WO2002056038A1 - Procédé de détection de courts-circuits dans une carte à circuit imprimé, sondes à piston utilisées pour ce procédé, carte à circuit imprimé prévue pour ce type d'examen, détecteur de court-circuit dans une carte à circuit imprimé, et détecteur à enroulement pour cet examen - Google Patents

Procédé de détection de courts-circuits dans une carte à circuit imprimé, sondes à piston utilisées pour ce procédé, carte à circuit imprimé prévue pour ce type d'examen, détecteur de court-circuit dans une carte à circuit imprimé, et détecteur à enroulement pour cet examen Download PDF

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Publication number
WO2002056038A1
WO2002056038A1 PCT/JP2000/009287 JP0009287W WO02056038A1 WO 2002056038 A1 WO2002056038 A1 WO 2002056038A1 JP 0009287 W JP0009287 W JP 0009287W WO 02056038 A1 WO02056038 A1 WO 02056038A1
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WO
WIPO (PCT)
Prior art keywords
circuit
short
pattern lines
sensor
circuit pattern
Prior art date
Application number
PCT/JP2000/009287
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English (en)
Japanese (ja)
Inventor
Shuji Yamaoka
Original Assignee
Oht Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oht Inc. filed Critical Oht Inc.
Priority to PCT/JP2000/009287 priority Critical patent/WO2002056038A1/fr
Publication of WO2002056038A1 publication Critical patent/WO2002056038A1/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/315—Contactless testing by inductive methods

Definitions

  • the present invention relates to a short inspection device for detecting a circuit fiber having a fine roving pattern, a method thereof, and a jig and a sensor used for the inspection.
  • the amount of change in the resistance value between turns is extremely small. For example, if the resistance value is 5 ⁇ in normal condition, the resistance value is about 4 O mQ and the force does not change (decrease) in ⁇ where a short circuit occurs. The change in the color is smaller than the change in the resistance to inversion of the probe, and therefore, the variation cannot be detected much by ordinary resistance measurement. At present, complicated four-terminal methods are used in the Nada area to perform simple resistance measurements.
  • a ⁇ ⁇ line is also generated by a semi-short ⁇ state force s. It could not be applied to the bare circuit board.
  • the present invention provides a St anti-inspection method and apparatus for a bare circuit S on which fine pitch pattern lines are laid.
  • the present invention can detect not only 3 ⁇ 4 ⁇ ⁇ but also a semi-short state of 1 ⁇ , and a short-time method and apparatus resistant to noise can be used. Disclosure of the invention
  • a short circuit for short-circuiting at least two circuit pattern lines and ffft at least two pattern lines is a short circuit for detecting the presence or absence of a short circuit in a circuit subjected to a force S.
  • a judgment step is provided for determining that a short force S is present between the two circuit pattern lines.
  • the accuracy is improved by increasing the current value of the test signal flowing through the two circuit pattern lines and the short ⁇ pattern line.
  • the short-circuit pattern line is used to protect an electronic circuit that may be exposed to the two circuit pattern lines from electrostatic damage. It is provided and will be cut off after the inspection. Use existing ones skillfully Thus, it is possible to suppress an increase in man-hours which would have been increased by newly providing a short ⁇ pattern line for the sake of quality.
  • the present invention is a shelf when a circuit having two circuit pattern lines each having a pattern line portion that is short and close to each other is used.
  • circuit fibers do not have short pattern lines.
  • the cabin signal includes an AC component, and a sensor for detecting an AC field is used in the venom detection process.
  • a sensor for detecting an AC field is used in the venom detection process.
  • a sensor having a coil for detecting an AC magnetic field formed by a Fujimi AC component in a SiitBt edging process is provided by By placing the rooster on the side of the e, sensor sensitivity can be increased.
  • the tiriB two circuit pattern lines and the tin self-shortening pattern line form a substantially closed knob, and the substantial center of the closed knob It is necessary to arrange the sin self-sensor to the sin self-short ⁇ pattern line so that the line of magnetic force penetrating through the center of the tin self-sensor. it can.
