WO1984000209A1 - Systeme de detection d'angles utilisant un polariseur rotatif - Google Patents

Systeme de detection d'angles utilisant un polariseur rotatif Download PDF

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Publication number
WO1984000209A1
WO1984000209A1 PCT/US1982/000884 US8200884W WO8400209A1 WO 1984000209 A1 WO1984000209 A1 WO 1984000209A1 US 8200884 W US8200884 W US 8200884W WO 8400209 A1 WO8400209 A1 WO 8400209A1
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WO
WIPO (PCT)
Prior art keywords
providing
responsive
light
signal
polarized light
Prior art date
Application number
PCT/US1982/000884
Other languages
English (en)
Inventor
Larry Trumbull Clark
Original Assignee
Boeing Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Boeing Co filed Critical Boeing Co
Priority to EP19820902840 priority Critical patent/EP0112334A4/fr
Priority to PCT/US1982/000884 priority patent/WO1984000209A1/fr
Publication of WO1984000209A1 publication Critical patent/WO1984000209A1/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/168—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by means of polarisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00—Measuring polarisation of light

Definitions

  • This invention relates to systems for measuring aeroelastic deformation of aircraft structure in flight or in wind tunnels and, more particularly, to a rotating polarizer angle sensor system for measuring aeroelastic deformation of an aircraft structure in flight or in a wind tunnel.
  • accelerometers have been utilized for measurement of aeroelastic deformation of aircraft structure in flight but have proved unsuitable because of sensitivity to acceleration as well as angle.
  • Other optical methods have been utilized in wind tunnel test ⁇ ing but, however, have been deficient in terms of accuracy of the systems.
  • Photogrammetric methods have also been utilized for flight testing, but have a] so been awkward to deploy and deficient in the measure of accuracy.
  • a preferred embodiment of the present invention utilizes the physical principle upon which linearly polarized light which passes through a linear polarizer relates the intensity of the transmitted light as a simple function' of the angle between the axis of polarization of the incoming light and the axis of the polarizer.
  • any effect which changes the intensity of the transmitted light would result in a change in the angle reading.
  • an incident beam of light in which the axis of polarization is a function of time is utilized wherein the phase angle between a reference signal and. a test signal as a measure of the angle between the axis of the reference polarizer and the axis of the test polarizer is utilized.
  • the present rotating polarizer angle sensor system embodiment while having remote angle measurement applicability in general, includes applica ⁇ tions wherein deformation and vibration of structures, such as in a tilt eter for geotechnical applications, are required, and wherein the operating range of the system is required to be from centimeters to e.g. kilometers.
  • FIGURE 1 is a schematic diagram utilized in explaining the principles of. operation of the present rotating polarizer angle sensor system embodiment
  • FIGURE 2 is a hardware system optical embodiment utilizing the principles shown in FIGURE 1;
  • CMPI FIGURE 2A is illustrative of an alternative light input arrangement which may be utilized in the system of FIGURE 2;
  • FIGURE 3 is a block diagram showing signal pro- cessing of reference and test signals from the optical system of FIGURE 2;
  • FIGURE 4 is a typical response curve for the rotating polarizer angle sensing system of FIGURES 2 and 3 over the angle range of from zero to 90° of the present system embodiment.
  • FIGURE 1 illustrative of the prin ⁇ ciples of operation of the present system in which an incident beam of light in which the axis of polarization is a function of time and in which the phase angle beween a reference signal and a test signal is utilized as a measure of the angle between the axis of the refer ⁇ ence ⁇ polarizer and the axis of the test polarizer, it can be seen that circularly polarized light 10 from a laser source (not shown) is passed through a rotating linear polarizer 20, thereby providing rotating linearly polarized light 30 with the axis of polarization rotat ⁇ ing at twice the speed of polarizer rotation.
  • Light beam 30 is divided downstream by beam splitter 40 into a reference beam and a test beam, each of which beams is coupled through linear polarizer elements 50 and 60 and, subsequently, collected by photo-detectors (not shown) which measure the time dependent intensity.
