USRE41342E1 - Coating thickness gauge - Google Patents
Coating thickness gauge Download PDFInfo
- Publication number
- USRE41342E1 USRE41342E1 US09/542,640 US54264000A USRE41342E US RE41342 E1 USRE41342 E1 US RE41342E1 US 54264000 A US54264000 A US 54264000A US RE41342 E USRE41342 E US RE41342E
- Authority
- US
- United States
- Prior art keywords
- coating thickness
- descriptive data
- thickness values
- data
- recording
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000000576 coating method Methods 0.000 title claims abstract description 103
- 239000011248 coating agent Substances 0.000 title claims abstract description 99
- 239000000523 sample Substances 0.000 claims abstract description 51
- 238000009675 coating thickness measurement Methods 0.000 claims abstract description 17
- 238000000034 method Methods 0.000 claims description 39
- 239000000758 substrate Substances 0.000 claims description 27
- CWYNVVGOOAEACU-UHFFFAOYSA-N Fe2+ Chemical compound [Fe+2] CWYNVVGOOAEACU-UHFFFAOYSA-N 0.000 claims description 8
- 230000001131 transforming effect Effects 0.000 claims description 4
- 238000007619 statistical method Methods 0.000 claims 2
- 238000005259 measurement Methods 0.000 description 14
- 239000000463 material Substances 0.000 description 8
- 230000008859 change Effects 0.000 description 7
- 238000010586 diagram Methods 0.000 description 6
- 230000008569 process Effects 0.000 description 6
- 238000007405 data analysis Methods 0.000 description 4
- 230000004907 flux Effects 0.000 description 4
- 238000003070 Statistical process control Methods 0.000 description 3
- 230000006870 function Effects 0.000 description 3
- 230000010355 oscillation Effects 0.000 description 3
- 230000005355 Hall effect Effects 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 230000005856 abnormality Effects 0.000 description 1
- 238000009529 body temperature measurement Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000004590 computer program Methods 0.000 description 1
- 230000001276 controlling effect Effects 0.000 description 1
- 230000002596 correlated effect Effects 0.000 description 1
- 230000000875 corresponding effect Effects 0.000 description 1
- 238000001739 density measurement Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 238000002372 labelling Methods 0.000 description 1
- 229910052755 nonmetal Inorganic materials 0.000 description 1
- 150000002843 nonmetals Chemical class 0.000 description 1
- 230000008520 organization Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000004886 process control Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
- G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
- G01B7/105—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring thickness of coating
Definitions
- the present invention relates to coating thickness gauges and more particularly to a novel method and apparatus for measuring and recording coating thickness data and associated descriptive data through a graphical user interface.
- coating thickness gauges include a probe which produces an electronical signal responsive to a measured physical quantity representative of a coating thickness.
- the probe when measuring the thickness of an electrically nonconductive coating on a conductive substrate, the probe can include an inductor which registers a change in impedance based on its proximity to the conductive substrate. The impedance change of the inductor is reflected by a change in frequency in an LC oscillator which can be mathematically related to the thickness of the coating.
- Conventional coating thickness gauges have also provided the capability of transforming the electronic signal representative of coating thickness into digital data and of storing a number of data points for later downloading and analysis. Typically, the coating thickness measurements are later sequentially correlated to a written description of the article being measured. Such a procedure, however, requires the user to manually keep track of which data points correspond to which locations on the object being measured, and are thus time consuming and susceptible to recording errors.
- coating thickness gauges have been developed to provide very accurate digital readings
- the industry has not yet produced a coating thickness gauge with a user interface which facilitates recording and analysis of data, despite the ongoing advances in computer technology.
- a method and apparatus for measuring and recording coating thickness data which is easy to use and which ensures accuracy and reliability in the recording of measurements.
- It is a further object of the invention to provide a modularized coating thickness apparatus which includes a probe which produces an electrical signal representative of a measured coating thickness and a PCMCIA card which receives the electrical signal and converts the electrical signal into a digital data signal in a standard PCMCIA output format.
- the coating thickness apparatus preferably includes a portable computing unit or Personal Digital Assistant (PDA) with a port for receiving the PCMCIA card and a screen for providing a graphical user interface.
- PDA Personal Digital Assistant
- An exemplary method includes the steps of obtaining a plurality of coating thickness values with a probe electrically connected to an electronic memory, recording in the electronic memory the plurality of coating thickness values, and recording in the electronic memory a plurality of descriptive data units, each descriptive data unit being associated with one of the coating thickness values and defined, for example, with reference to an electronic pictorial representation of the coated article.
- the steps of recording the coating thickness values and of recording the descriptive data units may be performed alternately.
- Exemplary embodiments of the invention provide the on-site user with the power of a personal computer together with an easy-to-use interface that does not require a keyboard.
- the gauge improves the accuracy and reliability of coating thickness measurements, provides the flexibility of plugging in any probe (e.g., magnetic, eddy current, ultrasonic, etc.) to an PCMCIA-compatible device, and allows the user to perform data analysis on-site.
- FIG. 1 is a perspective view of a coating thickness gauge according to an exemplary embodiment of the invention
- FIG. 2 is a schematic diagram of an exemplary PCMCIA card/probe unit
- FIG. 3a is an enlarged view of a portion of a first exemplary probe assembly
- FIG. 3b is a diagram of a second exemplary probe assembly
- FIG. 4 is a schematic diagram of a portable computing unit
- FIG. 5 is a diagram of an exemplary control display on the portable computing unit.
- FIG. 6 is a diagram of an exemplary output display on the portable computing unit.
- FIG. 1 is a perspective view of a coating thickness gauge according to an exemplary embodiment of the invention.
- the portable gauge 10 comprises a probe 20 connected by a cable 30 to an interface unit 40 such as a Personal Computer Memory Card International Association (PCMCIA) card.
- the PCMCIA card 40 is adapted to communicate with a portable computing unit 50 via a port 60 .
- the portable computing unit 50 is small enough to be held comfortably in the palm of one's hand. However, it preferably includes a relatively large screen display 70 to provide a graphical interface to the user.
- the screen 70 is preferably, though not necessarily, a touch-sensitive screen which can be activated, for example, with an index finger or with any suitable pointed writing instrument 80 .
- the portable computing unit 50 can be of the type generally known as a Personal Digital Assistant.
- the Apple NEWTON® which provides a graphical user interface without a keyboard, is a preferred example of such a portable computing unit 50 .
- the PCMCIA card 40 can be adapted to support a wide variety of peripheral devices, and due to its versatility, allows virtually any type of probe 20 to be incorporated into the thickness gauge 10 .
- two exemplary embodiments will now be described briefly in which a known type of probe 20 is implemented to measure the thickness of a coating on substrate.
- the PCMCIA card 40 can be adapted to support many other types of probes 20 in conjunction with the portable computing unit 50 .
- the probe 20 of the coating thickness gauge 10 can be the inductor 75 of an LC oscillator 85 of suitable, known type.
- the LC oscillator 85 allows for the measurement of the thickness of an electrically nonconductive coating on an electrically conductive substrate.
- the inductor 75 can be a simple air-core solenoid-type coil.
- air-core is meant to refer to a coil having a core made of nonmagnetic, nonmetallic material.
- the wire is wound around a nonmagnetic, nonmetallic rod.
- a probe structure housing the probe is placed in contact with the surface of the coating such that the separation of the coil 75 and the electrically conductive substrate is a function of the geometry of the probe structure and the coating thickness.
- the impedance of the coil 75 varies with its proximity to the electrically conductive substrate resulting in a corresponding variation in the oscillation frequency of the LC oscillator 85 .
- This frequency is determined by a counter 90 which is used in conjunction with a microprocessor 100 .
- a timing loop may be programmed into the microprocessor 100 such that it resets the counter 90 at the beginning of the timing loop and measures the period of time elapsed until a predetermined number of oscillations has occurred as indicated by an overflow signal. The number of measured oscillations should be large enough to achieve the desired accuracy.
- the relationship of the change in frequency of the oscillator 85 to the coating thickness is dependent on the particulars of the geometry of the probe assembly 20 , shown in expanded detail in FIG. 3 a.
- the most significant parameters affecting the relationship of the change in frequency to the coating thickness are the diameter r of the coil 75 , the number of turns of the coil 75 , the height I of the coil 75 , the gauge of the wire as it affects the dimension b, and the material of the wound wire. Furthermore, the relationship is different depending on the material composition of the substrate.
- a complete set of coefficients A 0-4 can be stored in a ROM portion 110 associated with the microprocessor unit 100 during production of the thickness 10 gauge for any desired substrate material.
- an additional set of coefficients B 0-4 can be stored for use with magnetic substrates.
- the coefficients associated with the selected substrate material can be recalled from the ROM 110 and employed along with the measured frequency change in the appropriate equation shown above for determining coating thickness.
