WO1993008446A1 - Dispositif et methode de controle non destructif et continu d'une variation de l'epaisseur de profiles - Google Patents

Dispositif et methode de controle non destructif et continu d'une variation de l'epaisseur de profiles Download PDF

Info

Publication number
WO1993008446A1
WO1993008446A1 PCT/FR1992/000922 FR9200922W WO9308446A1 WO 1993008446 A1 WO1993008446 A1 WO 1993008446A1 FR 9200922 W FR9200922 W FR 9200922W WO 9308446 A1 WO9308446 A1 WO 9308446A1
Authority
WO
WIPO (PCT)
Prior art keywords
profile
radiation
thickness
emitted
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/FR1992/000922
Other languages
English (en)
French (fr)
Inventor
Joseph Martin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
IFP Energies Nouvelles IFPEN
Original Assignee
IFP Energies Nouvelles IFPEN
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by IFP Energies Nouvelles IFPEN filed Critical IFP Energies Nouvelles IFPEN
Priority to DE69212299T priority Critical patent/DE69212299T2/de
Priority to US08/078,310 priority patent/US5399016A/en
Priority to EP92921797A priority patent/EP0563356B1/fr
Priority to JP5507477A priority patent/JPH06503650A/ja
Publication of WO1993008446A1 publication Critical patent/WO1993008446A1/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material