  • the Et food signal is applied to the two circuit pattern lines in a straightforward manner in the venom application step.
  • Direct application of the test signal is preferred because it easily increases the applied current value.
  • the tin pattern line is provided at one end of the two circuit pattern lines.
  • the short-circuit pattern lines are provided at both ends of the two circuit pattern lines.
  • the self-sensor has a width that substantially covers the arrangement of the two circuit pattern lines.
  • the installation position of the sensor which is the position of the short fault, affects the output of the sensor signal. Therefore, based on the position where the two circuit pattern lines are close to each other, the position where the Fujimi sensor is to be arranged is determined based on claim 13.
  • the ttflB two circuit patterns are provided as in claim 14! 3 ⁇ 4 ⁇ Determine the number of knitting sensors and the position of each sensor based on the distribution of the lengths of the adjacent parts.
  • a short circuit tester of a circuit fiber according to any one of claims 1 to 16 is suitable for performing a test replacement with a circuit tester having the following configuration.
  • the sickle is close to each other and long in the length direction; two circuit pattern lines extending on the circuit described above, and one end of the two circuit pattern lines fill A first short pattern line for shortening the line, and a short line between each of the two circuit pattern lines, and a tin line between both ends of the two circuit pattern lines.
  • pads and pads for inputting inspection signals there are formed pads and pads for inputting inspection signals.
  • the jigs are close to each other and long in the long direction.
  • the two circuit pattern lines extending on the self-circuit fiber and the one end of the two circuit pattern lines A first short pattern line for shortening the two circuit pattern lines, and a knitting pattern between each of the two circuit pattern lines for each of the two circuit pattern lines;
  • a probe pin for applying a true signal provided at a position corresponding to the return pad position, and a key are located above the two circuit pattern lines to detect the electromagnetic fields of the two circuit patterns and Tsuru et al.
  • the magnetic field sensor and the force S are provided.
  • igffl can be used for both the open and the short sides of the prosthesis.
  • the jig according to claim 20 is arranged at an upper position corresponding to the ends of the two circuit pattern lines, and detects the electric field from the two circuit pattern lines. It is assumed that the capacity sensor and the force S are provided.
  • FIG. 1 is a diagram showing a key structure of a sensor used for detecting short-circuit faults in connection with the present invention
  • FIG. 2 is a diagram showing the operating principle of the sensor of FIG.
  • FIG. 3 is a diagram showing a configuration of a work fiber inspected by the inspection apparatus of the first difficult form.
  • FIG. 4 is a view for explaining a part of the work fiber of FIG.
  • FIG. 5 is a view for explaining a relationship between a sensor used for a male tester of the first embodiment (further, a second embodiment) and a pattern line on a peak.
  • FIG. 6 is a block diagram illustrating a configuration of a device according to the first embodiment (further, a second embodiment).
  • FIG. 7 is a timing chart illustrating the relationship between the input signal ( ⁇ signal) and the sensor output signal in the detection of FIG.
  • FIG. 8 is a view for explaining a configuration of an inspection board 400 which is an inspection sentence of an inspection device of a first ability string, and further, a position of a sensor suitable for the inspection.
  • FIG. 9 is a view for explaining a configuration of a jig adapted to the detection difficulty in FIG.
  • FIG. 10 is a flowchart for explaining the control method I injection (acquisition of reference data) of the eclipse of the first embodiment (further, the second & M).
  • FIG. 11 is a flowchart illustrating a control procedure (acquisition of inspection data) of a detection device in a first real key $ state (further, a second embodiment).
  • Fig. 12 shows the work fiber 500] detected by the second embodiment. A diagram explaining the typical configuration.
  • FIG. 13 is a view for explaining the current flowing to the workpiece # 500 when the workpiece # 500 force 3 ⁇ 4E is normal.
  • FIG. 14 is a view for explaining a current flowing through the work 500 in the case where a short-term error has occurred in the work S500.
  • FIG. 15 shows the work translation: An open-ended failure occurred at 500
  • FIG. 4 illustrates current flowing through 500.
  • FIG. 16 is a diagram illustrating a circuit corresponding to the work fiber in FIG.
