WO2000032835A8 - Electro-chemical deposition system - Google Patents

Electro-chemical deposition system

Info

Publication number
WO2000032835A8
WO2000032835A8 PCT/US1999/028159 US9928159W WO0032835A8 WO 2000032835 A8 WO2000032835 A8 WO 2000032835A8 US 9928159 W US9928159 W US 9928159W WO 0032835 A8 WO0032835 A8 WO 0032835A8
Authority
WO
WIPO (PCT)
Prior art keywords
electro
mainframe
chemical deposition
deposition system
disposed
Prior art date
Application number
PCT/US1999/028159
Other languages
French (fr)
Other versions
WO2000032835A2 (en
Inventor
Yezdi Dordi
Donald J Olgado
Ratson Morad
Peter Hey
Mark Denome
Michael Sugarman
Mark Di Lloyd
Joe Stevens
Dan Marohl
Ho Seon Shin
Eugene Ravinovich
Robin Cheung
Ashok K Sinha
Avi Tepman
Dan Carl
George Birkmaier
Ben Shen
Original Assignee
Applied Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US09/263,649 external-priority patent/US6254760B1/en
Priority claimed from US09/289,074 external-priority patent/US6258220B1/en
Priority claimed from US09/350,210 external-priority patent/US6267853B1/en
Application filed by Applied Materials Inc filed Critical Applied Materials Inc
Priority to JP2000585464A priority Critical patent/JP4766579B2/en
Publication of WO2000032835A2 publication Critical patent/WO2000032835A2/en
Publication of WO2000032835A8 publication Critical patent/WO2000032835A8/en

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D17/00Constructional parts, or assemblies thereof, of cells for electrolytic coating
    • C25D17/001Apparatus specially adapted for electrolytic coating of wafers, e.g. semiconductors or solar cells
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D7/00Electroplating characterised by the article coated
    • C25D7/12Semiconductors
    • C25D7/123Semiconductors first coated with a seed layer or a conductive layer
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/28Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
    • H01L21/283Deposition of conductive or insulating materials for electrodes conducting electric current
    • H01L21/288Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition
    • H01L21/2885Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition using an external electrical current, i.e. electro-deposition
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/22Secondary treatment of printed circuits
    • H05K3/24Reinforcing the conductive pattern
    • H05K3/241Reinforcing the conductive pattern characterised by the electroplating method; means therefor, e.g. baths or apparatus

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Sustainable Development (AREA)
  • Electroplating Methods And Accessories (AREA)
  • Weting (AREA)
  • Electrodes Of Semiconductors (AREA)

Abstract

The present invention provides an electro-chemical deposition system that is designed with a flexible architecture that is expandable to accommodate future designs and gap fill requirements and provides satisfactory throughput to meet the demands of other processing systems. The electro-chemical deposition system generally comprises a mainframe having a mainframe wafer transfer robot, a loading station disposed in connection with the mainframe, one or more processing cells disposed in connection with the mainframe, and an electrolyte supply fluidly connected to the one or more electrical processing cells. Preferably, the electro-chemical deposition system includes an edge bead removal/spin-rinse-dry (EBR/SRD) station disposed on the mainframe adjacent the loading station, a rapid thermal anneal chamber attached to the loading station, a seed layer repair station disposed on the mainframe, and a system controller for controlling the electro-chemical deposition process and the components of the electro-chemical deposition system.
PCT/US1999/028159 1998-11-30 1999-11-29 Electro-chemical deposition system WO2000032835A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000585464A JP4766579B2 (en) 1998-11-30 1999-11-29 Electrochemical deposition equipment

Applications Claiming Priority (8)

Application Number Priority Date Filing Date Title
US11020998P 1998-11-30 1998-11-30
US60/110,209 1998-11-30
US09/263,649 1999-03-05
US09/263,649 US6254760B1 (en) 1999-03-05 1999-03-05 Electro-chemical deposition system and method
US09/289,074 US6258220B1 (en) 1998-11-30 1999-04-08 Electro-chemical deposition system
US09/289,074 1999-04-08
US09/350,210 1999-07-09
US09/350,210 US6267853B1 (en) 1999-07-09 1999-07-09 Electro-chemical deposition system

Publications (2)

Publication Number Publication Date
WO2000032835A2 WO2000032835A2 (en) 2000-06-08
WO2000032835A8 true WO2000032835A8 (en) 2000-08-17

Family

ID=27493736

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US1999/028159 WO2000032835A2 (en) 1998-11-30 1999-11-29 Electro-chemical deposition system

Country Status (3)

Country Link
JP (2) JP4766579B2 (en)
TW (1) TW513751B (en)
WO (1) WO2000032835A2 (en)

