WO2001078869A1 - A process for the purification of organometallic compounds or heteroatomic organic compounds with a palladium-based catalyst - Google Patents
A process for the purification of organometallic compounds or heteroatomic organic compounds with a palladium-based catalyst Download PDFInfo
- Publication number
- WO2001078869A1 WO2001078869A1 PCT/IT2001/000186 IT0100186W WO0178869A1 WO 2001078869 A1 WO2001078869 A1 WO 2001078869A1 IT 0100186 W IT0100186 W IT 0100186W WO 0178869 A1 WO0178869 A1 WO 0178869A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- bis
- process according
- tetramethyleptandionate
- compounds
- titanium
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4401—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
- C23C16/4402—Reduction of impurities in the source gas
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F1/00—Compounds containing elements of Groups 1 or 11 of the Periodic System
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F15/00—Compounds containing elements of Groups 8, 9, 10 or 18 of the Periodic System
- C07F15/02—Iron compounds
- C07F15/025—Iron compounds without a metal-carbon linkage
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F17/00—Metallocenes
- C07F17/02—Metallocenes of metals of Groups 8, 9 or 10 of the Periodic System
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F3/00—Compounds containing elements of Groups 2 or 12 of the Periodic System
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F3/00—Compounds containing elements of Groups 2 or 12 of the Periodic System
- C07F3/003—Compounds containing elements of Groups 2 or 12 of the Periodic System without C-Metal linkages
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F3/00—Compounds containing elements of Groups 2 or 12 of the Periodic System
- C07F3/06—Zinc compounds
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F5/00—Compounds containing elements of Groups 3 or 13 of the Periodic System
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F5/00—Compounds containing elements of Groups 3 or 13 of the Periodic System
- C07F5/003—Compounds containing elements of Groups 3 or 13 of the Periodic System without C-Metal linkages
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F5/00—Compounds containing elements of Groups 3 or 13 of the Periodic System
- C07F5/06—Aluminium compounds
- C07F5/061—Aluminium compounds with C-aluminium linkage
- C07F5/062—Al linked exclusively to C
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F5/00—Compounds containing elements of Groups 3 or 13 of the Periodic System
- C07F5/06—Aluminium compounds
- C07F5/061—Aluminium compounds with C-aluminium linkage
- C07F5/064—Aluminium compounds with C-aluminium linkage compounds with an Al-Halogen linkage
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F5/00—Compounds containing elements of Groups 3 or 13 of the Periodic System
- C07F5/06—Aluminium compounds
- C07F5/061—Aluminium compounds with C-aluminium linkage
- C07F5/065—Aluminium compounds with C-aluminium linkage compounds with an Al-H linkage
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F5/00—Compounds containing elements of Groups 3 or 13 of the Periodic System
- C07F5/06—Aluminium compounds
- C07F5/069—Aluminium compounds without C-aluminium linkages
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F7/00—Compounds containing elements of Groups 4 or 14 of the Periodic System
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F7/00—Compounds containing elements of Groups 4 or 14 of the Periodic System
- C07F7/003—Compounds containing elements of Groups 4 or 14 of the Periodic System without C-Metal linkages
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F9/00—Compounds containing elements of Groups 5 or 15 of the Periodic System
- C07F9/66—Arsenic compounds
- C07F9/68—Arsenic compounds without As—C bonds
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F9/00—Compounds containing elements of Groups 5 or 15 of the Periodic System
- C07F9/66—Arsenic compounds
- C07F9/70—Organo-arsenic compounds
- C07F9/72—Aliphatic compounds
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F9/00—Compounds containing elements of Groups 5 or 15 of the Periodic System
- C07F9/90—Antimony compounds
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F9/00—Compounds containing elements of Groups 5 or 15 of the Periodic System
- C07F9/90—Antimony compounds
- C07F9/902—Compounds without antimony-carbon linkages
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F9/00—Compounds containing elements of Groups 5 or 15 of the Periodic System
- C07F9/94—Bismuth compounds
Definitions
- the present invention relates to a process for the purification of organometallic compounds or heteroatomic organic compounds with a palladium- based catalyst.
- Organometallic compounds are characterized by the presence of a bond between one metal atom (also arsenic, selenium or tellurium being included among metals) and one carbon atom being part of an organic radical such as, for example, aliphatic or aromatic, saturated or unsaturated hydrocarbon radicals; by extension, with the definition of organometallic compounds also the compounds including metal atoms bound to organic radicals by means of an atom other than carbon, such as for instance the alcoholic radicals (-OR) or of esters (-0-CO-R) are meant.
