WO2000070385A3 - Hochauflösendes videomikroskop zur ausmessung extrahierter proben von partikelsuspensionen mit eingeprägter mechanischer probenschwingung - Google Patents

Hochauflösendes videomikroskop zur ausmessung extrahierter proben von partikelsuspensionen mit eingeprägter mechanischer probenschwingung Download PDF

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Publication number
WO2000070385A3
WO2000070385A3 PCT/DE2000/001466 DE0001466W WO0070385A3 WO 2000070385 A3 WO2000070385 A3 WO 2000070385A3 DE 0001466 W DE0001466 W DE 0001466W WO 0070385 A3 WO0070385 A3 WO 0070385A3
Authority
WO
WIPO (PCT)
Prior art keywords
resolution video
video microscope
particle suspensions
extracted samples
sample oscillation
Prior art date
Application number
PCT/DE2000/001466
Other languages
English (en)
French (fr)
Other versions
WO2000070385A2 (de
Inventor
Hajo Suhr
Original Assignee
Karl Voelker Stiftung An Der F
Hajo Suhr
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Karl Voelker Stiftung An Der F, Hajo Suhr filed Critical Karl Voelker Stiftung An Der F
Priority to JP2000618767A priority Critical patent/JP2002544560A/ja
Priority to EP00941913A priority patent/EP1177472A2/de
Publication of WO2000070385A2 publication Critical patent/WO2000070385A2/de
Publication of WO2000070385A3 publication Critical patent/WO2000070385A3/de

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/361—Optical details, e.g. image relay to the camera or image sensor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means, e.g. by light scattering, diffraction, holography or imaging
    • G01N15/0227—Investigating particle size or size distribution by optical means, e.g. by light scattering, diffraction, holography or imaging using imaging, e.g. a projected image of suspension; using holography
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes

Abstract

Zur Ausmessung extrahierter Proben von Partikelsuspensionen dient ein hochauflösendes Videomikroskop. Die Probe wird in Strömungsunruhe versetzt, und es werden mit extrem kurzer Belichtungszeit Bilder von der Probe aufgenommen.
PCT/DE2000/001466 1999-05-13 2000-05-11 Hochauflösendes videomikroskop zur ausmessung extrahierter proben von partikelsuspensionen mit eingeprägter mechanischer probenschwingung WO2000070385A2 (de)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2000618767A JP2002544560A (ja) 1999-05-13 2000-05-11 機械的にサンプルに振動を加えながら固体粒子サスペンションの抽出されたサンプルを測定するための高い分解能のビデオ顕微鏡
EP00941913A EP1177472A2 (de) 1999-05-13 2000-05-11 Hochauflösendes videomikroskop zur ausmessung extrahierter proben von partikelsuspensionen mit eingeprägter mechanischer probenschwingung

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19923074.9 1999-05-13
DE1999123074 DE19923074A1 (de) 1999-05-13 1999-05-13 Hochauflösendes Videomikroskop zur Ausmessung extrahierter Proben von Partikelsuspensionen mit eingeprägter mechanischer Probenschwingung

Publications (2)

Publication Number Publication Date
WO2000070385A2 WO2000070385A2 (de) 2000-11-23
WO2000070385A3 true WO2000070385A3 (de) 2001-04-19

Family

ID=7908570

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/DE2000/001466 WO2000070385A2 (de) 1999-05-13 2000-05-11 Hochauflösendes videomikroskop zur ausmessung extrahierter proben von partikelsuspensionen mit eingeprägter mechanischer probenschwingung

Country Status (4)

Country Link
EP (1) EP1177472A2 (de)
JP (1) JP2002544560A (de)
DE (1) DE19923074A1 (de)
WO (1) WO2000070385A2 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
UA95069C2 (ru) * 2005-02-17 2011-07-11 Сингента Партисипейшнс Аг Устройство и способ подсчета и измерения затрат семян
WO2008088249A1 (en) * 2007-01-17 2008-07-24 Hemocue Ab Apparatus for determining positions of objects contained in a sample
JP6134402B1 (ja) 2016-01-29 2017-05-24 シスメックス株式会社 生体試料撮像装置及び生体試料撮像方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4283128A (en) * 1980-06-23 1981-08-11 The United States Of America As Represented By The Administrator Of The U.S. Environmental Protection Agency Photomicrographic system for flowing fluids
DE9101082U1 (de) * 1990-02-05 1991-04-18 Kempe, Eberhard, Dipl.-Ing., 1000 Berlin, De
DE4032002A1 (de) * 1989-10-11 1991-06-06 Abb Patent Gmbh In situ mikroskopsonde und messverfahren
WO1997004347A1 (en) * 1995-07-19 1997-02-06 Morphometrix Technologies Inc. Automated scanning of microscope slides

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4283128A (en) * 1980-06-23 1981-08-11 The United States Of America As Represented By The Administrator Of The U.S. Environmental Protection Agency Photomicrographic system for flowing fluids
DE4032002A1 (de) * 1989-10-11 1991-06-06 Abb Patent Gmbh In situ mikroskopsonde und messverfahren
DE9101082U1 (de) * 1990-02-05 1991-04-18 Kempe, Eberhard, Dipl.-Ing., 1000 Berlin, De
WO1997004347A1 (en) * 1995-07-19 1997-02-06 Morphometrix Technologies Inc. Automated scanning of microscope slides

Also Published As

Publication number Publication date
JP2002544560A (ja) 2002-12-24
DE19923074A1 (de) 2000-11-16
WO2000070385A2 (de) 2000-11-23
EP1177472A2 (de) 2002-02-06

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