WO2001090709A1 - Streak camera apparatus - Google Patents
Streak camera apparatus Download PDFInfo
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- WO2001090709A1 WO2001090709A1 PCT/JP2001/004280 JP0104280W WO0190709A1 WO 2001090709 A1 WO2001090709 A1 WO 2001090709A1 JP 0104280 W JP0104280 W JP 0104280W WO 0190709 A1 WO0190709 A1 WO 0190709A1
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- Prior art keywords
- streak
- ccd camera
- operation state
- camera
- image
- Prior art date
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- 230000003111 delayed effect Effects 0.000 claims abstract description 23
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 33
- 238000010408 sweeping Methods 0.000 claims description 24
- 230000003321 amplification Effects 0.000 claims description 7
- 238000003199 nucleic acid amplification method Methods 0.000 claims description 7
- 230000002123 temporal effect Effects 0.000 claims description 7
- 235000012745 brilliant blue FCF Nutrition 0.000 claims 1
- 238000005259 measurement Methods 0.000 description 12
- 239000002245 particle Substances 0.000 description 10
- 230000002238 attenuated effect Effects 0.000 description 8
- 238000010586 diagram Methods 0.000 description 8
- 230000000694 effects Effects 0.000 description 7
- 230000001133 acceleration Effects 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 2
- 230000001934 delay Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 239000011163 secondary particle Substances 0.000 description 2
- 230000007423 decrease Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000005065 mining Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000002269 spontaneous effect Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J11/00—Measuring the characteristics of individual optical pulses or of optical pulse trains
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
Definitions
- the present invention relates to a streak camera device that measures a temporal change in measured light intensity as a streak image.
- a conventional streak camera device converts a temporal change in the measured light intensity into a streak image and forms a streak tube 101 on the phosphor screen 101 a and a streak tube 1.
- 01 Intensifier 102 for amplifying the streak image formed on the fluorescent screen 101a and displaying it on the fluorescent screen 102a, and fluorescent screen 102 for the image intensifier 102
- a frame transfer CCD camera 103 that captures the light image formed on a
- a streak sweep circuit 104 that controls the operation of the streak tube 101
- a CCD that drives the frame transfer CCD camera 103
- a camera drive circuit 105 a sample 107 to be measured and a laser device 106 for emitting the light R to be measured from the sample 107 are provided outside the streak camera device.
- the operation of the conventional streak camera device will be described with reference to FIG. 7 and FIGS. 8A to 8H.
- the sample 107 is irradiated with the laser beam L from the laser device 106 (FIGS. 7 and 8A)
- the measured light R such as X-rays is emitted from the sample 107 (FIGS. 7 and 8).
- Figure 8B The light R to be measured enters the photoelectric surface 101 b of the streak tube 101, and the streak sweep circuit 104, which receives the streak sweep trigger signal T1 from the laser device 106, generates the streak tube.
- a streak sweep voltage Vs is applied to 101 (FIGS. 8C and 8D). Thereby, a streak image is formed on the fluorescent screen 10 la of the streak tube 101.
- This streak image emits light for several milliseconds because the material constituting the phosphor screen 101a has an afterglow characteristic.
- the sample emits neutrons, but rapidly decays with time (Fig. 8E).
- the streak image is amplified by the image intensifier 102, and the widened streak image is formed on the phosphor screen 102 a of the image intensifier 102.
- the amplified streak image on the fluorescent screen 102a of the image intensifier 102 is captured by the frame transfer type CCD camera 103.
- the frame transfer type CCD camera 103 starts exposure in response to the command signal S from the CCD camera drive circuit 105 that has received the CCD trigger signal T2 from the streak sweep circuit 104 (FIGS. 8F and 8G).
- the timing of the exposure start is the same as the irradiation of the sample 107 with the laser beam L, as can be seen by comparing FIG. 8A and FIG. 8H.
- Some conventional streak camera devices include a control convenience 108 provided between a laser device 106 and a CCD camera driving circuit 105, as shown in FIG.
- a laser trigger signal T 4 is transmitted from the control computer 108 to the laser device 106 (FIG. 10A), and at the same time, a laser beam is irradiated (FIG. 10B). Release begins ( Figure 10C). Before the output of the laser trigger signal T4, the streak sweep trigger signal T1 is output (FIG. 10D), and the sweep of the voltage applied to the streak camera is started in synchronization with the trigger signal (FIG. 10D). 10E). Neutron radiation is emitted from the sample, but rapidly decays with time (Fig. 10F).
- the CCD trigger signal T2 is transmitted to the CCD camera driving circuit 105 (FIG. 10G).
- the brightness of the streak image on the fluorescent screen of the streak tube increases simultaneously with the irradiation of the laser beam and decreases with time (Fig. 10H).