  • FIG. 17 shows how the sensor output changes when the standing position of the short mouth changes when the short failure force is generated ⁇ and when the resistance value changes when the short 1% is changed.
  • FIG. Fig. 18 shows that the short fault occurred at a position different from that in Fig. 17 and that the #m contact, the short standing force S changed, and the short resistance
  • the sensor output is FIG.
  • FIG. 19 is a diagram for explaining how the sensor output changes from 1 to 1 in the case where an opening fault occurs and its occurrence position changes.
  • FIG. 20 is a diagram illustrating a configuration of a work fiber to be used for the detection device according to the second embodiment.
  • FIG. 21 is an extension of FIG. 20 in order to adapt the inspection apparatus to the second embodiment.
  • FIG. 1 shows a sensor 110 used for fiber detection according to the present invention (hereinafter, referred to as a "short sensor") and a short fault inspection circuit 3 ⁇ 4
  • the pattern wire may be composed of the conductive wires 100a and 100b of.
  • Some pattern lines on the circuit male are intended for signal transfer and for fff integration. However, as long as the width and pitch of the pattern line are fine, the pattern of the present invention can be used. There is no change to being a line.
  • Patterns, lines 100a and 100b are metal conductors having a line width of ⁇ mg ⁇ .
  • the patterns, lines 100a and 100b, are shortened by the short pier 100c.
  • a pattern is formed with a pattern line 100a, 100b and a short line 100c.
  • This short wire 100 c is used to cause a magnetic field to be formed inside the knot by causing a current to flow through the knot.
  • This short wire 100 c is specially provided for this short time.
  • a short bar or solid paste of a conductive metal is used to prevent electrostatic blasting. An example of adding a new short bar in order to create a new bar (Fig. 21) will be explained.
  • the “solid application” means a portion indicated by notching in FIGS. 20 and 21. Such a solid portion is generally generated in a bare board or the like due to a factor in a manufacturing process of the tii. In this swelling, the function of shortening the solid portion is the same as that of the short bar, and is used.
  • an inspection signal is applied to the predetermined pattern lines 100a and 100b by using contact pins.
  • the test signal is a signal including an AC component, for example, a sine wave signal, a symbol including an arbitrary AC component, a tff symbol including a predetermined number of repetitions, and a signal including a signal. like this
  • the senor 110 is not limited to a force using a coil in the example of FIG. 1, but is replaced by a GMR (giant magnec resonance) element, a horn element, or the like. As long as the sensor element can detect the change in the magnetic field, V and deviation may be used.
  • GMR giant magnec resonance
  • the short-wave sensor 110 is positioned above the fiber so as to straddle the pattern lines 100a and 100b without removing the sensor itself to the pattern lines as shown in FIG. .
  • the size of the short sensor 110 is large enough to cross the pattern lines 100a and 100b. The reason for this is that by setting the size of the sensor 110 to be equal to or larger than the pitch between the pattern lines, high accuracy is not required when positioning the sensor 110.
  • the sensor 110 In order to increase the value of the output signal E, the sensor 110 must be close to the short line 100c. Short line near 100 c! / The higher the standing, the stronger the magnetic field based on this short crane 100 c. In the example of FIG. 1, since the distance of the short bar 100c is high, it is easy to position the sensor 110 close to the short bar 100c.
  • the senor 110 is vertically attached to the substrate to be detected as shown.
  • a sensor 110 composed of a coil detects a time change E of the alternating magnetic field H.
  • the alternating magnetic field H flows through the pattern lines 100a, 100b and the short line 100c, etc .; it is determined based on the value of the signal branch current I ⁇ Is.
  • the inspection is performed by actively utilizing the fact that the fiber of the actual inspection contains a large number of short bars (or fortune-telling fortune).
  • a plurality of pattern lines flowing vertically are shortened at one end thereof, and are shorted at one end thereof, and are opened to the other end.
  • the second aspect of the present invention deals with the determination of the presence or absence of a short-circuit fault in a circuit board, and the short-circuit fault in a circuit sickle that is short and short at both ends. Handles the determination of the presence or absence of the disorder.
