USRE29755E - Piezoelectric transducer having a crystal orientation selected from (xyl) + 31.7° (±1°) and (xyl) + 76.7° (±1°) or symmetrical equivalent - Google Patents
Piezoelectric transducer having a crystal orientation selected from (xyl) + 31.7° (±1°) and (xyl) + 76.7° (±1°) or symmetrical equivalent Download PDFInfo
- Publication number
- USRE29755E USRE29755E US05/790,513 US79051377A USRE29755E US RE29755 E USRE29755 E US RE29755E US 79051377 A US79051377 A US 79051377A US RE29755 E USRE29755 E US RE29755E
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- United States
- Prior art keywords
- crystal
- xyl
- cut
- orientation
- piezoelectric
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Links
- 239000013078 crystal Substances 0.000 title claims abstract description 95
- GQYHUHYESMUTHG-UHFFFAOYSA-N lithium niobate Chemical compound [Li+].[O-][Nb](=O)=O GQYHUHYESMUTHG-UHFFFAOYSA-N 0.000 claims abstract description 18
- 230000035945 sensitivity Effects 0.000 abstract description 21
- 230000006835 compression Effects 0.000 abstract description 6
- 238000007906 compression Methods 0.000 abstract description 6
- 230000000694 effects Effects 0.000 description 6
- 238000006073 displacement reaction Methods 0.000 description 5
- 239000000463 material Substances 0.000 description 4
- 238000004458 analytical method Methods 0.000 description 3
- 230000005684 electric field Effects 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- 238000009529 body temperature measurement Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 229910003327 LiNbO3 Inorganic materials 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- 238000010420 art technique Methods 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000004590 computer program Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000006735 deficit Effects 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/09—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by piezoelectric pick-up
- G01P15/0907—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by piezoelectric pick-up of the compression mode type
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/09—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by piezoelectric pick-up
- G01P15/0915—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by piezoelectric pick-up of the shear mode type
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G7/00—Capacitors in which the capacitance is varied by non-mechanical means; Processes of their manufacture
- H01G7/02—Electrets, i.e. having a permanently-polarised dielectric
- H01G7/025—Electrets, i.e. having a permanently-polarised dielectric having an inorganic dielectric
Definitions
- the fields of art to which the invention pertains include the fields of piezoelectric crystals and accelerometers and other transducers incorporating piezoelectric crystals.
- Single crystal lithium niobate (LiNbO 3 ) is a clear, colorless material having a reported melting point of 1,250° C and a ferroelectric Curie point of 1,210° C. It crystalizes in the trigonal system (3m) and single domain crystals of practical size can be grown by the Czochralski technique. The material has a high peizoelectric coupling coefficient, i.e., high electrical energy output to mechanical energy input, and vice-versa. These characteristics make single crystal lithium niobate useful in a variety of transducers in which the piezoelectric effect is important, such as in frequency determining elements, temperature measurement devices, and in accelerometers and other transducers utilizing mechanical force to generate a signal current.
- lithium niobate A High-Temperature Piezoelectric Transducer Material
- Creature of Elastic and Piezoelectric Constants for Crystals In Class (3m) by Warner, Onoe and Coquin, Journal of the Acoustical Society of America, Vol. 42, No. 6, 1967, pages 1223-1231
- pieoelectric and Elastic Properties of Lithium Niobate Single Crystals by Yamada, Niizeki and Toyoda, “Japanese Journal of Applied Physics,” Vol. 6, No. 2, February 1967, pages 151-155.
- piezoelectric crystals When utilizing such crystals for their piezoelectric effect, it is generally desired to measure sensitivity in only a single direction. This is particularly true with accelerometers used in measuring accelerations encountered in vibrations occurring in aircraft, missiles, and the like.
- piezoelectric crystals generally exhibit cross-axis sensitivity so that the signal resulting from the application of mechanical force does not accurately represent the amount of force exerted in a particular direction.
- accelerometers are designed so that the mass exerting the force is constrained to apply force only along one measuring axis in relation to the crystal.
- a variety of mounting arrangements have been devised utilizing spring loading and the like in an attempt to reduce cross axis sensitivity. For example, in Tolliver et al. U.S.
