WO2003090276A2 - Method for the production of contact pads on a substrate and device for carrying out said method - Google Patents
Method for the production of contact pads on a substrate and device for carrying out said method Download PDFInfo
- Publication number
- WO2003090276A2 WO2003090276A2 PCT/FR2003/001261 FR0301261W WO03090276A2 WO 2003090276 A2 WO2003090276 A2 WO 2003090276A2 FR 0301261 W FR0301261 W FR 0301261W WO 03090276 A2 WO03090276 A2 WO 03090276A2
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- alloy
- pipe
- liquid metal
- matrix
- molding
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 16
- 238000000034 method Methods 0.000 title claims description 31
- 239000000758 substrate Substances 0.000 title description 5
- 238000000465 moulding Methods 0.000 claims abstract description 63
- 239000000956 alloy Substances 0.000 claims abstract description 60
- 229910045601 alloy Inorganic materials 0.000 claims abstract description 35
- 229910052751 metal Inorganic materials 0.000 claims abstract description 8
- 239000002184 metal Substances 0.000 claims abstract description 8
- 238000007711 solidification Methods 0.000 claims abstract description 8
- 230000008023 solidification Effects 0.000 claims abstract description 8
- 229910001338 liquidmetal Inorganic materials 0.000 claims description 42
- 239000011159 matrix material Substances 0.000 claims description 33
- 229910002065 alloy metal Inorganic materials 0.000 claims description 25
- 239000007789 gas Substances 0.000 claims description 23
- 238000002347 injection Methods 0.000 claims description 20
- 239000007924 injection Substances 0.000 claims description 20
- 230000001172 regenerating effect Effects 0.000 claims description 15
- BDAGIHXWWSANSR-UHFFFAOYSA-N methanoic acid Natural products OC=O BDAGIHXWWSANSR-UHFFFAOYSA-N 0.000 claims description 14
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 claims description 12
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 11
- OSWFIVFLDKOXQC-UHFFFAOYSA-N 4-(3-methoxyphenyl)aniline Chemical compound COC1=CC=CC(C=2C=CC(N)=CC=2)=C1 OSWFIVFLDKOXQC-UHFFFAOYSA-N 0.000 claims description 6
- 238000009792 diffusion process Methods 0.000 claims description 6
- 235000019253 formic acid Nutrition 0.000 claims description 6
- 229910052757 nitrogen Inorganic materials 0.000 claims description 6
- 238000011144 upstream manufacturing Methods 0.000 claims description 6
- 238000000926 separation method Methods 0.000 claims description 5
- 238000006073 displacement reaction Methods 0.000 claims description 4
- 238000002360 preparation method Methods 0.000 claims description 3
- 238000005213 imbibition Methods 0.000 claims 1
- 239000007788 liquid Substances 0.000 abstract description 7
- 230000008602 contraction Effects 0.000 abstract 1
- 239000000463 material Substances 0.000 description 12
- 238000010992 reflux Methods 0.000 description 6
- 230000005484 gravity Effects 0.000 description 4
- 239000007787 solid Substances 0.000 description 3
- 239000003963 antioxidant agent Substances 0.000 description 2
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- 230000007547 defect Effects 0.000 description 2
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- 238000007254 oxidation reaction Methods 0.000 description 2
- 239000012071 phase Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 238000003466 welding Methods 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 239000004809 Teflon Substances 0.000 description 1
- 229920006362 Teflon® Polymers 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 238000003491 array Methods 0.000 description 1
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- 230000015572 biosynthetic process Effects 0.000 description 1
- 229910052797 bismuth Inorganic materials 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 239000006071 cream Substances 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000001627 detrimental effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000001747 exhibiting effect Effects 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 229910052745 lead Inorganic materials 0.000 description 1
- 239000007791 liquid phase Substances 0.000 description 1
- 230000036244 malformation Effects 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 150000002829 nitrogen Chemical class 0.000 description 1
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- 230000008929 regeneration Effects 0.000 description 1
- 238000011069 regeneration method Methods 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 229910052718 tin Inorganic materials 0.000 description 1
- 238000009736 wetting Methods 0.000 description 1
Classifications
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
- H05K3/3457—Solder materials or compositions; Methods of application thereof
- H05K3/3468—Applying molten solder
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4814—Conductive parts
- H01L21/4846—Leads on or in insulating or insulated substrates, e.g. metallisation
- H01L21/4853—Connection or disconnection of other leads to or from a metallisation, e.g. pins, wires, bumps
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/11—Manufacturing methods
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/0556—Disposition
