WO2005067365A2 - Beleuchtungseinheit und verfahren zu deren betrieb - Google Patents
Beleuchtungseinheit und verfahren zu deren betrieb Download PDFInfo
- Publication number
- WO2005067365A2 WO2005067365A2 PCT/EP2005/000554 EP2005000554W WO2005067365A2 WO 2005067365 A2 WO2005067365 A2 WO 2005067365A2 EP 2005000554 W EP2005000554 W EP 2005000554W WO 2005067365 A2 WO2005067365 A2 WO 2005067365A2
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- light
- light source
- light guide
- lighting unit
- unit according
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/0001—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings specially adapted for lighting devices or systems
- G02B6/0005—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings specially adapted for lighting devices or systems the light guides being of the fibre type
- G02B6/0006—Coupling light into the fibre
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/24—Coupling light guides
- G02B6/42—Coupling light guides with opto-electronic elements
- G02B6/4296—Coupling light guides with opto-electronic elements coupling with sources of high radiant energy, e.g. high power lasers, high temperature light sources
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/24—Coupling light guides
- G02B6/42—Coupling light guides with opto-electronic elements
- G02B6/4298—Coupling light guides with opto-electronic elements coupling with non-coherent light sources and/or radiation detectors, e.g. lamps, incandescent bulbs, scintillation chambers
Definitions
- the invention relates to a lighting unit that is operated with a high-performance light source for inspecting object surfaces.
- a light source of such a lighting unit generally ages. This means that the lamp becomes darker with the same supply parameters on the input side. An automatic inspection of object surfaces would thus produce images of poorer quality that are difficult to evaluate.
- the invention has for its object to provide high-performance lighting for inspection tasks on object surfaces, which ensure uniform illumination of objects with high light intensity.
- An operating method must also be specified 3.
- the invention is based on the knowledge that the light intensity at the output of a lighting unit can be dimi ⁇ ted in such a way that homogeneous object lighting with a predetermined light intensity can be set by the
- the light beam path of a high-performance light source is focused by means of a first optical system, the light beam path is coupled into a light guide, the cross-sectional area of the focus being at least twice as large as the cross-sectional area of the light guide, the light via the light guide to a light measuring head and from there is passed on to an object and the light output on the object can be adjusted by axially varying the distance between the light source and the light entry surface of the light guide.
- the light distribution on the object surface is homogeneous. This is due to the fact that the high-power light source or its light emission or light beam path is aligned approximately coaxially with the initial region of the light guide.
- the cross-sectional area of the focus is designed such that it substantially covers the entry area of the light guide, ie is at least twice as large.
- the light falls into the entry surface of the light guide, which corresponds to the core of the light beam path of the high-power light source. This eliminates inhomogeneities in the lighting.
- the dimensioning of the light intensity results from the fact that, for example, when the distance of the high-performance light source is increased from the entry area of the light source lenleiters the entry surface of the light guide is moved out of the focus of the light beam path. This is synonymous with an increasing spot of illumination at the point of entry for the light guide. 3 in turn results in a correspondingly lower proportion of the total illumination intensity of the high-power light source being coupled into the light guide and the light output being able to be determined accordingly.
- the lighting unit consists of a housing, a displacement unit for the high-performance light source together with the first focusing optics and a light guide for the transmission of the light to the object.
- a light-sensitive sensor for example on a decoupled beam path, can be used to regulate the light intensity beyond the mere adjustment of the light intensity.
- the control is monitored accordingly via an electronic unit.
- the distance between the light guide inlet and the light source is varied for the di men of the lighting when using a high-performance light source. This is equivalent to an enlargement, because in practice a too small distance between light guide and high-performance light source is not desirable due to high thermal loads.
- the variation of the distance of the focus area of the light beam path from the entry surface of the light guide directly changes the amount of light coupled into the light guide. If, for example, certain color spectra are desired, appropriate filters can be introduced into the beam path. If a certain additional reduction in the j light output is to take place, a screen diaphragm for dimming is introduced into the beam path.
- the regulation of the brightness when illuminating an object surface takes place via a feedback signal which uses a photo detector which measures the light intensity at any point behind the light guide exit.
- the sensor signal is fed to control electronics.
- the control moves the lamp in such a way that the setpoint and actual value are brought into agreement.
- the figure shows a lighting unit consisting of a lamp housing with a high-performance light source, a light guide, a light measuring head that illuminates an object and electrical or electronic units for supplying or controlling the system.
- the figure shows in particular a device for uniformly illuminating an object 3 with simultaneous control possibility.
- Uniform lighting is understood to mean a homogeneous light distribution, so that there are no brightness fluctuations from the lighting side, for example, across the surface.
- a major advantage is the negative effects of aging processes of the high-performance light source that can be eliminated by the control.
- the liquid light guide serves for better cooling, since conventional light guides, for example made of plastic, do not withstand high thermal loads.
- additional optical elements such as second optics 13 and third optics 14, fine adjustments can be made under different elements of the lighting unit.
- the high-performance light source 1 is contained in the housing 4 as the main element.
- This light source can be provided with a reflector 5, for example.
