WO2003092062A3 - Surface protection sheet and electronic device package - Google Patents

Surface protection sheet and electronic device package Download PDF

Info

Publication number
WO2003092062A3
WO2003092062A3 PCT/US2003/008511 US0308511W WO03092062A3 WO 2003092062 A3 WO2003092062 A3 WO 2003092062A3 US 0308511 W US0308511 W US 0308511W WO 03092062 A3 WO03092062 A3 WO 03092062A3
Authority
WO
WIPO (PCT)
Prior art keywords
electronic device
protection sheet
surface protection
device package
substrate
Prior art date
Application number
PCT/US2003/008511
Other languages
French (fr)
Other versions
WO2003092062A2 (en
Inventor
Makoto Sakakibara
Original Assignee
3M Innovative Properties Co
Makoto Sakakibara
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 3M Innovative Properties Co, Makoto Sakakibara filed Critical 3M Innovative Properties Co
Priority to AU2003214239A priority Critical patent/AU2003214239A1/en
Publication of WO2003092062A2 publication Critical patent/WO2003092062A2/en
Publication of WO2003092062A3 publication Critical patent/WO2003092062A3/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting

Abstract

To provide a surface protection sheet useful as a back grinding tape, which does not cause defects or damages when an electronic device is subjected to grinding.A surface protection sheet used by being adhered to an element-fabricated surface of an electronic device, in which the surface protection sheet comprises a substrate and an adhesive layer supported by one surface of the substrate, and has a magnetic force sufficient to fix or necessary to assist in fixation of the electronic device when the electronic device is fixed to a fabrication apparatus for further fabrication of an element-unfabricated surface of the electronic device.
PCT/US2003/008511 2002-04-24 2003-03-20 Surface protection sheet and electronic device package WO2003092062A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AU2003214239A AU2003214239A1 (en) 2002-04-24 2003-03-20 Surface protection sheet and electronic device package

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2002122561A JP2003318142A (en) 2002-04-24 2002-04-24 Surface protection sheet and electronic component package
JP2002-122561 2002-04-24

Publications (2)

Publication Number Publication Date
WO2003092062A2 WO2003092062A2 (en) 2003-11-06
WO2003092062A3 true WO2003092062A3 (en) 2004-03-18

Family

ID=29267452

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2003/008511 WO2003092062A2 (en) 2002-04-24 2003-03-20 Surface protection sheet and electronic device package

Country Status (4)

Country Link
JP (1) JP2003318142A (en)
AU (1) AU2003214239A1 (en)
TW (1) TW200401356A (en)
WO (1) WO2003092062A2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101820528B1 (en) * 2016-01-13 2018-01-19 송혜경 Masking Tape having Magnetpart

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3612955A (en) * 1969-01-21 1971-10-12 Bell Telephone Labor Inc Circuit board containing magnetic means for positioning devices
JPH05114643A (en) * 1991-10-21 1993-05-07 Sony Corp Holding method for wafer sheet of semiconductor wafer
JPH0778360A (en) * 1993-09-10 1995-03-20 Tosoh Corp Polishing jig and polishing method for stamper
US5479694A (en) * 1993-04-13 1996-01-02 Micron Technology, Inc. Method for mounting integrated circuits onto printed circuit boards and testing
US5966591A (en) * 1997-08-07 1999-10-12 Read-Rite Corporation Method and tool for handling micro-mechanical structures
US6302775B1 (en) * 2000-03-22 2001-10-16 Motorola, Inc. Apparatus and method for cold cross-sectioning of soft materials
JP2002348554A (en) * 2001-05-24 2002-12-04 Lintec Corp Sheet for fixing work and method for machining work
WO2003054943A1 (en) * 2001-12-21 2003-07-03 Disco Corporation Support substrate for thin-sheet work