Definitions

  • the present invention relates to a device and to a method for non-destructive and continuous measurement and / or control of the thickness of a profile.
  • the present invention provides a method and a device for non-destructive and continuous measurement and / or control of the thickness of a profile overcoming the drawbacks of the methods of the prior art.
  • the method and the device according to the invention easily apply to the case of corrugated profiles whatever the shape and amplitude of the corrugations.
  • the method of the invention is based on the measurement of the radiation emitted by the profile during a heating phase or a cooling phase.
  • a material of substantially homogeneous density cools, or heats up, the more quickly the less its thickness.
  • the radiation emitted by the profile during a thermal transient regime that is to say during its heating or at during its cooling, it is possible to observe or measure continuously thicknesses or variations in thickness.
  • a material of substantially homogeneous density emits radiation, in particular infrared, whose power is proportional to the fourth power of its surface temperature.
  • the evolution of the surface temperature depends on the thickness of the profile.
  • each variation in thickness corresponds to different surface temperatures, therefore radiation emissions, in particular infrared radiation of different powers.
  • This phenomenon is more marked for materials having a low thermal conductivity, and for which the cooling or the heating is generally faster than the homogenization of the temperature within the material.
  • the present invention makes it possible in particular, but not exclusively, to carry out a continuous, non-destructive control, by infrared camera, of the thickness of thermoplastic corrugated tubes constituting for example the core of reinforced corrugated tubes.
  • the device for non-destructive and continuous measurement and / or control of the thickness of a profile, according to the present invention uses this physical phenomenon.
  • the device according to the invention comprises in combination:
  • the means for detecting and measuring the radiation emitted is connected to a means for recording the measurement of this radiation.
  • the means for detecting and measuring the emitted radiation comprises an infrared camera connected to a display screen and / or to a computer system comprising image processing software.
  • the computer system will preferably include means for storing the images. provided by the infrared camera and / or results provided by the image processing software.
  • the device will comprise at least one means allowing the profile to travel, for example tracks, and at least one means allowing the synchronization of this travel with the scanning movement of the detection and measurement means. of the radiation emitted, so that the entire surface of the profile is scanned by said detection and measurement means.
  • the device of the present invention can be used for non-destructive and continuous measurement and / or control of the thickness of a profile during its manufacture.
  • the profile heating means consists of the device for shaping said profile.
  • This shaping device can for example be an extruder, a pultruder machine die or any other device well known to those skilled in the art.
  • the device of the present invention can be used for non-destructive and continuous measurement and / or control of the thickness of a profile before its use, for example at the time of its manufacture, but also after its manufacture or in a remote site. from its place of manufacture.
  • the means of heating or reheating said profile is usually chosen from the group formed by electrical resistances, gaseous fluids or hot liquids and sources of heat by radiation (for example ramps of infrared lamps). .
  • the heating may for example be obtained by circulation of a hot fluid, such as for example air, water, a mineral or organic oil, around said profile or in the case of a profile having the form of 'a tube, inside of it.
  • the profile is most often heated so that its temperature is at least 50 ° C higher than ambient temperature in the area located at the level of the radiation detection and measurement means.
  • the maximum heating temperature depends on the material or materials constituting said profile; it is most often at most equal to the profile formation temperature, for example the extrusion temperature of the thermoplastic material used which is most often about 160 to about 280 ° C.
  • the position of the radiation detection and measurement means relative to that of the heating means depends both on the material of which the profile is made, on the temperature at which it is heated and on its average thickness.
  • This detection and measurement means is preferably positioned at a point where the temperature of said profile is from about 50 ° C to about 140 ° C.
  • the distance between this means and the profile itself is not critical and can be easily chosen by a person skilled in the art according to the characteristics of this detection and measurement means, and in particular according to its detection sensitivity.
  • an alarm system may for example be controlled by the computer system, the image processing software of which can, after calibration, convert the measured temperatures into thicknesses. It is thus possible to set one or more thresholds or alarm levels. We could for example consider setting an alarm threshold for a thickness greater than a previously chosen value and an alarm threshold for a thickness less than a previously chosen value, or choose only one alarm threshold, for example for a thickness less than a previously chosen value.
  • the means allowing the detection and measurement means to scan the entire surface of the profile can include a guide system such as for example a rail on which said detection and measurement means can be fixed so as to be mobile.
  • the present invention also relates to a method of non-destructive and continuous measurement and / or control of the thickness of a profile, characterized in that it comprises in combination: the creation of a temperature variation of said profile up to at a temperature sufficient for said profile to emit radiation, and the detection and measurement, over the entire surface of said profile, of the radiation emitted by said profile.
  • said profile is heated to a temperature such that it emits infrared radiation having a wavelength substantially between 2 and 25 micrometers and preferably between 2 and 5 micrometers.
  • the method of the present invention comprises recording the radiation emitted by the profile, viewing and / or processing it using a computer system comprising image processing software.
  • the method of the invention comprises scrolling the profile and recording the radiation emitted by synchronized scanning of the entire surface of the profile by the radiation detector.
  • thermoplastic materials such as those made of polyethylene (PE), polypropylene (PP), polyamide (PA), polyvinyl chloride.
  • thermoplastic materials may or may not be reinforced with fibers such as for example glass fibers, carbon fibers, or aromatic polyamides such as for example Kevlar (registered trademark). These materials all have a relatively low thermal conductivity and a high emissivity, especially in the range of wavelengths corresponding to infrared.
  • the present method can be. applied to the control and measurement of the thickness of flat or tubular profiles having a substantially circular, oval, elliptical, rectangular section or any other shape defined by a closed curve. It is particularly well suited for checking or measuring the thickness of tubes or corrugated sheets.
  • the undulations can have any shape and a very variable amplitude. These undulations are for example undulations of sinusoidal, square or rectangular section.
  • the profiles usually have an average thickness of about 0.1 millimeter to about 20 millimeters and most often about 0.2 millimeter to about 10 millimeters.
  • the device of the present invention is illustrated diagrammatically in FIG. 1 while FIG. 2 is a simplified visualization of a corrugated tube.
  • the device according to the invention shown diagrammatically in FIG. 1, comprises an extrusion device 2 allowing the continuous extrusion of a tube 1, for example of substantially circular section and having undulations of sinusoidal section.
  • the heating means 2e is in this case the extrusion apparatus itself.
  • the tube moves along its longitudinal axis YY ', for example at substantially constant speed, and its surface is scanned by an infrared camera 3 positioned on a mobile carriage moving simultaneously on a rail 4 perpendicular to the axis YY' of the tube.
  • the infrared camera is connected to a computer system 5 comprising a display screen 6.
  • FIG. 2 is a visualization of a thickness control of a PVDF tube of average thickness equal to 1 millimeter.
  • the device used to carry out this control is that shown diagrammatically in FIG. 1.
  • the infrared camera used can be a camera known per se, for example a camera of the registered trademark THERMOVISION sold by the French company AGEMA, this camera is cooled to liquid nitrogen, and has a spectral band of 2 to 5 micrometers.
  • the associated computer system can be a system marketed by the company AGEMA, referenced TIC-8000, comprising an IBM PC-AT computer and a program such as CATS-E developed by the company AGEMA for thermal analysis purposes.
  • the screen printing reproduced in FIG. 2 is carried out using an inkjet printer known per se.
  • the invention therefore consists in scanning the entire surface of the profile to be examined using an infrared camera 3, the profile then being in thermal transient, that is to say either during the heating period, or in cooling period, anyway emitting radiation capable of being detected by said camera.
  • the computer system associated with the infrared camera 3 comprises in particular a means of recording the emitted radiation, a means of storing the images supplied by the camera, a means of processing said images, a means of storing the results supplied by the means image processing.
  • each variation in thickness results in the appearance of a spot on the image of the profile viewed on the screen, a spot corresponding to a variation in color or in a variation grayscale for black and white screens.
  • FIG. 2 shows a simplified screen display according to which one can see three spots A, B, C corresponding respectively to three faults.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Radiation Pyrometers (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
PCT/FR1992/000922 1991-10-21 1992-09-30 Dispositif et methode de controle non destructif et continu d'une variation de l'epaisseur de profiles Ceased WO1993008446A1 (fr)