- the exposure of the CCD camera is performed from the output of the CCD trigger signal T2 until the brightness of the streak image becomes zero (FIG. 101).
- the CCD trigger signal T4 is set at a certain time earlier than the time when the laser trigger signal T4 is transmitted to the laser device 106. 2 is sent to the CCD camera driving circuit 105, and the frame —The camera transfer type CCD camera 103 starts exposure (Fig. 101).
- the sample 107 When the sample 107 is irradiated with the laser beam L, the sample 107 emits not only X-rays but also neutrons. As described above, the exposure of the frame transfer type CCD camera 103 starts at the same time as the sample 107 is irradiated with the laser beam L (that is, simultaneously with the emission of the light to be measured) or earlier than the irradiation. The frame transfer type CCD camera 103 during exposure is exposed to neutron rays.
- the charge generated in this manner is transferred to the outside together with the signal to be obtained by measurement, and is detected as noise.
- the image intensifier 102 used in the conventional streak camera device has a built-in electron multiplier MCP (micro channel plate: not shown), but neutrons emitted from the sample 107
- MCP micro channel plate
- neutrons emitted from the sample 107 The line also affects this MCP.
- MCP electron multiplier
- the line also affects this MCP.
- neutron beams or spontaneous particles or protons secondary to neutron beams enter the MCP electrons are generated inside the MCP. These electrons are multiplied by the MCP itself to form a light image on the phosphor screen 102 a of the image intensifier 102.
- the light image caused by the neutron beam or the like is picked up by the frame transfer CCD camera 103 and detected as knock ground noise. It is an object of the present invention to provide a streak camera device that can reduce noise caused by neutrons emitted from a sample to be measured.
- a streak camera device includes a streak tube that converts a temporal change in measured light intensity into a streak image, an amplifying unit that amplifies the streak image, In a streak image
- Line-type CCD camera Line-type CCD camera, streak sweep circuit that controls the operation of the streak tube, CCD camera drive circuit that switches the operation state of the inter-line CCD camera from the charge sweeping operation state to the exposure operation state, and the CCD
- the camera drive circuit has a control circuit that delays the timing of switching the operating state of the in-line CCD camera from the charge sweeping operation state to the exposure operation state from the point at which the light to be measured is emitted. It is characterized by the following.
- the period during which the streak image formed by the streak tube remains after image is approximately several ms e c.
- P-43 used as a phosphor screen has an afterglow time (time during which the emission intensity drops to 10%) is about 1 ms e. Also, there are some that persist after 50-; L O Oms e c as in P-39.
- the exposure start of the CCD camera is delayed by several tens of seconds / sec from the time of laser beam irradiation (the time when X-rays and neutrons are emitted), and the exposure of the CCD camera is started after the intensity of the neutrons is sufficiently attenuated. Once started, the effects of neutron radiation during CCD camera exposure can be reduced. In addition, since the phosphor screen has afterglow for several ms e c, even if the exposure start timing of the CCD camera is delayed, information necessary for measurement can be obtained without any problem.
- the timing at which the CCD camera driving circuit switches the operation state of the CCD camera (in-line type) from the charge sweeping operation state to the exposure operation state (that is, the timing at which the CCD camera starts exposure).
- a control circuit is provided for delaying the light to be measured from the point in time when the light is emitted. for that reason,
- the timing at which the CCD camera starts exposure can be delayed by a fixed delay time (several tens of sec) from the laser light irradiation time (the time when X-rays and neutrons are emitted). Therefore, since the CCD camera starts exposure after the intensity of the neutron beam is sufficiently attenuated, it is possible to reduce the influence of the CCD camera from the neutron beam or the like during the exposure.
- simply delaying the exposure start timing of the CCD camera from the time of laser beam irradiation does not necessarily eliminate the effect of the neutron beam and the like on the CCD camera. That is, even before the start of exposure, when a neutron beam or particles or protons secondary generated from the neutron beam enter the CCD camera, charges are induced in the CCD camera. The induced charges are accumulated in the CCD camera and transferred to the outside together with the charges induced by the light to be measured (X-rays) after the exposure, so they are observed as noise.
- an inter-line CCD camera is used instead of the frame transfer CCD camera commonly used in the conventional streak camera device.
- this in-line CCD camera can sweep out the charge accumulated in the CCD camera at a higher speed, so that neutron beams etc. enter the CCD camera before exposure starts. By doing so, even if charges are induced in the CCD camera, the charges can be swept away in a very short time (time shorter than the delay time 3). Therefore, it is possible to reduce the influence of the neutron beam and the like that the interline CCD camera receives before the start of exposure.