- the heteroatomic organic compounds are those organic compounds comprising, in addition to carbon and hydrogen, also atoms such as oxygen, nitrogen, halides, sulfur, phosphorus, silicon and boron.
- a gas flow of one or more organometallic or heteroatomic compounds is conveyed into a process chamber; then, inside the chamber the compounds are decomposed or reacted, so that materials containing metal atoms or heteroatoms are formed in situ (generally in the form of thin layers on a substrate).
- the organometallic or heteroatomic compounds can be already in the gaseous form, but they can also be in the liquid form.
- the gaseous flow of the compound is obtained either by evaporating the compound, in which case the flow- is composed only of the compound of interest, or by bubbling a gas in the container for the liquid, in which case the flow contains vapors of the compound in the earner gas.
- the main organometallic gases used in these applications are hafnium tetra- t-butoxyde, trimethylaluminum, triethylaluminum, tri-t-buthylaluminurn, di-i- buthylaluminum hydride, trim ethoxy aluminum, dimethylaluminum chloride, di ethyl aluminum ethoxyde, dimethylaluminum hydride, trimethylantimony, triethylantimony, tri-i-propyl antimony, tris-dimethylaminoantimony, trimethylarsenic, tris-dimethylaminoarsenic, t-buthylarsine, phenylarsine, barium bis-tetramethyleptandionate, bismuth tris-tetramethyleptandionate, dimethyl cadmium, diethylcadmium, iron pentacarbonyl, bis-cyclopentadienyl- iron, iron tris-
- the principal heteroatomic compounds used in these applications are trimefhylborane, asymmetric dimethylhydrazine (that is, wherein both methyl groups are bound to the same nitrogen atom), t-buthylamine, phenylhydrazine, trimethylphosphorus, t-buthylphosphine and t-buthylmercaptane.
- Some typical examples of application of these methods are the production of the semiconductors of type III-V, such as GaAs or InP, or of type II- VI such as ZnSe; the use for p doping (for instance with boron) or n doping (for instance with phosphorus) of traditional silicon-based semiconductor devices; the production of materials having a high dielectric constant (for example compounds such as PbZr x Ti ⁇ - x 0 3 ) used in ferroelectric memories; or the production of materials having a low dielectric constant (such as Si0 ) for insulating electric contacts in semiconductor devices.
- type III-V such as GaAs or InP
- type II- VI such as ZnSe
- p doping for instance with boron
- n doping for instance with phosphorus
- Patent US 5,470,555 describes the removal from organometallic compounds of oxygen gas which is present as an impurity, by using of a catalyst formed of copper or nickel metals, or the relevant oxides activated by reduction with hydrogen, deposited on a support such as alumina, silica or silicates. According to the patent, by this method the removal of oxygen gas from a flow of the organometallic compound can be obtained, down to values of 10 " " ppm.
- oxygen is not the only impurity that has to be removed from the organometallic or heteroatomic compounds.
- Other harmful impurities in the CVD processes are for example water and, particularly, the species deriving from the alteration of the same organometallic or heteroatomic compound, following to undesired reactions generally with water or oxygen.
- M represents the metal
- R an organic radical
- n the valence of the metal M
- contamination from MR n - ⁇ (-OR) x species can occur, wherein x is an integer varying between 1 and n.
- Object of the present invention is providing a process for the purification of organometallic compounds or heteroatomic organic compounds from oxygen, water and from the compounds derived from the reaction of water and oxygen with organometallic or heteroatomic compounds whose purification is sought.
- This object is obtained according to the present invention with a process wherein the organometallic or heteroatomic compound to be purified is contacted with a catalyst based on palladium deposited on a porous support.
- the purification can be carried out on the organometallic or heteroatomic compound either in the liquid or in the vapor state.
