WO1982000514A1 - Procede et systeme de mesure au laser pour une machine de tournage - Google Patents

Procede et systeme de mesure au laser pour une machine de tournage Download PDF

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Publication number
WO1982000514A1
WO1982000514A1 PCT/US1980/001043 US8001043W WO8200514A1 WO 1982000514 A1 WO1982000514 A1 WO 1982000514A1 US 8001043 W US8001043 W US 8001043W WO 8200514 A1 WO8200514 A1 WO 8200514A1
Authority
WO
WIPO (PCT)
Prior art keywords
axis
turret
slide
workpiece
axis slide
Prior art date
Application number
PCT/US1980/001043
Other languages
English (en)
Inventor
Ind Operating Corp Colt
Original Assignee
Kindl G
Michaud O
Brien J
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kindl G, Michaud O, Brien J filed Critical Kindl G
Priority to PCT/US1980/001043 priority Critical patent/WO1982000514A1/fr
Priority to EP19810901718 priority patent/EP0058673A4/fr
Publication of WO1982000514A1 publication Critical patent/WO1982000514A1/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques

Definitions

  • This invention relates to laser measuring systems for machine tools.
  • laser interferometry is employed to directly measure the interior or exterior dimensions of a turned workpiece.
  • the only positioning apparatus required for a system is that which is typically incorporated in a two axis lathe or chucker.
  • a lathe or chucker having a tool carrying turret mounted upon an X-axis slide movable perpendicular to the spindle axis, is provided with a gage head incorporating a reflector adapted to be positioned for measurement by an indexing rotation of the turret to a particular index station.
  • An interferometer is fixedly mounted upon a Z-axis slide (which carries the X-axis slide) movable parallel to the spindle axis.
  • the interferometer is aligned with the reflector in the gage head when the turret is in the measurement index station and is always aligned with a laser source and receiver mounted upon the machine tool frame or adjacent thereto.
  • the chuck is encircled by a master reference collar of known diameter (internal as well as external) whereby a reference point may be established when the gage head engages the inner or outer periphery of the collar.
  • a measuring system of the invention may be utilized to determine and compensate for excessive tool wear. For example, a correction signal could be transmitted to the slide position control device of the machine tool when the machining error is greater than a specified dimensional tolerance.
  • a system of the invention could be employed to determine size of a part just prior to or upon the completion of a final finishing operation. It will of course be appreciated that, under all circumstances, the accuracy of a measuring system of the invention does not depend upon the precision with which the machine tool slides are positioned but is independent thereof. Accordingly, it is a primary object of the invention to provide a system for measuring the dimensions of a turned workpiece which utilizes laser interferometry.
  • Another object is to provide a laser interferometer based system and method for measuring the dimensions of a workpiece machined upon a two axis turret lathe wherein the turret thereof includes a gage head incorporating a reflector and the axial slide has an interferometer- mounted thereupon.
  • FIGURE 1 is a schematic diagram of a preferred embodiment of a laser measuring system of the invention.
  • FIGURE 2 is a block diagram depicting the basic elements of the laser transducer and the receiver of FIGURE 1 and their relationship to other components of the system.
  • FIGURE 3 is a schematic view of the linear interferometer and retroflector arrangement of FIGURE 1 illustrating the beam paths and the principle of operation.
  • FIGURE 4 is a side elevational view, partly in section, of the gage head of FIGURE 1.
  • FIGURE 5 is a front elevational view of the gage head, partly in section, taken substantially along the line 5-5 of FIGURE 4.
  • FIGURE 6 is a top view of the gage head, taken substantially along the line 6-6 of FIGURE 4.
  • FIGURE 7 is a rear elevational view of the gage's roller slide assembly, per se, taken substantially along the line 7-7 of FIGURE 4.
  • FIGURE 8 is a side elevational view, partly in section, of the roller slide assembly, taken substantially along the line 8-8 of FIGURE 7.
  • FIGURE 9 is a sectional view of the roller slide assembly, taken substantially along the line 9-9 of FIGURE 7.
  • FIGURE 10 is a perspective view showing the engagement between the right side rail and a V-way of FIGURE 9.
  • FIGURE 1 there is shown a numerically controlled lathe or chucker, generally shown at 10, incorporating a measuring system of the invention.
  • the particular form of lathe shown embodies a vertically indexing turret 12 capable of movement along two axes.
  • This type of lathe Csometimes termed a universal lathe) is well-known in the art and an example thereof is illustrated in U.S. Patent No. 3,191,470. It will be appreciated that although the invention is specifically illustrated and described with reference to a machine tool having a vertically indexing turret, it is also applicable to other lathes or chuckers.
  • the lathe 10 embodies a frame 14, the outline of which is shown by phantom lines.
  • a spindle 16 having a workpiece holding chuck 18 attached thereto.
  • the chuck also has a master reference collar 20 (discussed hereinafter) mounted upon the chuck in encircling relationship thereto.
  • a pair of longitudinally extending ways 22 and 24 are secured to frame 14 for guiding the longitudinal motion (Z-axis) of a Z-axis slide 26.
  • Carried by the Z-axis slide 26 are ways 28 and 30 upon which is slideably mounted an ⁇ -axis slide 32.
  • the ⁇ -axis is, of course, perpendicular to both the Z-axis and the chuck or workpiece axis .
  • the turret 12 is mounted for rotation upon the X-axis slide 32 to a plurality of discrete index stations about an axis parallel to the chuck axis.
  • the turret may be configured to carry a plurality of turning tools, a plurality of boring tools or both turning tools and boring tools.
