WO2006001712A3 - Non-destructive testing of materials - Google Patents

Non-destructive testing of materials Download PDF

Info

Publication number
WO2006001712A3
WO2006001712A3 PCT/NO2005/000235 NO2005000235W WO2006001712A3 WO 2006001712 A3 WO2006001712 A3 WO 2006001712A3 NO 2005000235 W NO2005000235 W NO 2005000235W WO 2006001712 A3 WO2006001712 A3 WO 2006001712A3
Authority
WO
WIPO (PCT)
Prior art keywords
materials
destructive testing
light
paths
detector device
Prior art date
Application number
PCT/NO2005/000235
Other languages
French (fr)
Other versions
WO2006001712A2 (en
Inventor
Eiolf Vikhagen
Original Assignee
Optonor As
Eiolf Vikhagen
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Optonor As, Eiolf Vikhagen filed Critical Optonor As
Publication of WO2006001712A2 publication Critical patent/WO2006001712A2/en
Publication of WO2006001712A3 publication Critical patent/WO2006001712A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02097—Self-interferometers
    • G01B9/02098—Shearing interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
    • G01B11/162—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means by speckle- or shearing interferometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02075—Reduction or prevention of errors; Testing; Calibration of particular errors
    • G01B9/02082—Caused by speckles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G01J3/433—Modulation spectrometry; Derivative spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/45—Interferometric spectrometry
    • G01J3/453—Interferometric spectrometry by correlation of the amplitudes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1717—Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/35—Mechanical variable delay line
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N2021/8472—Investigation of composite materials

Abstract

This invention relates to a method and system for measuring characteristics in or beneath a material surface being subject to a periodic movement. The method comprises the projection of an expanded light beam toward the surface, receipt and splitting of the light reflected from the surface into two light paths, applying a periodic fluctuation into at least one of said paths, combining the light beams and directing them toward a detector device for producing an interference pattern on the surface of said detector device.
PCT/NO2005/000235 2004-06-28 2005-06-28 Non-destructive testing of materials WO2006001712A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NO20042724 2004-06-28
NO20042724A NO322717B1 (en) 2004-06-28 2004-06-28 System and method for painting properties in or below the surface of a material, as well as its use

Publications (2)

Publication Number Publication Date
WO2006001712A2 WO2006001712A2 (en) 2006-01-05
WO2006001712A3 true WO2006001712A3 (en) 2006-04-06

Family

ID=35005972

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/NO2005/000235 WO2006001712A2 (en) 2004-06-28 2005-06-28 Non-destructive testing of materials

Country Status (2)

Country Link
NO (1) NO322717B1 (en)
WO (1) WO2006001712A2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7255980B2 (en) 2017-06-21 2023-04-11 ザ・ボーイング・カンパニー Shearography for non-destructive inspection of sub-microcellular substrates

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5637738B2 (en) 2010-06-04 2014-12-10 キヤノン株式会社 Deformation measuring apparatus and deformation measuring method
GB2544727A (en) 2015-11-16 2017-05-31 Optonor As Optical interferometry
CN106596556B (en) * 2016-10-12 2019-04-05 上海大学 A kind of container inner wall bonding quality lossless detection method based on speckle-shearing interferometry
US10337969B2 (en) 2017-06-21 2019-07-02 The Boeing Company High speed vacuum cycling excitation system for optical inspection systems
GB2570742B (en) * 2018-06-01 2020-10-28 Optonor As Optical-interference analysis
NO20200190A1 (en) 2020-02-14 2021-08-16 Optonor As System and method for analysing an object

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0554477A1 (en) * 1990-05-25 1993-08-11 Laser Technology, Inc.(A Corporation Of Pennsylvania) Apparatus and method for performing electronic shearography
DE19639213A1 (en) * 1996-09-25 1998-03-26 Wolfgang Prof Dr Ing Steinchen Shearing-Speckle pattern interferometry for oscillating object
US6175411B1 (en) * 1998-02-25 2001-01-16 Bechtel Bwxt Idaho, Llc Apparatus and method for measuring and imaging traveling waves
US6717681B1 (en) * 1999-03-31 2004-04-06 Benjamin A. Bard Portable real-time high-resolution digital phase-stepping shearography with integrated excitation mechanisms

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0554477A1 (en) * 1990-05-25 1993-08-11 Laser Technology, Inc.(A Corporation Of Pennsylvania) Apparatus and method for performing electronic shearography
DE19639213A1 (en) * 1996-09-25 1998-03-26 Wolfgang Prof Dr Ing Steinchen Shearing-Speckle pattern interferometry for oscillating object
US6175411B1 (en) * 1998-02-25 2001-01-16 Bechtel Bwxt Idaho, Llc Apparatus and method for measuring and imaging traveling waves
US6717681B1 (en) * 1999-03-31 2004-04-06 Benjamin A. Bard Portable real-time high-resolution digital phase-stepping shearography with integrated excitation mechanisms

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
N. KRISHNA MOHAN: "Electronic shearography applied to static and vibrating objects", OPTICS COMMUNICATIONS, vol. 108, 1 June 1994 (1994-06-01), pages 197 - 202, XP002355507 *
TARUN KUMAR GANGOPADHYAY: "Prospects for specke-pattern based vibration sensing in electromechanical equipment", MEASUREMENT SCIENCE AND TECHNOLOGY, vol. 10, no. 9, September 1999 (1999-09-01), UK, pages R129 - R138, XP002355508 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7255980B2 (en) 2017-06-21 2023-04-11 ザ・ボーイング・カンパニー Shearography for non-destructive inspection of sub-microcellular substrates

Also Published As

Publication number Publication date
NO322717B1 (en) 2006-12-04
NO20042724L (en) 2005-12-29
WO2006001712A2 (en) 2006-01-05
NO20042724D0 (en) 2004-06-28

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