- the process of the invention consists m contacting the palladium-based catalyst with the compound to be purified m the liquid state This can be earned out simply by mtioducmg the catalyst into the container of the liquid compound, from which the same will be e ⁇ aporated by heating or with a carrier gas
- the purification is carried out by contacting the palladium-based catalyst with vapors, pure or m a earner gas, of the organometallic or heteroatomic compound
- the invention will be described with particular reference to the purification at the vapor state, since this is the condition most commonly used in the industry
- the quantity of palladium varies from 0,3 to 4% by weight with respect to the catalyst At lower values of palladium content, the activity of expedity removal is limited, whereas palladium quantities higher than 4% by weight bnng about a great increase of the catalyst cost without notable increases of the punfication yield
- the support may be any porous matenal normally used m the catalysis field, such as, e g , ceramics, molecular sieves, zeolites, porous glass or others Catalysts based on palladium on a porous support are available on the market, and are sold for the catalysis of chemical reactions (for example, hydrogenation reactions) from the companies Sud Chemie, Degussa and Engelhard
- the catalyst can be produced by impregnation m solution of the porous support with a quantity of a palladium salt or complex, for example palladium chlonde, PdCl , calculated on the basis of the desired quantity of palladium m the final catalyst, drying of the so impregnated porous support, decomposition (for example, thermal) of the precursor, optional calcination, for example at temperatures of about 400-500°C of the product so obtained
- the support of the catalyst is generally m the form of pellets or small cylinders, having size between 1 and 3 mm
- the range of the useful temperatures for the purification of organometallic or heteroatomic compounds with the palladium-based catalyst is between about
- the oxygen removal is limited, whereas at temperatures higher than about 100°C decomposition reactions of the gas to be purified could take place.
- the range of the preferred temperatures is within room temperature and about 50°C.
- the flow of the gas to be purified can vary between about 0,1 and 20 slpm (liters of gas, measured in standard conditions, per minute) at absolute pressures preferably comprised between about 1 and 10 bars.
- This flow can be fonned only of the vapors of the compound to be purified, or of said vapors in a flow of carrier gas.
- the carrier gas can be any gas interfering neither with the palladium-based catalyst (or with the other possibly used gas sorbing materials) nor with the deposition process wherein the organometallic or heteroatomic compound is used. Argon, nitrogen or even hydrogen are commonly used.
- FIG. 1 shows a cutaway view of a possible purifier to be used in the first embodiment of the process according to the invention.
- the purifier 10 is formed of a body 11, generally cylindrical; at the two ends of body 11 there are provided a piping 12 for the inlet of the gas into the purifier, and a piping 13 for the gas outlet.
- the palladium-based catalyst 14 (the type with the support of cylindrical shape is exemplified) is contained inside body 11.
- the inlet 12 and the outlet 13 of the gas are preferably provided with standard connections of the VCR type, known in the field (not shown in the figure) for coimection with the gas lines upstream and downstream the purifier.
- the purifier body can be made with various metal materials; the preferred material for this purpose is steel AISI 316.
- the internal surfaces of the purifier body which come in contact with the gas, are preferably electropolished until a surface roughness lower than about 0,5 ⁇ m is obtained.
- inside the purifier body at outlet 13 can be arranged means for retaining the particulate, such as nets or porous septa generally metallic having size of the "gaps" or of the pores suitable for retaining particles without causing an excessive pressure drop in the gas flow; the size of these openings can generally vary between about 10 and 0,003 ⁇ m.
- the gas flow to be purified can be contacted, not only with the palladium- based catalyst, but also with at least one additional matenal, selected among a hydrogenated getter alloy or a mixture of iron and manganese supported on zeolites, or both
- the getter alloys useful for the invention are the alloys based on titanium or zirconium with one or more elements selected among the transition metals and aluminum, and mixtures of one or more of these alloys with titanium and/or zirconium
- useful for the invention are the alloys ZrM 2 , wherein M is one or more of transition metals Cr, Mn, Fe, Co or Ni, descnbed m patent US 5,180,568, the alloys Zr-V-Fe described m patent US 4,312,669 and particularly the alloy having weight percent composition Zr 70% - V 24,6% - Fe 5,4% manufactured and sold by the Applicant under the name St 707, the alloys Zr-Co- A, wherein A means any element selected among yttrium, lanthanum, Rare Earths or mixtures of these elements, descnbed m patent US 5,961,750, the alloys Ti-Ni, and the alloys Ti-V-Mn described in patent US 4,457,891