  • Slide positioning and turret indexing are controlled by a computer numerical control unit (CNC) 34 which commands all machine tool operations.
  • a gage head, generally indicated at 36, is fixedly mounted upon the turret 12 at an index station by means of a bracket 38.
  • the heart of the gage head is a reflector 40 (which in this case is a retroflector) which is movable with a gage arm 42 having O.D. (Outside diameter) and I.D. (Inside diameter) tips or probes 44 and 46, respectively.
  • the retroflector 40 is in precise alignment with an interferometer 48 (which in this case is a linear interferometer).
  • the inter ferometer 48 is rigidly secured to the Z-axis slide 26 by means of an L-shaped mounting arm 50.
  • any movement of the Z-axis slide 26 when the turret is at the measuring index station does not in any manner affect the alignment of the interferometer and the reflector 40.
  • movement of the X-axis slide does not alter alignment but only the distance between the interferometer 48 and the reflector 40.
  • a laser transducer 52 is the source of the laser beam directed at the interferometer 48, the outgoing main beam being shown by a dashed line.
  • a portion of the outgoing main beam (shown by dashed line) is directed by the interferometer to the reflector 40 which sends a return beam (solid line) back to the interferometer in a latterally offset and parallel relationship.
  • the return beam from the reflector interferes with another portion of the main beam in the interferometer to produce a return main beam (solid line) directed at a receiver 54.
  • the return main beam is offset from and parallel to the outgoing main beam.
  • the receiver 54 which senses the main return beam generates an RF measurement signal which is applied to a pulse converter 56.
  • the receiver also incorporates a means to verify proper alignment.
  • the pulse converter 56 also receives an RF reference signal from the laser transducer 52.
  • the RF measurement and reference signals are transformed by the Pulse converter 56 into displacement information in pulse format (e.g., up pulses and down pulses) which can be utilized, for example, by a reversible counter dot shown) in the CNC unit 34.
  • a power supply 58 functions to provide the laser transducer 52 with a positive voltage D.C. supply and a. negative voltage D.C. supply.
  • the basic optical elements of the measuring system of the invention i.e., the retrofleetors, linear interferometer, Laser tranducer, receiver and pulse converter units are all commercially available items manufactured, for example, by the Hewlett Packard Co.
  • the detailed construction of the aforementioned elements forms no part of the present invention; and it will be understood that other suitable elements could be employed in a measuring system of the invention.
  • the laser transducer, receiver linear interferometer and retroflector will be cursorily described to facilitate a better understanding of the present invention.
  • FIGURE 2 the Laser transducer 52 and the receiver 54 are depicted in block diagram form.
  • the laser transducer 52 comprises a low power Helium- Neon laser 60 which emits a coherent light beam composed of two slightly different optical frequencies, f 1 and f 2 of opposite circular polarizations. After conversion to orthogonal linear polarizations, the beam is expande and collimated at 62 and then directed to the reference beam splitter 64 where a small fraction of both frequencies is split off. The downwardly directed portion 66 of the beam is used both to generate a reference frequency and to provide an error signal to the laser cavity tuning system.
  • Beam portion 66 impinges upon a polarizing beam splitter 88 which splits beam 66 into a portion directed to a photodetector 70 and a portion directed at a mirror 72, which, in turn, reflects the portion to another photodetector 74.
  • the output signal of photodetector 70 is directed to an input terminal of D.C. amplifier 76.
  • the output signal of photodetector 74 is directed both to another input terminal of D.C. amplifier 76 and an AC amplifier 78, the latter of which generates the reference signal f 1 -f 2 which is one of the inputs to the pulse converter 56.
  • amplifier 76 (the difference in the amplitudes of f 1 and f 2 ) is applied to a tuning regulator 80 which is connected to the laser 60.
  • the receiver 54 which senses the main return beam via a photodetector 82, includes an amplifier 84, connected thereto, which produces the measurement signal Relative motion between the linear interferometer 48 and the retroflector 40 causes a doppler shift in the difference frequency
  • the pulse converter 56 receives the reference and measurement signals and compares them cycle-by-cycle.
  • the pulse converter 56 produces an appropriate up ordown output pulse whenever one of the signals is one-half cycle ahead of or behind the other. Each pulse corresponds to a retroflector movement of one-quarter wavelength of light. These pulses are directed to the computer numerical control for counting therein.
  • the linear interferometer 48 and its relationship to the retroflector 40 are displayed schematically.
  • the outgoing main beam exiting from the laser transducer 52 is split at the surface of a polarizing beam splitter 48a with, one frequency (f 1 ) reflected to a reference cube corner 48b (i.e., a retroflector) mounted on the interferometer housing 48c.
  • the other frequency (f 2 ) is transmitted to the retroflector 40 and returned parallel to, but displaced from, the outgoing beam. Both return beams interfere with each other at point 48d from where both frequencies are directed back along a common axis to the receiver as the main return beam.
  • the retroflectors are comprised by high quality cube-corners which have the property that incident laser beams are reflected parallel to the incoming direction within seconds of arc and retain their coherence. Such retroflectors are notably advantageous in that their alignment during installation is not subjected to critical tolerances.
