WO2003061004A3 - Method for coding and authenticating semiconductor circuits - Google Patents

Method for coding and authenticating semiconductor circuits Download PDF

Info

Publication number
WO2003061004A3
WO2003061004A3 PCT/DE2003/000080 DE0300080W WO03061004A3 WO 2003061004 A3 WO2003061004 A3 WO 2003061004A3 DE 0300080 W DE0300080 W DE 0300080W WO 03061004 A3 WO03061004 A3 WO 03061004A3
Authority
WO
WIPO (PCT)
Prior art keywords
authenticating
coding
semiconductor circuits
chip
measurement
Prior art date
Application number
PCT/DE2003/000080
Other languages
German (de)
French (fr)
Other versions
WO2003061004A2 (en
Inventor
Ralf Brederlow
Astrid Elbe
Franz Kreupl
Johannes Luyken
Robert Neuhauser
Christian Paulus
Joerg Schepers
Roland Thewes
Original Assignee
Infineon Technologies Ag
Ralf Brederlow
Astrid Elbe
Franz Kreupl
Johannes Luyken
Robert Neuhauser
Christian Paulus
Joerg Schepers
Roland Thewes
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Infineon Technologies Ag, Ralf Brederlow, Astrid Elbe, Franz Kreupl, Johannes Luyken, Robert Neuhauser, Christian Paulus, Joerg Schepers, Roland Thewes filed Critical Infineon Technologies Ag
Publication of WO2003061004A2 publication Critical patent/WO2003061004A2/en
Publication of WO2003061004A3 publication Critical patent/WO2003061004A3/en

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K19/00—Record carriers for use with machines and with at least a part designed to carry digital markings
    • G06K19/06—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
    • G06K19/067—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components
    • G06K19/07—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components with integrated circuit chips
    • G06K19/073—Special arrangements for circuits, e.g. for protecting identification code in memory
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K19/00—Record carriers for use with machines and with at least a part designed to carry digital markings
    • G06K19/06—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
    • G06K19/067—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components
    • G06K19/07—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components with integrated circuit chips
    • G06K19/073—Special arrangements for circuits, e.g. for protecting identification code in memory
    • G06K19/07309—Means for preventing undesired reading or writing from or onto record carriers
    • G06K19/07372—Means for preventing undesired reading or writing from or onto record carriers by detecting tampering with the circuit
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/57—Protection from inspection, reverse engineering or tampering
    • H01L23/576—Protection from inspection, reverse engineering or tampering using active circuits
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
    • H01L2223/544—Marks applied to semiconductor devices or parts
    • H01L2223/54433—Marks applied to semiconductor devices or parts containing identification or tracking information
    • H01L2223/5444—Marks applied to semiconductor devices or parts containing identification or tracking information for electrical read out
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30—Technical effects
    • H01L2924/301—Electrical effects
    • H01L2924/3011—Impedance

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • Computer Security & Cryptography (AREA)
  • General Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Mathematical Physics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

According to the invention, an electrical characteristic of a material layer (3) or layer-type material structure is measured at various points provided with connection contacts (5, 6). A mean value of the measurement, taken from a base set of IC chips, is subtracted from a respective value, and a digital word for identifying the chip in question is formed on the basis of the result thus obtained, for each IC chip. The measurement can be carried out by means of a cross-correlation, the measuring regions crossing over each other.
PCT/DE2003/000080 2002-01-17 2003-01-13 Method for coding and authenticating semiconductor circuits WO2003061004A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE2002101645 DE10201645B4 (en) 2002-01-17 2002-01-17 Method for coding and authenticating semiconductor circuits
DE10201645.3 2002-01-17

Publications (2)

Publication Number Publication Date
WO2003061004A2 WO2003061004A2 (en) 2003-07-24
WO2003061004A3 true WO2003061004A3 (en) 2004-07-29

Family

ID=7712397

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/DE2003/000080 WO2003061004A2 (en) 2002-01-17 2003-01-13 Method for coding and authenticating semiconductor circuits

Country Status (3)