  • FIG. 3 shows an example of a short bar of work difficulties to be determined according to the first embodiment.
  • a lead frame circuit for an LSI package is formed on one bare board 200 so as to be 18 ⁇ (6 ⁇ 3) adjacent in the left, right, up and down directions.
  • Each lead frame circuit is composed of a plurality of lead wires arranged in a diagonal pattern around the part where the LSI knockout is to be mounted, a die pad as a terminal of the lead wire, and an extension from the die pad. And a lead line extending to the die pad of the adjacent lead frame.
  • each lead frame circuit is provided with a row of five die pads, one row; and one sensor power is provided for each row of pads. It is shown. That is, one sensor force S setting for each of the four pad rows Be killed.
  • FIG. 4 shows the relationship between the pad row, short
  • the plurality of lead frames shown in FIGS. 3 and 4 are provided with a short lead (or short bar) for protecting an LSI package (not shown) from electrostatic rupture.
  • the wire is electrically connected (ie, short) with the lead wire of another adjacent LSI. This short wire is mounted after the LSI is mounted and bonded.
  • the cut position is shown as “cut position” in FIG. Therefore, before cutting, as shown in FIG.
  • this pattern line constitutes a plurality of parallel systems.
  • one sensor is responsible for multiple loops.
  • a common short line power S is provided for five pattern lines, and four steps are formed. inputs the signal to the pin and P 2, in order to perform a short circuit test for flop inputs the test signal to the pin P 2 and P 3, flop R 3 Nitsure, short ⁇ hand to do inputs an inspection signal to the pin P 3 and P 4, in order to perform a short ⁇ test Te flop R 4 Nitsu ⁇ is such that the input test signals to the pin P 4 and P 5 .
  • the output from the sensor is detected as a signal and a signal via a probe pin for the sensor.
  • the potential difference between the signals is signal E in FIG.
  • FIG. 6 is a block diagram showing an inspection system for dislike of the first real-style $ 200 assemblage fiber (for example, FIG. 3). .
  • this detection method 200 requires each die frame to have 20 die pads, and thus requires four sensors. For this reason, the system uses 360 probe pins to send inspection signals to 360 lead pads for 18 lead frames on the board 200 to be inspected. ( ⁇ ! ⁇ ) And 72 pairs of probe pins to pick up the output signals from the 72 sensors and R 1; S 2 and R 2 , — S 72 and R 72 ) and force S are required.
  • These probe pins (1) are mounted in advance on a jig (not shown) (for example, a jig as shown in FIG. 9).
  • This jig is a piercing jig that has been designed in advance according to the shape and pattern line arrangement of the bare board 200, which is the fiber to be inspected. For example, when the sensor is lowered vertically, for example, the sensor and the sensor can be brought close to each other while in a non-worming state.
  • the jig, 3 6 0 of the probe pins for inspection signal application and (-? 36.) 7 2 pairs of probe pins for extraction output signal (and S 2 and R 2, _S 72 and R 72 ) and force S are also provided.
  • one ⁇ "loop circuit (formed by two pattern lines and short lines) and one sensor associated with this loop circuit As is clear from FIG. 5, specifying one circuit and one sensor is equivalent to specifying the controller 3 0 6 1 and its top circuit in the system of FIG. Two probe pins (any two of ⁇ ?
  • the 2 ⁇ 360 multiplexer 310 has 7 2 0 addresses.
  • Rogusuit suchi either et configured, by a selection signal from the controller 3 0 6, by selecting two terminals machine sold to pin to two out of the 3 6 0
  • This probe pins to P 360), which Connect the two terminals to the two outputs of the signal generator 3 1 0.
  • the 1 4 4 X 2 mano! ⁇ Plexer 302 is also controlled by the controller 360 and has 72 pairs of probe pins ( , S 2 and R 2 , _S 72 and R 72 ), and select this terminal to connect the two inputs of amplifier 303 Connect to force.
  • the signal generation circuit 310 in FIG. 6 outputs 5 to 6 pulse trains of a predetermined shape at one time.
