DE10060144A1 - Thickness measuring device for sheet or web material uses optical distance measuring devices on opposite sides of sheet or web - Google Patents

Thickness measuring device for sheet or web material uses optical distance measuring devices on opposite sides of sheet or web

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Publication number
DE10060144A1
DE10060144A1 DE10060144A DE10060144A DE10060144A1 DE 10060144 A1 DE10060144 A1 DE 10060144A1 DE 10060144 A DE10060144 A DE 10060144A DE 10060144 A DE10060144 A DE 10060144A DE 10060144 A1 DE10060144 A1 DE 10060144A1
Authority
DE
Germany
Prior art keywords
distance
measurement
measuring
range finder
rangefinder
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE10060144A
Other languages
German (de)
Inventor
Jean-Jaques Campas
Olivier Fichet
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
DILLINGER HUETTENWERKE AG
Original Assignee
DILLINGER HUETTENWERKE AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by DILLINGER HUETTENWERKE AG filed Critical DILLINGER HUETTENWERKE AG
Priority to DE10060144A priority Critical patent/DE10060144A1/en
Publication of DE10060144A1 publication Critical patent/DE10060144A1/en
Withdrawn legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical means
    • G01B11/02Measuring arrangements characterised by the use of optical means for measuring length, width or thickness
    • G01B11/06Measuring arrangements characterised by the use of optical means for measuring length, width or thickness for measuring thickness, e.g. of sheet material
    • G01B11/0691Measuring arrangements characterised by the use of optical means for measuring length, width or thickness for measuring thickness, e.g. of sheet material of objects while moving

Abstract

The invention relates to a device for measuring the thickness of web-like or plate-shaped measuring objects, with an optical rangefinder producing a measuring beam, which is arranged at a distance E from a reference plane adjacent to the measuring object and is provided for determining the distance D1 of the rangefinder to the measuring object, wherein the thickness Ep of the measurement object results from the relationship EP = E - D1 or alternatively a first range finder (5) arranged on one side of the measurement object (2) for determining the distance D1 of the first range finder (5) from the measurement object (2 ) and a second distance meter (6) arranged at a distance D from the first range finder (5) on the other side of the measurement object (2) for determining the distance D2 of the second range finder from the measurement object (2), the thickness Ep of the measurement object results from the relationship EP = D - D1 - D2. According to the invention, a calibration device is provided which redetermines and stores the distance D or the distance E at intervals. In addition or as an alternative, the rangefinders mentioned are provided for evaluating beams of rays reflected essentially parallel to the measurement beam.

Description

The invention relates to a device for measuring the thickness of web or plate-shaped Objects to be measured, with an optical rangefinder that generates a measuring beam Distance E arranged from a reference plane adjacent to the measurement object and to Determining the distance D1 of the range finder from the measurement object is provided, where the thickness Ep of the measurement object results from the relationship EP = E - D1 or older natively a first range finder arranged on one side of the measurement object for the Determination of the distance D1 of the first range finder from the measurement object and one second, at a distance D from the first range finder on the other side of the measurement object-arranged rangefinder for determining the distance D2 of the second Rangefinder to the measurement object, the thickness Ep of the measurement object from the loading drawing EP = D - D1 - D2 results, as well as with a calibration device.

For example, such thickness measuring devices are arranged downstream of rolling devices, the rangefinder attached to the legs of a C-arm or measuring frame are through which the emerging from the rolling device web ge leads. During the rolling process, the thickness of the web, e.g. B. the thickness of a rolled sheet, measured to adjust it to a predetermined set point.

A measuring device of the type mentioned above with two optical range finders known from JP 10-30 7008. The distance attached to the legs of a C-arm voltage meters each aim a measuring beam from above and below at the object to be measured. To the potash brier of the measuring device is a relatively large design effort Calibration measurement object of known thickness into the measurement object during the thickness measurement position taken and a correction value determined by the difference  between the known actual thickness of the calibration target and its measured ner thickness is determined.

