WO1989001698A1 - Electrode for use in a scanning electron microscope - Google Patents
Electrode for use in a scanning electron microscope Download PDFInfo
- Publication number
- WO1989001698A1 WO1989001698A1 PCT/SE1988/000407 SE8800407W WO8901698A1 WO 1989001698 A1 WO1989001698 A1 WO 1989001698A1 SE 8800407 W SE8800407 W SE 8800407W WO 8901698 A1 WO8901698 A1 WO 8901698A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- sample
- electrically conducting
- electrode
- scanning electron
- electron microscope
- Prior art date
Links
- 0 C1C2C=*CC12 Chemical compound C1C2C=*CC12 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00584—Control arrangements for automatic analysers
- G01N35/00722—Communications; Identification
- G01N35/00732—Identification of carriers, materials or components in automatic analysers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00584—Control arrangements for automatic analysers
- G01N35/00722—Communications; Identification
- G01N35/00732—Identification of carriers, materials or components in automatic analysers
- G01N2035/00742—Type of codes
- G01N2035/00772—Type of codes mechanical or optical code other than bar code
Definitions
- the invention relates to an electrically con- ducting electrode for analysis of multiple samples in a scanning electron microscope.
- the electrode As a sample holder with a surface (analysis surface) for supporting the sample.
- the sample may be collected and enriched on the sample holder and can be analyzed in the sample chamber of the scanning electron microscope without it being necessary to move the sample between several sample holders.
- the surface supporting the sample being constructed as a filter, possibly having two or more demountable porous surfaces of different pore sizes, the electrode can be used for collecting particles, if any, of different sizes, entrained in the sample material, on different surfaces and for enriching these particles by a filtration procedure, but it is also possible to make the surface supporting the sample impervious and to collect and enrich the sample material by centrifugal force or by an electromagnetic field.
- small par ⁇ ticles such as virus, bacteria, fungus, pollen, and asbestos fibres, entrained in liquid or gas, can be applied directly to the support surface/filter sur ⁇ face by the gas or the liquid, respectively, being sucked through the filter disc.
- the sample and also the sample holder - at least on the upper side thereof - is coated with a very thin (5 Angstrom - 500 Angstrom) layer which is applied by evaporation after evacu- ation of all air in a vacuum chamber.
- This layer as well as the sample holder is electrically con ⁇ ducting, and therefore the sample holder can then be used directly as an electrode in a scanning electron microscope for investigation of the collected par ⁇ ticle sample without moving the collected particles from one place to another.
- FIG. 1 is a partly exploded view of an elec ⁇ trode of the invention
- FIG. 2 is a vertical sectional view of the electrode in FIG. 1
- FIG. 3 is an enlarged vertical sectional view of an individual sample holder
- FIG. 4 is a plan view of the sample holder in FIG. 3, and
- FIG. 5 is a perspective view showing an alter- native embodiment of the electrode.
- FIGS. 1 and 2 disclose an elec ⁇ trode which in this case comprises an annular re ⁇ volving disc 10 having a central hub 11.
- This hub has a guide slot 12 to engage a corresponding guide rib on a pivot in a scanning electron microscope.
- the revolving disc thus can be mounted to the pivot only in a definite relative rotational position, and if the pivot is then connected to an indexing device it is possible to determine exactly the rotational position of the electrode in the scanning electron microscope.
- the re ⁇ volving disc can be arranged with a varying number of pins which always should be uniformly spaced such that when the samples are automatically run through in the sample chamber of the scanning electron microscope one will always land on the surface of the next sample holder.
- the revolving disc proper is not necessarily annular; the disc may have square, rectangular, or elliptical shape.
- the pins 13 are slightly conical and may be constructed as the male element of a Luer coupling.
- Each pin has a through passage 14 which communicates with the hub through a passage 15 in the revolving disc.
- a sample holder 16 is detachably mounted, said holder in this case being constructed as disclosed in WO 86/02160.
- the holder according to FIGS. 3 and 4 comprises a base portion 17 which forms a cavity 18 communicating through the bottom thereof with a hollow stud 19. This stud forms the female element of a Luer coupling so as to be de ⁇ tachably mounted to one of the pins 13.
- a filter disc 20 forms a supporting surface for the sample and is secured and sealed at the periphery thereof between an abutment surface surrounding the cavity, and a lock ring 21 attached to the base portion, said lock ring engaging the upper side of the filter disc at an annular flange 22.