  • the electromotive force induced by the magnetic field change generated by such a pulse train is amplified by the amplifier 303, and a predetermined frequency component is extracted by the filter 304.
  • the output from the filter 304 is sampled by the S / H circuit 305 and taken into the memory 307 via the controller 306.
  • the input inspection signal has five or six shots.
  • the signal detected by the sensor has a phase delay determined by the inductance of the inspection probe, the inductance of the sensor, and the filter 304, as shown in FIG.
  • the S / H circuit 305 is configured such that the amplitude of the pulse train of the output signal in which such a delay has occurred has a non-uniform amplitude.
  • the output pulse signal is extracted and the average value of the output signals is output to the memory 307 as the output of the corresponding signal.
  • the memory 307 stores the data (reference data) S obtained in advance by performing the same measurement for the reference test, so that the work sickle of the test sentence is measured as described above. J is compared with the reference data of the reference work to determine if the circuit is short or open.
  • the first example is an example in which the shape and number of sensors according to the actual work male 400 are devised.
  • £ 300 of the Chinese pattern is composed of four pattern lines (410, 411, 41
  • the short-wave detection sensors 402, 403 consist of coils, similar to the sensor in Fig. 5, and are connected to four pattern lines (410, 411, 412, 413). It has the size including. However, the two short-wave detection sensors 402, 403 are not compatible with each other due to their different purposes. The shape (size) of / is different.
  • the purpose of the larger sensor 402 is to detect a short distance between the sensor 402 and the open circuit (420-432).
  • many of the short expected parts of the pattern lines (410, 411, 412, 413) are located close to the sensors 402 and 403. There is, therefore, a small signal output that is expected. Therefore, in order to increase the S / N ratio of the signal output, the size of the sensor 402 is increased, and the shape and position of the sensor 402 are devised so as to surround the pads 430 to 433. did.
  • the sensor 403 aims to detect a short line in a long pattern line below the terminals 420 to 423. Since the distance between the sensor 402 and the short ⁇ point is long, the sensor signal output becomes relatively large, and the size of the sensor 400 can be reduced in inverse proportion to this. .
  • a bug sensor Japanese Patent Application No. 9-2649119 based on the capacitance change by the applicant of the present application is used to detect the open state. hand I have.
  • the signal picked up by the sensor 401 is a radiated I wave from a test signal (also including an AC component) imprinted on any of the pin probes 43 to 43.
  • FIG. 9 shows a jig 450 equipped with three sensors used in the first embodiment. It should be noted that the probe pins are not shown in the drawing to prevent the drawing from becoming complicated.
  • V It is possible to use a plurality of short-wave detection sensors (402, 403), and the output value of each sensor is large or small according to ⁇ If up to the expected position of the sensor. In order to make the difference, it is possible to reduce the shape of the sensor (403), which is expected to increase the output, and to reduce the size of the circuit while maintaining the judgment accuracy. By increasing the shape of the sensor (402) that is to be expected, the judgment accuracy can be improved.
  • the inspection sickle is a work sickle in which both ends of the pattern of the pattern are shortened.
  • FIG. 12 is a diagram modeling a test fiber 500 used for the second string $ state. Inspection
  • the circuit pattern of No. 500 has a gentle circuit pattern line on its surface, but for convenience of explanation, the surface of # 500 has an outer pattern (501a, 501b, 501c, 501) surrounding the outer circumference. d), a first circuit pattern line 502a, a second circuit pattern line 502b, a third circuit pattern line 502c, and a fourth circuit pattern line 5Old. It is a simple one. As is clear from FIG.
  • the c and 502 d form a number of closed knob circuits.
  • Each of the circuit patterns, marks 502a, 502b, 502c, and 502d is provided with a pad 503a, 503b, 503c, 503d for setting a probe pin.
  • the relationship between the short-circuited portion and the position of the pad for inputting the inspection signal was simple because the short length was only the negative end. However, the fiber was passed through both ends. In the difficult case, it is important to select the position of the sensor.