- H01L2224/05571—Disposition the external layer being disposed in a recess of the surface
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/05573—Single external layer
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/11—Manufacturing methods
- H01L2224/113—Manufacturing methods by local deposition of the material of the bump connector
- H01L2224/1131—Manufacturing methods by local deposition of the material of the bump connector in liquid form
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
- H01L2224/13001—Core members of the bump connector
- H01L2224/13099—Material
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- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01005—Boron [B]
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- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01013—Aluminum [Al]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01029—Copper [Cu]
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- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01033—Arsenic [As]
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- H01—ELECTRIC ELEMENTS
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01057—Lanthanum [La]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01058—Cerium [Ce]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01082—Lead [Pb]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01087—Francium [Fr]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/014—Solder alloys
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/01—Tools for processing; Objects used during processing
- H05K2203/0104—Tools for processing; Objects used during processing for patterning or coating
- H05K2203/0113—Female die used for patterning or transferring, e.g. temporary substrate having recessed pattern
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/12—Using specific substances
- H05K2203/128—Molten metals, e.g. casting thereof, or melting by heating and excluding molten solder
Definitions
- the present invention relates to the technical field of producing electrical connection pads, of the ball type, on surfaces of electronic components.
- the present invention relates more particularly to a method for producing at least one electrical contact pad on a reception area of an electronic component, in which an alloy or a liquid metal is injected into at least one pipe, which comprises two portions, a routing portion and a molding portion separated by a narrowing, said pipe being positioned so that the molding portion opens out against the reception area.
- the present invention also relates to a device for producing at least one electrical contact pad on a reception area of an electronic component, said device comprising a pipe intended for the passage of alloy or liquid metal, said pipe itself comprising two portions, a conveying portion forming part of a first part forming a matrix, and a molding portion forming part of a second part forming a mold, said conveying and molding portions being separated by a narrowing.
- a major challenge in the manufacture and installation of networks of connection pads lies in minimizing the number of production operations and the duration of said operations, so as to be able to equip pads with a substrate, in a minimum cycle time, without sacrificing the metallurgical and geometric quality of the studs.
- a conductive liquid alloy is injected into a guide formed by two separable parts, a mold and an injection matrix, with a narrowing of the guide at the separation of the parts; - The parts of the guide are separated while the alloy is liquid;
- the mold is separated from the substrate of the component before the alloy solidifies.
- the present invention also relates to a method for regenerating an assembly of electrical contact pads produced on receiving pads of an electronic component, in which an alloy or a liquid metal is injected into at least one pipe, which comprises two portions, a routing portion and a molding portion separated by a narrowing, said pipe being positioned so that the molding portion opens out against the reception area.
- the present invention finally relates to a device for regenerating a set of contact pads produced on the receiving areas of an electronic component, said device comprising a pipe intended for the passage of alloy or liquid metal, said pipe itself comprising two portions, a conveying portion forming part of a first part forming a matrix, and a molding portion forming part of a second part forming a mold, said conveying and molding portions being separated by a narrowing.
- the object assigned to the invention therefore aims to propose a new method for producing at least one electrical contact pad on a reception area of an electronic component, or for regenerating a set of electrical contact pads produced on a reception area of an electronic component, making it possible to remedy the various drawbacks listed above and capable of making electrical contact pads or of regenerating a set of electrical contact pads faster, simpler and less costly .
- Another object of the invention aims to propose a new method for producing at least one electrical contact pad on a reception area of an electronic component, or for regenerating a set of electrical contact pads produced on a reception of an electronic component, whose reliability is improved.