The present invention has for its object to provide a new measuring device gangs mentioned type with simplified calibration possibility and / or extended measurement create area.

The measuring device according to the invention which achieves this object is characterized in that that the calibration device for interval-wise redetermination and storage of the above-mentioned distance E or D is provided.

This solution of the invention assumes that variations in the distances E and D result Thermal expansion of the brackets carrying the rangefinders are the main flaws Source for the measurements are, so that an effective measurement error reduction alone can be caused by the one used in the above relationships The value of the distance E or D is redetermined at intervals. This advantageously requires Redetermination of E or D not the arrangement of a like in the prior art Calibration measuring object of known thickness at the measuring location provided for the measuring object.

In a preferred embodiment of the invention, the calibration device is new adjustment of the distance D or E using the rangefinder mentioned or use of both rangefinders. For example, when calibrating using the rangefinder to measure the distance to the reference plane where with a corresponding reflection surface for the measuring beam on the reference plane see is. On the other hand, the two range finders themselves can be used to to determine the distance D between you, for which the range finders z. B. can be provided with a reflection surface for the measuring beam and can be arranged to be movable NEN, so that the measuring beam of a range finder on the reflection surface of the other rangefinder and vice versa.

In a preferred embodiment of the invention, the calibration device has an in a predetermined position between the location of the measurement object and the range finder or the location of the measurement object and the first or second range finder Calibration body with a receiver surface for a measuring beam, the calibration body is preferably arranged at a distance (D01, D02) from the range finder which is small against the distance E or the distance D. With the help of such calibration body, the front are preferably designed as calibration plates with a known thickness (V1, V2), a  even more extensive calibration can be performed by the calibration body Nearby rangefinder the known distance (D01, D02) to the calibration body measures. If the measured value deviates from the known, actual value, e.g. B. by a constant offset value, this deviation can be used as a correction value for others Use distance measurements.

When using two rangefinders, it is advisable to use the location of the measurement object and each of the two rangefinders such a calibration body can be placed.

The interval D is determined at intervals in the absence of a measurement object the distance (D1, D2) between the calibration body and the one located further away Rangefinder determined by this rangefinder. The distance D results then from the sum of this measured distance (D1, D2), the known thickness (V1, V2) the calibration plate and the known or measured distance (D01, D02) to each because closer rangefinder.

According to a further solution to the above object, the range finder evaluates bundles of rays reflected essentially parallel to the measurement beam from the measurement object. Such a rangefinder, in which the measuring beam, in contrast to triangulators regardless of the measured distance with the optical axis the one reflected Light-receiving imaging device coincides, has a wide measuring range on which very accurate measurements of both the distances E and D as well as the smaller ones Allows distances between the measurement object and the range finder.

With such a rangefinder measuring device z. B. steel plate thicknesses greater than 120 mm are measured. On the other hand, with a such measuring device but also cover the area of smaller sheet thicknesses, which radiographic measurement was previously reserved.

In the preferred embodiment of the invention, the measuring beam is the range finder modulated and the range finder for evaluating a phase shift between emitted and received light as a measuring effect dependent on the distance intended.

The range finder preferably has a transmitter unit with a laser diode for the Transmission of a laser beam as a measuring beam and a receiver unit with a reflected one Light receiving photodiode.

The invention will now be based on exemplary embodiments and the enclosed these exemplary drawings are explained in more detail. Show it:

Fig. 1 is a schematic representation of a measuring device according to the invention according to a first embodiment,

Fig. 2 shows the measuring device of Fig. 1, wherein a first calibration position is in a calibration,

Fig. 3, the measuring device of Fig. 1, wherein a second calibration is brier position in a potash,

Fig. 4, the measuring apparatus of Fig. 1, wherein the first and second calibration are in a calibration position,

Fig. 5 is a schematic representation of the measuring apparatus according to Fig. 1 to 4 ver applied rangefinder

Fig. 6 shows a further embodiment of an inventive measuring device, in a schematic representation,

Fig. 7 shows a third embodiment for a measuring device according to the invention, and

Fig. 8 shows a fourth embodiment of a measuring device according to the invention.