- the CCD camera driving circuit switches the operation state of the CCD camera from the charge sweeping-out operation state to the exposure operation state by the control circuit, Since the neutron beam emitted from the sample is attenuated, the CCD camera Exposure can begin. As a result, it is possible to reduce noise due to neutron beams or secondary particles or protons generated by neutron beams during CCD camera exposure. Furthermore, by using an in-line CCD camera and setting the inter-line CCD camera in a charge sweeping operation state before the start of exposure, the electric charge induced by a neutron beam or the like in the inter-line CCD camera is reduced. Can be swept away. As a result, it is possible to reduce noise caused by neutron rays and the like in the in-line CCD camera between the time when the light to be measured and the neutron beam are emitted from the sample and the time when exposure starts.
- the control circuit described above controls the timing at which the CCD camera driving circuit switches the operation state of the inter-line type CCD camera from the charge sweeping operation state to the exposure operation state by the light to be measured. It is preferable that the setting can be made between a point in time that is earlier than a point in time when the is released and a point in time that is later than a certain period.
- the light to be measured is emitted at the timing when the CCD camera drive circuit switches the operation state of the in-line CCD camera from the charge sweeping operation state to the exposure operation state. It can be adjusted appropriately from a point in time that is earlier than a certain point in time to a point in time that is later than a certain period. Therefore, the measurement can be performed while confirming the ratio of the intensity of the signal to be obtained by the measurement and the noise caused by the neutron beam or the like (that is, the SZN ratio), so that the measurement can be performed with high accuracy.
- the streak camera device of the present invention is further configured to further include a drive unit for driving the amplifying unit for amplifying the streak image with a delay from a time point at which the light to be measured is emitted.
- the timing for applying a voltage to the MCP which is an electron multiplier built in the image intensifier, which is an amplifying means for amplifying the streak image, is used to reduce the intensity of the neutron beam by the driving means described above. Since it can be delayed until it attenuates, the effect of particle beams such as neutrons on the MCP can be reduced. That is, If the time when the voltage is applied to the MCP is delayed from the time when the light to be measured is emitted, no voltage is applied to the MCP during the period when a large amount of neutrons are generated. Even if an electron is induced in the MCP by such means, this electron is not multiplied.
- the noise generated by the MCP due to particle beams such as neutrons can be reduced to several thousandths. Even if a voltage is applied to the MCP several tens of seconds after the intensity of the neutron beam is attenuated, the streak image continues for several ms ec on the phosphor screen of the streak tube, so measurement can be performed without any problem. .
- an amplification means that does not contain MCP as the above amplification means. That is, if an amplification means that does not include the MCP is used, the neutron beam and the like do not affect the MCP, so that noise due to these particle beams can be eliminated.
- FIG. 1 is a schematic diagram illustrating a configuration of a streak camera device according to the first embodiment.
- 2A, 2B, 2C, 2D, 2E, 2F, 2G, 2H, 2I, and 2J show the streak camera device according to the first embodiment.
- 6 is a evening chart for explaining the operation of FIG.
- FIG. 3 is a schematic diagram showing a configuration of an embodiment of the second streak camera device.
- FIG. 5 is a schematic diagram showing a configuration of a strike camera device according to the third embodiment.
- FIGS. 6A, 6B, 6C, 6D, 6E, 6F, 6G, 6H, 6I, and 6J are views for explaining the operation of the streak camera device according to the third embodiment. It is a mining chart.
- FIG. 7 is a schematic diagram showing a configuration of a first example of a conventional streak camera device.
- 8A, 8B, 8C, 8D, 8E, 8F, 8G, and 8H are timing charts for explaining the operation of the first example of the conventional streak camera device.
- FIG. 9 is a schematic diagram showing a configuration of a second example of a conventional streak camera device.
- 10A, 10B, 10C, 10D, 10E, 10F, 10G, 10H, and 10I illustrate the operation of the second example of the conventional streak camera device.
- 6 is a timing chart of FIG.
- FIG. 1 is a schematic diagram of a streak camera device according to the first embodiment.
- 2A, 2B, 2C, 2D, 2E, 2F, 2G, 2H, 21 and 2J are timing charts for explaining the operation of the streak camera device according to the first embodiment. It is.
- the streak camera device 1 includes a streak tube 2 that converts a temporal change in the measured light intensity into a streak image and displays the streak image on the fluorescent screen 2a, and a fluorescent screen 3a that widens the streak image.
- the CCD camera drive circuit 7 and the CCD camera drive circuit 7 operate the in-line CCD camera 5.
- the control circuit 10 that delays the switching of the state from the charge sweeping operation state to the exposure operation state from the point at which the measured light R (X-ray: energy ray) is emitted, and the operation of the streak tube 2 Streak sweep circuit to control And 6. Further, a sample 9 to be measured and a laser device 8 for exciting the sample 9 are provided outside the streak camera device 1.
