WO2000033039A1 - Uv-vis spectrophotometry - Google Patents
Uv-vis spectrophotometry Download PDFInfo
- Publication number
- WO2000033039A1 WO2000033039A1 PCT/AU1999/001021 AU9901021W WO0033039A1 WO 2000033039 A1 WO2000033039 A1 WO 2000033039A1 AU 9901021 W AU9901021 W AU 9901021W WO 0033039 A1 WO0033039 A1 WO 0033039A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- light
- slit
- variable
- source
- spectrophotometer
- Prior art date
Links
- 238000000870 ultraviolet spectroscopy Methods 0.000 title claims description 6
- 229910052724 xenon Inorganic materials 0.000 claims abstract description 30
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 claims abstract description 30
- 230000003287 optical effect Effects 0.000 claims description 23
- 239000007787 solid Substances 0.000 claims description 19
- 238000005259 measurement Methods 0.000 claims description 16
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical group [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 15
- 239000003990 capacitor Substances 0.000 claims description 15
- 229910052710 silicon Inorganic materials 0.000 claims description 14
- 239000010703 silicon Substances 0.000 claims description 14
- 238000000034 method Methods 0.000 claims description 9
- 230000003993 interaction Effects 0.000 claims description 4
- 238000004611 spectroscopical analysis Methods 0.000 claims description 2
- 230000003595 spectral effect Effects 0.000 abstract description 7
- 230000008901 benefit Effects 0.000 description 6
- 206010034972 Photosensitivity reaction Diseases 0.000 description 5
- 230000008859 change Effects 0.000 description 5
- 230000036211 photosensitivity Effects 0.000 description 5
- 238000007792 addition Methods 0.000 description 2
- 238000013480 data collection Methods 0.000 description 2
- 230000001419 dependent effect Effects 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000020169 heat generation Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
- YZCKVEUIGOORGS-OUBTZVSYSA-N Deuterium Chemical compound [2H] YZCKVEUIGOORGS-OUBTZVSYSA-N 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- 238000004566 IR spectroscopy Methods 0.000 description 1
- 238000002835 absorbance Methods 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 229910052805 deuterium Inorganic materials 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000003574 free electron Substances 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 230000000977 initiatory effect Effects 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- XCAUINMIESBTBL-UHFFFAOYSA-N lead(ii) sulfide Chemical compound [Pb]=S XCAUINMIESBTBL-UHFFFAOYSA-N 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000007670 refining Methods 0.000 description 1
- 238000009877 rendering Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/04—Slit arrangements slit adjustment
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
Definitions
- This invention relates to ultraviolet/visible/infrared spectroscopy (UV-
- VIS VIS
- a spectrophotometer which offers variable spectral resolution (variable slit bandwidth) in combination with the use of a pulsed light source, for example a xenon flash tube, and solid state detectors.
- a pulsed light source for example a xenon flash tube, and solid state detectors.
- the invention will be described in relation to the use of a xenon flash tube, but it is to be understood other pulsed light sources having similar characteristics may be used.
- Solid state photosensitive devices typically silicon have several advantages as optical detectors for UV-VIS over the more traditional photomultiplier (PM) tubes. Considering specifically the case of silicon -
- the useable wavelength range is 190-1100nm compared to 190-900nm for photomultiplier (PM) tubes.
- the conversion efficiency of photons to free electrons (photosensitivity) is higher for silicon than for PM tubes and may be, for example, as high as 600 milliamps per watt compared to photomultiplier efficiencies typically peaking at 40 miliiamps per watt. This leads to lower system noise levels.
- Silicon detectors exhibit very uniform photosensitivity over their surface. By contrast the photosensitivity of PM tubes varies significantly at different points on the photosensitive cathode.
- solid state detectors are not limited to silicon. Germanium, Gallium Arsenide, Lead Sulphide and many other solid state detectors also exist and much of the above also applies to these devices. These alternative detectors typically cover other wavelength ranges. None the less, silicon is the most commonly used and this invention will be described in terms of this detector type, however it is to be understood that the invention is not limited to the use of a silicon solid state detector.
- Xenon flash lamps also have many advantages over conventional continuous emission light sources. • Optical emission covers the entire wavelength range from below 190nm to above 1100nm eliminating the need for two or more light sources plus the attendant optical switching means.
- the xenon light source is far more efficient at converting electrical power into light allowing a significant reduction in power input and heat generation.
- a quartz halogen light plus deuterium arc lamp combination typically used in conventional UV-VIS instruments together with power supplies typically consumes up to 120 watts of electrical power. Essentially all of this ends up as heat which has to be removed from the instrument.