- a second gauge probe can be used in conjunction with the present invention to determine automatically, with a single probe, the substrate characteristics, and to effect a measurement of the coating thickness on that substrate.
- a probe is described for example in commonly owned U.S. Pat. No. 5,343,146, entitled “Combination Coating Thickness Gauge Using a Magnetic Flux Density Sensor and an Eddy Current Search Coil”, which is hereby incorporated herein by reference.
- the probe tests for a ferrous substrate, measuring the temperature-compensated magnetic flux density at a pole of a permanent magnet using a Hall effect magnetic sensor and a thermistor.
- FIG. 3b shows a probe 25 which includes a permanent magnet 35 , a Hall effect magnetic sensor 45 , and a thermistor 55 .
- the magnetic flux density and temperature measurements are converted into a temperature-compensated magnetic flux density value that is proportional to the coating thickness on the ferrous substrate. If no ferrous substrate is detected, the coating thickness gauge automatically switches over to test for a conductive nonferrous substrate, measuring the effects of eddy currents generated in the conductive nonferrous substrate by the coating thickness gauge magnetic fields using an eddy current search coil 65 , as shown in FIG. 3 b.
- the eddy current measurements are converted into an eddy current frequency value that is proportional to the coating thickness on the conductive nonferrous substrate.
- the PCMCIA card 40 can be adapted to include hardware elements such as a counter or a ROM chip to support a desired coating thickness gauge probe.
- the gauge electronics 120 in FIG. 2 are thus intended to generally represent a capacity of the PCMCIA card 40 to include hardware elements to support any type of gauge probe.
- the PCMCIA card 40 can be modified by one skilled in the art to include hardware to support probes which measure thicknesses of nonmagnetic coatings on ferrous substrates, non-conductive coatings on nonferrous substrates, combination probes which measure both, or probes which ultrasonically measure coating thicknesses on nonmetals.
- the PCMCIA card 40 also includes the microprocessor 100 and a PCMCIA interface 130 which creates a standardized communication path from the microprocessor 100 to the portable computing unit 50 .
- a PCMCIA interface 130 Included in the PCMCIA interface 130 is a Universal Asynchronous Receiver Transmitter (UART) 140 , an I/O device which sends and receives information in bit-serial fashion.
- UART Universal Asynchronous Receiver Transmitter
- the microprocessor 100 in conjunction with the supporting hardware 120 , converts the signal from the probe 20 into a digital representation of a coating thickness which is transmitted through the UART 140 to the portable computing unit 50 in a standardized PCMCIA format.
- the details of this process are omitted, as those skilled in the art are capable of adapting a particular signal to the PCMCIA format.
- the physical attributes and internal operation of the PCMCIA card 40 are defined in detail by the Personal Computer Memory Card International Association, which updates the PCMCIA specifications periodically.
- the PCMCIA standard includes detailed specifications regarding the physical attributes of the card such as dimensions and mechanical tolerances, card interface information such as signal definitions for the connecting pins 125 of the PCMCIA card, and data organization on the card. Because the PCMCIA card is a standard interface, the present invention provides a versatile coating thickness gauge which can be used in a wide variety of hardware environments.
- the portable computing unit 50 receives the PCMCIA card 40 via a port 60 to communicate with the probe 20 .
- the portable computing unit 50 includes, among other elements, a microprocessor 150 for controlling the operations of the coating thickness gauge 10 . See FIG. 4 .
- the portable computing unit 50 can be programmed, for example, to automatically recognize the type of probe which is connected to the portable computing unit 50 .
- the microprocessor 150 is associated with a memory 160 which can store computer programs which control the operation of the gauge 10 .
- the microprocessor 150 exchanges data with the memory 160 and with the user via the screen 70 which is large enough to provide a graphical interface for the user.
- the versatility provided by the memory 160 , the microprocessor 150 , the large screen 70 , and the standard PCMCIA interface thus provide the coating thickness gauge 10 of the present invention with many important advantages.
- Exemplary embodiments of the invention provide the user with the ability to perform complete data analysis or statistical process control on-site, the flexibility of using any probe with any PCMCIA-compatible portable computing unit 50 , and the capability of providing a sophisticated user interface which allows the user to easily annotate coating thickness measurements with descriptive textual and graphical data.
- a user of the gauge 10 alternates between recording a thickness measurement reading with the probe 20 and entering descriptive data via the screen 70 .
- the descriptive data can be entered in a number of ways.
- a virtual typewriter keyboard can be graphically simulated on the screen 70 for entry of descriptive comments relating to a particular thickness measurement using an index finger or a pointed writing instrument 80 .
- the portable computing unit 50 can be adapted to convert a handwritten image, created by handwriting on the screen with the writing instrument 80 , into textual data.
- the process of converting a handwritten image of “electronic ink” or typed letters into digital textual data greatly facilitates the entry of descriptive data associated with a particular coating thickness measurement.
- the ability to label all or selective individual data points with descriptive text also enhances the reliability of the measured coating thickness data by ensuring that data points are properly labeled and by allowing the user to immediately record any abnormalities as measurements are taken.
- a two- or three-dimensional image of the object to be measured can be created on the screen 70 by the user as a reference for input coating thickness data points.
- a user first recalls or sketches a diagram of the object to be measured on the screen 70 of the portable computing unit 50 using the writing instrument 80 .
- This process can be facilitated with a program, included in the Apple NEWTON, which transforms user-created images into various geometrical forms such as rectangles and circles.
- the drawing is then stored in the memory 160 as a reference for the measured thickness values.
- coating thickness values are obtained with the probe 20 , the user identifies, with reference to the screen drawing, the locations on the object at which the coating thickness values were obtained.
- FIG. 1 is an example which depicts a drawing of a coated pipe 170 which a user would measure to obtain coating thickness values at various locations. After taking a measurement of the actual pipe with the probe 20 , the user simply indicates the location of the data point with reference to the pictorial representation on the screen 70 using the writing instrument. The screen thus serves as a graphical interface to record the location of data points 180 , as shown in FIG. 1 .
- the large touch-sensitive screen 70 of the portable computing unit 50 can be further adapted to facilitate operation of the coating thickness gauge 10 with a number of virtual buttons.
- the screen 70 can include several virtual buttons 190 which, for example, allow the user to enter a memory mode to begin storing thickness measurements, enter high and low tolerance limits, command the gauge to compute and display statistics on the data thus obtained, enter parameters specifying a particular process used in applying a coating, specify units for the coating thickness readings, or any other desired function.
- the process control button can be used for, among other functions, labeling any batch with a particular process used in coating. This feature facilitates data analysis by allowing the user to analyze a group of batches associated with the same coating process.
- Calibration buttons 200 are provided to calibrate the gauge when a reading differs from a known thickness.
- a display section 210 may be provided which displays thickness readings with units, an indicator of whether a ferrous or nonferrous material was measured, a textual description of a particular batch, and a label for a particular process used in coating.
- the screen 70 shown in FIG. 5 is of course intended to provide an example illustrating the versatility of one embodiment of an exemplary coating thickness gauge. It will be readily appreciated by those skilled in the art, however, that many modifications in the screen interface can be affected without departing from the scope of the invention.
- the screen 70 can also be adapted to provide graphical output, which advantageously allows the on-site user to use statistical process control in analyzing coating thickness measurements.
- FIG. 6 shows an exemplary output screen which includes graphs 220 and 230 of x-bar and range for a set of batches, a histogram 240 , and a list of desired statistics 250 for the stored readings.
- the x-bar graph 220 shows on the screen 70 a computed average thickness value for each batch.
- the range graph 230 shows a computed difference in thickness between the greatest and least measured thickness in a particular batch. These graphs thus allow the user to easily monitor any anomalies or trends in the coating process.
- the user can access any annotations or other descriptive data associated with a batch or thickness measurement simply by touching the displayed batch number, data point, or other indicia on the screen 70 with the writing instrument 80 .
- This capability allows the user to determine, for example, whether anomalies illustrated in the output graphs are associated with any anomalies described in annotations recorded during measurement.
- the histogram 240 provides an additional visual indicator of the consistency of recorded coating thickness measurements.
- This list of statistics 250 can include, among other parameters, a standard deviation calculated from measurements of selected batches, a maximum and a minimum reading, upper and lower set limits (USL, LSL) set by the user, and upper and lower control limits (UCL, LCL) which represent the average thickness plus or minus three standard deviations.
- USL, LSL upper and lower set limits
- UCL upper and lower control limits
- the output screen in FIG. 6 is, of course, intended to show one embodiment which may be modified, for example, to accommodate other statistical process control operations without departing from the scope of the invention.
- the present coating thickness gauge thus provides many important advantages in obtaining coating thickness measurement data.
