USD819581S1 - Socket for electronic device testing apparatus - Google Patents
Socket for electronic device testing apparatus Download PDFInfo
- Publication number
- USD819581S1 USD819581S1 US29/601,371 US201729601371F USD819581S US D819581 S1 USD819581 S1 US D819581S1 US 201729601371 F US201729601371 F US 201729601371F US D819581 S USD819581 S US D819581S
- Authority
- US
- United States
- Prior art keywords
- socket
- testing apparatus
- electronic device
- device testing
- view
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
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Description
The even dashed broken lines shown in the drawings represent portions of the socket for an electronic testing apparatus, that form no part of the claimed design.
The dashed-dot line shown on the top and bottom of the socket for an electronic testing apparatus represents the boundary line between the claimed and unclaimed surface areas.
The outer boarder of the center broken line circles in FIG. 8 that form no part of the claimed design, show the step in FIGS. 11 and 12 .
Claims (1)
- The ornamental design for a socket for an electronic device testing apparatus, as shown and described.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US29/601,371 USD819581S1 (en) | 2014-07-17 | 2017-04-21 | Socket for electronic device testing apparatus |
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR30-2014-0035155 | 2014-07-17 | ||
KR20140035153 | 2014-07-17 | ||
KR20140035155 | 2014-07-17 | ||
KR30-2014-0035153 | 2014-07-17 | ||
US29/509,962 USD788722S1 (en) | 2014-07-17 | 2014-11-24 | Socket for an electronic device testing apparatus |
US29/601,371 USD819581S1 (en) | 2014-07-17 | 2017-04-21 | Socket for electronic device testing apparatus |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US29/509,962 Division USD788722S1 (en) | 2014-07-17 | 2014-11-24 | Socket for an electronic device testing apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
USD819581S1 true USD819581S1 (en) | 2018-06-05 |
Family
ID=58778578
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US29/509,962 Active USD788722S1 (en) | 2014-07-17 | 2014-11-24 | Socket for an electronic device testing apparatus |
US29/601,371 Active USD819581S1 (en) | 2014-07-17 | 2017-04-21 | Socket for electronic device testing apparatus |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US29/509,962 Active USD788722S1 (en) | 2014-07-17 | 2014-11-24 | Socket for an electronic device testing apparatus |
Country Status (1)
Country | Link |
---|---|
US (2) | USD788722S1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD956705S1 (en) * | 2019-11-07 | 2022-07-05 | Lam Research Corporation | Cooling plate for a semiconductor processing apparatus |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD788722S1 (en) * | 2014-07-17 | 2017-06-06 | Advantest Corporation | Socket for an electronic device testing apparatus |
Citations (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD358806S (en) | 1993-09-24 | 1995-05-30 | Sgs-Thomson Microelectronics, Inc. | Socketed integrated circuit package |
USD359028S (en) | 1993-09-02 | 1995-06-06 | Sgs-Thomson Microelectronics, Inc. | Socketed integrated circuit package |
US20030032322A1 (en) | 2001-08-08 | 2003-02-13 | Yamaichi Electronics Co., Ltd. | Semiconductor device-socket |
US20040063241A1 (en) | 2001-06-19 | 2004-04-01 | Tomohiro Nakano | Socket for semiconductor package |
US20040212382A1 (en) | 2003-04-28 | 2004-10-28 | Cram Daniel P. | Test socket for semiconductor components having serviceable nest |
US20040248435A1 (en) * | 2002-12-17 | 2004-12-09 | Yamaichi Electronics Co., Ltd. | Socket for semiconductor device |
US20050136721A1 (en) | 2003-12-19 | 2005-06-23 | Yamaichi Electronics Co., Ltd. | Semiconductor device socket |
US20050231919A1 (en) | 2004-04-16 | 2005-10-20 | Yamaichi Electronics Co., Ltd. | Semiconductor device socket |
US20050250363A1 (en) | 2002-07-09 | 2005-11-10 | Yamaichi Electronics Co., Ltd. | Socket for semiconductor device |
US20050287837A1 (en) | 2004-06-24 | 2005-12-29 | Trobough Mark B | Multi-portion socket and related apparatuses |
USD522977S1 (en) | 2004-08-31 | 2006-06-13 | Yamaichi Electronics Co., Ltd. | Socket for semiconductor device |
US20070173081A1 (en) | 2006-01-20 | 2007-07-26 | Hon Hai Precision Ind. Co., Ltd. | Socket assembly |
US7335030B2 (en) * | 2005-03-10 | 2008-02-26 | Yamaichi Electronics Co., Ltd. | Cartridge for contact terminals and semiconductor device socket provided with the same |
US7568918B2 (en) * | 2007-09-28 | 2009-08-04 | Yamaichi Electronics Co., Ltd. | Socket for semiconductor device |
US20100062623A1 (en) | 2008-09-08 | 2010-03-11 | Hon Hai Precision Industry Co., Ltd. | Ic socket with floatable pressing device for receiving testing ic packages of different sizes |