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3612955A (en) * 1969-01-21 1971-10-12 Bell Telephone Labor Inc Circuit board containing magnetic means for positioning devices
JPH05114643A (en) * 1991-10-21 1993-05-07 Sony Corp Holding method for wafer sheet of semiconductor wafer
US5479694A (en) * 1993-04-13 1996-01-02 Micron Technology, Inc. Method for mounting integrated circuits onto printed circuit boards and testing
JPH0778360A (en) * 1993-09-10 1995-03-20 Tosoh Corp Polishing jig and polishing method for stamper
US5966591A (en) * 1997-08-07 1999-10-12 Read-Rite Corporation Method and tool for handling micro-mechanical structures
US6302775B1 (en) * 2000-03-22 2001-10-16 Motorola, Inc. Apparatus and method for cold cross-sectioning of soft materials
JP2002348554A (en) * 2001-05-24 2002-12-04 Lintec Corp Sheet for fixing work and method for machining work
WO2003054943A1 (en) * 2001-12-21 2003-07-03 Disco Corporation Support substrate for thin-sheet work

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
PATENT ABSTRACTS OF JAPAN vol. 017, no. 476 (E - 1424) 30 August 1993 (1993-08-30) *
PATENT ABSTRACTS OF JAPAN vol. 1995, no. 06 31 July 1995 (1995-07-31) *
PATENT ABSTRACTS OF JAPAN vol. 2003, no. 04 2 April 2003 (2003-04-02) *

Also Published As

Publication number Publication date
AU2003214239A1 (en) 2003-11-10
WO2003092062A2 (en) 2003-11-06
JP2003318142A (en) 2003-11-07
TW200401356A (en) 2004-01-16

Similar Documents

Publication Publication Date Title
TW200606098A (en) Method and apparatus for peeling a film
EP1724319A4 (en) Heat-peelable pressure-sensitive adhesive sheet and method for processing adherend using the heat-peelable pressure-sensitive adhesive sheet
TW200710195A (en) Pressure-sensitive adhesive sheet, production method thereof and method of processing articles
TW200519810A (en) Electro-optical device, electronic equipment, and manufacturing method of electro-optical device
TWI268572B (en) Film peeling method and film peeling device
SG137801A1 (en) Surface protection film peeling method and surface protection film peeling device
MY147687A (en) Wafer-processing tape
SG107656A1 (en) Adhesive sheet for dicing glass substrate and method of dicing glass substrate
EP1895581A3 (en) Method of semiconductor wafer back processing, method of substrate back processing, and radiation-curable pressure-sensitive adhesive sheet
EP2096153A3 (en) Adhesive sheet for grinding back surface of semiconductor wafer and method for grinding back surface of semiconductor wafer using the same
SG107634A1 (en) Heat-peelable pressure-sensitive adhesive sheet for electronic part, method of processing electronic part, and electronic part
SG111946A1 (en) Die bonding sheet sticking apparatus and method of sticking die bonding sheet
EP0977254A3 (en) Hot-melt sheet for holding and protecting semiconductor wafers and method for applying the same
JP2005123382A5 (en)
EP1002845A3 (en) Pressure sensitive adhesive sheet and method of use thereof
EP1901123A4 (en) Photosensitive adhesive composition, and obtained using the same, adhesive film, adhesive sheet, semiconductor wafer with adhesive layer, semiconductor device and electronic part
AU2003252444A1 (en) Method and device for polishing substrate
WO2002029856A3 (en) A testing device for semiconductor components and a method of using the same
SG138537A1 (en) Peeling tape adhering method and peeling tape adhering device
WO2006047117A3 (en) Method for reducing semiconductor die warpage
SG153665A1 (en) Adhesive tape and edging method
MXPA06007570A (en) Protective film consisting of a hot-melt adhesive and method and device for applying said film.
UA90198C2 (en) Temperature-controlling mat
TW200509239A (en) Substrate joining method and apparatus
EP1542274A4 (en) Protective structure of semiconductor wafer, method for protecting semiconductor wafer, multilayer protective sheet used therein, and method for processing semiconductor wafer

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A2

Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BY BZ CA CH CN CO CR CU CZ DE DK DM DZ EC EE ES FI GB GD GE GH GM HR HU ID IL IN IS KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NI NO NZ OM PH PL PT RO RU SC SD SE SG SK SL TJ TM TN TR TT TZ UA UG US UZ VC VN YU ZA ZM ZW

AL Designated countries for regional patents

Kind code of ref document: A2

Designated state(s): GH GM KE LS MW MZ SD SL SZ TZ UG ZM ZW AM AZ BY KG KZ MD RU TJ TM AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LU MC NL PT RO SE SI SK TR BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG

121 Ep: the epo has been informed by wipo that ep was designated in this application
122 Ep: pct application non-entry in european phase