- a portable computing unit such as a Personal Digital Assistant
- the invention greatly enhances the computing options available for obtaining and processing coating thickness measurements on-site.
- the user may perform data analysis, enter descriptive comments, control the gauge with icons, and generally harness the power of a large display, resident software, and regular upgrades of the portable computing unit.
- these advantages are provided in a coating thickness gauge which is substantially less expensive to manufacture than commercially available gauges.
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Abstract
A modular coating thickness gauge includes a probe which generates a signal representative of coating thickness, a PCMCIA card connected to the probe for converting the signal into a standard PCMCIA output format, and a portable computing unit for receiving the signal via the PCMCIA card. The gauge allows the on-site user to alternately record coating thickness measurement data and descriptive textual or graphical data relating to each coating thickness measurement.
Description
1. Field of the Invention
The present invention relates to coating thickness gauges and more particularly to a novel method and apparatus for measuring and recording coating thickness data and associated descriptive data through a graphical user interface.
2. Description of the Related Art
The art of measuring the thickness of a coating on a substrate has produced a wide variety of coating thickness gauges for measuring a variety of materials. In general, coating thickness gauges include a probe which produces an electronical signal responsive to a measured physical quantity representative of a coating thickness. For example, when measuring the thickness of an electrically nonconductive coating on a conductive substrate, the probe can include an inductor which registers a change in impedance based on its proximity to the conductive substrate. The impedance change of the inductor is reflected by a change in frequency in an LC oscillator which can be mathematically related to the thickness of the coating.
Conventional coating thickness gauges have also provided the capability of transforming the electronic signal representative of coating thickness into digital data and of storing a number of data points for later downloading and analysis. Typically, the coating thickness measurements are later sequentially correlated to a written description of the article being measured. Such a procedure, however, requires the user to manually keep track of which data points correspond to which locations on the object being measured, and are thus time consuming and susceptible to recording errors.
Thus, although coating thickness gauges have been developed to provide very accurate digital readings, the industry has not yet produced a coating thickness gauge with a user interface which facilitates recording and analysis of data, despite the ongoing advances in computer technology. Prior to the present invention, there was a need in the art, therefore, for a method and apparatus for measuring and recording coating thickness data which is easy to use and which ensures accuracy and reliability in the recording of measurements.
It is an object of the invention to provide a novel coating thickness gauge which allows a user to record thickness measurement data along with descriptive data through a user interface on a computer screen.
It is a further object of the invention to improve the accuracy of coating thickness measurement data by providing an apparatus which allows a user to alternate between recording a coating thickness measurement data point and recording descriptive textual or graphical data relating to the data point.
It is a further object of the invention to provide a modularized coating thickness apparatus which includes a probe which produces an electrical signal representative of a measured coating thickness and a PCMCIA card which receives the electrical signal and converts the electrical signal into a digital data signal in a standard PCMCIA output format. The coating thickness apparatus preferably includes a portable computing unit or Personal Digital Assistant (PDA) with a port for receiving the PCMCIA card and a screen for providing a graphical user interface.
An exemplary method according to the present invention includes the steps of obtaining a plurality of coating thickness values with a probe electrically connected to an electronic memory, recording in the electronic memory the plurality of coating thickness values, and recording in the electronic memory a plurality of descriptive data units, each descriptive data unit being associated with one of the coating thickness values and defined, for example, with reference to an electronic pictorial representation of the coated article. The steps of recording the coating thickness values and of recording the descriptive data units may be performed alternately.
Exemplary embodiments of the invention provide the on-site user with the power of a personal computer together with an easy-to-use interface that does not require a keyboard. Among other advantages, the gauge improves the accuracy and reliability of coating thickness measurements, provides the flexibility of plugging in any probe (e.g., magnetic, eddy current, ultrasonic, etc.) to an PCMCIA-compatible device, and allows the user to perform data analysis on-site.
The foregoing and other objects, features and advantages of the present invention will be more readily understood upon reading the following detailed description in conjunction with the drawings in which:
The PCMCIA card 40 can be adapted to support a wide variety of peripheral devices, and due to its versatility, allows virtually any type of probe 20 to be incorporated into the thickness gauge 10. For the purpose of illustration, two exemplary embodiments will now be described briefly in which a known type of probe 20 is implemented to measure the thickness of a coating on substrate. However, those skilled in the art will recognized that the PCMCIA card 40 can be adapted to support many other types of probes 20 in conjunction with the portable computing unit 50.
According to one embodiment, as shown in FIG. 2 and as further described in commonly owned U.S. Pat. No. 5,293,132, entitled “Coating Thickness Measurement Gauge”, which is hereby incorporated herein by reference, the probe 20 of the coating thickness gauge 10 can be the inductor 75 of an LC oscillator 85 of suitable, known type. The LC oscillator 85 allows for the measurement of the thickness of an electrically nonconductive coating on an electrically conductive substrate. The inductor 75 can be a simple air-core solenoid-type coil. The phrase “air-core” is meant to refer to a coil having a core made of nonmagnetic, nonmetallic material. In practice, the wire is wound around a nonmagnetic, nonmetallic rod. During measurement, a probe structure housing the probe is placed in contact with the surface of the coating such that the separation of the coil 75 and the electrically conductive substrate is a function of the geometry of the probe structure and the coating thickness.
The impedance of the coil 75 varies with its proximity to the electrically conductive substrate resulting in a corresponding variation in the oscillation frequency of the LC oscillator 85. This frequency is determined by a counter 90 which is used in conjunction with a microprocessor 100. For instance, a timing loop may be programmed into the microprocessor 100 such that it resets the counter 90 at the beginning of the timing loop and measures the period of time elapsed until a predetermined number of oscillations has occurred as indicated by an overflow signal. The number of measured oscillations should be large enough to achieve the desired accuracy.
The relationship of the change in frequency of the oscillator 85 to the coating thickness is dependent on the particulars of the geometry of the probe assembly 20, shown in expanded detail in FIG. 3a. The most significant parameters affecting the relationship of the change in frequency to the coating thickness are the diameter r of the coil 75, the number of turns of the coil 75, the height I of the coil 75, the gauge of the wire as it affects the dimension b, and the material of the wound wire. Furthermore, the relationship is different depending on the material composition of the substrate. For a nonmagnetic substrate such as aluminum, the relationship may be approximated by the fourth-order polynomial:
Y=A0+A1F+A2F2+A3F3+A4F4
where the coefficients A0-4 are determined by the geometry of theprobe 20 and the electrical characteristics of the substrate.
Y=A0+A1F+A2F2+A3F3+A4F4
where the coefficients A0-4 are determined by the geometry of the
For a six-turn single layer wound coil using 26-gauge copper wire, the coefficients A0-4 may be empirically determined and represented as follows for nonmagnetic aluminum substrates, with F representing the frequency change in KHz and Y representing the thickness in microns:
Y=10090.44−(26.965)F+(3.0195×10−2)F2−(1.60−374×10−5)F3+(+3.25473×10−9)F4
Y=10090.44−(26.965)F+(3.0195×10−2)F2−(1.60−374×10−5)F3+(+3.25473×10−9)F4
A complete set of coefficients A0-4 can be stored in a ROM portion 110 associated with the microprocessor unit 100 during production of the thickness 10 gauge for any desired substrate material. For example, an additional set of coefficients B0-4 can be stored for use with magnetic substrates. Thus, upon selection by the user of one of the substrate materials stored in memory, the coefficients associated with the selected substrate material can be recalled from the ROM 110 and employed along with the measured frequency change in the appropriate equation shown above for determining coating thickness.
According to a second exemplary embodiment, a second gauge probe can be used in conjunction with the present invention to determine automatically, with a single probe, the substrate characteristics, and to effect a measurement of the coating thickness on that substrate. Such a probe is described for example in commonly owned U.S. Pat. No. 5,343,146, entitled “Combination Coating Thickness Gauge Using a Magnetic Flux Density Sensor and an Eddy Current Search Coil”, which is hereby incorporated herein by reference. The probe tests for a ferrous substrate, measuring the temperature-compensated magnetic flux density at a pole of a permanent magnet using a Hall effect magnetic sensor and a thermistor. FIG. 3b shows a probe 25 which includes a permanent magnet 35, a Hall effect magnetic sensor 45, and a thermistor 55. The magnetic flux density and temperature measurements are converted into a temperature-compensated magnetic flux density value that is proportional to the coating thickness on the ferrous substrate. If no ferrous substrate is detected, the coating thickness gauge automatically switches over to test for a conductive nonferrous substrate, measuring the effects of eddy currents generated in the conductive nonferrous substrate by the coating thickness gauge magnetic fields using an eddy current search coil 65, as shown in FIG. 3b. The eddy current measurements are converted into an eddy current frequency value that is proportional to the coating thickness on the conductive nonferrous substrate.
