WO1998004927B1 - Loaded board drop pin fixture - Google Patents
Loaded board drop pin fixtureInfo
- Publication number
- WO1998004927B1 WO1998004927B1 PCT/US1997/013215 US9713215W WO9804927B1 WO 1998004927 B1 WO1998004927 B1 WO 1998004927B1 US 9713215 W US9713215 W US 9713215W WO 9804927 B1 WO9804927 B1 WO 9804927B1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- test
- fixture
- translator
- circuit board
- probes
- Prior art date
Links
- 239000000523 sample Substances 0.000 claims abstract 11
- 239000007787 solid Substances 0.000 claims abstract 2
Abstract
A test fixture for testing a loaded printed circuit board (30) having a plurality of test points (50) includes a housing (12) and a probe plate (18) located in the base of the housing. The probe plate includes an array of widely spaced high spring force test probes (16) in compliant contact with solid translator pins (46) located in a translator fixture (14) removably positioned over the probe plate. The translator fixture includes a top plate (40) having recessed portions (31) for receipt of loaded circuit board components so that the top plate is adjacent the test points on the circuit board. The translator fixture aligns the translator pins to translate electrical test signals between the test points and an external electronic test analyzer electrically connected to the test probes. The translator pins can be adapted to rotate on their axes when applying such test forces by use of twisting test probes in an alternative embodiment.
Claims
1. A loaded board test fixture for testing a plurality of closely spaced test points on a loaded printed circuit board comprising: a housing; a probe plate located in a base of the housing; an array of relatively widely spaced apart high spring force test probes extending through the probe plate and adapted for electrically connecting to an external electronic test analyzer; a translator fixture removably positioned over the probe plate within a cavity in the housing and adjacent the closely spaced test points on the circuit board; said translator fixture having a top plate with recessed portions for receipt of circuit board components so that an upper surface of the top plate is adjacent the test points on the loaded printed circuit board; and a plurality of translator pins supported in the translator fixture for alignment with the test probes at one end of the translator fixture and with the closely spaced test points at the opposite end of the translator fixture, the translator pins comprising solid pins having sufficient axial rigidity to effectively translate test forces applied by the test probes to the test points on the board, and wherein the test probes are in compliant contact with the translator pins for translating said test forces and electrical test signals between the closely spaced test points on the printed circuit board and the connections to the external electronic test analyzer.
2. The fixture of claim 1 wherein the test probes exert a spring force of about 6 ounces.
3. The fixture of claim 1 wherein the test probes exert a force from about 6 to about 12 ounces.
4. The fixture of claim 1 wherein the test probes are spaced about 100 mils on center through the probe plate.
5. The fixture of claim 4 wherein the test points include individual test locations spaced 50 mils or less apart.
6. The test fixture of claim 1 wherein the test probes are helix probes which rotate under compliant spring pressure to rotate the translator pins producing twisting contact between the translator pin and the test points on the printed circuit board.
7. The fixture of claim 1 wherein the fixture further includes a short-wire interface panel positioned below the probe plate for electrically connecting the test probes and the electronic test analyzer.
8. The fixture of claim 7 wherein the short- wire interface panel includes interface pins in contact with the test probes, the interface pins are hard wired to standard interface pins at a periphery of the short-wire interface panel.
9. A loaded board test fixture for testing a plurality of closely spaced test points on a loaded printed circuit board comprising: a housing; an array of widely spaced high spring force helix test probes extending through a probe plate in a base of the housing and electrically connected to an external electronic test analyzer; and a translator fixture removably positioned over the probe plate within a cavity in the housing and adjacent the closely spaced test points for aligning a plurality of translator pins in the translator fixture with the helix test probes, wherein the helix test probes are in compliant contact with the translator pins for rotating the translator pins into contact with the closely spaced test points for translating electrical test signals to the external electronic test analyzer.
10. The fixture of claim 9 wherein the helix test probes exert a spring force of at least 6 ounces.
1 1. The fixture of claim 9 wherein the helix test probes exert a force from about 6 to about 12 ounces.