- Another object of the invention is to propose a new method for producing at least one electrical contact pad on a reception area of an electronic component or for regenerating a set of contact pads electrical produced on a reception area of an electronic component, making it possible to obtain electrical contact pads with excellent shape reproducibility.
- Another object of the invention is to propose a device for producing at least one electrical contact pad on a reception area of an electronic component, or for regenerating a set of electrical contact pads produced on a reception area of an electronic component, whose design is simplified and the kinematics, as well as the robustness, are improved.
- Another object of the invention is to propose a new device for producing at least one electrical contact pad on a reception area of an electronic component, or for regenerating a set of electrical contact pads produced on a location reception of an electronic component, with good reproducibility and homogeneity.
- Another object of the invention is to propose a new device for producing at least one electrical contact pad on a reception area of an electronic component, or for regenerating a set of electrical contact pads produced on reception of an electronic component making it possible to obtain studs of improved quality.
- the objects assigned to the invention are achieved using a method for producing at least one electrical contact pad on a reception area of an electronic component, or for regenerating a set of electrical contact pads produced on reception areas of an electronic component, in which: - an alloy or a liquid metal is injected into at least one pipe, which comprises two portions, one portion conveying and a molding portion separated by a narrowing, said pipe being positioned so that the molding portion opens out against the reception area,
- the molding portion and the reception area are separated before complete solidification of the metal or of the alloy, while keeping the routing and molding portions integral,
- the conveying portion is part of a first part forming a matrix
- the molding portion is part of a second separate part forming a mold, said matrix and mold being juxtaposed to form the pipe.
- a device for producing at least one electrical contact pad on a reception area of an electronic component, or for regenerating a set of electrical contact pads produced on reception areas of an electronic component said device comprising a pipe intended for the passage of alloy or of molten metal, said pipe itself comprising two portions, a routing portion forming part of a first part forming matrix, and a molding portion forming part of a second part forming a mold, said conveying and molding portions being separated by a narrowing, characterized in that it comprises a means for fixing the matrix relative to the mold allowing said matrix and mold are mounted fixedly juxtaposed to form the pipe.
- FIG. 4 schematically illustrates, in a sectional view, a detail of the device according to the invention, in a configuration corresponding to the process step shown in FIG. 1.
- FIG. 5 schematically illustrates an embodiment of the pipe of the device according to the invention.
- FIGS. 1 to 3 illustrate different steps of the method for producing at least one electrical contact pad 1 on a reception area 2 of an electronic component 3, in accordance with the invention.
- the electronic component 3 is made of any material well known to those skilled in the art, and includes electrically conductive receiving pads 2 which generally consist of metal tracks, for example copper or gold.
- an alloy or a liquid metal 4 is injected into at least one pipe 5.
- alloys which can be used in the context of the process according to the invention, mention may be made, purely by way of nonlimiting illustration, of alloys combining two or more, of the following elements: Sn, Pb, Bi, In.
- Line 5 comprises two portions 5A, 5B, namely a routing portion 5A and a molding portion 5B, separated by a narrowing 5C.
- Figures 1 to 4 show process and device using four lines, purely by way of illustration. It is indeed necessary to count as many pipes 5 as pads 1 to be produced, that is to say in practice generally several tens or hundreds.
- the injection of the alloy or of the liquid metal 4, which constitutes the welding material can be carried out by imposing, by any known means, an injection pressure on said liquid welding material 4, so as to force the latter to pass in line 5 in the direction of the reception area 2, in an injection direction shown in FIG. 1 by the arrow I.
- the routing portion 5A is extended by the molding portion 5B, so as to form a continuous pipe 5 in which the alloy or liquid metal 4 will follow a substantially and generally unidirectional trajectory, in the direction of injection I.
- the routing portions 5A and molding 5B can be rectilinear and have a common axial symmetry along an axis XX ′. It is also possible, without departing from the scope of the invention, for the respective axes of symmetry of the routing portions 5A and of the molding 5B to be offset and not to coincide.