Priority Applications (4)

Application Number Priority Date Filing Date Title
DE69212299T DE69212299T2 (de) 1991-10-21 1992-09-30 Vorrichtung und verfahren zur kontinuierlichen zerstörungsfreien überwachung der dickenäderung von profilkörpern
US08/078,310 US5399016A (en) 1991-10-21 1992-09-30 Device and method for continuously and non-destructively monitoring variation in the thickness of shaped sections
EP92921797A EP0563356B1 (fr) 1991-10-21 1992-09-30 Dispositif et methode de controle non destructif et continu d'une variation de l'epaisseur de profiles
JP5507477A JPH06503650A (ja) 1991-10-21 1992-09-30 形鋼の厚みの変化の非破壊連続検査システムおよび方法

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR9112989A FR2682757A1 (fr) 1991-10-21 1991-10-21 Dispositif et methode de controle non destructif et continu de l'epaisseur de profiles.
FR91/12989 1991-10-21

Publications (1)

Publication Number Publication Date
WO1993008446A1 true WO1993008446A1 (fr) 1993-04-29

Family

ID=9418159

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/FR1992/000922 Ceased WO1993008446A1 (fr) 1991-10-21 1992-09-30 Dispositif et methode de controle non destructif et continu d'une variation de l'epaisseur de profiles

Country Status (7)

Country Link
US (1) US5399016A (enExample)
EP (1) EP0563356B1 (enExample)
JP (1) JPH06503650A (enExample)
DE (1) DE69212299T2 (enExample)
ES (1) ES2092132T3 (enExample)
FR (1) FR2682757A1 (enExample)
WO (1) WO1993008446A1 (enExample)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5376793A (en) * 1993-09-15 1994-12-27 Stress Photonics, Inc. Forced-diffusion thermal imaging apparatus and method
EP0718735B1 (de) * 1994-12-23 1999-12-22 Findlay Industries Deutschland GmbH Verfahren und Vorrichtung zum Bestimmen der auf einer Flächeneinheit vorliegenden Menge eines Klebstoffes sowie Verfahren und Vorrichtung zum Steuern der auf eine Flächeneinheit aufzutragenden Menge eines Klebstoffes
US6224699B1 (en) 1998-11-12 2001-05-01 Kimberly-Clark Worldwide, Inc. Infrared imaging to detect components on personal care articles
US6354984B1 (en) 1999-04-02 2002-03-12 Kimberly-Clark Worldwide, Inc. Indirect registration of elements of web-derived product
US6352497B1 (en) 1999-04-02 2002-03-05 Kimberly-Clark Worldwide, Inc. Detectable marks in trim material
US6394646B1 (en) * 1999-04-16 2002-05-28 General Electric Company Method and apparatus for quantitative nondestructive evaluation of metal airfoils using high resolution transient thermography
US6367969B1 (en) * 1999-07-21 2002-04-09 General Electric Company Synthetic reference thermal imaging method
US6888143B2 (en) * 2002-03-09 2005-05-03 Kimberly-Clark Worldwide, Inc. Apparatus and method for inspecting pre-fastened articles
US6885451B2 (en) * 2002-03-09 2005-04-26 Kimberly-Clark Worldwide, Inc. Infrared detection of composite article components
US6919965B2 (en) 2002-03-09 2005-07-19 Kimberly-Clark Worldwide, Inc. Apparatus and method for making and inspecting pre-fastened articles
US6927857B2 (en) * 2002-03-09 2005-08-09 Kimberly-Clark Worldwide, Inc. Process for the detection of marked components of a composite article using infrared blockers
US6900450B2 (en) 2002-03-09 2005-05-31 Kimberly-Clark Worldwide, Inc. Method and apparatus for inferring item position based on multiple data
US7123765B2 (en) * 2002-07-31 2006-10-17 Kimberly-Clark Worldwide, Inc. Apparatus and method for inspecting articles
CN101027548B (zh) * 2004-06-24 2012-05-23 弗兰克公司 用于监视和检测塑料包装密封部中的缺陷的方法和设备
US20060124853A1 (en) * 2004-12-10 2006-06-15 Andrew Corporation Non-contact surface coating monitor and method of use
US20070237201A1 (en) * 2006-04-06 2007-10-11 Ircon, Inc. Method and Apparatus for Analyzing Thermo-Graphic Images to Detect Defects in Thermally Sealed Packaging
US8486576B2 (en) * 2008-12-02 2013-07-16 Institute Of Nuclear Energy Research In-line height measurement system for planar fuel cell
PL224744B1 (pl) * 2012-06-15 2017-01-31 Akademia Górniczo Hutnicza Im Stanisława Staszica W Krakowie Urządzenie do oceny stanu technicznego powierzchni cięgien wykonanych z gumy lub tworzywa sztucznego
US10929969B2 (en) 2016-08-25 2021-02-23 Accusentry, Inc. Method and apparatus for measuring and profiling absorbent material in an absorbent article
CN107228876B (zh) * 2017-06-26 2021-01-12 东旭光电科技股份有限公司 一种评价玻璃基板热收缩的方法
CN111928959B (zh) * 2020-07-21 2024-05-03 国家能源集团新能源技术研究院有限公司 管屏换热器换热管表面温度分布的测量方法及装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3535522A (en) * 1966-12-22 1970-10-20 Glass Container Ind Research Process and apparatus for monitoring thickness of shaped transparent items
WO1981003704A1 (en) * 1980-06-10 1981-12-24 Valmet Oy Procedure for examining the surface quality of materials in solid state of aggregation,and means for carrying out the procedure
DE4003407A1 (de) * 1990-02-05 1991-08-08 Siemens Ag Verfahren und anordnung zum pruefen der oberflaeche von bewegten objekten

