WO1990005907A3 - Inspection apparatus - Google Patents
Inspection apparatus Download PDFInfo
- Publication number
- WO1990005907A3 WO1990005907A3 PCT/GB1989/001372 GB8901372W WO9005907A3 WO 1990005907 A3 WO1990005907 A3 WO 1990005907A3 GB 8901372 W GB8901372 W GB 8901372W WO 9005907 A3 WO9005907 A3 WO 9005907A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- point
- focusing means
- optical axis
- object point
- inspection apparatus
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
- G02B7/28—Systems for automatic generation of focusing signals
- G02B7/30—Systems for automatic generation of focusing signals using parallactic triangle with a base line
- G02B7/305—Systems for automatic generation of focusing signals using parallactic triangle with a base line using a scanner
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Optics & Photonics (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Automatic Focus Adjustment (AREA)
Abstract
An optical apparatus including focusing means (41), an optical axis, an object point (31) and an image point on said optical axis, said object point being movable along the optical axis with respect to the focusing means, means being provided to change the effective optical distance between either the object point and the focusing means or between the image point and the focusing means to maintain the object point at a fixed point even if the image point moves.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB8827297.6 | 1988-11-23 | ||
GB888827297A GB8827297D0 (en) | 1988-11-23 | 1988-11-23 | Inspection apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
WO1990005907A2 WO1990005907A2 (en) | 1990-05-31 |
WO1990005907A3 true WO1990005907A3 (en) | 1990-07-12 |
Family
ID=10647279
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/GB1989/001372 WO1990005907A2 (en) | 1988-11-23 | 1989-11-17 | Inspection apparatus |
Country Status (3)
Country | Link |
---|---|
CA (1) | CA2003734A1 (en) |
GB (1) | GB8827297D0 (en) |
WO (1) | WO1990005907A2 (en) |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2053017A1 (en) * | 1970-10-29 | 1972-05-04 | Grundig Emv | Method for contactless distance measurement |
US3876875A (en) * | 1972-05-11 | 1975-04-08 | Philips Corp | Optical system for forming an image of an object in a given plane |
US3892494A (en) * | 1972-07-26 | 1975-07-01 | Sira Institute | Detection of optical micro-defects with focused retroreflected scanning beam |
US3910695A (en) * | 1973-02-28 | 1975-10-07 | Hitachi Ltd | Automatic focus adjusting device for use in information retrieving apparatus |
JPS59148025A (en) * | 1983-02-14 | 1984-08-24 | Victor Co Of Japan Ltd | Focus adjusting method |
EP0182471A2 (en) * | 1984-09-24 | 1986-05-28 | Sira Limited | Inspection apparatus with a scanning beam of radiation |
-
1988
- 1988-11-23 GB GB888827297A patent/GB8827297D0/en active Pending
-
1989
- 1989-11-17 WO PCT/GB1989/001372 patent/WO1990005907A2/en unknown
- 1989-11-23 CA CA 2003734 patent/CA2003734A1/en not_active Abandoned
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2053017A1 (en) * | 1970-10-29 | 1972-05-04 | Grundig Emv | Method for contactless distance measurement |
US3876875A (en) * | 1972-05-11 | 1975-04-08 | Philips Corp | Optical system for forming an image of an object in a given plane |
US3892494A (en) * | 1972-07-26 | 1975-07-01 | Sira Institute | Detection of optical micro-defects with focused retroreflected scanning beam |
US3910695A (en) * | 1973-02-28 | 1975-10-07 | Hitachi Ltd | Automatic focus adjusting device for use in information retrieving apparatus |
JPS59148025A (en) * | 1983-02-14 | 1984-08-24 | Victor Co Of Japan Ltd | Focus adjusting method |
EP0182471A2 (en) * | 1984-09-24 | 1986-05-28 | Sira Limited | Inspection apparatus with a scanning beam of radiation |
Non-Patent Citations (3)
Title |
---|
IBM Technical Disclosure Bulletin, Vol. 15, No. 2, July 1972, (New York, US) A. FROSCH et al.: "Optical Surface Microtopography Measurement and/or Automatic Focussing", pages 504-505 * |
PATENT ABSTRACTS OF JAPAN, Volume 7, No. 164 (P-211) (1309), 19 July 1983; & JP-A-5872127 (Canon K.K.) 30 April 1983 * |
PATENT ABSTRACTS OF JAPAN, Volume 8, No. 282 (P-323) (1719), 22 December 1984; & JP-A-59148025 (Nippon Victor K.K.) 24 August 1984 * |
Also Published As
Publication number | Publication date |
---|---|
CA2003734A1 (en) | 1990-05-23 |
WO1990005907A2 (en) | 1990-05-31 |
GB8827297D0 (en) | 1988-12-29 |
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