- the loading with hydrogen of the above mentioned alloys is earned out at a hydrogen pressure lower than 10 bars, and preferably higher than the atmosphenc pressure, at temperatures comprised between room temperature and about 400°C Greater details on the method of loading the getter alloys with hydrogen can be found m the above mentioned patent EP-B-470936
- the optimal temperature range for use of the hydrogenated getter alloys in this application is compnsed between room temperature and about 100°C
- the material formed of the mixture of iron and manganese on zeolites has preferably a weight ratio between iron and manganese compnsed between 7 1 and 1 1 , even more preferably this ratio is about 2 1
- This matenal can be produced according to the modalities descnbed patent US 5,716,588 m the Applicant's name
- the optimal temperatuie range for using this material is compnsed between about -20 and 100°C, and preferably between room temperature and 50°C
- the additional material can be positioned indifferently upstream or downstream the palladium-based catalyst along the direction of the gas flow It is also possible, when both the cited additional materials are used, that one of them is upstream ad the other one downstream the palladium-based catalyst
- the additional material (or the additional matenals) can be provided m a separate body, connected to body 11 of the punfier containing the palladium based catalyst by means of pipings and fittings, for instance of the above mentioned VCR type
- this second body will be preferably made of the matenals and with the finishing level of the surfaces as descnbed for body 11 Piefeiably, the additional material (or the additional matenals) is arranged in the same punfier body wherein the palladium-based catalyst is provided
- the different materials can be mixed, but preferably they are separated m the punfier body
- Figuie 2 shows a cutaway view of a possible purifier containing more than one matenal (the case of two matenals is exemplified), in particular, it shows a purifier made according to the preferred mode wherein the different mate ⁇ als are kept separated mside the punfier body
- the purifier 20 is formed of a body 21, a gas inlet 22 and a gas outlet 23, the palladium-based catalyst 24 is arranged on the side of inlet 22 inside body 21, and, on the side of the outlet 23, a matenal 25 selected between a hydrogenated getter alloy or a mixture of iron and manganese supported on zeolites, preferably, a mechanical member 26 which is easily permeable to gases, such as a metal net, is arranged between the two matenals in order to help maintaining the separation and the original geometrical arrangement of the materials
- the punfier must be kept at a temperature compatible with the working temperature
- vanous cited matenals also a water chemical sorber, for example calcium oxide or boron oxide, this latter prepared accoidmg to the teachings of patent application EP-A-960647 m the Applicant's name.
- a water chemical sorber for example calcium oxide or boron oxide
- a purifier of the type shown in figure 1 is made.
- the purifier has a body made of steel AISI 316 and an internal volume of about 50 cm".
- the catalyst formed of small cylinders of ⁇ -alumina (total volume 20 cm ) on which 2% by weight of metal palladium is provided, is introduced into the purifier.
- the purifier is then connected, by means of VCR connections, upstream to a nitrogen cylinder containing 40 ppm by volume (ppmv) of water and 100 ppmv of oxygen, and downstream to a mass spectrometer of the APIMS type (atmospheric pressure ionization mass spectrometer) mod.
- APIMS atmospheric pressure ionization mass spectrometer
- TOF 2000 of the company Sensar that has a sensing threshold of 10 "4 ppmv both for water and for oxygen.
- the test is carried out in nitrogen instead of in a flow of an organometallic compound vapor, because the analyzing instrument used (APIMS) has a reduced sensibility in the vapors of these compounds, such that a test with an organometallic compound would not enable to obtain significant results.
- the gas to be purified is passed at 5 bars in the purifier maintained at room temperature, with a flow of 0,1 slpm. At the beginning of the test the quantity of water and oxygen in the gas outlet from the purifier is under the analyzer sensibility threshold, indicating the functionality of the palladium-based catalyst in the removal of these species.
- the test is continued until the analyzer senses in the gas output from the purifier a quantity of contaminant of 10 "3 ppmv; this contamination value of the output gas is adopted as indicator of the purifier depletion. From the knowledge of the test data, it is obtained that the purifier has a capacity of 3 1/1 (liters of the gas measured in standard conditions per liter of the getter alloy) for oxygen, and 15 1/1 for water.