- the streak tube 2 includes a cylindrical tube 2b whose inside is kept in a vacuum.
- a photocathode 2c is provided on the surface of the tube 2b where the light to be measured R is incident.
- the photocathode 2c has a function of converting light into electrons. When the light R to be measured enters the photocathode 2c, electrons are emitted from the surface opposite to the incident surface of the light R to be measured.
- An accelerating electrode 2d is provided inside the tube 2b at a position facing the photocathode 2c.
- the accelerating electrode 2d accelerates electrons generated on the photocathode 2c.
- a pair of deflection plates 2e is provided at a position opposite to the photocathode 2c with respect to the acceleration electrode 2d.
- the streak sweep voltage Vs is applied from the streak sweep circuit 6 to the deflection plate 2e.
- the electrons accelerated by the acceleration electrode 2d are deflected by the streak sweep voltage Vs.
- a fluorescent screen 2a is provided on the surface of the tube 2b opposite to the surface on which the light R to be measured is incident.
- Electrons deflected by the acceleration electrode 2d collide with the phosphor screen 2a.
- the phosphor screen 2a emits light, so that a light image according to the distribution of the collided electrons, that is, a streak image, is formed on the phosphor screen 2a.
- P-43 is used for the fluorescent screen 2a of the streak tube 2.
- a coil 2f is provided outside the tube 2b so as to surround the side surface of the tube 2b. The coil 2 focuses the electrons accelerated by the acceleration electrode 2d.
- the image intensifier 3 which is an amplifying means for amplifying a streak image, is provided such that the surface on which light is incident faces the fluorescent screen 2 a of the streak tube 2.
- an MCP (not shown), which is an electron multiplier, is provided inside the image intensifier 3.
- the image intensifier 3 When the light emitted from the streak image on the fluorescent screen 2a of the streak tube 2 enters the image intensifier 3, it is provided on the incident surface. Electrons are emitted from the surface of the photocathode 3b opposite to the light incident surface. After being multiplied by the MCP, the electrons collide with the phosphor screen 3a. As a result, an amplified streak image is formed on the phosphor screen 3a.
- the in-line CCD camera 5 is provided so that the light incident surface faces the fluorescent screen 3a of the image intensifier 3, and plays a role of capturing a light image on the fluorescent screen 3a. Fulfill.
- the CCD camera driving circuit 7 is for driving the in-line CCD camera 5, and in particular, changes the operation state of the inter-line CCD camera 5 from the charge sweeping operation state to the exposure operation state. It has the function of switching.
- the control circuit 10 controls the timing (exposure start timing) at which the CCD camera driving circuit 7 switches the operation state of the in-line CCD camera 5 from the charge sweeping operation to the exposure operation. Specifically, when the control circuit 10 receives the CCD trigger signal T2 transmitted from the streak sweep circuit 6, the control circuit 10 sends the delayed CCD trigger signal T3 to the CCD camera driving circuit 7 after a certain delay time has elapsed. It has the function of transmitting.
- the CCD camera driving circuit 7 sets the in-line CCD camera 5 to the charge sweeping operation state. In this operation state, all the charges in the in-line CCD camera 5 are transferred to the outside, so that the inter-line CCD camera 5 is in a non-charge state.
- the measured light R (X-ray) is emitted from the sample 9 (Fig. 2B).
- the measured light R is incident on the photoelectric surface 2c of the streak tube 2
- electrons are emitted from the surface of the photoelectric surface 2c on the side opposite to the incident side of the measured light R.
- the electrons are accelerated by the accelerating electrode 2 d and the phosphor screen 2 a Flying toward.
- the electrons continue to be emitted while the light to be measured R is irradiated on the photocathode 2c, so that the electrons fly into the phosphor screen 2a in the form of a beam.
- the streak sweep trigger signal T1 Prior to irradiating the sample 9 with the laser light L, the streak sweep trigger signal T1 is transmitted from the laser device 8 to the streak sweep circuit 6 (FIG. 2C).
- Streak sweep circuit 6 receives the streak sweep trigger signal T 1, applying the streak sweep voltage Vs whose voltage value changes linearly against the time deflection plate 2 e (FIG. 2 D) c
- the streak sweeping Electrons in flight are deflected by the voltage Vs and collide with the phosphor screen 2a.
- the streak image is amplified by the image intensifier 3, and the amplified streak image is formed on the fluorescent screen 3a of the image intensifier 3.
- the image intensifier 3 There is no time delay between the time when the measured light R is emitted from the sample 9 and the time when the amplified streak image is formed on the fluorescent screen 3 a of the image intensifier 3.
- an amplified streak image is formed on the fluorescent screen 3a of the image intensifier 3.