  • the determination of the sensor arrangement position in the second haze example will be described. It should be noted that this can be directly applied to the outline system of the first actual expansion state and the inspection system of the first embodiment. Note that in the actual case, the implied symbol is used as the;! ⁇ Signal, but in the description of Embodiment 2 using the drawings such as FIGS. Instead of using an AC model, a DC model is used.
  • the medullary system of the first embodiment shown in FIG. 6 can be used as it is.
  • an inspection signal (1 amp) is applied to the pads 503a and 503b from the signal generator 310.
  • a current of 900raA flows in the node 510 and a current of lOOraA flows in the node 511.
  • the output of the sensor 110 is 100 as a relative value by obtaining the output force S corresponding to the current of lOOraA by the sensor 110
  • the value of 100 is the basic value for judging whether or not the difficulty is normal. (Reference data).
  • a short fault 520 force as shown in Fig. 14 is generated between S pattern / lines 502a and 502b.
  • most of the current (9 OmA in the example of Fig. 14) flowing through the sensor will be short, and the sensor output will be '' Then decrease to 10).
  • a short circuit is detected from this output decrease.
  • the opening iC® 530 force S was generated at pattern line 502a and the 15th garden was exposed.
  • the humility passing through the sensor 110 decreases, and the sensor output decreases.
  • the detection method of the second embodiment is such that both ends are shortened by being surrounded by the outer peripheral pattern lines (501a, 501b, etc.).
  • Two (or more) pattern lines (502a, 502b) Inspection of 500 difficulties caused by short-term failures and open-ended failures (Fig. 13) and pattern lines (502 a, 502b) ⁇
  • the difference between the output of the sensor 110 and the output of the same sensor under normal conditions is ⁇ 3 ⁇ 4 ⁇ , normal, short-circuit faults, and open-ended faults can be eliminated. .
  • Fig. 16 shows the surface circuit diagram when the force S is generated.
  • FIG. Indicates the DC resistance of the turn line.
  • the sensor position of the sensor 110 is set to 1 so as to cover the pattern lines 502a and 502b.
  • the pattern lines 502b and 502c were similarly covered: the sensor position of ⁇ was set to 110b, and the pattern lines 502c and 502d were covered: the sensor position of ⁇ was set to 110c, respectively.
  • the sensor output is assumed to be proportional to the value of the current flowing through the pattern line of the sensor. Therefore, in FIG. 16, the sensor output is represented by the current flowing through the pattern line. The values are replaced with values.
  • a current of 36.6 mA flows in the positive direction in the pattern 502a, and a current of 10.7 mA flows in the negative direction in the pattern 502b.
  • the sensor 110 when the sensor 110 is placed between the patterns 502 a and 502 b (close to the short-circuited portion on the right side of the pattern) (the sensor at this time is 1 47.3raA power was obtained as the sensor output (expressed as 10a) (when converted to current value), and the sensor 110 was placed between patterns 502b and 502c.
  • the sensor output is expressed as 1 10 b) (by current value conversion)
  • 10.9 mA was obtained, and the sensor 1 10 was placed between the pattern 5 0 2 c and '5 0 2 d.
  • a sensor output (in direct conversion) of 0.3 mA was obtained (the sensor at this time is represented as 110 c).
  • Fig. 17 shows that when dew is generated between the pattern lines 502a and 502b, the fiber standing changes (horizontal axis direction), or the short ⁇ resistance value decreases.
  • the sensor output current conversion
  • the sensor output was 47.7 mA when the short circuit was not superimposed (normal).
  • the sensor output was 44.31 mA, and the rate of decrease in the sensor output was -7.1%.
  • the sensor output was 41.33raA, and the rate of decrease to its normal value (47.7mA) was -13.4%.
  • the sensor output was 34.65 mA and the rate of decrease was -27.4%.
  • the table in Fig. 18 shows that the short ⁇ strives between the pattern lines 502 b and 502 c: in ⁇ , the standing of the short mouth changed (horizontal axis direction): ⁇
  • the table in Fig. 19 shows that when an open (or open) failure occurs in any part of the work fiber 500 in Fig. 12, the sensor is changed according to the change in the position of the open arrogance. It shows how the output of 110 changes. According to the table in the figure, it can be seen that both the sensor 110a and the sensor 11Ob can obtain a sufficient sensor output reduction rate. That is, in the second embodiment, the short-wave detection sensor can also be used for detecting an open heart disease.
