WO2001044788A3 - Verfahren und einrichtung zur messung von kenngrössen einer probe - Google Patents

Verfahren und einrichtung zur messung von kenngrössen einer probe Download PDF

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Publication number
WO2001044788A3
WO2001044788A3 PCT/DE2000/004456 DE0004456W WO0144788A3 WO 2001044788 A3 WO2001044788 A3 WO 2001044788A3 DE 0004456 W DE0004456 W DE 0004456W WO 0144788 A3 WO0144788 A3 WO 0144788A3
Authority
WO
WIPO (PCT)
Prior art keywords
performance characteristics
measuring
sample
additional
established
Prior art date
Application number
PCT/DE2000/004456
Other languages
English (en)
French (fr)
Other versions
WO2001044788A2 (de
Inventor
Peter Maier
Original Assignee
Siemens Ag
Peter Maier
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Ag, Peter Maier filed Critical Siemens Ag
Priority to EP00991062A priority Critical patent/EP1238262A2/de
Publication of WO2001044788A2 publication Critical patent/WO2001044788A2/de
Publication of WO2001044788A3 publication Critical patent/WO2001044788A3/de
Priority to US10/171,964 priority patent/US6671629B2/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/127—Calibration; base line adjustment; drift compensation
    • G01N2201/12723—Self check capacity; automatic, periodic step of checking

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

Bei der Messung von Kenngrößen einer Probe durch Spektralanalyse werden aus den dabei erhaltenen spektralen Daten mittels eines auf der Grundlage von Referenzproben erstellten Kalibrationsmodells die Kenngrößen berechnet. Um die Robustheit der Messung zu erhöhen, erfolgt mittels mindestens eines auf der Grundlage von weiteren Referenzproben (1'') erstellten weiteren Kalibrationsmodells (14) eine weitere Berechnung der Kenngrößen (16) der Proben (1), wobei Abweichungen zwischen den von den Kalibrationsmodellen (11, 14) jeweils berechneten Kenngrößen (12, 16) ermittelt und ausgegeben werden.
PCT/DE2000/004456 1999-12-15 2000-12-14 Verfahren und einrichtung zur messung von kenngrössen einer probe WO2001044788A2 (de)

Priority Applications (2)

Application Number Priority Date Filing Date Title
EP00991062A EP1238262A2 (de) 1999-12-15 2000-12-14 Verfahren und einrichtung zur messung von kenngrössen einer probe
US10/171,964 US6671629B2 (en) 1999-12-15 2002-06-17 Method and device for measuring characteristics of a sample

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19960586.6 1999-12-15
DE19960586A DE19960586B4 (de) 1999-12-15 1999-12-15 Verfahren und Einrichtung zur Messung von Kenngrössen einer Probe durch Spektralanalyse

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US10/171,964 Continuation US6671629B2 (en) 1999-12-15 2002-06-17 Method and device for measuring characteristics of a sample

Publications (2)

Publication Number Publication Date
WO2001044788A2 WO2001044788A2 (de) 2001-06-21
WO2001044788A3 true WO2001044788A3 (de) 2001-11-29

Family

ID=7932810

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/DE2000/004456 WO2001044788A2 (de) 1999-12-15 2000-12-14 Verfahren und einrichtung zur messung von kenngrössen einer probe

Country Status (4)

Country Link
US (1) US6671629B2 (de)
EP (1) EP1238262A2 (de)
DE (1) DE19960586B4 (de)
WO (1) WO2001044788A2 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AUPS059002A0 (en) * 2002-02-15 2002-03-14 Airservices Australia Determination of solution concentration
DE10350075A1 (de) * 2003-10-27 2005-06-09 Siemens Ag Verfahren und Vorrichtung zur Prozessführung bei der Zellstoffkochung
EP1985996A1 (de) * 2007-04-27 2008-10-29 Roche Diagnostics GmbH Analysesystem zur photometrischen Bestimmung eines Analyten in einer Körperflüssigkeit mit einem Analysegerät und einem Testträger zur Aufnahme in das Analysegerät
DE102018103509B3 (de) * 2017-10-11 2018-12-13 Carl Zeiss Spectroscopy Gmbh Mobiles Inhaltsstoffanalysesystem sowie Verfahren zur probenrichtigen Messung und Nutzerführung mit diesem

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4155009A (en) * 1977-04-07 1979-05-15 Unit Process Assemblies, Inc. Thickness measurement instrument with memory storage of multiple calibrations
US5576544A (en) * 1989-01-19 1996-11-19 Futrex, Inc. Method for providing general calibration for near infrared instruments for measurement of blood glucose

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6198532B1 (en) * 1991-02-22 2001-03-06 Applied Spectral Imaging Ltd. Spectral bio-imaging of the eye
US5872630A (en) * 1995-09-20 1999-02-16 Johs; Blaine D. Regression calibrated spectroscopic rotating compensator ellipsometer system with photo array detector
US6441388B1 (en) * 1998-10-13 2002-08-27 Rio Grande Medical Technologies, Inc. Methods and apparatus for spectroscopic calibration model transfer
US6280381B1 (en) * 1999-07-22 2001-08-28 Instrumentation Metrics, Inc. Intelligent system for noninvasive blood analyte prediction

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4155009A (en) * 1977-04-07 1979-05-15 Unit Process Assemblies, Inc. Thickness measurement instrument with memory storage of multiple calibrations
US5576544A (en) * 1989-01-19 1996-11-19 Futrex, Inc. Method for providing general calibration for near infrared instruments for measurement of blood glucose

Also Published As

Publication number Publication date
EP1238262A2 (de) 2002-09-11
WO2001044788A2 (de) 2001-06-21
US20030028329A1 (en) 2003-02-06
US6671629B2 (en) 2003-12-30
DE19960586A1 (de) 2001-07-12
DE19960586B4 (de) 2008-04-24

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