- the light emitted from the high-power light source 1 is focused by means of a first optic 12, so that a focus area 15 is present.
- a displacement unit 6 has an L-shaped stand, the longer leg of which is positioned horizontally and which fixes both the input-side end of the light guide 2 or a second optical system 13 and an adjustment device which can be moved via a motor M and which serves for this purpose , the high-performance light source 1 or. to shift the corresponding focus axially relative to the light entry surface of the light guide.
- a motor controller is also available for the positioning of filters or screens 7.
- the light coupled into the light guide 2 is coupled into the light measuring head at the other end of the light guide 2 directly or via a third optic 14, via a beam splitter into the illuminating beam, which is directed onto the object 3, and a side branch is split up by a photosensor 10 to be fed.
- the third optics 14 can be attached to the light measuring head 8 on the input side as well as on the output side.
- the first control circuit 20 the regulation of the illumination intensity, as it is detected in the figure as an example in the light measuring head, can be carried out on the basis of this opto-electrical signal, which is generated by the photo sensor 10.
- Another option is to use the second control circuit 21, the light measurement of the actual value taking place via the camera 11, which is used anyway for inspection tasks on the object surface.
- the use of a computer for image processing is also necessary, the setpoint for the first control loop being derived from the detection signal for the light intensity.
- the position of the focal point or focal region 15 shown schematically in the figure represents a relative position of the high-power light source 1 in the retracted position.
- this position means that the focus is not in the plane of the entry surface of the light guide 2, but is shifted axially between the light guide and the light source.
- only a relatively small proportion of the amount of light enters the optical waveguide 2, since the invariable cross section of the light entry surface is illuminated only by a very small proportion of the total light spot. This is based on the fact that the illumination spot present in the plane of the light entry surface of the optical waveguide 2 is considerably larger than the cross-sectional area of the light entry.
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Optical Couplings Of Light Guides (AREA)
Abstract
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP05715201A EP1709471A2 (de) | 2004-01-16 | 2005-01-17 | Beleuchtungseinheit und verfahren zu deren betrieb |
US10/586,247 US7427731B2 (en) | 2004-01-16 | 2005-01-17 | Illumination unit and method for the operation thereof |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102004002450A DE102004002450A1 (de) | 2004-01-16 | 2004-01-16 | Beleuchtungseinheit und Verfahren zu deren Betrieb |
DE102004002450.2 | 2004-01-16 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2005067365A2 true WO2005067365A2 (de) | 2005-07-28 |
WO2005067365A3 WO2005067365A3 (de) | 2006-04-13 |
Family
ID=34778074
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP2005/000554 WO2005067365A2 (de) | 2004-01-16 | 2005-01-17 | Beleuchtungseinheit und verfahren zu deren betrieb |
Country Status (4)
Country | Link |
---|---|
US (1) | US7427731B2 (de) |
EP (1) | EP1709471A2 (de) |
DE (1) | DE102004002450A1 (de) |
WO (1) | WO2005067365A2 (de) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102006058079B4 (de) * | 2006-12-07 | 2011-04-28 | Schott Ag | Beleuchtungsvorrichtung |
CA2749832C (en) * | 2010-08-30 | 2016-04-26 | Ushio Denki Kabushiki Kaisha | Light source unit |
US9885671B2 (en) | 2014-06-09 | 2018-02-06 | Kla-Tencor Corporation | Miniaturized imaging apparatus for wafer edge |
US9645097B2 (en) | 2014-06-20 | 2017-05-09 | Kla-Tencor Corporation | In-line wafer edge inspection, wafer pre-alignment, and wafer cleaning |
US9520742B2 (en) | 2014-07-03 | 2016-12-13 | Hubbell Incorporated | Monitoring system and method |
CN116709614B (zh) * | 2023-08-02 | 2023-10-20 | 深圳爱图仕创新科技股份有限公司 | 灯光控制方法、装置、计算机设备及计算机可读存储介质 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5013311A (en) * | 1988-10-06 | 1991-05-07 | Lasag Ag | Envelope generator for a power beam |
US20020012502A1 (en) * | 2000-02-17 | 2002-01-31 | Cogent Light Technologies, Inc. | Snap-on connector system for coupling light from an illuminator to a fiber optic |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0685022B2 (ja) * | 1984-07-05 | 1994-10-26 | オリンパス光学工業株式会社 | 内視鏡用照明光学系 |
DE69109285T2 (de) * | 1991-08-02 | 1995-11-02 | Ibm | Apparat und Methode zur Inspektion eines Substrates. |
