WO1997022886A1 - Generic interface test adapter - Google Patents
Generic interface test adapter Download PDFInfo
- Publication number
- WO1997022886A1 WO1997022886A1 PCT/US1996/014949 US9614949W WO9722886A1 WO 1997022886 A1 WO1997022886 A1 WO 1997022886A1 US 9614949 W US9614949 W US 9614949W WO 9722886 A1 WO9722886 A1 WO 9722886A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- interface
- contact
- test
- generic
- plane
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2844—Fault-finding or characterising using test interfaces, e.g. adapters, test boxes, switches, PIN drivers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
Abstract
Description
Claims
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP96932262A EP0866977B1 (en) | 1995-12-15 | 1996-09-18 | Generic interface test adapter |
DE69621152T DE69621152T2 (en) | 1995-12-15 | 1996-09-18 | SCHNITTSTELLENPRUEFADAPTER |
AU71128/96A AU7112896A (en) | 1995-12-15 | 1996-09-18 | Generic interface test adapter |
HK98112440A HK1011223A1 (en) | 1995-12-15 | 1998-11-28 | Generic interface test adapter |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US573,026 | 1995-12-15 | ||
US08/573,026 US5793218A (en) | 1995-12-15 | 1995-12-15 | Generic interface test adapter |
Publications (1)
Publication Number | Publication Date |
---|---|
WO1997022886A1 true WO1997022886A1 (en) | 1997-06-26 |
Family
ID=24290357
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US1996/014949 WO1997022886A1 (en) | 1995-12-15 | 1996-09-18 | Generic interface test adapter |
Country Status (11)
Country | Link |
---|---|
US (1) | US5793218A (en) |
EP (1) | EP0866977B1 (en) |
KR (1) | KR100479136B1 (en) |
AU (1) | AU7112896A (en) |
DE (1) | DE69621152T2 (en) |
ES (1) | ES2175129T3 (en) |
HK (1) | HK1011223A1 (en) |
IN (1) | IN189781B (en) |
PT (1) | PT866977E (en) |
TW (1) | TW312747B (en) |
WO (1) | WO1997022886A1 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2013164407A1 (en) * | 2012-05-03 | 2013-11-07 | Turbodynamics Gmbh | Module for exchanging an interface unit in a testing system for testing semiconductor components and testing system comprising such a module |
FR2996367A1 (en) * | 2012-10-01 | 2014-04-04 | Airbus Operations Sas | CONNECTION SYSTEM FOR CONNECTING AN ELECTRONIC EQUIPMENT, IN PARTICULAR FOR AN AIRCRAFT, TO A TEST UNIT. |
CN106324460A (en) * | 2016-11-08 | 2017-01-11 | 沈小晴 | Universal test mechanism with switchable dial |
Families Citing this family (34)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6178255B1 (en) * | 1998-04-28 | 2001-01-23 | Cross Match Technologies, Inc. | Individualized fingerprint scanner |
US6269319B1 (en) | 1999-01-29 | 2001-07-31 | The Mcdonnell Douglas Corporation | Reconfigurable integration test station |
US6272562B1 (en) * | 1999-05-28 | 2001-08-07 | Cross Match Technologies, Inc. | Access control unit interface |
US6239592B1 (en) * | 1999-06-02 | 2001-05-29 | Sun Microsystems, Inc. | Test fixture with quick connect and release board interconnect mechanism |
US6886104B1 (en) | 1999-06-25 | 2005-04-26 | Cross Match Technologies | Rechargeable mobile hand-held fingerprint scanner with a data and power communication interface |
US6744910B1 (en) | 1999-06-25 | 2004-06-01 | Cross Match Technologies, Inc. | Hand-held fingerprint scanner with on-board image normalization data storage |
US7162060B1 (en) | 1999-08-09 | 2007-01-09 | Cross Match Technologies | Method, system, and computer program product for control of platen movement during a live scan |
JP2003506793A (en) * | 1999-08-09 | 2003-02-18 | クロス マッチ テクノロジーズ, インコーポレイテッド | System and method for transmitting a packet having a location address and line scan data via an interface cable |