- the routing portions 5A and molding 5B are of substantially cylindrical shape, the portion routing 5A having a constant section smaller than the section, also constant, of the molding portion 5B.
- the shrinkage 5C in this case comes from the difference in section between the routing portion 5A and the molding portion 5B.
- the narrowing 5C is understood here and in what follows as a restriction of section of the pipe 5 when the latter is traversed in the direction opposite to the direction of injection I, that is to say from the molding portion towards the routing portion.
- routing portions 5A and molding 5B are both of frustoconical shape, each of said portions of cones connecting at their respective minimum section, so as to produce a neck forming a narrowing 5C.
- the routing portion 5A is of rectilinear cylindrical shape and opens out at the minimum section of a molding portion 5B of frustoconical shape.
- the molding portion 5B has a substantially hemispherical or cavity shape, with an opening communicating with a routing portion 5A of cylindrical or frustoconical shape.
- the step described above thus constitutes a step of injecting an alloy or liquid metal 4 onto a reception area 2. At the end of this step, the injection pressure ceases to be imposed on the alloy or liquid metal 4.
- the molding portion 5B and the reception area 2 are separated before complete solidification of the metal or of the alloy 4, while holding the portions together routing 5A and molding 5B.
- the state “before complete solidification” corresponds to a state located outside the “all solid” zone delimited by the Solidus curve in the liquid-solid diagram of l 'alloy considered.
- Line 5 can be machined in one piece from the mass of a single part.
- the pipe 5 is however produced by two separate parts 6, 7.
- the routing portion 5A is part of a first part forming a matrix 6, and the molding portion 5B is part of a second separate part forming a mold 7, said matrix 6 and mold 7 being juxtaposed to form the pipe 5, as shown in FIGS. 1, 2 and 4.
- the mold 7 thus pressed against the matrix 6 makes it possible to create a continuous pipe 5, in the same way as if line 5 had been machined in a single part.
- the juxtaposition of two separate parts, such as the mold 7 and the matrix 6, however necessarily creates a clearance at the contact interface 8 between these two parts. This game, even an infinitesimal one, creates an air gap which turns out to contribute in a beneficial way to the demolding phase represented in FIG. 2, since it contributes to separate the material forming the primary pad 1A from that remaining in the matrix. at the routing line 5A.
- the juxtaposition of two distinct parts 6, 7, so as to form a unitary unitary assembly is a particularly appreciated embodiment of the pipe 5.
- the alloy or the liquid metal 4 is moved in the opposite direction to the injection (or reflux direction, illustrated by the arrow R) within the conveying portion 5A, before separating the portion 5B molding and the reception area 2.
- This reflux step which occurs between the injection step shown in Figure 1 and the release step shown in Figure 2, allows to break, at the level of shrinkage 5C and in cooperation with it, the “column” of alloy or liquid metal 4 present in the pipe 5, thus making it possible to facilitate and optimize the demolding operation, by perfectly controlling the quantity of material deposited on the reception area 2 to form the primary pad 1A.
- the displacement of the alloy 4 in the direction of the reflux R is achieved by suction, by imposing on the alloy or liquid metal 4 a pressure opposite to the injection pressure, that is to say a vacuum.
- the suction is carried out by the displacement, in the direction R opposite to the direction of injection, of a shutter element 9 of the valve type, located upstream of the pipe 5 in consideration of the direction of injection. I, towards a position where said obturation element 9 closes the supply of the pipe 5 in alloy or liquid metal 4.
- the obturation element 9 thus has a double function: it closes the supply of the pipe 5 and thus puts an end to the injection step, and its displacement through the alloy or the liquid metal 4 creates a depression substantially displacing the alloy or the liquid metal 4 in the conveying portion 5A in the direction of reflux R.
- the alloy or liquid metal constituting the primary pad 1A free of any mechanical influence, except that of the receiving area 2 on which it rests, will take the form of a substantially spherical cap, as shown in Figure 3, this geometry minimizing the surface tensions.
