WO1981003580A1 - Chambre d'echantillons pour instrument de sondage electronique - Google Patents
Chambre d'echantillons pour instrument de sondage electronique Download PDFInfo
- Publication number
- WO1981003580A1 WO1981003580A1 PCT/SU1980/000103 SU8000103W WO8103580A1 WO 1981003580 A1 WO1981003580 A1 WO 1981003580A1 SU 8000103 W SU8000103 W SU 8000103W WO 8103580 A1 WO8103580 A1 WO 8103580A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- shaft
- electron
- eleκτροnnο
- οπτichesκοy
- vdοl
- Prior art date
Links
- 238000009434 installation Methods 0.000 claims description 4
- 230000007246 mechanism Effects 0.000 abstract description 12
- 239000000523 sample Substances 0.000 description 18
- 230000008859 change Effects 0.000 description 5
- 230000004308 accommodation Effects 0.000 description 3
- 230000008901 benefit Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 239000000725 suspension Substances 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 206010069808 Electrical burn Diseases 0.000 description 1
- 241001663154 Electron Species 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 230000004913 activation Effects 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 231100001261 hazardous Toxicity 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 235000013372 meat Nutrition 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
Definitions
- the drive shaft is attached to the shafts; at the other hand, the shafts are connected to the corresponding shafts and the first and second shafts
- the invention has been provided with the task of creating such a small-sized camera for the consumer, in fact,
- s ⁇ - de ⁇ z haschaya ge ⁇ me ⁇ ichny ⁇ us in ⁇ m ⁇ azmeschen ⁇ dvizh- 5 ny s ⁇ lzh ⁇ for us ⁇ an ⁇ v ⁇ zh thereon issleduem ⁇ g ⁇ ⁇ b ⁇ aztsa and ⁇ iv ⁇ dnye me ⁇ anizsh for ⁇ e ⁇ emescheniya s ⁇ li ⁇ a vd ⁇ l ⁇ e ⁇ vzashln ⁇ ⁇ e ⁇ endi ⁇ ulya ⁇ ny ⁇ ⁇ dina ⁇ ny ⁇ ⁇ sey, ⁇ dna ZHZ ⁇ y ⁇ It complies with the
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Nitrogen And Oxygen Or Sulfur-Condensed Heterocyclic Ring Systems (AREA)
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/SU1980/000103 WO1981003580A1 (fr) | 1980-06-09 | 1980-06-09 | Chambre d'echantillons pour instrument de sondage electronique |
| JP55501573A JPS57500954A (enrdf_load_stackoverflow) | 1980-06-09 | 1980-06-09 | |
| DE803050424T DE3050424A1 (de) | 1980-06-09 | 1980-06-09 | Sample chamber for electron-sounding instrument |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/SU1980/000103 WO1981003580A1 (fr) | 1980-06-09 | 1980-06-09 | Chambre d'echantillons pour instrument de sondage electronique |
| WOSU80/00103 | 1980-06-09 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO1981003580A1 true WO1981003580A1 (fr) | 1981-12-10 |
Family
ID=21616626
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/SU1980/000103 WO1981003580A1 (fr) | 1980-06-09 | 1980-06-09 | Chambre d'echantillons pour instrument de sondage electronique |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JPS57500954A (enrdf_load_stackoverflow) |
| DE (1) | DE3050424A1 (enrdf_load_stackoverflow) |
| WO (1) | WO1981003580A1 (enrdf_load_stackoverflow) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0595548A1 (en) * | 1992-10-26 | 1994-05-04 | Hitachi, Ltd. | An apparatus for measuring electromagnetic field distribution using a focused electron beam |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| AU407449B2 (en) * | 1966-11-07 | 1970-11-03 | Commonwealth Scientific And Industrial Research Organization | Apparatus for positioning specimens in electron microscopes or electron diffraction cameras |
| JPS4826416A (enrdf_load_stackoverflow) * | 1971-08-11 | 1973-04-07 | ||
| GB1320346A (en) * | 1970-05-22 | 1973-06-13 | Ass Elect Ind | Specimen stages for electron microscopes |
| JPS493290A (enrdf_load_stackoverflow) * | 1972-03-27 | 1974-01-12 | ||
| SU568984A1 (ru) * | 1976-02-20 | 1977-08-15 | Предприятие П/Я А-7638 | Гениометрический столик объектов |
-
1980
- 1980-06-09 JP JP55501573A patent/JPS57500954A/ja active Pending
- 1980-06-09 DE DE803050424T patent/DE3050424A1/de not_active Withdrawn
- 1980-06-09 WO PCT/SU1980/000103 patent/WO1981003580A1/ru active Application Filing
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| AU407449B2 (en) * | 1966-11-07 | 1970-11-03 | Commonwealth Scientific And Industrial Research Organization | Apparatus for positioning specimens in electron microscopes or electron diffraction cameras |
| GB1320346A (en) * | 1970-05-22 | 1973-06-13 | Ass Elect Ind | Specimen stages for electron microscopes |
| JPS4826416A (enrdf_load_stackoverflow) * | 1971-08-11 | 1973-04-07 | ||
| JPS493290A (enrdf_load_stackoverflow) * | 1972-03-27 | 1974-01-12 | ||
| SU568984A1 (ru) * | 1976-02-20 | 1977-08-15 | Предприятие П/Я А-7638 | Гениометрический столик объектов |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0595548A1 (en) * | 1992-10-26 | 1994-05-04 | Hitachi, Ltd. | An apparatus for measuring electromagnetic field distribution using a focused electron beam |
Also Published As
| Publication number | Publication date |
|---|---|
| DE3050424A1 (de) | 1982-07-29 |
| JPS57500954A (enrdf_load_stackoverflow) | 1982-05-27 |
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