WO2003103008A1 - Spectrometre de masse a temps de vol combinant des champs non lineaires dans le temps et l'espace - Google Patents

Spectrometre de masse a temps de vol combinant des champs non lineaires dans le temps et l'espace Download PDF

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Publication number
WO2003103008A1
WO2003103008A1 PCT/US2003/016777 US0316777W WO03103008A1 WO 2003103008 A1 WO2003103008 A1 WO 2003103008A1 US 0316777 W US0316777 W US 0316777W WO 03103008 A1 WO03103008 A1 WO 03103008A1
Authority
WO
WIPO (PCT)
Prior art keywords
ion
time
electric field
ion source
detector
Prior art date
Application number
PCT/US2003/016777
Other languages
English (en)
Inventor
Robert J. Cotter
Benjamin D. Gardner
John F. Holland
Original Assignee
The Johns Hopkins University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by The Johns Hopkins University filed Critical The Johns Hopkins University
Priority to AU2003238769A priority Critical patent/AU2003238769A1/en
Publication of WO2003103008A1 publication Critical patent/WO2003103008A1/fr
Priority to US11/352,301 priority patent/US7372021B2/en

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers

Definitions

  • the resolving power is independently degraded by each of the starting parameters, with the overall resolving power representing the combined effect of the space and energy resolutions.
  • the total resolving power, R is defined as
  • R t While not a fundamental parameter of ion motion, the term R t is included for those cases where ions may be formed during the finite time of ion extraction from the source.
  • the term Reiect r onics is also included here to acknowledge that in practice, if all ion space and energy effects can be corrected or eliminated, the ultimate limitation to R is that imposed by the speed and precision of the detector and electronics circuitry.
  • FIG. 3 A shows a graph of the voltage potential versus the length so between the ion source (backing plate) and the drawout grid or exit grid.
  • the voltage potential decreases linearly to reach zero volt at the exit grid, illustrated in FIG. 3A by a dotted vertical line.
  • the focus position lies at a distance of 2so from the exit grid.
  • the focus position is indicated on FIG. 3A by a vertical line.
  • Non-linear-field mirrors that focus a broad range of initial ion energies have also been developed using either an entirely gridless design to achieve a single non-linear field (Cornish, T. J., Cotter, R. J. Rapid Comm. Mass Spectrom., 1993, 7, 1037-1040), or a gridded design generating a combination of linear and non-linear fields (Beussman, Douglas J., Vlasak, Paul R., McLane, Richard D.; Seeterlin, Mary A.; Enke, Christie G. Anal. Chem. 1995, 67(21), 3952-3957).
  • FIG. 1A is a schematic representation of a conventional time- of-flight spectrometer

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)

Abstract

L'invention concerne un spectromètre de masse à temps de vol présentant une source d'ions, un tube à vide, placé à proximité de la source d'ions et conçu pour recevoir des ions provenant de la source d'ions, ainsi qu'un détecteur placé à une extrémité du tube à vide opposée à une extrémité située à proximité de cette source d'ions. Ladite source d'ions est conçue pour générer un champ électrique qui varie non linéairement en fonction d'une position le long d'une trajectoire allant de la source d'ions au détecteur. Cette source d'ions est également conçue pour générer un champ électrique qui varie en fonction du temps, ce champ électrique étant destiné à accélérer des ions entre la source d'ions et le détecteur.
PCT/US2003/016777 2002-05-30 2003-05-30 Spectrometre de masse a temps de vol combinant des champs non lineaires dans le temps et l'espace WO2003103008A1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
AU2003238769A AU2003238769A1 (en) 2002-05-30 2003-05-30 Time of flight mass specrometer combining fields non-linear in time and space
US11/352,301 US7372021B2 (en) 2002-05-30 2006-02-13 Time-of-flight mass spectrometer combining fields non-linear in time and space

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US38434402P 2002-05-30 2002-05-30
US60/384,344 2002-05-30

Related Child Applications (2)

Application Number Title Priority Date Filing Date
US10516131 A-371-Of-International 2003-05-30
US11/352,301 Continuation US7372021B2 (en) 2002-05-30 2006-02-13 Time-of-flight mass spectrometer combining fields non-linear in time and space

Publications (1)