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3504524A (en) * 1966-09-09 1970-04-07 Automation Ind Inc Method of thermal material inspection
US3843290A (en) * 1972-12-18 1974-10-22 Sender Ornamental Iron Works Extrusion die
US3973122A (en) * 1974-06-17 1976-08-03 Ixcon Inc. Measuring apparatus
SU565239A1 (ru) * 1974-12-17 1977-07-15 Предприятие П/Я Р-6303 Способ обнаружени локальных дефектов
SU800614A1 (ru) * 1979-04-17 1981-01-30 Киевский Филиал Всесоюзного Науч-Ho-Исследовательского И Проектно- Конструкторского Института По Ab-Томатизации Предприятий Промышлен-Ности Строительных Материалов Способ контрол толщины выт ги-ВАЕМОй B ВАлКАХ лЕНТы СТЕКлА
JPS58124938A (ja) * 1982-01-22 1983-07-25 Ebara Corp 赤外線検出探傷装置
FR2563342B1 (fr) * 1984-04-24 1988-03-25 Somafer Sa Procede de detection et d'enregistrement des defauts sur semi-produits siderurgiques chauds
US4854724A (en) * 1984-07-09 1989-08-08 Lockheed Corporation Method of and apparatus for thermographic evaluation of spot welds
US4818118A (en) * 1984-11-26 1989-04-04 General Electric Company Coating thickness measurement
US4783647A (en) * 1985-12-20 1988-11-08 Aeonic Systems, Inc. Sheet material manufacturing
JPS62172249A (ja) * 1986-01-25 1987-07-29 Kajima Corp 煙突の劣化診断方法及び装置
GB2197465B (en) * 1986-09-17 1990-05-30 Atomic Energy Authority Uk Crack sizing
JPS63124948A (ja) * 1986-11-14 1988-05-28 Kyoei Sangyo Kk プリント配線板検査装置
US4872762A (en) * 1987-08-25 1989-10-10 Nkk Corporation Method and apparatus for detecting defective portion on inner surface of pipe
US4886370A (en) * 1987-08-25 1989-12-12 Nkk Corporation Method for detecting a state of substance existing in pipe
JPS6480441A (en) * 1987-09-24 1989-03-27 Kenkichi Murakami Polymer absorbing chlorinated solvent and treating apparatus for waste water and waste gas
JPH01214749A (ja) * 1988-02-23 1989-08-29 Nkk Corp 充填枠体の充填物充填状況検出方法
DE3820862A1 (de) * 1988-06-21 1989-12-28 Soelter Hans Joachim Dipl Phys Verfahren und vorrichtung zur kontaktlosen untersuchung von oberflaechen und inneren strukturen eines festen pruefkoerpers
JPH02309205A (ja) * 1989-05-24 1990-12-25 Hitachi Shonan Denshi Co Ltd 粘着テープの厚み検査装置
US5052816A (en) * 1989-08-29 1991-10-01 Denyo Kabushiki Kaisha Junction inspection method and apparatus for electronic parts

