WO2002001706A1 - Microcomposant electronique, capteur et actionneur incorporant un tel microcomposant - Google Patents
Microcomposant electronique, capteur et actionneur incorporant un tel microcomposant Download PDFInfo
- Publication number
- WO2002001706A1 WO2002001706A1 PCT/FR2001/002075 FR0102075W WO0201706A1 WO 2002001706 A1 WO2002001706 A1 WO 2002001706A1 FR 0102075 W FR0102075 W FR 0102075W WO 0201706 A1 WO0201706 A1 WO 0201706A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- blades
- equipotential
- fixed
- mobile
- zones
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/125—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by capacitive pick-up
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02N—ELECTRIC MACHINES NOT OTHERWISE PROVIDED FOR
- H02N1/00—Electrostatic generators or motors using a solid moving electrostatic charge carrier
- H02N1/002—Electrostatic motors
- H02N1/006—Electrostatic motors of the gap-closing type
- H02N1/008—Laterally driven motors, e.g. of the comb-drive type
Definitions
- the invention relates to the field of microelectronics, and more specifically mechanical microsystems. It relates more particularly to a microcomponent allowing movement perpendicular to the plane of the substrate in which it is produced. It finds an application in the manufacture of actuators or inertial sensors. Previous techniques
- This type of sensor or micro-actuator produced in a semiconductor wafer or wafer, comprises a part that is movable relative to the rest of the substrate forming a fixed part.
- the mobile part is connected to the rest of the substrate by zones of lesser thickness allowing a certain bending and therefore a displacement of the mobile part relative to the fixed part.
- the accelerations undergone cause the moving part to move relative to the fixed part.
- This displacement generates a variation of the surface opposite the fixed and mobile parts.
- This variation therefore results in a variation in the electrical capacity measured between the fixed and mobile parts.
- the detection of this variation in capacity is therefore an image of the acceleration undergone.
- the mobile part has a degree of freedom in the plane of the substrate, and a voltage applied between the mobile part and the fixed part makes it possible to generate an electrostatic force proportional to the facing surfaces and to the square of this potential difference.
- These combs are obtained by surface or volume micromachining, followed by release by dissolution of the underlay of the mobile part.
- the intensity of the forces exerted on the movable part is limited by the relatively small thickness of the teeth of each comb, measured perpendicular to the main face of the wafer.
- a problem which the invention proposes to solve is that of obtaining displacements of the movable part in a direction perpendicular to the plane of the wafer, with sufficient intensity of effort, while using manufacturing techniques derived from known methods.
- the invention therefore relates to an electronic microcomponent, produced from wafers or wafers of semiconductor substrate or the like, comprising two parts, namely a fixed part and a mobile part able to move one relative to the other. .
- each part comprises a plurality of perpendicular blades on the main face of the wafer, the blades of the mobile part being interposed between the blades of the fixed part;
- each part comprises a set of vertical blades, arranged in the form of combs. These blades are typically produced by a lithographic process for defining their outline in the plane of the wafer, then by a deep selective etching operation making it possible to eliminate the material completely anisotropically in the thickness of the substrate.
- the fixed and movable blades have equipotential zones which are partially opposite one another, and spatially offset.
- the application of a voltage between these two equipotential zones generates an electrostatic force which tends to bring together or repel the two armatures to maximize or minimize the area of the opposite zones.
- the equipotential zone of the mobile blades moves relative to the equipotential zone of the fixed blades, and the electrical capacity measured between these two equipotential zones varies. In other words, the movement exerted perpendicular to the plane of the wafer results in the variation of an electrical signal.
- an actuator according to the invention makes it possible to move a member perpendicular to the plane of the wafer.
- the blades of the movable part have a height measured perpendicular to the main face of the plate, which is less than that of the blades of the fixed part.
- the difference in height of the blades of the movable part or of the fixed part corresponds substantially to the maximum theoretical travel of the movable part relative to the fixed part.
- the substrate used is laminated and comprises at least three layers, namely two conductive layers separated by an insulating layer serving as a border to the equipotential zone of the blades of the fixed part.
- the definition of the equipotential zones is determined by the presence of the insulating layer of the laminated substrate.
- it is a semiconductor substrate, but equivalent micro-components could be obtained from substrates of different nature, and in particular those including ceramics.
- At the blades of the mobile part at least two conductive layers can be electrically connected to form the equipotential zone.
- the insulating layer of a laminated substrate is present on the blades of the fixed and movable parts, it is possible to give the equipotential zone of the movable blades the desired geometry by connecting conductive zones together in a different configuration. that of the fixed part.