- a xenon flash lamp typically consumes less than 10 watts peak and appropriate system design techniques can reduce the average power consumption even lower (to below 1 watt). Not only does this reduce heat generation, it also makes portable or battery operation feasible.
- the xenon flash lamp emits light in a discontinuous fashion compared to the continuous emission of conventional sources it eliminates the need for optical interrupters or choppers simplifying the mechanical construction of the instrument. • Because the xenon emission is in the form of a very short (typically less than 10 microseconds) and very intense light pulse it allows room light compensation to be made very close in time to the light measurement thus improving the accuracy of such compensation and rendering the instrument substantially less sensitive to room light ingress (typically up to 10,000 times less sensitive).
- Xenon flash lamps have substantially longer life than conventional sources. Depending on the system design, this can be up to 40-80 times as long which substantially adds to overall instrument reliability.
- xenon flash light sources have a substantial disadvantage over conventional light sources. This is that the position and intensity of the arc varies from flash to flash, which has the effect of substantially varying the received optical intensity flash to flash. This variation is effectively optical noise and one technique for overcoming this noise, disclosed in International Application No. PCT/AU97/00603, involves splitting the optical beam into two parts, passing one part through the sample (giving a sample beam), bypassing the sample with the other part (giving a reference beam), simultaneously measuring both the sample and reference beams and ratioing them.
- xenon flash lamps Another problem with xenon flash lamps is that the spatial intensity distribution within the beam also varies. To avoid the effects of this, all parts of the incident beam need to be uniformly split into the sample and reference beams (for example, a split of the left half of the incident beam to the sample and the right half to reference would be unacceptable). It is also necessary that the detectors which are used have uniform photosensitivity over their optical surface. This need for uniform photosensitivity can be met by using solid state (silicon) detectors in place of PM tubes.
- An object of the present invention is to provide a UV-VIS instrument which utilizes a pulsed light source and solid state detectors and which allows variable spectral resolution.
- a spectrophotometer for UV-VIS spectroscopy including: a pulsed light source for emitting bursts of light, an optical system for directing a beam of each said burst of light to a sample to be analysed, the optical system including a monochromator for selecting the wavelength of said beam, and having a variable slit size, a solid state detector for detecting the intensity of light after interaction of said beam with said sample, and a variable source of electrical power connected to the pulsed light source for varying the energy of each burst of light emitted by the light source for controlling the dynamic measurement range of the spectrophotometer.
- the pulsed light source is a xenon based flash lamp.
- the light energy of the source per flash (that is, per burst of light from the lamp) can be manipulated to control the dynamic measurement range of the spectrophotometer in the sense that the actual dynamic range that is presented to the detector for measurement is reduced.
- the light energy is varied in dependence on either or both the wavelength or slit settings which are chosen for a measurement.
- This aspect of the invention also provides a method of conducting spectroscopic analysis of a sample including the steps of: generating bursts of light by a pulsed light source, directing a light beam generated by each burst through the entrance slit of a variable slit bandwidth monochromator to the sample to be analysed, measuring the intensity of said light beam after it has interacted with said sample using a solid state detector, and varying the energy of each burst of light by the pulsed light source to control the dynamic measurement range at the detector.
- the pulsed light source is a xenon based flash lamp.
- the light energy emitted by a xenon lamp depends on the electrical power input which is usually derived from charge stored on a capacitor. This charge is dumped into the lamp to generate a flash by a trigger pulse.
- the charge stored on a capacitor depends on the capacity of the capacitor (C) and the voltage (V) applied thereto and the invention encompasses changing either C or V or both to vary the light energy emitted by the xenon lamp.
- C the capacity of the capacitor
- V voltage
- the capacitance voltage may be changed. For example, one possibility is to vary the time for which the capacitor is charged from either a fixed current source or a fixed voltage source and series resistor. In the preferred embodiment the voltage is determined via a feedback loop setting the voltage in relation to a voltage reference output from a processor.
- the feedback loop operates through controlling the output of a DC:DC converter.
- Lower voltages will in general result in shorter charging times.
- This allows for increasing the flash rate as the energy per flash is reduced without requiring a larger charging supply or increasing the average dissipation of the lamp.
- Such an arrangement has the benefit of using regions of greater light throughput to increase data collection rate or reduce noise. It has the disadvantage of increasing the complexity of data collection timing.
- a second aspect of the invention is to vary the slit height when changing width.