With the reference numeral 1 in the figures, a C-arm of a thickness measuring device is characterized, in which a measuring object 2 is immersed in a measuring position approximately in the middle of the arm. In the measurement object, it can be, for. B. act from a rolling device emerging heavy plate steel strip, in particular with a thickness <120 mm, the thickness is continuously measured during the rolling process in order to regulate it to a predetermined target value. Brackets which ensure that the test object 2 always assumes a constant position with respect to the measuring bracket 1 are not shown in FIGS . 1 to 4.

On stirrup legs 3 and 4 of the C-bracket 1 , optical distance meters 5 and 6 are mounted opposite one another with an exit window for a measuring beam 7 and 8 , respectively, which strikes the measurement object 2 perpendicularly.

The with respect to the exit window symmetrical and otherwise identical Ent distance meters 5 and 6 contain, as shown in Fig. 5, a transmitter device 9 with a laser diode for generating the measuring beam 7 and 8th The transmitter device 9 is controlled by a modulation device 10 which ensures that the laser diode emits a measuring beam which is modulated in intensity. In the relevant exemplary embodiment, pulsed measuring beams are generated with a pulse frequency in the gigahertz range.

The range finders 5 and 6 also each contain a receiver device 11 with a photodiode and an amplifier, which selectively amplifies the pulse frequency mentioned. The receiver device 11 is arranged close to the transmitter device, so that, regardless of the size of the measurement distance, it only detects light bundles reflected approximately parallel from the measurement object to the measurement beam 7 or 8 .

A circuit 12 connected to the receiver device 11 determines the phase shift which occurs as a result of the transit time of the measuring beam 7 or 8 between a modulation signal which triggers the light pulses and is generated by the device 10 and the electrical reception signal generated in the receiver 11 , this phase shift being a measure of is the respective distance to a measurement object on which the measurement beam 7 or 8 impinges.

A device 13 downstream of the circuit 12 generates a distance signal corresponding to the phase shift.

The distance signals of the units 13 of the two range finders 5 and 6 are fed to a central evaluation unit 14 of the measuring device.

The reference numerals 15 and 16 denote schematically illustrated movement devices, via which a calibration plate 17 or 18 of known thickness can be moved into the measuring beam 7 and 8 , the measuring beams hitting the plate perpendicularly.

In FIGS. 2 and 3, the thickness of the calibration plate 17 by V1 and the thickness of the calibration plate 18 is designated V2. In the exemplary embodiment shown, the thicknesses V1 and V2 are approximately the same size. As can also be seen from FIGS . 2 to 4, the distance between the range finder 5 and the calibration plate 17 bears the designation D01 and the distance between the calibration plate 18 and the range finder 6 bears the designation D02. D1 'denotes the distance between the calibration plate 18 and the range finder 5 and D2' denotes the distance between the calibration plate 17 and the range finder 6 . The designation D indicates the distance between the range finders 5 and 6 .

The movement devices 15 , 16 may include a pivoting or sliding mechanism, via which the plates 17 and 18 can be moved into the positions shown in FIGS. 2 to 4, in which their surfaces facing the range finders 5 and 6, the measuring beams 7 and 8 perpendicular to cut.

In the following the operation of the preceding measuring device explained with reference to FIGS . 1 to 5 is explained.

In a thickness measurement, the measuring beams 7 and 8 emitted by the rangefinders 5 and 6 meet perpendicularly on the sides of the measurement object facing them, for example, as stated above, the upper and lower side of a plate plate emerging from a Walzeinrich device, which can be seen through the C-bracket 1 moved perpendicular to the bracket plane.