Various other types of known probes may also be incorporated into the present invention, for example probes which measure coating thicknesses on ferrous substrates with a magnetic induction technique using two coils and a ferrous core. As discussed with regard to the first embodiment, the PCMCIA card 40 can be adapted to include hardware elements such as a counter or a ROM chip to support a desired coating thickness gauge probe. The gauge electronics 120 in FIG. 2 are thus intended to generally represent a capacity of the PCMCIA card 40 to include hardware elements to support any type of gauge probe. For example, as will be readily appreciated by those skilled in the art, the PCMCIA card 40 can be modified by one skilled in the art to include hardware to support probes which measure thicknesses of nonmagnetic coatings on ferrous substrates, non-conductive coatings on nonferrous substrates, combination probes which measure both, or probes which ultrasonically measure coating thicknesses on nonmetals.
In addition to the hardware support elements 120 included in the PCMCIA card 40 for a particular application. The PCMCIA card 40 also includes the microprocessor 100 and a PCMCIA interface 130 which creates a standardized communication path from the microprocessor 100 to the portable computing unit 50. Included in the PCMCIA interface 130 is a Universal Asynchronous Receiver Transmitter (UART) 140, an I/O device which sends and receives information in bit-serial fashion. The microprocessor 100, in conjunction with the supporting hardware 120, converts the signal from the probe 20 into a digital representation of a coating thickness which is transmitted through the UART 140 to the portable computing unit 50 in a standardized PCMCIA format. For brevity, the details of this process are omitted, as those skilled in the art are capable of adapting a particular signal to the PCMCIA format.
The physical attributes and internal operation of the PCMCIA card 40 are defined in detail by the Personal Computer Memory Card International Association, which updates the PCMCIA specifications periodically. The PCMCIA standard includes detailed specifications regarding the physical attributes of the card such as dimensions and mechanical tolerances, card interface information such as signal definitions for the connecting pins 125 of the PCMCIA card, and data organization on the card. Because the PCMCIA card is a standard interface, the present invention provides a versatile coating thickness gauge which can be used in a wide variety of hardware environments.
The portable computing unit 50 receives the PCMCIA card 40 via a port 60 to communicate with the probe 20. The portable computing unit 50 includes, among other elements, a microprocessor 150 for controlling the operations of the coating thickness gauge 10. See FIG. 4. The portable computing unit 50 can be programmed, for example, to automatically recognize the type of probe which is connected to the portable computing unit 50. The microprocessor 150 is associated with a memory 160 which can store computer programs which control the operation of the gauge 10. The microprocessor 150 exchanges data with the memory 160 and with the user via the screen 70 which is large enough to provide a graphical interface for the user. The versatility provided by the memory 160, the microprocessor 150, the large screen 70, and the standard PCMCIA interface thus provide the coating thickness gauge 10 of the present invention with many important advantages. Exemplary embodiments of the invention, for example, provide the user with the ability to perform complete data analysis or statistical process control on-site, the flexibility of using any probe with any PCMCIA-compatible portable computing unit 50, and the capability of providing a sophisticated user interface which allows the user to easily annotate coating thickness measurements with descriptive textual and graphical data.
According to one exemplary method of the invention, a user of the gauge 10 alternates between recording a thickness measurement reading with the probe 20 and entering descriptive data via the screen 70. The descriptive data can be entered in a number of ways. For example, a virtual typewriter keyboard can be graphically simulated on the screen 70 for entry of descriptive comments relating to a particular thickness measurement using an index finger or a pointed writing instrument 80. Alternatively, the portable computing unit 50 can be adapted to convert a handwritten image, created by handwriting on the screen with the writing instrument 80, into textual data. The process of converting a handwritten image of “electronic ink” or typed letters into digital textual data, which has been incorporated into the Apple NEWTON®, greatly facilitates the entry of descriptive data associated with a particular coating thickness measurement. The ability to label all or selective individual data points with descriptive text also enhances the reliability of the measured coating thickness data by ensuring that data points are properly labeled and by allowing the user to immediately record any abnormalities as measurements are taken.
According to a further exemplary method, a two- or three-dimensional image of the object to be measured can be created on the screen 70 by the user as a reference for input coating thickness data points. According to this method, a user first recalls or sketches a diagram of the object to be measured on the screen 70 of the portable computing unit 50 using the writing instrument 80. This process can be facilitated with a program, included in the Apple NEWTON, which transforms user-created images into various geometrical forms such as rectangles and circles. The drawing is then stored in the memory 160 as a reference for the measured thickness values. As coating thickness values are obtained with the probe 20, the user identifies, with reference to the screen drawing, the locations on the object at which the coating thickness values were obtained. In addition, the user can input for any coating thickness value, a textual description relating to the measured data point. FIG. 1 is an example which depicts a drawing of a coated pipe 170 which a user would measure to obtain coating thickness values at various locations. After taking a measurement of the actual pipe with the probe 20, the user simply indicates the location of the data point with reference to the pictorial representation on the screen 70 using the writing instrument. The screen thus serves as a graphical interface to record the location of data points 180, as shown in FIG. 1.
The large touch-sensitive screen 70 of the portable computing unit 50 can be further adapted to facilitate operation of the coating thickness gauge 10 with a number of virtual buttons. As shown in FIG. 5 , the screen 70 can include several virtual buttons 190 which, for example, allow the user to enter a memory mode to begin storing thickness measurements, enter high and low tolerance limits, command the gauge to compute and display statistics on the data thus obtained, enter parameters specifying a particular process used in applying a coating, specify units for the coating thickness readings, or any other desired function. The process control button can be used for, among other functions, labeling any batch with a particular process used in coating. This feature facilitates data analysis by allowing the user to analyze a group of batches associated with the same coating process. Calibration buttons 200 are provided to calibrate the gauge when a reading differs from a known thickness.
At the top of the screen 70, a display section 210 may be provided which displays thickness readings with units, an indicator of whether a ferrous or nonferrous material was measured, a textual description of a particular batch, and a label for a particular process used in coating. The screen 70 shown in FIG. 5 is of course intended to provide an example illustrating the versatility of one embodiment of an exemplary coating thickness gauge. It will be readily appreciated by those skilled in the art, however, that many modifications in the screen interface can be affected without departing from the scope of the invention.
The screen 70 can also be adapted to provide graphical output, which advantageously allows the on-site user to use statistical process control in analyzing coating thickness measurements. FIG. 6 shows an exemplary output screen which includes graphs 220 and 230 of x-bar and range for a set of batches, a histogram 240, and a list of desired statistics 250 for the stored readings. The x-bar graph 220 shows on the screen 70 a computed average thickness value for each batch. The range graph 230 shows a computed difference in thickness between the greatest and least measured thickness in a particular batch. These graphs thus allow the user to easily monitor any anomalies or trends in the coating process. Moreover, according to an exemplary embodiment of the invention, the user can access any annotations or other descriptive data associated with a batch or thickness measurement simply by touching the displayed batch number, data point, or other indicia on the screen 70 with the writing instrument 80. This capability allows the user to determine, for example, whether anomalies illustrated in the output graphs are associated with any anomalies described in annotations recorded during measurement.
The histogram 240 provides an additional visual indicator of the consistency of recorded coating thickness measurements. This list of statistics 250 can include, among other parameters, a standard deviation calculated from measurements of selected batches, a maximum and a minimum reading, upper and lower set limits (USL, LSL) set by the user, and upper and lower control limits (UCL, LCL) which represent the average thickness plus or minus three standard deviations. Like the screen of FIG. 5 , the output screen in FIG. 6 is, of course, intended to show one embodiment which may be modified, for example, to accommodate other statistical process control operations without departing from the scope of the invention.
The present coating thickness gauge according to exemplary embodiments of the invention thus provides many important advantages in obtaining coating thickness measurement data. By combining a portable computing unit such as a Personal Digital Assistant with a coating thickness gauge probe via a PCMCIA interface, the invention greatly enhances the computing options available for obtaining and processing coating thickness measurements on-site. Thus, the user may perform data analysis, enter descriptive comments, control the gauge with icons, and generally harness the power of a large display, resident software, and regular upgrades of the portable computing unit. Moreover, these advantages are provided in a coating thickness gauge which is substantially less expensive to manufacture than commercially available gauges.
The above-described exemplary embodiments are intended to be illustrative in all respects, rather than restrictive, of the present invention. Thus the present invention is capable of many variations in detailed implementation that can be derived from the description contained herein by a person skilled in the art. All such variations and modifications are considered to be within the scope and spirit of the present invention as defined by the following claims.