WO2001011550A1 (en) * | 1999-08-09 | 2001-02-15 | Cross Match Technologties, Inc. | Method, system, and computer program product for a gui to fingerprint scanner interface |
US6658164B1 (en) | 1999-08-09 | 2003-12-02 | Cross Match Technologies, Inc. | Calibration and correction in a fingerprint scanner |
US6483932B1 (en) | 1999-08-19 | 2002-11-19 | Cross Match Technologies, Inc. | Method and apparatus for rolled fingerprint capture |
AU2178400A (en) | 1999-10-22 | 2001-05-08 | Cross Match Technologies, Inc. | Adjustable, rotatable finger guide in a tenprint scanner with movable prism platen |
DE60027207T2 (en) * | 2000-08-18 | 2006-11-16 | Cross Match Technologies, Inc., Palm Beach Gardens | SYSTEM AND METHOD FOR AUTOMATIC CONTROL OF A FINGERPRINT KEYSTONE |
US6611152B1 (en) | 2000-10-31 | 2003-08-26 | The Boeing Company | Test adapter for configuring the electrical communication between a unit under test and an electronic test station and associated separator plate |
TW561263B (en) * | 2001-03-10 | 2003-11-11 | Samsung Electronics Co Ltd | Parallel test board used in testing semiconductor memory devices |
US6504730B1 (en) * | 2001-07-23 | 2003-01-07 | Hamilton Sundstrand Corporation | Serviceable power modules for a power distribution assembly |
US6841990B2 (en) * | 2001-10-31 | 2005-01-11 | Agilent Technologies, Inc. | Mechanical interface for rapid replacement of RF fixture components |
ATE406626T1 (en) | 2002-01-17 | 2008-09-15 | Cross Match Technologies Inc | FINGERPRINT WORKSTATION AND METHOD |
US6954260B2 (en) | 2002-01-17 | 2005-10-11 | Cross Match Technologies, Inc. | Systems and methods for illuminating a platen in a print scanner |
JP2003307552A (en) * | 2002-04-17 | 2003-10-31 | Tokyo Electron Ltd | Contact body for signal detection and signal calibrating device |
AU2003254280A1 (en) * | 2002-08-02 | 2004-02-23 | Cross Match Technologies, Inc. | System and method for counting ridges in a captured print image |
US6906544B1 (en) * | 2003-02-14 | 2005-06-14 | Cisco Technology, Inc. | Methods and apparatus for testing a circuit board using a surface mountable adaptor |
US7164440B2 (en) * | 2003-02-28 | 2007-01-16 | Cross Match Technologies, Inc. | Dynamic image adaptation method for adjusting the quality of digital prints |
EP1612571A4 (en) * | 2003-04-04 | 2010-03-03 | Advantest Corp | Connection unit, test head, and test device |
US7082676B2 (en) * | 2003-08-05 | 2006-08-01 | Qualitau, Inc. | Electrostatic discharge (ESD) tool for electronic device under test (DUT) boards |
US20050047631A1 (en) * | 2003-08-26 | 2005-03-03 | Cross Match Technologies, Inc. | Method and apparatus for rolled fingerprint image capture with variable blending |
TWI273248B (en) | 2006-01-26 | 2007-02-11 | Au Optronics Corp | Universal probing apparatus for TFT array test |
WO2008128286A1 (en) * | 2007-04-18 | 2008-10-30 | Tiip Pty Ltd | Test instrument enclosure |
US20080295090A1 (en) * | 2007-05-24 | 2008-11-27 | Lockheed Martin Corporation | Software configuration manager |
US7866784B2 (en) * | 2008-08-19 | 2011-01-11 | Silverbrook Research Pty Ltd | Diagnostic probe assembly for printhead integrated circuitry |
CN107608842B (en) * | 2017-10-31 | 2023-11-21 | 江苏特创科技有限公司 | Interface test assembly and interface test device |
KR102107111B1 (en) | 2019-09-19 | 2020-05-06 | 한화시스템 주식회사 | Lru combined sru testing apparatus and method |
KR102466483B1 (en) * | 2021-12-20 | 2022-11-11 | 한화시스템 주식회사 | Testing apparatus and method for sru using multiple signal |