The units 13 of the range finders 5 and 6 each determine a range measurement signal which corresponds to the distance D1 between the range finder 5 and the measurement object or the distance D2 between the range finder 6 and the measurement object 2 .

From these measurement signals, the central evaluation unit 14 determines the thickness EP of the object 2 according to the relationship

Ep = D - (D1 + D2) (1)

where D is the known distance between the range finders 5 and 6 . This distance is stored in the central evaluation unit 14 .

This thickness measurement is subject to various incorrect influences. Above all, the distance D can change compared to the stored value due to the thermal expansion of the C-arm. There is also the possibility that the measurement signals generated by the unit 13 and representing the distance measurement values D1 and D2 are each falsified by an offset value formed over time.

As part of a calibration of the measuring device of a corresponding correction value is to determine to determine this offset value by FIG. 4, the known Ab stands D01 and D02 between the distance-measuring devices 6 and 7 and the respective calibration plates 17 and 18 by the distance meter 6 and 7 measured become. Correction values then result from the difference between the measured values and the known, actual distance values D01 and D02. These correction values, like the distance D, can be stored in the central evaluation device, so that each determined distance measuring signal can be corrected automatically by the relevant value.

As part of a basic calibration, a calibration measurement object of known thickness Ep could be inserted into the C-frame at the location in the frame provided for measurement objects and the distances D1 and D2 could be measured, with the measurement values being corrected as described above. By changing the relationship 1 , the current distance D, possibly changed by the influence of heat, between the distance meters 6 and 7 could then be determined and stored in the central evaluation unit 14 in order to be used in subsequent thickness determinations according to ( 1 ).

In the thickness measuring device described here, however, it is not necessary to inter vallwise update of the distance value D a calibration target on the for measuring to place objects in the center of the bracket for a calibration measurement. Such a measurement can be reserved for the basic calibration described above stay.

Especially in the context of recalibrations, for. B. breaks the rolling device, in which there is no object to be measured in the C-bracket is inserted, according to Fig. 2 and 3, the calibration 17 and / or introduced into the measuring beam 7 and 8, 18 and the distances D1 'and D2' of measure the respective rangefinder up to the calibration plate 17 or 18 .

The value D newly determined at intervals then results from the relationship

D = D1 '+ V1 + D01 (2)

or

D = D2 '+ V2 + D02 (3).

Since the distances D2 'and D1' are large compared to the sum D01 + V1 and D02 + V2, it can be assumed that changes in the absolute value of the distance D caused by the thermal expansion of the C-arm, especially in such a change in the distances D1 'and D2 'are expressed, while the absolute value change of the sums D01 + V1 or D02 + V2 is comparatively small. By re-measuring the distances D1 'and D2' and calculating the distance D according to ( 2 ) or ( 3 ) from the measured values and the known throws for V1 and D01 or V2 and D02, D can be redetermined with sufficient accuracy ,

Since D can be determined both with the help of the relationship ( 2 ) and with the help of the relationship ( 3 ), there is a further possibility of control. If the distance values determined according to ( 2 ) and ( 3 ) do not match, this indicates an offset value change and thus the need to redetermine correction values (see Fig. 4), with slight changes in the distance D01 or D02 due to the thermal expansion of the measuring device be ignored. If there is agreement, to further increase the measuring accuracy instead of the known throws for D01 and D02, measured throws for D01 and D02, possibly changed by thermal expansion, can be used in equations (2) and (3).

It is now referred to Fig. 6, where another embodiment of a measuring device is shown.

In contrast to the embodiment described above, a measuring frame 1 a is provided instead of the C-bracket 1 . On an upper leg 3 a of the measuring frame 1 a, a range finder 5 a and a movement device 15 a with a calibration plate 17 a are attached. On a lower leg 4 a, a support for a plate-shaped object 2 a is provided. The support has rollers 21 and forms a reference plane 20 for the thickness measurement with the aid of the rangefinder 5 a.