Claims (43)
1. A method of recording coating thickness measurements, comprising the steps of:
obtaining a plurality of coating thickness values with a probe electrically connected to an electronic memory;
recording in the electronic memory the plurality of coating thickness values; and
recording in the electronic memory a plurality of descriptive data, each descriptive data is associated with a respective one of the coating thickness values and provides information concerning the respective one coating thickness value,
wherein the plurality of descriptive data are recorded by transforming text entered on a computer screen with an input device into digital data.
2. The method of claim 1 , wherein the steps of recording the coating thickness values and of recording the descriptive data are performed alternately.
3. The method of claim 1 , wherein the coating thickness values are transmitted to the electronic memory via a PCMCIA card.
4. The method of claim 1 , wherein the descriptive data comprise text a written description of a thickness reading location on a coated article.
5. The method of claim 1 , wherein the descriptive data are recorded by transforming text is handwritten on a the computer screen with a writing instrument into digital data .
6. The method of claim 1 , wherein the descriptive data are defined with reference to an electronic pictorial representation of a coated article.
7. The method of claim 6 , wherein the descriptive data represent locations on the electronic pictorial representation of the coated article.
8. The method of claim 1 , further comprising the step of displaying a plurality of indicia on a graph on a video display screen, the indicia representing the plurality of coating thickness values.
9. The method of claim 8 , further comprising the step of retrieving one of the descriptive data by selecting on the graph one of the indicia.
10. An apparatus for measuring a coating thickness, comprising:
a probe which generates a first signal representative of a measured coating thickness; and
a PCMCIA card connected to the probe and which receives the first signal from the probe, the PCMCIA card including means for converting the first signal into a second signal which is compatible with a standard PCMCIA output format; and
a portable computing unit which includes a PCMCIA port for receiving the PCMCIA card,
wherein the portable computing unit includes a touch-sensitive screen, and the portable computing unit receives descriptive data from a user via the screen.
11. The apparatus of claim 10 , wherein the probe comprises an LC oscillator.
12. The apparatus of claim 11 , wherein the PCMCIA card includes a counter which measures a frequency of the LC oscillator.
13. The apparatus of claim 10 , wherein the probe comprises a permanent magnet and a Hall sensor.
14. The apparatus of claim 13 , wherein the probe further comprises an eddy current search coil.
15. The apparatus of claim 10 , wherein the probe includes means for discriminating between a ferrous and a nonferrous substrate upon which the coating is coated.
16. The apparatus of claim 10 , further comprising a portable computing unit which includes a PCMCIA port for receiving the PCMCIA card.
17. The apparatus of claim 16 , wherein the portable computing unit includes a touch-sensitive screen, and the portable computing unit receives descriptive data from a user via the screen.
18. The apparatus of claim 17 10, further comprising a pointed writing instrument for entering the descriptive data.
19. The apparatus of claim 17 10, wherein the portable computing unit comprises a memory and is adapted to alternately record in the memory the descriptive data from the user and numerical data from the second signal which numerical data represent a coating thickness.
20. The apparatus of claim 19 , wherein the descriptive data are defined with reference to a pictorial representation on the screen of an article upon which a coating is coated.
21. An apparatus for measuring and recording coating thickness measurements, comprising:
a computer screen;
an electronic memory;
means for obtaining a plurality of coating thickness values with a probe electrically connected to the electronic memory;
means for recording in the electronic memory the plurality of coating thickness values; and
means for recording in the electronic memory a plurality of descriptive data so that each descriptive data is associated with a respective one of the coating thickness values and provides information concerning the respective one coating thickness value,
wherein the plurality of descriptive data are recorded by transforming text entered on the computer screen with an input device into digital data.
22. The apparatus of claim 21 , wherein the coating thickness values are transmitted to the electronic memory via a PCMCIA card.
23. The method of claim 1 , wherein the descriptive data includes textual descriptions of the associated coating thickness values.
24. The method of claim 1 , wherein the descriptive data includes an image of an object measured to obtain the plurality of coating thickness values.
25. The method of claim 1 , wherein the descriptive data provides a description of a source of the coating thickness values.
26. The apparatus of claim 21 , wherein the descriptive data includes textual descriptions of the associated coating thickness values.
27. The apparatus of claim 21 , wherein the descriptive data includes an image of an object measured to obtain the plurality of coating thickness values.
28. The apparatus of claim 21 , wherein the descriptive data provides a description of a source of the coating thickness values.
29. The method of claim 1 , further comprising the step of inputting wherein the plurality of descriptive data via an are input device prior to recording the plurality of descriptive data with a writing instrument.
30. The apparatus of claim 21 , further comprising means for inputting wherein the plurality of descriptive data are input with a writing instrument.
31. The method according to claim 37 , wherein the descriptive data identifies the location from which the coating thickness values were taken.
32. The method according to claim 1 , further comprising the step of performing a statistical analysis of the plurality of coating thickness values.
33. The method according to claim 1 , wherein the computer screen is a graphical interface to input the descriptive data.
34. The method according to claim 33 , wherein the data is entered using a pictorial representation of the location.
35. The method according to claim 33 , wherein the screen is a touchsensitive screen and the data is entered by touching the screen.
36. The method according to claim 33 , wherein the data is entered by converting handwriting on the screen into text data.
37. The method according to claim 1 , wherein the descriptive data is recorded after the coating thickness values are recorded.
38. The method according to claim 1 , wherein each of the descriptive data is recorded after the respective coating thickness value is recorded.
39. The method according to claim 38 , further comprising the step of performing a statistical analysis of the plurality of coating thickness values.
40. The method according to claim 38 , wherein the computer screen is a graphical interface to input the descriptive data.
41. The method according to claim 38 , wherein each descriptive data identifies the location from which the respective coating thickness value was taken.
42. A method of recording coating thickness measurements, comprising the steps of:
obtaining a plurality of coating thickness values with a probe electrically connected to an electronic memory;
recording in the electronic memory the plurality of coating thickness values; and
recording in the electronic memory a plurality of descriptive data, each descriptive data is associated with a respective one of the coating thickness values and provides information concerning the respective one coating thickness value,
wherein the plurality of descriptive data are entered by touching a touch-sensitive computer screen that includes an electronic pictorial representation of a coated article.
43. An apparatus for measuring and recording coating thickness measurements, comprising:
a touch-sensitive computer screen;
an electronic memory;
means for obtaining a plurality of coating thickness values with a probe electrically connected to the electronic memory;
means for recording in the electronic memory the plurality of coating thickness values; and