CN116027124A (en) * | 2022-10-21 | 2023-04-28 | 深圳市朗科智能电气股份有限公司 | Detachable modular test platform |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0115135A1 (en) * | 1982-12-27 | 1984-08-08 | Genrad, Inc. | Electrical test fixture for printed circuit boards and the like |
EP0463684A1 (en) * | 1990-06-28 | 1992-01-02 | Koninklijke Philips Electronics N.V. | Test device for electric circuits on boards |
US5103378A (en) * | 1990-09-21 | 1992-04-07 | Virginia Panel Corporation | Hinged interlocking receiver for mainframe card cage |
US5406199A (en) * | 1993-07-28 | 1995-04-11 | At&T Corp. | Test fixture carrying a channel card for logic level translation |
Family Cites Families (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3654585A (en) * | 1970-03-11 | 1972-04-04 | Brooks Research And Mfg Inc | Coordinate conversion for the testing of printed circuit boards |
US3751649A (en) * | 1971-05-17 | 1973-08-07 | Marcrodata Co | Memory system exerciser |
US3854125A (en) * | 1971-06-15 | 1974-12-10 | Instrumentation Engineering | Automated diagnostic testing system |
CA1038042A (en) * | 1975-03-03 | 1978-09-05 | Motorola | Programmable probe fixture and method of connecting units under test with test equipment |
US4352061A (en) * | 1979-05-24 | 1982-09-28 | Fairchild Camera & Instrument Corp. | Universal test fixture employing interchangeable wired personalizers |
US4354268A (en) * | 1980-04-03 | 1982-10-12 | Santek, Inc. | Intelligent test head for automatic test system |
DE3013215A1 (en) * | 1980-04-03 | 1981-10-15 | Luther & Maelzer Gmbh, 3050 Wunstorf | ADAPTER FOR A SELF-PROGRAMMABLE CIRCUIT TEST DEVICE |
US4402055A (en) * | 1981-01-27 | 1983-08-30 | Westinghouse Electric Corp. | Automatic test system utilizing interchangeable test devices |
DE3116079A1 (en) * | 1981-04-23 | 1982-11-11 | Robert Bosch Gmbh, 7000 Stuttgart | TEST SYSTEM |
US4590581A (en) * | 1983-05-09 | 1986-05-20 | Valid Logic Systems, Inc. | Method and apparatus for modeling systems of complex circuits |
US4551675A (en) * | 1983-12-19 | 1985-11-05 | Ncr Corporation | Apparatus for testing printed circuit boards |
DK291184D0 (en) * | 1984-06-13 | 1984-06-13 | Boeegh Petersen Allan | METHOD AND DEVICE FOR TESTING CIRCUIT PLATES |
JPS6125263A (en) * | 1984-07-13 | 1986-02-04 | Sony Corp | Control system of electronic device |
US4724383A (en) * | 1985-05-03 | 1988-02-09 | Testsystems, Inc. | PC board test fixture |
US4899306A (en) * | 1985-08-26 | 1990-02-06 | American Telephone And Telegraph Company, At&T Bell Laboratories | Test interface circuit which generates different interface control signals for different target computers responding to control signals from host computer |
US4716500A (en) * | 1985-10-18 | 1987-12-29 | Tektronix, Inc. | Probe cable assembly |
US4718064A (en) * | 1986-02-28 | 1988-01-05 | Western Digital Corporation | Automatic test system |
US4901259A (en) * | 1988-08-15 | 1990-02-13 | Lsi Logic Corporation | Asic emulator |
US5291129A (en) * | 1988-10-24 | 1994-03-01 | Nhk Spring Co., Ltd. | Contact probe |
CN1045655A (en) * | 1988-11-23 | 1990-09-26 | 约翰弗兰克制造公司 | The kernel test interface and the method for system's automatic diagnosis |
US5036479A (en) * | 1989-04-20 | 1991-07-30 | Trw Inc. | Modular automated avionics test system |
US5058110A (en) * | 1989-05-03 | 1991-10-15 | Ultra Network Technologies | Protocol processor |
US5196789A (en) * | 1991-01-28 | 1993-03-23 | Golden Joseph R | Coaxial spring contact probe |
US5218302A (en) * | 1991-02-06 | 1993-06-08 | Sun Electric Corporation | Interface for coupling an analyzer to a distributorless ignition system |
