WO1998008244A3 - Analyseur de vitesse de particules chargees - Google Patents

Analyseur de vitesse de particules chargees Download PDF

Info

Publication number
WO1998008244A3
WO1998008244A3 PCT/GB1997/002182 GB9702182W WO9808244A3 WO 1998008244 A3 WO1998008244 A3 WO 1998008244A3 GB 9702182 W GB9702182 W GB 9702182W WO 9808244 A3 WO9808244 A3 WO 9808244A3
Authority
WO
WIPO (PCT)
Prior art keywords
signal
time
analyser
detector
give
Prior art date
Application number
PCT/GB1997/002182
Other languages
English (en)
Other versions
WO1998008244A2 (fr
Inventor
Timothy Andrew Steele
Ronald Charles Unwin
Adrian John Eccles
Original Assignee
Millbrook Instr Limited
Timothy Andrew Steele
Ronald Charles Unwin
Adrian John Eccles
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Millbrook Instr Limited, Timothy Andrew Steele, Ronald Charles Unwin, Adrian John Eccles filed Critical Millbrook Instr Limited
Priority to EP97936783A priority Critical patent/EP0919067B1/fr
Priority to DE69703624T priority patent/DE69703624T2/de
Publication of WO1998008244A2 publication Critical patent/WO1998008244A2/fr
Publication of WO1998008244A3 publication Critical patent/WO1998008244A3/fr

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0031—Step by step routines describing the use of the apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/022—Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

La présente invention concerne un analyseur de vitesse d'ions (10) comprenant une source (12) d'ions, laquelle se trouve dans un vide. Dans la partie de focalisation (14) de l'analyseur de vitesse d'ions (10), une série de lentilles électrostatiques focalisent les ions en un faisceau. Le faisceau est modulé par un déflecteur (16) de manière qu'il produit un signal binaire pseudo-aléatoire à impulsions de longeur variable. Le faisceau du modulateur descend vers un détecteur (20), le long d'un tube de glissement sous vide (18) muni d'un potentiel électrostatique choisi. Le signal émis par le détecteur (20) est amplifié, et un analyseur multicanal (22) mesure et enregistre la caractéristique d'intensité de signal d'un réseau de canaux de temps, le signal obtenu étant une convolution du signal binaire pseudo-aléatoire et de la durée du spectre de vol de l'échantillon d'ions. On met en corrélation croisée le signal provenant du détecteur avec le signal modulé ayant subi une déconvolution afin d'obtenir une durée de spectre de vol de l'échantillon d'ions. On inverse alors la durée de spectre de vol pour obtenir un spectre de masse.
PCT/GB1997/002182 1996-08-17 1997-08-18 Analyseur de vitesse de particules chargees WO1998008244A2 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
EP97936783A EP0919067B1 (fr) 1996-08-17 1997-08-18 Analyseur de vitesse de particules chargees
DE69703624T DE69703624T2 (de) 1996-08-17 1997-08-18 Geschwindigkeitsanalysator geladener teilchen

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB9617312.5A GB9617312D0 (en) 1996-08-17 1996-08-17 Charged particle velocity analyser
GB9617312.5 1996-08-17

Publications (2)

Publication Number Publication Date
WO1998008244A2 WO1998008244A2 (fr) 1998-02-26
WO1998008244A3 true WO1998008244A3 (fr) 1998-04-09

Family

ID=10798630

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/GB1997/002182 WO1998008244A2 (fr) 1996-08-17 1997-08-18 Analyseur de vitesse de particules chargees

Country Status (4)