- a spectrophotometer for UV-VIS spectroscopy including: a pulsed light source for emitting bursts of light, an optical system for directing a beam of each said burst of light to a sample to be analysed, the optical system including a monochromator for selecting the wavelength of said beam, and having a variable slit size, a solid state detector for detecting the intensity of light after interaction of said beam with said sample, and a source of electrical power connected to the pulsed light source for providing electrical energy for each burst of light emitted by the light source, wherein the slit size is variable by varying both the slit width and the slit height such that as width is increased, height is reduced, for controlling the dynamic measurement range of the spectrophotometer.
- an 8mm high slit offering 0.5nm spectral bandpass will have about the same light throughput as a 2mm high slit offering 1 nm bandpass.
- the pulsed light source is a xenon based flash lamp.
- FIG. 1 shows in functional block diagram form an arrangement of parts for an example UV-VIS instrument according to the invention.
- a UV-VIS instrument includes a xenon flash lamp 10 which is powered from a power supply 12.
- a flash which is also herein sometimes termed "a burst of light"
- light therefrom enters the instrument's optical system represented by block 16.
- this optical system includes a monochromator having a variable entrance slit and a variable exit slit, and a beam splitter for deriving a reference beam, represented by line 18, and a sample beam, represented by line 20, from a beam which exits the monochromator.
- the reference beam 20 is passed through a sample 22 and the residue thereof detected by a sample detector 24 from which an electrical measurement signal 26 is passed to a processor 32.
- the sample beam 18 passes to a reference detector 28 from which an electrical measurement signal 30 is passed to the processor 32.
- the sample and reference detectors 24 and 28 are solid state detectors, preferably of silicon.
- Processor 32 also provides wavelength and slit control signals, 34 and 36 respectively, to the optics 16, and an energy control signal 38 to the power supply 12 for the xenon lamp.
- the energy throughput of the monochromator is inversely proportional to the square of the slit setting (double the slit width increases light throughput 4 times). It also depends on the wavelength in a complex way dependent on the lamp emission profile, grating efficiency and detector efficiency. This means that energy compensation for changes in the slit setting can be readily computed and applied via control signal 38.
- a simple implementation may rely on only compensating for slit variation making no compensation for changes in throughput with wavelength. This would offer significant advantage over a fixed energy flash but not as much as compensating for both slit and wavelength.
- Adding compensation for wavelength can be achieved for example either via an approximate preprogrammed relationship (determined for example by experimental measurements on one or more units) or more accurately by measuring the variation in throughput with wavelength by a calibration scan, or a combination of the two techniques using a preprogrammed relationship as a starting point and refining it via a calibration scan.
- the processor 32 also controls a lamp trigger pulse signal 40 to the power supply 12 for initiating the dumping of the energy stored by supply 12 into lamp 10.
- the amount of light energy per flash that is passed into the optics 16 of the instrument is controlled by varying the light energy emitted by the xenon lamp 10 and this in turn is controlled by the wavelength and slit settings.
- the dynamic measurement range required of the instrument is controllable to within an acceptable range for the silicon detectors 24 and 28.
- a 250:1 change in lamp output can reduce the dynamic range from about 76000:1 to about 270:1.
- the variation in lamp energy is effectively a noise free change in system gain and achieves the same result as a change in photomultiplier tube gain via changing the EHT voltage.
- the power supply 12 may include a capacitor which is charged from a
- DC source via a DC/DC converter, which may be a flyback or other type of converter.
- a DC/DC converter By controlling a reference voltage input to such a converter, the final steady state output voltage of the converter and thus the charge on the capacitor is determinable on a flash-by-flash basis.
- the energy of each flash may be controlled. For example, varying the capacitor voltage between 200 volts and 1000 volts gives a 25:1 change in lamp flash energy.
- the power supply 12 may additionally include means to control the capacitance.
- Such control may involve using two or more capacitors in parallel and switching one or more of these into or out of the circuit with either a solid state or mechanical relay. For example, using 2 capacitors with a 9:1 ratio of capacitance and switching the larger achieves a 10:1 change in flash energy. This, used in conjunction with variation of charging voltage, gives an overall adjustment range of 250:1 within the time from one flash to the next.
- the maximum electrical input to xenon flash tubes is limited - typically to about 100-300 mJ.
- xenon tubes are usually run at near their maximum rated energy input, much of the increased dynamic range will be achieved by reducing the energy per flash rather than by increasing it. This means that it is also necessary to increase the overall system throughput to compensate.
- Such an increase may be achieved in a variety of ways such as: • use of higher slits (for example, a 0.75mm slit could be increased to 8mm).
