WO2001031286A2 - Method and device for non-destructive inspection of objects by means of optical holographic interferometry - Google Patents
Method and device for non-destructive inspection of objects by means of optical holographic interferometry Download PDFInfo
- Publication number
- WO2001031286A2 WO2001031286A2 PCT/NO2000/000346 NO0000346W WO0131286A2 WO 2001031286 A2 WO2001031286 A2 WO 2001031286A2 NO 0000346 W NO0000346 W NO 0000346W WO 0131286 A2 WO0131286 A2 WO 0131286A2
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- holographic
- investigation area
- light
- light source
- camera
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
- G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
- G01B11/164—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means by holographic interferometry
Definitions
- This invention relates to a method and device for non-destructive inspection by means of holographic interferometry of details, machine units, mechanisms, and various materials, which makes it possible to considerably decrease the requirements for protecting against vibratory movements during measurements and to perform measurements in real time scale of different objects in situ under any weather condition.
- Optical holographic interferometry makes it possible to perform non-destructive inspections of blocks and units of machines and devices for eventual presence of internal defects, as well as measuring stresses of an object during the object's work load and residual stresses caused by technological processes of welding, forging, soldering etc. These measurements are useful for such fields as offshore petroleum industry, shipbuilding industry, manufacturing industry, aircraft industry, and for all kinds of structures where loading stresses and residual stresses can result in failures.
- the principle of non-destructive inspections of an area of an object by optical holographic interferometry can be described as follows: First, a hologram of the area which is to be investigated on the object is recorded and developed by a registering medium when the object is in an unloaded initial state of stress (a description of recording holograms by a holographic interferometer is for instance given in the applicants Norwegian application no. 20002948, which is included here as a reference). Then one slightly reforms the investigation area of the object by applying some types of loading; for example stretching, compression, bending, twisting, heating, and combinations of one or several of these etc. The loading is performed in such a way that the stress will be concentrated in the region where the eventual defect is located.
- the registering medium containing the developed image of the hologram and the object are simultaneously illuminated by coherent light.
- two light waves scattered by the investigation area before and after loading will simultaneously emerge behind the registering medium.
- These light waves will interfere and form an interferogram which contains a set of fringes.
- the interferogram is observed by f.eks. the naked eye or an objective and a monitor through the registering medium, it is seen as a set of fringes which cover the investigation area during loading.
- a presence of areas with abnormal fringe behaviour corresponds to presence of defects in the object. With this technique it is thus possible to reveal various types of defects such as cracks, conglutinations, incomplete fusion, voids, cavities, pores, etc.
- the illumination forms an interferogram from which one first determines the normal components of the surface displacements at the edge zone of released stresses. Finally, the measurements are employed to calculate the magnitude of the residual stresses. This procedure is thoroughly presented in the applicants Norwegian application no. 19995312, which is incorporated here as a reference.
- the spatial carrier frequency is typically in the order of 1000-2000 mm "1 , thus a relative displacement of one of the above mentioned components by as little as 0,5-1 ⁇ m will result in a crabbing of the interference pattern of the hologram and render it's registration impossible.
- the registering media are films of amorphous molecular semiconductors (AMS-films)
- AMS-films are subject to an electrostatic charging by corona discharges prior to registration of holograms. This is impossible in a high humidity environment or at temperatures below 0°C. Also, high quality registrations and developments of holograms becomes impossible in high humidities and low temperatures due to a surface relaxation of the variable component of the latent electrostatic image. Also, achieving an optimum heating rate of the AMS-film during development becomes impossible in such conditions.
- the main object of the invention is to provide a device and method for nondestructive inspections of objects by means of the optical holographic interferometry technique in real-time scale and which overcomes the above mentioned drawbacks.
- Another object of the invention is to provide a device and method for performing non-destructive inspections of objects by means of real-time optical holographic interferometry which makes it possible to perform the loading and illumination of the investigation area of an object with coherent light in situ, while the registration, development of holograms and formation of interferograms takes place in another location.