  • the phase difference between the two signals from the detectors (as processed by the system of FIGURES 2 and 3) is directy proportional to the difference between the polarization axes of the two polarizers.
  • FIGURES 2 and 3 A system embodiment of the present rotating polar-— izer angle sensor system is shown in FIGURES 2 and 3.
  • a light source 101 comprising a low power laser with a linearly polarized output beam is utilized.
  • the beam is coupled through a one-fourth wave retarda ⁇ tion plate 102 to generate the required circularly polarized light.
  • the beam is then coupled through a rotating linear polarizer system 104 which comprises a constant speed motor 103 driving a linear polarizer 100.
  • the frequency of rotation of the axis of polarization of the output beam from rotating linear polarizer 104 is twice that of constant speed motor 103.
  • downstream the beam is coupled through expansion lens 105 and then coupled through beam splitter 106 wherein the reference and test beams separation is provided.
  • Retro- reflector element 111 may comprise retro-reflective tape or e.g. a corner cube reflector depending upon system application.
  • the transmission beam striking target 700 is reflected back through linear polarizer 110 in the present system embodiment of FIGURE 2 to be collected by objective lens 109.
  • the collected beam is subsequently directed downstream by mirror element 106 through lens 112 and interference filter element 113 (set for the wavelengths of the laser light) and then is incident upon photo-detector 114.
  • Photo-detector 114 comprises a photo-voltaic cell for ranges up to thirty meters and may comprise a photo-multiplier tube for longer range applications.
  • Photo-voltaic detectors 108 and 114 are current sources and current to voltage converters 300 and 301, as seen in FIGURE 3, are utilized to condition reference signal 208 and test signal 209 further down ⁇ stream for analysis.
  • the gain of current to voltage converters 300 and 301 should be adjuste to yield a predetermined voltage e.g. typically two to five volts peak to peak.
  • the respective signals from current to voltage converter 300 and current to voltage conver- ter 301 are then A.C. coupled to fixed gain amplifiers 305 and 306, respectively, with the output therefrom being clipped fifteen volt signals which are then transmitted through respective phase locked loops 310 and 3.12 for providing additional noise rejection.
  • Voltage controlled oscillators 314 and 316 in the respective phase locked loops 310 and 312, are utilized for phase measurement with the respective signals from phase locked loops 310 and 312 being coupled to the input of exclusive OR gate 320, the output of exclusive OR gate 320 being provided with low pass filtering in 12 pole Butterworth type filter 321 to provide a voltage output from digital voltmeter 322 which is proportional to angle with a dynamic range equal to one-half the carrier frequency.
  • FIGURE 4 it can be seen in the graph showing E from the system ' of FIGURE 3 as a function of target angle that the angle range of the system of FIGURES 2 and 3 over 90° as provided ' , a typical response curve being shown in FIGURE 4.
  • Accuracy at 95 percent confidence at a range of four meters is .025°.
  • the present system in bright sun ⁇ light, has been shown to provide, at a range of thirty meters, a similar accuracy.
  • an input light source 402 using a high intensity lamp coupled through a lens, stop, and further lens may be utilized in place of laser 101 and one-fourth wave plate 102 in the system of FIGURE 2.

Abstract

Un système de mesure de la déformation aéroélastique d'une aile d'aéronef en vol ou en soufflerie utilise une lumière provenant d'une source de lumière polarisée linéairement (101). La lumière est transmise au travers d'éléments de modulation (104, 105) pour former un rayon porteur et une petite portion du rayon est réfléchie au travers d'un polariseur linéaire (107) dans un photodétecteur (108) pour l'utiliser comme signal électrique de référence (208). Le reste du rayon est réfléchi par une cible rétroréflectrice (700) placée sur l'aile dans un autre photodétecteur (114) pour produire le signal électrique cible (209). Les deux signaux électriques amplifiés sont comparés dans un détecteur de phase (fig. 3) pour obtenir un signal de sortie de mesure d'angle E0.
PCT/US1982/000884 1982-06-30 1982-06-30 Systeme de detection d'angles utilisant un polariseur rotatif WO1984000209A1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
EP19820902840 EP0112334A4 (fr) 1982-06-30 1982-06-30 Systeme de detection d'angles utilisant un polariseur rotatif.
PCT/US1982/000884 WO1984000209A1 (fr) 1982-06-30 1982-06-30 Systeme de detection d'angles utilisant un polariseur rotatif