- the CCD trigger signal T 2 is transmitted from the streak sweep circuit 6 to the control circuit 10 (FIG. 2F).
- the CCD trigger signal T2 is transmitted from the streak sweep circuit 6 and the control circuit 10 receives the CCD trigger signal T2 at the same time.
- the control circuit 10 transmits the delayed CCD trigger signal T3 to the CCD camera drive circuit 7 after a certain delay time (after elapse of 5) (FIG. 2G).
- the transmission of the delayed CCD trigger signal T 3 from the control circuit 10 and the reception of the delayed CCD trigger signal T 3 by the CCD camera driving circuit 7 are simultaneous. Then, the CCD camera driving circuit 7 transmits the command signal S to the in-line CCD camera 5 at the same time as receiving the delayed CCD trigger signal T 3.
- the operation status of the in-line CCD camera 5 is as follows. The operation state switches to the exposure operation state. That is, the interline CCD camera 5 starts exposure (FIG. 2J).
- the amplified streak image formed on the fluorescent screen 3 a of the image intensifier 3 is captured by the in-line CCD camera 5 through the optical system 4.
- the time when the light to be measured R is emitted from the sample 9 and the time when the control circuit 10 receives the CCD trigger signal T2 are simultaneous.
- the point in time when the delayed CCD trigger signal T3 is transmitted from the control circuit 10 and the point in time when the operating state of the in-line CCD camera 5 switches from the charge sweeping operation state to the exposure operation state are simultaneous. is there.
- the point in time at which the delay C CD trigger signal T3 is transmitted from the control circuit 10 is delayed by a delay time d from the point in time when the control circuit 10 receives the CCD trigger signal T2.
- the operating state of the in-line CCD camera 5 switches from the charge sweeping-out operation state to the exposure operation state, that is, the in-line CCD camera 5 starts exposure at the sample 9 is delayed by a delay time (
- control circuit 10 is configured to start the exposure of the one-line CCD camera 5 after a certain delay time d from the time when the measured light R is emitted. 2E and FIG. 2J, the in-line CCD camera 5 starts exposure after the neutrons emitted from the sample 9 are sufficiently attenuated.
- the CCD camera 5 is of the in-line type, and is set to the charge sweeping operation state by the CCD camera driving circuit 7 before the start of exposure. Therefore, even if neutrons emitted simultaneously with X-rays or rays or protons secondary generated from neutrons enter the in-line CCD camera 5, these particles The electric charge induced in the in-line CCD camera 5 by the line is swept away and is not detected as noise.
- a streak image formed by the light to be measured R can be measured in a state where noise due to neutron beams or the like is reduced.
- FIG. 3 is a schematic diagram illustrating a configuration of a streak camera device according to the second embodiment.
- 4A, 4B, 4C, 4D, 4E, 4F, and 4G are timing charts for explaining the operation of the streak camera device according to the second embodiment.
- a control circuit 12 is connected to a laser device 8 and a CCD camera driving circuit 7. It is provided so that.
- the control circuit 12 causes the laser device 8 to emit the laser beam L to the sample 9 and the CCD camera drive circuit 7 changes the operating state of the in-line CCD camera from the charge sweeping operation to the exposure operation.
- the timing of switching to the state is controlled.
- a streak image formed by the measured light R emitted from the sample 9 is amplified by the image intensifier 3, and the fluorescent screen 3 of the image intensifier 3
- a series of operations in which an amplified streak image is formed in a is the same as the operation in the streak camera device 1 of the first embodiment, as shown in FIGS. 4A, 4B, 4C, and 4D. is there.
- FIGS. 4A, 4B, 4C, and 4D. is there.
- the laser trigger signal T4 is transmitted from the control circuit 12 to the laser device 8, and the laser device receiving the laser trigger signal T4 The laser light L is emitted from the device 8 to the sample 9. Further, a CCD trigger signal T 5 is transmitted from the control circuit 12 to the CCD camera drive circuit 7. In response to the command signal S from the CCD camera driving circuit 7 that has received the CCD trigger signal T5, the operation state of the in-line CCD camera 5 is switched from the charge sweeping operation state to the exposure operation state. (That is, exposure is started.)
- the timing at which the in-line CCD camera 5 starts exposure is arbitrarily determined by the difference in transmission time between the laser trigger signal T 4 transmitted from the control circuit 12 and the CCD trigger signal T 5. It is determined. For example, if the CCD trigger signal T5 is transmitted earlier than the laser trigger signal T4, the in-line CCD camera 5 starts exposure earlier than the emission point of the light R to be measured (see FIG. 4). E).