- piezoelectric crystals having low or zero cross axis sensitivity.
- lithium niobate single crystals are provided which have been cut from a larger crystal with certain selected orientations.
- a Z axis has been chosen to coincide with the C (symmetry) axis of the crystal
- an X axis has been chosen to lie in an a axis (mirror plane - perpendicular to the plane of symmetry) of the crystal
- a Y axis has been chosen to lie perpendicular to the Z and X axes to give a conventional right handed rectangular coordinate system.
- lithium niobate single crystals are provided which can be utilized in a compressional mode transducer by orientating a crystal cut from a larger crystal along a plane (a) initially perpendicular to the Y axis and rotated 38.6 ⁇ 1° counterclockwise around the X axis, in IRE notation an (yxl) +38.6°( ⁇ 1°) cut.
- lithium niobate single crystals can be provided for utilization in a shear mode transducer by orientating a crystal cut along a plane (a) initially perpendicular to the X axis and rotated about 31.7° +1° counterclockwise around the Y axis, in IRE notation a (zxtl) +60°( ⁇ 1°)/+51.4°( ⁇ 1°) cut or (b) initially perpendicular to the X axis and rotated 76.7° ⁇ 1° counterclockwise around the Y axis, in IRE notation an (xyl) +76.7°( ⁇ 1°) cut or symmetrical equivalents thereof.
- a symmetrical equivalent of the 38.6° Y cut is obtained by cutting from a crystal along a plane initially perpendicular to the Z axis, rotated 60.0° ⁇ 1° counterclockwise around the Z axis to define an X' axis thereat and then rotated 51.4 ⁇ 1° counterclockwise around the X' axis.
- FIG. 1 is a schematic representation of components of an accelerometer utilizing a piezoelectric crystal in a compressional mode of operation
- FIG. 2 is a schematic representation of a crystal section, having a (yxl) +38.6° cut;
- FIG. 3 is a schematic representation of a crystal section having a (zxtl) +60°/+51.4° cut a symmetrical equivalent to the section of FIG. 2;
- FIG. 4 is a schematic representation of components of an accelerometer utilizing a piezoelectric crystal in a shear mode of operation
- FIG. 5 is a schematic representation of a crystal section having an (xyl) +31.7° cut.
- FIG. 6 is a schematic representation of a crystal section having an (xyl) +76.7° cut.
- a wafer 10 cut from a crystal of lithium niobate is utilized in a compresional mode in an accelerometer 12.
- the accelerometer includes a housing having a bottom wall 14 and a top wall 16 between which are sandwiched the crystal 10 and an inertial mass 18 in contact with the crystal 10.
- the inertial mass is connected to the top wall 16 by means of a layer 20 of non-conductive adhesive.
- the inertial mass 18 and bottom wall 14 are electrically connected to reproducing means, represented by an amplifier 22 and a recorder 24, via leads 26 and 28, respectively, through a coaxial cable indicated by the dashed lines 30.
- reproducing means represented by an amplifier 22 and a recorder 24, via leads 26 and 28, respectively, through a coaxial cable indicated by the dashed lines 30.
- Constructional details of such an accelerometer are well known to the art (see for example, U.S. Pat. No. 3,233,465, above-referred to) and are not a part of the present invention.
- the crystal has low or zero cross axis sensitivity when utilized in such a compressional mode. Accordingly, one need not resort to the various prior art devices of spring loading the crystal or taking other steps to decrease cross axis sensitivity.
- the orientation of one such wafer 10' is schematically represented in relation to the direction of the crystal, in terms of rectangular coordinate axes derived as hereinabove stated.
- the crystal is cut along a plane initially perpendicular to the Y axis and rotated about 38.6° counterclockwise around the X axis to yield a (yxl) +38.6° cut in IRE notation.
- a plane perpendicular to the Y axis also referred to as a "Y-cut”
- the boule from which the wafer 10' is sliced is mounted on a conventional orientation jig and carefully adjusted using any conventional prior art technique.