- the semiconductor substrate comprises a single insulating zone
- the two conductive zones of the movable blades are connected to form an equipotential zone extending over the entire height of the blade. In this case, only one of the conductive layers of the substrate will be chosen as the equipotential zone on the fixed part.
- the microcomponent according to the invention can be used for the production of an inertial (i.e. position or acceleration) sensor in which the position or acceleration information is a image of the variation in the electrical capacity measured between the equipotential zones of the fixed and / or mobile parts.
- inertial i.e. position or acceleration
- Such a microcomponent can also be used to form an actuator intended to move a member which is integral with the mobile part, the assembly comprising means for applying a potential difference between the equipotential zones of the blades of the fixed and mobile parts.
- the equipotential zones of the fixed and mobile blades being vertically offset, the application of the desired voltage makes it possible to cause vertical displacement, or more generally perpendicular to the plane of the substrate.
- the actuator may also include means for determining the relative position of the blades of the fixed and movable parts, so as to control the means which apply the potential difference which generates the movement.
- such an actuator can operate with closed-loop regulation, by measuring the variation in capacity between the blades, and thus controlling the potential difference to be applied to obtain the desired displacement.
- Figure 3 corresponds to the sectional view of Figure 2 in which the movable part undergoes a movement relative to the fixed part.
- FIG. 4 is a partial sectional view along the plane IV-IV of FIG. 1.
- Figure 5 corresponds to the section of Figure 5 when the movable part undergoes a movement relative to the fixed part.
- the invention relates to an electronic microcomponent produced from a wafer (1) or semiconductor plate.
- This type of wafer (1) is a laminated substrate, such as for example the substrates known by the abbreviation SOI, in other words "Silicon on Insulator”.
- such a substrate (1) comprises two conductive layers (2, 4) of great thickness relative to an insulating intermediate layer (3).
- a microcomponent comprises a fixed part (11), and a mobile part (10).
- the fixed part (11) is mechanically integral and immobile relative to the rest of the substrate (1).
- the movable part (10) is connected to the rest of the substrate by means of two thinner zones (12, 13). These thinner areas (12, 13) have a capacity for bending or twisting which allows movement of the central area (14) of the movable part (10).
- the central zone (14) of the fixed part (10) has a set of parallel blades (20), and perpendicular to the main face (5) of the substrate. These blades (20) can be of variable number depending on the desired application.
- the part (11) also comprises a plurality of blades (21) oriented in the direction of the movable part (10), and which are oriented perpendicular to the plane of the main face (5) of the substrate.
- the blades (21) of the fixed part (11) partially penetrate inside the space defined between each blade (20) of the movable part.
- the blades (21) of the fixed part and the blades (20) of the movable part therefore have a relatively large facing surface.
- the blades (21) of the fixed part extend over the entire height of the substrate.
- the blades (20) of the movable part (10) have a height, measured perpendicular to the plane (5) of the main face of the substrate, which is less than that of the blades (21) of the fixed part.
- the insulating layer (3) of the substrate forms a border between the two conductive layers (2, 4) both on the fixed blades (21) and on the movable blades (20).
- the zones (24) and (25) of the blade (21) form electrically isolated equipotential zones.
- the zones (26, 27) located on either side of the insulating layer (3) are electrically connected.
- the electrical continuity of the conductive layers (2, 4) is broken.
- the upper conductive layer (2) is interrupted between the fixed (11) and mobile (10) parts. We can do the same, or differently, to obtain the interruption of the lower layer.
- the zones (26, 27) of the mobile blade (20) form a single equipotential zone extending over the entire height of the mobile blade (20). Because of the difference in height of the movable (20) and fixed (21) blades, the equipotential surface formed by the zones (26, 27) of the fixed part partially covers the equipotential zone (25) of the blade (21).
- the equipotential surfaces (26, 27, - 25) of the fixed (21) and mobile (20) blades are the seat of electrostatic forces when a potential difference is applied to them.
- an electrostatic force tends to increase the surface opposite these equipotential zones to bring the system into the configuration illustrated in the figure. 3.
- the movable blade (20) has undergone a movement perpendicular to the main face (5) of the substrate.
- the vertical movement describes an arc of a circle whose radius depends on the geometry of the articulation zone of the mobile part (11) relative to the fixed part (11). This type of phenomenon corresponds to an actuator operation in which the movement of the mobile part (10) is controlled relative to the fixed part (11).