US5223788A (en) * | 1991-09-12 | 1993-06-29 | Grumman Aerospace Corporation | Functional avionic core tester |
US5357519A (en) * | 1991-10-03 | 1994-10-18 | Apple Computer, Inc. | Diagnostic system |
US5175493A (en) * | 1991-10-11 | 1992-12-29 | Interconnect Devices, Inc. | Shielded electrical contact spring probe assembly |
-
1995
- 1995-12-15 US US08/573,026 patent/US5793218A/en not_active Expired - Fee Related
-
1996
- 1996-09-18 DE DE69621152T patent/DE69621152T2/en not_active Expired - Fee Related
- 1996-09-18 AU AU71128/96A patent/AU7112896A/en not_active Abandoned
- 1996-09-18 KR KR10-1998-0704459A patent/KR100479136B1/en not_active IP Right Cessation
- 1996-09-18 ES ES96932262T patent/ES2175129T3/en not_active Expired - Lifetime
- 1996-09-18 WO PCT/US1996/014949 patent/WO1997022886A1/en not_active Application Discontinuation
- 1996-09-18 EP EP96932262A patent/EP0866977B1/en not_active Expired - Lifetime
- 1996-09-18 PT PT96932262T patent/PT866977E/en unknown
- 1996-09-30 IN IN1728CA1996 patent/IN189781B/en unknown
- 1996-12-13 TW TW085115431A patent/TW312747B/zh active
-
1998
- 1998-11-28 HK HK98112440A patent/HK1011223A1/en not_active IP Right Cessation
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0115135A1 (en) * | 1982-12-27 | 1984-08-08 | Genrad, Inc. | Electrical test fixture for printed circuit boards and the like |
EP0463684A1 (en) * | 1990-06-28 | 1992-01-02 | Koninklijke Philips Electronics N.V. | Test device for electric circuits on boards |
US5103378A (en) * | 1990-09-21 | 1992-04-07 | Virginia Panel Corporation | Hinged interlocking receiver for mainframe card cage |
US5406199A (en) * | 1993-07-28 | 1995-04-11 | At&T Corp. | Test fixture carrying a channel card for logic level translation |
Non-Patent Citations (1)
Title |
---|
POINTL P: "INTERFACING, OFTEN A PERFORMANCE BOTTLENECK BETWEEN ATE AND DEVICE UNDER TEST", PROCEEDINGS OF THE EUROPEAN TEST CONFERENCE, PARIS, APRIL 12 - 14, 1989, no. 1989, 12 April 1989 (1989-04-12), INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, pages 94 - 99, XP000044375 * |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2013164407A1 (en) * | 2012-05-03 | 2013-11-07 | Turbodynamics Gmbh | Module for exchanging an interface unit in a testing system for testing semiconductor components and testing system comprising such a module |
US9519023B2 (en) | 2012-05-03 | 2016-12-13 | Turbodynamics Gmbh | Module for exchanging an interface unit in a testing system for testing semiconductor components and testing system comprising such a module |
FR2996367A1 (en) * | 2012-10-01 | 2014-04-04 | Airbus Operations Sas | CONNECTION SYSTEM FOR CONNECTING AN ELECTRONIC EQUIPMENT, IN PARTICULAR FOR AN AIRCRAFT, TO A TEST UNIT. |
US9261230B2 (en) | 2012-10-01 | 2016-02-16 | Airbus Operations (S.A.S.) | Connection system for connecting an electronic device, in particular for an aircraft, to a test unit |
CN106324460A (en) * | 2016-11-08 | 2017-01-11 | 沈小晴 | Universal test mechanism with switchable dial |
CN106324460B (en) * | 2016-11-08 | 2024-03-22 | 沈小晴 | Universal test mechanism with replaceable dial |
Also Published As
Publication number | Publication date |
---|---|
EP0866977B1 (en) | 2002-05-08 |
AU7112896A (en) | 1997-07-14 |
TW312747B (en) | 1997-08-11 |
EP0866977A1 (en) | 1998-09-30 |
ES2175129T3 (en) | 2002-11-16 |
PT866977E (en) | 2002-09-30 |
IN189781B (en) | 2003-04-19 |
DE69621152T2 (en) | 2003-01-02 |
KR100479136B1 (en) | 2005-05-16 |
DE69621152D1 (en) | 2002-06-13 |
KR20000064402A (en) | 2000-11-06 |
HK1011223A1 (en) | 1999-07-09 |