- a further object of the invention is to provide a device and method for performing non-destructive inspections of objects by real-time optical holographic interferometry which considerably reduces the requirements for vibration protection during registration and development of holograms and formation of interferograms.
- Figure 1 shows a preferred embodiment of a holographic interferometer according to the invention and an example of a clamping and loading device for investigation of the joint of two welded half-pipes which are subject to bending loading.
- Figure 2 shows an enlarged depicted view of the object module shown in Fig. 1.
- Figure 3 shows an enlarged depicted view of the holographic camera shown in Fig. 1.
- Figure 4 is a photograph of an interferogram from an area of a welded seam of a titanium pipe of 12 mm diameter which is exposed to bending deformation.
- the objectives of the invention can be achieved by the device and method disclosed in the appended claims and in the description given below.
- the aims of considerably reducing the requirements for vibration protection and to be able to study the object in situ while registration, development of holograms and formation of interferograms takes place in another location, can be achieved by "dividing" the holographic interferometer into an object module and a holographic camera, and by ensuring that the path length of the coherent light travelling from the light source, to the object and further to the registering medium is independent of movements of the object relative to the holographic camera and/or light source. This ensures that any phase changes of the object and/or reference beam is due to changes at the surface of the object and not by a change in the distance between the object and holographic camera or light source.
- a preferred way to achieve this is to transmit the part of the coherent light that constitutes the object beam from the light source to the object surface and therefrom to the holographic camera, and the part of the coherent light that constitutes the reference beam from the light source to the holographic camera in single-mode light guidance cables which are attached to optical connectors which themselves are rigidly fixed on the light source, above the investigation area of the object and holographic camera, respectively.
- the optical connectors above the object surface and it's attachment means can be said to constitute an object module. It is preferred to employ single-mode light guidance cables since the optical path length in such cables are practically independent of bending and twisting of the cables.
- the holographic camera, light source and object module are free to move relative to each other without leading to distortions of the interference fringes on the interferogram.
- the only requirement is that the optical connectors must be firmly fixed relative to the object, registering medium or light source, respectively. This is obviously a much easier task than the state of the art requirement of fixing all components, including the object in relation to each other.
- Another advantage of this preferred embodiment is that the registration and development of holograms and formation interferograms can be performed
- Fig. 1 shows a holographic interferometer for non-destructive inspections of objects and a loading device according to a preferred embodiment of the invention.
- Fig. 2 shows an enlarged depicted view of the loading module which shows the optical scheme of the loading module
- Fig. 3 shows an enlarged depicted view of the holographic camera with optical connectors and the optical scheme for the camera.
- the investigation object welded joint of two half-pipes
- the device for performing the bending loading are of course only given as a typical example of an investigation by holographic interferometry, and shall by no means be interpreted as a limitation to this invention.
- This invention relates to the method and device for performing holographic interferometry and can be applied for all kinds of objects that are mentioned in the background section given above.
- the size and shape of the loading device must of course be altered according to the size and shape of the object which is to be investigated and to the chosen way of loading the object in order to create stresses in the vicinity of a defect in the object.
- the only requirement is that the loading device should provide the necessary conditions for illuminating the investigation area of the object with coherent light by means of a first optical connector, and for collecting the coherent light that scatters off the investigation area by means of a second optical connector. Matters concerned with shaping and sizing of the loading device is within the know-how of an average skilled person, and will therefore not be further presented here.
- the attention will now be focused on the holographic interferometer of the device which constitutes the basis of the invention.
- the holographic interferometer (see Figs. 1-3) comprises an object module 20 situated directly on an element of the loading device 8, a holographic camera 12 with a registration medium 13, a source of coherent light -laser 1 with optical connector 3 and beam splitter 3, and single-mode optical cables 4, 5, 10.
- the object module 20 and the holographic camera 12 comprises pairs of optical connectors 6,9 and 1 1 ,14, respectively.
- the device for performing non-destructive inspections of objects comprises a device for registering holograms on AMS-films 15, a TV-camera with an objective 16, a computer 17 with monitor 18, and printer 19.