- the in-line CCD camera 5 starts exposure simultaneously with the emission of the light R to be measured (FIG. 4F). Furthermore, if the CCD trigger signal T5 is transmitted later than the laser trigger signal T4, the in-line CCD camera 5 starts exposure later than the emission time of the light R to be measured (Fig. 4G). .
- the timing (exposure start timing) at which the CCD camera driving circuit 7 switches the operation state of the interline CCD camera 5 from the charge sweeping operation state to the exposure operation state is determined by the control circuit. According to Fig. 12, it can be set arbitrarily between a point in time that is earlier than the point in time when the measured light: is emitted and a point in time that is later than a certain period. The measurement can be performed while checking the intensity ratio (ie, SZN ratio). Therefore, measurement accuracy can be improved.
- the exposure start time of the inter-line CCD camera is set between a point in time that is a fixed period earlier than the point in time when the light R to be measured is emitted and a point in time that is later than the fixed time.
- the control circuit 12 is configured so as to set the interval between the sample materials. What is necessary is just to determine in consideration of measurement conditions, such as the afterglow time of the fluorescent screen 3a of the magnification, the intensity of laser light, or the irradiation time of laser light.
- FIG. 5 is a schematic diagram illustrating a configuration of a streak camera device according to the third embodiment.
- 6A, 6B, 6C, 6D, 6E, 6F, 6G, 6H, 61, and 6J are timing charts for explaining the operation of the streak camera device according to the third embodiment.
- an image intensifier drive circuit 11 for driving an amplifying means for amplifying a streak image is provided.
- the image intensifier drive circuit 11 is connected to the control circuit 10 and receives the delayed CCD trigger signal T3.
- the image intensifier drive circuit 11 and the control circuit 10 drive the amplifying means (image intensifier 3) for amplifying the streak image with a delay from the time when the measured light R is emitted.
- the driving means are configured.
- the operation in which the temporal change in the intensity of the measured light R emitted from the sample 9 is displayed as a streak image on the fluorescent screen 2a of the streak tube 2 is shown in FIG. 6B, FIG. 6C, FIG. 6D, FIG. 6E, FIG. 6F, FIG. 6G, FIG. 6H, and FIG. 6J, the operation is the same as that of the first embodiment described above. Hereinafter, only the differences from the operation of the first embodiment will be described.
- the delayed CCD trigger signal T 3 from the control circuit 10 is transmitted not only to the CCD camera driving circuit 7 but also to the image intensifier driving circuit 11.
- the image intensifier drive circuit 11 receives the delay CCD trigger signal T3 and simultaneously applies a voltage to an MCP (not shown) in the image intensifier 3.
- MCP not shown
- the delayed CCD trigger signal T 3 is also received by the CCD camera drive circuit 7 at the same time as it is received by the image intensifier drive circuit 11, so that the CCD camera drive circuit 7
- the timing of switching the operation state of the camera from the charge sweeping operation state to the exposure operation state is the same as when the voltage is applied to the MCP in the image intensifier 3 (Fig. 6G, Fig. 61 and Fig. 61). 6 J). That is, at the same time that the amplified streak image is formed on the fluorescent screen 3a of the image intensifier 3, the operation state of the in-line CCD camera 5 changes from the charge sweeping operation state to the exposure operation state. The state is switched to the state, and the amplified streak image on the phosphor screen 3 a is captured by the in-line CCD camera 5 through the optical system 4.
- the image intensifier drive circuit 11 is provided, and the image intensifier drive circuit 11 is configured to receive the delayed CCD trigger signal T3 from the control circuit 10. Therefore, not only the exposure of the line CCD camera 5 but also the voltage application to the MCP, which is the electron multiplier in the image intensifier 3, can be delayed.
- the voltage is applied to the MCP after the neutrons emitted from Sample 9 have sufficiently attenuated.
- the electrons induced in the MCP by the neutron beam or the particles or protons secondary generated from the neutron beam are not multiplied by the MCP, and the effect of the neutron beam and the like on the MCP can be reduced.
- Image intensifier configured without MCP Key is used (see Figure 1). That is, the area between the photoelectric surface 3b and the fluorescent surface 3a is directly opposed. More specifically, this image intensifier includes a photocathode 3b provided on the side of the streak tube 2 and a phosphor screen 3a provided on the side of the CCD camera 5, and the photocathode 3b and the phosphor screen 3 are provided. a means that the electrons generated on the photocathode 3b are not passed through the electrode (metal film provided inside the phosphor screen 3b if necessary) for accelerating the electrons, and the phosphor screen 3b They face each other so that they are directly incident on a. All other device configurations and measurement operations are the same as in the first embodiment.
- the effect of neutrons, etc., on the image intensifier is mainly related to the MCP. it can.