- a further aspect of the invention which may be used to assist in alleviating the dynamic range problem is to use different slit heights for different slit widths.
- a 1.5 nm slit 0.75mm high has almost the same throughput as a 0.5nm slit 6.75mm high.
- This could be particularly applicable to an instrument which say used a tall narrow slit for high precision analysis using conventional cuvettes but a wider shorter slit for optical fibre work where poorer spectral resolution is often acceptable.
- this latter slit could be round instead of rectangular allowing optimal matching to optical fibres.
- the slit widths in optics 16 may be continuously variable for example from 0.2 to 4nm.
- a number of fixed width slits may be used. This may utilise a slit drive stepper motor driving a single etched slit disc incorporating all the slit apertures.
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Spectrometry And Color Measurement (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Abstract
Description
Claims
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP99959145A EP1137917A4 (en) | 1998-12-03 | 1999-12-02 | Uv-vis spectrophotometry |
AU16443/00A AU751519B2 (en) | 1998-12-03 | 1999-12-02 | UV-VIS spectrophotometry |
US09/856,660 US6559941B1 (en) | 1998-12-03 | 1999-12-02 | UV-VIS spectrophotometry |
JP2000585629A JP2002531819A (en) | 1998-12-03 | 1999-12-02 | UV-VIS spectrometry |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AUPP7483A AUPP748398A0 (en) | 1998-12-03 | 1998-12-03 | Uv-vis spectrophotometry |
AUPP7483 | 1998-12-03 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2000033039A1 true WO2000033039A1 (en) | 2000-06-08 |
Family
ID=3811692
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/AU1999/001021 WO2000033039A1 (en) | 1998-12-03 | 1999-12-02 | Uv-vis spectrophotometry |
Country Status (5)
Country | Link |
---|---|
US (1) | US6559941B1 (en) |
EP (1) | EP1137917A4 (en) |
JP (1) | JP2002531819A (en) |
AU (2) | AUPP748398A0 (en) |
WO (1) | WO2000033039A1 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2004025233A1 (en) * | 2002-09-13 | 2004-03-25 | Klein Medical Limited | Spectrophotometer |
FR2898083A1 (en) * | 2006-03-06 | 2007-09-07 | Peugeot Citroen Automobiles Sa | FUEL CIRCUIT OF A VEHICLE |
US8512279B2 (en) | 2005-11-29 | 2013-08-20 | Klein Medical Limited | Syringe |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
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JP4325109B2 (en) * | 2000-12-27 | 2009-09-02 | 株式会社島津製作所 | Spectrophotometer |
US20090270459A1 (en) * | 2001-09-03 | 2009-10-29 | Satoshi Tanabe | Flea control agent containing N-Substituted indole derivative |
EP1664742A4 (en) * | 2003-08-14 | 2010-05-05 | Microptix Technologies Llc | System and method for integrated sensing and control of industrial processes |
US7459713B2 (en) * | 2003-08-14 | 2008-12-02 | Microptix Technologies, Llc | Integrated sensing system approach for handheld spectral measurements having a disposable sample handling apparatus |
US7672342B2 (en) * | 2005-05-24 | 2010-03-02 | MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. | Method and radiation source for generating pulsed coherent radiation |
US20070034758A1 (en) * | 2005-05-24 | 2007-02-15 | Bates Edward K | Deck rail umbrella stand |
EP1955033A4 (en) * | 2005-11-30 | 2012-01-18 | Microptix Technologies Llc | An integrated sensing system approach for handheld spectral measurements |
US8808649B2 (en) | 2007-10-10 | 2014-08-19 | Pocared Diagnostics Ltd. | System for conducting the identification of bacteria in urine |
US8519358B2 (en) | 2008-02-05 | 2013-08-27 | Pocared Diagnostics Ltd. | System for conducting the identification of bacteria in biological samples |
US8309897B2 (en) | 2009-02-06 | 2012-11-13 | Pocared Diagnostics Ltd. | Optical measurement arrangement |
US10288632B2 (en) * | 2009-09-21 | 2019-05-14 | Pocared Diagnostics Ltd. | System for conducting the identification of bacteria in biological samples |
