WO1994014201B1 - Electrical interconnect structures - Google Patents

Electrical interconnect structures

Info

Publication number
WO1994014201B1
WO1994014201B1 PCT/US1993/011632 US9311632W WO9414201B1 WO 1994014201 B1 WO1994014201 B1 WO 1994014201B1 US 9311632 W US9311632 W US 9311632W WO 9414201 B1 WO9414201 B1 WO 9414201B1
Authority
WO
WIPO (PCT)
Prior art keywords
dielectric material
layer
electrically conducting
conducting film
depositing
Prior art date
Application number
PCT/US1993/011632
Other languages
French (fr)
Other versions
WO1994014201A1 (en
Filing date
Publication date
Application filed filed Critical
Priority to JP6514230A priority Critical patent/JPH08504541A/en
Priority to KR1019950702436A priority patent/KR950704819A/en
Priority to EP94904394A priority patent/EP0674808B1/en
Priority to DE69309306T priority patent/DE69309306T2/en
Publication of WO1994014201A1 publication Critical patent/WO1994014201A1/en
Publication of WO1994014201B1 publication Critical patent/WO1994014201B1/en

Links

Abstract

Electrical interconnect structures comprised of high temperature superconducting signal layers on a substrate bonded to one another or optionally to a base substructure containing power and ground planes and processes for their preparation are disclosed.

Claims

AMENDED CLAIMS
[received by the International Bureau on 21 June 1994 (21.06.94); original claims 1-11 unchanged; original claims 12-16 cancelled (1 page)]
(b) depositing a layer of dielectric material onto the electrically conducting film;
(d) depositing a second electrically conducting film which can serve as a ground plane or power plane onto the layer of dielectric material;
(3) bonding the exposed patterned signal layer of substructure D to the exposed electrically conducting film of substructure A with a layer of dielectric material having a thickness of at least 2 μm and a dielectric constant of less than about 5; and
(4) producing holes through the top surface (reduced first crystal substrate) of the combined substructures D and A to the power plane, ground plane, and signal layers and depositing metal into the holes to provide vias to said planes and layers to yield the electrical interconnect structure.
9. The process of Claim 8 wherein the thickness of the first single crystal substrate is reduced to a maximum thickness of about 5 μm. 10. The structure and processes of Claim 1, 4, or 8 wherein the dielectric material bonding the substructures to one another is a polymer.
11. The structure and process of Claim 2, 4, or 8 wherein the power plane and the ground plane are expitaxially grown high temperature oxide super¬ conductors, and the single crystal substrates of the signal layers are LaAlθ3, MgO, sapphire or NdGaθ3.
AMENDED SHEET(ARHCLE19)
PCT/US1993/011632 1992-12-15 1993-12-07 Electrical interconnect structures WO1994014201A1 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP6514230A JPH08504541A (en) 1992-12-15 1993-12-07 Electrical interconnection structure
KR1019950702436A KR950704819A (en) 1992-12-15 1993-12-07 ELECTRICAL INTERCONNECT STRUCTURES
EP94904394A EP0674808B1 (en) 1992-12-15 1993-12-07 Electrical interconnect structures
DE69309306T DE69309306T2 (en) 1992-12-15 1993-12-07 Electrical connection structures

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US99227592A 1992-12-15 1992-12-15
US8046393A 1993-06-21 1993-06-21
US07/992,275 1993-06-21
US08/080,463 1993-06-21

Publications (2)

Publication Number Publication Date
WO1994014201A1 WO1994014201A1 (en) 1994-06-23
WO1994014201B1 true WO1994014201B1 (en) 1994-08-04

Family

ID=26763551

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US1993/011632 WO1994014201A1 (en) 1992-12-15 1993-12-07 Electrical interconnect structures

Country Status (8)