Families Citing this family (50)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100586481B1 (en) 1997-09-02 2006-11-30 가부시키가이샤 에바라 세이사꾸쇼 How to Plate the Substrate
WO1999054527A2 (en) 1998-04-21 1999-10-28 Applied Materials, Inc. Electro-chemical deposition system and method of electroplating on substrates
US6773560B2 (en) 1998-07-10 2004-08-10 Semitool, Inc. Dry contact assemblies and plating machines with dry contact assemblies for plating microelectronic workpieces
US7048841B2 (en) 1998-12-07 2006-05-23 Semitool, Inc. Contact assemblies, methods for making contact assemblies, and plating machines with contact assemblies for plating microelectronic workpieces
US6303010B1 (en) 1999-07-12 2001-10-16 Semitool, Inc. Methods and apparatus for processing the surface of a microelectronic workpiece
JP2003520898A (en) 1998-07-10 2003-07-08 セミトゥール・インコーポレイテッド Method and apparatus for performing copper plating using chemical plating and electroplating
US6258220B1 (en) 1998-11-30 2001-07-10 Applied Materials, Inc. Electro-chemical deposition system
US6645356B1 (en) 1998-12-07 2003-11-11 Semitool, Inc. Methods and apparatus for processing the surface of a microelectronic workpiece
US6309520B1 (en) 1998-12-07 2001-10-30 Semitool, Inc. Methods and apparatus for processing the surface of a microelectronic workpiece
TW483950B (en) 1998-12-31 2002-04-21 Semitool Inc Method, chemistry, and apparatus for high deposition rate solder electroplating on a microelectronic workpiece
EP1031647A3 (en) * 1999-02-19 2002-03-06 Solid State Equipment Corporation Apparatus and method for plating a wafer
US6582578B1 (en) * 1999-04-08 2003-06-24 Applied Materials, Inc. Method and associated apparatus for tilting a substrate upon entry for metal deposition
US6551488B1 (en) * 1999-04-08 2003-04-22 Applied Materials, Inc. Segmenting of processing system into wet and dry areas
US6585876B2 (en) 1999-04-08 2003-07-01 Applied Materials Inc. Flow diffuser to be used in electro-chemical plating system and method
US6837978B1 (en) * 1999-04-08 2005-01-04 Applied Materials, Inc. Deposition uniformity control for electroplating apparatus, and associated method
US6557237B1 (en) * 1999-04-08 2003-05-06 Applied Materials, Inc. Removable modular cell for electro-chemical plating and method
US7264698B2 (en) * 1999-04-13 2007-09-04 Semitool, Inc. Apparatus and methods for electrochemical processing of microelectronic workpieces
US6558518B1 (en) * 1999-07-08 2003-05-06 Ebara Corporation Method and apparatus for plating substrate and plating facility
JP4149620B2 (en) * 1999-08-25 2008-09-10 株式会社荏原製作所 Substrate copper plating method
US20030213772A9 (en) * 1999-07-09 2003-11-20 Mok Yeuk-Fai Edwin Integrated semiconductor substrate bevel cleaning apparatus and method
US7645366B2 (en) 1999-07-12 2010-01-12 Semitool, Inc. Microelectronic workpiece holders and contact assemblies for use therewith
US6673216B2 (en) 1999-08-31 2004-01-06 Semitool, Inc. Apparatus for providing electrical and fluid communication to a rotating microelectronic workpiece during electrochemical processing
US6558478B1 (en) 1999-10-06 2003-05-06 Ebara Corporation Method of and apparatus for cleaning substrate
US6454927B1 (en) * 2000-06-26 2002-09-24 Applied Materials, Inc. Apparatus and method for electro chemical deposition
TW562878B (en) * 2000-06-30 2003-11-21 Ebara Corp Copper-plating liquid, plating method and plating apparatus
US6576110B2 (en) 2000-07-07 2003-06-10 Applied Materials, Inc. Coated anode apparatus and associated method
AT412043B (en) * 2000-07-12 2004-08-26 Ind Tech Res Inst METHOD FOR CLEANING A WAFER WITH METALS ON THE BACK
CN100469948C (en) * 2000-10-03 2009-03-18 应用材料有限公司 Method and associated apparatus for tilting a substrate upon entry for metal deposition
JP2006339665A (en) * 2000-10-12 2006-12-14 Ebara Corp Apparatus for manufacturing semiconductor substrate
WO2002031227A2 (en) * 2000-10-12 2002-04-18 Applied Materials, Inc. Deposition uniformity control for electroplating apparatus, and associated method
US6569307B2 (en) * 2000-10-20 2003-05-27 The Boc Group, Inc. Object plating method and system
JP2002212786A (en) * 2001-01-17 2002-07-31 Ebara Corp Substrate processor
JP2002220692A (en) 2001-01-24 2002-08-09 Ebara Corp Plating equipment and method
US7189647B2 (en) 2001-04-05 2007-03-13 Novellus Systems, Inc. Sequential station tool for wet processing of semiconductor wafers
WO2003007274A1 (en) * 2001-07-12 2003-01-23 James Hambleton Electro-chemical teaching unit
US7247222B2 (en) * 2002-07-24 2007-07-24 Applied Materials, Inc. Electrochemical processing cell
JP4303484B2 (en) 2003-01-21 2009-07-29 大日本スクリーン製造株式会社 Plating equipment
KR100518788B1 (en) * 2003-03-11 2005-10-05 삼성전자주식회사 Spin coating apparatus for coating photoresist
JP4872199B2 (en) * 2004-09-06 2012-02-08 ルネサスエレクトロニクス株式会社 Semiconductor manufacturing equipment
KR100854373B1 (en) 2006-12-29 2008-09-02 주식회사 포스코 Acid cleaning solution sampling apparatus of the acid solution tank
KR101590661B1 (en) * 2010-09-13 2016-02-01 도쿄엘렉트론가부시키가이샤 Liquid processing apparatus, liquid processing method and storage medium
JP5321574B2 (en) * 2010-12-17 2013-10-23 ルネサスエレクトロニクス株式会社 Method of operating semiconductor manufacturing apparatus and method of manufacturing semiconductor device
CN105044370B (en) * 2014-11-04 2017-03-08 长沙绿智电子科技有限公司 A kind of unattended heavy metal-polluted water monitoring apparatus
KR102342006B1 (en) * 2016-03-04 2021-12-22 가부시키가이샤 에바라 세이사꾸쇼 Plating apparatus and plating method
JP6833557B2 (en) * 2016-03-04 2021-02-24 株式会社荏原製作所 Plating equipment and plating method
GB201701166D0 (en) 2017-01-24 2017-03-08 Picofluidics Ltd An apparatus for electrochemically processing semiconductor substrates
EP3647467B1 (en) * 2017-06-30 2022-04-06 Showa Denko K.K. Anode mounting member of fluorine electrolytic cell, fluorine electrolytic cell, and method for producing fluorine gas
KR102373893B1 (en) * 2018-03-13 2022-03-11 가부시키가이샤 야마모토메키시켄키 Plating equipment and plating system
CN110355025B (en) * 2019-08-01 2020-11-27 宿迁市创盈知识产权服务有限公司 Automobile spare and accessory part material nanometer modification equipment
US11686208B2 (en) 2020-02-06 2023-06-27 Rolls-Royce Corporation Abrasive coating for high-temperature mechanical systems