- the movement of the mobile part (10), and therefore of the blades (20) relative to the fixed blades (21) induces a variation in the electrical capacitance between the equipotential zone (26, 27 ) of the movable blade (20) and the equipotential zone (25) of the fixed blade (21).
- the variation of this electrical capacity can be measured and give an image of the amplitude of the movement of the blade (20) relative to the blades (21), and therefore of the acceleration of the sudden movement.
- the actuator operation can be improved by means of a regulation which measures the amplitude of the movement generated by the determination of the variation in the electrical capacitance between the equipotential zones (26, 27) and (25). This measurement of the capacitance can be carried out in a particular frequency range, distinct from the frequency of the voltage inducing mechanical movement.
- the invention is not limited to the single form of geometry illustrated in FIGS. 1 to 5, but covers other variants in which the fixed part is not connected to the rest of the substrate by zones of reduced thickness , but has sufficient length to undergo bending.
- the invention is not limited to the use of a substrate having a single insulating layer, but covers variants in which the substrate has a plurality of insulating layers making it possible to define more than two conductive layers which are electrically linked together to define equipotential zones partially overlapping and offset between the movable blades and the fixed blades.
- the microcomponent according to the invention is obtained by deep machining processes.
- the contour of the movable part and of the blade combs are defined on one face or the other of the substrate.
- An anisotropic plasma etching is carried out to define straight sides and walls that are as straight as possible between the different fixed and mobile blades.
- etching is carried out at the lower face of the mobile blades (20) to reduce their height, and thus create the spatial offset between the equipotential zones.
- the microcomponent and the applications to actuators or sensors according to the invention have multiple advantages, and in particular that of allowing movement or detection along a plane perpendicular to the plane of the substrate.
- the importance of the area of the facing zones makes it possible to obtain sufficient efforts for the actuation of a large type of organ.
- the invention also finds a very particular application in the field of inertial sensors, where until now, the production of an integrated three-way sensor was only possible by the combination of two bidirectional sensors. It is thus possible to produce a three-way sensor on a single substrate
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Micromachines (AREA)
- Pressure Sensors (AREA)
Abstract
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002505744A JP2004502146A (ja) | 2000-06-29 | 2001-06-28 | 電子超小型部品ならびに該電子超小型部品を内蔵したセンサ及びアクチュエータ |
AU2001270703A AU2001270703A1 (en) | 2000-06-29 | 2001-06-28 | Electronic microcomponent, sensor and actuator incorporating same |
EP01949575A EP1295384A1 (fr) | 2000-06-29 | 2001-06-28 | Microcomposant electronique, capteur et actionneur incorporant un tel microcomposant |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0008420A FR2810976B1 (fr) | 2000-06-29 | 2000-06-29 | Microcomposant electronique, capteur et actionneur incorporant un tel microcomposant |
FR00/08420 | 2000-06-29 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2002001706A1 true WO2002001706A1 (fr) | 2002-01-03 |
Family
ID=8851884
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/FR2001/002075 WO2002001706A1 (fr) | 2000-06-29 | 2001-06-28 | Microcomposant electronique, capteur et actionneur incorporant un tel microcomposant |
Country Status (6)
Country | Link |
---|---|
US (1) | US20030164042A1 (fr) |
EP (1) | EP1295384A1 (fr) |
JP (1) | JP2004502146A (fr) |
AU (1) | AU2001270703A1 (fr) |
FR (1) | FR2810976B1 (fr) |
WO (1) | WO2002001706A1 (fr) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7168680B2 (en) * | 2004-07-22 | 2007-01-30 | Harris Corporation | Embedded control valve using electroactive material |