  • the gage head 36 includes a housing 86 which has mounting bracket 38 secured thereto whereby it may be attached to an index station of the turret 12.
  • the retroflector 40 is cradled within a support90 so as to be upwardly facing to receive and emit light beams through an aperture 86a in the top of the housing 86.
  • the support 90 is attached by means of screws 92 to a slide 94 which is axially movable vertically relative to the housing 86.
  • To the surface of the slide 94 is attached a depending shaft 96 which is secured to the gage arm 42 (which carries probes 44 and 46) at its lower extremity.
  • Shaft 96 extendsdownwardly through an opening 86b in the lower portion of the housing 86 and is encircled by a seal 98 attached to the base of the housing for preventing the entry of contaminating fluids, such as cutting coolant.
  • contaminating fluids such as cutting coolant.
  • a cover 100 is pivotally mounted upon a pin 102 supported by a bracket 104 attached to the front of the housing.
  • the bracket 104 and the cover 100 incorporate latterally projecting pins 106 and 108 for mounting springs which hold the cover 100 closed or open.
  • a handle 110 is provided for opening the cover; and a stop 112 , which is secured to the housing, limits the extent of its opening. When closed, the cover rests upon a gasket 114 which acts to seal out contaminants.
  • the slide 94 is mounted for axial sliding movement upon a base 116 which is securely fastened to the housing 86 by means of screws 118.
  • the slide and base assembly is shown in detail in FIGURES 7,8,9, and 10.
  • the slide 94 comprises a table 120 having longitudinal sides 122 and 124 and end plates 126 and 128 which together define an open box-like structure.
  • the end plates include pins 130 and 132 inserted therein which function as mounting guides for springs 134 and 136.
  • the springs are mounted in cavities 138 and 140 in the base 116 for biasing the slide 94 to the neutral or intermediate position depicted when displaced therefrom.
  • the end plates also include stop bolts 142 and 144 for limiting slide travel in both upward and downward directions.
  • the base includes two roller straps 146 and 148 attached to the body thereof by mounting screws 150 and 152.
  • the slide also incorporates a pair of V-ways 154 and 156 secured to the table 120 by mounting screws similar to those associated with the roller strips.
  • the sliding interengagement between the V-ways and roller strips is occasioned by respective axial arrays of crossed roller bearings 158.
  • the roller bearings 158 in each strip have alternately opposed axes. Screw 160 allows for preload adjustment.
  • a slide assembly permits superior travel accuracies to be attained.
  • the basic elements of such a slide assembly are commercially available from Micro Slides Inc. of Westbury, New York.
  • the workpiece is machined to final rough OD dimensions.
  • the turret 12 is then indexed, (i.e., rotated) to the measuring station whereby the retroflector 40 is aligned with the linear interferometer 48 and the gage head 36 is also aligned with a diameter of the workpiece.
  • the gage head 36 is then moved over the master references collar 20 by moving the Z-axis slide 26 to the left as viewed in FIGURE 1 until the probe 44 on the gage arm 42 is aligned with the diameter of the collar.
  • the X-axis slide is moved downwardly until the probe 44 firmly engages the outer periphery of the collar 20.
  • the cover 100 on the gage head 36 is now opened to expose the retroflector 40.
  • a cover (should one be provided) on the linear interferometer is opened.
  • the opening of covers could be performed manually or by automatic means such as air cylinders or solenoids.
  • Alignment is now verified by a signal (e.g., a DC voltage or warning light) from the receiver 54 which indicates that the main return beam is being properly received.
  • the distance A is subsequently preset into a memory register in the CNC unit 34 whereupon workpiece measurements are ready to be taken.
  • the Z-axis slide 26 is then moved to the right until the probe 44 overlies that axial station on the workpiece where the diameter is to be measured.
  • the X-axis slide 32 moves downwardly toward the workpiece, as viewed in FIGURE 1.
  • the pulse converter 56 When pulse generation by the pulse converter 56 terminates during X-axis slide movement, the probe 44 has engaged the workpiece and the number in the CNC unit is an extremely precise measurement of a workpiece OD dimension. Similar OD measurements may be taken at other axial stations by simple slide movement without the need for placing the probe 44 again upon the collar 20. During such latter mentioned movements, the pulse converter will, of course, generate incrementing or decrementing pulses to the CNC unit register. Various measurements at different axial stations may be transferred to respective memory locations in the CNC unit.
  • gage head is then removed from the workpiece (e.g., to a home position).
  • the part program is then adjusted for the difference in the programmed and measured dimensions and final workpiece finishing is then completed. If desired, final workpiece dimensions may be checked as previously described. Any excessive variation between measured diameters and programmed diameters may indicate excessive tool wear or some other difficulty and corrective action is accordingly mandated.
  • Measurement of internal diameters may be made by using a similar procedure and contacting the inner periphery of the workpiece with probe 46. It will be noted that for such measurements, an interior reference surface could be provided on the collar, or alternatively the distance between the tips of the probes could be precisely measured.
  • a system of the invention could be associated with a lathe having a dual or single level turret mounted on the X-axis slide and rotatable about an axis parallel to the X-axis and intersecting the spindle axis in ortho- ginal or canted relationship thereto.
  • a lathe is shown in U.S. Patent No. 3,878,742.
  • the invention could be utilized with a lathe as shown in U.S. Patent No. 3,750,245.

