USD984288S1 - Inspection gauge for coordinate measuring machine - Google Patents
Inspection gauge for coordinate measuring machine Download PDFInfo
- Publication number
- USD984288S1 USD984288S1 US29/783,792 US202129783792F USD984288S US D984288 S1 USD984288 S1 US D984288S1 US 202129783792 F US202129783792 F US 202129783792F US D984288 S USD984288 S US D984288S
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- US
- United States
- Prior art keywords
- measuring machine
- coordinate measuring
- inspection gauge
- gauge
- inspection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPD2020-24629F JP1691006S (zh) | 2020-11-16 | 2020-11-16 | |
JP2020-024629D | 2020-11-16 |
Publications (1)
Publication Number | Publication Date |
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USD984288S1 true USD984288S1 (en) | 2023-04-25 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US29/783,792 Active USD984288S1 (en) | 2020-11-16 | 2021-05-14 | Inspection gauge for coordinate measuring machine |
Country Status (2)
Country | Link |
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US (1) | USD984288S1 (zh) |
JP (1) | JP1691006S (zh) |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012137301A (ja) * | 2010-12-24 | 2012-07-19 | Tokyo Metropolitan Industrial Technology Research Institute | 三次元座標測定機簡易検査用ゲージ |
WO2016132407A1 (ja) | 2015-02-18 | 2016-08-25 | 株式会社浅沼技研 | 直角ステップゲージ |
CN108534676A (zh) * | 2018-04-20 | 2018-09-14 | 西京学院 | 一种坐标测量机测量空间内空间误差的检验方法 |
US20190274654A1 (en) | 2018-03-12 | 2019-09-12 | Mitutoyo Corporation | Measuring x-ray ct apparatus and tomographic image generating method |
WO2020004222A1 (ja) | 2018-06-28 | 2020-01-02 | 株式会社浅沼技研 | 検査マスタ |
JP2020027087A (ja) | 2018-08-17 | 2020-02-20 | 地方独立行政法人東京都立産業技術研究センター | 校正ゲージ及び校正方法 |
WO2020261623A1 (ja) | 2019-06-25 | 2020-12-30 | 株式会社浅沼技研 | 検査マスタ |
-
2020
- 2020-11-16 JP JPD2020-24629F patent/JP1691006S/ja active Active
-
2021
- 2021-05-14 US US29/783,792 patent/USD984288S1/en active Active
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012137301A (ja) * | 2010-12-24 | 2012-07-19 | Tokyo Metropolitan Industrial Technology Research Institute | 三次元座標測定機簡易検査用ゲージ |
WO2016132407A1 (ja) | 2015-02-18 | 2016-08-25 | 株式会社浅沼技研 | 直角ステップゲージ |
US20190274654A1 (en) | 2018-03-12 | 2019-09-12 | Mitutoyo Corporation | Measuring x-ray ct apparatus and tomographic image generating method |
JP2019158534A (ja) | 2018-03-12 | 2019-09-19 | 株式会社ミツトヨ | 計測用x線ct装置、及び、その断層画像生成方法 |
CN108534676A (zh) * | 2018-04-20 | 2018-09-14 | 西京学院 | 一种坐标测量机测量空间内空间误差的检验方法 |
WO2020004222A1 (ja) | 2018-06-28 | 2020-01-02 | 株式会社浅沼技研 | 検査マスタ |
JP2020027087A (ja) | 2018-08-17 | 2020-02-20 | 地方独立行政法人東京都立産業技術研究センター | 校正ゲージ及び校正方法 |
WO2020261623A1 (ja) | 2019-06-25 | 2020-12-30 | 株式会社浅沼技研 | 検査マスタ |
Non-Patent Citations (3)
Title |
---|
Asanuma Giken Co., Ltd.; Quality Master T Instructions Manual; obtained 2021. |
Jun. 29, 2021 Decision to Grant issued in Japanese Patent Application No. 2020-024629. |
Jun. 29, 2021 Decision to Grant issued in Japanese Patent Application No. 2020-027087. |
Also Published As
Publication number | Publication date |
---|---|
JP1691006S (zh) | 2021-07-26 |
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Legal Events
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