means for recording in the electronic memory a plurality of descriptive data so that each descriptive data is associated with a respective one of the coating thickness values and provides information concerning the respective one coating thickness value,
wherein the plurality of descriptive data are entered by touching the touch-sensitive computer screen including an electronic pictorial representation of a coated article.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/542,640 USRE41342E1 (en) | 1995-09-15 | 2000-04-03 | Coating thickness gauge |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US52913795A | 1995-09-15 | 1995-09-15 | |
US09/542,640 USRE41342E1 (en) | 1995-09-15 | 2000-04-03 | Coating thickness gauge |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US52913795A Reissue | 1995-09-15 | 1995-09-15 |
Publications (1)
Publication Number | Publication Date |
---|---|
USRE41342E1 true USRE41342E1 (en) | 2010-05-18 |
Family
ID=24108680
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US08/529,137 Ceased US5930744A (en) | 1995-09-15 | 1995-09-15 | Coating thickness gauge |
US09/542,640 Expired - Lifetime USRE41342E1 (en) | 1995-09-15 | 2000-04-03 | Coating thickness gauge |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US08/529,137 Ceased US5930744A (en) | 1995-09-15 | 1995-09-15 | Coating thickness gauge |
Country Status (3)
Country | Link |
---|---|
US (2) | US5930744A (en) |
DE (1) | DE19637064A1 (en) |
GB (1) | GB2305251A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20120209564A1 (en) * | 2011-02-10 | 2012-08-16 | John Gardner Pfanstiehl | Low cost method for creating product condition reports from field inspections |
WO2014150385A1 (en) | 2013-03-15 | 2014-09-25 | Defelsko Corporation | Probe communications module and a computing device |
US11566881B2 (en) * | 2016-12-20 | 2023-01-31 | Greg Nickel | Devices, systems and methods for evaluating objects subject to repair or other alteration |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5934197A (en) * | 1997-06-03 | 1999-08-10 | Gerber Systems Corporation | Lithographic printing plate and method for manufacturing the same |
JP3523093B2 (en) * | 1997-11-28 | 2004-04-26 | 株式会社東芝 | Semiconductor device and manufacturing method thereof |
US6243661B1 (en) * | 1998-02-12 | 2001-06-05 | Elcometer Instruments Ltd. | Coating thickness gauge |
US6067509A (en) * | 1998-03-18 | 2000-05-23 | Gaiski; Stephen N. | Method for generating computed statistical control charts from pelt gage thickness measurements |
DE19940434B4 (en) * | 1999-08-26 | 2007-12-27 | Willtek Communications Gmbh | Device and method for displaying signal values |
US6707540B1 (en) | 1999-12-23 | 2004-03-16 | Kla-Tencor Corporation | In-situ metalization monitoring using eddy current and optical measurements |
US6433541B1 (en) | 1999-12-23 | 2002-08-13 | Kla-Tencor Corporation | In-situ metalization monitoring using eddy current measurements during the process for removing the film |
US7010991B2 (en) * | 2000-09-13 | 2006-03-14 | Pentagon Technologies Group, Inc. | Surface particle detector |
US6888453B2 (en) | 2001-06-22 | 2005-05-03 | Pentagon Technologies Group, Inc. | Environmental monitoring system |
US7115093B2 (en) | 2001-11-21 | 2006-10-03 | Ge Medical Systems Global Technology Company, Llc | Method and system for PDA-based ultrasound system |
US6819120B2 (en) * | 2002-11-13 | 2004-11-16 | Northrop Grumman Corporation | Non-contact surface conductivity measurement probe |
US20040193054A1 (en) * | 2003-02-19 | 2004-09-30 | Leblanc Paul D. | Hand-held ophthalmic device |
DE102004052302B4 (en) * | 2004-09-30 | 2013-05-23 | Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg | Method for outputting measured values and display device |
JP4862411B2 (en) * | 2006-01-30 | 2012-01-25 | ソニー株式会社 | Image blur correction device, lens device, and imaging device |
WO2013059452A1 (en) * | 2011-10-18 | 2013-04-25 | Cidra Corporate Services Inc. | Re-lined pipe technique for wear mitigation in slurry transport pipeline |
CN103575202A (en) * | 2012-08-06 | 2014-02-12 | 富泰华工业(深圳)有限公司 | Electronic device and test system with function of measuring thickness of coating layer |
CN110722608A (en) * | 2019-10-16 | 2020-01-24 | 徐州德通汽车服务有限公司 | Multifunctional automobile beauty shovel |
CN113959899B (en) * | 2021-10-11 | 2023-05-09 | 常州市大成真空技术有限公司 | Wet coating surface density measuring method and system and electronic equipment |
Citations (46)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4046994A (en) * | 1975-11-12 | 1977-09-06 | Unit Process Assemblies, Inc. | Control card receiving and sensing assembly |
US4059904A (en) * | 1975-03-04 | 1977-11-29 | Kansai Paint Company, Limited | Preparation of coating composition of specified color |
US4079237A (en) * | 1975-11-12 | 1978-03-14 | Unit Process Assemblies, Inc. | Card controlled beta backscatter thickness measuring instrument |
US4155009A (en) * | 1977-04-07 | 1979-05-15 | Unit Process Assemblies, Inc. | Thickness measurement instrument with memory storage of multiple calibrations |
US4266875A (en) * | 1979-02-20 | 1981-05-12 | Siemens Aktiengesellschaft | Method and device for contact-free interval or thickness measurement by control of the direction of a light ray beam |
US4389706A (en) * | 1972-05-03 | 1983-06-21 | Westinghouse Electric Corp. | Digital computer monitored and/or operated system or process which is structured for operation with an improved automatic programming process and system |
JPS59180322A (en) * | 1983-03-30 | 1984-10-13 | Mitsubishi Electric Corp | Distribution display method of film thickness |
WO1987004783A1 (en) * | 1986-02-06 | 1987-08-13 | Britoil P.L.C., | Ultrasonic thickness meter |
US4695797A (en) | 1984-02-10 | 1987-09-22 | Karl Deutsch Pruf- und Messgeratebau GmbH+Co. KG | Method of and apparatus for layer thickness measurement |
US4715007A (en) * | 1984-07-31 | 1987-12-22 | Kett Electric Laboratory | Instrument for measuring film thickness |
US4742879A (en) * | 1985-10-01 | 1988-05-10 | Trutzschler Gmbh & Co. Kg | Apparatus for measuring quantities of fiber fed to a textile machine |
US4791706A (en) * | 1986-05-24 | 1988-12-20 | Tr/u/ tzschler GmbH & Co. KG | Method and apparatus for evening the sliver produced by a card |
WO1989003020A1 (en) * | 1987-09-28 | 1989-04-06 | Sekisui Jushi Kabushiki Kaisha | Recording card system of temperature and humidity |
US4863037A (en) * | 1986-09-05 | 1989-09-05 | Opex Corporation | Apparatus for the automated processing of bulk mail and the like |
WO1990002920A1 (en) * | 1988-09-16 | 1990-03-22 | International Electronic Machines Corporation | Portable electronic wheel wear gauge |
US4919967A (en) * | 1987-07-09 | 1990-04-24 | Behr Industrieanlagen Gmbh & Co. | Method and apparatus for coating parts in series |
US4934309A (en) * | 1988-04-15 | 1990-06-19 | International Business Machines Corporation | Solder deposition system |
US4962569A (en) * | 1988-02-05 | 1990-10-16 | Truzschler GmbH & Co. KG | Method and apparatus for obtaining measuring values representing the thickness of a coherent fiber mass |
US4967381A (en) * | 1985-04-30 | 1990-10-30 | Prometrix Corporation | Process control interface system for managing measurement data |
US4974166A (en) * | 1987-05-18 | 1990-11-27 | Asyst Technologies, Inc. | Processing systems with intelligent article tracking |
US4982477A (en) * | 1988-10-07 | 1991-01-08 | Trutzschler Gmbh & Co. Kg | Method and apparatus for detecting sliver feed |
US5066241A (en) * | 1990-06-18 | 1991-11-19 | Eastman Kodak Company | Electrical connector apparatus for use with an integrated circuit card |
US5097421A (en) * | 1984-12-24 | 1992-03-17 | Asyst Technologies, Inc. | Intelligent waxer carrier |
US5138268A (en) * | 1990-08-15 | 1992-08-11 | Steve Mulkey | Thickness measuring system for nonconducting materials |
US5137661A (en) * | 1988-11-16 | 1992-08-11 | Canon Kabushiki Kaisha | Process for producing optical recording medium |
US5165415A (en) * | 1985-09-27 | 1992-11-24 | Bio-Rad Laboratories, Inc. | Self contained hand held ultrasonic instrument for ophthalmic use |
JPH05185367A (en) * | 1992-01-16 | 1993-07-27 | Fujikoshi Kikai Kogyo Kk | Lapping device |
US5233727A (en) * | 1990-07-04 | 1993-08-10 | Zellweger Uster Ag | Device for measuring the thickness and/or unevenness of webs or wadding on spinning preparation machines. |
US5241280A (en) * | 1990-06-05 | 1993-08-31 | Defelsko Corporation | Coating thickness measurement gauge |
GB2265985A (en) * | 1992-04-11 | 1993-10-13 | Elcometer Instr Ltd | Measuring instrument |
US5254830A (en) * | 1991-05-07 | 1993-10-19 | Hughes Aircraft Company | System for removing material from semiconductor wafers using a contained plasma |