  • the second embodiment (or the first embodiment) is to identify the short-span placement, the ability to detect the short-lived string is not required. If the purpose of the detection can be achieved by being able to detect the occurrence of a short circuit somewhere, if fiber is generated, the larger the value of the decrease rate of the sensor output to the normal output, the shorter the value ! This means that the accuracy of judging the presence or absence of rawness can be improved. Also, from the results of FIGS. 17 and 19, the more the 3 ⁇ 4 ⁇ ⁇ ⁇ ⁇ and the larger the gf ⁇ between the location of the short-lived; ⁇ and the sensor, When the sensor output value is normal, the rate of decrease is high. Therefore, if the Tankan occurs ⁇ ⁇ , and if the pattern position can be predicted in advance,
  • Fig. 20 shows the cage of the work difficult 600, where the position of the second array is the inspection 3 ⁇ 4 " ⁇ .
  • the black part is the part where the deposited film by the metal conductor is formed.
  • 600 Force Although the shape is similar to that of # 400 in Fig. 8, it is easy to generate short-circuit faults in the area 601, and the point that four pattern lines are close to each other. In four pattern lines in some 60 1
  • pads for setting probe pins 63 0 to 63 3 3 are the same as pads 4 30 to 43 3 in Figure 8). Requires pads.
  • the area of 61 is too narrow to form a pad because the spacing force S between pattern lines is too small.
  • the pads 6400 to 643 and the lead wires extending from each of those pads are And were connected to the metal conductors of these leads. That is, similar to the fiber 600, the inferiority 700 is maintained at both ends of the pattern line of the inspection document, and the short state force S is maintained. In this way, it is possible to further provide an extension area (extension area) and provide a pad for setting a pin, and to secure a short state, and to shorten the short detection sensor. It can be used for both lt detection and openness detection.
  • the system configuration for the detection of the second difficult condition can use the one shown in FIG. 6 of the first male form.
  • the control procedures in FIG. 10 and FIG. 11 are described in steps S6, S20, S22, S34, S48, and S5.
  • Procedure 0 can be deleted, and the other steps can be used without change. This is because, in the second embodiment and the second difficulty, the short-circuit detection sensor can also be used for detecting an opening failure.
  • the force S was important to determine the sensor position and the pad position. Therefore, a CAD device that determines the sensor position and the pad position is proposed as a variable sequence.
  • the circuit fiber of the inspection document is designed by the user's CAD device according to the purpose of the circuit fiber.
  • This $ example CAD device uses a circuit fiber set by the user. Using CAD data, the shape of the circuit fiber is displayed on a display device, and the inspection jig is designed on this display screen. ⁇
  • the designer of the inspection jig decides where to put the pads and where to put the sensors on the display screen of this CAD device while looking at the dense pattern line in the circuit designed by the user. To do it.
  • a pattern line having a division line is « ⁇ (constitutively a short state. Therefore, a circuit having a pattern line having such a division line; in the case of ⁇ , the shape of the sensor of the above embodiment is changed. In other words, a plurality of sensors must be arranged so that the sensors do not cover both the pattern line and the segment line, or, for example, the sensor positions are arranged so as to include the pattern lines.
  • the sensor is moved to a position that covers the line of the pattern line.Note that there are some cases where it is difficult to distinguish the sensor when the pattern line and the branch line are close to each other.
  • splitting the sensor for force ie, setting the size of one sensor to cover the pattern springs (and the other pattern lines without » ⁇ ).
  • »Sensor size Are distributed so as to cover the branch line of the pattern line (and the pattern line having no other ⁇ line, and the other pattern line ⁇ ).

