WO2000032835A8 - Electro-chemical deposition system - Google Patents
Electro-chemical deposition systemInfo
- Publication number
- WO2000032835A8 WO2000032835A8 PCT/US1999/028159 US9928159W WO0032835A8 WO 2000032835 A8 WO2000032835 A8 WO 2000032835A8 US 9928159 W US9928159 W US 9928159W WO 0032835 A8 WO0032835 A8 WO 0032835A8
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- electro
- mainframe
- chemical deposition
- deposition system
- disposed
- Prior art date
Links
- 238000004070 electrodeposition Methods 0.000 title abstract 6
- 239000011324 bead Substances 0.000 abstract 1
- 239000003792 electrolyte Substances 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
- C25D17/001—Apparatus specially adapted for electrolytic coating of wafers, e.g. semiconductors or solar cells
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
- C25D7/12—Semiconductors
- C25D7/123—Semiconductors first coated with a seed layer or a conductive layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/288—Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition
- H01L21/2885—Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition using an external electrical current, i.e. electro-deposition
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/24—Reinforcing the conductive pattern
- H05K3/241—Reinforcing the conductive pattern characterised by the electroplating method; means therefor, e.g. baths or apparatus
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Sustainable Development (AREA)
- Electroplating Methods And Accessories (AREA)
- Weting (AREA)
- Electrodes Of Semiconductors (AREA)
Abstract
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000585464A JP4766579B2 (en) | 1998-11-30 | 1999-11-29 | Electrochemical deposition equipment |
Applications Claiming Priority (8)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11020998P | 1998-11-30 | 1998-11-30 | |
US60/110,209 | 1998-11-30 | ||
US09/263,649 | 1999-03-05 | ||
US09/263,649 US6254760B1 (en) | 1999-03-05 | 1999-03-05 | Electro-chemical deposition system and method |
US09/289,074 US6258220B1 (en) | 1998-11-30 | 1999-04-08 | Electro-chemical deposition system |
US09/289,074 | 1999-04-08 | ||
US09/350,210 | 1999-07-09 | ||
US09/350,210 US6267853B1 (en) | 1999-07-09 | 1999-07-09 | Electro-chemical deposition system |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2000032835A2 WO2000032835A2 (en) | 2000-06-08 |
WO2000032835A8 true WO2000032835A8 (en) | 2000-08-17 |
Family
ID=27493736
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US1999/028159 WO2000032835A2 (en) | 1998-11-30 | 1999-11-29 | Electro-chemical deposition system |
Country Status (3)
Country | Link |
---|---|
JP (2) | JP4766579B2 (en) |
TW (1) | TW513751B (en) |
WO (1) | WO2000032835A2 (en) |
Families Citing this family (50)
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KR100586481B1 (en) | 1997-09-02 | 2006-11-30 | 가부시키가이샤 에바라 세이사꾸쇼 | How to Plate the Substrate |
WO1999054527A2 (en) | 1998-04-21 | 1999-10-28 | Applied Materials, Inc. | Electro-chemical deposition system and method of electroplating on substrates |
US6773560B2 (en) | 1998-07-10 | 2004-08-10 | Semitool, Inc. | Dry contact assemblies and plating machines with dry contact assemblies for plating microelectronic workpieces |
US7048841B2 (en) | 1998-12-07 | 2006-05-23 | Semitool, Inc. | Contact assemblies, methods for making contact assemblies, and plating machines with contact assemblies for plating microelectronic workpieces |
US6303010B1 (en) | 1999-07-12 | 2001-10-16 | Semitool, Inc. | Methods and apparatus for processing the surface of a microelectronic workpiece |
JP2003520898A (en) | 1998-07-10 | 2003-07-08 | セミトゥール・インコーポレイテッド | Method and apparatus for performing copper plating using chemical plating and electroplating |
US6258220B1 (en) | 1998-11-30 | 2001-07-10 | Applied Materials, Inc. | Electro-chemical deposition system |
US6645356B1 (en) | 1998-12-07 | 2003-11-11 | Semitool, Inc. | Methods and apparatus for processing the surface of a microelectronic workpiece |