- optical connector 2 is attached to the laser 1 in one end and to the beam splitter 3 in the other end
- the single-mode optical light guidance cable 4 is attached to the beam splitter 3 in one end and to the optical connector 6 in the other end
- the single-mode optical light guidance cable 5 is attached to the beam splitter 3 in one end and to the optical connector 14 in the other end
- the single-mode optical light guidance cable 10 is attached to the optical connector 9 in one end and to the optical connector 1 1 in the other end.
- the object module 20 with optical connectors 6,9 is situated on an element of the loading device 8 in such a manner that connector 6 illuminates the investigation area of the object with the object coherent light (see Fig.
- the optical connector 1 1 is situated on the optical camera 12 in such a manner that it directs the object beam onto the registering medium 13, while optical connector 14 is situated on the optical camera 12 in such a manner that it directs the reference beam onto the registering medium 13 (see Fig. 3).
- optical connector 2 and beam splitter 3 are rigidly fixed onto the laser 1
- the optical connectors 6, 9 are rigidly fastened onto the object module 20 which itself must be rigidly fastened to the loading device 8 in a fixed distance above the investigation area of the object
- the optical connectors 1 1,14 are rigidly fastened onto the optical camera in a fixed distance of the registering medium 3.
- the holographic interferometer can be conceived as constituted of two parts; a holographic camera with light source and an object module, which can be placed in different location and which ensures that they are all free to move relative to each other within limits defined by the length of the optical guidance cables without imparting any changes in the optical path length of the object and/or reference beams.
- the holographic interferometer camera and light source
- the holographic interferometer in a comfortable and/or weather protected place and perform in situ investigations off various objects regardless of their size and shape.
- the registering medium is an AMS-film made up of 91wt% of a copolymer comprising epoxypropylcarbazole and 5 wt% buthylglycedil ether doped with 5wt% of methyl-9-(4-dodecyl-oxyphenyl-l,3-selenathiol-2- ylidene)-2,5,7-trinitrofluorene-4-carboxylate and 5wt% of hexadecyl-2,7-dinitro- dicyanomethylenfluorene-4-carboxylate.
- a discussion of the properties of AMS- films and why this film is preferred is given in the applicants Norwegian application 19995273) which is incorporated here as a reference.
- the registering medium 13 When the object module 20 is properly fastened above the investigation area, the registering medium 13 will be made ready for registration of a hologram. Then the laser is switched on and coherent light is sent via optical connector 2 into beam splitter 3 which divides the laser radiation into a coherent object and reference beam.
- the coherent object beam travels through single-mode light guidance cable 4 and enters into optical connector 6 of the object module 20.
- the connector 6 expands and directs the object beam such that it illuminates the investigation area of the object 7.
- the part of the object beam that reflects off the surface of the investigation area is collected by connector 9 of the object module 20, from which it enters and travels through the single-mode light guidance cable 10.
- the object beam will then enter optical connector 1 1 of the holographic camera 12.
- the optical connector 11 direct and expand the object beam such that it illuminates the registering medium 13.
- the coherent reference beam is sent to optical connector 14 of the holographic camera 12 by means of the single-mode light guidance cable 5.
- the optical connector 10 will direct and expand the reference beam 15 such that it illuminates the registering medium 3.
- the object and reference beam interfere on the surface of the registering medium 13, and form a hologram of the investigation area of the object.
- This hologram is registered and developed into a latent image on the registering medium.
- the investigation area of the object is subject to a load, in this case a slight bending deformation with use of the loading device 8.
- the registering medium 13 containing the developed holographic image and the investigation area of the object are simultaneously illuminated by the reference and object beam, respectively.
- two light waves will simultaneously appear behind the registering medium 13, one of which corresponds to the object light wave scattered by the investigation area of the object before loading, while the other corresponds to the light wave scattered by the investigation area of the object after loading.
- the device and method for non-destructive real-time inspection of objects by use of holographic interferometry eliminates the above mentioned drawbacks accompanying the presently known devices and methods of non-destructive inspections of objects by holographic interferometry.
