WO2002001213A1 - Device and method for determining at least an interface characteristic between two phases of an electricity conducting material - Google Patents

Device and method for determining at least an interface characteristic between two phases of an electricity conducting material Download PDF

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Publication number
WO2002001213A1
WO2002001213A1 PCT/FR2001/002034 FR0102034W WO0201213A1 WO 2002001213 A1 WO2002001213 A1 WO 2002001213A1 FR 0102034 W FR0102034 W FR 0102034W WO 0201213 A1 WO0201213 A1 WO 0201213A1
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WO
WIPO (PCT)
Prior art keywords
interface
sample
state
frequency components
excitation current
Prior art date
Application number
PCT/FR2001/002034
Other languages
French (fr)
Inventor
Charles Salvi
Nelly Kernevez
Jean-Paul Garandet
Béatrice Drevet
Original Assignee
Commissariat A L'energie Atomique
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by Commissariat A L'energie Atomique filed Critical Commissariat A L'energie Atomique
Publication of WO2002001213A1 publication Critical patent/WO2002001213A1/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/02—Investigating or analyzing materials by the use of thermal means by investigating changes of state or changes of phase; by investigating sintering
    • G01N25/04—Investigating or analyzing materials by the use of thermal means by investigating changes of state or changes of phase; by investigating sintering of melting point; of freezing point; of softening point
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/02—Investigating or analyzing materials by the use of thermal means by investigating changes of state or changes of phase; by investigating sintering

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)

Abstract

The invention concerns a device for characterising an interface between two phases of an electricity conducting material sample comprising: means (110, 121, 122, 123, 130, 132, 152) for measuring the electric impedance of a load comprising said sample (10) and means for calculating (150) a characteristic of said interface based on at least an impedance measurement. The invention is characterised in that the impedance measuring means comprise means (110, 210) for delivering to the load at least an excitation voltage having different frequencies and means (140, 150) for determining the impedance values respectively on the basis of the excitation voltage frequencies.

