WO2002017022A3 - Verfahren zur prozesssteuerung - Google Patents
Verfahren zur prozesssteuerung Download PDFInfo
- Publication number
- WO2002017022A3 WO2002017022A3 PCT/EP2001/009598 EP0109598W WO0217022A3 WO 2002017022 A3 WO2002017022 A3 WO 2002017022A3 EP 0109598 W EP0109598 W EP 0109598W WO 0217022 A3 WO0217022 A3 WO 0217022A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- module
- nonconformity
- assurance
- process control
- data gathering
- Prior art date
Links
- 238000000034 method Methods 0.000 title abstract 10
- 238000004886 process control Methods 0.000 title abstract 3
- 238000000275 quality assurance Methods 0.000 abstract 2
- 238000004519 manufacturing process Methods 0.000 abstract 1
- 238000012544 monitoring process Methods 0.000 abstract 1
- 230000002265 prevention Effects 0.000 abstract 1
- 230000003449 preventive effect Effects 0.000 abstract 1
- 238000012797 qualification Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
- G05B19/41875—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by quality surveillance of production
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
- G06Q10/00—Administration; Management
- G06Q10/06—Resources, workflows, human or project management; Enterprise or organisation planning; Enterprise or organisation modelling
- G06Q10/063—Operations research, analysis or management
- G06Q10/0639—Performance analysis of employees; Performance analysis of enterprise or organisation operations
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
Landscapes
- Business, Economics & Management (AREA)
- Engineering & Computer Science (AREA)
- Human Resources & Organizations (AREA)
- General Physics & Mathematics (AREA)
- Quality & Reliability (AREA)
- Economics (AREA)
- Entrepreneurship & Innovation (AREA)
- Development Economics (AREA)
- Strategic Management (AREA)
- Physics & Mathematics (AREA)
- Educational Administration (AREA)
- Tourism & Hospitality (AREA)
- Operations Research (AREA)
- Marketing (AREA)
- General Business, Economics & Management (AREA)
- Game Theory and Decision Science (AREA)
- Theoretical Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Automation & Control Theory (AREA)
- Management, Administration, Business Operations System, And Electronic Commerce (AREA)
- General Factory Administration (AREA)
Abstract
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP01974200A EP1314069A2 (de) | 2000-08-23 | 2001-08-21 | Verfahren zur prozesssteuerung |
AU2001293781A AU2001293781A1 (en) | 2000-08-23 | 2001-08-21 | Process control method |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10041296A DE10041296A1 (de) | 2000-08-23 | 2000-08-23 | Verfahren zur Prozeßsteuerung |
DE10041296.3 | 2000-08-23 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2002017022A2 WO2002017022A2 (de) | 2002-02-28 |
WO2002017022A3 true WO2002017022A3 (de) | 2002-09-19 |
Family
ID=7653468
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP2001/009598 WO2002017022A2 (de) | 2000-08-23 | 2001-08-21 | Verfahren zur prozesssteuerung |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP1314069A2 (de) |
AU (1) | AU2001293781A1 (de) |
DE (1) | DE10041296A1 (de) |
WO (1) | WO2002017022A2 (de) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1577726A1 (de) * | 2004-03-17 | 2005-09-21 | Abb Research Ltd. | System und Verfahren zur Überwachung und Bewertung von Kennwerten in einem technischen Prozess |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5134574A (en) * | 1990-02-27 | 1992-07-28 | The Foxboro Company | Performance control apparatus and method in a processing plant |
US5208765A (en) * | 1990-07-20 | 1993-05-04 | Advanced Micro Devices, Inc. | Computer-based method and system for product development |
US5408405A (en) * | 1993-09-20 | 1995-04-18 | Texas Instruments Incorporated | Multi-variable statistical process controller for discrete manufacturing |
US5440478A (en) * | 1994-02-22 | 1995-08-08 | Mercer Forge Company | Process control method for improving manufacturing operations |