- single-mode light guide optic cables for transmitting coherent light from a laser to an investigation area of an object, (ii) for transmitting the coherent light scattered off by the investigation area to the place where a hologram forms, (iii) for transmitting coherent light from a laser to the place where a hologram forms, allows a much easier practical realisation of the illumination of an object with a coherent light and collection of light scattered off the object in situ, while the hologram formation and its registration and development, formation of an interferogram takes place in another comfortable protected location. In the same time this allow a considerable reduction of the requirements for protecting the measurements against vibrations, since vibrations in the object no longer influences the registering medium, elements of the holographic camera and laser.
- elements of the holographic camera and registering medium are not mechanically fastened to a laser, therefore relative movements of the laser and holographic camera will not influence each other. Also, any shifts or bends of single-mode light guide optic cables will not result in change of the optical pass- length or in additional accumulation of phase.
Abstract
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU13119/01A AU1311901A (en) | 1999-10-29 | 2000-10-18 | Method and device for non-destructive inspection of objects by means of optical holographic interferometry |
JP2001533383A JP4757421B2 (en) | 1999-10-29 | 2000-10-18 | Method and apparatus for nondestructive inspection of objects by optical holographic interferometry |
EP00975011A EP1226402A2 (en) | 1999-10-29 | 2000-10-18 | Method and device for non-destructive inspection of objects by means of optical holographic interferometry |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NO995311A NO995311D0 (en) | 1999-10-29 | 1999-10-29 | Method and Device for Non-Destructive Inspection of Objects Using Optical Holographic Interferometer |
NO19995311 | 1999-10-29 | ||
NO20002724A NO20002724L (en) | 1999-10-29 | 2000-05-26 | Method and equipment for non-destructive inspection of objects based on halographic interferometry |
NO20002724 | 2000-05-26 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2001031286A2 true WO2001031286A2 (en) | 2001-05-03 |
WO2001031286A3 WO2001031286A3 (en) | 2001-11-01 |
Family
ID=26649009
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/NO2000/000346 WO2001031286A2 (en) | 1999-10-29 | 2000-10-18 | Method and device for non-destructive inspection of objects by means of optical holographic interferometry |
Country Status (7)
Country | Link |
---|---|
EP (1) | EP1226402A2 (en) |
JP (1) | JP4757421B2 (en) |
CN (1) | CN1192207C (en) |
AU (1) | AU1311901A (en) |
NO (1) | NO20002724L (en) |
RU (1) | RU2002113769A (en) |
WO (1) | WO2001031286A2 (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002035180A1 (en) * | 2000-10-25 | 2002-05-02 | Holotech As | Method and device for non-destructive real-time measurements of residual stresses in planar and non-planar objects |
US9810683B2 (en) | 2009-05-06 | 2017-11-07 | The Regents Of The University Of California | Use of live cell inteferometry with reflective floor of observation chamber to determine changes in mass of mammalian cells |
US10203331B2 (en) | 2011-08-02 | 2019-02-12 | The Regents Of The University Of California | Single cell drug response measurements via live cell interferometry |
US10900956B2 (en) | 2013-05-24 | 2021-01-26 | The Regents Of The University Of California | Selecting and isolating desirable t lymphocytes by change in mass responses |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9116504B2 (en) * | 2010-09-07 | 2015-08-25 | Dai Nippon Printing Co., Ltd. | Scanner device and device for measuring three-dimensional shape of object |
RU2475725C1 (en) * | 2011-09-14 | 2013-02-20 | Общество С Ограниченной Ответственностью Инженерно-Технологический Центр "Сварка" | Method for nondestructive rapid inspection of weld joints and apparatus for realising said method |
CN102519976A (en) * | 2011-12-26 | 2012-06-27 | 上海大学 | Digital holographic detection device for subsurface defect of optical element |