- control circuit 10 is provided between the streak sweep circuit 6 and the CCD camera drive circuit 7, but the present invention is not limited to this. If the exposure start timing of the line-type CCD camera 5 can be delayed with respect to the time point at which the measured light R is emitted, the control circuit 10 can be connected between the CCD camera drive circuit 7 and the CCD camera 5, for example. May be provided.
- a driving means is provided for driving the image intensifier 3 which is an amplifying means for amplifying a streak image with a delay from a point in time when the measured light R is emitted.
- the timing of voltage application to the MCP may be delayed.
- an image intensifier configured without including the MCP used in the streak camera device 30 of the fourth embodiment may be used.
- a streak tube having P-43 is used as the phosphor screen.
- it may be determined in consideration of the afterglow time of the phosphor screen and the period during which a large amount of neutron rays are generated.
- the neutron beam etc. mainly affects the CCD camera and the MCP, but the neutron beam collides with the phosphor screen 3 a of the image intensifier 3 and the neutron beam etc. There is a small possibility that a light image will be formed.
- a fluorescent substance with short afterglow is used as the fluorescent screen 3a of the image intensifier 3. Is preferred.
- the phosphor screen 3 a will be emitted before the in-line CCD camera 5 starts exposure.
- the light image formed by the neutron beam above is attenuated in a short time. Therefore, it becomes difficult to capture an optical image by a neutron beam or the like by the in-line CCD camera 5. Therefore, it is possible to reduce the effect of neutron beam etc. on the phosphor screen.o
- the timing at which the CCD camera driving circuit switches the operation state of the CCD camera from the charge sweeping operation state to the exposure operation state is delayed by the control circuit from the time of emission of the light to be measured. Therefore, the exposure of the CCD camera can be started after the neutrons emitted from the sample are attenuated.
- the timing at which the CCD camera driving circuit switches the operation state of the inter-line CCD camera from the charge sweeping operation state to the exposure operation state is more constant than when the light to be measured is emitted. If a control circuit is set up between the early and late time periods, the ratio of the intensity of the signal to be obtained to the noise due to neutrons, etc. (ie, the S / N ratio) can be ascertained. The measurement can be performed while confirming. Therefore, the accuracy of the measurement can be improved.
- a driving unit for driving an amplifying unit for amplifying the streak image with a delay from a point in time at which the light to be measured is emitted.
- the voltage is not applied to the MCP during a period in which a large amount of neutrons are generated. Even if is induced, this electron is not multiplied. Therefore, noise generated by the amplifying means due to particle beams such as neutrons can be reduced.
- an amplifying means that does not include the MCP is used, neutrons and the like do not affect the MCP, and noise generated by the amplifying means due to these particle beams can be eliminated.
- the present invention can be used for a streak camera device that measures a temporal change in measured light intensity as a streak image.
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- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Molecular Biology (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Multimedia (AREA)
- High Energy & Nuclear Physics (AREA)
- Engineering & Computer Science (AREA)
- Signal Processing (AREA)
- Image-Pickup Tubes, Image-Amplification Tubes, And Storage Tubes (AREA)
- Measurement Of Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Studio Devices (AREA)
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP01932203A EP1306652A4 (en) | 2000-05-26 | 2001-05-22 | STREAK CAMERA DEVICE |
AU2001258804A AU2001258804A1 (en) | 2000-05-26 | 2001-05-22 | Streak camera apparatus |
US10/296,509 US20030128278A1 (en) | 2000-05-26 | 2001-05-22 | Streak camera apparatus |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000-157025 | 2000-05-26 | ||
JP2000157025A JP2001339638A (ja) | 2000-05-26 | 2000-05-26 | ストリークカメラ装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2001090709A1 true WO2001090709A1 (en) | 2001-11-29 |
Family
ID=18661726
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2001/004280 WO2001090709A1 (en) | 2000-05-26 | 2001-05-22 | Streak camera apparatus |
Country Status (5)
Country | Link |
---|---|
US (1) | US20030128278A1 (ja) |
EP (1) | EP1306652A4 (ja) |