The thickness Ep of the measurement object 2 a results from the relationship Ep = E - D1, where E denotes the distance between the reference plane 20 and the range finder 5 a and D1 the measured distance of the surface of the measurement object 2 a to the range finder 5 a.

The distance E is subject to changes due to thermal expansion of the measuring bracket 1 a. For further calibration, the distance E between the rangefinder 5 a and the reference plane 20 is measured again at intervals and stored for further thickness measurements. The calibration plate 17 a can be used to determine correction values, as described above with reference to plates 17 and 18 .

Reference is now made to FIG. 7, where a further measuring device with a C-bracket 1 b is shown. At bracket legs 3 b and 4 b range finder 5 b and 6 b are attached, which can be moved back and forth along the legs, so that a measuring beam 7 b can be directed onto a reflection surface 22 on the range finder 6 b. Conversely, a measuring beam from the rangefinder 6 b can strike a reflection surface 23 of the rangefinder 5 b. By respective displacements of the range finders 5 b and 6 b, calibration measurements of the distance D can be carried out.

In FIG. 8 is a further embodiment of a measuring device with a C-bracket 1 and c attached to the C-frame rangefinders 5 c and shown c6. The range finders 5 c and 6 c are triangulators. On a bracket leg 3 c, a further range finder 25 is attached, which determines the distance L to a reflection surface 22 c on the other bracket leg 4 c of the C bracket 1 c at intervals in the absence of a measurement object 2 c. The distance L is proportional to the distance D between the range finders 5 c and 6 c in equation (1). By forming quotients from successively measured values of the distance L, correction factors for the interwall-wise redetermination of the distance D can therefore be obtained.

Because of the large distance measuring range of the range finders 5 and 6 using parallel measuring and reflection beams, a calibration could also be carried out in such a way that, analogously to equation (1), the thickness of one or the other calibrating plate 17 or 18 was measured at intervals and from the measured value and the known thickness value V1 or V2 is determined by forming a quotient or difference, by means of which the thickness Ep determined according to equation (1) is corrected.

Claims (12)