- a groove 23 is provided to receive a projection 24 on the pin such that the sample holder can be mounted in a single predetermined rotational posi ⁇ tion only on the pin.
- a code 25 formed by a struc ⁇ tural relief is provided for the identification of the sample holder and thus the sample located there ⁇ on.
- Said code can be made by laser, and preferably data related to the code (sample) are printed at the same time by means of a printer.
- the code is located on all sample holders in a predetermined angular po ⁇ sition in relation to the groove 23. Due to the fact that the code comprises a structural relief it can be read outside as well as inside the microscope, also when the sample holder has been coated with an electrically conducting thin layer.
- the surface supporting the sample and also the annular circular surface sur- rounding said supporting surface can be analyzed automatically by means of computer based picture analysis, which means that also the code can be read by such analysis.
- the code can comprise figures or letters or a combination thereof or a bar code or other code which cannot be optically read directly, i.e. it cannot be read and understood by ocular examination.
- a marking en clair which can be optically read and can be located on the cylindrical surface surrounding the annular circular surface.
- All parts of the electrode except the filter disc should be made of an electrically conducting material.
- the base portion and the lock ring then preferably are made of an electrically conducting plastic material such as HD polyethylene, and this is true also as far as the revolving disc and the hub and pins thereof are concerned, but also a metal, e.g. aluminium, can be used for these parts.
- the code can be read in the scanning electron micro- scope. Thus, it is easy to determine which sample holder is observed in the scanning electron micro ⁇ scope.
- Suction can be applied to all sample holders when the sample is being collected, viz. through the hub of the revolving disc by connecting said hub to a suction device.
- an aeration can also take place when the electrode with the sample holders mounted thereon is exposed to a negative pressure at the metal coating and when used in the scanning electron microscope. This is important in case e.g. heavy protein layers have accumulated on the filter disc, which make the fil ⁇ ter disc impermeable to air. Without aeration bulging of the filter disc in that case may arise due to positive pressure in the cavity of the sample holder in connection with the metal coating or the analysis in the scanning electron microscope.
- sample holders in the embodiment described are detachable. They may also be made integral with the revolving disc.
- FIG. 5 there is shown another manner of effecting the aeration.
- the passage of each pin communicates with an aperture at the lower side of the revolving disc 26 instead of being connected to the hub. In this case it is necessary to deposit the sample on the filter disc by connecting each indi- vidual sample holder separated from the revolving disc, to a suction device.
- the analysis surface i.e. the surface sup ⁇ porting the sample, of each sample holder is not necessarily air or liquid permeable; said surface can comprise a homogeneous surface.
- the collection of the sample on said surface then can be effected by a centrifugation method wherein particles, if any, entrained in the sample will sediment on the analysis surface.
- the analysis sur- face can be magnetic such that e.g. magnetic par ⁇ ticles can be collected on the surface by means of an electromagnetic field.
- the use of the electrode/sample holder de ⁇ scribed is illustrated by the following example re- lating to the analysis of bacteria and virus, if any, in urine.
- a holder having two filters of different pore size can be used since bacteria have a diameter of 1 ⁇ m and virus has a diameter ranging from 20 nm to 200 nm.
- the first filter then can comprise an analysis surface having a filter aperture size of 0.8 ⁇ while the lower surface can comprise an analysis surface having a filter aperture size of 50 nm.
- Virus particles will pass through the upper analysis surface and will be recovered on the lower analysis surface.
- the analysis surfaces are detached and are mounted in the electrode, are coated with a gold/platinum layer or a coal layer in a so called sputter, and are examined in a scanning electron microscope.
- the particles searched for can be collected and enriched, respectively, by incubating micro spheres marked with antibodies, in the sample liquid, e.g. latex particles on the surface of which antibodies are located which are directed towards the particle searched for.
- These micro spheres can be of a size ranging from 0.5 pri to 50 urn diameter. If the sample contains the virus searched for such virus will be bound to the micro spheres which then can be collected on the analysis surface which in this case can have a considerably larger pore size than in the previous example because it must prevent passage of micro spheres only and not of individual virus particles which have not been bound. If mag- netic micro spheres are used so as to bind to such spheres specific antibodies it is not necessary that the analysis surface is porous; the micro spheres will be collected on the analysis surface by means of an electromagnetic field.