US6309520B1 (en) | 1998-12-07 | 2001-10-30 | Semitool, Inc. | Methods and apparatus for processing the surface of a microelectronic workpiece |
TW483950B (en) | 1998-12-31 | 2002-04-21 | Semitool Inc | Method, chemistry, and apparatus for high deposition rate solder electroplating on a microelectronic workpiece |
EP1031647A3 (en) * | 1999-02-19 | 2002-03-06 | Solid State Equipment Corporation | Apparatus and method for plating a wafer |
US6582578B1 (en) * | 1999-04-08 | 2003-06-24 | Applied Materials, Inc. | Method and associated apparatus for tilting a substrate upon entry for metal deposition |
US6551488B1 (en) * | 1999-04-08 | 2003-04-22 | Applied Materials, Inc. | Segmenting of processing system into wet and dry areas |
US6585876B2 (en) | 1999-04-08 | 2003-07-01 | Applied Materials Inc. | Flow diffuser to be used in electro-chemical plating system and method |
US6837978B1 (en) * | 1999-04-08 | 2005-01-04 | Applied Materials, Inc. | Deposition uniformity control for electroplating apparatus, and associated method |
US6557237B1 (en) * | 1999-04-08 | 2003-05-06 | Applied Materials, Inc. | Removable modular cell for electro-chemical plating and method |
US7264698B2 (en) * | 1999-04-13 | 2007-09-04 | Semitool, Inc. | Apparatus and methods for electrochemical processing of microelectronic workpieces |
US6558518B1 (en) * | 1999-07-08 | 2003-05-06 | Ebara Corporation | Method and apparatus for plating substrate and plating facility |
JP4149620B2 (en) * | 1999-08-25 | 2008-09-10 | 株式会社荏原製作所 | Substrate copper plating method |
US20030213772A9 (en) * | 1999-07-09 | 2003-11-20 | Mok Yeuk-Fai Edwin | Integrated semiconductor substrate bevel cleaning apparatus and method |
US7645366B2 (en) | 1999-07-12 | 2010-01-12 | Semitool, Inc. | Microelectronic workpiece holders and contact assemblies for use therewith |
US6673216B2 (en) | 1999-08-31 | 2004-01-06 | Semitool, Inc. | Apparatus for providing electrical and fluid communication to a rotating microelectronic workpiece during electrochemical processing |
US6558478B1 (en) | 1999-10-06 | 2003-05-06 | Ebara Corporation | Method of and apparatus for cleaning substrate |
US6454927B1 (en) * | 2000-06-26 | 2002-09-24 | Applied Materials, Inc. | Apparatus and method for electro chemical deposition |
TW562878B (en) * | 2000-06-30 | 2003-11-21 | Ebara Corp | Copper-plating liquid, plating method and plating apparatus |
US6576110B2 (en) | 2000-07-07 | 2003-06-10 | Applied Materials, Inc. | Coated anode apparatus and associated method |
AT412043B (en) * | 2000-07-12 | 2004-08-26 | Ind Tech Res Inst | METHOD FOR CLEANING A WAFER WITH METALS ON THE BACK |
CN100469948C (en) * | 2000-10-03 | 2009-03-18 | 应用材料有限公司 | Method and associated apparatus for tilting a substrate upon entry for metal deposition |
JP2006339665A (en) * | 2000-10-12 | 2006-12-14 | Ebara Corp | Apparatus for manufacturing semiconductor substrate |
WO2002031227A2 (en) * | 2000-10-12 | 2002-04-18 | Applied Materials, Inc. | Deposition uniformity control for electroplating apparatus, and associated method |
US6569307B2 (en) * | 2000-10-20 | 2003-05-27 | The Boc Group, Inc. | Object plating method and system |
JP2002212786A (en) * | 2001-01-17 | 2002-07-31 | Ebara Corp | Substrate processor |
JP2002220692A (en) | 2001-01-24 | 2002-08-09 | Ebara Corp | Plating equipment and method |
US7189647B2 (en) | 2001-04-05 | 2007-03-13 | Novellus Systems, Inc. | Sequential station tool for wet processing of semiconductor wafers |
WO2003007274A1 (en) * | 2001-07-12 | 2003-01-23 | James Hambleton | Electro-chemical teaching unit |
US7247222B2 (en) * | 2002-07-24 | 2007-07-24 | Applied Materials, Inc. | Electrochemical processing cell |
JP4303484B2 (en) | 2003-01-21 | 2009-07-29 | 大日本スクリーン製造株式会社 | Plating equipment |
KR100518788B1 (en) * | 2003-03-11 | 2005-10-05 | 삼성전자주식회사 | Spin coating apparatus for coating photoresist |
JP4872199B2 (en) * | 2004-09-06 | 2012-02-08 | ルネサスエレクトロニクス株式会社 | Semiconductor manufacturing equipment |
KR100854373B1 (en) | 2006-12-29 | 2008-09-02 | 주식회사 포스코 | Acid cleaning solution sampling apparatus of the acid solution tank |
KR101590661B1 (en) * | 2010-09-13 | 2016-02-01 | 도쿄엘렉트론가부시키가이샤 | Liquid processing apparatus, liquid processing method and storage medium |