- the method of obtaining the cut, other than the selection of the angle, is not a part of the present invention. Orientation of the crystal following the cut is confirmed by Laue X-ray photography.
- Crystals cut as in FIG. 2 were connected by shielded leads to an Admittance Bridge driven by two sources of radio frequency.
- One source was an oscillator with a range of 50 kc to 55 mc, while the other was a swept frequency oscillator with a total range of from 0 to 222 mc. This latter oscillator had both variable sweep range and variable sweep rate and it was used to obtain approximate values of the crystal frequency responses. Exact values were then measured by the 50 kc-55 mc oscillator which was monitored by a 60 mc frequency cunter. The bridge output was then amplified and displayed on an oscilloscope. Measurements were made in a heavy duty electric clam shell type oven with a range to 1,850° F.
- the temperature of the oven was controlled and temperatures were measured electrically. Fundamental vibration frequencies were measured along with as many overtone frequencies as were of sufficient amplitude to be accurately identified. Multiple frequency measurement was made at from 12 to 14 different temperatures and results were then converted to a polynominal expression for frequency vs. temperature by a Fortran computer program. Each of the boules from which crystals were cut were analyzed by mass spectrography and the impurity concentration on all samples was small enough to indicate that the particular constants involved, which are essentially macroscopic, would not be affected thereby.
- a wafer 10' can be formed having a compression or tension sensitivity of 37 picocoulombs per newton and substantialy zero shear and torsion sensitivity.
- the orientation of another wafer 10" is schematically represented in relation to the direction of the crystal in terms of rectangular coordinate axes.
- the crystal is cut along a plane 34 initially perpendicular to the Z axis, rotated about 60° counterclockwise around the Z axis to define an X' axis 36 thereat and then rotated about 51.4° counterclockwise around the X' axis to yield a (zxtl) +60°/+51.4° cut in IRE notation.
- the resulting orientation is a symmetrical equivalent, in mirror image fashion, of the above (yxl) +38.6° cut.
- Tensor analysis confirms this equivalency, showing a compression or tension sensitivity also of 37 picocoulombs per newton and zero shear and torsion sensitivity.
- a wafer 40 is cut from a crystal of lithium niobate is utilized in a shear mode in an accelerometer 42.
- the accelerometer 42 includes a housing having a side wall 44 and inertial masses 46 and 48 sandwiching the crystal 40 therebetween.
- the crystal 40 is secured by conductive adhesive to the inertial masses 46 and 48 which are electrically connected through a coaxial cable 50 to an amplifier 52 and recorder 54.
- the wafer 40 is subjected to a shear or torsional forces to generate a signal current. Construction details of such an accelerometer are well known to the art (see for example, U.S. Pat. No. 3,104,335, above-referred to) and are not a part of the present invention.
- the orientation of a wafer 40' for use in a shear mode accelerometer is schematically represented in relation to the direction of the crystal in terms of rectangular coordinate axes, derived as hereinabove stated.
- the crystal is cut along a plane 56 initially perpendicular to the X axis and rotated 31.7° counterclockwise around the Y axis to yield an (xyl) +31.7° cut in IRE notation.
- the orientation has a predicted shear sensitivity of 67 picocoulombs per newton and zero compression sensitivity.
- a crystal was cut at that orientation from a larger crystal of lithium niobate, it had a measured shear sensitivity of 66 picocoulombs per newton and a measured cross axis sensitivity of only 1.2 percent.
- a crystal wafer 40" is illustrated which is cut along a plane 58 initially perpendicular to the X axis and rotated about 76.7° counterclockwise around the Y axis to yield an (xyl) +76.7° cut in IRE notation.
- Tensor analysis indicates that such an X-cut has a shear sensitivity of 79.9 picocoulombs per newton and zero compression sensitivity.
- Variations of about ⁇ 1° in each of the foregoing orientations are permitted to yield shear and compression sensitivity ranges of up to about ⁇ 5 percent.
- the output of a piezoelectric crystal is a function of the applied stress.
- the proportionally constant between stress and output increases with temperature which results in an impairment of accuracy in a transducer which is subjected to constant stress in a changing temperature environment.