Abstract
Description
Claims
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE8703250-4 | 1987-08-21 | ||
SE8703250A SE457836B (en) | 1987-08-21 | 1987-08-21 | ELECTRIC CONDUCTIVE ELECTRODE FOR ANALYZE OF MULTIPLE SAMPLES IN A SWEEP ELECTRON MICROSCOPE |
Publications (1)
Publication Number | Publication Date |
---|---|
WO1989001698A1 true WO1989001698A1 (en) | 1989-02-23 |
Family
ID=20369349
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/SE1988/000407 WO1989001698A1 (en) | 1987-08-21 | 1988-08-12 | Electrode for use in a scanning electron microscope |
Country Status (5)
Country | Link |
---|---|
EP (1) | EP0375716A1 (en) |
JP (1) | JPH03501307A (en) |
AU (1) | AU2266288A (en) |
SE (1) | SE457836B (en) |
WO (1) | WO1989001698A1 (en) |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5280178A (en) * | 1991-03-18 | 1994-01-18 | U.S. Philips Corporation | Specimen holder for use in a charged particle beam device |
DE10335504A1 (en) * | 2003-07-31 | 2005-03-10 | Leo Elektronenmikroskopie Gmbh | Source holder |
WO2010001399A1 (en) * | 2008-07-03 | 2010-01-07 | B-Nano | A scanning electron microscope, an interface and a method for observing an object within a non-vacuum environment |
ITRM20100143A1 (en) * | 2010-03-30 | 2011-10-01 | Federica Paglietti | ASSEMBLY OF STAMP AND MICROSCOPE STAMP HOLDERS, IN PARTICULAR AN ELECTRONIC SCANNING MICROSCOPE. |
US8492716B2 (en) | 2008-09-28 | 2013-07-23 | B-Nano Ltd. | Vacuumed device and a scanning electron microscope |
JP2015046338A (en) * | 2013-08-29 | 2015-03-12 | 日本電子株式会社 | Cleaning device |
US8981294B2 (en) | 2008-07-03 | 2015-03-17 | B-Nano Ltd. | Scanning electron microscope, an interface and a method for observing an object within a non-vacuum environment |
US9466458B2 (en) | 2013-02-20 | 2016-10-11 | B-Nano Ltd. | Scanning electron microscope |
DE102018206898A1 (en) * | 2018-05-04 | 2019-11-07 | Carl Zeiss Microscopy Gmbh | Apparatus and method for tracking microscopic samples |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CH531728A (en) * | 1971-04-19 | 1972-12-15 | Hamilton Co | Microscope with slide |
-
1987
- 1987-08-21 SE SE8703250A patent/SE457836B/en not_active IP Right Cessation
-
1988
- 1988-08-12 AU AU22662/88A patent/AU2266288A/en not_active Abandoned
- 1988-08-12 WO PCT/SE1988/000407 patent/WO1989001698A1/en not_active Application Discontinuation
- 1988-08-12 JP JP50693088A patent/JPH03501307A/en active Pending
- 1988-08-12 EP EP19880907429 patent/EP0375716A1/en not_active Withdrawn
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CH531728A (en) * | 1971-04-19 | 1972-12-15 | Hamilton Co | Microscope with slide |
Non-Patent Citations (2)
Title |
---|
PATENT ABSTRACTS OF JAPAN, Abstract of JP 58-108742, publ. 1983-06-28 * |
PATENT ABSTRACTS OF JAPAN, Abstract of JP 61-142648, publ. 1986-06-30 * |
Cited By (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5280178A (en) * | 1991-03-18 | 1994-01-18 | U.S. Philips Corporation | Specimen holder for use in a charged particle beam device |
DE10335504A1 (en) * | 2003-07-31 | 2005-03-10 | Leo Elektronenmikroskopie Gmbh | Source holder |
EP1503398A3 (en) * | 2003-07-31 | 2006-03-29 | Carl Zeiss NTS GmbH | Electron beam apparatus with specimen holder |
US7119344B2 (en) | 2003-07-31 | 2006-10-10 | Carl Zeiss Nts Gmbh | Electron beam device having a specimen holder |
DE10335504B4 (en) * | 2003-07-31 | 2008-11-27 | Carl Zeiss Nts Gmbh | Electron beam device with specimen holder |
US8981294B2 (en) | 2008-07-03 | 2015-03-17 | B-Nano Ltd. | Scanning electron microscope, an interface and a method for observing an object within a non-vacuum environment |
WO2010001399A1 (en) * | 2008-07-03 | 2010-01-07 | B-Nano | A scanning electron microscope, an interface and a method for observing an object within a non-vacuum environment |
US8334510B2 (en) | 2008-07-03 | 2012-12-18 | B-Nano Ltd. | Scanning electron microscope, an interface and a method for observing an object within a non-vacuum environment |