JP (1) | JP2001339638A (ja) |
AU (1) | AU2001258804A1 (ja) |
WO (1) | WO2001090709A1 (ja) |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
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EP1550857A1 (en) * | 2002-10-01 | 2005-07-06 | Hamamatsu Photonics K.K. | Fluorescence measuring device |
US7732730B2 (en) | 2000-09-13 | 2010-06-08 | Hamamatsu Photonics K.K. | Laser processing method and laser processing apparatus |
US7749867B2 (en) | 2002-03-12 | 2010-07-06 | Hamamatsu Photonics K.K. | Method of cutting processed object |
US8247734B2 (en) | 2003-03-11 | 2012-08-21 | Hamamatsu Photonics K.K. | Laser beam machining method |
US8268704B2 (en) | 2002-03-12 | 2012-09-18 | Hamamatsu Photonics K.K. | Method for dicing substrate |
US8409968B2 (en) | 2002-12-03 | 2013-04-02 | Hamamatsu Photonics K.K. | Method of cutting semiconductor substrate via modified region formation and subsequent sheet expansion |
US8685838B2 (en) | 2003-03-12 | 2014-04-01 | Hamamatsu Photonics K.K. | Laser beam machining method |
US8969752B2 (en) | 2003-03-12 | 2015-03-03 | Hamamatsu Photonics K.K. | Laser processing method |
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US20170336431A1 (en) * | 2016-05-19 | 2017-11-23 | Purdue Research Foundation | System and method for measuring exhaust flow velocity of supersonic nozzles |
US9940497B2 (en) * | 2016-08-16 | 2018-04-10 | Hand Held Products, Inc. | Minimizing laser persistence on two-dimensional image sensors |
DE102021108181B4 (de) | 2021-03-31 | 2023-02-16 | ebm-papst neo GmbH & Co. KG | Vorrichtung zur Abbildung von Partikeln, insbesondere Viren, in einer Probe |
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JPH05187914A (ja) * | 1991-07-24 | 1993-07-27 | Hamamatsu Photonics Kk | 微弱光計測装置 |
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WO1999029103A1 (fr) * | 1997-11-28 | 1999-06-10 | Hamamatsu Photonics K.K. | Dispositif de capture d'images a semi-conducteurs et analyseur utilisant ledit dispositif |
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FR2569510B1 (fr) * | 1984-08-21 | 1986-11-21 | Thomson Csf | Dispositif de correction de signaux video pour systeme d'acquisition et d'analyse de signaux rapides utilisant une camera a fente |
JPH07114472B2 (ja) * | 1984-11-19 | 1995-12-06 | 株式会社ニコン | 固体撮像素子の駆動方法 |
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2000
- 2000-05-26 JP JP2000157025A patent/JP2001339638A/ja active Pending
-
2001
- 2001-05-22 WO PCT/JP2001/004280 patent/WO2001090709A1/ja not_active Application Discontinuation
- 2001-05-22 AU AU2001258804A patent/AU2001258804A1/en not_active Abandoned
- 2001-05-22 EP EP01932203A patent/EP1306652A4/en not_active Withdrawn
- 2001-05-22 US US10/296,509 patent/US20030128278A1/en not_active Abandoned
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JPH04262213A (ja) * | 1990-05-18 | 1992-09-17 | Sony Tektronix Corp | 光サンプリング・システム |
JPH05187914A (ja) * | 1991-07-24 | 1993-07-27 | Hamamatsu Photonics Kk | 微弱光計測装置 |
JPH1048044A (ja) * | 1996-08-06 | 1998-02-20 | Hamamatsu Photonics Kk | 光波形測定装置 |
WO1999029103A1 (fr) * | 1997-11-28 | 1999-06-10 | Hamamatsu Photonics K.K. | Dispositif de capture d'images a semi-conducteurs et analyseur utilisant ledit dispositif |
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US8927900B2 (en) | 2000-09-13 | 2015-01-06 | Hamamatsu Photonics K.K. | Method of cutting a substrate, method of processing a wafer-like object, and method of manufacturing a semiconductor device |
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US8268704B2 (en) | 2002-03-12 | 2012-09-18 | Hamamatsu Photonics K.K. | Method for dicing substrate |
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US9142458B2 (en) | 2002-03-12 | 2015-09-22 | Hamamatsu Photonics K.K. | Substrate dividing method |
US9287177B2 (en) | 2002-03-12 | 2016-03-15 | Hamamatsu Photonics K.K. | Substrate dividing method |
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EP1550857A4 (en) * | 2002-10-01 | 2006-12-20 | Hamamatsu Photonics Kk | DEVICE FOR MEASURING FLUORESCENCE |
EP1550857A1 (en) * | 2002-10-01 | 2005-07-06 | Hamamatsu Photonics K.K. | Fluorescence measuring device |
US8865566B2 (en) | 2002-12-03 | 2014-10-21 | Hamamatsu Photonics K.K. | Method of cutting semiconductor substrate |
US8409968B2 (en) | 2002-12-03 | 2013-04-02 | Hamamatsu Photonics K.K. | Method of cutting semiconductor substrate via modified region formation and subsequent sheet expansion |
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Also Published As
Publication number | Publication date |
---|---|
EP1306652A4 (en) | 2005-07-13 |
EP1306652A1 (en) | 2003-05-02 |
US20030128278A1 (en) | 2003-07-10 |
JP2001339638A (ja) | 2001-12-07 |
AU2001258804A1 (en) | 2001-12-03 |
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