WO2005012882A3 - Procede et dispositif de determination d'un coefficient d'aplatissement d'un materiau - Google Patents

Procede et dispositif de determination d'un coefficient d'aplatissement d'un materiau Download PDF

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Publication number
WO2005012882A3
WO2005012882A3 PCT/FR2004/002056 FR2004002056W WO2005012882A3 WO 2005012882 A3 WO2005012882 A3 WO 2005012882A3 FR 2004002056 W FR2004002056 W FR 2004002056W WO 2005012882 A3 WO2005012882 A3 WO 2005012882A3
Authority
WO
WIPO (PCT)
Prior art keywords
determining
particle
distribution curve
factors
flattening
Prior art date
Application number
PCT/FR2004/002056
Other languages
English (en)
Other versions
WO2005012882A2 (fr
Inventor
Marie-Noelle Bouquety
Yannick Descantes
Larrard Francois De
Original Assignee
France Etat Ponts Chaussees
Marie-Noelle Bouquety
Yannick Descantes
Larrard Francois De
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by France Etat Ponts Chaussees, Marie-Noelle Bouquety, Yannick Descantes, Larrard Francois De filed Critical France Etat Ponts Chaussees
Publication of WO2005012882A2 publication Critical patent/WO2005012882A2/fr
Publication of WO2005012882A3 publication Critical patent/WO2005012882A3/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N15/0227—Investigating particle size or size distribution by optical means using imaging; using holography
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N2015/025—Methods for single or grouped particles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N2015/1497—Particle shape

Landscapes

  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

L'invention concerne un procédé et un dispositif de détermination d'un coefficient d'aplatissement (A%) d'un matériau divisé. Le procédé comporte les étapes suivantes : a) on amène un matériau divisé composé d'au moins une particule (12),b) on projette une ombre (28) de ladite particule (12), c) on approche ladite ombre (28) par une ellipse (32), d) on détermine des données de ladite ellipse (32), e) on détermine une longueur et une grosseur de ladite particule à partir desdites données de l'ellipse (32), f) on détermine un facteur d'allongement d'une particule (12), g) on trace une courbe de distribution des facteurs d'allongement, h) on construit une courbe de distribution des facteurs d'aplatissement en transformant ladite courbe de distribution des facteurs d'allongement dans un même repère, en effectuant une affinité dans ledit repère, et i) on détermine un coefficient d'aplatissement (A%) sur ladite courbe de distribution des facteurs d'aplatissement.
PCT/FR2004/002056 2003-08-01 2004-07-30 Procede et dispositif de determination d'un coefficient d'aplatissement d'un materiau WO2005012882A2 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR0309555 2003-08-01
FR0309555A FR2858411B1 (fr) 2003-08-01 2003-08-01 Procede et dispositif de determination d'un coefficient d'aplatissement d'un materiau

Publications (2)

Publication Number Publication Date
WO2005012882A2 WO2005012882A2 (fr) 2005-02-10
WO2005012882A3 true WO2005012882A3 (fr) 2005-04-07

Family

ID=34043751

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/FR2004/002056 WO2005012882A2 (fr) 2003-08-01 2004-07-30 Procede et dispositif de determination d'un coefficient d'aplatissement d'un materiau

Country Status (2)

Country Link
FR (1) FR2858411B1 (fr)
WO (1) WO2005012882A2 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108387259B (zh) * 2018-03-22 2024-05-17 厦门攸信信息技术有限公司 视觉检测机构及视觉检测系统

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4288162A (en) * 1979-02-27 1981-09-08 Sumitomo Kinzoku Kogyo Kabushiki Kaisha Measuring particle size distribution
US4497576A (en) * 1981-01-14 1985-02-05 L'etat Francais Article analyzer apparatus by silhouette projection
US5748311A (en) * 1996-03-11 1998-05-05 Hamann; Oliver Apparatus and method of particle geometry measurement by speckle pattern analysis
US20020164063A1 (en) * 2001-03-30 2002-11-07 Heckman Carol A. Method of assaying shape and structural features in cells
EP1273901A1 (fr) * 2001-07-02 2003-01-08 Université de Liège Méthode et appareillage pour mesure automatique de granulométrie et de morphométrie de particules

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4288162A (en) * 1979-02-27 1981-09-08 Sumitomo Kinzoku Kogyo Kabushiki Kaisha Measuring particle size distribution
US4497576A (en) * 1981-01-14 1985-02-05 L'etat Francais Article analyzer apparatus by silhouette projection
US5748311A (en) * 1996-03-11 1998-05-05 Hamann; Oliver Apparatus and method of particle geometry measurement by speckle pattern analysis
US20020164063A1 (en) * 2001-03-30 2002-11-07 Heckman Carol A. Method of assaying shape and structural features in cells
EP1273901A1 (fr) * 2001-07-02 2003-01-08 Université de Liège Méthode et appareillage pour mesure automatique de granulométrie et de morphométrie de particules

Also Published As

Publication number Publication date
WO2005012882A2 (fr) 2005-02-10
FR2858411B1 (fr) 2006-05-26
FR2858411A1 (fr) 2005-02-04

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