US5793218A (en) | 1998-08-11 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5793218A (en) | Generic interface test adapter | |
US4922191A (en) | Electronic testing equipment interconnection assembly | |
US6379183B1 (en) | Adapter usable with an electronic interconnect for high speed signal and data transmission | |
US7521634B2 (en) | Multi-Channel signal acquisition probe | |
US5828223A (en) | Universal chip tester interface device | |
US10069257B1 (en) | Inline compression RF connector | |
JP2630509B2 (en) | Probe device for circuit test | |
US4634209A (en) | Modular plug connector | |
US20060006892A1 (en) | Flexible test head internal interface | |
US8354853B2 (en) | Test electronics to device under test interfaces, and methods and apparatus using same | |
US5010446A (en) | Multi-edge extender board | |
JP2011527819A (en) | Carrier assembly and system configured to common ground headers | |
JPH0236595A (en) | Interconnection device between high density circuit boards | |
US5397241A (en) | High density electrical connector | |
EP0977045A2 (en) | Apparatus for coupling a test head and probe card in a wafer testing system | |
US6433562B1 (en) | Method and apparatus of interconnecting with a system board | |
US6252391B1 (en) | High frequency probe | |
US5021000A (en) | Zero insertion force socket with low inductance and capacitance | |
US6611152B1 (en) | Test adapter for configuring the electrical communication between a unit under test and an electronic test station and associated separator plate | |
US5967814A (en) | Adjustable angle extender card | |
JPH09501793A (en) | Self-switching connector for electronic systems | |
EP2876739B1 (en) | High performance liga spring interconnect system for probing application | |
US6040701A (en) | Thin profile vertically oriented probe adapter | |
JPH0374995A (en) | Digital signal cross connection assembly | |
EP1432078A1 (en) | Cable connector shell |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AK | Designated states |
Kind code of ref document: A1 Designated state(s): AL AM AT AU AZ BA BB BG BR BY CA CH CN CU CZ DE DK EE ES FI GB GE HU IL IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MD MG MK MN MW MX NO NZ PL PT RO RU SD SE SG SI SK TJ TM TR TT UA UG UZ VN AM AZ BY KG KZ MD RU TJ TM |
|
AL | Designated countries for regional patents |
Kind code of ref document: A1 Designated state(s): KE LS MW SD SZ UG AT BE CH DE DK ES FI FR GB GR IE IT LU MC NL PT SE BF BJ CF CG CI |
|
DFPE | Request for preliminary examination filed prior to expiration of 19th month from priority date (pct application filed before 20040101) | ||
121 | Ep: the epo has been informed by wipo that ep was designated in this application | ||
WWE | Wipo information: entry into national phase |
Ref document number: 1996932262 Country of ref document: EP |
|
WWE | Wipo information: entry into national phase |
Ref document number: 1019980704459 Country of ref document: KR |
|
NENP | Non-entry into the national phase |
Ref country code: JP Ref document number: 97522763 Format of ref document f/p: F |
|
WWP | Wipo information: published in national office |
Ref document number: 1996932262 Country of ref document: EP |
|
REG | Reference to national code |
Ref country code: DE Ref legal event code: 8642 |
|
WWP | Wipo information: published in national office |
Ref document number: 1019980704459 Country of ref document: KR |
|
WWG | Wipo information: grant in national office |
Ref document number: 1996932262 Country of ref document: EP |
|
WWR | Wipo information: refused in national office |
Ref document number: 1019980704459 Country of ref document: KR |