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US1982/000884 WO1984000209A1 (fr) 1982-06-30 1982-06-30 Systeme de detection d'angles utilisant un polariseur rotatif

Publications (1)

Publication Number Publication Date
WO1984000209A1 true WO1984000209A1 (fr) 1984-01-19

Family

ID=22168070

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US1982/000884 WO1984000209A1 (fr) 1982-06-30 1982-06-30 Systeme de detection d'angles utilisant un polariseur rotatif

Country Status (2)

Country Link
EP (1) EP0112334A4 (fr)
WO (1) WO1984000209A1 (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104748695A (zh) * 2015-04-10 2015-07-01 清华大学 基于区段精细测量的大断面地下洞室早期变形监测方法

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3633212A (en) * 1970-10-15 1972-01-04 Guy F Cooper System for determining the orientation of an object by employing plane-polarized light
US3833302A (en) * 1972-08-23 1974-09-03 Leitz Ernst Gmbh Method and apparatus for the automatic photoelectric trapping of local changes of optically effective object structures
SU522425A1 (ru) * 1975-01-07 1976-07-25 Ленинградский Ордена Ленина Политехнический Институт Им.М.И.Калинина Фотоупругий динамометр
US3992104A (en) * 1974-08-29 1976-11-16 Nippon Kogaku K.K. Automatic polarization analyzer device
US4176951A (en) * 1976-09-23 1979-12-04 Etat Francais as represented by the Pelegue General pour l'Armement Rotating birefringent ellipsometer and its application to photoelasticimetry
US4179217A (en) * 1977-02-21 1979-12-18 Etat Francais As Represented By The Delegue General Pour L'armement Dynamic photoelasticimeter with rotating birefringent element
US4263810A (en) * 1978-03-08 1981-04-28 Chiu Hong Yee Angular deflection sensing apparatus for load, force, and other types of measurements

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4129384A (en) * 1977-06-08 1978-12-12 Batelle Memorial Institute Optical extensometer

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3633212A (en) * 1970-10-15 1972-01-04 Guy F Cooper System for determining the orientation of an object by employing plane-polarized light
US3833302A (en) * 1972-08-23 1974-09-03 Leitz Ernst Gmbh Method and apparatus for the automatic photoelectric trapping of local changes of optically effective object structures
US3992104A (en) * 1974-08-29 1976-11-16 Nippon Kogaku K.K. Automatic polarization analyzer device
SU522425A1 (ru) * 1975-01-07 1976-07-25 Ленинградский Ордена Ленина Политехнический Институт Им.М.И.Калинина Фотоупругий динамометр
US4176951A (en) * 1976-09-23 1979-12-04 Etat Francais as represented by the Pelegue General pour l'Armement Rotating birefringent ellipsometer and its application to photoelasticimetry
US4179217A (en) * 1977-02-21 1979-12-18 Etat Francais As Represented By The Delegue General Pour L'armement Dynamic photoelasticimeter with rotating birefringent element
US4263810A (en) * 1978-03-08 1981-04-28 Chiu Hong Yee Angular deflection sensing apparatus for load, force, and other types of measurements

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP0112334A4 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104748695A (zh) * 2015-04-10 2015-07-01 清华大学 基于区段精细测量的大断面地下洞室早期变形监测方法

Also Published As

Publication number Publication date
EP0112334A1 (fr) 1984-07-04
EP0112334A4 (fr) 1984-11-23

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