Abstract
Description
Claims
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU52550/01A AU5255001A (en) | 2000-04-19 | 2001-04-13 | A process for the purification of organometallic compounds or heteroatomic organic compounds with a palladium-based catalyst |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IT2000MI000881A IT1318474B1 (en) | 2000-04-19 | 2000-04-19 | Purification of organometallic or heteroatomic compounds useful in semiconductor manufacture involves contacting the compounds with a catalyst formed of metal palladium deposited on a porous support |
ITMI2000A000881 | 2000-04-19 | ||
ITMI2000A000891 | 2000-04-20 | ||
IT2000MI000891A IT1318480B1 (en) | 2000-04-20 | 2000-04-20 | Purification of organometallic or heteroatomic compounds useful in semiconductor manufacture involves contacting the compounds with a catalyst formed of metal palladium deposited on a porous support |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2001078869A1 true WO2001078869A1 (en) | 2001-10-25 |
WO2001078869A9 WO2001078869A9 (en) | 2002-07-18 |
Family
ID=26332742
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/IT2001/000186 WO2001078869A1 (en) | 2000-04-19 | 2001-04-13 | A process for the purification of organometallic compounds or heteroatomic organic compounds with a palladium-based catalyst |
Country Status (2)
Country | Link |
---|---|
AU (1) | AU5255001A (en) |
WO (1) | WO2001078869A1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110483580A (en) * | 2019-09-06 | 2019-11-22 | 广东先导先进材料股份有限公司 | A kind of high-purity trialkyl antimony and the preparation method and application thereof |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1004741A (en) * | 1964-03-11 | 1965-09-15 | British Oxygen Co Ltd | Process for the purification of gases |
US3535074A (en) * | 1965-10-29 | 1970-10-20 | Hitachi Ltd | Method and apparatus for purifying crude inert gases |
EP0444422A1 (en) * | 1990-02-02 | 1991-09-04 | Air Products And Chemicals, Inc. | Production of high purity argon |
EP0470936A1 (en) * | 1990-07-12 | 1992-02-12 | SAES GETTERS S.p.A. | Removal of impurities from a hydride gas |
US5470555A (en) * | 1991-07-17 | 1995-11-28 | Japan Pionics Co., Ltd. | Process for purification of gaseous organometallic compound |
US5961750A (en) * | 1997-04-03 | 1999-10-05 | Saes Getters, S.P.A. | Nonevaporable getter alloys |
-
2001
- 2001-04-13 WO PCT/IT2001/000186 patent/WO2001078869A1/en active Application Filing
- 2001-04-13 AU AU52550/01A patent/AU5255001A/en not_active Abandoned
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1004741A (en) * | 1964-03-11 | 1965-09-15 | British Oxygen Co Ltd | Process for the purification of gases |
US3535074A (en) * | 1965-10-29 | 1970-10-20 | Hitachi Ltd | Method and apparatus for purifying crude inert gases |
EP0444422A1 (en) * | 1990-02-02 | 1991-09-04 | Air Products And Chemicals, Inc. | Production of high purity argon |
EP0470936A1 (en) * | 1990-07-12 | 1992-02-12 | SAES GETTERS S.p.A. | Removal of impurities from a hydride gas |
US5470555A (en) * | 1991-07-17 | 1995-11-28 | Japan Pionics Co., Ltd. | Process for purification of gaseous organometallic compound |
US5961750A (en) * | 1997-04-03 | 1999-10-05 | Saes Getters, S.P.A. | Nonevaporable getter alloys |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110483580A (en) * | 2019-09-06 | 2019-11-22 | 广东先导先进材料股份有限公司 | A kind of high-purity trialkyl antimony and the preparation method and application thereof |
CN110483580B (en) * | 2019-09-06 | 2022-04-19 | 广东先导微电子科技有限公司 | High-purity trialkyl antimony, and preparation method and application thereof |
Also Published As
Publication number | Publication date |
---|---|
AU5255001A (en) | 2001-10-30 |
WO2001078869A9 (en) | 2002-07-18 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US6797182B2 (en) | Process for the purification of organometallic compounds or heteroatomic organic compounds with hydrogenated getter alloys | |
EP0784595B1 (en) | Process for removing oxygen from ammonia at room temperature | |
US6733734B2 (en) | Materials and methods for the purification of hydride gases | |
US20030035763A1 (en) | Process for the purification of organometallic compounds or heteroatomic organic compounds with a catalyst based on iron and manganese supported on zeolites | |