12. The fixture of claim 9 wherein the translator fixture includes a top plate with recessed portion for receipt of circuit board components so that an upper surface of the top plate is adjacent the test points.
13. The fixture of claim 12 wherein the test points include individual test locations spaced 50 mils or less apart.
1 3
14. The fixture of claim 9 wherein the fixture further includes a short-wire interface panel positioned below the probe plate for electrically connecting the helix test probes and the external electronic test analyzer.
15. A loaded board test fixture for testing a plurality of closely spaced test pads on a loaded printed circuit board comprising; a receiver; an array of widely spaced high spring force test probes located in a loaded circuit board tester; a first translator fixture removably positioned over the test probes within a cavity of the loaded circuit board tester and adjacent the closely spaced test pads for aligning a plurality of translator pins in the translator fixture with the test probes and the closely spaced test pads; said translator fixture having a top plate with recessed portions for receipt of loaded circuit board components so that the top plate is adjacent the test points on the loaded printed circuit board; and means for compressing the translator pins in the translator fixture against the test probes for translating electrical test signals between the test pads on the printed circuit board and the loaded circuit board tester.
16. The fixture of claim 15 wherein the means for compressing the translator pins against the test probes is an air cylinder attached to said receiver.
17. The fixture of claim 16 wherein a second translator fixture is positioned in said receiver in an inverted position and axially aligned over said first translator fixture.
18. The fixture of claim 1 wherein the housing is a vacuum wired fixture.
19. The fixture of claim 1 wherein the housing is a mechanical wired fixture.
20. The fixture of claim 1 wherein the housing is a pneumatic wired fixture.
1 4
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10509054A JPH10512682A (en) | 1996-07-29 | 1997-07-29 | Drop pin device for loaded substrates |
| EP97935151A EP0855037B1 (en) | 1996-07-29 | 1997-07-29 | Loaded board drop pin fixture |
| DE69734815T DE69734815T2 (en) | 1996-07-29 | 1997-07-29 | CASE NEEDLE BED TEST DEVICE FOR FITTED PRINTED CIRCUITS |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US08/688,189 | 1996-07-29 | ||
| US08/688,189 US5818248A (en) | 1996-07-29 | 1996-07-29 | Loaded board test fixture with integral translator fixture for testing closely spaced test sites |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| WO1998004927A1 WO1998004927A1 (en) | 1998-02-05 |
| WO1998004927B1 true WO1998004927B1 (en) | 1998-04-02 |
Family
ID=24763478
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/US1997/013215 WO1998004927A1 (en) | 1996-07-29 | 1997-07-29 | Loaded board drop pin fixture |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US5818248A (en) |
| EP (1) | EP0855037B1 (en) |
| JP (1) | JPH10512682A (en) |
| DE (1) | DE69734815T2 (en) |
| WO (1) | WO1998004927A1 (en) |
Families Citing this family (45)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19507127A1 (en) * | 1995-03-01 | 1996-09-12 | Test Plus Electronic Gmbh | Adapter system for component boards, to be used in a test facility |
| DE19625493C1 (en) * | 1996-06-26 | 1997-11-20 | Ibm | Contact probe arrangement for electronic functional testing |
| US5945836A (en) | 1996-10-29 | 1999-08-31 | Hewlett-Packard Company | Loaded-board, guided-probe test fixture |