- the alloy or liquid metal will then cool and solidify completely.
- the separation of the molding portion 5B and of the reception area 2 takes place in a sheet of inert or reducing gas G.
- the gas G is preferably spread from before the demolding step shown in the figure 2, so as to carry out the demolding operation in a gaseous environment inhibiting the oxidation of the pads.
- the gas G comprises nitrogen.
- the gas G may however include any other neutral or reducing gas fulfilling the function of inhibiting oxidation.
- the gas G comprises a component comprising a carboxyl group (COOH).
- COOH carboxyl group
- the presence in the gas G of such a component in fact makes it possible to confer on it properties of aid in the formation of the pad 1 from the primary pad 1A, making it possible to rapidly form the balls 1 with good repeatability of form.
- the component comprising a carboxyl group is formic acid (H-COOH).
- the gas G thus constitutes an active atmosphere having a double function, namely an antioxidant function and a function for forming the pads 1.
- the device for producing at least one electrical contact pad 1 on a reception area 2 of an electronic component 3 comprises a pipe 5 intended for the passage of alloy or liquid metal 4.
- said pipe 5 itself comprises two portions, a routing portion 5A forming part of a first part forming a die 6, and a molding portion 5B forming part of a second part forming a mold 7, preferably distinct from the first play.
- Said routing portions 5A and molding 5B are separated by a narrowing 5C.
- the latter comprises a means 10 for fixing the matrix 6 relative to the mold 7, allowing said matrix 6 or mold 7 to be mounted juxtaposed in a fixed manner to form the pipe 5.
- the matrix 6 and the mold 7 are thus mounted to form a unitary unitary sub-assembly.
- the matrix 6 includes a plate comprising at least one porous zone which forms the conveying portion 5A.
- the matrix 6 can thus be produced from a porous material, the porosity of which is inhibited by chemical attack, varnishing or any other process well known to those skilled in the art, except in areas which constitute the routing portion 5A.
- the mold 7 can be manufactured by any process known to those skilled in the art.
- the material of the mold 7 is chosen so as not to wet the alloy or liquid metal 4, and to minimize the surface tension of the alloy / mold.
- the material can in particular be chosen from: stainless steel with chemical deburring, graphite, teflon, treated silicon.
- the device according to the invention comprises, upstream of the matrix 6 and in consideration of the direction I of passage (or injection) of the alloy or of the liquid metal 4, a reservoir 11 intended to contain the alloy or the liquid metal 4, said reservoir 11 having a lower opening 11A opening into a tank 12 communicating itself with said matrix 6.
- the passage of the alloy or of the liquid metal 4 through the lower opening 11A is controlled by an element d mobile shutter 9 of the valve type, capable of moving parallel to the direction of passage of the alloy or of the liquid metal 4, in the direction of injection l or in the opposite direction of reflux R, between a high stop position (not shown) where it closes the lower opening 11A, and at least one intermediate position (shown in FIG. 4) where it authorizes the passage of the alloy or of the liquid metal 4 towards the tank 12, then towards the matrix 6 .
- the movable closure element 9 of the valve type comprises a rod 9A and a head 9B of section greater than that of the rod 9A.
- the latter slides vertically between the edges of the opening 11 A, with sufficient clearance relative to said edges to allow passage of alloy or liquid metal 4.
- the opening 11A widens downstream in consideration of the direction of injection I, to form a chamber in which the head 9B moves.
- the matrix 6 is mounted in communication with this chamber in a sealed manner by means of a seal 13 to form the tank 12.
- the head 9B moves in the alloy or liquid metal contained in the tank 12, and can print this direction of passage in the routing portion 6.
- Such a valve-type arrangement thus makes it possible to carry out the step of stopping the injection and aspiration mentioned previously in the description of the process.
- the device according to the invention comprises means (not shown) for dispensing a gas G at the level of the molding portion 5B.
- This gas dispensing means makes it possible to saturate the atmosphere with a gas G which is preferably inert or reducing, so as to have an antioxidant function.
