SU565239A1 - Способ обнаружени локальных дефектов - Google Patents
Способ обнаружени локальных дефектовInfo
- Publication number
- SU565239A1 SU565239A1 SU7402083600A SU2083600A SU565239A1 SU 565239 A1 SU565239 A1 SU 565239A1 SU 7402083600 A SU7402083600 A SU 7402083600A SU 2083600 A SU2083600 A SU 2083600A SU 565239 A1 SU565239 A1 SU 565239A1
- Authority
- SU
- USSR - Soviet Union
- Prior art keywords
- local defects
- detecting local
- detecting
- defects
- defectoscopy
- Prior art date
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Description
ванне технологнн изготовлени изделий, так и устранение дефектов готовой продукций.
Claims (2)
1.Экспресс-информаци «Надежиость и контроль качества, вып. 48, реф. 359, 1974.
2.Дефектоскопи , № 5, стр. 118, 1973.
3 12
ПЛ IT
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU7402083600A SU565239A1 (ru) | 1974-12-17 | 1974-12-17 | Способ обнаружени локальных дефектов |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU7402083600A SU565239A1 (ru) | 1974-12-17 | 1974-12-17 | Способ обнаружени локальных дефектов |
Publications (1)
Publication Number | Publication Date |
---|---|
SU565239A1 true SU565239A1 (ru) | 1977-07-15 |
Family
ID=20603371
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SU7402083600A SU565239A1 (ru) | 1974-12-17 | 1974-12-17 | Способ обнаружени локальных дефектов |
Country Status (1)
Country | Link |
---|---|
SU (1) | SU565239A1 (ru) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1993022663A1 (en) * | 1992-05-01 | 1993-11-11 | Exid, Inc. | Contactless testing of electronic materials and devices using microwave radiation |
US5399016A (en) * | 1991-10-21 | 1995-03-21 | Institut Francais Du Petrole | Device and method for continuously and non-destructively monitoring variation in the thickness of shaped sections |
US5709469A (en) * | 1995-03-13 | 1998-01-20 | The United States Of America As Represented By The Secretary Of The Air Force | Process for testing integrity of bonds between epoxy patches and aircraft structural materials |
US5810477A (en) * | 1993-04-30 | 1998-09-22 | International Business Machines Corporation | System for identifying surface conditions of a moving medium |
US7083327B1 (en) * | 1999-04-06 | 2006-08-01 | Thermal Wave Imaging, Inc. | Method and apparatus for detecting kissing unbond defects |
-
1974
- 1974-12-17 SU SU7402083600A patent/SU565239A1/ru active
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5399016A (en) * | 1991-10-21 | 1995-03-21 | Institut Francais Du Petrole | Device and method for continuously and non-destructively monitoring variation in the thickness of shaped sections |
WO1993022663A1 (en) * | 1992-05-01 | 1993-11-11 | Exid, Inc. | Contactless testing of electronic materials and devices using microwave radiation |
US5417494A (en) * | 1992-05-01 | 1995-05-23 | Exid, Inc. | Contactless testing of electronic materials and devices using microwaves |
US5810477A (en) * | 1993-04-30 | 1998-09-22 | International Business Machines Corporation | System for identifying surface conditions of a moving medium |
US6019503A (en) * | 1993-04-30 | 2000-02-01 | International Business Machines Corporation | Method for identifying surface conditions of a moving medium |
US5709469A (en) * | 1995-03-13 | 1998-01-20 | The United States Of America As Represented By The Secretary Of The Air Force | Process for testing integrity of bonds between epoxy patches and aircraft structural materials |
US7083327B1 (en) * | 1999-04-06 | 2006-08-01 | Thermal Wave Imaging, Inc. | Method and apparatus for detecting kissing unbond defects |
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