| US6407565B1 (en) | 1996-10-29 | 2002-06-18 | Agilent Technologies, Inc. | Loaded-board, guided-probe test fixture |
| US5949243A (en) * | 1997-02-27 | 1999-09-07 | Star Technology Group, Inc. | Translator fixture for use in circuit board testing |
| US5945838A (en) * | 1997-06-26 | 1999-08-31 | Star Technology Group, Inc. | Apparatus for testing circuit boards |
| US6194908B1 (en) * | 1997-06-26 | 2001-02-27 | Delaware Capital Formation, Inc. | Test fixture for testing backplanes or populated circuit boards |
| US6005405A (en) * | 1997-06-30 | 1999-12-21 | Hewlett Packard Company | Probe plate assembly for high-node-count circuit board test fixtures |
| JPH1164426A (en) * | 1997-08-25 | 1999-03-05 | I C T:Kk | Inspection device of printed circuit board and assembly kit of inspection device of printed circuit board |
| US6025729A (en) * | 1997-09-11 | 2000-02-15 | Delaware Capital Formation, Inc. | Floating spring probe wireless test fixture |
| US6005402A (en) * | 1998-05-08 | 1999-12-21 | Delaware Capital Formation, Inc. | Translator fixture for use in circuit board testing |
| US6191601B1 (en) * | 1999-02-22 | 2001-02-20 | Delaware Capital Formation, Inc. | Test fixture for matched impedance testing |
| US6437587B1 (en) | 1999-11-04 | 2002-08-20 | Agilent Technologies, Inc. | ICT test fixture for fine pitch testing |
| US6420887B1 (en) * | 2000-06-13 | 2002-07-16 | Kulicke & Soffa Investment, Inc. | Modulated space transformer for high density buckling beam probe and method for making the same |
| KR100428782B1 (en) * | 2001-04-11 | 2004-04-27 | 삼성전자주식회사 | Apparatus for measuring tension of pogo pin |
| JP2005504991A (en) * | 2001-10-10 | 2005-02-17 | デラウェア キャピタル フォーメーション，インコーポレイテッド | Coaxial tilt pin jig for inspecting high frequency circuit boards |
| US7059046B2 (en) * | 2002-06-24 | 2006-06-13 | Delaware Capital Formation, Inc. | Method for producing a captive wired test fixture and fixture therefor |
| US6784675B2 (en) * | 2002-06-25 | 2004-08-31 | Agilent Technologies, Inc. | Wireless test fixture adapter for printed circuit assembly tester |
| TWI236723B (en) | 2002-10-02 | 2005-07-21 | Renesas Tech Corp | Probe sheet, probe card, semiconductor inspection device, and manufacturing method for semiconductor device |
| JP2004228332A (en) * | 2003-01-23 | 2004-08-12 | Yamaha Fine Technologies Co Ltd | Electrical inspection apparatus |
| KR100546361B1 (en) * | 2003-08-08 | 2006-01-26 | 삼성전자주식회사 | Test tool of semiconductor device and operation method of the test tool |
| US6967492B2 (en) * | 2003-11-26 | 2005-11-22 | Asm Assembly Automation Ltd. | Spring contact probe device for electrical testing |
| US7145352B2 (en) * | 2004-08-13 | 2006-12-05 | Agilent Technologies, Inc. | Apparatus, method, and kit for probing a pattern of points on a printed circuit board |
| DE102005030550B3 (en) * | 2005-06-22 | 2006-10-26 | JHS Technik Josef Schäfer | Apparatus for testing circuits boards with or without components mounted thereon having contact pins acted on by spring elements |
| US7511517B2 (en) * | 2005-11-08 | 2009-03-31 | Qualitau, Inc. | Semi-automatic multiplexing system for automated semiconductor wafer testing |
| US7698809B2 (en) * | 2006-05-12 | 2010-04-20 | Tyco Electronics Corporation | Apparatus and method for detecting a location of conductive pins with respect to a circuit board |
| US7498826B2 (en) * | 2006-08-25 | 2009-03-03 | Interconnect Devices, Inc. | Probe array wafer |
| US7492174B2 (en) * | 2007-06-18 | 2009-02-17 | James Hall | Testing apparatus for surface mounted connectors |
| CA2592901C (en) * | 2007-07-13 | 2012-03-27 | Martin Blouin | Semi-generic in-circuit test fixture |