- the proportionality constant between electric field and output is the dielectric constant which is also temperature sensitive. The equation relating these parameters is:
- T d the piezoelectric constant
- T d the temperature coefficient of d
- E the electric field strength
- K the dielectric constant
- T K the temperature coefficient of the dielectric constant
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
Description
D = TdT.sub.d + EKT.sub.K
dT.sub.d + EKT.sub.K = zero
Claims (9)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US05/790,513 USRE29755E (en) | 1971-12-23 | 1977-04-25 | Piezoelectric transducer having a crystal orientation selected from (xyl) + 31.7° (±1°) and (xyl) + 76.7° (±1°) or symmetrical equivalent |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US21120071A | 1971-12-23 | 1971-12-23 | |
US05/790,513 USRE29755E (en) | 1971-12-23 | 1977-04-25 | Piezoelectric transducer having a crystal orientation selected from (xyl) + 31.7° (±1°) and (xyl) + 76.7° (±1°) or symmetrical equivalent |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US21120071A Reissue | 1971-12-23 | 1971-12-23 |
Publications (1)
Publication Number | Publication Date |
---|---|
USRE29755E true USRE29755E (en) | 1978-09-05 |
Family
ID=22785940
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US00211200A Expired - Lifetime US3735161A (en) | 1971-12-23 | 1971-12-23 | Piezoelectric transducer |
US05/790,513 Expired - Lifetime USRE29755E (en) | 1971-12-23 | 1977-04-25 | Piezoelectric transducer having a crystal orientation selected from (xyl) + 31.7° (±1°) and (xyl) + 76.7° (±1°) or symmetrical equivalent |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US00211200A Expired - Lifetime US3735161A (en) | 1971-12-23 | 1971-12-23 | Piezoelectric transducer |
Country Status (1)
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US (2) | US3735161A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0226742A2 (en) * | 1985-12-21 | 1987-07-01 | FEV Forschungsgesellschaft für Energietechnik und Verbrennungsmotoren mbH | Pressure transducer for measuring pressures at high temperatures |
US20100206083A1 (en) * | 2009-02-13 | 2010-08-19 | Nissan Technical Center North America, Inc. | Laser deflection vibration test of door mirror |
US20130112011A1 (en) * | 2011-11-08 | 2013-05-09 | Seiko Epson Corporation | Sensor element, force detecting device, robot and sensor device |
US20210190609A1 (en) * | 2018-01-24 | 2021-06-24 | Avl List Gmbh | Measuring system and method for determining a force and/or a torque on a torque-transmitting shaft |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3858065A (en) * | 1970-12-31 | 1974-12-31 | Becton Dickinson Co | Annular 3m class piezoelectric crystal transducer |
US3911388A (en) * | 1973-09-21 | 1975-10-07 | Houston Products And Services | Accelerometer |
JPS5141898A (en) * | 1974-10-07 | 1976-04-08 | Tokyo Shibaura Electric Co | Denki kikaihenkansochi |
US3955109A (en) * | 1974-11-29 | 1976-05-04 | Bell Telephone Laboratories, Incorporated | Crystal resonator of (yzw)θ orientation having a thickness to width ratio of less than one |
FR2453413A1 (en) * | 1979-04-03 | 1980-10-31 | Tamboise Maurice | Intrusion detector for motor vehicle - utilises movement of mass acting on piezoelectric element to modulate transmission frequency |
CH644227A5 (en) * | 1979-09-14 | 1984-07-13 | Kistler Instrumente Ag | PIEZOELECTRIC CRYSTAL ELEMENT FOR MEASURING TRANSDUCERS. |
US4893049A (en) * | 1986-05-29 | 1990-01-09 | The United States Of America As Represented By The United States Department Of Energy | Lithium niobate explosion monitor |
US4736132A (en) * | 1987-09-14 | 1988-04-05 | Rockwell International Corporation | Piezoelectric deformable mirrors and gratings |