Country Link
US (1) US5567330A (en)
EP (1) EP0674808B1 (en)
JP (1) JPH08504541A (en)
KR (1) KR950704819A (en)
CA (1) CA2150913A1 (en)
DE (1) DE69309306T2 (en)
TW (1) TW245839B (en)
WO (1) WO1994014201A1 (en)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5759625A (en) * 1994-06-03 1998-06-02 E. I. Du Pont De Nemours And Company Fluoropolymer protectant layer for high temperature superconductor film and photo-definition thereof
JP2871516B2 (en) * 1995-03-22 1999-03-17 株式会社移動体通信先端技術研究所 Oxide superconducting thin film device
US5662816A (en) * 1995-12-04 1997-09-02 Lucent Technologies Inc. Signal isolating microwave splitters/combiners
US6073482A (en) * 1997-07-21 2000-06-13 Ysi Incorporated Fluid flow module
US5932799A (en) * 1997-07-21 1999-08-03 Ysi Incorporated Microfluidic analyzer module
US6293012B1 (en) 1997-07-21 2001-09-25 Ysi Incorporated Method of making a fluid flow module
SE9904263L (en) 1999-11-23 2001-05-24 Ericsson Telefon Ab L M Superconducting substrate structure and a method for producing such a structure
US20050062131A1 (en) * 2003-09-24 2005-03-24 Murduck James Matthew A1/A1Ox/A1 resistor process for integrated circuits
KR102266022B1 (en) * 2014-03-07 2021-06-16 스미토모 덴키 고교 가부시키가이샤 Oxide superconducting thin film wire and method for producing same
JP6789385B2 (en) * 2016-09-13 2020-11-25 グーグル エルエルシー Reduction of loss in stacked quantum devices
JP7003719B2 (en) * 2018-02-16 2022-02-04 日本電信電話株式会社 Magnetic materials and elements

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59144190A (en) * 1983-02-08 1984-08-18 Agency Of Ind Science & Technol Mounting substrate for superconductive circuit
US4474828A (en) * 1983-03-30 1984-10-02 Sperry Corporation Method of controlling the supercurrent of a Josephson junction device
KR900001273B1 (en) * 1983-12-23 1990-03-05 후지쑤 가부시끼가이샤 Semiconductor integrated circuit device
JPS61239649A (en) * 1985-04-13 1986-10-24 Fujitsu Ltd High-speed integrated circuit package
CA1329952C (en) * 1987-04-27 1994-05-31 Yoshihiko Imanaka Multi-layer superconducting circuit substrate and process for manufacturing same
EP0301962B1 (en) * 1987-07-27 1994-04-20 Sumitomo Electric Industries Limited A superconducting thin film and a method for preparing the same
US4980339A (en) * 1987-07-29 1990-12-25 Matsushita Electric Industrial Co., Ltd. Superconductor structure
US4837609A (en) * 1987-09-09 1989-06-06 American Telephone And Telegraph Company, At&T Bell Laboratories Semiconductor devices having superconducting interconnects
JPH01157007A (en) * 1987-12-11 1989-06-20 Sony Corp Superconductive wire material
JPH01158757A (en) * 1987-12-16 1989-06-21 Hitachi Ltd Circuit mounting structure
JP2598973B2 (en) * 1988-07-27 1997-04-09 三洋電機株式会社 Laminated superconducting element
EP0358879A3 (en) * 1988-09-13 1991-02-27 Hewlett-Packard Company Method of making high density interconnects
US5087605A (en) * 1989-06-01 1992-02-11 Bell Communications Research, Inc. Layered lattice-matched superconducting device and method of making
JPH0710005B2 (en) * 1989-08-31 1995-02-01 アメリカン テレフォン アンド テレグラフ カムパニー Superconductor interconnection device
US5159347A (en) * 1989-11-14 1992-10-27 E-Systems, Inc. Micromagnetic circuit
WO1992020108A1 (en) * 1991-05-08 1992-11-12 Superconductor Technologies, Inc. Multichip interconnect module including superconductive materials
EP0538077B1 (en) * 1991-10-18 1996-05-22 Shinko Electric Industries Co. Ltd. Super conducting quantum interference device

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