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

La présente invention concerne un appareil et un procédé de détection précise de court-circuit dans une carte à circuit imprimé. Ce procédé de détection de court-circuit dans une carte à circuit intégré implique au moins deux lignes de tracé de circuit et une ligne de tracé en court-circuit qui court-circuite les deux lignes de tracé du circuit. Ce procédé se caractérise en ce qu'on commence par appliquer un signal d'examen spécifié entre les deux lignes de tracé de circuit. On mesure alors la valeur d'intensité du signal d'examen circulant par les deux lignes de tracé de circuit et la ligne de tracé en court-circuit. Dès lors, on fait une comparaison entre une première valeur d'intensité du signal d'examen mesuré et une deuxième valeur d'intensité du signal d'examen préalablement enregistrée pour une carte normale de circuit imprimé de référence. Enfin, si la première valeur d'intensité diffère de la deuxième valeur d'intensité, on considère qu'il y a un court-circuit entre les deux lignes de tracé de circuit.
PCT/JP2000/009287 2000-12-27 2000-12-27 Procédé de détection de courts-circuits dans une carte à circuit imprimé, sondes à piston utilisées pour ce procédé, carte à circuit imprimé prévue pour ce type d'examen, détecteur de court-circuit dans une carte à circuit imprimé, et détecteur à enroulement pour cet examen WO2002056038A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
PCT/JP2000/009287 WO2002056038A1 (fr) 2000-12-27 2000-12-27 Procédé de détection de courts-circuits dans une carte à circuit imprimé, sondes à piston utilisées pour ce procédé, carte à circuit imprimé prévue pour ce type d'examen, détecteur de court-circuit dans une carte à circuit imprimé, et détecteur à enroulement pour cet examen

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2000/009287 WO2002056038A1 (fr) 2000-12-27 2000-12-27 Procédé de détection de courts-circuits dans une carte à circuit imprimé, sondes à piston utilisées pour ce procédé, carte à circuit imprimé prévue pour ce type d'examen, détecteur de court-circuit dans une carte à circuit imprimé, et détecteur à enroulement pour cet examen

Publications (1)

Publication Number Publication Date
WO2002056038A1 true WO2002056038A1 (fr) 2002-07-18

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PCT/JP2000/009287 WO2002056038A1 (fr) 2000-12-27 2000-12-27 Procédé de détection de courts-circuits dans une carte à circuit imprimé, sondes à piston utilisées pour ce procédé, carte à circuit imprimé prévue pour ce type d'examen, détecteur de court-circuit dans une carte à circuit imprimé, et détecteur à enroulement pour cet examen

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WO (1) WO2002056038A1 (fr)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS559146A (en) * 1978-07-06 1980-01-23 Pentel Kk Tablet testing device
JPS6463878A (en) * 1987-09-03 1989-03-09 Kyushu Nippon Electric Shortcircuit position detecting apparatus
JPS6469965A (en) * 1987-09-10 1989-03-15 Mitsubishi Electric Corp Checking apparatus of wiring
JPH0339989A (ja) * 1989-07-07 1991-02-20 Matsushita Electric Ind Co Ltd 透明導電回路基板の欠陥検査法
JPH08105926A (ja) * 1994-10-05 1996-04-23 Fujitsu Ltd 配線パターン検査装置及び配線パターン検査方法
JP2001041994A (ja) * 1999-05-24 2001-02-16 Nidec-Read Corp 基板の配線検査装置および配線検査方法

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS559146A (en) * 1978-07-06 1980-01-23 Pentel Kk Tablet testing device
JPS6463878A (en) * 1987-09-03 1989-03-09 Kyushu Nippon Electric Shortcircuit position detecting apparatus
JPS6469965A (en) * 1987-09-10 1989-03-15 Mitsubishi Electric Corp Checking apparatus of wiring
JPH0339989A (ja) * 1989-07-07 1991-02-20 Matsushita Electric Ind Co Ltd 透明導電回路基板の欠陥検査法
JPH08105926A (ja) * 1994-10-05 1996-04-23 Fujitsu Ltd 配線パターン検査装置及び配線パターン検査方法
JP2001041994A (ja) * 1999-05-24 2001-02-16 Nidec-Read Corp 基板の配線検査装置および配線検査方法

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