- Said gas G also preferably comprises a component comprising a carboxyl group (COOH), so as to have forming properties, with good repeatability, of the beads 1.
- the component exhibiting a carboxyl group is formic acid ( H-COOH).
- the gas G comprises nitrogen.
- the gas dispensing means G (not shown) comprises a diffusion means (not shown) and a preparation means (not shown) located upstream of said diffusion means, said diffusion means allowing the component to be imbibed. having a carboxyl group with an inert or reducing primary gas.
- the dispensing means comprises, as means of preparation, a container containing liquid formic acid which will be brought into contact with nitrogen, so that this nitrogen is soaked with formic acid and thus has the qualities mentioned above.
- the pipe 5 is arranged so as to be positioned above the reception area 2.
- This technical characteristic is completely independent of the fact that the matrix and the mold are formed from a single piece or from two separate pieces.
- This specific arrangement makes it possible to obtain particularly good results, no doubt due to the fact that any impurities contained in the alloy or liquid metal 4, and whose density is generally lower than that of the alloy or liquid metal 4, go up. in the direction of reflux R under the effect of gravity and do not come to accumulate at the level of the pad surface 14 in contact with the reception area 2, which could disturb the correct wetting of the pad 1A and its good adhesion to the reception area 2.
- This arrangement also makes it possible to avoid the accumulation, under the effect of gravity, of impurities at the level of the molding portion 5B and / or of the routing portion 5A , which could block said portions 5A, 5B.
- the invention thus relates, entirely independently, to a method for producing at least one electrical contact pad 1 on a reception area 2 of an electronic component, or for regenerating a set of electrical contact pads 1 produced on receiving areas 2 of an electronic component 3, into which a liquid alloy or a liquid metal 4 is injected into at least one pipe 5, which comprises two separate portions, a routing portion 5A and a molding portion 5B by a narrowing 5C, said pipe 5 being positioned so that the molding portion 5B opens against the reception area 2, said method also comprising a step in which the molding portion 5B is separated of the reception area 2 before complete solidification of the metal or of the alloy 4, while holding the routing portions 5A and the molding 5B integral, said pipe 5 being arranged so as to be positioned above the range d welcome 2 relative to gravity.
- the invention also relates independently to a device for producing at least one electrical contact pad 1 on a receiving pad 2 of an electronic component 3, or for regenerating a set of electrical contact pads 1 formed on pads reception 2 of an electronic component 3, said device comprising a pipe 5 intended for the passage of alloy or of liquid metal 4, said pipe 5 itself comprising two portions, a routing portion 5A forming part of a first part forming a matrix 6, and a molding portion 5B forming part of a second part forming a mold 7, said routing portions 5A and molding 5B being separated by a narrowing 5C, said device comprising a means 10 for fixing the matrix 6 relative to the mold 7, allowing said matrix 6 and mold 7 to be mounted juxtaposed in a fixed manner to form the pipe 5, said pipe 5 being arranged so as to be be positioned above the reception area, relative to gravity.
- the method can also be used to regenerate a set of electrical contact pads 1 produced on receiving pads 2 of an electronic component 3.
- the term “regenerate” here designates an operation repair of studs in the broad sense, in particular possibly involving the addition of material to correct or complete the size of studs, and / or reforming of studs. To this end, the same steps should be carried out as those implemented in the production of new studs according to the method described above, to rehabilitate arrays of balls 1 having defects (geometric especially).
- the first regeneration step thus consists in pressing the pipe 5 against the reception area 2, so that it includes the existing contact pad 1 to be corrected.
- an alloy or a liquid metal 4 is injected into the pipe 5, the latter occupying, at the level of the molding portion 5B, the space remaining left free by the existing stud 1 to be corrected. This produces a corrective overmolding of the defective stud.
- the device and the method in accordance with the invention make it possible to produce or regenerate networks of electrical contact pads 1 of the BGA type quickly, since the number of steps is optimized (no mold separation step and of the matrix), as well as the cycle time, since it is not necessary to wait until the material has solidified in the molding portion 5B before proceeding with demolding.