Claims

25REVENDICATIONS 25REVENDICATIONS
1. Dispositif de caractérisation d'une interface entre deux phases d'un échantillon de matériau conducteur de l'électricité comportant : - des moyens (110, 121, 122, 123, 130, 132, 152, 210) de mesure de l'impédance électrique d'une charge comprenant ledit échantillon (10), et1. Device for characterizing an interface between two phases of a sample of electrically conductive material comprising: - means (110, 121, 122, 123, 130, 132, 152, 210) for measuring the electrical impedance of a load comprising said sample (10), and
- des moyens de calcul (150) d'une caractéristique de ladite interface basée sur au moins une mesure d'impédance, caractérisé en ce que les moyens de mesure de l'impédance comportent des moyens (110, 210) pour délivrer à la charge au moins un courant d'excitation présentant différentes composantes de fréquence et des moyens (140, 150) pour déterminer des impédances respectivement en fonction des composantes de fréquence du courant d'excitation.- means for calculating (150) a characteristic of said interface based on at least one impedance measurement, characterized in that the means for measuring the impedance include means (110, 210) for delivering to the load at least one excitation current having different frequency components and means (140, 150) for determining impedances respectively as a function of the frequency components of the excitation current.
2. Dispositif selon la revendication 1, dans lequel les moyens de mesure comportent un transformateur différentiel (130) .2. Device according to claim 1, in which the measuring means comprise a differential transformer (130).
3. Dispositif selon la revendication 1, dans lequel les moyens pour déterminer les impédances en fonction des composantes de fréquence comportent des unités (152) de détection synchrone connectées entre les moyens de mesure et les moyens de calcul.3. Device according to claim 1, in which the means for determining the impedances as a function of the frequency components comprise synchronous detection units (152) connected between the measurement means and the calculation means.
4. Dispositif selon la revendication 3, comportant un nombre d'unités de détection synchrone au moins égal à un nombre de composantes de fréquence différentes du courant d'excitation. 4. Device according to claim 3, comprising a number of synchronous detection units at least equal to a number of different frequency components of the excitation current.
5. Dispositif selon la revendication 1, caractérisé en ce que les moyens pour déterminer 265. Device according to claim 1, characterized in that the means for determining 26
lesdites impédances comportent un analyseur spectralsaid impedances include a spectral analyzer
(140) .(140).
6. Dispositif selon la revendication 1, dans lequel les moyens pour délivrer le courant d'excitation comportent une pluralité de sources de courant (110) connectées en parallèle sur la charge (10), chaque source de courant de la pluralité de sources de courant délivrant un courant sinusoïdal de fréquence différente. 6. Device according to claim 1, in which the means for delivering the excitation current comprise a plurality of current sources (110) connected in parallel to the load (10), each current source of the plurality of current sources delivering a sinusoidal current of different frequency.
7. Dispositif selon la revendication 1, dans lequel les moyens pour délivrer le courant d'excitation comportent un générateur (210) de signaux périodiques.7. Device according to claim 1, wherein the means for delivering the excitation current comprise a generator (210) of periodic signals.
8. Dispositif selon la revendication 1, dans lequel les moyens de calcul (150) sont aptes à établir au moins une caractéristique de l'interface choisie parmi :8. Device according to claim 1, in which the calculation means (150) are capable of establishing at least one characteristic of the interface chosen from:
- la position de l'interface,- the position of the interface,
- la forme de l'interface,- the shape of the interface,
- le déplacement de l'interface. - moving the interface.
9. Dispositif selon la revendication 8, comprenant des moyens d'affichage (160) d'une représentation graphique de l'interface et/ou d'au moins une des caractéristiques de l'interface.9. Device according to claim 8, comprising display means (160) of a graphic representation of the interface and / or at least one of the characteristics of the interface.
10. Dispositif selon la revendication 1, comportant des moyens (12) de contrôle localisé de la température de l'échantillon.10. Device according to claim 1, comprising means (12) for localized control of the temperature of the sample.
11. Procédé de caractérisation d'une interface entre deux phases d'un échantillon (10) de matériau conducteur, dans lequel : 2711. Method for characterizing an interface between two phases of a sample (10) of conductive material, in which: 27
- on applique au moins un courant d'excitation présentant différentes composantes de fréquence à l'échantillon (10), etat least one excitation current having different frequency components is applied to the sample (10), and
- on établit des impédances de l'échantillon en fonction des composantes de fréquence, et- the impedances of the sample are established as a function of the frequency components, and
- on établit en fonction des impédances une caractéristique choisie parmi : la position de l'interface, la forme de l'interface, • le déplacement de l'interface.- a characteristic is chosen based on the impedances chosen from: the position of the interface, the shape of the interface, • the displacement of the interface.
12. Procédé selon la revendication 11, dans lequel on établit la position de l'interface à partir d'une mesure différentielle de l'impédance entre un premier point situé dans une première partie solide (28a) de l'échantillon présentant un premier état de matière, un second point situé dans une partie intermédiaire (24) de l'échantillon présentant un second état de matière et un troisième point situé dans une deuxième partie (28b) de l'échantillon présentant le premier état de matière et séparée de ladite première partie (28a) par la partie intermédiaire (24).12. The method of claim 11, in which the position of the interface is established from a differential measurement of the impedance between a first point located in a first solid part (28a) of the sample having a first state. of material, a second point located in an intermediate part (24) of the sample having a second state of material and a third point located in a second part (28b) of the sample having the first state of material and separated from said first part (28a) by the intermediate part (24).
13. Procédé selon la revendication 12, caractérisé en ce que le premier état est un état solide et le deuxième état est un état liquide. 13. Method according to claim 12, characterized in that the first state is a solid state and the second state is a liquid state.
14. Procédé selon la revendication 12, caractérisé en ce que le premier état est un état liquide avec une première viscosité et le deuxième état est un état liquide avec une deuxième viscosité.14. Method according to claim 12, characterized in that the first state is a liquid state with a first viscosity and the second state is a liquid state with a second viscosity.
15. Procédé selon la revendication 11, dans lequel on établit le déplacement de l'interface à partir d'au moins une position de l'interface. 2815. The method of claim 11, wherein the displacement of the interface is established from at least one position of the interface. 28
16. Procédé selon la revendication 11, dans lequel on établit la forme de l'interface à partir de plusieurs mesures d'impédance correspondant à des composantes de fréquence différentes du courant d'excitation et associées à des couches de matériau situées à différentes profondeur dans l'échantillon.16. The method of claim 11, wherein the shape of the interface is established from several impedance measurements corresponding to different frequency components of the excitation current and associated with layers of material located at different depths in the sample.
17. Procédé selon la revendication 11, dans lequel on applique un courant d'excitation périodique multifréquence . 17. The method of claim 11, in which a multifrequency periodic excitation current is applied.
18. Procédé selon la revendication 11, dans lequel on applique à l'échantillon, de façon concomitante, une pluralité de courants d'excitation à différentes fréquences. 18. The method of claim 11, wherein a plurality of excitation currents at different frequencies are applied to the sample concomitantly.
PCT/FR2001/002034 2000-06-28 2001-06-27 Device and method for determining at least an interface characteristic between two phases of an electricity conducting material WO2002001213A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR00/08300 2000-06-28
FR0008300A FR2811082A1 (en) 2000-06-28 2000-06-28 DEVICE AND METHOD FOR DETERMINING AT LEAST ONE CHARACTERISTIC OF AN INTERFACE BETWEEN TWO PHASES OF AN ELECTRICALLY CONDUCTIVE MATERIAL

Publications (1)

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WO2002001213A1 true WO2002001213A1 (en) 2002-01-03

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Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4696337A (en) * 1985-10-31 1987-09-29 Instytut Odlewnictwa Apparatus for anticipation of structure of casting alloys and particularly the degree of spheroidization of cast iron
FR2772394A1 (en) * 1997-12-17 1999-06-18 Commissariat Energie Atomique DEVICE FOR MEASURING THE SOLIDIFICATION OF AN ELECTRICITY-CONDUCTING MATERIAL, DOPE, AND FOR CONTINUOUSLY MONITORING ITS DOPANT CONTENT

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4696337A (en) * 1985-10-31 1987-09-29 Instytut Odlewnictwa Apparatus for anticipation of structure of casting alloys and particularly the degree of spheroidization of cast iron
FR2772394A1 (en) * 1997-12-17 1999-06-18 Commissariat Energie Atomique DEVICE FOR MEASURING THE SOLIDIFICATION OF AN ELECTRICITY-CONDUCTING MATERIAL, DOPE, AND FOR CONTINUOUSLY MONITORING ITS DOPANT CONTENT

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
WADLEY H N G ET AL: "Methods for liquid-solid interface shape and location discrimination during eddy current sensing of Bridgman growth", JOURNAL OF CRYSTAL GROWTH,NL,NORTH-HOLLAND PUBLISHING CO. AMSTERDAM, vol. 172, no. 3-4, 1 March 1997 (1997-03-01), pages 313 - 322, XP004117298, ISSN: 0022-0248 *

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