Publication Number Publication Date
WO2003103008A1 true WO2003103008A1 (fr) 2003-12-11

Family

ID=29712014

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2003/016777 WO2003103008A1 (fr) 2002-05-30 2003-05-30 Spectrometre de masse a temps de vol combinant des champs non lineaires dans le temps et l'espace

Country Status (2)

Country Link
AU (1) AU2003238769A1 (fr)
WO (1) WO2003103008A1 (fr)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7576323B2 (en) 2004-09-27 2009-08-18 Johns Hopkins University Point-of-care mass spectrometer system
EP2584587A2 (fr) 2011-10-21 2013-04-24 Shimadzu Corporation Analyseur de masse à temps de vol avec une meilleure puissance de résolution
CN109616398A (zh) * 2017-09-28 2019-04-12 布鲁克道尔顿有限公司 反射器飞行时间质谱仪中的宽范围高质量分辨率

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4458149A (en) * 1981-07-14 1984-07-03 Patrick Luis Muga Time-of-flight mass spectrometer
US5032722A (en) * 1989-06-23 1991-07-16 Bruker Franzen Analytik Gmbh MS-MS time-of-flight mass spectrometer
DE4442348A1 (de) * 1994-11-29 1996-05-30 Bruker Franzen Analytik Gmbh Vorrichtung und Verfahren zur verbesserten Massenauflösung eines Flugzeit-Massenspektrometers mit Ionenreflektor
US5969348A (en) * 1996-09-20 1999-10-19 Bruker Daltonik Gmbh Wide mass range focusing in time-of-flight mass spectrometers
WO2000076638A1 (fr) * 1999-06-11 2000-12-21 The Johns Hopkins University Procede et appareil d'extraction pulsee a correlation de masse pour un analyseur a temps de vol

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4458149A (en) * 1981-07-14 1984-07-03 Patrick Luis Muga Time-of-flight mass spectrometer
US5032722A (en) * 1989-06-23 1991-07-16 Bruker Franzen Analytik Gmbh MS-MS time-of-flight mass spectrometer
DE4442348A1 (de) * 1994-11-29 1996-05-30 Bruker Franzen Analytik Gmbh Vorrichtung und Verfahren zur verbesserten Massenauflösung eines Flugzeit-Massenspektrometers mit Ionenreflektor
US5969348A (en) * 1996-09-20 1999-10-19 Bruker Daltonik Gmbh Wide mass range focusing in time-of-flight mass spectrometers
WO2000076638A1 (fr) * 1999-06-11 2000-12-21 The Johns Hopkins University Procede et appareil d'extraction pulsee a correlation de masse pour un analyseur a temps de vol

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7576323B2 (en) 2004-09-27 2009-08-18 Johns Hopkins University Point-of-care mass spectrometer system
EP2584587A2 (fr) 2011-10-21 2013-04-24 Shimadzu Corporation Analyseur de masse à temps de vol avec une meilleure puissance de résolution
US9136100B2 (en) 2011-10-21 2015-09-15 Shimadzu Corporation ToF mass analyser with improved resolving power
CN109616398A (zh) * 2017-09-28 2019-04-12 布鲁克道尔顿有限公司 反射器飞行时间质谱仪中的宽范围高质量分辨率
GB2568354A (en) * 2017-09-28 2019-05-15 Bruker Daltonik Gmbh Wide-range high mass resolution in reflector time-of-flight mass spectrometers
US10615022B2 (en) 2017-09-28 2020-04-07 Bruker Daltonik Gmbh Wide-range high mass resolution in reflector time-of-flight mass spectrometers
CN109616398B (zh) * 2017-09-28 2021-06-25 布鲁克道尔顿有限公司 反射器飞行时间质谱仪中的宽范围高质量分辨率
GB2568354B (en) * 2017-09-28 2022-08-10 Bruker Daltonics Gmbh & Co Kg Wide-range high mass resolution in reflector time-of-flight mass spectrometers
DE102018122960B4 (de) 2017-09-28 2024-05-08 Bruker Daltonics GmbH & Co. KG Breitbandig hohe Massenauflösungen in Reflektor-Flugzeitmassenspektrometern

Also Published As

Publication number Publication date
AU2003238769A1 (en) 2003-12-19

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