US5452218A (en) * | 1994-02-03 | 1995-09-19 | Texas Instruments | System and method for determining quality analysis on fabrication and/or assembly design using shop capability data |
US5541846A (en) * | 1994-10-24 | 1996-07-30 | Secrest; Edgar A. | Self-improving work instruction system |
US5768153A (en) * | 1995-09-14 | 1998-06-16 | Fuji Photo Film Co., Ltd. | Method of and apparatus for production management |
US5859964A (en) * | 1996-10-25 | 1999-01-12 | Advanced Micro Devices, Inc. | System and method for performing real time data acquisition, process modeling and fault detection of wafer fabrication processes |
-
2000
- 2000-08-23 DE DE10041296A patent/DE10041296A1/de not_active Withdrawn
-
2001
- 2001-08-21 AU AU2001293781A patent/AU2001293781A1/en not_active Abandoned
- 2001-08-21 EP EP01974200A patent/EP1314069A2/de not_active Withdrawn
- 2001-08-21 WO PCT/EP2001/009598 patent/WO2002017022A2/de not_active Application Discontinuation
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5134574A (en) * | 1990-02-27 | 1992-07-28 | The Foxboro Company | Performance control apparatus and method in a processing plant |
US5208765A (en) * | 1990-07-20 | 1993-05-04 | Advanced Micro Devices, Inc. | Computer-based method and system for product development |
US5408405A (en) * | 1993-09-20 | 1995-04-18 | Texas Instruments Incorporated | Multi-variable statistical process controller for discrete manufacturing |
US5452218A (en) * | 1994-02-03 | 1995-09-19 | Texas Instruments | System and method for determining quality analysis on fabrication and/or assembly design using shop capability data |
US5440478A (en) * | 1994-02-22 | 1995-08-08 | Mercer Forge Company | Process control method for improving manufacturing operations |
US5541846A (en) * | 1994-10-24 | 1996-07-30 | Secrest; Edgar A. | Self-improving work instruction system |
US5768153A (en) * | 1995-09-14 | 1998-06-16 | Fuji Photo Film Co., Ltd. | Method of and apparatus for production management |
US5859964A (en) * | 1996-10-25 | 1999-01-12 | Advanced Micro Devices, Inc. | System and method for performing real time data acquisition, process modeling and fault detection of wafer fabrication processes |
Non-Patent Citations (6)
Title |
---|
HERMANN J ET AL: "CAQ IM GESAMT-MANAGEMENTSYSTEM", ZWF ZEITSCHRIFT FUR WIRTSCHAFTLICHE FERTIGUNG UND AUTOMATISIERUNG, CARL HANSER VERLAG. MUNCHEN, DE, VOL. 92, NR. 3, PAGE(S) 128-130, ISSN: 0947-0085, XP000688389 * |
JAGDEV H ET AL: "A QFD based performance measurement tool", COMPUTERS IN INDUSTRY, ELSEVIER SCIENCE PUBLISHERS. AMSTERDAM, NL, VOL. 33, NR. 2-3, PAGE(S) 357-366, ISSN: 0166-3615, XP004097800 * |
KRAUSE F-L ET AL: "PROBLEMMANAGEMENT INFORMATIONSTECHNISCH UNTERSTUETZEN", ZWF ZEITSCHRIFT FUR WIRTSCHAFTLICHE FERTIGUNG UND AUTOMATISIERUNG, CARL HANSER VERLAG. MUNCHEN, DE, VOL. 91, NR. 11, PAGE(S) 530-533, ISSN: 0947-0085, XP000637973 * |
LUBBE U: "STRUKTUR EINES CAQ-SYSTEMS IN HINBLICK AUF DIN ISO 9000 FF", MICROTECNIC, AGIFA VERLAG S.A. ZURICH, CH, NR. 4, PAGE(S) 22-25, ISSN: 0026-2854, XP000466259 * |
NEDESS C ET AL: "A case-based reasoning approach towards learning from experience connecting design and shop floor", COMPUTERS IN INDUSTRY, ELSEVIER SCIENCE PUBLISHERS. AMSTERDAM, NL, VOL. 33, NR. 1, PAGE(S) 127-137, ISSN: 0166-3615, XP004096559 * |
NOOKABADI A S ET AL: "A GENERIC IDEFO MODEL OF QUALITY ASSURANCE INFORMATION SYSTEMS FOR THE DESIGN-TO-ORDER MANUFACTURING ENVIRONMENT", IEEE TRANSACTIONS ON COMPONENTS, PACKAGING AND MANUFACTURING TECHNOLOGY. PART C: MANUFACTURING, IEEE SERVICE CENTER, PISCATAWAY, NJ, US, VOL. 19, NR. 2, PAGE(S) 78-84, ISSN: 1083-4400, XP000639607 * |
Also Published As
Publication number | Publication date |
---|---|
EP1314069A2 (de) | 2003-05-28 |
WO2002017022A2 (de) | 2002-02-28 |
AU2001293781A1 (en) | 2002-03-04 |
DE10041296A1 (de) | 2002-03-07 |
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