU IE IS IT LU LV MC NL PL PT RO SE SI SK TR BF BJ CF CG CI CM GA GN GQ GW MR NE SN TD TG

DPE1 Request for preliminary examination filed after expiration of 19th month from priority date (pct application filed from 20040101)
NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 05807187

Country of ref document: EP

Kind code of ref document: A2