Country Link
DE (1) DE10201645B4 (en)
TW (1) TW200302353A (en)
WO (1) WO2003061004A2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7023363B1 (en) * 2005-02-17 2006-04-04 Saiful Bahari Saidan Position encoding using impedance comparison
CN101772775B (en) 2007-08-02 2013-07-10 Nxp股份有限公司 Tamper-resistant semiconductor device and methods of manufacturing thereof
EP2665094A1 (en) 2012-05-15 2013-11-20 Nxp B.V. Tamper resistant IC

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6460110A (en) * 1987-08-31 1989-03-07 Toshiba Corp Code identifying circuit
EP0404985A1 (en) * 1989-06-29 1991-01-02 Siemens Aktiengesellschaft Identification circuit for integrated semiconductor circuits
EP0893705A2 (en) * 1997-07-04 1999-01-27 Integrated Detector & Electronics AS Method and system for reading data signal emitted by an active pixel in a sensor
US5881155A (en) * 1996-04-01 1999-03-09 Schlumberger Industries Security device for a semiconductor chip
JP2000068833A (en) * 1998-08-21 2000-03-03 Meidensha Corp Digital filter system
US6047068A (en) * 1995-09-19 2000-04-04 Schlumberger Industries Method for determining an encryption key associated with an integrated circuit
US6161213A (en) * 1999-02-17 2000-12-12 Icid, Llc System for providing an integrated circuit with a unique identification
DE10025213A1 (en) * 1999-06-24 2001-01-18 Mitsubishi Electric Corp Semiconductor device for protecting access e.g. to mobile telephone had circuit for encoding dispersion of polycrystalline substance in semiconductor element

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3736882C2 (en) * 1987-10-30 1997-04-30 Gao Ges Automation Org Method for checking the authenticity of a data carrier with an integrated circuit
US6459095B1 (en) * 1999-03-29 2002-10-01 Hewlett-Packard Company Chemically synthesized and assembled electronics devices

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6460110A (en) * 1987-08-31 1989-03-07 Toshiba Corp Code identifying circuit
EP0404985A1 (en) * 1989-06-29 1991-01-02 Siemens Aktiengesellschaft Identification circuit for integrated semiconductor circuits
US6047068A (en) * 1995-09-19 2000-04-04 Schlumberger Industries Method for determining an encryption key associated with an integrated circuit
US5881155A (en) * 1996-04-01 1999-03-09 Schlumberger Industries Security device for a semiconductor chip
EP0893705A2 (en) * 1997-07-04 1999-01-27 Integrated Detector & Electronics AS Method and system for reading data signal emitted by an active pixel in a sensor
JP2000068833A (en) * 1998-08-21 2000-03-03 Meidensha Corp Digital filter system
US6161213A (en) * 1999-02-17 2000-12-12 Icid, Llc System for providing an integrated circuit with a unique identification
DE10025213A1 (en) * 1999-06-24 2001-01-18 Mitsubishi Electric Corp Semiconductor device for protecting access e.g. to mobile telephone had circuit for encoding dispersion of polycrystalline substance in semiconductor element

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
PATENT ABSTRACTS OF JAPAN vol. 013, no. 270 (E - 776) 21 June 1989 (1989-06-21) *
PATENT ABSTRACTS OF JAPAN vol. 2000, no. 06 22 September 2000 (2000-09-22) *
WIJARANAKULA W ET AL: "A FORMATION OF CRYSTAL DEFECTS IN CARBON-DOPED CZOCHRALSKI-GROWN SILICON AFTER A THREE-STEP INTERNAL GETTERING ANNEAL", JOURNAL OF THE ELECTROCHEMICAL SOCIETY, ELECTROCHEMICAL SOCIETY. MANCHESTER, NEW HAMPSHIRE, US, VOL. 138, NR. 7, PAGE(S) 2153-2159, ISSN: 0013-4651, XP000293484 *

Also Published As

Publication number Publication date
WO2003061004A2 (en) 2003-07-24
DE10201645B4 (en) 2007-04-26
DE10201645A1 (en) 2003-08-07
TW200302353A (en) 2003-08-01

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