WO2002097382A3 - In situ calibration of photodiodes - Google Patents

In situ calibration of photodiodes Download PDF

Info

Publication number
WO2002097382A3
WO2002097382A3 PCT/GB2002/002429 GB0202429W WO02097382A3 WO 2002097382 A3 WO2002097382 A3 WO 2002097382A3 GB 0202429 W GB0202429 W GB 0202429W WO 02097382 A3 WO02097382 A3 WO 02097382A3
Authority
WO
WIPO (PCT)
Prior art keywords
detector
array
light source
detectors
opto
Prior art date
Application number
PCT/GB2002/002429
Other languages
French (fr)
Other versions
WO2002097382A2 (en
Inventor
Joseph Alan Barnard
Daniel James Danskin
Original Assignee
Bookham Technology Plc
Joseph Alan Barnard
Daniel James Danskin
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bookham Technology Plc, Joseph Alan Barnard, Daniel James Danskin filed Critical Bookham Technology Plc
Priority to AU2002257951A priority Critical patent/AU2002257951A1/en
Publication of WO2002097382A2 publication Critical patent/WO2002097382A2/en
Publication of WO2002097382A3 publication Critical patent/WO2002097382A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/08—Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)

Abstract

A system for calibrating an array of light detectors, each detector having an opto-electrical response according to which incident light is converted to an electrical value, the system comprising: a light source arranged to illuminate the array of detectors; a reference detector having a know opto-electric response and being located such that it is illuminated by the light source simultaneously with at least one detector of the array; a measurement device arranged to measured the electrical value output from the detector under calibration and the reference value output from the reference detector whilst those detectors are being illuminated by the light source and operable to compare said values to derive a sensitivity correction factor for said detector under calibration; and wherein the array, the light source and the reference detector are integrated on a common chip for carrying out in situ calibrations.
PCT/GB2002/002429 2001-05-30 2002-05-24 In situ calibration of photodiodes WO2002097382A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AU2002257951A AU2002257951A1 (en) 2001-05-30 2002-05-24 In situ calibration of photodiodes

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB0113103A GB0113103D0 (en) 2001-05-30 2001-05-30 In situ calibration of photodiodes
GB0113103.6 2001-05-30

Publications (2)

Publication Number Publication Date
WO2002097382A2 WO2002097382A2 (en) 2002-12-05
WO2002097382A3 true WO2002097382A3 (en) 2003-08-28

Family

ID=9915536

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/GB2002/002429 WO2002097382A2 (en) 2001-05-30 2002-05-24 In situ calibration of photodiodes

Country Status (3)

Country Link
AU (1) AU2002257951A1 (en)
GB (1) GB0113103D0 (en)
WO (1) WO2002097382A2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10360696B4 (en) * 2003-12-19 2008-04-10 Infineon Technologies Ag Test device for electrical and optical measurements of an integrated circuit optical sensor
US7276681B2 (en) 2005-05-26 2007-10-02 Bae Systems Information And Electronic Systems Integration Inc. On-board light source based gain correction for semi-active laser seekers
CN112630753B (en) * 2020-12-18 2023-05-23 上海交通大学 Correction system and correction method for optical phased array chip

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4585934A (en) * 1979-03-05 1986-04-29 Hughes Aircraft Company Self-calibration technique for charge-coupled device imagers
US4695794A (en) * 1985-05-31 1987-09-22 Santa Barbara Research Center Voltage calibration in E-beam probe using optical flooding

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4585934A (en) * 1979-03-05 1986-04-29 Hughes Aircraft Company Self-calibration technique for charge-coupled device imagers
US4695794A (en) * 1985-05-31 1987-09-22 Santa Barbara Research Center Voltage calibration in E-beam probe using optical flooding

Also Published As

Publication number Publication date
AU2002257951A1 (en) 2002-12-09
GB0113103D0 (en) 2001-07-18
WO2002097382A2 (en) 2002-12-05

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