Country Link
EP (1) EP0919067B1 (fr)
DE (1) DE69703624T2 (fr)
GB (1) GB9617312D0 (fr)
WO (1) WO1998008244A2 (fr)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6198096B1 (en) 1998-12-22 2001-03-06 Agilent Technologies, Inc. High duty cycle pseudo-noise modulated time-of-flight mass spectrometry
AU2002305866B2 (en) * 2001-06-08 2005-12-15 Spectrum Square Associates, Inc. Spectroscopy instrument using broadband modulation and statistical estimation
GB2390740A (en) * 2002-04-23 2004-01-14 Thermo Electron Corp Spectroscopic analyser for surface analysis and method therefor
HU224767B1 (en) * 2002-05-08 2006-02-28 Gyoergy Dr Hars Continuous ion emitting time-of-flight mass spectrometer and method for selective determining ion current of different mass/charge ratio ions
US20060273253A1 (en) * 2003-04-30 2006-12-07 Fitzgerald John P Pseudo-random binary sequence gate-switching for spectrometers
GB201613988D0 (en) 2016-08-16 2016-09-28 Micromass Uk Ltd And Leco Corp Mass analyser having extended flight path
EP3309816B1 (fr) 2016-10-12 2019-02-27 Tofwerk AG Procédé et appareil de détermination d'un spectre
GB2567794B (en) 2017-05-05 2023-03-08 Micromass Ltd Multi-reflecting time-of-flight mass spectrometers
GB2563571B (en) 2017-05-26 2023-05-24 Micromass Ltd Time of flight mass analyser with spatial focussing
US11817303B2 (en) 2017-08-06 2023-11-14 Micromass Uk Limited Accelerator for multi-pass mass spectrometers
WO2019030472A1 (fr) 2017-08-06 2019-02-14 Anatoly Verenchikov Miroir ionique servant à des spectromètres de masse à réflexion multiple
EP3662503A1 (fr) 2017-08-06 2020-06-10 Micromass UK Limited Injection d'ions dans des spectromètres de masse à passages multiples
WO2019030475A1 (fr) 2017-08-06 2019-02-14 Anatoly Verenchikov Spectromètre de masse à multipassage
WO2019030473A1 (fr) 2017-08-06 2019-02-14 Anatoly Verenchikov Champs servant à des sm tof à réflexion multiple
WO2019030474A1 (fr) 2017-08-06 2019-02-14 Anatoly Verenchikov Miroir ionique à circuit imprimé avec compensation
US11081332B2 (en) 2017-08-06 2021-08-03 Micromass Uk Limited Ion guide within pulsed converters
GB201806507D0 (en) 2018-04-20 2018-06-06 Verenchikov Anatoly Gridless ion mirrors with smooth fields
GB201807605D0 (en) 2018-05-10 2018-06-27 Micromass Ltd Multi-reflecting time of flight mass analyser
GB201807626D0 (en) 2018-05-10 2018-06-27 Micromass Ltd Multi-reflecting time of flight mass analyser
GB201808530D0 (en) 2018-05-24 2018-07-11 Verenchikov Anatoly TOF MS detection system with improved dynamic range
GB201810573D0 (en) 2018-06-28 2018-08-15 Verenchikov Anatoly Multi-pass mass spectrometer with improved duty cycle
GB201901411D0 (en) 2019-02-01 2019-03-20 Micromass Ltd Electrode assembly for mass spectrometer

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58172854A (ja) * 1982-04-02 1983-10-11 Univ Nagoya 飛行時間型イオン質量分析装置
JPS59173939A (ja) * 1983-03-23 1984-10-02 Univ Nagoya 飛行時間型イオン質量分析装置
JPS6182651A (ja) * 1984-09-29 1986-04-26 Shimadzu Corp 飛行時間型質量分析装置
JPS61195554A (ja) * 1985-02-22 1986-08-29 Shimadzu Corp 飛行時間型質量分析計
US4707602A (en) * 1985-04-08 1987-11-17 Surface Science Laboratories, Inc. Fourier transform time of flight mass spectrometer
WO1991003071A1 (fr) * 1989-08-25 1991-03-07 Institut Energeticheskikh Problem Khimicheskoi Fiziki Akademii Nauk Sssr Procede et dispositif d'analyse spectrometrique de masse a temps de vol de faisceau d'ions a onde continue
WO1991004571A1 (fr) * 1989-09-12 1991-04-04 Institut Kosmicheskikh Issledovany Akademii Nauk Sssr Spectrometre de masse a temps de vol
US5160840A (en) * 1991-10-25 1992-11-03 Vestal Marvin L Time-of-flight analyzer and method
FR2681471A1 (fr) * 1991-09-12 1993-03-19 Centre Nat Rech Scient Modulateur temporel de faisceau d'ions.
DE4137114A1 (de) * 1991-11-12 1993-05-13 Spectro Mass Spectrometry Ges Flugzeit-massenspektrometer mit hohem analytischen nachweisvermoegen

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58172854A (ja) * 1982-04-02 1983-10-11 Univ Nagoya 飛行時間型イオン質量分析装置
JPS59173939A (ja) * 1983-03-23 1984-10-02 Univ Nagoya 飛行時間型イオン質量分析装置
JPS6182651A (ja) * 1984-09-29 1986-04-26 Shimadzu Corp 飛行時間型質量分析装置
JPS61195554A (ja) * 1985-02-22 1986-08-29 Shimadzu Corp 飛行時間型質量分析計
US4707602A (en) * 1985-04-08 1987-11-17 Surface Science Laboratories, Inc. Fourier transform time of flight mass spectrometer
WO1991003071A1 (fr) * 1989-08-25 1991-03-07 Institut Energeticheskikh Problem Khimicheskoi Fiziki Akademii Nauk Sssr Procede et dispositif d'analyse spectrometrique de masse a temps de vol de faisceau d'ions a onde continue
WO1991004571A1 (fr) * 1989-09-12 1991-04-04 Institut Kosmicheskikh Issledovany Akademii Nauk Sssr Spectrometre de masse a temps de vol
FR2681471A1 (fr) * 1991-09-12 1993-03-19 Centre Nat Rech Scient Modulateur temporel de faisceau d'ions.
US5160840A (en) * 1991-10-25 1992-11-03 Vestal Marvin L Time-of-flight analyzer and method
DE4137114A1 (de) * 1991-11-12 1993-05-13 Spectro Mass Spectrometry Ges Flugzeit-massenspektrometer mit hohem analytischen nachweisvermoegen