1. Device for measuring the thickness of web-like or plate-shaped measuring objects, with an optical, a measuring beam generating rangefinder ( 5 ) which is arranged at a distance E from a reference plane ( 20 a) adjacent to the measuring object ( 2 a) and for determining the distance D1 of the Distance meter ( 5 a) to the measurement object ( 2 a) is seen before, the thickness Ep of the measurement object ( 2 a) resulting from the relationship Ep = E - D1, or alternatively a first one on one side of the measurement object ( 2 ) to ordered such a rangefinder ( 5 ) for determining the distance D1 of the first rangefinder ( 5 ) to the measurement object ( 2 ) and a second, at a distance D to the first rangefinder ( 5 ) on the other side of the measurement object ( 2 ) such a rangefinder ( 6 ) for determining the distance D2 of the second rangefinder ( 6 ) to the measurement object ( 2 ), the thickness Ep of the measurement object ( 2 ) resulting from the relationship EP = D - D1 - D2; and with a calibration device, characterized in that the calibration device is provided for interval-wise redetermination and storage of the distance E or D.
2. Device according to claim 1, characterized in that the calibration device for interval-wise determination of the distance D using the range finder ( 5 a) or using the first ( 5 ) and / or two ( 6 ) range finder is provided.
3. Apparatus according to claim 1 or 2, characterized in that the calibration device one in a predetermined position between the location of the measurement object ( 2 a) and the range finder ( 5 a) or the location of the measurement object ( 2 ) and the first ( 5th ) or second ( 6 ) range finder calibrating body ( 17 , 18 ; 17 a) with a receiver surface for a measuring beam ( 7 , 8 ; 7 a) generated by the range finder ( 5 a) or first or second range finder ( 5 , 6 ) having.
4. The device according to claim 3, characterized in that the calibration body ( 17 , 18 ) at a distance (D01, D02) from the range finder ( 5 , 6 ; 5 a) is arranged, which is small against the distance E or D. is.
5. Apparatus according to claim 3 or 4, characterized in that between the location of the measurement object ( 2 ) and the first range finder ( 5 ) and between the location of the measurement object ( 2 ) and the second range finder ( 6 ) a calibration body ( 17th , 18 ) can be placed.
6. Device according to one of claims 3 to 5, characterized in that the calibration body is designed as a calibration plate ( 17 , 18 ) with a receiving surface for the measuring beam ( 7 , 8 ) on each side of the plate and a predetermined plate thickness (V1, V2) having.
7. The device according to claim 6, characterized in that the sum of the plate thickness (V1, V2) and the distance (D01, D02) of the Kali brierplatte ( 17 , 18 ; 17 a) to the relevant range finder ( 5 , 6 , 5 a ) is small compared to the distance E or D.
8. Device according to one of claims 1 to 7, characterized in that the range finder ( 5 a) or first and second range finder ( 5 , 6 ) for evaluation of the measurement object ( 2 ; 2 a) substantially parallel to the measuring beam ( 7 , 8 ; 7 a) reflected beam is provided.
9. Device according to one of claims 1 to 8, characterized in that the measuring beam ( 7 , 8 ) modulates and the range finder ( 5 , 6 ) is provided for evaluating a phase shift between emitted and received light.
10. Device according to one of claims 1 to 9, characterized in that the range finder ( 5 a) or first and second range finder ( 5 , 6 ) a transmitter unit ( 9 ) with a laser diode and a receiver unit ( 11 ) with a photo diode having.
11. The device according to any one of claims 1 to 10, characterized in that a separate range finder ( 25 ) for measuring a distance (L) proportional to the distance D between the legs of a C-arm or measuring frame is provided for redetermining the distance D. ,
12. Device for measuring the thickness of web or plate-shaped objects with an optical, a measuring beam generating rangefinder ( 5 a), which is arranged at a distance E from an adjacent to the measurement object ( 2 ) reference plane ( 20 ) and for determining the distance D1 Distance meter ( 5 a) to the measurement object ( 2 a) is seen before, the thickness Ep of the measurement object ( 2 a) resulting from the relationship Ep = E - D1, or alternatively with a first, on one side of the measurement object ( 2 ) arranged such a rangefinder ( 5 ) for determining the distance D1 of the first rangefinder ( 5 ) to the measurement object ( 2 ) and a second, at a distance D to the first rangefinder ( 5 ) on the other side of the measurement object ( 2 ) such a rangefinder ( 6 ) for determining the distance D2 of the second rangefinder ( 6 ) to the measurement object ( 2 ), the thickness Ep of the measurement object ( 2 ) being derived from the relationship Ep = D - D1 - D2 there, characterized in that the range finder ( 5 a) or the first and second range finder ( 5 , 6 ) for evaluating one of the measurement object ( 2 ; 2 a) is provided essentially parallel to the measuring beam ( 7 , 8 ; 7 a) reflected beam.
DE10060144A 2000-12-04 2000-12-04 Thickness measuring device for sheet or web material uses optical distance measuring devices on opposite sides of sheet or web Withdrawn DE10060144A1 (en)