CN105607452B (en) * | 2016-01-04 | 2019-01-15 | 中国海洋大学 | Measure the Double-number holographic imaging apparatus of suspended particulate settling velocity |
CN109374646A (en) * | 2018-09-26 | 2019-02-22 | 上海海事大学 | A kind of CRACKED BEAM detection method based on laser holography |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4798466A (en) | 1986-01-20 | 1989-01-17 | Aerospatiale Societe Nationale Industrielle | Device for the non-destructive inspection of a part by means of optical holography |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58106406A (en) * | 1981-12-21 | 1983-06-24 | Sumitomo Electric Ind Ltd | Optical sensor |
FR2543299B1 (en) * | 1983-03-21 | 1985-11-15 | Daeden Jean Pierre | HOLOGRAPHIC NON-DESTRUCTIVE CONTROL SYSTEM |
DE3516538A1 (en) * | 1985-05-08 | 1986-11-13 | Fa. Carl Zeiss, 7920 Heidenheim | METHOD AND DEVICE FOR OPTICAL VOLTAGE MEASUREMENT |
JPH05157514A (en) * | 1991-12-06 | 1993-06-22 | Mitsubishi Electric Corp | Measuring apparatus of minute deformation |
JP2554996B2 (en) * | 1993-01-19 | 1996-11-20 | 株式会社ヒューテック | Non-destructive inspection of mechanical behavior of a loaded object, its determination method and its apparatus |
US5680212A (en) * | 1996-04-15 | 1997-10-21 | National Research Council Of Canada | Sensitive and fast response optical detection of transient motion from a scattering surface by two-wave mixing |
-
2000
- 2000-05-26 NO NO20002724A patent/NO20002724L/en unknown
- 2000-10-18 CN CN 00818014 patent/CN1192207C/en not_active Expired - Fee Related
- 2000-10-18 EP EP00975011A patent/EP1226402A2/en not_active Withdrawn
- 2000-10-18 RU RU2002113769/28A patent/RU2002113769A/en unknown
- 2000-10-18 WO PCT/NO2000/000346 patent/WO2001031286A2/en active Application Filing
- 2000-10-18 JP JP2001533383A patent/JP4757421B2/en not_active Expired - Fee Related
- 2000-10-18 AU AU13119/01A patent/AU1311901A/en not_active Abandoned
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4798466A (en) | 1986-01-20 | 1989-01-17 | Aerospatiale Societe Nationale Industrielle | Device for the non-destructive inspection of a part by means of optical holography |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002035180A1 (en) * | 2000-10-25 | 2002-05-02 | Holotech As | Method and device for non-destructive real-time measurements of residual stresses in planar and non-planar objects |
US6765677B1 (en) | 2000-10-25 | 2004-07-20 | Holotech A.S. | Method and device for non-destructive real-time measurements of residual stresses in planar and non-planar objects |
US9810683B2 (en) | 2009-05-06 | 2017-11-07 | The Regents Of The University Of California | Use of live cell inteferometry with reflective floor of observation chamber to determine changes in mass of mammalian cells |
US10802012B2 (en) | 2009-05-06 | 2020-10-13 | The Regents Of The University Of California | Optical cytometry to determine cell mass changes in response to a biologically active agent |
US10203331B2 (en) | 2011-08-02 | 2019-02-12 | The Regents Of The University Of California | Single cell drug response measurements via live cell interferometry |
US10900956B2 (en) | 2013-05-24 | 2021-01-26 | The Regents Of The University Of California | Selecting and isolating desirable t lymphocytes by change in mass responses |
Also Published As
Publication number | Publication date |
---|---|
NO20002724L (en) | 2001-04-30 |
RU2002113769A (en) | 2004-01-27 |
AU1311901A (en) | 2001-05-08 |
JP2003513232A (en) | 2003-04-08 |
CN1192207C (en) | 2005-03-09 |
EP1226402A2 (en) | 2002-07-31 |
NO20002724D0 (en) | 2000-05-26 |
JP4757421B2 (en) | 2011-08-24 |
WO2001031286A3 (en) | 2001-11-01 |
CN1415067A (en) | 2003-04-30 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Steinzig et al. | Residual stress measurement using the hole drilling method and laser speckle interferometry: part 1 | |
Yang et al. | Precision measurement and nondestructive testing by means of digital phase shifting speckle pattern and speckle pattern shearing interferometry | |
US20080123079A1 (en) | Residual stress measuring method and system | |
WO2001031286A2 (en) | Method and device for non-destructive inspection of objects by means of optical holographic interferometry | |
