WO2005106436A8 - Paper surface quality testing - Google Patents
Paper surface quality testingInfo
- Publication number
- WO2005106436A8 WO2005106436A8 PCT/FI2005/050134 FI2005050134W WO2005106436A8 WO 2005106436 A8 WO2005106436 A8 WO 2005106436A8 FI 2005050134 W FI2005050134 W FI 2005050134W WO 2005106436 A8 WO2005106436 A8 WO 2005106436A8
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- paper
- surface quality
- paper surface
- quality testing
- different angles
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N2021/4704—Angular selective
- G01N2021/4709—Backscatter
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/86—Investigating moving sheets
- G01N2021/8663—Paper, e.g. gloss, moisture content
Abstract
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20040600A FI117834B (en) | 2004-04-28 | 2004-04-28 | Paper surface quality testing |
FI20040600 | 2004-04-28 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2005106436A1 WO2005106436A1 (en) | 2005-11-10 |
WO2005106436A8 true WO2005106436A8 (en) | 2006-01-19 |
Family
ID=32104234
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/FI2005/050134 WO2005106436A1 (en) | 2004-04-28 | 2005-04-27 | Paper surface quality testing |
Country Status (2)
Country | Link |
---|---|
FI (1) | FI117834B (en) |
WO (1) | WO2005106436A1 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101158640B (en) * | 2007-11-06 | 2010-06-09 | 山东大学 | Device and method for rapid measuring coherent backscattering by linear array CCD |
CN106442870A (en) * | 2016-07-29 | 2017-02-22 | 维达纸业(中国)有限公司 | On-line paper quality detection system and method |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4097751A (en) * | 1976-09-24 | 1978-06-27 | Grumman Aerospace Corporation | Retroreflectance measuring apparatus |
SU1383168A1 (en) * | 1986-04-28 | 1988-03-23 | Ленинградский институт текстильной и легкой промышленности им.С.М.Кирова | Optical method of checking strength of sheet fibre transparent materials and process of making same |
DE58907717D1 (en) * | 1988-10-31 | 1994-06-30 | Wilfried Schoeps | DEVICE FOR THE SIMULTANEOUS CONTACTLESS TESTING OF A MULTIPLE NUMBER OF POINTS OF A TEST MATERIAL AND THEIR USE THEREOF. |
US5063301A (en) * | 1989-12-21 | 1991-11-05 | The Standard Oil Company | Noninvasive method and apparatus using coherent backscattering for process control |
US5155558A (en) * | 1990-09-19 | 1992-10-13 | E. I. Du Pont De Nemours And Company | Method and apparatus for analyzing the appearance features of a surface |
DE19733775A1 (en) * | 1997-08-05 | 1999-02-18 | Honeywell Ag | Measuring surface roughness of reflective material, e.g. paper |
US6690473B1 (en) * | 1999-02-01 | 2004-02-10 | Sensys Instruments Corporation | Integrated surface metrology |
FI991071A0 (en) * | 1999-05-10 | 1999-05-10 | Valmet Automation Inc | Procedure and measurement arrangement for measuring paper surface |
DE19950588B4 (en) * | 1999-10-20 | 2013-07-18 | Byk Gardner Gmbh | Apparatus and method for quality control of especially painted surfaces |
JP4164430B2 (en) * | 2002-10-29 | 2008-10-15 | キヤノン株式会社 | Recording medium identification apparatus, recording apparatus, and recording medium identification method |
-
2004
- 2004-04-28 FI FI20040600A patent/FI117834B/en active IP Right Grant
-
2005
- 2005-04-27 WO PCT/FI2005/050134 patent/WO2005106436A1/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
WO2005106436A1 (en) | 2005-11-10 |
FI20040600A0 (en) | 2004-04-28 |
FI117834B (en) | 2007-03-15 |
FI20040600A (en) | 2005-10-29 |
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