US5335066A (en) * | 1991-08-29 | 1994-08-02 | Nkk Corporation | Measuring method for ellipsometric parameter and ellipsometer |
US5343146A (en) * | 1992-10-05 | 1994-08-30 | De Felsko Corporation | Combination coating thickness gauge using a magnetic flux density sensor and an eddy current search coil |
US5416411A (en) * | 1993-01-08 | 1995-05-16 | Lockheed Fort Worth Company | System and method for measuring the thickness of a ferromagnetic layer |
US5467014A (en) * | 1992-07-03 | 1995-11-14 | Nix; Norbert | Device for measuring the thickness of a layer or coating on a ferrous and/or non-ferrous substrate |
US5666553A (en) * | 1992-04-10 | 1997-09-09 | Puma Technology, Inc. | Method for mapping, translating, and dynamically reconciling data between disparate computer platforms |
US5884323A (en) * | 1995-10-13 | 1999-03-16 | 3Com Corporation | Extendible method and apparatus for synchronizing files on two different computer systems |
US5886522A (en) * | 1995-10-05 | 1999-03-23 | Elcometer Instruments Limited | Dual mode coating thickness measuring probe for determining the thickness of a coating on ferrous and non-ferrous substrates |
US5956658A (en) * | 1993-09-18 | 1999-09-21 | Diagnostic Instruments Limited | Portable data collection apparatus for collecting maintenance data from a field tour |
US6202060B1 (en) * | 1996-10-29 | 2001-03-13 | Bao Q. Tran | Data management system |
US6243661B1 (en) * | 1998-02-12 | 2001-06-05 | Elcometer Instruments Ltd. | Coating thickness gauge |
US6429846B2 (en) * | 1998-06-23 | 2002-08-06 | Immersion Corporation | Haptic feedback for touchpads and other touch controls |
US6789030B1 (en) * | 2000-06-23 | 2004-09-07 | Bently Nevada, Llc | Portable data collector and analyzer: apparatus and method |
US6885727B2 (en) * | 2001-08-07 | 2005-04-26 | Sii Nanotechnology Inc. | Apparatus and method for measuring thickness and composition of multi-layered sample |
US6954064B2 (en) * | 2002-12-02 | 2005-10-11 | The Boeing Company | Method and apparatus for measuring a thickness of a nonconductive coating and calibrating a thickness measurement gauge |
US6985138B2 (en) * | 2003-08-29 | 2006-01-10 | Motorola, Inc. | Input writing device |
-
1995
- 1995-09-15 US US08/529,137 patent/US5930744A/en not_active Ceased
-
1996
- 1996-09-12 DE DE19637064A patent/DE19637064A1/en not_active Withdrawn
- 1996-09-12 GB GB9619032A patent/GB2305251A/en not_active Withdrawn
-
2000
- 2000-04-03 US US09/542,640 patent/USRE41342E1/en not_active Expired - Lifetime
Patent Citations (51)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4389706A (en) * | 1972-05-03 | 1983-06-21 | Westinghouse Electric Corp. | Digital computer monitored and/or operated system or process which is structured for operation with an improved automatic programming process and system |
US4059904A (en) * | 1975-03-04 | 1977-11-29 | Kansai Paint Company, Limited | Preparation of coating composition of specified color |
US4046994A (en) * | 1975-11-12 | 1977-09-06 | Unit Process Assemblies, Inc. | Control card receiving and sensing assembly |
US4079237A (en) * | 1975-11-12 | 1978-03-14 | Unit Process Assemblies, Inc. | Card controlled beta backscatter thickness measuring instrument |
US4155009A (en) * | 1977-04-07 | 1979-05-15 | Unit Process Assemblies, Inc. | Thickness measurement instrument with memory storage of multiple calibrations |
US4266875A (en) * | 1979-02-20 | 1981-05-12 | Siemens Aktiengesellschaft | Method and device for contact-free interval or thickness measurement by control of the direction of a light ray beam |
JPS59180322A (en) * | 1983-03-30 | 1984-10-13 | Mitsubishi Electric Corp | Distribution display method of film thickness |
US4695797A (en) | 1984-02-10 | 1987-09-22 | Karl Deutsch Pruf- und Messgeratebau GmbH+Co. KG | Method of and apparatus for layer thickness measurement |
US4715007A (en) * | 1984-07-31 | 1987-12-22 | Kett Electric Laboratory | Instrument for measuring film thickness |
US5097421A (en) * | 1984-12-24 | 1992-03-17 | Asyst Technologies, Inc. | Intelligent waxer carrier |
US4967381A (en) * | 1985-04-30 | 1990-10-30 | Prometrix Corporation | Process control interface system for managing measurement data |
US5165415A (en) * | 1985-09-27 | 1992-11-24 | Bio-Rad Laboratories, Inc. | Self contained hand held ultrasonic instrument for ophthalmic use |
US4742879A (en) * | 1985-10-01 | 1988-05-10 | Trutzschler Gmbh & Co. Kg | Apparatus for measuring quantities of fiber fed to a textile machine |
WO1987004783A1 (en) * | 1986-02-06 | 1987-08-13 | Britoil P.L.C., | Ultrasonic thickness meter |
US4791706A (en) * | 1986-05-24 | 1988-12-20 | Tr/u/ tzschler GmbH & Co. KG | Method and apparatus for evening the sliver produced by a card |
US5115918A (en) * | 1986-09-05 | 1992-05-26 | Opex Corporation | Apparatus for the automated processing of bulk mail and the like |
US4863037A (en) * | 1986-09-05 | 1989-09-05 | Opex Corporation | Apparatus for the automated processing of bulk mail and the like |
US5054700A (en) * | 1986-09-05 | 1991-10-08 | Opex Corporation | Apparatus for the automated processing of bulk mail and the like |
US5054620A (en) * | 1986-09-05 | 1991-10-08 | Opex Corporation | Apparatus for the automated processing of bulk mail and the like |
US4974166A (en) * | 1987-05-18 | 1990-11-27 | Asyst Technologies, Inc. | Processing systems with intelligent article tracking |
US4919967A (en) * | 1987-07-09 | 1990-04-24 | Behr Industrieanlagen Gmbh & Co. | Method and apparatus for coating parts in series |
WO1989003020A1 (en) * | 1987-09-28 | 1989-04-06 | Sekisui Jushi Kabushiki Kaisha | Recording card system of temperature and humidity |
US4962569A (en) * | 1988-02-05 | 1990-10-16 | Truzschler GmbH & Co. KG | Method and apparatus for obtaining measuring values representing the thickness of a coherent fiber mass |
US4934309A (en) * | 1988-04-15 | 1990-06-19 | International Business Machines Corporation | Solder deposition system |
WO1990002920A1 (en) * | 1988-09-16 | 1990-03-22 | International Electronic Machines Corporation | Portable electronic wheel wear gauge |
US4982477A (en) * | 1988-10-07 | 1991-01-08 | Trutzschler Gmbh & Co. Kg | Method and apparatus for detecting sliver feed |
US5137661A (en) * | 1988-11-16 | 1992-08-11 | Canon Kabushiki Kaisha | Process for producing optical recording medium |
US5241280A (en) * | 1990-06-05 | 1993-08-31 | Defelsko Corporation | Coating thickness measurement gauge |
US5293132A (en) * | 1990-06-05 | 1994-03-08 | Defelsko Corporation | Coating thickness measurement gauge |
US5066241A (en) * | 1990-06-18 | 1991-11-19 | Eastman Kodak Company | Electrical connector apparatus for use with an integrated circuit card |
US5233727A (en) * | 1990-07-04 | 1993-08-10 | Zellweger Uster Ag | Device for measuring the thickness and/or unevenness of webs or wadding on spinning preparation machines. |
US5138268A (en) * | 1990-08-15 | 1992-08-11 | Steve Mulkey | Thickness measuring system for nonconducting materials |
US5254830A (en) * | 1991-05-07 | 1993-10-19 | Hughes Aircraft Company | System for removing material from semiconductor wafers using a contained plasma |
US5335066A (en) * | 1991-08-29 | 1994-08-02 | Nkk Corporation | Measuring method for ellipsometric parameter and ellipsometer |
JPH05185367A (en) * | 1992-01-16 | 1993-07-27 | Fujikoshi Kikai Kogyo Kk | Lapping device |
US5701423A (en) * | 1992-04-10 | 1997-12-23 | Puma Technology, Inc. | Method for mapping, translating, and dynamically reconciling data between disparate computer platforms |
US5666553A (en) * | 1992-04-10 | 1997-09-09 | Puma Technology, Inc. | Method for mapping, translating, and dynamically reconciling data between disparate computer platforms |
GB2265985A (en) * | 1992-04-11 | 1993-10-13 | Elcometer Instr Ltd | Measuring instrument |
US5467014A (en) * | 1992-07-03 | 1995-11-14 | Nix; Norbert | Device for measuring the thickness of a layer or coating on a ferrous and/or non-ferrous substrate |
US5343146A (en) * | 1992-10-05 | 1994-08-30 | De Felsko Corporation | Combination coating thickness gauge using a magnetic flux density sensor and an eddy current search coil |
US5416411A (en) * | 1993-01-08 | 1995-05-16 | Lockheed Fort Worth Company | System and method for measuring the thickness of a ferromagnetic layer |
US5956658A (en) * | 1993-09-18 | 1999-09-21 | Diagnostic Instruments Limited | Portable data collection apparatus for collecting maintenance data from a field tour |
US5886522A (en) * | 1995-10-05 | 1999-03-23 | Elcometer Instruments Limited | Dual mode coating thickness measuring probe for determining the thickness of a coating on ferrous and non-ferrous substrates |