KR940006950B1 (en) * | 1989-05-02 | 1994-07-30 | 후지꾸라 가부시끼가이샤 | Piezoelectric acceleration sensor and Piezoelectric acceleration sensor device |
US5739626A (en) * | 1991-04-27 | 1998-04-14 | Ngk Spark Plug Co., Ltd. | Piezoelectric sensor |
JPH08242026A (en) * | 1995-03-03 | 1996-09-17 | Fujitsu Ltd | Piezoelectric oscillator and piezoelectric oscillator device provided therewith and circuit device provided with same device |
EP0768532B1 (en) | 1995-10-09 | 2003-04-23 | Matsushita Electric Industrial Co., Ltd | Acceleration sensor and method for producing the same, and shock detecting device using the same |
US5675208A (en) * | 1996-02-28 | 1997-10-07 | Motorola, Inc. | Lithium niobate piezoelectric transformer operating in thickness-shear mode |
JP2007532016A (en) * | 2003-07-11 | 2007-11-08 | ケン デン | Acoustic vector sensor |
US7104140B2 (en) * | 2003-12-15 | 2006-09-12 | Wilcoxon Research, Inc. | High sensitivity, low noise piezoelelctric flexural sensing structure using <011> poled relaxor-based piezoelectric single crystals |
US20070119259A1 (en) * | 2004-12-15 | 2007-05-31 | Lichun Zou | High sensitivity, low noise piezoelectric flexural sensing structure |
US9883576B2 (en) | 2013-06-14 | 2018-01-30 | The Curators Of The University Of Missouri | Low-power, compact piezoelectric particle emission |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3528765A (en) * | 1967-06-08 | 1970-09-15 | Union Carbide Corp | Lithium niobate crystals having elevated phase matching temperatures and method therefor |
US3591813A (en) * | 1969-02-28 | 1971-07-06 | Bell Telephone Labor Inc | Lithium niobate transducers |
-
1971
- 1971-12-23 US US00211200A patent/US3735161A/en not_active Expired - Lifetime
-
1977
- 1977-04-25 US US05/790,513 patent/USRE29755E/en not_active Expired - Lifetime
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3528765A (en) * | 1967-06-08 | 1970-09-15 | Union Carbide Corp | Lithium niobate crystals having elevated phase matching temperatures and method therefor |
US3591813A (en) * | 1969-02-28 | 1971-07-06 | Bell Telephone Labor Inc | Lithium niobate transducers |
Non-Patent Citations (1)
Title |
---|
Ultrasonic Transducer Materials, by Mattiat, Plenum Press, 1971, pp. 97, 136 and 148-151. * |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0226742A2 (en) * | 1985-12-21 | 1987-07-01 | FEV Forschungsgesellschaft für Energietechnik und Verbrennungsmotoren mbH | Pressure transducer for measuring pressures at high temperatures |
EP0226742A3 (en) * | 1985-12-21 | 1988-06-22 | Fev Forschungsgesellschaft Fur Energietechnik Und Verbrennungsmotoren Mbh | Pressure transducer for measuring pressures at high temperatures |
US20100206083A1 (en) * | 2009-02-13 | 2010-08-19 | Nissan Technical Center North America, Inc. | Laser deflection vibration test of door mirror |
US8161819B2 (en) | 2009-02-13 | 2012-04-24 | Nissan North America, Inc. | Laser deflection vibration test of door mirror |
US20130112011A1 (en) * | 2011-11-08 | 2013-05-09 | Seiko Epson Corporation | Sensor element, force detecting device, robot and sensor device |
US9102067B2 (en) * | 2011-11-08 | 2015-08-11 | Seiko Epson Corporation | Sensor element, force detecting device, robot and sensor device |
US20210190609A1 (en) * | 2018-01-24 | 2021-06-24 | Avl List Gmbh | Measuring system and method for determining a force and/or a torque on a torque-transmitting shaft |
US11852545B2 (en) | 2018-01-24 | 2023-12-26 | Avl List Gmbh | Measuring device and method for determining a force and/or a torque on a torque-transmitting shaft |
US12013301B2 (en) * | 2018-01-24 | 2024-06-18 | Avl List Gmbh | Measuring system and method for determining a force and/or a torque on a torque-transmitting shaft |
Also Published As
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US3735161A (en) | 1973-05-22 |
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