JP5321574B2 (en) * | 2010-12-17 | 2013-10-23 | ルネサスエレクトロニクス株式会社 | Method of operating semiconductor manufacturing apparatus and method of manufacturing semiconductor device |
CN105044370B (en) * | 2014-11-04 | 2017-03-08 | 长沙绿智电子科技有限公司 | A kind of unattended heavy metal-polluted water monitoring apparatus |
KR102342006B1 (en) * | 2016-03-04 | 2021-12-22 | 가부시키가이샤 에바라 세이사꾸쇼 | Plating apparatus and plating method |
JP6833557B2 (en) * | 2016-03-04 | 2021-02-24 | 株式会社荏原製作所 | Plating equipment and plating method |
GB201701166D0 (en) | 2017-01-24 | 2017-03-08 | Picofluidics Ltd | An apparatus for electrochemically processing semiconductor substrates |
EP3647467B1 (en) * | 2017-06-30 | 2022-04-06 | Showa Denko K.K. | Anode mounting member of fluorine electrolytic cell, fluorine electrolytic cell, and method for producing fluorine gas |
KR102373893B1 (en) * | 2018-03-13 | 2022-03-11 | 가부시키가이샤 야마모토메키시켄키 | Plating equipment and plating system |
CN110355025B (en) * | 2019-08-01 | 2020-11-27 | 宿迁市创盈知识产权服务有限公司 | Automobile spare and accessory part material nanometer modification equipment |
US11686208B2 (en) | 2020-02-06 | 2023-06-27 | Rolls-Royce Corporation | Abrasive coating for high-temperature mechanical systems |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4529353A (en) * | 1983-01-27 | 1985-07-16 | At&T Bell Laboratories | Wafer handling apparatus and method |
US4732785A (en) * | 1986-09-26 | 1988-03-22 | Motorola, Inc. | Edge bead removal process for spin on films |
JPS6410073A (en) * | 1987-07-01 | 1989-01-13 | Sanyo Electric Co | Decompression device |
JPS6410073U (en) * | 1987-07-03 | 1989-01-19 | ||
JPH0222499A (en) * | 1988-07-12 | 1990-01-25 | Yamaha Corp | Plating equipment |
US4981715A (en) * | 1989-08-10 | 1991-01-01 | Microelectronics And Computer Technology Corporation | Method of patterning electroless plated metal on a polymer substrate |
JPH03193899A (en) * | 1989-12-22 | 1991-08-23 | Ebara Yuujiraito Kk | Method for automatically controlling electrolytic solution |
JP2557146B2 (en) * | 1991-03-20 | 1996-11-27 | 日本エレクトロプレイテイング・エンジニヤース株式会社 | Automatic wafer plating equipment |
JP2888001B2 (en) * | 1992-01-09 | 1999-05-10 | 日本電気株式会社 | Metal plating equipment |
JPH05195296A (en) * | 1992-01-22 | 1993-08-03 | Nippon Hyomen Kagaku Kk | Automatic controlling device for electrolytic solution |
JPH06349952A (en) * | 1993-06-14 | 1994-12-22 | Oki Electric Ind Co Ltd | Wiring forming method |
JP2624200B2 (en) * | 1994-11-29 | 1997-06-25 | 日本電気株式会社 | Jet type electroplating apparatus and plating method |
US5807469A (en) * | 1995-09-27 | 1998-09-15 | Intel Corporation | Flexible continuous cathode contact circuit for electrolytic plating of C4, tab microbumps, and ultra large scale interconnects |
WO1998002907A1 (en) * | 1996-07-15 | 1998-01-22 | Semitool, Inc. | Control system for a semiconductor workpiece processing tool |
JP3583883B2 (en) * | 1997-01-24 | 2004-11-04 | 日本エレクトロプレイテイング・エンジニヤース株式会社 | Automatic wafer plating equipment |
US6188120B1 (en) * | 1997-02-24 | 2001-02-13 | International Business Machines Corporation | Method and materials for through-mask electroplating and selective base removal |
ATE488621T1 (en) * | 1997-04-04 | 2010-12-15 | Univ Southern California | GALVANIC PROCESS FOR PRODUCING A MULTI-LAYER STRUCTURE |
JP2003527477A (en) * | 1998-07-13 | 2003-09-16 | ディージェイ パーカー カンパニー、インク. ディー/ビー/エー パーカー システムズ | Regular chemical replenishment system |
-
1999
- 1999-11-29 WO PCT/US1999/028159 patent/WO2000032835A2/en active Application Filing
- 1999-11-29 JP JP2000585464A patent/JP4766579B2/en not_active Expired - Fee Related
-
2000
- 2000-02-25 TW TW88120799A patent/TW513751B/en not_active IP Right Cessation
-
2009
- 2009-09-16 JP JP2009214692A patent/JP2009293134A/en active Pending
Also Published As
Publication number | Publication date |
---|---|
JP2003528214A (en) | 2003-09-24 |
JP4766579B2 (en) | 2011-09-07 |
TW513751B (en) | 2002-12-11 |
JP2009293134A (en) | 2009-12-17 |
WO2000032835A2 (en) | 2000-06-08 |
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