AU2266288A - Electrode for use in a scanning electron microscope - Google Patents
Electrode for use in a scanning electron microscopeInfo
- Publication number
- AU2266288A AU2266288A AU22662/88A AU2266288A AU2266288A AU 2266288 A AU2266288 A AU 2266288A AU 22662/88 A AU22662/88 A AU 22662/88A AU 2266288 A AU2266288 A AU 2266288A AU 2266288 A AU2266288 A AU 2266288A
- Authority
- AU
- Australia
- Prior art keywords
- electrode
- electron microscope
- scanning electron
- scanning
- microscope
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00584—Control arrangements for automatic analysers
- G01N35/00722—Communications; Identification
- G01N35/00732—Identification of carriers, materials or components in automatic analysers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00584—Control arrangements for automatic analysers
- G01N35/00722—Communications; Identification
- G01N35/00732—Identification of carriers, materials or components in automatic analysers
- G01N2035/00742—Type of codes
- G01N2035/00772—Type of codes mechanical or optical code other than bar code
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Sampling And Sample Adjustment (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE8703250 | 1987-08-21 | ||
SE8703250A SE457836B (en) | 1987-08-21 | 1987-08-21 | ELECTRIC CONDUCTIVE ELECTRODE FOR ANALYZE OF MULTIPLE SAMPLES IN A SWEEP ELECTRON MICROSCOPE |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2266288A true AU2266288A (en) | 1989-03-09 |
Family
ID=20369349
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU22662/88A Abandoned AU2266288A (en) | 1987-08-21 | 1988-08-12 | Electrode for use in a scanning electron microscope |
Country Status (5)
Country | Link |
---|---|
EP (1) | EP0375716A1 (en) |
JP (1) | JPH03501307A (en) |
AU (1) | AU2266288A (en) |
SE (1) | SE457836B (en) |
WO (1) | WO1989001698A1 (en) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0504972A1 (en) * | 1991-03-18 | 1992-09-23 | Koninklijke Philips Electronics N.V. | Specimen holder for use in a charged particle beam device |
DE10335504B4 (en) * | 2003-07-31 | 2008-11-27 | Carl Zeiss Nts Gmbh | Electron beam device with specimen holder |
US8981294B2 (en) | 2008-07-03 | 2015-03-17 | B-Nano Ltd. | Scanning electron microscope, an interface and a method for observing an object within a non-vacuum environment |
US8334510B2 (en) | 2008-07-03 | 2012-12-18 | B-Nano Ltd. | Scanning electron microscope, an interface and a method for observing an object within a non-vacuum environment |
JP2012503856A (en) | 2008-09-28 | 2012-02-09 | ビー−ナノ リミテッド | Vacuumed device and scanning electron microscope |
IT1399664B1 (en) * | 2010-03-30 | 2013-04-26 | Paglietti | ASSEMBLY OF STAMP AND MICROSCOPE STAMP HOLDERS, IN PARTICULAR AN ELECTRONIC SCANNING MICROSCOPE |
KR20150120476A (en) | 2013-02-20 | 2015-10-27 | 비-나노 리미티드 | Scanning electron microscope |
JP6207305B2 (en) * | 2013-08-29 | 2017-10-04 | 日本電子株式会社 | Cleaning device |
DE102018206898A1 (en) * | 2018-05-04 | 2019-11-07 | Carl Zeiss Microscopy Gmbh | Apparatus and method for tracking microscopic samples |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2139153A1 (en) * | 1971-04-19 | 1972-10-26 | Hamilton Co, Whittier, Calif (V St A) | Microscope slide |
-
1987
- 1987-08-21 SE SE8703250A patent/SE457836B/en not_active IP Right Cessation
-
1988
- 1988-08-12 JP JP50693088A patent/JPH03501307A/en active Pending
- 1988-08-12 AU AU22662/88A patent/AU2266288A/en not_active Abandoned
- 1988-08-12 WO PCT/SE1988/000407 patent/WO1989001698A1/en not_active Application Discontinuation
- 1988-08-12 EP EP19880907429 patent/EP0375716A1/en not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
WO1989001698A1 (en) | 1989-02-23 |
EP0375716A1 (en) | 1990-07-04 |
SE8703250D0 (en) | 1987-08-21 |
SE457836B (en) | 1989-01-30 |
JPH03501307A (en) | 1991-03-22 |
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