Abstract

Un systeme de mesure au laser est associe a un tour a deux axes (10), ayant une tourelle porte-outil (12), pour s'assurer que les cotes d'une piece usinee sont exactes sans retirer la piece du mandrin (18) du tour. Une tete de calibrage (36), qui comprend un retroflecteur (40), est montee sur la tourelle qui peut etre indexee sur une station de mesure dans laquelle des mesures des pieces sont effectuees, La tourelle est montee sur une coulisse d'axe X (32) mobile perpendiculairement a l'axe du mandrin qui, a son tour, est montee sur une coulisse a axe Z (26) mobile parallelement a l'axe du mandrin. Un interferometre (48) est monte fixe sur la coulisse d'axe Z de maniere a se trouver en alignement avec le retroflecteur lorsque ce dernier se trouve dans la station de mesure. Une source a rayon laser (52) et un recepteur du rayon (54) sont montes sur le tour ou adjacents au tour de telle sorte qu'ils se trouvent en bon alignement avec l'interferometre. Un collier (20) sur le mandrin forme une surface de reference qui sert de point de calibrage fixe.
PCT/US1980/001043 1980-08-11 1980-08-11 Procede et systeme de mesure au laser pour une machine de tournage WO1982000514A1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
PCT/US1980/001043 WO1982000514A1 (fr) 1980-08-11 1980-08-11 Procede et systeme de mesure au laser pour une machine de tournage
EP19810901718 EP0058673A4 (fr) 1980-08-11 1980-08-11 Procede et systeme de mesure au laser pour une machine de tournage.