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3535522A (en) * 1966-12-22 1970-10-20 Glass Container Ind Research Process and apparatus for monitoring thickness of shaped transparent items
WO1981003704A1 (en) * 1980-06-10 1981-12-24 Valmet Oy Procedure for examining the surface quality of materials in solid state of aggregation,and means for carrying out the procedure
DE4003407A1 (de) * 1990-02-05 1991-08-08 Siemens Ag Verfahren und anordnung zum pruefen der oberflaeche von bewegten objekten

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
PATENT ABSTRACTS OF JAPAN vol. 15, no. 95 (P-1176)7 Mars 1991 *

Also Published As

Publication number Publication date
FR2682757A1 (fr) 1993-04-23
JPH06503650A (ja) 1994-04-21
DE69212299D1 (de) 1996-08-22
US5399016A (en) 1995-03-21
ES2092132T3 (es) 1996-11-16
EP0563356A1 (en) 1993-10-06
DE69212299T2 (de) 1996-11-21
FR2682757B1 (enExample) 1995-06-02
EP0563356B1 (fr) 1996-07-17

Similar Documents

Publication Publication Date Title
EP0563356B1 (fr) Dispositif et methode de controle non destructif et continu d'une variation de l'epaisseur de profiles
EP1965929B1 (fr) Procede et machine automatiques d'inspection et de tri d'objets selon leur epaisseur
Koepke Effective reflectance of oceanic whitecaps
EP0089760B1 (en) Transient thermography
EP2414815B1 (fr) Imagerie téra-hertz à convertisseur thermique perfectionné
EP0965037B1 (fr) Procede et dispositif d'examen photothermique d'un materiau
McRae et al. Backscatter absorption gas imaging: a new technique for gas visualization
FR2477706A1 (fr) Procede et appareil permettant de mesurer la temperature de surface et le pouvoir emissif d'un materiau chauffe
FR2970946A1 (fr) Dispositif et procede de detection de givre depose sur une surface d'un avion
EP2032973A1 (fr) Installation de production de verre plat avec equipement de mesure des contraintes, et procede de conduite d'une etenderie de recuisson de verre plat
Ma et al. Method for black ice detection on roads using tri-wavelength backscattering measurements
EP2521906B1 (fr) Procede de mesure de la corrosion dans un ouvrage en beton
FR2555749A1 (fr) Procede et appareil de preevaluation pour un essai de resistance a l'action des intemperies
Casselgren et al. Polarization resolved classification of winter road condition in the near-infrared region
EP3426613B1 (fr) Installation de production de verre plat comprenant une installation de mesure en continu de la temperature du verre et procede de reglage d'une telle installation de mesure
Schaumberger et al. Improving process reliability by means of detection of weld seam irregularities in copper via thermographic process monitoring
FR2755240A1 (fr) Procede pour determiner la qualite d'une feuille de verre plat
EP2936095A2 (fr) Mesure optique d'une temperature d'un objet, et cartographie associee
Hao et al. Photothermal detuning for absorption measurement of optical coatings
WO2013050417A1 (fr) Procédé de détermination sans contact de l'épaisseur d'un échantillon, système correspondant
WO1992007367A1 (fr) Procede et machine de marquage d'un cable electrique
Eyal et al. Fiber-optic pulsed photothermal radiometry for fast surface-temperature measurements
FR2863048A1 (fr) Procede et dispositif de mesure de l'epaisseur de paroi de pieces en matiere plastique
EP1006334B1 (fr) Cible thermique
Abramov et al. Remote Recognition of Materials Using Laser Photothermal Radiometry

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A1

Designated state(s): JP US

AL Designated countries for regional patents

Kind code of ref document: A1

Designated state(s): AT BE CH DE DK ES FR GB GR IE IT LU MC NL SE

WWE Wipo information: entry into national phase

Ref document number: 1992921797

Country of ref document: EP

WWE Wipo information: entry into national phase

Ref document number: 08078310

Country of ref document: US

WWP Wipo information: published in national office

Ref document number: 1992921797

Country of ref document: EP

WWG Wipo information: grant in national office

Ref document number: 1992921797

Country of ref document: EP