JP5296723B2 (en) * | 2010-02-18 | 2013-09-25 | 株式会社日立ハイテクノロジーズ | Spectrophotometer and performance measurement method thereof |
JP5796275B2 (en) * | 2010-06-02 | 2015-10-21 | セイコーエプソン株式会社 | Spectrometer |
US20110299085A1 (en) * | 2010-06-04 | 2011-12-08 | Solum, Inc. | Rapid Tissue Analysis Technique |
ES2366290B1 (en) * | 2010-10-20 | 2012-08-27 | Abengoa Solar New Technologies S.A. | SPECTROPHOTOMETER FOR AUTOMATIC OPTICAL CHARACTERIZATION OF SOLAR COLLECTOR TUBES AND OPERATING METHOD. |
US8804114B2 (en) | 2010-11-03 | 2014-08-12 | Pocared Diagnostics Ltd. | Optical cup |
CN104955957B (en) | 2012-12-11 | 2019-01-11 | 普凯尔德诊断技术有限公司 | optics cup with curved bottom |
TWI579553B (en) | 2013-11-24 | 2017-04-21 | 中央研究院 | Apparatus and method for high performance liquid chromatography with uv-visible detection |
WO2024058733A1 (en) | 2022-09-16 | 2024-03-21 | Haus Sps Makina Elektronik Bilisim Sanayi Ve Ticaret Anonim Sirketi | Device for measuring elemental and molecular properties with hybrid electromagnetic waves |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
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EP0242725A2 (en) * | 1986-04-23 | 1987-10-28 | Kollmorgen Instruments Corporation | Remote reading spectrophotometer |
WO1998012541A1 (en) * | 1996-09-16 | 1998-03-26 | Varian Australia Pty. Ltd. | Improved spectrophotometer |
EP0840101A1 (en) * | 1996-10-31 | 1998-05-06 | Ando Electric Co., Ltd. | Optical spectrum measuring apparatus |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3431054A (en) * | 1965-10-29 | 1969-03-04 | Bausch & Lomb | Monochromator device |
GB1285885A (en) * | 1968-11-07 | 1972-08-16 | Atomic Energy Authority Uk | Improvements in or relating to nephelometers |
US4565447A (en) * | 1983-11-21 | 1986-01-21 | Millipore Corporation | Photometric apparatus with multi-wavelength excitation |
US4669878A (en) * | 1984-06-29 | 1987-06-02 | American Monitor Corporation | Automatic monochromator-testing system |
IL95617A0 (en) * | 1990-09-09 | 1991-06-30 | Aviv Amirav | Pulsed flame detector method and apparatus |
-
1998
- 1998-12-03 AU AUPP7483A patent/AUPP748398A0/en not_active Abandoned
-
1999
- 1999-12-02 AU AU16443/00A patent/AU751519B2/en not_active Ceased
- 1999-12-02 US US09/856,660 patent/US6559941B1/en not_active Expired - Lifetime
- 1999-12-02 EP EP99959145A patent/EP1137917A4/en not_active Withdrawn
- 1999-12-02 WO PCT/AU1999/001021 patent/WO2000033039A1/en active IP Right Grant
- 1999-12-02 JP JP2000585629A patent/JP2002531819A/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
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EP0242725A2 (en) * | 1986-04-23 | 1987-10-28 | Kollmorgen Instruments Corporation | Remote reading spectrophotometer |
WO1998012541A1 (en) * | 1996-09-16 | 1998-03-26 | Varian Australia Pty. Ltd. | Improved spectrophotometer |
EP0840101A1 (en) * | 1996-10-31 | 1998-05-06 | Ando Electric Co., Ltd. | Optical spectrum measuring apparatus |
Non-Patent Citations (1)
Title |
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See also references of EP1137917A4 * |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2004025233A1 (en) * | 2002-09-13 | 2004-03-25 | Klein Medical Limited | Spectrophotometer |
US7460226B2 (en) | 2002-09-13 | 2008-12-02 | Klein Medical Limited | Spectrophotometer |
US8512279B2 (en) | 2005-11-29 | 2013-08-20 | Klein Medical Limited | Syringe |
FR2898083A1 (en) * | 2006-03-06 | 2007-09-07 | Peugeot Citroen Automobiles Sa | FUEL CIRCUIT OF A VEHICLE |
WO2007101960A3 (en) * | 2006-03-06 | 2008-11-13 | Peugeot Citroen Automobiles Sa | Device and method for identifying a fuel |
Also Published As
Publication number | Publication date |
---|---|
EP1137917A1 (en) | 2001-10-04 |
AU751519B2 (en) | 2002-08-15 |
EP1137917A4 (en) | 2005-04-13 |
AU1644300A (en) | 2000-06-19 |
JP2002531819A (en) | 2002-09-24 |
AUPP748398A0 (en) | 1998-12-24 |
US6559941B1 (en) | 2003-05-06 |
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