- the invention finds its industrial application in the production of electrical contact pads.
Abstract
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2004-7016840A KR20050006172A (en) | 2002-04-19 | 2003-04-18 | Method for the production of contact pads on a substrate and device for carrying out said method |
EP03746848A EP1500131A2 (en) | 2002-04-19 | 2003-04-18 | Method for the production of contact pads on a substrate and device for carrying out said method |
AU2003246848A AU2003246848A1 (en) | 2002-04-19 | 2003-04-18 | Method for the production of contact pads on a substrate and device for carrying out said method |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR02/04976 | 2002-04-19 | ||
FR0204976A FR2838913A1 (en) | 2002-04-19 | 2002-04-19 | Production or regeneration of electrical contact pads on a substrate involves injecting molten metal through the routing part and molding part of a conduit onto a receiving pad |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2003090276A2 true WO2003090276A2 (en) | 2003-10-30 |
WO2003090276A3 WO2003090276A3 (en) | 2004-04-01 |
Family
ID=28686225
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/FR2003/001261 WO2003090276A2 (en) | 2002-04-19 | 2003-04-18 | Method for the production of contact pads on a substrate and device for carrying out said method |
Country Status (6)
Country | Link |
---|---|
EP (1) | EP1500131A2 (en) |
KR (1) | KR20050006172A (en) |
CN (1) | CN1650414A (en) |
AU (1) | AU2003246848A1 (en) |
FR (1) | FR2838913A1 (en) |
WO (1) | WO2003090276A2 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103962677B (en) * | 2014-05-15 | 2016-01-13 | 苏州云远网络技术有限公司 | A kind of circuit board welder |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11274204A (en) * | 1998-03-26 | 1999-10-08 | Toshiba Corp | Formation of solder bump |
FR2792861A1 (en) * | 1999-04-30 | 2000-11-03 | Eric Pilat | METHOD FOR PRODUCING WELDING PLOTS ON A SUBSTRATE AND GUIDE FOR IMPLEMENTING THE METHOD |
US20010008250A1 (en) * | 1998-08-31 | 2001-07-19 | Hembree David R. | Method of forming a solder ball |
-
2002
- 2002-04-19 FR FR0204976A patent/FR2838913A1/en active Pending
-
2003
- 2003-04-18 KR KR10-2004-7016840A patent/KR20050006172A/en not_active Application Discontinuation
- 2003-04-18 AU AU2003246848A patent/AU2003246848A1/en not_active Abandoned
- 2003-04-18 EP EP03746848A patent/EP1500131A2/en not_active Withdrawn
- 2003-04-18 CN CNA038098008A patent/CN1650414A/en active Pending
- 2003-04-18 WO PCT/FR2003/001261 patent/WO2003090276A2/en not_active Application Discontinuation
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11274204A (en) * | 1998-03-26 | 1999-10-08 | Toshiba Corp | Formation of solder bump |
US20010008250A1 (en) * | 1998-08-31 | 2001-07-19 | Hembree David R. | Method of forming a solder ball |
FR2792861A1 (en) * | 1999-04-30 | 2000-11-03 | Eric Pilat | METHOD FOR PRODUCING WELDING PLOTS ON A SUBSTRATE AND GUIDE FOR IMPLEMENTING THE METHOD |
Non-Patent Citations (1)
Title |
---|
PATENT ABSTRACTS OF JAPAN vol. 2000, no. 01, 31 janvier 2000 (2000-01-31) -& JP 11 274204 A (TOSHIBA CORP), 8 octobre 1999 (1999-10-08) * |
Also Published As
Publication number | Publication date |
---|---|
WO2003090276A3 (en) | 2004-04-01 |
EP1500131A2 (en) | 2005-01-26 |
KR20050006172A (en) | 2005-01-15 |
AU2003246848A1 (en) | 2003-11-03 |
FR2838913A1 (en) | 2003-10-24 |
CN1650414A (en) | 2005-08-03 |
AU2003246848A8 (en) | 2003-11-03 |
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