USD984288S1 - Inspection gauge for coordinate measuring machine - Google Patents

Inspection gauge for coordinate measuring machine Download PDF

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Publication number
USD984288S1
USD984288S1 US29/783,792 US202129783792F USD984288S US D984288 S1 USD984288 S1 US D984288S1 US 202129783792 F US202129783792 F US 202129783792F US D984288 S USD984288 S US D984288S
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United States
Prior art keywords
measuring machine
coordinate measuring
inspection gauge
gauge
inspection
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Active
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US29/783,792
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English (en)
Inventor
Tetsuro Hidaka
Kengo Hirata
Shingo Kiyotani
Kanae KOBAYASHI
Mitsuru Fukuda
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Mitutoyo Corp
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Mitutoyo Corp
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Assigned to MITUTOYO CORPORATION reassignment MITUTOYO CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: FUKUDA, MITSURU, HIDAKA, TETSURO, HIRATA, KENGO, KIYOTANI, SHINGO, KOBAYASHI, KANAE
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US29/783,792 2020-11-16 2021-05-14 Inspection gauge for coordinate measuring machine Active USD984288S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPD2020-24629F JP1691006S (zh) 2020-11-16 2020-11-16
JP2020-024629D 2020-11-16

Publications (1)

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USD984288S1 true USD984288S1 (en) 2023-04-25

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JP (1) JP1691006S (zh)

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012137301A (ja) * 2010-12-24 2012-07-19 Tokyo Metropolitan Industrial Technology Research Institute 三次元座標測定機簡易検査用ゲージ
WO2016132407A1 (ja) 2015-02-18 2016-08-25 株式会社浅沼技研 直角ステップゲージ
CN108534676A (zh) * 2018-04-20 2018-09-14 西京学院 一种坐标测量机测量空间内空间误差的检验方法
US20190274654A1 (en) 2018-03-12 2019-09-12 Mitutoyo Corporation Measuring x-ray ct apparatus and tomographic image generating method
WO2020004222A1 (ja) 2018-06-28 2020-01-02 株式会社浅沼技研 検査マスタ
JP2020027087A (ja) 2018-08-17 2020-02-20 地方独立行政法人東京都立産業技術研究センター 校正ゲージ及び校正方法
WO2020261623A1 (ja) 2019-06-25 2020-12-30 株式会社浅沼技研 検査マスタ

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012137301A (ja) * 2010-12-24 2012-07-19 Tokyo Metropolitan Industrial Technology Research Institute 三次元座標測定機簡易検査用ゲージ
WO2016132407A1 (ja) 2015-02-18 2016-08-25 株式会社浅沼技研 直角ステップゲージ
US20190274654A1 (en) 2018-03-12 2019-09-12 Mitutoyo Corporation Measuring x-ray ct apparatus and tomographic image generating method
JP2019158534A (ja) 2018-03-12 2019-09-19 株式会社ミツトヨ 計測用ｘ線ｃｔ装置、及び、その断層画像生成方法
CN108534676A (zh) * 2018-04-20 2018-09-14 西京学院 一种坐标测量机测量空间内空间误差的检验方法
WO2020004222A1 (ja) 2018-06-28 2020-01-02 株式会社浅沼技研 検査マスタ
JP2020027087A (ja) 2018-08-17 2020-02-20 地方独立行政法人東京都立産業技術研究センター 校正ゲージ及び校正方法
WO2020261623A1 (ja) 2019-06-25 2020-12-30 株式会社浅沼技研 検査マスタ

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
Asanuma Giken Co., Ltd.; Quality Master T Instructions Manual; obtained 2021.
Jun. 29, 2021 Decision to Grant issued in Japanese Patent Application No. 2020-024629.
Jun. 29, 2021 Decision to Grant issued in Japanese Patent Application No. 2020-027087.

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JP1691006S (zh) 2021-07-26

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