NO20002724L - Method and equipment for non-destructive inspection of objects based on halographic interferometry - Google Patents

Method and equipment for non-destructive inspection of objects based on halographic interferometry

Info

Publication number
NO20002724L
NO20002724L NO20002724A NO20002724A NO20002724L NO 20002724 L NO20002724 L NO 20002724L NO 20002724 A NO20002724 A NO 20002724A NO 20002724 A NO20002724 A NO 20002724A NO 20002724 L NO20002724 L NO 20002724L
Authority
NO
Norway
Prior art keywords
halographic
interferometry
equipment
objects based
destructive inspection
Prior art date
Application number
NO20002724A
Other languages
Norwegian (no)
Other versions
NO20002724D0 (en
Inventor
John Petter Fjeldstad
Irina Evgenievna Fjeldstad
Leonid Michailovich Lobanov
Vjacheslav Avtonomovi Pivtorak
Nikolay Georgievich Kuvshinsky
Galina Ivanovna Tkachuk
Vladimir Petrovich Kushniruk
Valeriy Aleksandrovich Pavlov
Nikolay Aleksandrovi Davidenko
Peter Dmitrievich Krotenko
Original Assignee
Holo Tech As
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from NO995311A external-priority patent/NO995311D0/en
Application filed by Holo Tech As filed Critical Holo Tech As
Priority to NO20002724A priority Critical patent/NO20002724L/en
Publication of NO20002724D0 publication Critical patent/NO20002724D0/en
Priority to EP00975011A priority patent/EP1226402A2/en
Priority to CN 00818014 priority patent/CN1192207C/en
Priority to AU13119/01A priority patent/AU1311901A/en
Priority to PCT/NO2000/000346 priority patent/WO2001031286A2/en
Priority to JP2001533383A priority patent/JP4757421B2/en
Priority to RU2002113769/28A priority patent/RU2002113769A/en
Publication of NO20002724L publication Critical patent/NO20002724L/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/16Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/161Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
    • G01B11/164Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means by holographic interferometry

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Holo Graphy (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
NO20002724A 1999-10-29 2000-05-26 Method and equipment for non-destructive inspection of objects based on halographic interferometry NO20002724L (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
NO20002724A NO20002724L (en) 1999-10-29 2000-05-26 Method and equipment for non-destructive inspection of objects based on halographic interferometry
EP00975011A EP1226402A2 (en) 1999-10-29 2000-10-18 Method and device for non-destructive inspection of objects by means of optical holographic interferometry
CN 00818014 CN1192207C (en) 1999-10-29 2000-10-18 Method and device for non-destructive inspection of objects by means of optical holographic interferometry measurement technology
AU13119/01A AU1311901A (en) 1999-10-29 2000-10-18 Method and device for non-destructive inspection of objects by means of optical holographic interferometry
PCT/NO2000/000346 WO2001031286A2 (en) 1999-10-29 2000-10-18 Method and device for non-destructive inspection of objects by means of optical holographic interferometry
JP2001533383A JP4757421B2 (en) 1999-10-29 2000-10-18 Method and apparatus for nondestructive inspection of objects by optical holographic interferometry
RU2002113769/28A RU2002113769A (en) 1999-10-29 2000-10-18 Method and device for non-destructive testing of objects by means of optical holographic interferometry

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NO995311A NO995311D0 (en) 1999-10-29 1999-10-29 Method and Device for Non-Destructive Inspection of Objects Using Optical Holographic Interferometer
NO20002724A NO20002724L (en) 1999-10-29 2000-05-26 Method and equipment for non-destructive inspection of objects based on halographic interferometry

Publications (2)

Publication Number Publication Date
NO20002724D0 NO20002724D0 (en) 2000-05-26
NO20002724L true NO20002724L (en) 2001-04-30

Family

ID=26649009

Family Applications (1)

Application Number Title Priority Date Filing Date
NO20002724A NO20002724L (en) 1999-10-29 2000-05-26 Method and equipment for non-destructive inspection of objects based on halographic interferometry

Country Status (7)

Country Link
EP (1) EP1226402A2 (en)
JP (1) JP4757421B2 (en)
CN (1) CN1192207C (en)
AU (1) AU1311901A (en)
NO (1) NO20002724L (en)
RU (1) RU2002113769A (en)
WO (1) WO2001031286A2 (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NO20005376L (en) 2000-10-25 2002-04-26 Holo Tech As Method and apparatus for non-destructive measurements of intrinsic stresses in plane and non-plane objects
US8599383B2 (en) 2009-05-06 2013-12-03 The Regents Of The University Of California Optical cytometry
EP3064895B1 (en) * 2010-09-07 2020-04-15 Dai Nippon Printing Co., Ltd. Linear illumination device
JP6144679B2 (en) 2011-08-02 2017-06-07 ザ リージェンツ オブ ザ ユニバーシティ オブ カリフォルニア Rapid massively parallel single-cell drug response measurement via live cell interferometry
RU2475725C1 (en) * 2011-09-14 2013-02-20 Общество С Ограниченной Ответственностью Инженерно-Технологический Центр "Сварка" Method for nondestructive rapid inspection of weld joints and apparatus for realising said method
CN102519976A (en) * 2011-12-26 2012-06-27 上海大学 Digital holographic detection device for subsurface defect of optical element
CN105229162B (en) 2013-05-24 2019-04-19 加利福尼亚大学董事会 Pass through T lymphocyte needed for mass-basis response variation identification
CN105607452B (en) * 2016-01-04 2019-01-15 中国海洋大学 Measure the Double-number holographic imaging apparatus of suspended particulate settling velocity
CN109374646A (en) * 2018-09-26 2019-02-22 上海海事大学 A kind of CRACKED BEAM detection method based on laser holography

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58106406A (en) * 1981-12-21 1983-06-24 Sumitomo Electric Ind Ltd Optical sensor
FR2543299B1 (en) * 1983-03-21 1985-11-15 Daeden Jean Pierre HOLOGRAPHIC NON-DESTRUCTIVE CONTROL SYSTEM
DE3516538A1 (en) * 1985-05-08 1986-11-13 Fa. Carl Zeiss, 7920 Heidenheim METHOD AND DEVICE FOR OPTICAL VOLTAGE MEASUREMENT
FR2593288B1 (en) 1986-01-20 1989-09-01 Aerospatiale DEVICE FOR NON-DESTRUCTIVE CHECKING OF A PART BY OPTICAL HOLOGRAPHY
JPH05157514A (en) * 1991-12-06 1993-06-22 Mitsubishi Electric Corp Measuring apparatus of minute deformation
JP2554996B2 (en) * 1993-01-19 1996-11-20 株式会社ヒューテック Non-destructive inspection of mechanical behavior of a loaded object, its determination method and its apparatus
US5680212A (en) * 1996-04-15 1997-10-21 National Research Council Of Canada Sensitive and fast response optical detection of transient motion from a scattering surface by two-wave mixing

Also Published As

Publication number Publication date
CN1192207C (en) 2005-03-09
CN1415067A (en) 2003-04-30
RU2002113769A (en) 2004-01-27
JP4757421B2 (en) 2011-08-24
WO2001031286A3 (en) 2001-11-01
WO2001031286A2 (en) 2001-05-03
NO20002724D0 (en) 2000-05-26
EP1226402A2 (en) 2002-07-31
JP2003513232A (en) 2003-04-08
AU1311901A (en) 2001-05-08

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