US5884323A (en) * | 1995-10-13 | 1999-03-16 | 3Com Corporation | Extendible method and apparatus for synchronizing files on two different computer systems |
US6202060B1 (en) * | 1996-10-29 | 2001-03-13 | Bao Q. Tran | Data management system |
US6243661B1 (en) * | 1998-02-12 | 2001-06-05 | Elcometer Instruments Ltd. | Coating thickness gauge |
US6429846B2 (en) * | 1998-06-23 | 2002-08-06 | Immersion Corporation | Haptic feedback for touchpads and other touch controls |
US6789030B1 (en) * | 2000-06-23 | 2004-09-07 | Bently Nevada, Llc | Portable data collector and analyzer: apparatus and method |
US6885727B2 (en) * | 2001-08-07 | 2005-04-26 | Sii Nanotechnology Inc. | Apparatus and method for measuring thickness and composition of multi-layered sample |
US6954064B2 (en) * | 2002-12-02 | 2005-10-11 | The Boeing Company | Method and apparatus for measuring a thickness of a nonconductive coating and calibrating a thickness measurement gauge |
US6985138B2 (en) * | 2003-08-29 | 2006-01-10 | Motorola, Inc. | Input writing device |
Non-Patent Citations (42)
Title |
---|
"Dataputer Specification Sheet" as Exhibit "M" from Affidavit of Peter Baldwin. |
"Elcometer 1994 World Sales Conference Program" as Exhibit "J" from Affidavit of Peter Baldwin. |
"Elcometer 300 Information Sheet" as Exhibit "A" from Affidavit of Peter Baldwin. |
"Elcometer 300 Operating Instructions" as Exhibit "B" from Affidavit of Peter Baldwin. |
"Elcometer 300 Specification Sheet " as Exhibit "C" from Affidavit of Peter Baldwin. |
"Elcometer 355 Information Sheet" as Exhibit "D" from Affidavit of Peter Baldwin. |
"Elcometer 355 Instruction Booklet" as Exhibit "E" from Affidavit of Peter Baldwin. |
"Elcometer 365 Information Sheet" as Exhibit "I" from Affidavit of Peter Baldwin. |
"Elcometer 365 Information Sheet" as Exhibit "K" from Affidavit of Peter Baldwin. |
"Elcometer 500 Instruction Manual" as part of Enclosure 1 from correspondence from Wilson Gunn, M'Caw dated May 20, 1999. |
"Elcometer 500 literature" (dated Jun. 1986), as part of Enclosure 1 from correspondence from Wilson, Gunn, M'Caw dated May 20, 1999. |
"Elcometer Lead Sheet" as Exhibit "L" from Affidavit of Peter Baldwin. |
"Fischerscope MMS Information Sheet" as Exhibit "O" from Affidavit of Peter Baldwin. |
"Instruction Sheets relating to the use of coating thickness measuring probes with the Elcometer 500" (dated Jul. 3, 1987) as part of Enclosure 1 from correspondence from Wilson, Gunn, M'Caw dated May 20, 1999. |
"Introductory Pages" as part of Enclosure 2 from correspondence from Wilson, Gunn, M'Caw dated May 20, 1999. |
"Invoice No. 016849 issued by Elcometer Instruments Limited, " dated Jul. 14, 1993 as Exhibit "N" from Affidavit of Peter Baldwin. |
"Invoice No. 029902 issued by Elcometer Instruments Limited" as Exhibit "H" from Affidavit of Peter Baldwin. |
"Printout from an Elcometer 355 Coating Thickness Gauge in Histogram Format" as Exhibit "G" from Affidavit of Peter Baldwin. |
"Printout from an Elcometer 355 Coating Thickness Gauge" as Exhibit "F" from Affidavit of Peter Baldwin. |
Affidavit of Peter Baldwin dated Jan. 19, 1998 submitted concurrently with the Third Party Observations, referring to prior art documents attached thereto as Exhibits "A" through "O". |
Chapter 1-6 of the SPC FocusPlus Users Manual produced by VERAX Systems, Inc. as part of Enclosure 2 from correspondence from Wilson, Gunn, M'Caw dated May 20, 1999. |
Comments made by Examiner in response to Third Party Observations submitted in DeFelsko's UK application. |
Correspondence from Wilson, Gunn, M'Caw to DeFelsko's U.S. attorneys, dated May 14, 1999. |
Correspondence from Wilson, Gunn, M'Caw to DeFelsko's U.S. attorneys, dated May 20, 1999, and two (2) enclosures. |
Elcometer 500 Literature; elcometer 500; 8 pages; 1986. |
Elcometer 500; Instruction Manual; Publication ELC0500/0886/3.05; 55 pages;. |
Extracts from an Addendum to the VERAX SPC FocusPlus Users Manual as part of Enclosure 2 from correspondence from Wilson, Gunn, M'Caw dated May 20, 1999. |
Initialed PTO Form 1449 dated Dec. 16, 1998 from File History of U.S. Pat. No. 5,930,744 listing selected documents cited in the Third Submissions and referred to the Affidavit of Peter Baldwin dated Jan. 19, 1998. |
Instruction Manual for an ETG instrument available in the U.S. since 1991. |
Interface between Elcometer. . . ; Instruction Sheet; pp. 4316-1 through 4316-3. |
Introductory Pages of User's Manual for SPC FocusPLUS; Verax Systems, Inc.; 1994; 15 pages. |
Leptoskop Layer Thickness Gauges; 4 pages. |
NDTnet; Karl Deutsch Handterminal 2051 Layer Thickness Measuring with or without PC; Oct. 1998; 1 page. |
New Affidavit of Peter Baldwin dated Aug. 1, 2001 and referring to prior art documents attached thereto as Exhibits "A" through "Q". |
Personal Computer Memory Card International Association PCMCIA PC Card Standard, pp. i through xii, 1-3 through 1-4, 2-1 through 2-4, 3-1 through 3-28, 4-1 through 4-4, Release 2.1, Jul. 1993. * |
Representative MG Rover data recordal sheet. |
Sonden für LEPTOSKOP 2040 in orginalgrbetae; 1995; 1 page. |
Sonden für LEPTOSKOP 2040 in orginalgrβe; 1995; 1 page. |
SPC FocusPLUS User's Manual; Chapter 6; Variables Data collection; 28 pages. |
Third Party Observations filed in the U.K. Patent Office during pendency of DeFelsko's U.K. application. |
Unsigned PTO Form 1449 from File History of U.S. Pat. No. 5,930,744 listing enclosures from Wilson, Gunn, M'Caw letter of May 20, 1999. |
Verax Systems, Inc.; SPC FocusPLUS; 1993; 9 pages;. |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20120209564A1 (en) * | 2011-02-10 | 2012-08-16 | John Gardner Pfanstiehl | Low cost method for creating product condition reports from field inspections |
US8874408B2 (en) * | 2011-02-10 | 2014-10-28 | John Gardner Pfanstiehl | Low cost method for creating product condition reports from field inspections |
WO2014150385A1 (en) | 2013-03-15 | 2014-09-25 | Defelsko Corporation | Probe communications module and a computing device |
US11566881B2 (en) * | 2016-12-20 | 2023-01-31 | Greg Nickel | Devices, systems and methods for evaluating objects subject to repair or other alteration |
Also Published As
Publication number | Publication date |
---|---|
DE19637064A1 (en) | 1997-03-20 |
US5930744A (en) | 1999-07-27 |
GB2305251A (en) | 1997-04-02 |
GB9619032D0 (en) | 1996-10-23 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
USRE41342E1 (en) | Coating thickness gauge | |
US5825351A (en) | Method and apparatus for noise filtering for an input device | |
KR920006327B1 (en) | System for sensing spacial coordinates | |
US6195618B1 (en) | Component position verification using a probe apparatus | |
EP0916923A2 (en) | Method and apparatus for displaying active probe tip status of a coordinate measuring machine | |
CN101802565B (en) | Universal transmitter for magnetic flow measurement | |
CA1320251C (en) | Parallel plate dielectric analyzer | |
CN115798659A (en) | Quality control method, quality control system, analyzer and computer storage medium | |
JP6994282B1 (en) | Wall thickness measurement method | |
US20150233697A1 (en) | Measuring Instrument and Method | |
US6639403B2 (en) | System and method for sensing magnetic fields based on movement | |
CA2212355A1 (en) | Generating data about the surface of an object | |
Quirk | Semiautomated recording of wood cell dimensions | |
Malikov et al. | Application of the eddy current method for flaw detection of conductive tracks of printed circuit boards | |
CN114152860B (en) | Probe calibration method and device, electronic equipment and storage medium | |
CN111103032B (en) | Two-wire water level and water temperature and pumping test detection instrument and method | |
CN210442500U (en) | Novel high-precision magnetic field measuring instrument | |
JPS59150313A (en) | Measuring apparatus of distribution of physical quantities | |
Pachhandara | The Human Touch | |
TWI601941B (en) | Electronic device and weighing method | |
CN114424928A (en) | Pulse condition measuring equipment and pulse condition measuring method for pulse diagnosis | |
Ivanov et al. | Intelligent System for Capacitance Measurements | |
JPH07320019A (en) | Sensor card and measuring instrument using the same | |
CN110989013A (en) | Method and device for calculating susceptibility value, storage medium and electronic equipment | |
CN107462784A (en) | The detection numerical value storage device of detector bar |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
FPAY | Fee payment |
Year of fee payment: 12 |