Sirohi | Shearography and its applications–a chronological review | |
WO2004072629A1 (en) | System and method for inspection of silicon wafers | |
Steinchen et al. | Application of shearography to quality assurance | |
US6522409B1 (en) | Method and device for non-destructive inspection of objects by means of optical holographic interferometry | |
Ferraro et al. | Controlling images parameters in the reconstruction process of digital holograms | |
Neumann et al. | Off-table holography: A technique that permits the practice of holography in a vibration environment | |
JP2003098040A (en) | Optical system evaluation device and method | |
Barrientos et al. | Measurement of out-of-plane deformation by combination of speckle photography and speckle shearing interferometry | |
Baldi | Using optical interferometry to restart the ring-core method | |
US6765677B1 (en) | Method and device for non-destructive real-time measurements of residual stresses in planar and non-planar objects | |
Nistea et al. | Experimental analysis of failure in embedded electronics and mechatronical systems under thermal stress | |
Dudderar et al. | Potential applications of fiber optics and image processing in industrial holo-interferometry | |
Trentadue et al. | Thermomechanical Behaviour of a PWB by Speckle Interferometry Technique | |
Kujawinska et al. | New trends in instrumentation and application of automated grating interferometry | |
Yamaguchi | Measurement and testing by digital speckle correlation | |
Casavola et al. | ESPI analysis of thermo-mechanical behavior of electronic components | |
Gilbert et al. | Displacement analysis of the interior walls of a pipe using panoramic holointerferometry | |
Sirohi et al. | Shear ESPI with small objects | |
Ek et al. | Real Time Study Of Vibrations By Means Of An Instrument Recording Time-Average Holograms On A TV-Vidicon | |
Kruschke et al. | Three-dimensional (3D) displacement measurement by a holographic interferometric microscope | |
Pan et al. | Dynamic measurement of 3D displacements using dual-camera lensless Fourier transform digital holography |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AK | Designated states |
Kind code of ref document: A2 Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BY BZ CA CH CN CR CU CZ DE DK DM DZ EE ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NO NZ PL PT RO RU SD SE SG SI SK SL TJ TM TR TT TZ UA UG UZ VN YU ZA ZW |
|
AL | Designated countries for regional patents |
Kind code of ref document: A2 Designated state(s): GH GM KE LS MW MZ SD SL SZ TZ UG ZW AM AZ BY KG KZ MD RU TJ TM AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE BF BJ CF CG CI CM GA GN GW ML MR NE SN TD TG |
|
121 | Ep: the epo has been informed by wipo that ep was designated in this application | ||
DFPE | Request for preliminary examination filed prior to expiration of 19th month from priority date (pct application filed before 20040101) | ||
AK | Designated states |
Kind code of ref document: A3 Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BY BZ CA CH CN CR CU CZ DE DK DM DZ EE ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NO NZ PL PT RO RU SD SE SG SI SK SL TJ TM TR TT TZ UA UG UZ VN YU ZA ZW |
|
AL | Designated countries for regional patents |
Kind code of ref document: A3 Designated state(s): GH GM KE LS MW MZ SD SL SZ TZ UG ZW AM AZ BY KG KZ MD RU TJ TM AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE BF BJ CF CG CI CM GA GN GW ML MR NE SN TD TG |
|
ENP | Entry into the national phase in: |
Ref country code: JP Ref document number: 2001 533383 Kind code of ref document: A Format of ref document f/p: F |
|
WWE | Wipo information: entry into national phase |
Ref document number: 2000975011 Country of ref document: EP |
|
ENP | Entry into the national phase in: |
Ref country code: RU Ref document number: 2002 2002113769 Kind code of ref document: A Format of ref document f/p: F |
|
WWE | Wipo information: entry into national phase |
Ref document number: 008180148 Country of ref document: CN |
|
WWP | Wipo information: published in national office |
Ref document number: 2000975011 Country of ref document: EP |
|
REG | Reference to national code |
Ref country code: DE Ref legal event code: 8642 |