US7819686B2 (en) * | 2008-08-11 | 2010-10-26 | Hon Hai Precision Ind. Co., Ltd. | Burn-in socket |
US7887355B2 (en) * | 2008-11-13 | 2011-02-15 | Yamaichi Electronics Co., Ltd. | Semiconductor device socket |
USD633880S1 (en) | 2010-03-26 | 2011-03-08 | Advanced Micro Devices, Inc. | Socket housing |
USD633879S1 (en) | 2010-03-26 | 2011-03-08 | Advanced Micro Devices, Inc. | Socket cap |
USD633878S1 (en) | 2010-03-26 | 2011-03-08 | Advanced Micro Devices, Inc. | Socket cover cap |
USD633877S1 (en) | 2010-03-26 | 2011-03-08 | Advanced Micro Devices, Inc. | Socket frame |
USD645426S1 (en) | 2010-03-26 | 2011-09-20 | Advanced Micro Devices, Inc. | Socket assembly |
USD788722S1 (en) * | 2014-07-17 | 2017-06-06 | Advantest Corporation | Socket for an electronic device testing apparatus |
US9755387B2 (en) * | 2014-03-31 | 2017-09-05 | Enplas Corporation | Elevating mechanism and socket for electrical component |
-
2014
- 2014-11-24 US US29/509,962 patent/USD788722S1/en active Active
-
2017
- 2017-04-21 US US29/601,371 patent/USD819581S1/en active Active
Patent Citations (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD359028S (en) | 1993-09-02 | 1995-06-06 | Sgs-Thomson Microelectronics, Inc. | Socketed integrated circuit package |
USD358806S (en) | 1993-09-24 | 1995-05-30 | Sgs-Thomson Microelectronics, Inc. | Socketed integrated circuit package |
US20040063241A1 (en) | 2001-06-19 | 2004-04-01 | Tomohiro Nakano | Socket for semiconductor package |
US20030032322A1 (en) | 2001-08-08 | 2003-02-13 | Yamaichi Electronics Co., Ltd. | Semiconductor device-socket |
US20050250363A1 (en) | 2002-07-09 | 2005-11-10 | Yamaichi Electronics Co., Ltd. | Socket for semiconductor device |
US20040248435A1 (en) * | 2002-12-17 | 2004-12-09 | Yamaichi Electronics Co., Ltd. | Socket for semiconductor device |
US20040212382A1 (en) | 2003-04-28 | 2004-10-28 | Cram Daniel P. | Test socket for semiconductor components having serviceable nest |
US20050136721A1 (en) | 2003-12-19 | 2005-06-23 | Yamaichi Electronics Co., Ltd. | Semiconductor device socket |
US20050231919A1 (en) | 2004-04-16 | 2005-10-20 | Yamaichi Electronics Co., Ltd. | Semiconductor device socket |
US7230830B2 (en) * | 2004-04-16 | 2007-06-12 | Yamaichi Electronics Co., Ltd. | Semiconductor device socket |
US20050287837A1 (en) | 2004-06-24 | 2005-12-29 | Trobough Mark B | Multi-portion socket and related apparatuses |
USD522977S1 (en) | 2004-08-31 | 2006-06-13 | Yamaichi Electronics Co., Ltd. | Socket for semiconductor device |
US7335030B2 (en) * | 2005-03-10 | 2008-02-26 | Yamaichi Electronics Co., Ltd. | Cartridge for contact terminals and semiconductor device socket provided with the same |
US20070173081A1 (en) | 2006-01-20 | 2007-07-26 | Hon Hai Precision Ind. Co., Ltd. | Socket assembly |
US7568918B2 (en) * | 2007-09-28 | 2009-08-04 | Yamaichi Electronics Co., Ltd. | Socket for semiconductor device |
US7819686B2 (en) * | 2008-08-11 | 2010-10-26 | Hon Hai Precision Ind. Co., Ltd. | Burn-in socket |
US20100062623A1 (en) | 2008-09-08 | 2010-03-11 | Hon Hai Precision Industry Co., Ltd. | Ic socket with floatable pressing device for receiving testing ic packages of different sizes |
US7887355B2 (en) * | 2008-11-13 | 2011-02-15 | Yamaichi Electronics Co., Ltd. | Semiconductor device socket |
USD633878S1 (en) | 2010-03-26 | 2011-03-08 | Advanced Micro Devices, Inc. | Socket cover cap |
USD633879S1 (en) | 2010-03-26 | 2011-03-08 | Advanced Micro Devices, Inc. | Socket cap |
USD633880S1 (en) | 2010-03-26 | 2011-03-08 | Advanced Micro Devices, Inc. | Socket housing |
USD633877S1 (en) | 2010-03-26 | 2011-03-08 | Advanced Micro Devices, Inc. | Socket frame |
USD645426S1 (en) | 2010-03-26 | 2011-09-20 | Advanced Micro Devices, Inc. | Socket assembly |
USD648688S1 (en) | 2010-03-26 | 2011-11-15 | Advanced Micro Devices, Inc. | Socket housing |
USD661667S1 (en) | 2010-03-26 | 2012-06-12 | Advanced Micro Devices, Inc. | Socket assembly |
US9755387B2 (en) * | 2014-03-31 | 2017-09-05 | Enplas Corporation | Elevating mechanism and socket for electrical component |
USD788722S1 (en) * | 2014-07-17 | 2017-06-06 | Advantest Corporation | Socket for an electronic device testing apparatus |
Non-Patent Citations (2)
Title |
---|
Office Action issued in Taiwan Counterpart Patent Appl. No. 103306664, dated Jul. 20, 2015. |
Office Action issued in Taiwan Counterpart Patent Appl. No. 10420942510, dated Jul. 20, 2015. |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USD956705S1 (en) * | 2019-11-07 | 2022-07-05 | Lam Research Corporation | Cooling plate for a semiconductor processing apparatus |
Also Published As
Publication number | Publication date |
---|---|
USD788722S1 (en) | 2017-06-06 |
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