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Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006045867A2 (en) * 2004-10-19 2006-05-04 Universidad De Málaga Mechanical-electronic system for the laser measurement of the thickness of moving sheets with perpendicularity correction
DE102006059415A1 (en) * 2006-12-15 2008-06-26 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Thickness measurement device determines material thickness between first and second main surface using first and second measured distances and first material thickness measured from x-ray attenuation
GB2479572A (en) * 2010-04-15 2011-10-19 Paul Roderick Hayes Griffin Thickness guage for measurement of hot metal plate on the procss line
US8064072B2 (en) 2006-12-15 2011-11-22 Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.V. Method and apparatus for thickness measurement
DE102011107771A1 (en) * 2011-04-15 2012-10-18 Micro-Epsilon Messtechnik Gmbh & Co. Kg Device and method for measuring the thickness of a measurement object
DE102013017289A1 (en) * 2013-10-17 2015-04-23 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Method for carrying out a thickness measurement on strip-like materials and on piece goods as well as a corresponding device
DE102014200157A1 (en) * 2013-10-28 2015-05-21 Micro-Epsilon Messtechnik Gmbh & Co. Kg Method for measuring the thickness of objects to be measured and device for using the method
CN104729415A (en) * 2015-03-26 2015-06-24 南京师范大学 High-precision super-high temperature real-time thickness measuring device and method
WO2016177369A1 (en) * 2015-05-05 2016-11-10 Micro-Epsilon Messtechnik Gmbh & Co. Kg Device and method for measuring the width and thickness of a flat object
WO2019170540A1 (en) * 2018-03-05 2019-09-12 BUNDESREPUBLIK DEUTSCHLAND, vertreten durch DAS BUNDESMINISTERIUM FÜR WIRTSCHAFT UND ENERGIE Thickness-measuring device for measuring a thickness of flat workpieces and associated method

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US5210593A (en) * 1990-11-19 1993-05-11 Fag Kugelfischer Georg Schafer Kgaa Gauge for measuring the thickness of an unsupported web
DE4341098A1 (en) * 1993-12-02 1995-06-08 Klaschka Gmbh & Co Optical distance and thickness measuring device
JPH10307008A (en) * 1997-05-06 1998-11-17 Toshiba Corp Thickness gage
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Cited By (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006045867A2 (en) * 2004-10-19 2006-05-04 Universidad De Málaga Mechanical-electronic system for the laser measurement of the thickness of moving sheets with perpendicularity correction
WO2006045867A3 (en) * 2004-10-19 2006-06-22 Univ Malaga Mechanical-electronic system for the laser measurement of the thickness of moving sheets with perpendicularity correction
ES2259521A1 (en) * 2004-10-19 2006-10-01 Universidad De Malaga Mechanical-electronic system for the laser measurement of the thickness of moving sheets with perpendicularity correction
DE102006059415A1 (en) * 2006-12-15 2008-06-26 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Thickness measurement device determines material thickness between first and second main surface using first and second measured distances and first material thickness measured from x-ray attenuation
US8064072B2 (en) 2006-12-15 2011-11-22 Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.V. Method and apparatus for thickness measurement
US8228488B2 (en) 2006-12-15 2012-07-24 Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.V. Method and apparatus for thickness measurement
GB2479572A (en) * 2010-04-15 2011-10-19 Paul Roderick Hayes Griffin Thickness guage for measurement of hot metal plate on the procss line
US9335145B2 (en) 2011-04-15 2016-05-10 Micro-Epsilon Messtechnik Gmbh & Co. Kg Apparatus and method for measuring the thickness of a measurement object
DE102011107771B4 (en) * 2011-04-15 2013-10-17 Micro-Epsilon Messtechnik Gmbh & Co. Kg Device and method for measuring the thickness of a measurement object
CN103492831A (en) * 2011-04-15 2014-01-01 微-埃普西龙测量技术有限两合公司 Apparatus and method for measuring the thickness of a measurement object
DE102011107771A1 (en) * 2011-04-15 2012-10-18 Micro-Epsilon Messtechnik Gmbh & Co. Kg Device and method for measuring the thickness of a measurement object
CN103492831B (en) * 2011-04-15 2017-04-12 微-埃普西龙测量技术有限两合公司 Apparatus and method for measuring the thickness of a measurement object
DE102013017289B4 (en) * 2013-10-17 2016-09-01 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Performing a thickness measurement on band-shaped materials and on piece goods
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