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
PCT/US1980/001043 WO1982000514A1 (fr) 1980-08-11 1980-08-11 Procede et systeme de mesure au laser pour une machine de tournage
WOUS80/01043800811 1980-08-11

Publications (1)

Publication Number Publication Date
WO1982000514A1 true WO1982000514A1 (fr) 1982-02-18

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Application Number Title Priority Date Filing Date
PCT/US1980/001043 WO1982000514A1 (fr) 1980-08-11 1980-08-11 Procede et systeme de mesure au laser pour une machine de tournage

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EP (1) EP0058673A4 (fr)
WO (1) WO1982000514A1 (fr)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2640040A1 (fr) * 1988-12-05 1990-06-08 Micro Controle Procede et dispositif de mesure optique
WO2008134385A1 (fr) * 2007-04-28 2008-11-06 Miyano Steven S Machine-outil contrôlée par ordinateur avec accommodation et alignement de température
CN111366070A (zh) * 2018-12-25 2020-07-03 苏州笛卡测试技术有限公司 一种复合式线激光测量系统多轴空间坐标系标定方法

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3191470A (en) * 1962-08-21 1965-06-29 Carl F Pabst Lathe
US3409375A (en) * 1964-10-21 1968-11-05 Cutler Hammer Inc Gauging interferometer systems
US3520613A (en) * 1966-11-14 1970-07-14 Optomechanisms Inc Interferometer with environmental correction computer
US3750245A (en) * 1971-09-21 1973-08-07 Pratt & Whitney Inc Turret lathe
US3791739A (en) * 1970-12-30 1974-02-12 Asahi Optical Co Ltd Interferometer for x-y measurement
US3878742A (en) * 1972-12-04 1975-04-22 Index Werke Kg Hahn & Tessky Numerically controlled lathes
US4038890A (en) * 1975-11-24 1977-08-02 U.S. Industries, Inc. Machine control system

Family Cites Families (3)

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Publication number Priority date Publication date Assignee Title
US3661463A (en) * 1970-03-05 1972-05-09 Kearney & Trecker Corp Single interferometer multiple axis laser measuring system
SE354115B (fr) * 1971-10-13 1973-02-26 Lasergruppen Konsuit Ab
US3884580A (en) * 1973-09-07 1975-05-20 Gerber Scientific Instr Co Apparatus for measuring and positioning by interferometry

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3191470A (en) * 1962-08-21 1965-06-29 Carl F Pabst Lathe
US3409375A (en) * 1964-10-21 1968-11-05 Cutler Hammer Inc Gauging interferometer systems
US3520613A (en) * 1966-11-14 1970-07-14 Optomechanisms Inc Interferometer with environmental correction computer
US3791739A (en) * 1970-12-30 1974-02-12 Asahi Optical Co Ltd Interferometer for x-y measurement
US3750245A (en) * 1971-09-21 1973-08-07 Pratt & Whitney Inc Turret lathe
US3878742A (en) * 1972-12-04 1975-04-22 Index Werke Kg Hahn & Tessky Numerically controlled lathes
US4038890A (en) * 1975-11-24 1977-08-02 U.S. Industries, Inc. Machine control system

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
"Lasers in Interferometric Distance Measurement." Colloquium on Optical Techtr iques for Measurement in Control, ROWLEY, October 1970 (pp. 1-4) *
Radio & Electr. Engineer, 40(1): 49-55, July 1970 *
Rec. Electr. Common Eng. Conversazione. 45(4): 177-180, November 1976 *
See also references of EP0058673A4 *

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2640040A1 (fr) * 1988-12-05 1990-06-08 Micro Controle Procede et dispositif de mesure optique
WO1990006489A2 (fr) * 1988-12-05 1990-06-14 Micro-Controle Procede et dispositif de mesure optique
WO1990006489A3 (fr) * 1988-12-05 1990-10-04 Micro Controle Procede et dispositif de mesure optique
WO2008134385A1 (fr) * 2007-04-28 2008-11-06 Miyano Steven S Machine-outil contrôlée par ordinateur avec accommodation et alignement de température
CN111366070A (zh) * 2018-12-25 2020-07-03 苏州笛卡测试技术有限公司 一种复合式线激光测量系统多轴空间坐标系标定方法

Also Published As

Publication number Publication date
EP0058673A4 (fr) 1985-04-03
EP0058673A1 (fr) 1982-09-01

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