DE4304530C2 (de) * | 1992-02-14 | 1994-12-22 | Norbert Lemke | Einrichtung zur Beleuchtung von insbesondere von einer Videokamera aufgenommenen Objekten |
EP2420822B1 (de) * | 2001-06-29 | 2020-09-02 | Universite Libre De Bruxelles | Vorrichtung zum Erhalt von dreidimensionalen Bildern einer Probe durch Mikroskopietechnik |
DE10256365A1 (de) * | 2001-12-04 | 2003-07-17 | Ccs Inc | Lichtabstrahlungsvorrichtung, Lichtquellenvorrichtung, Beleuchtungseinheit und Lichtverbindungsmechanismus |
-
2004
- 2004-01-16 DE DE102004002450A patent/DE102004002450A1/de not_active Ceased
-
2005
- 2005-01-17 EP EP05715201A patent/EP1709471A2/de not_active Withdrawn
- 2005-01-17 WO PCT/EP2005/000554 patent/WO2005067365A2/de active Application Filing
- 2005-01-17 US US10/586,247 patent/US7427731B2/en not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5013311A (en) * | 1988-10-06 | 1991-05-07 | Lasag Ag | Envelope generator for a power beam |
US20020012502A1 (en) * | 2000-02-17 | 2002-01-31 | Cogent Light Technologies, Inc. | Snap-on connector system for coupling light from an illuminator to a fiber optic |
Also Published As
Publication number | Publication date |
---|---|
US20070273891A1 (en) | 2007-11-29 |
WO2005067365A3 (de) | 2006-04-13 |
EP1709471A2 (de) | 2006-10-11 |
DE102004002450A1 (de) | 2005-08-25 |
US7427731B2 (en) | 2008-09-23 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE68911926T2 (de) | Lichtquelle mit stabilisierter intensität. | |
DE3118341C2 (de) | Bildabtastvorrichtung | |
DE10010213B4 (de) | Optische Meßvorrichtung, insbesondere zur Qualitätsüberwachung bei kontinuierlichen Prozessen | |
DE2644341C2 (de) | Verfahren und Anordnungen zur automatischen Verwirklichung des Köhler'schen Beleuchtungsprinzipes | |
EP1532479A1 (de) | Vorrichtung und verfahren zur inspektion eines objekts | |
DE3442218A1 (de) | Auflichtbeleuchtungsapparat fuer mikroskope | |
WO2005067365A2 (de) | Beleuchtungseinheit und verfahren zu deren betrieb | |
EP3084500B1 (de) | Verfahren zur scanning-mikroskopie und scanning-mikroskop | |
EP0144732B1 (de) | Einrichtung zum automatischen Fokussieren von optischen Geräten | |
WO2021032387A1 (de) | Ausrichteinheit, sensormodul umfassend dieselbe und laserbearbeitungssystem umfassend das sensormodul | |
DE3446727C2 (de) | Autofokuseinrichtung für Mikroskope | |
DE2944215A1 (de) | Beleuchtungsvorrichtung fuer fluoreszenzmikroskop | |
DE10330003A1 (de) | Vorrichtung, Verfahren und Computerprogramm zur Wafer-Inspektion | |
EP1927026A1 (de) | Konfokalmikroskop und verfahren zur detektion mit einem konfokalmikroskop | |
DE10033269B4 (de) | Vorrichtung zum Einkoppeln von Licht mindestens einer Wellenlänge einer Laserlichtquelle in ein konfokales Rastermikroskop | |
DE69727266T2 (de) | Faseroptisches Bildeingabegerät | |
EP1744148A2 (de) | Vorrichtung zur Inspektion eines Wafers | |
DE102012218624B4 (de) | Konfokales Laser-Raster-Mikroskop mit einer gepulst angesteuerten Laserlichtquelle | |
DE102005059650B4 (de) | Vorrichtung zur Montage für mehrere Laser und Mikroskop | |
EP0160687B1 (de) | Vorrichtung zum überwachen eines schweissvorganges | |
DE10359723B4 (de) | Vorrichtung und Verfahren zur Inspektion eines Wafers | |
DE4338531A1 (de) | Vorrichtung zur Mehrfarbbeleuchtung von Präparaten | |
WO2020254303A1 (de) | Verfahren und vorrichtungen zur überprüfung der konfokalität einer scannenden und entscannenden mikroskopbaugruppe | |
DE10135321A1 (de) | Mikroskopobjektivanordnung und Verwendung einer solchen Mikroskopobjektivanordnung bei einem Mikroskop | |
EP1153569A2 (de) | Operationsmikroskop |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AK | Designated states |
Kind code of ref document: A2 Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BW BY BZ CA CH CN CO CR CU CZ DE DK DM DZ EC EE EG ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NA NI NO NZ OM PG PH PL PT RO RU SC SD SE SG SK SL SY TJ TM TN TR TT TZ UA UG US UZ VC VN YU ZA ZM ZW |
|
AL | Designated countries for regional patents |
Kind code of ref document: A2 Designated state(s): GM KE LS MW MZ NA SD SL SZ TZ UG ZM ZW AM AZ BY KG KZ MD RU TJ TM AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LT LU MC NL PL PT RO SE SI SK TR BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG |
|
NENP | Non-entry into the national phase |
Ref country code: DE |
|
WWW | Wipo information: withdrawn in national office |
Country of ref document: DE |
|
WWE | Wipo information: entry into national phase |
Ref document number: 2005715201 Country of ref document: EP |
|
WWP | Wipo information: published in national office |
Ref document number: 2005715201 Country of ref document: EP |
|
WWE | Wipo information: entry into national phase |
Ref document number: 10586247 Country of ref document: US |
|
WWP | Wipo information: published in national office |
Ref document number: 10586247 Country of ref document: US |