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4529353A (en) * 1983-01-27 1985-07-16 At&T Bell Laboratories Wafer handling apparatus and method
US4732785A (en) * 1986-09-26 1988-03-22 Motorola, Inc. Edge bead removal process for spin on films
JPS6410073A (en) * 1987-07-01 1989-01-13 Sanyo Electric Co Decompression device
JPS6410073U (en) * 1987-07-03 1989-01-19
JPH0222499A (en) * 1988-07-12 1990-01-25 Yamaha Corp Plating equipment
US4981715A (en) * 1989-08-10 1991-01-01 Microelectronics And Computer Technology Corporation Method of patterning electroless plated metal on a polymer substrate
JPH03193899A (en) * 1989-12-22 1991-08-23 Ebara Yuujiraito Kk Method for automatically controlling electrolytic solution
JP2557146B2 (en) * 1991-03-20 1996-11-27 日本エレクトロプレイテイング・エンジニヤース株式会社 Automatic wafer plating equipment
JP2888001B2 (en) * 1992-01-09 1999-05-10 日本電気株式会社 Metal plating equipment
JPH05195296A (en) * 1992-01-22 1993-08-03 Nippon Hyomen Kagaku Kk Automatic controlling device for electrolytic solution
JPH06349952A (en) * 1993-06-14 1994-12-22 Oki Electric Ind Co Ltd Wiring forming method
JP2624200B2 (en) * 1994-11-29 1997-06-25 日本電気株式会社 Jet type electroplating apparatus and plating method
US5807469A (en) * 1995-09-27 1998-09-15 Intel Corporation Flexible continuous cathode contact circuit for electrolytic plating of C4, tab microbumps, and ultra large scale interconnects
WO1998002907A1 (en) * 1996-07-15 1998-01-22 Semitool, Inc. Control system for a semiconductor workpiece processing tool
JP3583883B2 (en) * 1997-01-24 2004-11-04 日本エレクトロプレイテイング・エンジニヤース株式会社 Automatic wafer plating equipment
US6188120B1 (en) * 1997-02-24 2001-02-13 International Business Machines Corporation Method and materials for through-mask electroplating and selective base removal
ATE488621T1 (en) * 1997-04-04 2010-12-15 Univ Southern California GALVANIC PROCESS FOR PRODUCING A MULTI-LAYER STRUCTURE
JP2003527477A (en) * 1998-07-13 2003-09-16 ディージェイ パーカー カンパニー、インク. ディー/ビー/エー パーカー システムズ Regular chemical replenishment system

Also Published As

Publication number Publication date
JP2003528214A (en) 2003-09-24
JP4766579B2 (en) 2011-09-07
TW513751B (en) 2002-12-11
JP2009293134A (en) 2009-12-17
WO2000032835A2 (en) 2000-06-08

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