US7258010B2 (en) * | 2005-03-09 | 2007-08-21 | Honeywell International Inc. | MEMS device with thinned comb fingers |
US7690254B2 (en) * | 2007-07-26 | 2010-04-06 | Honeywell International Inc. | Sensor with position-independent drive electrodes in multi-layer silicon on insulator substrate |
US8187902B2 (en) | 2008-07-09 | 2012-05-29 | The Charles Stark Draper Laboratory, Inc. | High performance sensors and methods for forming the same |
DE102008043836A1 (de) * | 2008-11-19 | 2010-05-20 | Robert Bosch Gmbh | Verfahren zum Betreiben eines elektrostatischen Antriebs und elektrostatische Antriebe |
US20120146452A1 (en) * | 2010-12-10 | 2012-06-14 | Miradia, Inc. | Microelectromechanical system device and semi-manufacture and manufacturing method thereof |
ITTO20131014A1 (it) | 2013-12-12 | 2015-06-13 | St Microelectronics Int Nv | Struttura oscillante attuata elettrostaticamente con controllo della fase di inizio oscillazione, e relativi metodo di fabbricazione e metodo di pilotaggio |
GB2579057A (en) * | 2018-11-16 | 2020-06-10 | Atlantic Inertial Systems Ltd | Accelerometer |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0547742A1 (fr) * | 1991-12-19 | 1993-06-23 | Motorola, Inc. | Accéléromètre à trois axes |
GB2292462A (en) * | 1994-08-18 | 1996-02-21 | British Tech Group | Transducer |
US5623099A (en) * | 1994-11-03 | 1997-04-22 | Temic Telefunken Microelectronic Gmbh | Two-element semiconductor capacitive acceleration sensor |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4419844B4 (de) * | 1994-06-07 | 2009-11-19 | Robert Bosch Gmbh | Beschleunigungssensor |
DE4432837B4 (de) * | 1994-09-15 | 2004-05-13 | Robert Bosch Gmbh | Beschleunigungssensor und Meßverfahren |
DE19537814B4 (de) * | 1995-10-11 | 2009-11-19 | Robert Bosch Gmbh | Sensor und Verfahren zur Herstellung eines Sensors |
JP2000206142A (ja) * | 1998-11-13 | 2000-07-28 | Denso Corp | 半導体力学量センサおよびその製造方法 |
JP2002131331A (ja) * | 2000-10-24 | 2002-05-09 | Denso Corp | 半導体力学量センサ |
-
2000
- 2000-06-29 FR FR0008420A patent/FR2810976B1/fr not_active Expired - Fee Related
-
2001
- 2001-06-28 JP JP2002505744A patent/JP2004502146A/ja not_active Withdrawn
- 2001-06-28 US US10/311,981 patent/US20030164042A1/en not_active Abandoned
- 2001-06-28 AU AU2001270703A patent/AU2001270703A1/en not_active Abandoned
- 2001-06-28 EP EP01949575A patent/EP1295384A1/fr not_active Withdrawn
- 2001-06-28 WO PCT/FR2001/002075 patent/WO2002001706A1/fr not_active Application Discontinuation
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0547742A1 (fr) * | 1991-12-19 | 1993-06-23 | Motorola, Inc. | Accéléromètre à trois axes |
GB2292462A (en) * | 1994-08-18 | 1996-02-21 | British Tech Group | Transducer |
US5623099A (en) * | 1994-11-03 | 1997-04-22 | Temic Telefunken Microelectronic Gmbh | Two-element semiconductor capacitive acceleration sensor |
Non-Patent Citations (4)
Title |
---|
A. SELVAKUMAR AND K. NAJAFI: "A High-Sensitivity Z-Axis Capacitive Silicon Microaccelerometer with a torsional suspension", JOURNAL OF MICROMECHANICAL SYSTEMS, vol. 7, no. 2, 1 June 1998 (1998-06-01), pages 192 - 200, XP002170797 * |
DATABASE INSPEC [online] INSTITUTE OF ELECTRICAL ENGINEERS, STEVENAGE, GB; LEE A P ET AL: "Electrostatic comb drive for vertical actuation", XP002170798, Database accession no. 5954432 * |
MICROMACHINED DEVICES AND COMPONENTS III, AUSTIN, TX, USA, 29 SEPT. 1997, vol. 3224, Proceedings of the SPIE - The International Society for Optical Engineering, 1997, SPIE-Int. Soc. Opt. Eng, USA, pages 109 - 119, ISSN: 0277-786X * |
SELVAKUMAR A ET AL: "VERTICAL COMB ARRAY MICROACTUATORS", PROCEEDINGS OF THE WORKSHOP ON MICRO ELECTRICAL MECHANICAL SYSTEMS. (MEMS),US,NEW YORK, IEEE, vol. WORKSHOP 8, 29 January 1995 (1995-01-29), pages 43 - 48, XP000555241, ISBN: 0-7803-2504-4 * |
Also Published As
Publication number | Publication date |
---|---|
JP2004502146A (ja) | 2004-01-22 |
EP1295384A1 (fr) | 2003-03-26 |
FR2810976A1 (fr) | 2002-01-04 |
AU2001270703A1 (en) | 2002-01-08 |
US20030164042A1 (en) | 2003-09-04 |
FR2810976B1 (fr) | 2003-08-29 |
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