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
PATENT ABSTRACTS OF JAPAN vol. 008, no. 008 (E - 221) 13 January 1984 (1984-01-13) *
PATENT ABSTRACTS OF JAPAN vol. 009, no. 031 (E - 295) 9 February 1985 (1985-02-09) *
PATENT ABSTRACTS OF JAPAN vol. 010, no. 255 (E - 433) 2 September 1986 (1986-09-02) *
PATENT ABSTRACTS OF JAPAN vol. 011, no. 027 (E - 474) 27 January 1987 (1987-01-27) *

Also Published As

Publication number Publication date
DE69703624D1 (de) 2001-01-04
EP0919067A2 (fr) 1999-06-02
WO1998008244A2 (fr) 1998-02-26
DE69703624T2 (de) 2001-06-28
GB9617312D0 (en) 1996-09-25
EP0919067B1 (fr) 2000-11-29

Similar Documents

Publication Publication Date Title
WO1998008244A3 (fr) Analyseur de vitesse de particules chargees
CA2450465C (fr) Spectrometres de masse et procedes de separation et de detection ioniques
WO2003081286A3 (fr) Systeme et procede de focalisation, deflexion et de captage de signal d'optique electronique a lentille d'immersion avec retard de balancement d'objectif
US5376788A (en) Apparatus and method for matrix-assisted laser desorption mass spectrometry
CA1269181A (fr) Spectrometre de masse pour ions positifs et negatifs
AU2010346305B2 (en) Mass spectrometers and methods of ion separation and detection
WO1989006044A1 (fr) Spectrometre de masse
CA2344446A1 (fr) Systeme optique ionique pour spectrometre de masse
US5750993A (en) Method of reducing noise in an ion trap mass spectrometer coupled to an atmospheric pressure ionization source
US6002128A (en) Sample analyzer
US4649278A (en) Generation of intense negative ion beams
US4912327A (en) Pulsed microfocused ion beams
US2956169A (en) Ion pulse generation
US5850084A (en) Ion lens assembly for gas analysis system
EP3598476B1 (fr) Procédés et systèmes de détection de la distribution spatiale d'ions
EP0059111A3 (fr) Photoioniseur
DE69019903D1 (de) Differential-Fluoreszenz-LIDAR und damit verbundenes Nachweisverfahren.
US5770859A (en) Time of flight mass spectrometer having microchannel plate and modified dynode for improved sensitivity
JPH03173054A (ja) 粒子線装置
GB2147140A (en) Mass spectrometers
CN113295763B (zh) 一种可消除反应物背景信号干扰的交叉分子束探测装置
CN214895012U (zh) 可消除反应物背景信号干扰的交叉分子束探测装置
SU1597968A1 (ru) Энергетический анализатор зар женных частиц
SU1095272A1 (ru) Врем пролетный масс-спектрометр
JPS5774957A (en) Ionizing device of mass spectrometer

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A2

Designated state(s): JP US

AL Designated countries for regional patents

Kind code of ref document: A2

Designated state(s): AT BE CH DE DK ES FI FR GB GR IE IT LU MC NL PT SE

AK Designated states

Kind code of ref document: A3

Designated state(s): JP US

AL Designated countries for regional patents

Kind code of ref document: A3

Designated state(s): AT BE CH DE DK ES FI FR GB GR IE IT LU MC NL PT SE

DFPE Request for preliminary examination filed prior to expiration of 19th month from priority date (pct application filed before 20040101)
121 Ep: the epo has been informed by wipo that ep was designated in this application
WWE Wipo information: entry into national phase

Ref document number: 1997936783

Country of ref document: EP

WWP Wipo information: published in national office

Ref document number: 1997936783

Country of ref document: EP

NENP Non-entry into the national phase

Ref country code: JP

Ref document number: 1998510487

Format of ref document f/p: F

WWG Wipo information: grant in national office

Ref document number: 1997936783

Country of ref document: EP