KR100376899B1 (en) | Process and Apparatus for Removing Metal Carbonyls and Moisture from a Gas | |
EP0484301B1 (en) | Process for the purification of ammonia | |
WO2001078869A1 (en) | A process for the purification of organometallic compounds or heteroatomic organic compounds with a palladium-based catalyst | |
CA2124052C (en) | Liquid indium source | |
US8748644B2 (en) | Ruthenium compound, method of producing the same, method of producing ruthenium-containing thin film using the same, and ruthenium-containing thin film | |
US5094830A (en) | Process for removal of water and silicon mu-oxides from chlorosilanes | |
KR20120120182A (en) | Ruthenium complex mixture, method for producing same, composition for forming film, ruthenium-containing film and method for producing same | |
ITMI20000893A1 (en) | PROCESS FOR THE PURIFICATION OF ORGANOMETALLIC COMPOUNDS OR HETEROATOMIC ORGANIC COMPOUNDS WITH AN IRON AND MANGANESE BASED CATALYST | |
US5057242A (en) | Composition, process, and apparatus, for removal of water and silicon mu-oxides from chlorosilanes | |
ITMI20000880A1 (en) | PROCESS FOR THE PURIFICATION OF ORGANOMETALLIC COMPOUNDS OR HETEROATOMIC ORGANIC COMPOUNDS WITH AN IRON AND MANGANESE-BASED CATALYST | |
ITMI20000891A1 (en) | PROCESS FOR THE PURIFICATION OF ORGANOMETALLIC COMPOUNDS OR HETEROATOMIC ORGANIC COMPOUNDS WITH A PALLADIUM-BASED CATALYST. | |
ITMI20000881A1 (en) | PROCESS FOR THE PURIFICATION OF ORGANOMETALLIC COMPOUNDS OR HETEROATOMIC ORGANIC COMPOUNDS WITH A PALLADIUM-BASED CATALYST | |
EP0839817A2 (en) | Method for purifying mono-alkyl-arsines or mono-alkyl-phosphines | |
ITMI20000882A1 (en) | PROCESS FOR THE PURIFICATION OF ORGANOMETALLIC COMPOUNDS OR HETEROATOMIC ORGANIC COMPOUNDS WITH HYDROGENATED GETTER ALLOYS. | |
ITMI20000892A1 (en) | PROCESS FOR THE PURIFICATION OF ORGANOMETALLIC COMPOUNDS OR HETEROATOMIC ORGANIC COMPOUNDS WITH HYDROGENATED GETTER ALLOYS. | |
KR20240032512A (en) | Composition for thin film deposition containing a metal compound, method for manufacturing a metal-containing thin film using the same, and metal-containing thin film manufactured using the same | |
KR20000024977A (en) | Method for preparation of nitriding film | |
Malm | Vacuum line chemistry in selected atomic layer deposition processes |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AK | Designated states |
Kind code of ref document: A1 Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BY BZ CA CH CN CO CR CU CZ DE DK DM DZ EE ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NO NZ PL PT RO RU SD SE SG SI SK SL TJ TM TR TT TZ UA UG US UZ VN YU ZA ZW |
|
AL | Designated countries for regional patents |
Kind code of ref document: A1 Designated state(s): GH GM KE LS MW MZ SD SL SZ TZ UG ZW AM AZ BY KG KZ MD RU TJ TM AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE TR BF BJ CF CG CI CM GA GN GW ML MR NE SN TD TG |
|
DFPE | Request for preliminary examination filed prior to expiration of 19th month from priority date (pct application filed before 20040101) | ||
121 | Ep: the epo has been informed by wipo that ep was designated in this application | ||
AK | Designated states |
Kind code of ref document: C2 Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BY BZ CA CH CN CO CR CU CZ DE DK DM DZ EE ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NO NZ PL PT RO RU SD SE SG SI SK SL TJ TM TR TT TZ UA UG US UZ VN YU ZA ZW |
|
AL | Designated countries for regional patents |
Kind code of ref document: C2 Designated state(s): GH GM KE LS MW MZ SD SL SZ TZ UG ZW AM AZ BY KG KZ MD RU TJ TM AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE TR BF BJ CF CG CI CM GA GN GW ML MR NE SN TD TG |
|
COP | Corrected version of pamphlet |
Free format text: PAGES 2 AND 3, DESCRIPTION, REPLACED BY NEW PAGES 2 AND 3; PAGES 10 AND 11, CLAIMS, REPLACED BY NEWPAGES 10 AND 11; AFTER RECTIFICATION OF OBVIOUS ERRORS AS AUTHORIZED BY THE INTERNATIONAL SEARCHING AUTHORITY |
|
REG | Reference to national code |
Ref country code: DE Ref legal event code: 8642 |
|
122 | Ep: pct application non-entry in european phase | ||
NENP | Non-entry into the national phase |
Ref country code: JP |