US9431213B2 (en) | 2008-07-03 | 2016-08-30 | B-Nano Ltd. | Scanning electron microscope, an interface and a method for observing an object within a non-vacuum environment |
US8492716B2 (en) | 2008-09-28 | 2013-07-23 | B-Nano Ltd. | Vacuumed device and a scanning electron microscope |
ITRM20100143A1 (en) * | 2010-03-30 | 2011-10-01 | Federica Paglietti | ASSEMBLY OF STAMP AND MICROSCOPE STAMP HOLDERS, IN PARTICULAR AN ELECTRONIC SCANNING MICROSCOPE. |
US9466458B2 (en) | 2013-02-20 | 2016-10-11 | B-Nano Ltd. | Scanning electron microscope |
JP2015046338A (en) * | 2013-08-29 | 2015-03-12 | 日本電子株式会社 | Cleaning device |
DE102018206898A1 (en) * | 2018-05-04 | 2019-11-07 | Carl Zeiss Microscopy Gmbh | Apparatus and method for tracking microscopic samples |
US11328896B2 (en) | 2018-05-04 | 2022-05-10 | Carl Zeiss Microscopy Gmbh | Device and method for tracking microscopic samples |
Also Published As
Publication number | Publication date |
---|---|
SE8703250D0 (en) | 1987-08-21 |
SE457836B (en) | 1989-01-30 |
EP0375716A1 (en) | 1990-07-04 |
AU2266288A (en) | 1989-03-09 |
JPH03501307A (en) | 1991-03-22 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP0171896B1 (en) | Cell viability assay methods and apparatus | |
KR100324810B1 (en) | Method and apparatus for obtaining monolayer cells | |
EP0378353B1 (en) | Apparatus for collecting biological fluid | |
US7871813B2 (en) | Diagnostic device and method | |
JP3244504B2 (en) | Test module that can be attached to a liquid sample container | |
US5498550A (en) | Device for collecting or preparing specimens using magnetic micro-particles | |
JP3016830B2 (en) | Multiwell filtration device | |
JP3459923B2 (en) | Multi-site chemotaxis test apparatus and method | |
US20040004043A1 (en) | Magnetic separation apparatus and methods | |
JPS61137062A (en) | Method and device for classifying fine particle | |
EP0591436A1 (en) | System for growing and manipulating tissue cultures | |
CA2106507A1 (en) | Specimen processor method and apparatus | |
WO1989001698A1 (en) | Electrode for use in a scanning electron microscope | |
CN108884431B (en) | Filter for filtering nucleated cells and filtering method using same | |
JPS59126227A (en) | Method of forming stripe of liquid on slide of microscope and centrifugal turning gear | |
US7211225B2 (en) | Filter devices for depositing material and density gradients of material from sample suspension | |
US5419279A (en) | Apparatus for depositing and staining cytological material on a microscope slide | |
US7629165B2 (en) | Diagnostic device and method | |
EP0590506A1 (en) | Apparatus for depositing and staining cytological material on a microscope slide | |
US6423237B1 (en) | Method and apparatus for manually separating particulate matter from a liquid specimen | |
JPS5976513A (en) | Filter apparatus | |
CN107561265A (en) | A kind of separation of solid and liquid composite membrane and preparation method thereof | |
WO2004073486A2 (en) | Diagnostic device and method | |
JP2016174578A (en) | Microparticle sorting apparatus, and microparticle recovery apparatus equipped with the same | |
USRE39457E1 (en) | Liquid specimen container and attachable testing modules |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AK | Designated states |
Kind code of ref document: A1 Designated state(s): AT AU BB BG BR CH DE DK FI GB HU JP KP KR LK LU MC MG MW NL NO RO SD SE SU US |
|
AL | Designated countries for regional patents |
Kind code of ref document: A1 Designated state(s): AT BE BJ CF CG CH CM DE FR GA GB IT LU ML MR NL SE SN TD TG |
|
WWE | Wipo information: entry into national phase |
Ref document number: 1988907429 Country of ref document: EP |
|
REG | Reference to national code |
Ref country code: DE Ref legal event code: 8642 |
|
WWP | Wipo information: published in national office |
Ref document number: 1988907429 Country of ref document: EP |
|
WWW | Wipo information: withdrawn in national office |
Ref document number: 1988907429 Country of ref document: EP |