| EP2131204B1 (en) * | 2008-06-06 | 2012-11-14 | Texas Instruments France | A method and system for testing a semiconductor package |
| DE102009004555A1 (en) * | 2009-01-14 | 2010-09-30 | Atg Luther & Maelzer Gmbh | Method for testing printed circuit boards |
| US8907694B2 (en) | 2009-12-17 | 2014-12-09 | Xcerra Corporation | Wiring board for testing loaded printed circuit board |
| US8648616B2 (en) * | 2009-12-22 | 2014-02-11 | Ltx-Credence Corporation | Loaded printed circuit board test fixture and method for manufacturing the same |
| CN102447767B (en) * | 2011-09-05 | 2014-05-07 | 杭州厚德通信技术有限公司 | Mobile phone mother board performance parameter acquisition device |
| US9182425B2 (en) | 2012-05-21 | 2015-11-10 | Lenovo Enterprise Solutions (Singapore) Pte. Ltd. | Probe supporting and aligning apparatus |
| CN103852675A (en) * | 2012-11-30 | 2014-06-11 | 达丰(上海)电脑有限公司 | On-line test fixture with pneumatic probes |
| US11067601B2 (en) | 2013-03-08 | 2021-07-20 | Donald DeMille | High accuracy electrical test interconnection device and method for electrical circuit board testing |
| US9274166B2 (en) | 2013-08-26 | 2016-03-01 | Fujitsu Limited | Pin verification device and method |
| CN104690664B (en) * | 2013-12-06 | 2017-08-08 | 珠海格力电器股份有限公司 | Test fixture loading and unloading mechanism |
| TWI561823B (en) * | 2015-09-03 | 2016-12-11 | King Yuan Electronics Co Ltd | Improved connecting apparatus and testing interface using the same |
| DE102017102700A1 (en) * | 2017-02-10 | 2018-09-13 | Atg Luther & Maelzer Gmbh | Test apparatus and method for testing printed circuit boards |
| CN108521718B (en) * | 2018-06-21 | 2023-12-19 | 苏州工业职业技术学院 | Auxiliary device for circuit board processing |
| CN113834955B (en) * | 2020-06-24 | 2024-06-14 | 亿光电子(中国)有限公司 | Test clamp |
| JP7453891B2 (en) * | 2020-10-06 | 2024-03-21 | 日本航空電子工業株式会社 | Electrical component inspection equipment |
| CN113671344B (en) * | 2021-08-16 | 2024-05-28 | 苏州特斯捷电子科技有限公司 | Industrial control mainboard test fixture |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5032787A (en) * | 1989-11-03 | 1991-07-16 | Everett/Charles Contact Products, Inc. | Electrical test probe having rotational control of the probe shaft |
| US5633598A (en) * | 1993-06-23 | 1997-05-27 | Everett Charles Technologies, Inc. | Translator fixture with module for expanding test points |
| US5450017A (en) * | 1993-12-03 | 1995-09-12 | Everett Charles Technologies, Inc. | Test fixture having translator for grid interface |
| US5442299A (en) * | 1994-01-06 | 1995-08-15 | International Business Machines Corporation | Printed circuit board test fixture and method |
| WO1995023341A1 (en) * | 1994-02-23 | 1995-08-31 | Everett Charles Technologies, Inc. | Translator fixture with module for expanding test points |
| IT1273339B (en) * | 1994-02-24 | 1997-07-08 | Circuit Line Spa | MARKING SYSTEM FOR PRINTED CIRCUITS |
| US5493230A (en) * | 1994-02-25 | 1996-02-20 | Everett Charles Technologies, Inc. | Retention of test probes in translator fixtures |
| US5663655A (en) * | 1995-09-22 | 1997-09-02 | Everett Charles Technologies, Inc. | ESD protection for universal grid type test fixtures |
-
1996
- 1996-07-29 US US08/688,189 patent/US5818248A/en not_active Expired - Lifetime
-
1997
- 1997-07-29 EP EP97935151A patent/EP0855037B1/en not_active Expired - Lifetime
- 1997-07-29 JP JP10509054A patent/JPH10512682A/en active Pending
- 1997-07-29 WO PCT/US1997/013215 patent/WO1998004927A1/en active IP Right Grant
- 1997-07-29 DE DE69734815T patent/DE69734815T2/en not_active Expired - Lifetime
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