WO2004113933A3 - Low cost electronic probe devices manufactured from conductive loaded resin-based materials - Google Patents

Low cost electronic probe devices manufactured from conductive loaded resin-based materials Download PDF

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Publication number
WO2004113933A3
WO2004113933A3 PCT/US2004/019012 US2004019012W WO2004113933A3 WO 2004113933 A3 WO2004113933 A3 WO 2004113933A3 US 2004019012 W US2004019012 W US 2004019012W WO 2004113933 A3 WO2004113933 A3 WO 2004113933A3
Authority
WO
WIPO (PCT)
Prior art keywords
conductive
fiber
loaded resin
combination
probe devices
Prior art date
Application number
PCT/US2004/019012
Other languages
French (fr)
Other versions
WO2004113933A2 (en
Inventor
Thomas Aisenbrey
Original Assignee
Integral Technologies Inc
Thomas Aisenbrey
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Integral Technologies Inc, Thomas Aisenbrey filed Critical Integral Technologies Inc
Publication of WO2004113933A2 publication Critical patent/WO2004113933A2/en
Publication of WO2004113933A3 publication Critical patent/WO2004113933A3/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06788—Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

Electronic probe devices (170) are formed of a conductive loaded resin-based material. The conductive loaded resin-­based material comprises micron conductive powder(s) (34), conductive fiber(s) (38), or combination of conductive powder and conductive fibers in a base resin host. The ratio of the weight of the conductive powder(s), conductive fiber(s), or a combination of conductive powder and conductive fibers to the weight of the base resin host is between about 0.20 and 0.40. The micron conductive powders are formed from non-metals, such as carbon, graphite, that may also be metallic plated, or the like, or from metals such as stainless steel, nickel, copper, silver, that may also be metallic plated, or the like, or from a combination of non-metal, plated, or in combination with, metal powders. The micron conductor fibers preferably are of nickel plated carbon fiber, stainless steel fiber, copper fiber, silver fiber, or the like.
PCT/US2004/019012 2003-06-16 2004-06-16 Low cost electronic probe devices manufactured from conductive loaded resin-based materials WO2004113933A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US47877603P 2003-06-16 2003-06-16
US60/478,776 2003-06-16

Publications (2)

Publication Number Publication Date
WO2004113933A2 WO2004113933A2 (en) 2004-12-29
WO2004113933A3 true WO2004113933A3 (en) 2006-03-02

Family

ID=33539118

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2004/019012 WO2004113933A2 (en) 2003-06-16 2004-06-16 Low cost electronic probe devices manufactured from conductive loaded resin-based materials

Country Status (1)

Country Link
WO (1) WO2004113933A2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20150084655A1 (en) * 2013-09-25 2015-03-26 Tektronix, Inc. Switched load time-domain reflectometer de-embed probe
KR102163843B1 (en) * 2019-03-04 2020-10-12 (주)디팜스테크 A contact pin for a semiconductor socket which can form a pre-ionized plating part and enhance reliability
CN115236371B (en) * 2022-07-25 2023-03-07 东莞市竹菱铜业有限公司 Nano probe and preparation method thereof

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3367186A (en) * 1965-08-27 1968-02-06 Measurement Science Corp Resistance thermometer
US4341992A (en) * 1980-01-21 1982-07-27 Control Electronics Co., Inc. Conductive probe cover
JPH0921827A (en) * 1995-07-05 1997-01-21 Sony Corp Resistance measuring device
GB2377449A (en) * 2001-07-09 2003-01-15 Michael Patrick Sayers Electrically conductive polymer composition

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3367186A (en) * 1965-08-27 1968-02-06 Measurement Science Corp Resistance thermometer
US4341992A (en) * 1980-01-21 1982-07-27 Control Electronics Co., Inc. Conductive probe cover
JPH0921827A (en) * 1995-07-05 1997-01-21 Sony Corp Resistance measuring device
GB2377449A (en) * 2001-07-09 2003-01-15 Michael Patrick Sayers Electrically conductive polymer composition

Also Published As

Publication number Publication date
WO2004113933A2 (en) 2004-12-29

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